Atec TSE-11-A User Manual

Thermal Shock Chamber

TSE 11A

CAT.NO.E01133-T1202

ESPEC offers a compact, but highly performant thermal shock chamber ideal for the requirements of test standards with small and low-volume specimen.

Equipped with superior temperature recovery performance capable of answering the requirements of severe test specifications,

this thermal shock model offers a wide test area in a compact, slim design.

1	*The paperless recorder and additional overheat protector are optional.

Characteristics

A high performance compact package to meet severe test requirements.

A temperature recovery time of less than 5 minutes is achieved in 2 zones ( 150 and 65 ) without auxiliary cooling

By realizing a temperature recovery time of less than 5 minutes for the upstream air in the 2 zones ( 150 and 65 ), we have achieved performance equivalent to that of a large thermal shock chamber without having to use auxiliary cooling by means of liquid carbon dioxide, which was required in previous compact thermal shock chamber.

Complies with MIL-STD-883H and other test standards

This compact thermal shock chamber satisfies the temperature cycle test requirements of MIL-STD-883H and other test standard (see page 5).

Smooth specimen transfer

The "soft-move mode" is used to reduce vibration shock when specimens are moving between the hot and cold chambers.

Uniform temperature distribution across specimens

High temperature uniformity performance ensures consistent stress on specimens.

High-temperature exposure Low-temperature exposure

● Examples of temperature uniformity

● Test conditions			●Temperature uniformity measurement method
High temperature exposure	150 30 min.		Thermocouples were embedded in 10 plastic
Low temperature exposure	65 30 min.		molded ICs (16 pin DIPs), which were then
Specimen	Plastic molded IC 2kg		placed on two levels in each of the corners
			and in the center of a specimen basket.
				Sensor temperature
			Within ±1.5 (Test area: upstream)

Within ±1.0

2