FEATURES
500 MHz Driver Operation
Driver Inhibit Function
100 ps Edge Matching
Guaranteed Industry Specifications
50 ⍀ Output Impedance
>1.5 V/ns Slew Rate
Variable Output Voltages for ECL, TTL and CMOS
High Speed Differential Inputs for Maximum Flexibility
Ultrasmall 20-Lead SOP Package with Built-In Heat Sink
APPLICATIONS
Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems
Instrumentation and Characterization Equipment
PRODUCT DESCRIPTION
The AD53040 is a complete high speed pin driver designed for
use in digital or mixed-signal test systems. Combining a high
speed monolithic process with a unique surface mount package,
this product attains superb electrical performance while preserving optimum packaging densities and long-term reliability in an
ultrasmall 20-lead, SOP package with built-in heat sink.
Featuring unity gain programmable output levels of –3 V to
+8 V, with output swing capability of less than 100 mV to 9 V,
the AD53040 is designed to stimulate ECL, TTL and CMOS
logic families. The 500 MHz data rate capacity and matched
output impedance allows for real-time stimulation of these
digital logic families. To test I/O devices, the pin driver can
be switched into a high impedance state (Inhibit Mode), electrically removing the driver from the path. The pin driver leakage
current inhibit is typically 100 nA and output charge transfer
entering inhibit is typically less than 20 pC.
with Inhibit Mode
AD53040
FUNCTIONAL BLOCK DIAGRAM
V
V
CCVEE
CC
V
H
DATA
DATA
INH
INH
V
L
DRIVER
AD53040
GND
GND GND GND GND
The AD53040 transition from HI/LO or to inhibit is controlled
through the data and inhibit inputs. The input circuitry uses
high speed differential inputs with a common-mode range of
±3 V. This allows for direct interface to precision differential
ECL timing or the simplicity of stimulating the pin driver from a
single ended TTL or CMOS logic source. The analog logic HI/LO
inputs are equally easy to interface. Typically requiring 10 µA of
bias current, the AD53040 can be directly coupled to the
output of a digital-to-analog converter.
The AD53040 is available in a 20-lead, SOP package with a
built-in heat sink and is specified to operate over the ambient
commercial temperature range of –25°C to +85°C.
50V
1.0mA/K
V
EE
39nF39nF
V
HDCPL
V
OUT
V
LDCPL
TV
CC
THERM
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V ⴞ
3% unless otherwise noted. All temperature coefficients are measured at TJ = +75ⴗC–95ⴗC). (A 39 nF capacitor must be connected between
VCC and V
ParameterMinTypMaxUnitsTest Conditions
DIFFERENTIAL INPUT CHARACTERISTICS
Input Swing (Data to DATA, INH to INH)ECL2Volts
Max (DATA, DATA) to Min (INH, INH)
Max (INH, INH) to Min (Data, DATA)2Volts
Bias Current±10µAV
REFERENCE INPUTS
Bias Currents–50+50µAV
OUTPUT CHARACTERISTICS
Logic High Range–2+8VoltsDATA = H, VH = –2 V to +8 V
Logic Low Range–3+5VoltsDATA = L, V
Amplitude (V
Absolute Accuracy
V
V
V
V
Offset TC, V
Output Resistance454749ΩDATA = H, V
Output Leakage–1.0+1.0µAV
Dynamic Current Limit150mAC
Static Current Limit±65mAOutput to –3 V, V
PSRR, Drive Mode35dBVS = V
DYNAMIC PERFORMANCE, DRIVE
(VH and VL)
Propagation Delay Time1.5nsMeasured at 50%, V
Propagation Delay TC2ps/°CMeasured at 50%, V
Delay Matching, Edge to Edge100psMeasured at 50%, V
Rise and Fall Time
Rise and Fall Time TC
Overshoot, Undershoot and Preshoot±(1% +50 mV)% of Step + mVa. V
Settling Time
and between VEE and V
HDCPL
and VL)0.19VoltsVL = –0.05 V, VH = +0.05 V and
H
Offset–100+100 mVDATA = H, VH = –2 V to +8 V, VL = –3 V
H
Gain + Linearity Error±0.3 ±5% of V
H
Offset–100+100 mVDATA = L, VL = –3 V to +5 V, VH = +6 V
L
Gain + Linearity Error±0.3 ±5% of V
L
or V
H
L
1 V Swing0.8nsMeasured 20%–80%, V
3 V Swing1.7nsMeasured 10%–90%, V
5 V Swing2.4nsMeasured 10%–90%, V
1 V Swing±1ps/°CMeasured 20%–80%, V
3 V Swing±2ps/°CMeasured 10%–90%, V
5 V Swing±3ps/°CMeasured 10%–90%, V
to 15 mV40nsV
to 4 mV8µsV
Delay Change vs. Pulsewidth50psV
LDCPL
.)
= –2 V, 0.0 V
IN
, VH = 5 V
L
V
= –3 V (VH = –2 V to +6 V)
L
V
= –1 V (VH = +6 V to +8 V)
L
V
= –2 V, VH = +7 V
L
+ mVDATA = H, VH = –2 V to +8 V, VL = –3 V
H
+ mVDATA = L, VL = –3 V to +5 V, VH = +6 V
0.5mV/°CV
L
, VH = 0 V, +5 V and –3 V, 0 V
L
= 30 mA
I
OUT
= –3 V to +8 V
OUT
= 39 nF, VH = +7 V, VL = –2 V
BYP
DATA = H and Output to +8 V, V
V
= –3 V, DATA = L
L
V
= –400 mV
L
V
= –400 mV
L
V
= –400 mV
L
, VH = 0.0 V, 1.0 V
L
b. V
, VH = 0.0 V, 3.0 V
L
, VH = 0.0 V, 5.0 V
c. V
L
= 0 V, VH = 0.5 V
L
= 0 V, VH = 0.5 V
L
= 0 V, VH = 2 V,
L
= –3 V to +5 V, VH = +6 V
L
= +3 V, VL = 0 V,
H
= +8 V, VL = –1 V,
H
± 3%
S
= +400 mV,
H
= +400 mV,
H
= +400 mV,
H
L
L
L
L
L
L
= +6 V,
H
= 0 V, VH = 1 V
= 0 V, VH = 3 V
= 0 V, VH = 5 V
= 0 V, VH = 1 V
= 0 V, VH = 3 V
= 0 V, VH = 5 V
Pulsewidth = 2.5 ns/7.5 ns, 30 ns/100 ns
–2–
REV. B
AD53040
WARNING!
ESD SENSITIVE DEVICE
ParameterMinTypMaxUnitsTest Conditions
DYNAMIC PERFORMANCE, DRIVE
(VH and VL) (Continued)
Minimum Pulsewidth
3 V Swing1.7ns4.0 ns Input, 10%/90% Output,
V
= 0 V, VH = 3 V
5 V Swing2.6ns6.0 ns Input, 10%/90% Output,
Toggle Rate500MHzV
DYNAMIC PERFORMANCE, INHIBIT
Delay Time, Active to Inhibit25nsMeasured at 50%, VH = +2 V,
Delay Time, Inhibit to Active25nsMeasured at 50%, V
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Absolute maximum limits apply
individually, not in combination. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
2
Output short circuit protection is guaranteed as long as proper heat sinking is
employed to ensure compliance with the operating temperature limits.
3
To ensure lead coplanarity (±0.002 inches) and solderability, handling with bare
hands should be avoided and the device should be stored in environments at 24°C± 5°C (75°F ± 10°F) with relative humidity not to exceed 65%.
2
ORDERING GUIDE
CC
EE
PackageQuantity PerPackage
ModelDescriptionShipping Container Option
AD53040KRP 20-Lead Power SOIC Tube, 38 PiecesRP-20
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD53040 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
Shipment Method,
REV. B
–3–
AD53040
PIN FUNCTION DESCRIPTIONS
PinPin
NameNumberPin Functional Description
V
CC
1, 2Positive Power Supply. Both pins
should be connected to minimize inductance and allow maximum speed of
operation. V
should be decoupled to
CC
GND with a low inductance 0.1 µF
capacitor.
V
EE
8, 9Negative Power Supply. Both pins
should be connected to keep the inductance down and allow maximum speed
of operation. V
should be decoupled
EE
to GND with a low inductance 0.1 µF
capacitor.
GND4, 6, 14,
16, 17Device Ground. These pins should be
connected to the circuit board’s ground
plane at the pins.
V
L
15Analog Input that sets the voltage level
of a Logic 0 of the driver. Determines
the driver output for DATA > DATA.
V
H
18Analog input that sets the voltage level
of a Logic 1 of the driver. Determines
the driver output for DATA > DATA.
V
OUT
5The Driver Output. The nominal out-
put impedance is 50 Ω.
V
HDCPL
3Internal supply decoupling for the
output stage. This pin is connected
through a 39 nF minimum
to V
CC
capacitors.
V
LDCPL
7Internal supply decoupling for the
output stage. This pin is connected
to V
through a 39 nF minimum
EE
capacitors.
INH, INH 10, 11ECL compatible input that control the
high impedance state of the driver.
When INH > INH, the driver goes into
a high impedance state.
DATA,13, 12ECL compatible inputs that determines
DATAthe high and low state of the driver.
Driver output is high for DATA >
DATA.
TV
CC
19Temperature Sensor Start-Up Pin. This
pin should be connected to V
CC
.
THERM20Temperature Sensor Output Pin. A
resistor (10K) should be connected
between THERM and V
. The ap-
CC
proximate die temperature can be determined by measuring the current
through the resistor. The typical scale
factor is 1 µA/K.
PIN CONFIGURATION
V
HDCPL
V
LDCPL
V
V
GND
V
OUT
GND
V
V
INH
CC
CC
EE
EE
1
2
3
4
5
6
7
8
9
10
AD53040
TOP VIEW
(Not to Scale)
COPPER
SLUG UP
20
19
18
17
16
15
14
13
12
11
THERM
TV
CC
V
H
GND
GND
V
L
GND
DATA
DATA
INH
Table I. Pin Driver Truth Table
Output
DATADATAINHINHState
0101V
1001V
L
H
0110Hi-Z
1010Hi-Z
Table II. Package Thermal Characteristics
Air Flow, FMJC, ⴗC/WJA, ⴗC/W
0450
50449
400434
–4–
REV. B
AD53040
p
APPLICATION INFORMATION
Power Supply Distribution, Bypassing and Sequencing
The AD53040 draws substantial transient currents from its
power supplies when switching between states and careful design
of the power distribution and bypassing is key to obtaining specified performance. Supplies should be distributed using broad,
low inductance traces or (preferably) planes in a multilayered
board with a dedicated ground-plane layer. All of the device’s
power supply pins should be used to minimize the internal inductance presented by the part’s bond wires. Each supply must
be bypassed to ground with at least one 0.1 µF capacitor; chip-
style capacitors are preferable as they minimize inductance. One
or more 10 µF (or greater) Tantalum capacitors per board are
also advisable to provide additional local energy storage.
The AD53040’s current-limit circuitry also requires external
bypass capacitors. Figure 1 shows a simplified schematic of the
positive current-limit circuit. Excessive collector current in out-
put transistor Q49 creates a voltage drop across the 10 Ω resis-
tor, which turns on PNP transistor Q48. Q48 diverts the risingedge slew current, shutting down the current mirror and removing the output stage’s base drive. The V
pin should be
HDCPL
bypassed to the positive supply with a 0.039 µF capacitor, while
the V
pin (not shown) requires a similar capacitor to the
LDCPL
negative supply- these capacitors ensure that the AD53040
doesn’t current limit during normal output transitions up the its
full 9 V rated step size. Both capacitors must have minimumlength connections to the AD53040. Here again, chip capacitors
are ideal.
VPOS
10V610%
V
HDCPL
V
H
RISING-EDGE SLEW
CONTROL CURRENT
LEVEL-SHIFTED
LOGIC DRIVE
Q48
VNEG
Q49
Several points about the current-limit circuitry should be noted.
First, the limiting currents are not tightly controlled, as they are
functions of both absolute transistor V
and junction tem-
BES
perature; higher dc output current is available at lower junction
temperatures. Second, it is essential to connect the V
capacitor to the positive supply (and the V
LDCPL
HDCPL
capacitor to
the negative supply)—failure to do so causes considerable thermal stress in the current-limiting resistor(s) during normal supply sequencing and may ultimately cause them to fail, rendering
the part nonfunctional. Finally, the AD53040 may appear to
function normally for small output steps (less than 3 V or so) if
one or both of these capacitors is absent, but it will exhibit
excessive rise or fall times for steps of larger amplitude.
The AD53040 does not require special power-supply sequencing.
However, good design practice dictates that digital and analog
control signals not be applied to the part before the supplies are
stable. Violating this guideline will not normally destroy the
part, but the active inputs can draw considerable current until
the main supplies are applied.
Digital Input Range Restrictions
Total range amongst all digital signals (DATA, DATA, INH,
and INH) has to be less than or equal to 2 V to meet specified
timing. The device will function above 2 V with reduced performance up to the absolute maximum limit. This performance
degradation might not be noticed in all modes of operation. Of
all the six possible transitions (V
INH v V
, VL v INH and INH v VL), there may be only one
H
v VL, VL v VH, VH v INH,
H
that would show a degradation, usually in delay time. Taken to
the extreme, the driver may fail to achieve a proper output voltage, output impedance or may fail to fully inhibit.
An example of a scenario that would not work for the AD53040
is if the part is driven using 5 V single-ended CMOS. One pin of
each differential input would be tied to a +2.5 V reference level
and the logic voltages would be applied to the other. This would
meet the Absolute Maximum Rating of ±3 V because the max
differential is ±2.5 V. It is however possible, for example for
0.0 V to be applied to the INH input and +5 V to be applied to
the DATA input. This 5 V difference far exceeds the 2.0 V
limitation given above. Even using 3 V CMOS or TTL the
difference between logic high and logic low is greater than or
equal to 3 V which will not properly work. The only solution is
to use resistive dividers or equivalent to reduce the voltage levels.
OUT
Q50
Figure 1. Simplified Schematic of the AD53040 Output
Stage and Positive Current Limit Circuitry
REV. B
–5–
5.12V
550mV
/DIV
–380mV
66.25ns500
Figure 2. 5 V Output Swing
s/DIV71.25ns
AD53040
DATA
J1
SMB
50V
R6
50V
C12
0.01mF
INH
J2
SMB
50V
R5
50V
C13
0.01mF
NOTE:
1. 50V TERMINATION TO BE AS CLOSE TO RECEIVER
AS POSSIBLE. (END OF TRACE MARKED BY *). THROUGH
SMA CONNECTS BETWEEN MC10EL16 OUTPUTS AND DUT.
2. NO VIAS ALLOWED ON VOUT LINE.
3. SMA ON V
IMPEDANCE MATCH.
4. ONE DIMENSION OF BOARD TO BE 4-1/2 INCHES.
5. DUT PACKAGE IS TO BE CENTERED ON BOARD.
6. ALL RESISTORS AND NONELECTROLYTIC CAPS ARE
0805-SIZE SURFACE MOUNT.
7. SEE DATA SHEET FOR HIDDEN POWER AND GROUND PINS
ON LOGIC GATES.
V
LOW
V
50V
C14
0.1mF
C15
0.1mF
J4
J5
P1
DB15
SMB
J3
SMB
J6
SMB
SMB
1
9
2
10
3
11
4
12
5
13
6
14
7
15
8
50V
50V
50V
+
C4
1mFC71mFC61mF
JP1
1
TP
JP2
1
TP
JP3
1
TP
U1
MC10EL16
1
8
2
7
3
2
3
6
5
–5.2V
–2V
U2
MC10EL16
6
–5.2V
–2V
R4
50VR350V
R1
50VR250V
C21
0.1mF
1
8
7
5
C22
0.1mF
GND
+V
–V
S
S
0.1mF
C1
HIGH
C5
1mF
8. ALL 100nF BYPASS CAPACITORS TO BE LOCATED CLOSE
TO PACKAGE.
9. PCB IS TO BE 4-LAYER WITH POWER GND ( ) AND –2V AS
INNER PLANES.
C2
0.1mF
THERM
TV
CC
TH
VH
VL
AD53040
DATA
INH
PWR
GND
V
LOW
–2V
V
HIGH
–V
S
THERM
–5.2V
+V
S
C8
0.1mF
TO BE MOUNTED ON ITS SIDE FOR BEST
OUT
+V
S
C19
0.1mF
R7
50V
+V
–V
S
S
V
C9
0.1mF
EE
C16
0.039mF
IL+
IL–
C10
0.1mF
G2H
G2L
V
OUT
–5.2V
C17
0.039mF
C3
0.1mF
C11
0.1mF
HQG1
U3
–V
S
50V
J8
SIDESMB
J7
SIDESMB
GND
TEST_LD
V
OUT
C18
5pF
V
CC
Figure 3. Evaluation Board Schematic
–6–
REV. B
OUTLINE DIMENSIONS
SEATING
PLANE
0.0118 (0.30)
0.0040 (0.10)
0.0201 (0.51)
0.0130 (0.33)
0.1043 (2.65)
0.0926 (2.35)
0.0500
(1.27)
BSC
STANDOFF
0.0500 (1.27)
0.0057 (0.40)
8°
0°
0.0295 (0.75)
0.0098 (0.25)
x 45°
0.5118 (13.00)
0.4961 (12.60)
0.4193 (10.65)
0.3937 (10.00)
0.2992 (7.60)
0.2914 (7.40)
PIN 1
0.3340 (8.61)
0.3287 (8.35)
0.1890 (4.80)
0.1791 (4.55)
20
1
11
10
HEAT
SINK
Dimensions shown in inches and (mm).
20-Lead Thermally Enhanced Small Outline Package (PSOP)
(RP-20)
AD53040
C3003b–0–11/99
REV. B
PRINTED IN U.S.A.
–7–
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