Analog Devices AD53040 b Datasheet

Ultrahigh Speed Pin Driver
a
FEATURES 500 MHz Driver Operation Driver Inhibit Function 100 ps Edge Matching Guaranteed Industry Specifications
50 Output Impedance >1.5 V/ns Slew Rate
Variable Output Voltages for ECL, TTL and CMOS High Speed Differential Inputs for Maximum Flexibility Ultrasmall 20-Lead SOP Package with Built-In Heat Sink
APPLICATIONS Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems Instrumentation and Characterization Equipment
PRODUCT DESCRIPTION
The AD53040 is a complete high speed pin driver designed for use in digital or mixed-signal test systems. Combining a high speed monolithic process with a unique surface mount package, this product attains superb electrical performance while preserv­ing optimum packaging densities and long-term reliability in an ultrasmall 20-lead, SOP package with built-in heat sink.
Featuring unity gain programmable output levels of –3 V to +8 V, with output swing capability of less than 100 mV to 9 V, the AD53040 is designed to stimulate ECL, TTL and CMOS logic families. The 500 MHz data rate capacity and matched output impedance allows for real-time stimulation of these digital logic families. To test I/O devices, the pin driver can be switched into a high impedance state (Inhibit Mode), electri­cally removing the driver from the path. The pin driver leakage current inhibit is typically 100 nA and output charge transfer entering inhibit is typically less than 20 pC.
with Inhibit Mode
AD53040
FUNCTIONAL BLOCK DIAGRAM
V
V
CCVEE
CC
V
H
DATA
DATA
INH
INH
V
L
DRIVER
AD53040
GND
GND GND GND GND
The AD53040 transition from HI/LO or to inhibit is controlled through the data and inhibit inputs. The input circuitry uses high speed differential inputs with a common-mode range of
±3 V. This allows for direct interface to precision differential
ECL timing or the simplicity of stimulating the pin driver from a single ended TTL or CMOS logic source. The analog logic HI/LO
inputs are equally easy to interface. Typically requiring 10 µA of
bias current, the AD53040 can be directly coupled to the output of a digital-to-analog converter.
The AD53040 is available in a 20-lead, SOP package with a built-in heat sink and is specified to operate over the ambient
commercial temperature range of –25°C to +85°C.
50V
1.0mA/K
V
EE
39nF 39nF
V
HDCPL
V
OUT
V
LDCPL
TV
CC
THERM
REV. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 1999
AD53040–SPECIFICATIONS
(All specifications are at TJ = +85C 5C, +VS = +12 V 3%, –VS = –7 V 3% unless otherwise noted. All temperature coefficients are measured at TJ = +75ⴗC–95ⴗC). (A 39 nF capacitor must be connected between VCC and V
Parameter Min Typ Max Units Test Conditions
DIFFERENTIAL INPUT CHARACTERISTICS
Input Swing (Data to DATA, INH to INH) ECL 2 Volts
Max (DATA, DATA) to Min (INH, INH) Max (INH, INH) to Min (Data, DATA) 2 Volts Bias Current ±10 µAV
REFERENCE INPUTS
Bias Currents –50 +50 µAV
OUTPUT CHARACTERISTICS
Logic High Range –2 +8 Volts DATA = H, VH = –2 V to +8 V
Logic Low Range –3 +5 Volts DATA = L, V Amplitude (V
Absolute Accuracy
V V V V
Offset TC, V
Output Resistance 45 47 49 DATA = H, V
Output Leakage –1.0 +1.0 µAV
Dynamic Current Limit 150 mA C
Static Current Limit ±65 mA Output to –3 V, V
PSRR, Drive Mode 35 dB VS = V
DYNAMIC PERFORMANCE, DRIVE
(VH and VL)
Propagation Delay Time 1.5 ns Measured at 50%, V
Propagation Delay TC 2 ps/°C Measured at 50%, V
Delay Matching, Edge to Edge 100 ps Measured at 50%, V
Rise and Fall Time
Rise and Fall Time TC
Overshoot, Undershoot and Preshoot ±(1% +50 mV) % of Step + mV a. V
Settling Time
and between VEE and V
HDCPL
and VL) 0.1 9 Volts VL = –0.05 V, VH = +0.05 V and
H
Offset –100 +100 mV DATA = H, VH = –2 V to +8 V, VL = –3 V
H
Gain + Linearity Error ±0.3 ±5% of V
H
Offset –100 +100 mV DATA = L, VL = –3 V to +5 V, VH = +6 V
L
Gain + Linearity Error ±0.3 ±5% of V
L
or V
H
L
1 V Swing 0.8 ns Measured 20%–80%, V 3 V Swing 1.7 ns Measured 10%–90%, V 5 V Swing 2.4 ns Measured 10%–90%, V
1 V Swing ±1 ps/°C Measured 20%–80%, V 3 V Swing ±2 ps/°C Measured 10%–90%, V 5 V Swing ±3 ps/°C Measured 10%–90%, V
to 15 mV 40 ns V
to 4 mV 8 µsV
Delay Change vs. Pulsewidth 50 ps V
LDCPL
.)
= –2 V, 0.0 V
IN
, VH = 5 V
L
V
= –3 V (VH = –2 V to +6 V)
L
V
= –1 V (VH = +6 V to +8 V)
L
V
= –2 V, VH = +7 V
L
+ mV DATA = H, VH = –2 V to +8 V, VL = –3 V
H
+ mV DATA = L, VL = –3 V to +5 V, VH = +6 V
0.5 mV/°CV
L
, VH = 0 V, +5 V and –3 V, 0 V
L
= 30 mA
I
OUT
= –3 V to +8 V
OUT
= 39 nF, VH = +7 V, VL = –2 V
BYP
DATA = H and Output to +8 V, V V
= –3 V, DATA = L
L
V
= –400 mV
L
V
= –400 mV
L
V
= –400 mV
L
, VH = 0.0 V, 1.0 V
L
b. V
, VH = 0.0 V, 3.0 V
L
, VH = 0.0 V, 5.0 V
c. V
L
= 0 V, VH = 0.5 V
L
= 0 V, VH = 0.5 V
L
= 0 V, VH = 2 V,
L
= –3 V to +5 V, VH = +6 V
L
= +3 V, VL = 0 V,
H
= +8 V, VL = –1 V,
H
± 3%
S
= +400 mV,
H
= +400 mV,
H
= +400 mV,
H
L
L
L
L
L
L
= +6 V,
H
= 0 V, VH = 1 V = 0 V, VH = 3 V = 0 V, VH = 5 V
= 0 V, VH = 1 V = 0 V, VH = 3 V = 0 V, VH = 5 V
Pulsewidth = 2.5 ns/7.5 ns, 30 ns/100 ns
–2–
REV. B
AD53040
WARNING!
ESD SENSITIVE DEVICE
Parameter Min Typ Max Units Test Conditions
DYNAMIC PERFORMANCE, DRIVE
(VH and VL) (Continued)
Minimum Pulsewidth
3 V Swing 1.7 ns 4.0 ns Input, 10%/90% Output,
V
= 0 V, VH = 3 V
5 V Swing 2.6 ns 6.0 ns Input, 10%/90% Output,
Toggle Rate 500 MHz V
DYNAMIC PERFORMANCE, INHIBIT
Delay Time, Active to Inhibit 2 5 ns Measured at 50%, VH = +2 V,
Delay Time, Inhibit to Active 2 5 ns Measured at 50%, V
I/O Spike <200 mV, p-p V Output Capacitance 5 pF Driver Inhibited
POWER SUPPLIES
Total Supply Range 19 V Positive Supply +12 V Negative Supply –7 V Positive Supply Current 75 mA Negative Supply Current 75 mA Total Power Dissipation 1.15 1.43 W
Temperature Sensor Gain Factor 1.0 µA/K R
NOTES Connecting or shorting the decoupling capacitors to ground will result in the destruction of the device.
Specifications subject to change without notice.
L
= 0 V, VH = 5 V
V
L
= –1.8 V, VH = –0.8 V,
L
V
> 600 mV p-p
OUT
V
= –2 V
L
V
= –2 V
L
= 0 V, VL = 0 V
H
= 10 K, V
LOAD
SOURCE
= +2 V,
H
= +12 V
ABSOLUTE MAXIMUM RATINGS
1
Power Supply Voltage
+V
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V
S
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –8 V
–V
S
+V
to –VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20 V
S
Inputs
DATA, DATA, INH, INH . . . . . . . . . . . . . . . . +5 V, –3 V
DATA to DATA, INH to INH . . . . . . . . . . . . . . . . . . ±3 V
, VL to GND . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V
V
H
to VL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +11 V, 0 V
V
H
Outputs
V
Short Circuit Duration . . . . . . . . . . . . . . . .Indefinite
OUT
V
Range in Inhibit Mode
OUT
V V
. . . . . Do Not Connect Except for Capacitor to V
HDCPL
. . . . . Do Not Connect Except for Capacitor to V
LDCPL
THERM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V, 0 V
Environmental
Operating Temperature (Junction) . . . . . . . . . . . . . .+175°C
Storage Temperature . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec)
3
. . . . . . . . . . +260°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Absolute maximum limits apply individually, not in combination. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Output short circuit protection is guaranteed as long as proper heat sinking is
employed to ensure compliance with the operating temperature limits.
3
To ensure lead coplanarity (±0.002 inches) and solderability, handling with bare
hands should be avoided and the device should be stored in environments at 24°C ± 5°C (75°F ± 10°F) with relative humidity not to exceed 65%.
2
ORDERING GUIDE
CC
EE
Package Quantity Per Package
Model Description Shipping Container Option
AD53040KRP 20-Lead Power SOIC Tube, 38 Pieces RP-20
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD53040 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Shipment Method,
REV. B
–3–
AD53040
PIN FUNCTION DESCRIPTIONS
Pin Pin Name Number Pin Functional Description
V
CC
1, 2 Positive Power Supply. Both pins
should be connected to minimize in­ductance and allow maximum speed of operation. V
should be decoupled to
CC
GND with a low inductance 0.1 µF
capacitor.
V
EE
8, 9 Negative Power Supply. Both pins
should be connected to keep the induc­tance down and allow maximum speed of operation. V
should be decoupled
EE
to GND with a low inductance 0.1 µF
capacitor.
GND 4, 6, 14,
16, 17 Device Ground. These pins should be
connected to the circuit board’s ground plane at the pins.
V
L
15 Analog Input that sets the voltage level
of a Logic 0 of the driver. Determines the driver output for DATA > DATA.
V
H
18 Analog input that sets the voltage level
of a Logic 1 of the driver. Determines the driver output for DATA > DATA.
V
OUT
5 The Driver Output. The nominal out-
put impedance is 50 Ω.
V
HDCPL
3 Internal supply decoupling for the
output stage. This pin is connected
through a 39 nF minimum
to V
CC
capacitors.
V
LDCPL
7 Internal supply decoupling for the
output stage. This pin is connected to V
through a 39 nF minimum
EE
capacitors.
INH, INH 10, 11 ECL compatible input that control the
high impedance state of the driver. When INH > INH, the driver goes into a high impedance state.
DATA, 13, 12 ECL compatible inputs that determines DATA the high and low state of the driver.
Driver output is high for DATA > DATA.
TV
CC
19 Temperature Sensor Start-Up Pin. This
pin should be connected to V
CC
.
THERM 20 Temperature Sensor Output Pin. A
resistor (10K) should be connected between THERM and V
. The ap-
CC
proximate die temperature can be de­termined by measuring the current through the resistor. The typical scale
factor is 1 µA/K.
PIN CONFIGURATION
V
HDCPL
V
LDCPL
V V
GND
V
OUT
GND
V V
INH
CC
CC
EE
EE
1 2 3 4 5 6 7 8 9
10
AD53040
TOP VIEW
(Not to Scale)
COPPER SLUG UP
20 19 18 17 16 15 14 13 12 11
THERM TV
CC
V
H
GND GND V
L
GND DATA
DATA
INH
Table I. Pin Driver Truth Table
Output
DATA DATA INH INH State
0101V 1001V
L
H
0110Hi-Z 1010Hi-Z
Table II. Package Thermal Characteristics
Air Flow, FM JC, C/W JA, C/W
0450 50 4 49 400 4 34
–4–
REV. B
AD53040
p
APPLICATION INFORMATION Power Supply Distribution, Bypassing and Sequencing
The AD53040 draws substantial transient currents from its power supplies when switching between states and careful design of the power distribution and bypassing is key to obtaining speci­fied performance. Supplies should be distributed using broad, low inductance traces or (preferably) planes in a multilayered board with a dedicated ground-plane layer. All of the device’s power supply pins should be used to minimize the internal in­ductance presented by the part’s bond wires. Each supply must
be bypassed to ground with at least one 0.1 µF capacitor; chip-
style capacitors are preferable as they minimize inductance. One
or more 10 µF (or greater) Tantalum capacitors per board are
also advisable to provide additional local energy storage.
The AD53040’s current-limit circuitry also requires external bypass capacitors. Figure 1 shows a simplified schematic of the positive current-limit circuit. Excessive collector current in out-
put transistor Q49 creates a voltage drop across the 10 resis-
tor, which turns on PNP transistor Q48. Q48 diverts the rising­edge slew current, shutting down the current mirror and remov­ing the output stage’s base drive. The V
pin should be
HDCPL
bypassed to the positive supply with a 0.039 µF capacitor, while
the V
pin (not shown) requires a similar capacitor to the
LDCPL
negative supply- these capacitors ensure that the AD53040 doesn’t current limit during normal output transitions up the its full 9 V rated step size. Both capacitors must have minimum­length connections to the AD53040. Here again, chip capacitors are ideal.
VPOS
10V610%
V
HDCPL
V
H
RISING-EDGE SLEW
CONTROL CURRENT
LEVEL-SHIFTED
LOGIC DRIVE
Q48
VNEG
Q49
Several points about the current-limit circuitry should be noted. First, the limiting currents are not tightly controlled, as they are functions of both absolute transistor V
and junction tem-
BES
perature; higher dc output current is available at lower junction temperatures. Second, it is essential to connect the V capacitor to the positive supply (and the V
LDCPL
HDCPL
capacitor to the negative supply)—failure to do so causes considerable ther­mal stress in the current-limiting resistor(s) during normal sup­ply sequencing and may ultimately cause them to fail, rendering the part nonfunctional. Finally, the AD53040 may appear to function normally for small output steps (less than 3 V or so) if one or both of these capacitors is absent, but it will exhibit excessive rise or fall times for steps of larger amplitude.
The AD53040 does not require special power-supply sequencing. However, good design practice dictates that digital and analog control signals not be applied to the part before the supplies are stable. Violating this guideline will not normally destroy the part, but the active inputs can draw considerable current until the main supplies are applied.
Digital Input Range Restrictions
Total range amongst all digital signals (DATA, DATA, INH, and INH) has to be less than or equal to 2 V to meet specified timing. The device will function above 2 V with reduced perfor­mance up to the absolute maximum limit. This performance degradation might not be noticed in all modes of operation. Of all the six possible transitions (V INH v V
, VL v INH and INH v VL), there may be only one
H
v VL, VL v VH, VH v INH,
H
that would show a degradation, usually in delay time. Taken to the extreme, the driver may fail to achieve a proper output volt­age, output impedance or may fail to fully inhibit.
An example of a scenario that would not work for the AD53040 is if the part is driven using 5 V single-ended CMOS. One pin of each differential input would be tied to a +2.5 V reference level and the logic voltages would be applied to the other. This would
meet the Absolute Maximum Rating of ±3 V because the max differential is ±2.5 V. It is however possible, for example for
0.0 V to be applied to the INH input and +5 V to be applied to the DATA input. This 5 V difference far exceeds the 2.0 V limitation given above. Even using 3 V CMOS or TTL the difference between logic high and logic low is greater than or equal to 3 V which will not properly work. The only solution is to use resistive dividers or equivalent to reduce the voltage levels.
OUT
Q50
Figure 1. Simplified Schematic of the AD53040 Output Stage and Positive Current Limit Circuitry
REV. B
–5–
5.12V
550mV
/DIV
–380mV
66.25ns 500
Figure 2. 5 V Output Swing
s/DIV 71.25ns
AD53040
DATA
J1
SMB
50V
R6 50V
C12
0.01mF
INH
J2
SMB
50V
R5 50V
C13
0.01mF
NOTE:
1. 50V TERMINATION TO BE AS CLOSE TO RECEIVER AS POSSIBLE. (END OF TRACE MARKED BY *). THROUGH SMA CONNECTS BETWEEN MC10EL16 OUTPUTS AND DUT.
2. NO VIAS ALLOWED ON VOUT LINE.
3. SMA ON V
IMPEDANCE MATCH.
4. ONE DIMENSION OF BOARD TO BE 4-1/2 INCHES.
5. DUT PACKAGE IS TO BE CENTERED ON BOARD.
6. ALL RESISTORS AND NONELECTROLYTIC CAPS ARE
0805-SIZE SURFACE MOUNT.
7. SEE DATA SHEET FOR HIDDEN POWER AND GROUND PINS ON LOGIC GATES.
V
LOW
V
50V
C14
0.1mF
C15
0.1mF
J4
J5
P1
DB15
SMB
J3
SMB
J6
SMB
SMB
1 9 2 10 3 11 4 12 5 13 6 14 7 15 8
50V
50V
50V
+
C4 1mFC71mFC61mF
JP1
1
TP
JP2
1
TP
JP3
1
TP
U1
MC10EL16
1
8
2
7
3
2 3
6
5
–5.2V
–2V
U2
MC10EL16
6 –5.2V
–2V
R4 50VR350V
R1 50VR250V
C21
0.1mF
1
8
7
5
C22
0.1mF GND
+V
–V
S
S
0.1mF
C1
HIGH
C5 1mF
8. ALL 100nF BYPASS CAPACITORS TO BE LOCATED CLOSE
TO PACKAGE.
9. PCB IS TO BE 4-LAYER WITH POWER GND ( ) AND –2V AS
INNER PLANES.
C2
0.1mF
THERM
TV
CC
TH VH VL
AD53040
DATA
INH
PWR
GND
V
LOW
–2V V
HIGH
–V
S
THERM
–5.2V
+V
S
C8
0.1mF
TO BE MOUNTED ON ITS SIDE FOR BEST
OUT
+V
S
C19
0.1mF
R7
50V
+V
–V
S
S
V
C9
0.1mF
EE
C16
0.039mF
IL+
IL–
C10
0.1mF
G2H
G2L
V
OUT
–5.2V
C17
0.039mF
C3
0.1mF
C11
0.1mF
HQG1
U3
–V
S
50V
J8
SIDESMB
J7
SIDESMB
GND
TEST_LD
V
OUT
C18 5pF
V
CC
Figure 3. Evaluation Board Schematic
–6–
REV. B
OUTLINE DIMENSIONS
SEATING PLANE
0.0118 (0.30)
0.0040 (0.10)
0.0201 (0.51)
0.0130 (0.33)
0.1043 (2.65)
0.0926 (2.35)
0.0500 (1.27)
BSC
STANDOFF
0.0500 (1.27)
0.0057 (0.40)
8° 0°
0.0295 (0.75)
0.0098 (0.25)
x 45°
0.5118 (13.00)
0.4961 (12.60)
0.4193 (10.65)
0.3937 (10.00)
0.2992 (7.60)
0.2914 (7.40)
PIN 1
0.3340 (8.61)
0.3287 (8.35)
0.1890 (4.80)
0.1791 (4.55)
20
1
11
10
HEAT
SINK
Dimensions shown in inches and (mm).
20-Lead Thermally Enhanced Small Outline Package (PSOP)
(RP-20)
AD53040
C3003b–0–11/99
REV. B
PRINTED IN U.S.A.
–7–
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