The Harris CD74HC4094 and CD74HCT4094 are 8-stage
serial shift registers having a storage latch associated with
each stage for strobing data from the serial input to parallel
buffered three-state outputs. The parallel outputs may be
connected directly to common bus lines. Data is shifted on
positive clock transitions. The data in each shift register
stage is transferred to the storage register when the Strobe
input is high. Data in the storage register appears at the
outputs whenever the Output-Enable signal is high.
Two serial outputs are available for cascading a number of
these devices. Data is available at the QS
serial output
1
terminal on positive clock edges to allow for high-speed
operation in cascaded system in which the clock rise time is
fast. The same serial information, available at the QS
terminal on the next negative clock edge, provides a means
Functional Diagram
2
3
8-STAGE
SHIFT
REGISTER
DAT A
CP
for cascading these devices when the clock rise time is slow.
Ordering Information
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC4094E-55 to 12516 Ld PDIPE16.3
CD74HCT4094E-55 to 12516 Ld PDIPE16.3
CD74HC4094M-55 to 12516 Ld SOICM16.15
CD74HCT4094M-55 to 12516 Ld SOICM16.15
NOTES:
1. When ordering,use the entire part number. Add the suffix 96 to
2
obtain the variant in the tape and reel.
2. Waferordie for thispartnumber is availablewhich meets allelectrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
9
QS
1
10
QS
2
PKG.
NO.
STROBE
OE
1
15
8-BIT
STORAGE
REGISTER
THREE-
STATE
OUTPUT
4
Q
0
5
Q
1
6
Q
2
7
Q
3
14
Q
4
13
Q
5
12
Q
GND = 8
6
11
V
= 16
Q
CC
7
TRUTH TABLE
INPUTSPARALLEL OUTPUTSSERIAL OUTPUTS
CPOESTRDQ
0
Q
n
QS1 (NOTE 4)QS
2
↑LXXZZQ’6NC
↓LXXZZNCQ
7
↑HLXNCNCQ’6NC
↑HHLLQ
-1Q’6NC
n
2
CD74HC4094, CD74HCT4094
TRUTH TABLE
INPUTSPARALLEL OUTPUTSSERIAL OUTPUTS
CPOESTRDQ
↑HHHHQ
↓H H H NCNCNCQ
NOTES:
3. H = High Voltage Level, L = Low Voltage Level, X = Don’t Care, NC = No charge, Z = High Impedance Off-state,
↑ = Transition from Low to High Level, ↓ = Transition from High to Low.
4. At the positive clock edge the information in the seventh register stage is transferred to the 8th register stage and QS1 output.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
5. θJA is measured with the component mounted on an evaluation PC board in free air.
FIGURE 1. DATA PROPAGATION DELAYS, SET-UP AND HOLD TIMES
INPUT LEVEL
GND
t
V
S
SU
t
H
INPUT LEVEL
V
S
GND
t
W
V
S
V
S
V
OH
V
OL
V
OH
V
OL
= 6ns
t
r
OE90%
t
PLZ
OUTPUT
LOW TO OFF
t
PHZ
OUTPUT
HIGH TO OFF
OUTPUTS
CONNECTED
GND
V
OH
V
OL
t
PHL
V
OH
V
OL
10%
90%
OUTPUTS
DISCONNECTED
t
= 6ns
f
V
t
t
S
10%
PZL
V
S
PZH
V
S
OUTPUTS
CONNECTED
FIGURE 2. STROBE PROPAGATIONDELAYS AND SET-UP
AND HOLD TIMES
FIGURE 3. ENABLE AND DISABLE TIMES
9
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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