WM5628L and WM5628 are Octal 8-bit digital to analogue
converters (DAC) controlled via a serial interface. Each
DAC's output voltage range is programmable for either x1
or x 2 its reference input voltage, allowing near rail to rail
operation for the x 2 output range. High impedance
buffered voltage reference inputs are provided for each
group of four DACs. WM5628L operates on a single
supply voltage of 3 V while WM5628 operates on 5 V .
WM5628/L interfaces to all popular microcontrollers and
microprocessors via a three wire serial interface with CMOS
compatible, schmitt trigger, digital inputs. An 12 bit
command word comprises 3 DAC select bits, an output
range selection bit and 8-bits of data.
Individual or all DAC outputs are changed using
WM5628/L's double buffered DAC registers and the
separate LOAD and LDAC inputs. DAC outputs are
updated simultaneously by writing a complete set of new
values and then pulsing the LDAC input.
The DAC outputs are optimised for single supply
operation and driving ground referenced loads.
An internal power-on-reset function sets the DAC's input
codes to zero at power up.
Ideal in space critical applications WM5628/L is available
in wide-bodied and DIP packages for commercial (0
o
C) and industrial (-40oC to 85oC) temperature ranges.
70
o
C to
Pin Configuration
Features
•Eight 8-bit voltage output DAC's
•Three wire serial interface
•Programmable x1 or x 2 output range.
•Power-on-reset sets outputs to zero
•Buffered voltage reference inputs
•Simultaneous DAC output update
Key Specifications
•Single supply operation:
WM5628L : 3 V
WM5628: 5 V
Production Data data sheets contain
final specifications current on publication
date. Supply of products conforms to
Wolfson Microelectronics standard terms
and conditions
DEVICETEMP. RANGE PACKAGE
WM5628CN0oC to 70oC16 pin plastic DIP
o
WM5628CDW0
C to 70oC16 pin wide-bodied plastic SO
WM5628IN-40oC to 85oC16 pin plastic DIP
WM5628IDW-40oC to 85oC16 pin wide-bodied plastic SO
WM5628LCN0oC to 70oC16 pin plastic DIP
WM5628LCDW0oC to 70oC16 pin wide-bodied plastic SO
WM5628LIN-40oC to 85oC16 pin plastic DIP
WM5628LIDW-40oC to 85oC16 pin wide-bodied plastic SO
Wolfson Microelectronics
Lutton Court, Bernard Terrace, Edinburgh EH8 9NX, UK
VDD = 3 .6V , GND = 0 V, VREF = 2 V x 1 gain, RL = 10 kΩ, CL = 100 pF, TA = full range, unless otherwise stated.
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT
Dynamic Performance
Output settling timeT o 1/2LSB, VDD=3V & 5V (note 13)10µs
Output slew rate1V/µs
Input bandwidth(note 14)100kHz
Large Signal BandwidthMeasured at -3dB point100kH z
Digital CrosstalkClk = 1MHz sq wave measured at-50dB
DACA - DACD
Notes:
1. Absolute Maximum Ratings are stress ratings only.
Permanent damage to the device may be caused by
continuously operating at or beyond these limits.
Device functional operating range limits are given
under Recommended Operating Conditions.
Guaranteed performance specifications are given
under Electrical Characteristics at the test conditions
specified.
2. Total Unadjusted Error is the sum of integral linearity
error, zero code error and full scale error over the input
code range.
3. Differential Nonlinearity (DNL) is the difference
between the measured and ideal 1 LSB amplitude
change of any two adjacent codes. A guarantee of
monotonicity means the output voltage changes in the
same direction (or remains constant) as a change in
the digital input code.
4. Integral Nonlinearity (INL) is the maximum deviation of
the output from the line between zero and full scale
(excluding the effects of zero code and full-scale
errors).
5. Zero code error is the deviation from zero voltage
output when the digital input code is zero.
6. Zero code error temperature coefficient is given by:
ZCETC = (ZCE(T
max - ZCE(Tmin)) /VREF x 10
6
/ (Tmax
- Tmin)
8. Full-scale error is the deviation from the ideal full-scale
output (V
REF - 1LSB) with an output load of 10kΩ
9. Full-Scale T emperature Co-ef ficient is given by:
FSETC = (FSE(Tmax) - FSE(Tmin)) / VREF x 10
/ Tmax - T min)
10. Full Scale Error Rejection Ratio (FSE-RR) is
measured by varying the V
DD voltage from 4.5 to
5.5 V d.c. and measuring the proportion of this signal
imposed on the full-scale output voltage
11 Reference feedthrough is measured at a DAC output
with an input code = 00 Hex with a V
REF input = 1 Vdc
+ 1 VPP at 10kHz
12. Channel to channel isolation is measured at a DAC
output with an input code of one DAC to FF Hex and
the code oa all other DACs to oo Hex with a V
put = 1 V
dc + 1 Vpp at 10kHz
13 Setting time is the time for the output signal to remain
within ±0.5 LSB of the final measurement value for a
digital input code change of 00 Hex to FF Hex. For
WM 5628: V
WM5628L: V
DD = 5V , VREF = 2V and range = x 2. For
DD = 3, VREF = 1.25V and range = x 2.
14 Reference bandwidth is the -3dB bandwidth with an
input at VREF = 1.25 Vdc =+ 2 Vpp with a digital input
code of full-scale.
6
REF in-
7. Zero-code Error Rejection Ratio (ZCE-RR) is
measured by varying the V
DD voltage, from 4.5 to 5.5
V d.c., and measuring the proportion of this signal
imposed on the zero-code output voltage.
Wolfson Microelectronics
5
Page 6
WM5628L, WM5628
s
Parameter Measurement Information
DACA
DACB
DACC
.
.
DACH
Slewing Settling Time and Linearity Measurements
Typical Performance Characteristics
Typical DNL, INL and TUE * at VDD = 5 V
10KΩCL - 100pF
0.2
0.1
0
Error (lsb)
-0.1
-0.2
032 64 96 128 160 192 224 256
0.5
0.25
0
Error (lsb)
-0.25
-0.5
0 32 64 96 128 160 192 224 256
* see note 2
Differential Nonlinearity
VDD = 5 V, Vref = 2.5 V, Range x 1, TA = 25oC
Input Code
Total Unadjusted Error
VDD = 5 V, Vref = 2.5 V, Range x 1, TA = 25oC
Input C ode
Integra l Nonline a rity
VDD = 5 V, Vref =2.5 V, Range x 1, TA = 25oC
0.4
0.2
0
Error (lsb)
-0.2
032 64 96 128 160 1 92 224 256
Input Code
Differentia l Nonline arity
VDD = 5 V, Vref = 1.25 V, Range x 2, TA = 25oC
0.2
0.1
0
Error (l
-0.1
-0.2
032 64 96 1 28 160 192 2 24 256
Input Code
6
Wolfson Microelectronics
Page 7
Typical Performance Characteristics (continued)
s
s
s
nt
)
)
V
T
V
R
I
s
)
)
R
I
5
V
V
V
V
V
V
V
Typical DNL, INL and TUE * at VDD = 5 V (continued)
WM5628L, WM5628
Integra l Nonline arity
VDD = 5 V, Vref = 1.25 V, Ra n g e x 2, TA = 25oC
0.4
0.2
0
Error (l
-0.2
032 64 96 128 1 60 192 224 2 56
Input Code
Typical DNL, INL and TUE at VDD = 3 V
Differential Nonlinearity
VDD = 3 V, Vref = 1.25 V, Ran g e x 2, TA = 25oC
0.2
0.1
0
Error (lsb)
-0.1
-0.2
032 64 96 128 160 192 224 256
Input Code
Total Una djusted Error
VDD = 3 V, Vref = 1.25 V, Ran ge x 2, TA = 25oC
0.5
0.25
0
Error (l
-0.25
-0.5
032 64 96 128 160 192 224 2 56
Input Code
Total Unadjusted E rror
VDD = 5 V, Vref = 1.25 V, Ra n ge x 2, TA = 25oC
0.5
0.25
0
-0.25
Error (l
-0.5
032 64 96 128 160 192 224 256
Input Code
Integral Nonlinearity
V
= 3 V, Vref = 1.25 V, Rang e x 2, TA = 25oC
DD
0.5
0.25
0
-0.25
Error (lsb)
-0.5
032 64 96 128 1 60 192 224 256
Input Code
Output Source Curre
vs Output Volt age
8
7
6
5
4
DD = 5 V
(mA
I
= 25OC
A
out
= 2 V
ref
3
ange = x 2
n put code = 255
2
1
0
012345
V
(V
out
2.4
2.2
1.8
IDD (mA
1.6
1.4
Supply Current v
Temperature
DD + 3V
ref = 1.25
DD = 5
ref = 2
o
C
ange = x 2
2
nput Code = 25
-50 -250255075 100
Temperature ('C
Wolfson Microelectronics
7
Page 8
WM5628L, WM5628
y
)
)
V
T
V
I
y
z)
)
V
T
V
I
T ypical Performance Characteristics (continued)
Large Signal Frequenc
Response
2
0
-2
-4
-6
-8
-10
DD = 5 V
A
-12
= 25OC
ref = 1.25 Vdc + 2 Vpp
Relative Gain (dB
-14
nput Code = 255
-16
-18
-20
1101001000
Frequency (kHz
Positive Rise and Settling Time VDD = 3 V
500 mV/Vert. div
2 µs/Hor. div
VDD = 3 V
O
A = 25
C
T
code 00 to FF Hex
Range = x 2
Vref = 1.25 V
Small Signal Frequenc
Response
10
0
-10
-20
DD = 5 V
-30
= 25OC
A
ref = 2 Vdc + 0.5 V
-40
nput code = 255
Relative Gain (dB
-50
-60
110100100010000
pp
Frequency (kH
Negative Fall and Settling Time VDD = 3 V
VDD = 3 V
O
A = 25
C
T
500 mV/Vert. div
2 µs/Hor. div
code FF to 00 Hex
Range = x 2
Vref = 1.25 V
Rise time = 2.5 µs, Positive slew rate = 0.80 µs
Settling time = 4.5 µs
Positive Rise and Settling Time VDD = 5 V
1 V/Vert. div
2 µs/Hor. div
DD = 5 V
V
O
A = 25
C
T
code 00 to FF Hex
Range = x 2
Vref = 2 V
Rise time = 3.75 µs, Positive slew rate = 0.54 µs
Settling time = 5.9 µs
8
Wolfson Microelectronics
Fall time = 4.85 µs, Negative slew rate = 0.41 µs
Settling time = 8.0 µs
Negative Fall and Settling Time VDD = 5 V
VDD = 5 V
O
C
TA = 25
code FF to 00 Hex
Range = x 2
Vref = 2 V
1 V/Vert. div
5 µs/Hor. div
Fall time = 5.9 µs, Negative slew rate = 0.54 µs
Settling time = 8.5 µs
Page 9
Equivalent Input and Output Circuits
D
Data Input Timing
Load and LDAC Timing
Timing Waveforms
WM5628L, WM5628
CLK
ata
50 %
t
SD
t
HD
CLK
Load
50 %
t
HL
t
WL
t
LD
t
SL
t
WD
LDAC
Wolfson Microelectronics
9
Page 10
WM5628L, WM5628
1234567891011
12
L
L
L
123456789101112
L
Timing Diagrams
CLK
Data
Load
DAC
A1A2A0
RNG
D7D6D5D4D3D2D1D0
Figure 1. Load controlled update (LDAC = 0)
1234567891011
CLK
Data
Load
DAC
A1A2A0
RNG
D7D6D5D4D3D2D1D0
Figure 2. LDAC controlled update
CLK
Data
A2A1 A0
RNG
12
D7D6 D5D4D3D2D1D0
Load
DAC
CLK
Data
Load
DAC
Figure 3. Load controlled update (LDAC = 0) using 8-bit serial word.
123456789101112
A2A1A0
RNG
D7D6D5D4D3D2D1D0
Figure 4. LDAC controlled update using 8-bit serial word.
10
Wolfson Microelectronics
Page 11
WM5628L, WM5628
Pin Descriptions
Pin Name Type Function
1DACBAnalogue outputDAC B output
2DACAAnalogue inputDAC A output
3GNDSupplyGround return
4DataDigital inputSerial data input
5CLKDigital inputSerial interface clock, negative edge sensitive
6VDDSupplyPositive supply voltage
7DACEAnalogue outputDAC E output
8DACFAnalogue outputDAC F output
9DACGAnalogue outputDAC G output
10DACHAnalogue outputDAC H output
11Ref2Analogue inputReference to DACE, DACF, DACG and DACH
12LoadDigital inputSerial input load
13LDACDigital inputDAC update latch control
14Ref1Analogue inputReference to DACA, DACB, DACC and DACD
15DACDAnalogue outputDAC D output
16DACCAnalogue outputDAC C output
Functional Description
DAC operation
Each of WM5628/L 's eight digital to analogue converters
(DACs) are implemented using a single resistor string with
256 taps corresponding to each of the input 8-bit codes.
One end of a resistor string is connected to the GND pin
and the other end is driven from the output of a reference
input buffer. The use of a resistor string guarantees
monotonicity of the DAC's output voltage. Linearity depends
upon the matching of the resistor string's individual elements
and the performance of the output buffe r. Two high input
impedance voltage reference buffers are provided, each
driving four DACs,
Each DAC has a voltage output amplifier which is
programmable for gains of x1 or x 2 through the serial
interface. The DAC output amplifiers feature rail to rail
output stages, allowing outputs over the full supply voltage
range to be achieved with a x 2 gain setting and a V
reference voltage input. Used in this way a slight
degradation in linearity will occur as the output voltage
approaches V
A power-on-reset activates at power up resetting the DACs
inputs to code 0. Each output voltage is given by:
DD.
out = Vref x CODE/256 x (RNG+1 )
V
DD/2
Data Interface
WM5628/L's eight double buffered DAC inputs allow
several ways of controlling the update of each DAC's
output.
Serial data is input, MSB first, into the DA T A input pin Serial
Input DAC Address and Output Tables using CLK, LOAD
and LDAC control inputs and comprises 3 DAC address
bits, an output range (RNG) bit and 8 DAC input bits.
With the LOAD pin high data is clocked into the DATA pin
on each falling edge of CLK. Any number of data bits may
be clocked in, only the last 12 bits are used. When all data
bits have been clocked in, a falling edge at the LOAD pin
latches the data and RNG bits into the correct 9 bit input
latch using the 3 bit DAC address.
If the LDAC input pin is low, the second latch at the DAC
input is transparent, and the DAC input and RNG bit will be
updated on the falling edge of LOAD simultaneously with
the input latch, as shown in figure 1. If the LDAC input is high
during serial data input, as shown in figure 2, the falling edge
of the LOAD input stores the data in the addressed input
latch. The falling edge of LDAC updates the second latches
from the input latches and hence the DAC outputs.
Where:RNG controls the output gains of x 1 and x 2
CODE is the range 0 to 255
Wolfson Microelectronics
11
Page 12
WM5628L, WM5628
Functional Description (continued)
Using these inputs individual DACs can be updated using
one 12 bit serial input word and the LOAD pin. Using both
LOAD and LDAC, all or selected DACs can be updated
after an appropriate number of data words have been
inputted. Figures 3 &4 illustrate operation with the 8 clock
pulses available from some microprocessors. If the data
input is interrupted in this way the clock input must be held
low during the break in clock pulses.
The RNG bit controls the DAC output range. When RNG = 0
the output is between Vref(A,B,C,D) and GND and when
RNG = 1 the range is between 2 x Vref (A,B,C,D) and GND.
01111111(127/256) x Ref (1 + RNG)
10000000(128/256) x Ref (1 + RNG)
11111111(255/256) x Ref (1 + RNG)
12
Wolfson Microelectronics
Page 13
Functional Description (Continued)
Linearity, offset, and gain error using
single end supplies
When an amplifier is operated from a single supply, the
voltage offset can still be either positive or negative. With a
positive offset, the output voltage changes on the first code
change. With a negative offset the output voltage may not
change with the first code depending on the magnitude of
the offset voltage.
The output amplifier, with a negative voltage of fset, attempts
to drive the output to a negative voltage. However , because
the most negative supply rail is GND, the output cannot drive
to a negative voltage.
So when the output offset voltage is negative, the output
voltage remains at ZERO volts until the input code value
produces a sufficient output voltage to overcome the
inherent negative offset voltage, resulting in the transfer
function shown below
WM5628L, WM5628
This negative offset error, not the linearity error, produces
this breakpoint. The transfer function would have followed
the dotted line if the output buffer could drive to a negative
voltage.
For a DAC, linearity is measured between ZERO input code
( all inputs 0 ) and full scale code ( all inputs 1 ) after offset
and full scale are adjusted out or accounted for in some way .
However, single supply operation does not allow for
adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity in the unipolar
mode is measured between full scale code and the lowest
code which produces a positive output voltage. The code is
calculated from the maximum specification for the negative
offset.
A. Dimensions are in inches
B. Falls within JEDEC MS-001( 20 pin package is shorter than MS-001)
C. N is the maximum number of terminals
D. All end pins are partial width pins as shown, except the 14 pin package which is full width.
N/2
14
Rev. 1 November 96
Wolfson Microelectronics
Page 15
Package Description
Wide body Plastic Small-Outline Package
1,27 B.S.C.
0,51
16
0,33
0,25 M
WM5628L, WM5628
DW - 16 pin shown
PINS**
9
DIM
A MAX
16
10,50
20
13,00
24
15,60
28
18,10
10,65
10,00
7,60
7,40
18
2,65
2,35
A
0,30
0,10
0,10
A MIN
0,33
0,23
0o - 8
10,10
o
12,60
Gauge Plane
15,20
1,27
0,40
17,70
0.75 x 45
0.25 x 45
Notes:
A. Dimensions in millimeters.
B. Complies with Jedec standard MS-013.
C. This drawing is subject to change without notice.
D. Body dimensions do not include mold flash or protrusion.
E. Dimension A, mould flash or protrusion shall not exceed 0.15mm. Body width, interlead flash or protrusions shall not
exceed 0.25mm.
0
0
Wolfson Microelectronics
Rev. 1 November 96
15
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