The Harris CD74HC374, CD74HCT374, CD74HC574 and
CD74HCT574 are Octal D-Type Flip-Flops with Three-State
Outputs and the capability to drive 15 LSTTL loads. The eight
edge-triggered flip-flops enter data into their registers on the
LOW to HIGH transition of cloc k (CP). The Output Enable
(
OE) controls the three-state outputs and is independent of
the register operation. When Output Enable (
outputs will be in the high impedance state. The 374 and 574
are identical in function and differ only in their pinout
arrangements.
Ordering Information
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC374E-55 to 12520 Ld PDIPE20.3
CD74HCT374E-55 to 12520 Ld PDIPE20.3
CD74HCT574E-55 to 12520 Ld PDIPE20.3
CD74HC574E-55 to 12520 Ld PDIPE20.3
CD74HC574M-55 to 12520 Ld SOICM20.3
CC
CD74HC374M-55 to 12520 Ld SOICM20.3
CD74HCT374M-55 to 12520 Ld SOICM20.3
CD74HCT574M-55 to 12520 Ld SOICM20.3
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Wafer and die for this part number is available which meets all
electrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
OE) is HIGH the
PKG.
NO.
Pinouts
CD74HC374, CD74HCT374
(PDIP, SOIC)
TOP VIEW
1
OE
Q0
2
D0
3
D1
4
Q1
5
Q2
6
D2
7
8
D3
9
Q3
GND
10
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
NOTE:
H = High Level (Steady State)
L = Low Level (Steady State)
X = Don’t Care
↑ = Transition from Low to High Level
Q0= The level of Q before the indicated steady-state input conditions
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For f
, input duty cycle = 50%.
MAX
FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
tr = 6nstf = 6ns
V
t
CC
GND
TLH
INPUT
t
THL
90%
50%
10%
90%
t
50%
10%
PLH
INVERTING
OUTPUT
t
PHL
FIGURE 3. HCTRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
tfC
L
V
CC
50%
GND
t
H(L)
V
CC
50%
t
SU(L)
GND
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
90%
10%
t
H(H)
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For f
, input duty cycle = 50%.
MAX
FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
= 6ns
tr = 6ns
INPUT
t
2.7V
1.3V
0.3V
THL
t
f
3V
GND
t
TLH
90%
t
PLH
1.3V
10%
INVERTING
OUTPUT
t
PHL
FIGURE 4. HCTTRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
2.7V
0.3V
t
H(H)
1.3V
1.3V
tfC
L
3V
1.3V
GND
t
H(L)
3V
1.3V
t
SU(L)
GND
OUTPUT
t
REM
V
CC
SET, RESET
OR PRESET
50%
90%
t
PLH
IC
t
TLH
t
THL
90%
50%
10%
t
PHL
GND
C
L
50pF
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
OUTPUT
t
REM
3V
SET, RESET
1.3V
90%
1.3V
t
t
PLH
TLH
90%
1.3V
10%
t
t
PHL
THL
OR PRESET
IC
C
L
50pF
FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
GND
CD74HC374, CD74HCT374, CD74HC574, CD74HCT574
Test Circuits and Waveforms
6ns6ns
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
50%
t
t
OUTPUTS
ENABLED
PLZ
PHZ
90%
10%
90%
OUTPUTS
DISABLED
(Continued)
10%
t
PZL
t
PZH
FIGURE 7. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
50%
50%
OUTPUTS
ENABLED
IC WITH
THREE-
STATE
OUTPUT
V
CC
GND
OUTPUT
R
0.3
t
t
PZH
6ns
PZL
t
r
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
t
t
OUTPUTS
ENABLED
6nst
PLZ
PHZ
10%
90%
f
2.7
1.3
OUTPUTS
DISABLED
FIGURE 8. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
= 1kΩ
L
C
L
50pF
VCC FOR t
GND FOR t
PLZ
PHZ
AND t
AND t
PZL
PZH
3V
GND
1.3V
1.3V
OUTPUTS
ENABLED
NOTE: Opendrain waveforms t
VCC, CL = 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
PLZ
and t
are the same as those for three-state shown on the left. The test circuit is Output RL=1kΩto
PZL
8
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pertaining to warranty, patent infringement, and limitation of liability.
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
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In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
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Copyright 1999, Texas Instruments Incorporated
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