The WM2619 is a 12-bit voltage output, resistor string, digital-toanalogue converter. A hardware controlled power down mode is
provided that reduces power consumption to 50nW. In normal
operation the device dissipates 8mW at 5V or 4.3mW at 3V.
The device has been designed to interface efficiently to industry
standard microprocessors and DSPs.
Excellent performance is delivered with a typical DNL of 0.4 LSBs
and a settling time of 1µs. The output stage is buffered by a x2
gain near rail-to-rail amplifier, which features a Class A output
stage. The 12 data bits are double-buffered enabling the output to
be asynchronously updated under hardware control.
The device is available in a 20-pin TSSOP package. Commercial
temperature (0° to 70°C) and Industrial temperature (-40° to 85°C)
variants are supported.
D2Digital inputDigital data input.
D3Digital inputDigital data input.
D4Digital inputDigital data input.
D5Digital inputDigital data input.
D6Digital inputDigital data input.
D7Digital inputDigital data input.
D8Digital inputDigital data input.
D9Digital inputDigital data input
D10Digital inputDigital data input.
D11Digital inputDigital data input (MSB).
VDDSupplyPositive power supply.
REFINAnalogue inputVoltage reference input.
OUTAnalogue outputAnalogue output.
GNDGroundGround.
NPDDigital inputPower down. Powers down all DACs overriding their individual
power down settings and all output stages. This pin is active low.
16
NLDACDigital inputLoad DAC. Digital input active low. NLDAC must be taken low to
update the DAC latch from the holding latches.
17
18
19
20
NWEDigital inputWrite enable (active low).
NCSDigital inputChip select (active low).
D0Digital inputParallel data input (LSB).
D1Digital inputParallel data input.
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Production DataWM2619
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously
operating at or beyond these limits. Device functional operating limits and guaranteed performance specifications are given
under Electrical Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically
susceptible to damage from excessive static voltages. Proper ESD precautions must be taken during
handling and storage of this device
CONDITIONMINMAX
Digital Supply voltage, VDD to GND
Reference input voltage
Digital input voltages
Operating temperature range, T
A
WM2619C
WM2619I
Storage temperature
Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds
-0.3VVDD + 0.3V
-0.3VVDD + 0.3V
0°C
-40°C
-65°C150°C
7V
70°C
85°C
260°C
RECOMMENDED OPERATING CONDITIONS
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNIT
Supply voltage
High-level digital input voltage
Low-level digital input voltage
Reference voltage to REFIN
Load resistance
Load capacitance
Operating free-air temperature
VDD2.75.5V
V
IH
V
IL
V
REF
R
L
C
L
T
A
VDD = 2.7V to 5.5V2V
VDD = 2.7V to 5.5V0.8V
See NoteVDD - 1.5V
210kΩ
WM2619C070°C
WM2619I-4085°C
Note: Reference input voltages greater than VDD/2 will cause output saturation for large DAC codes.
100pF
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WM2619Production Data
IH
IL
OUT
OUT
ELECTRICAL CHARACTERISTICS
Test Conditions:
RL = 10kΩ, CL = 100pF. VDD = 5V ±± 10%, V
temperature range (unless noted otherwise)
Resolution
Integral non-linearity
Differential non-linearity
Zero code error
Gain error
D.c. power supply rejection ratio
Zero code error temperature coefficient
Gain error temperature coefficient
WOLFSON MICROELECTRONICS LTDProduction Data Rev 1.0 June 1999
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Production DataWM2619
Test Conditions:
RL = 10kΩ, CL = 100pF. VDD = 5V ±± 10%, V
= 2.048V and VDD = 3V ±± 10%, V
REF
= 1.024V over recommended operating free-air
REF
temperature range (unless noted otherwise)
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNIT
Digital Inputs
High level input current
Low level input current
Input capacitance
I
IH
I
IL
C
I
Input voltage = VDD1µA
Input voltage = 0V-1µA
8pF
Notes:
1. Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects
of zero code and full scale errors).
2. Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two
codes. A guarantee of monotonicity means the output voltage changes in the same direction (or remains constant) as a change in
digital input code.
3. Zero code error is the voltage output when the DAC input code is zero.
4. Gain error is the deviation from the ideal full scale output excluding the effects of zero code error.
5. Power supply rejection ratio is measured by varying VDD from 4.5V to 5.5V and measuring the proportion of this signal imposed on
the zero code error and the gain error.
6. Zero code error and Gain error temperature coefficients are normalised to full scale voltage.
7. Output load regulation is the difference between the output voltage at full scale with a 10kΩ load and 2kΩ load. It is expressed as
a percentage of the full scale output voltage with a 10kΩ load.
8. IDD is measured while continuously writing code 2048 to the DAC. For VIH < VDD - 0.7V and VIL > 0.7V supply current will increase.
9. Typical supply current in power down mode is 10nA. Production test limits are wider for speed of test.
10. Slew rate results are for the lower value of the rising and falling edge slew rates.
11. Settling time is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and falling edges.
Limits are ensured by design and characterisation, but are not production tested.
12. SNR, SNRD, THD and SPFDR are measured on a synthesised sinewave at frequency f
generated with a sampling frequency fs
OUT
.
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WM2619Production Data
SERIAL INTERFACE
D [0:11]
t
SUCSWE
t
SUDWE
DataXX
t
HD
NCS
t
WWE
NWE
t
SUWELD
t
WLD
NLDAC
Figure 1 Timing Diagram
Test Conditions:
RL = 10kΩ, CL = 100pF. VDD = 5V ±± 10%, V
= 2.048V and VDD = 3V ±± 10%, V
REF
= 1.024V over recommended operating
REF
free-air temperature range (unless noted otherwise)
SYMBOLTEST CONDITIONSMINTYPMAXUNIT
t
SUCSWE
t
SUDWE
T
HD
t
SUWELD
t
WWE
t
WLD
Setup time NCS low before positive NWE edge
Setup time data ready before positive NWE edge
Data hold after positive NWE edge
Setup time NWE high before NLDAC low
High pulse width of NWE
Low pulse width of NLDAC
13ns
9ns
0ns
0ns
10ns
10ns
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Production DataWM2619
INL - LSB
OUTPUT VOLTAGE - V
OUTPUT VOLTAGE - V
OUTPUT VOLTAGE - V
OUTPUT VOLTAGE - V
TYPICAL PERFORMANCE GRAPHS
3
VDD = 5V, V
2
1
0
-1
-2
-3
05121024153620482559307135834095
Figure 2 Integral Non-Linearity
= 2.048V, Load = 10k/100pF
REF
DIGITAL CODE
3
VDD = 3V, V
= 1V, Input Code = 0
REF
2.5
2
1.5
1
0.5
0
012345678910
ISINK - mA
5
VDD = 5V, V
= 2V, Input Code = 0
4.5
3.5
2.5
1.5
0.5
REF
4
3
2
1
0
012345678910
ISINK - mA
Figure 3 Sink Current VDD = 3VFigure 4 Sink Current VDD = 5V
2.065
VDD = 3V, V
= 1V, Input Code = 4095
2.06
2.055
2.05
2.045
2.04
2.035
2.03
2.025
REF
012345678910
ISOURCE - mA
4.105
VDD = 5V, V
= 2V, Input Code = 4095
4.1
4.095
4.09
4.085
4.08
4.075
4.07
4.065
REF
0246810
ISOURCE - mA
Figure 5 Source Current VDD = 3VFigure 6 Source Current VDD = 5V
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WM2619Production Data
DEVICE DESCRIPTION
GENERAL FUNCTION
The device uses a resistor string network buffered with an op amp to convert 12-bit digital data to
analogue voltage levels (see Block Diagram). The output voltage is determined by the reference
input voltage and the input code according to the following relationship:
Output voltage =
INPUTOUTPUT
111111111111
::
100000000001
100000000000
011111111111
::
000000000001
0000000000000V
Table 1 Binary Code Table (0V to 2V
CODE
()
REF
V2
4096
()
V2 REF
()
REF
V2
2048
()
V2=
4096
()
V2 REF
()
REF
V2
Output), Gain = 2
REFIN
4095
4096
2049
4096
REFREFV
2047
4096
1
4096
POWER ON RESET
An internal power-on-reset circuit resets the DAC register to all 0s on power-up.
BUFFER AMPLIFIER
The output buffer has a near rail-to-rail output with short circuit protection and can reliably drive a
2kΩ load with a 100pF load capacitance.
EXTERNAL REFERENCE
The reference voltage input is buffered which makes the DAC input resistance independent of
code. The REFIN pin has an input resistance of 10MΩ and an input capacitance of typically 5pF.
The reference voltage determines the DAC full-scale output.
HARDWARE CONFIGURATION OPTIONS
The WM2619 has two configuration options that are controlled by device pins.
DEVICE POWERDOWN
The device can be powered-down by pulling pin NPD (pin 15) high. This powers down the DAC.
This will reduce power consumption significantly. When the power down function is released the
device reverts to the DAC code set prior to power down.
DAC UPDATE
The NLDAC pin (Pin 16) can be held high to prevent serial word writes from updating the DAC
latch. By writing the new value to the DAC then pulling NLDAC low, the new DAC code is loaded
into the DAC latch.
PARALLEL INTERFACE
The device registers data on the positive edge of NWE (Pin 17). It must be enabled with NCS
(Pin 18) low.
WOLFSON MICROELECTRONICS LTDProduction Data Rev 1.0 June 1999
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Production DataWM2619
PACKAGE DIMENSIONS
DT: 20 PIN TSSOP (6.5 x 4.4 x 1.0 mm)
b
A2
A1
A
e
1120
D
101
0.05 C
E1E
-C-
SEATING PLANE
GAUGE
PLANE
DM008.C
θθ
0.25
c
L
Dimensions
Symbols
(mm)
MINNOMMAX
A
A
1
A
2
b
c
D
----------1.20
0.05-----0.15
0.801.001.05
0.19-----0.30
0.09-----0.20
6.406.506.60
e0.65 BSC
E
E
1
L
θθ
4.304.404.50
0.450.600.75
o
0
REF:
NOTES:
A. ALL LINEAR DIMENSIONS ARE IN MILLIMETERS.
B. THIS DRAWING IS SUBJECT TO CHANGE WITHOUT NOTICE.
C. BODY DIMENSIONS DO NOT INCLUDE MOLD FLASH OR PROTRUSION, NOT TO EXCEED 0.25MM.
D. MEETS JEDEC.95 MO-153, VARIATION = AC. REFER TO THIS SPECIFICATION FOR FURTHER DETAILS.
6.4 BSC
-----8
JEDEC.95, MO-153
o
WOLFSON MICROELECTRONICS LTDProduction Data Rev1.0 June 1999
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