Atec Agilent-4284A, Agilent-4285A User Manual

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Agilent 4284A/4285A

Precision LCR Meter Family

20 Hz to 1 MHz

75 kHz to 30 MHz

Technical Overview

Agilent

precision LCR meter family

Utilize state-of-the art measurement technologies

6-digits of resolution at any range

Basic accuracies of 0.05% (Agilent 4284A) and 0.1% (Agilent 4285A)

20 impedance parameters to access and measure

Constant V or I test signal level

20 Vrms test signal level (Agilent 4284A)

Move your process toward error-free operation

Instrument setup state storage

Comparator functions

Selectable frequency error corrections

Open, short and load corrections remove parasitics

1.Refer to specifications for complete accuracy.

2.Supplimental information only.

Key specifications

Agilent 4284A precision LCR meter

Test frequency

20 Hz to 1 MHz over 8610 selectable frequencies

 

 

Measurement range1

 

 

|Z|, R, X :0.01 mΩ to 99.9999 MΩ

 

|Y|, G,B :0.01 nS to 99.9999 S

 

C :0.01 fF to 9.99999 F

 

L :0.01 nH to 99.9999 kH

 

D :0.000001 to 9.99999

 

Q :0.01 to 99999.9

 

 

Basic accuracy

|Z| , C and L:0.05% D:0.0005

 

 

Test signal level range

 

Voltage

5 mVrms to 2 Vrms

Current

50 µArms to 20 mArms

 

 

Constant test signal level range

 

Voltage

10 mVrms to 1 Vrms

Current

100 µArms to 10 mArms

 

 

Measurement time 2

39 ms/190 ms/830 ms at 1 kHz

 

 

4284A with Option 4284A-001

Test signal level range

 

Voltage

5 mVrms to 20 Vrms

Current

50 µArms to 200 mArms

 

 

Constant test signal level range

 

Voltage

10 mVrms to 10 Vrms

Current

100 µArms to 100 mArms

 

 

Internal DC bias

± (1 mV ~ 40 V), ≤ 100 mA, 0.1% accuracy

 

 

4284A with Option 4284A-002 and 42841A

DC current bias

0.01 A to 20 A (with 42841A and 42842A)

 

0.02 A to 40 A (with 42841A x 2 ea., 42842B and 42843A)

 

 

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Satisfying your performance needs

Adapt instrument configurations to fit your test needs

Internal voltage biasing up to ±40 Vdc3

High current biasing up to 40 A dc3 (Agilent 4284A)

Wide range of frequencies, 20 Hz to 30 MHz

BIN’ing and comparator functions for handlers

SMD, axial and radial test fixtures3

Simplify your system development and integration

Programming language compatible with IEEE 488.2

Test port extensions: maximum 4 m for 4284A3 and 2 m for 4285A

Identical operation for the entire family of products

Scanner, handler and GPIB interfaces3

1.Refer to specifications for complete accuracy.

2.Supplimental information only.

3.The options, the accessories, or the test fixtures are needed.

Key specifications

Agilent 4285A precision LCR meter

Test frequency

75 kHz to 30 MHz with 100 Hz resolution

 

 

Measurement range1

 

 

|Z|, R, X :0.01 m Ω to 99.9999 MΩ

 

|Y|, G,B :0.01 nS to 99.9999 S

 

C :0.01 fF to 999.999 µF

 

L :0.001 nH to 99.9999 H

 

D :0.000001 to 9.99999

 

Q :0.01 to 99999.9

 

 

Basic accuracy

|Z|, C and L:0.1% D:0.001

 

 

Test signal level range

 

Voltage

5 mVrms to 2 Vrms

Current

200 µArms to 20 mArms

 

 

Constant test signal level range

 

Voltage

10 mVrms to 1 Vrms

Current

100 µArms to 20 mArms

 

 

Measurement time2

30 ms/65 ms/200 ms

4285A with Option 4285A-001

Internal DC bias ± (1 mV ~ 40 V), ≤ 100 mA, 0.1% accuracy

4285A with Option 4285A-002, 42841A, and 42842C

DC current bias 0.01 A to 10 A

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Versatile component measurements

Characterize inductive devices

Sweep high current conditions

Identify device properties precisely

Test to RF frequencies

Low frequency measurements: Agilent 4284A

Inductive devices can now be accurately characterized from 20 Hz to 1 MHz with a dc bias current up to 40 A1 dc.

High frequency measurements: Agilent 4285A

The Agilent 4285A’s wide 75 kHz to 30 MHz range allow you to test RF inductors with improved accuracy and 0.001 nH resolution. Magnetic heads, ferrite-cores, and power inductors that need to be tested at a specified current signal level can be easily tested with the Agilent 4285A.

Precise ceramic capacitor measurements

Test at 1 kHz and 1 MHz

Resolve measurements to low values

Maintain constant signal levels

1 kHz and 1 MHz are the primary testing frequencies for ceramic materials and capacitors. The Agilent 4284A can provide these test frequencies while maintaining an equally excellent accuracy and 6-digits of measurement resolution.

1 MHz accuracies of capacitance (0.05%) and dissipation factor (0.0005) are essential for characterizing DUTs with low dissipation factors. Dissipation factors can change as a function of the applied test signal level to the DUT. For reliable and consistent measurements, the Agilent 4284A can maintain a constant voltage test signal level.

1. Need Option 4284A-001

Inductance rolloff due to high dc current bias

Dissipation factor rise due to high ac signal

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Adaptable parameter testing

Discover new material properties

High accuracy and precise measurements

Wide frequency ranges

High test signal levels

Agilent 16451B dielectric test fixture

The Agilent precision LCR meter family provides the accuracy, resolution, high test signal and bias levels1 required for material measurements. Using the Agilent 16451B dielectric test fixture provides you with accurate permittivity and dissipation factor measurements.

The ability to output a constant test signal level permits repeatable and accurate magnetic/dielectric measurements. Both the Agilent 4284A and Agilent 4285A offer variable voltage and current test signal level control.

Semiconductor testing

Extend the test cable to the DUT

Detect small parameter changes

Rapidly acquire data

Test at multiple frequencies

Both instruments allow you to extend the front panel measurement port through test cables, switches, and probers directly to the DUT. The 6-digits of resolution give you the ability to sense and identify changes not normally seen by conventional LCR meters.

The accuracies of the Agilent 4284A at key test frequencies up to 1 MHz permit complete DUT evaluation for either production or laboratory needs.

For high speed device testing at frequencies above 1 MHz, the best solution is the Agilent 4285A.

1. Need Option 4284A/4285A-001

A material’s characteristics versus frequency

C-V characteristics sample—MOS diode

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Atec Agilent-4284A, Agilent-4285A User Manual

One LCR meter family

for your product’s life cycle

Research and development

Research tomorrow’s electronic components now

Increase measurement confidence

The basic accuracies are:

Agilent 4284A 0.05% and Agilent 4285A 0.1%.

Detect 1 ppm changes

The 6-digits of resolution permit you to measure differences in materials not detectable before.

Fit the instrument to your test needs

For low frequency applications the Agilent 4284A is the ideal tool. For testing at RF frequencies the Agilent 4285A is the best solution.

Material design

Design and test new materials

Material test fixtures

For accurate permittivity and dissipation factor measurements of solid dielectric materials, the 16451B dielectric test fixture is provided. The 16452A liquid test fixture is provided for the permittivity measurements of liquids with minimal conductivity.

Sample program

By using the sample program in the operation manual of 16451B, complex permittivity can be calculated rather easily and instantly. In addition, with the use of a spreadsheet soft ware, the frequency response of permittivity can be displayed in a graph.

1.For 4284A, need Option 4284A-006

2.Choose the combination from Option 4284A/4285A-201, 4284A/4285A-202, or 4284A/4285A-301

3.Need Option 4284A/4285A-301

Production test

Reduce production test factors

Increase test throughput

The precision LCR meter family reduces testing costs by providing accurate high throughput testing.

Interface easily to handlers

Built-in comparator, cable compensation1, and interfaces2 permit system integration.

Minimize operator error

Instrument state storage minimizes costly setup errors.

Quality assurance

Automated quality assurance

Reduce your system development time

The Agilent 4284A and Agilent 4285A are designed to be used as elements in systems. This means GPIB, programming, and the ability to interface with scanners3.

Painlessly integrate the system

GPIB and a scanner3 interface allow the instruments to easily integrate into system configurations.

Leverage your programming experience

Learning to program one instrument automatically means you learn both.

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Comprehensive incoming inspection

Satisfying difficulties and requirements of impedance measurements during incoming inspection

Many types of measurements requiring a variety of measurement conditions have to be carried out during incoming inspection. However, as measurement instruments cannot perform all of the measurements required, substitute measurements are made. On the other hand, purchasing all the necessary equipment would substantially increase capital costs.

By employing the precision LCR meter family, a wide frequency range is covered (20 Hz to 1 MHz for 4284A and 75 kHz to

30 MHz for 4285A) and various test signal levels can be set (20 Vrms/200 mArms for 4284A Option 4284A-001 and

2 Vrms/20 mArms for 4285A). In addition, the ALC function allows measurements of constant-voltage and constant-current signals, and the added capability of Option 4284A/4285A-001 enables up to ±40 V of dc bias to be applied to the DUT. As a result of these features, a variety of measurement conditions can be carried out.

Furthermore, the precision LCR meter family achieves high accuracy measurements (basic |Z| measurement accuracy: 0.05% for 4284A and 0.1% for 4285A), permitting the characteristics of inductors and capacitors to be evaluated with excellent reliability. Also, built-in compensation functions reduce the influence of test fixtures to a minimum, further raising the reliability.

Built-in functionalities

for efficient measurements

In order to save time and facilitate the efficiency of measurement routines, the precision LCR meter family has the following features. The memory card1 allows the measurement conditions to be preset for various components with different measurement needs. The comparator function can be set to sort into a maximum of 10 BINs, enabling many components to be handled during inspection. The Option 4284A/4285A-301 scanner interface solves the problem of having discrepancies in measurement values for different channels of the switching matrix by allowing channel compensation for up to 128 channels.

1. Need Option 4284A/4285A-004

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User friendly Interface

Simple front panel operation

Clearly view the display

See all instrument settings

Interactive softkeys for simple control

Directly view all instrument settings and measurement results on the large LCD display. This simplifies operation and improves operator efficiency by minimizing readout error.

The softkeys simplify front panel operation by allowing the user to easily change instrument states by moving the LCD cursor with cursor keys. The softkeys

will automatically change to reflect the cursor’s position. This minimizes the number of menus and key strokes.

Customized test frequencies

Non-volatile memory

Eliminate costly setup errors

Increase user productivity

Archive tests

The instruments contain two types of user accessible memory; internal and external (memory cards)1. The memory can easily be used to store measurement setups. Later, a setup can be loaded back into the instrument. This reduces test setup errors and increases the user’s productivity.

The memory can store 10 different instrument states, complete with correction data and system configuration. Entire

setups including limit information can

now be stored and loaded using either Inserting the memory card1 the internal memory or the memory card1.

The memory card1 system is completely electronic and is based on EEPROM.

1. Need Option 4284A/4285A-004

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Testing with the proper tools

Measure the components’ performance in your power supply

Test your components under load conditions

Bias inductive devices with high currents

Satisfy your needs with the right instrument

Designing advanced switching power supplies require the use of inductors and transformers that operate in the RF regions.

For low frequencies, the Agilent 4284A1 precision LCR meter with the

Agilent 42841A bias current source,

High current bias for inductor testing under load conditions

and the 42842A/B bias current test fixtures all combine to form a 40 A dc test system.

Where a high frequency measurement is required, use an Agilent 4285A2, an Agilent 42842C bias current test fixture,

and an Agilent 42841A bias current source to achieve up to 10 A dc biasing with measurements at 30 MHz.

Reduce system development time

The 4284A and 4285A employ a programming language, which is compatible with the IEEE 488.2. Since the command names are similar to the measurement functions, the time spent for creating and debugging programs can be largely minimized. The

operation manual lists several key sample

programs, allowing the user to efficiently Code generation made easy create a program for their measurement

system.

1.Need Option 4284A-002

2.Need Option 4285A-002

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