12-/14-/16-bit nanoDACs
On-chip, 2.5 V, 5 ppm/°C reference in TSSOP
On-chip, 2.5 V, 10 ppm/°C reference in LFCSP
On-chip, 1.25 V, 10 ppm/°C reference in LFCSP
AD5625/AD5665
12-/16-bit nanoDACs
External reference only
3 mm × 3 mm 10-lead LFCSP and 14-lead TSSOP
2.7 V to 5.5 V power supply
Guaranteed monotonic by design
Power-on reset to zero scale/midscale
Per channel power-down
Hardware
2
I
C-compatible serial interface supports standard (100 kHz),
LDAC
and
functions
CLR
fast (400 kHz), and high speed (3.4 MHz) modes
APPLICATIONS
Process control
Data acquisition systems
Portable battery-powered instruments
Digital gain and offset adjustment
Programmable voltage and current sources
Programmable attenuators
GENERAL DESCRIPTION
The AD5625R/AD5645R/AD5665R and AD5625/AD5665
members of the nanoDAC® family are low power, quad, 12-/
14-/16-bit, buffered voltage-out DACs with/without an on-chip
reference. All devices operate from a single 2.7 V to 5.5 V supply,
are guaranteed monotonic by design, and have an I
serial interface.
The AD5625R/AD5645R/AD5665R have an on-chip reference.
The LFCSP versions of the AD56x5R have a 1.25 V or 2.5 V,
10 ppm/°C reference, giving a full-scale output range of 2.5 V or
5 V; the TSSOP versions of the AD56x5R have a 2.5 V, 5 ppm/°C
reference, giving a full-scale output range of 5 V. The on-chip
reference is off at power-up, allowing the use of an external
reference. The internal reference is enabled via a software write.
The AD5625/AD5665 require an external reference voltage to
set the output range of the DAC.
The part incorporates a power-on reset circuit that ensures that
the DAC output powers up to 0 V (POR = GND) or midscale
(POR = V
) and remains there until a valid write occurs. The
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
2
C-compatible
FUNCTIONAL BLOCK DIAGRAMS
REFIN
STRING
STRING
STRING
STRING
STRING
STRING
STRING
STRING
V
REFOUT
1.25V/2.5V REF
DAC A
DAC B
DAC C
DAC D
REFIN
DAC A
DAC B
DAC C
DAC D
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
DD
AD5625R/AD5645R/AD5665R
DDR1
DDR2
SCL
SDA
NOTES
1. THE FOLLOWING PINS ARE AVAILABLE ONLY ON 14-LEAD PACKAGE:
ADDR2, LDAC, CLR, POR.
INTERFACE
LDAC CLRPOR
INPUT
REGISTER
INPUT
REGISTER
LOGIC
INPUT
REGISTER
INPUT
REGISTER
POWER-ON RE SETPOWER-DOWN LOGIC
GND
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
Figure 1. AD5625R/AD5645R/AD5665R
DD
AD5625/AD5665
ADDR1
ADDR2
SCL
SDA
NOTES
1. THE FOL LOWI NG PINS ARE AVAI LABLE ONL Y ON 14-LEAD PACKAG E:
ADDR2, LDAC, CLR, POR.
INTERFACE
LDAC CLRPOR
INPUT
REGISTE R
INPUT
REGISTE R
LOGIC
INPUT
REGISTE R
INPUT
REGISTE R
POWER-O N RESETPOWER-DOWN LOGIC
GND
DAC
REGISTE R
DAC
REGISTE R
DAC
REGISTE R
DAC
REGISTE R
Figure 2. AD5625/AD5665
The AD56x5R/AD56x5 use a 2-wire I2C-compatible serial
interface that operates in standard (100 kHz), fast (400 kHz),
and high speed (3.4 MHz) modes.
Differential Nonlinearity ±1 ±0.25 LSB Guaranteed monotonic by design
Zero-Code Error 2 10 2 10 mV All 0s loaded to DAC register
Offset Error ±1 ±10 ±1 ±10 mV
Full-Scale Error −0.1 ±0.5 −0.1 ±0.5 % FSR All 1s loaded to DAC register
Gain Error ±0.1 ±1.25 ±0.1 ±1 % FSR
Zero-Code Error Drift ±2 ±2 µV/°C
Gain Temperature Coefficient ±2.5 ±2.5 ppm Of FSR/°C
DC Power Supply Rejection
−100 −100 dB DAC code = midscale; V
Ratio
DC Crosstalk (External
15 15 µV
Reference)
10 10 µV/mA Due to load current change
8 8 µV Due to powering down (per channel)
DC Crosstalk (Internal
25 25 µV
Reference)
20 20 µV/mA Due to load current change
10 10 µV Due to powering down (per channel)
OUTPUT CHARACTERISTICS
3
Output Voltage Range 0 VDD 0 VDD V Internal reference disabled
0
2 ×
V
REF
Capacitive Load Stability 2 2 nF RL = ∞
10 10 nF RL = 2 kΩ
DC Output Impedance 0.5 0.5 Ω
Short-Circuit Current 30 30 mA VDD = 5 V
Power-Up Time 4 4 µs
REFERENCE INPUTS
Reference Current 210 260 210 260 µA V
Reference Input Range 0.75 VDD 0.75 VDD V
Reference Input Impedance 26 26 kΩ
REFERENCE OUTPUT (1.25 V)
Output Voltage 1.247 1.253 1.247 1.253 V At ambient
Reference TC
3
±10 ±10 ppm/°C
Output Impedance 7.5 7.5 kΩ
= VDD; all specifications T
REFIN
2 ×
V
Rev. B | Page 3 of 36
to T
MIN
Due to full-scale output change,
R
Due to full-scale output change,
R
, unless otherwise noted.
MAX
= 2 kΩ to GND or V
L
= 2 kΩ to GND or V
L
Internal reference enabled
REF
Coming out of power-down mode;
VDD = 5 V
= VDD = 5.5 V
REF
= 5 V ± 10%
DD
DD
DD
1
AD5625R/AD5645R/AD5665R, AD5625/AD5665
A Grade B Grade
Parameter Min Typ Max Min Typ Max Unit Test Conditions/Comments1
REFERENCE OUTPUT (2.5 V) VDD = 4.5 V to 5.5 V
Output Voltage 2.495 2.505 2.495 2.505 V At ambient
Reference TC3 ±10 ±5 ±10 ppm/°C
Output Impedance 7.5 7.5 kΩ
LOGIC INPUTS (ADDRx, CLR,
, POR)3
LDAC
IIN, Input Current ±1 ±1 μA
V
, Input Low Voltage 0.15 × VDD 0.15 × VDD V
INL
V
, Input High Voltage 0.85 × VDD 0.85 × VDD V
INH
CIN, Pin Capacitance 2 2 pF
V
, Input Hysteresis 0.1 × VDD 0.1 × VDD V
HYST
LOGIC INPUTS (SDA, SCL)3
IIN, Input Current ±1 ±1 μA
V
, Input Low Voltage 0.3 × VDD 0.3 × VDD V
INL
V
, Input High Voltage 0.7 × VDD 0.7 × VDD V
INH
CIN, Pin Capacitance 2 2 pF
V
, Input Hysteresis 0.1 × VDD 0.1 × VDD V High speed mode
HYST
0.05 × VDD 0.05 × VDD V Fast mode
LOGIC OUTPUTS (SDA)3
VOL, Output Low Voltage 0.4 0.4 V I
0.6 0.6 V I
Floating-State Leakage
Current
Floating-State Output
Capacitance
POWER REQUIREMENTS
VDD 2.7 5.5 2.7 5.5 V
IDD (Normal Mode)4 V
VDD = 4.5 V to 5.5 V 1.0 1.16 1.0 1.16 mA Internal reference off
VDD = 2.7 V to 3.6 V 0.9 1.05 0.9 1.05 mA Internal reference off
VDD = 4.5 V to 5.5 V 1.9 2.14 1.9 2.14 mA Internal reference on
VDD = 2.7 V to 3.6 V 1.4 1.59 1.4 1.59 mA Internal reference on
IDD (All Power-Down Modes)5
VDD = 2.7 V to 5.5 V 0.48 1 0.48 1 μA VIH = VDD, VIL = GND (LFCSP)
VDD = 3.6 V to 5.5 V 0.48 1 0.48 1 μA VIH = VDD, VIL = GND (TSSOP)
1
Temperature range of A and B grades is −40°C to +105°C.
2
Linearity calculated using a reduced code range: AD5665R (Code 512 to Code 65,024), AD5645R (Code 128 to Code 16,256), AD5625R (Code 32 to Code 4064). Output
unloaded.
3
Guaranteed by design and characterization; not production tested.
4
Interface inactive. All DACs active. DAC outputs unloaded.
5
All DACs powered down. Power-down function is not available on 14-lead TSSOP parts when the part is powered with VDD < 3.6 V.
= 3 mA
SINK
= 6 mA
SINK
±1 ±1 μA
2 2 pF
= VDD, VIL = GND, full-scale loaded
IH
Rev. B | Page 4 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
SPECIFICATIONS—AD5665/AD5625
VDD = 2.7 V to 5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; V
Table 3.
B Grade
Parameter Min Typ Max Unit Test Conditions/Comments
STATIC PERFORMANCE
2
AD5665
Resolution 16 Bits
Relative Accuracy ±8 ±16 LSB
Differential Nonlinearity ±1 LSB Guaranteed monotonic by design
AD5625
Resolution 12 Bits
Relative Accuracy ±0.5 ±1 LSB
Differential Nonlinearity ±0.25 LSB Guaranteed monotonic by design
Zero-Code Error 2 10 mV All 0s loaded to DAC register
Offset Error ±1 ±10 mV
Full-Scale Error −0.1 ±0.5 % FSR All 1s loaded to DAC register
Gain Error ±0.1 ±1 % FSR
Zero-Code Error Drift ±2 µV/°C
Gain Temperature Coefficient ±2.5 ppm Of FSR/°C
DC Power Supply Rejection Ratio −100 dB DAC code = midscale; VDD = 5 V ± 10%
DC Crosstalk (External Reference) 15 µV
10 µV/mA Due to load current change
8 µV Due to powering down (per channel)
DC Crosstalk (Internal Reference) 25 µV
20 µV/mA Due to load current change
10 µV Due to powering down (per channel)
OUTPUT CHARACTERISTICS
3
Output Voltage Range 0 VDD V
Capacitive Load Stability 2 nF RL = ∞
10 nF RL = 2 kΩ
DC Output Impedance 0.5 Ω
Short-Circuit Current 30 mA VDD = 5 V
Power-Up Time 4 µs Coming out of power-down mode; VDD = 5 V
REFERENCE INPUTS
Reference Current 210 260 µA V
Reference Input Range 0.75 VDD V
Reference Input Impedance 26 kΩ
3
LOGIC INPUTS (ADDRx, CLR, LDAC, POR)
IIN, Input Current ±1 µA
V
, Input Low Voltage 0.15 × VDD V
INL
V
, Input High Voltage 0.85 × VDD V
INH
CIN, Pin Capacitance 2 pF
V
, Input Hysteresis 0.1 × VDD V
HYST
LOGIC INPUTS (SDA, SCL)
3
IIN, Input Current ±1 µA
V
, Input Low Voltage 0.3 × VDD V
INL
V
, Input High Voltage 0.7 × VDD V
INH
CIN, Pin Capacitance 2 pF
V
, Input Hysteresis 0.1 × VDD V High speed mode
HYST
0.05 × VDD V Fast mode
= VDD; all specifications T
REFIN
MIN
to T
, unless otherwise noted.
MAX
1
Due to full-scale output change,
= 2 kΩ to GND or V
R
L
DD
Due to full-scale output change,
R
= 2 kΩ to GND or V
L
DD
= VDD = 5.5 V
REF
Rev. B | Page 5 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
B Grade
Parameter Min Typ Max Unit Test Conditions/Comments
LOGIC OUTPUTS (SDA)
VOL, Output Low Voltage 0.4 V I
0.6 V I
3
= 3 mA
SINK
= 6 mA
SINK
Floating-State Leakage Current ±1 µA
Floating-State Output Capacitance 2 pF
POWER REQUIREMENTS
VDD 2.7 5.5 V
IDD (Normal Mode)
4
V
= VDD, VIL = GND, full-scale loaded
IH
VDD = 4.5 V to 5.5 V 1.0 1.16 mA
VDD = 2.7 V to 3.6 V 0.9 1.05 mA
IDD (All Power-Down Modes)
5
VDD = 2.7 V to 5.5 V 0.48 1 µA VIH = VDD, VIL = GND (LFCSP)
VDD = 3.6 V to 5.5 V 0.48 1 µA VIH = VDD, VIL = GND (TSSOP)
1
Temperature range of B grade is −40°C to +105°C.
2
Linearity calculated using a reduced code range: AD5665 (Code 512 to Code 65,024), AD5625 (Code 32 to Code 4064). Output unloaded.
3
Guaranteed by design and characterization; not production tested.
4
Interface inactive. All DACs active. DAC outputs unloaded.
5
All DACs powered down. Power-down function is not available on 14-lead TSSOP parts when the part is powered with VDD < 3.6 V.
1
Rev. B | Page 6 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; V
= VDD; all specifications T
REFIN
MIN
to T
, unless otherwise noted.
MAX
Table 4.
Parameter
1, 2
Min Typ Max Unit Test Conditions/Comments
3
Output Voltage Settling Time
AD5625R/AD5625 3 4.5 µs ¼ to ¾ scale settling to ±0.5 LSB
AD5645R 3.5 5 µs ¼ to ¾ scale settling to ±0.5 LSB
AD5665R/AD5665 4 7 µs ¼ to ¾ scale settling to ±2 LSB
Slew Rate 1.8 V/µs
Digital-to-Analog Glitch Impulse 1 LSB change around major carry
15 nV-s LFCSP
5 nV-s TSSOP
Digital Feedthrough 0.1 nV-s
Reference Feedthrough −90 dB V
= 2 V ± 0.1 V p-p, frequency 10 Hz to 20 MHz
REF
Digital Crosstalk 0.1 nV-s
Analog Crosstalk 1 nV-s External reference
4 nV-s Internal reference
DAC-to-DAC Crosstalk 1 nV-s External reference
4 nV-s Internal reference
Multiplying Bandwidth 340 kHz V
Total Harmonic Distortion −80 dB V
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C, typical @ 25°C.
Rev. B | Page 7 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
I2C TIMING SPECIFICATIONS
VDD = 2.7 V to 5.5 V; all specifications T
MIN
to T
, f
= 3.4 MHz, unless otherwise noted.1
MAX
SCL
Table 5.
Parameter Test Conditions
3
f
SCL
Standard mode 100 kHz Serial clock frequency
2
Min Max Unit Description
Fast mode 400 kHz
High speed mode, CB = 100 pF 3.4 MHz High speed mode, CB = 400 pF 1.7 MHz
t1 Standard mode 4 s t
, SCL high time
HIGH
Fast mode 0.6 s
High speed mode, CB = 100 pF 60 ns High speed mode, CB = 400 pF 120 ns
t2 Standard mode 4.7 s t
, SCL low time
LOW
Fast mode 1.3 s
High speed mode, CB = 100 pF 160 ns High speed mode, CB = 400 pF 320 ns
t3 Standard mode 250 ns t
, data setup time
SU;DAT
Fast mode 100 ns
High speed mode 10 ns
t4 Standard mode 0 3.45 s t
, data hold time
HD;DAT
Fast mode 0 0.9 s
High speed mode, CB = 100 pF 0 70 ns High speed mode, CB = 400 pF 0 150 ns
t5 Standard mode 4.7 s t
, setup time for a repeated start condition
SU;STA
Fast mode 0.6 s High speed mode 160 ns
t6 Standard mode 4 s t
, hold time (repeated) start condition
HD;STA
Fast mode 0.6 s High speed mode 160 ns
t7 Standard mode 4.7 s
, bus-free time between a stop and a start
t
BUF
condition
Fast mode 1.3 s
t8 Standard mode 4 s t
, setup time for a stop condition
SU;STO
Fast mode 0.6 s
High speed mode 160 ns
t9 Standard mode 1000 ns t
, rise time of SDA signal
RDA
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns High speed mode, CB = 400 pF 20 160 ns
t10 Standard mode 300 ns t
, fall time of SDA signal
FDA
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns High speed mode, CB = 400 pF 20 160 ns
t11 Standard mode 1000 ns t
, rise time of SCL signal
RCL
Fast mode 300 ns
High speed mode, CB = 100 pF 10 40 ns High speed mode, CB = 400 pF 20 80 ns
t
Standard mode 1000 ns
11A
, rise time of SCL signal after a repeated start
t
RCL1
condition and after an acknowledge bit
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns High speed mode, CB = 400 pF 20 160 ns
Rev. B | Page 8 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
Parameter Test Conditions
t12 Standard mode 300 ns t
2
Min Max Unit Description
, fall time of SCL signal
FCL
Fast mode 300 ns High speed mode, CB = 100 pF 10 40 ns High speed mode, CB = 400 pF 20 80 ns
t13 Standard mode 10 ns
pulse width low
LDAC
Fast mode 10 ns
High speed mode 10 ns
t14 Standard mode 300 ns
Falling edge of ninth SCL clock pulse of last byte
of a valid write to LDAC
falling edge
Fast mode 300 ns
High speed mode 30 ns
t15 Standard mode 20 ns
pulse width low
CLR
Fast mode 20 ns
High speed mode 20 ns
4
t
SP
Fast mode 0 50 ns Pulse width of spike suppressed
High speed mode 0 10 ns
1
See Figure 3. High speed mode timing specification applies only to the AD5625RBRUZ-2/AD5625RBRUZ-2REEL7 and AD5665RBRUZ-2/AD5665RBRUZ-2REEL7.
2
CB refers to the capacitance on the bus line.
3
The SDA and SCL timing is measured with the input filters enabled. Switching off the input filters improves the transfer rate but has a negative effect on the EMC
behavior of the part.
4
Input filtering on the SCL and SDA inputs suppresses noise spikes that are less than 50 ns for fast mode or less than 10 ns for high speed mode.
t
t
SCL
SDA
t
7
PSSP
2
t
6
11
t
4
t
12
t
1
t
3
t
6
t
5
t
10
t
8
t
14
t
9
LDAC*
CLR
*ASYNCHRONOUS LDAC UPDAT E MODE.
t
15
Figure 3. 2-Wire Serial Interface Timing Diagram
t
13
06341-003
Rev. B | Page 9 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 6.
Parameter Rating
VDD to GND −0.3 V to +7 V
V
to GND −0.3 V to VDD + 0.3 V
OUT
V
REFIN/VREFOUT
Digital Input Voltage to GND −0.3 V to VDD + 0.3 V
Operating Temperature Range, Industrial −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (TJ maximum) 150°C
Power Dissipation (TJ max − TA)/θJA
θJA Thermal Impedance
LFCSP_WD (4-Layer Board) 61°C/W
TSSOP 150.4°C/W
Reflow Soldering Peak Temperature,
RoHS Compliant
to GND −0.3 V to VDD + 0.3 V
260°C ± 5°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. B | Page 10 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
V
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
1
LDAC
2
ADDR1
V
OUT
V
OUT
POR
REFIN/VREFOUT
V
DD
A
C
AD5625R/
3
AD5645R/
4
AD5665R
TOP VIEW
5
(Not to Scale)
6
7
Figure 4. Pin Configuration (14-Lead TSSOP), R Suffix Version
1
LDAC
2
ADDR1
V
V
OUT
V
OUT
POR
V
REFIN
DD
A
C
AD5625/
3
AD5665
4
TOP VIEW
(Not to Scale)
5
6
7
Figure 5. Pin Configuration (14-Lead TSSOP)
14
13
12
11
10
9
8
14
SCL
13
SDA
12
GND
11
V
10
V
9
CLR
8
ADDR2
SCL
SDA
GND
V
OUT
V
OUT
CLR
ADDR2
B
D
OUT
OUT
1
V
A
OUT
2
V
B
OUT
3
B
D
06341-120
GND
4
V
C
OUT
5
V
D
OUT
EXPOSED PAD TIED TO GND.
Figure 6. Pin Configuration (10-Lead LFCSP), R Suffix Version
V
A
OUT
V
B
OUT
GND
V
C
OUT
V
D
OUT
6341-121
EXPOSED PAD TIED TO GND.
Figure 7. Pin Configuration (10-Lead LFCSP)
Table 7. Pin Function Descriptions
Pin Number
14-Lead 10-Lead Mnemonic Description
1 N/A
LDAC
Pulsing this pin low allows any or all DAC registers to be updated if the input registers have new data.
This allows simultaneous update of all DAC outputs. Alternatively, this pin can be tied permanently
low.
2 N/A ADDR1
Three-State Address Input. Sets the two least significant bits (Bit A1, Bit A0) of the 7-bit slave address
(see Table 9).
3 9 V
DD
Power Supply Input. These parts can be operated from 2.7 V to 5.5 V, and the supply should be
decoupled with a 10 F capacitor in parallel with a 0.1 F capacitor to GND.
4 1 V
5 4 V
6 N/A POR
A Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
C Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
Power-On Reset Pin. Tying the POR pin to GND powers up the part to 0 V. Tying the POR pin to V
powers up the part to midscale.
7 10 V
REFIN/VREFOUT
The AD56x5R have a common pin for reference input and reference output. When using the internal
reference, this is the reference output pin. When using an external reference, this is the reference
input pin. The default for this pin is as a reference input. (The internal reference and reference output
are only available on R suffix versions.) The AD56x5 has a reference input pin only.
8 N/A ADDR2
9 N/A
CLR
Three-State Address Input. Sets Bit A3 and Bit A2 of the 7-bit slave address (see Table 9).
Asynchronous Clear Input. The CLR input is falling-edge sensitive. While CLR is low, all LDAC pulses
are ignored. When CLR
is activated, zero scale is loaded to all input and DAC registers. This clears the
output to 0 V. The part exits clear code mode on the falling edge of the ninth clock pulse of the last
byte of the valid write. If CLR
is activated during a write sequence, the write is aborted. If CLR is
activated during high speed mode, the part exits high speed mode.
10 5 V
11 2 V
12 3 GND
13 8 SDA
D Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
OUT
B Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
Ground Reference Point for All Circuitry on the Part.
Serial Data Line. This is used in conjunction with the SCL line to clock data into or out of the 16-bit
input register. It is a bidirectional, open-drain data line that should be pulled to the supply with an
external pull-up resistor.
14 7 SCL
Serial Clock Line. This is used in conjunction with the SDA line to clock data into or out of the 16-bit
input register.
N/A 6 ADDR
Three-State Address Input. Sets the two least significant bits (Bit A1, Bit A0) of the 7-bit slave address
(see Table 8).
EPAD For the 10-lead LFCSP, the exposed pad must be tied to GND.
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSBs, from a
straight line passing through the endpoints of the DAC
transfer function.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic
by design.
Zero-Code Error
Zero-code error is a measurement of the output error when zero
scale (0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5665R because the output of the DAC cannot go below 0 V
due to a combination of the offset errors in the DAC and the output amplifier. Zero-code error is expressed in millivolts (mV).
Full-Scale Error
Full-scale error is a measurement of the output error when fullscale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be V
− 1 LSB. Full-scale error is expressed as a
DD
percentage of full-scale range (FSR).
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal
expressed as a percentage of full-scale range (FSR).
Zero-Code Error Drift
Zero-code error drift is a measurement of the change in
zero-code error with a change in temperature. It is expressed in
microvolts per degrees Celsius (µV/°C).
Gain Temperature Coefficient
Gain temperature coefficient is a measurement of the change in
gain error with changes in temperature. It is expressed in parts
per million (ppm) of full-scale range per degrees Celsius
(FSR/°C).
Offset Error
Offset error is a measure of the difference between V
and V
(ideal) expressed in mV in the linear region of the
OUT
(actual)
OUT
transfer function. Offset error is measured on the AD5665R
with Code 512 loaded in the DAC register. It can be negative or
positive.
DC Power Supply Rejection Ratio (PSRR)
DC PSRR indicates how the output of the DAC is affected by
changes in the supply voltage. PSRR is the ratio of the change in
V
to the change in VDD for full-scale output of the DAC. It is
OUT
measured in decibels (dB). V
is held at 2 V, and VDD is varied
REF
by ±10%.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for
the output of a DAC to settle to a specified level for a ¼ to ¾
full-scale input change, and it is measured from the rising edge
of the stop condition.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000) (see
Figure 44).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into the
analog output of the DAC from the digital inputs of the DAC
but is measured when the DAC output is not updated. It is
specified in nV-s and is measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Reference Feedthrough
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated. It is expressed in decibels (dB).
Output Noise Spectral Density
Output noise spectral density is a measurement of the internally
generated random noise, which is characterized as a spectral
density (nanovolts per square root of hertz frequency (nV/√Hz)).
It is measured by loading the DAC to midscale and measuring
noise at the output. It is measured in nanovolts per square root
of hertz frequency (nV/√Hz). A plot of noise spectral density is
shown in Figure 50.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC
in response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC (or soft
power-down and power-up) while monitoring another DAC
kept at midscale. It is expressed in microvolts (V).
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has on
another DAC kept at midscale. It is expressed in microvolts per
milliampere (V/mA).
Digital Crosstalk
This is the glitch impulse transferred to the output of one DAC
at midscale in response to a full-scale code change (all 0s to all
1s and vice versa) in the input register of another DAC. It is
measured in standalone mode and is expressed in nanovolts per
second (nV-s).
Rev. B | Page 20 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC due to a change in the output of another DAC. It is
measured by loading one of the input registers with a full-scale
code change (all 0s to all 1s and vice versa) and then executing
a software LDAC and monitoring the output of the DAC whose
digital code was not changed. The area of the glitch is expressed
in nanovolts per second (nV-s).
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC due to a digital code change and subsequent
analog output change of another DAC. It is measured by
loading the attack channel with a full-scale code change (all 0s
to all 1s and vice versa) with
output of the victim channel that is at midscale. The energy of
the glitch is expressed in nanovolts per second (nV-s).
LDAC
low while monitoring the
Multiplying Bandwidth
The multiplying bandwidth is a measure of the finite bandwidth
of the amplifiers within the DAC. A sine wave on the reference
(with full-scale code loaded to the DAC) appears on the output.
The multiplying bandwidth is the frequency at which the output
amplitude falls to 3 dB below the input.
Total Harmonic Distortion (THD)
THD is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC, and the THD is a measurement of the
harmonics present on the DAC output. It is measured in
decibels (dB).
Rev. B | Page 21 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
THEORY OF OPERATION
DIGITAL-TO-ANALOG CONVERTER (DAC)
The AD56x5R/AD56x5 DACs are fabricated on a CMOS
process. The AD56x5 does not have an internal reference, and
the DAC architecture is shown in Figure 54. The AD56x5R does
have an internal reference and can be configured for use with
either an internal or external reference (see Figure 54 and
Figure 55).
Because the input coding to the DAC is straight binary, the ideal
output voltage when using an external reference is given by
D
⎞
⎛
×=
OUT
V
REFIN/VREFOUT
VV
REFIN
DAC
REGISTER
REF
BUFFER
⎟
⎜
N
2
⎠
⎝
OUTPUT
AMPLIFIER
REF (+)
RESISTOR
STRING
REF (–)
GAIN = ×2
V
OUT
RESISTOR STRING
The resistor string is shown in Figure 56. It is simply a string of
resistors, each of value R. The code loaded to the DAC register
determines at which node on the string the voltage is tapped off
to be fed into the output amplifier. The voltage is tapped off by
closing one of the switches connecting the string to the amplifier.
Because it is a string of resistors, it is guaranteed monotonic.
OUTPUT AMPLIFIER
The output buffer amplifier can generate rail-to-rail voltages on its
output, which gives an output range of 0 V to V
load of 2 k in parallel with 1000 pF to GND. The source and
sink capabilities of the output amplifier are shown in Figure 38
and Figure 39. The slew rate is 1.8 V/µs with a ¼ to ¾ full-scale
settling time of 7 µs.
R
R
R
TO OUTPUT
AMPLIFIER
. It can drive a
DD
GND
Figure 54. Internal Configuration When Using an External Reference
06341-034
The ideal output voltage when using the internal reference is
given by
D
⎞
⎛
VV
2
××=
⎟
REFOUTOUT
⎜
N
2
⎠
⎝
where:
D is the decimal equivalent of the binary code that is loaded to
the DAC register, as follows:
0 to 4095 for AD5625R/AD5625 (12-bit).
0 to 16,383 for AD5645R (14-bit).
0 to 65,535 for AD5665R/AD5665 (16-bit).
N is the DAC resolution.
V
REFIN/VREFOUT
1.25V INTE RNAL
REFERENCE
1
CAN BE OVERDRIVEN
BY V
REFIN/VREFOUT
Figure 55. Internal Configuration When Using the Internal Reference
1
DAC
REGISTER
.
REF (+)
RESISTOR
STRING
REF (–)
GND
OUTPUT
AMPLIFIER
GAIN = ×2
V
OUT
06341-035
R
R
Figure 56. Resistor String
06341-033
INTERNAL REFERENCE
The AD5625R/AD5645R/AD5665R feature an on-chip reference.
Versions without the R suffix require an external reference. The
on-chip reference is off at power-up and is enabled via a write to a
control register. See the Internal Reference Setup section for details.
Versions packaged in a 10-lead LFCSP have a 1.25 V reference
or a 2.5 V reference, giving a full-scale output of 2.5 V or 5 V,
depending on the model selected (see the Ordering Guide). These
parts can be operated with a V
packaged in a 14-lead TSSOP have a 2.5 V reference, giving a
full-scale output of 5 V. Parts are functional with a V
of 2.7 V to 5.5 V, but, with a V
output is clamped to V
DD
of models. The internal reference associated with each part is
available at the V
pin (available on R suffix versions only).
REFOUT
A buffer is required if the reference output is used to drive
external loads. When using the internal reference, it is recommended that a 100 nF capacitor be placed between the reference
output and GND for reference stability.
supply of 2.7 V to 5.5 V. Versions
DD
supply
DD
supply of less than 5 V, the
DD
. See the Ordering Guide for a full list
Rev. B | Page 22 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
EXTERNAL REFERENCE
The V
reference if the application requires it. The default condition of
the on-chip reference is off at power-up. All devices can be
operated from a single 2.7 V to 5.5 V supply.
pin on the AD56x5R allows the use of an external
REFIN
SERIAL INTERFACE
The AD56x5R/AD56x5 have 2-wire I2C-compatible serial interfaces. The AD56x5R/AD56x5 can be connected to an I
a slave device, under the control of a master device. See Figure 3
for a timing diagram of a typical write sequence.
The AD56x5R/AD56x5 support standard (100 kHz), fast
(400 kHz), and high speed (3.4 MHz) data transfer modes.
High speed operation is only available on selected models. See
the Ordering Guide for a full list of models. Support is not
provided for 10-bit addressing and general call addressing.
The AD56x5R/AD56x5 each has a 7-bit slave address. The
10-lead versions of the part have a slave address whose five
MSBs are 00011, and the two LSBs are set by the state of the
ADDR address pin, which determines the state of the A0 and
A1 address bits. The 14-lead versions of the part have a slave
address whose three MSBs are 001, and the four LSBs are set by
the ADDR1 and ADDR2 address pins, which determine the
state of the A0 and A1 and A2 and A3 address bits, respectively.
The facility to make hardwired changes to the ADDR pin allows
the user to incorporate up to three of these devices on one bus,
as outlined in Table 8.
Table 8. ADDR Pin Settings (10-Lead Package)
ADDR Pin Connection A1 A0
VDD 0 0
NC 1 0
GND 1 1
The facility to make hardwired changes to the ADDR1 and the
ADDR2 pins allows the user to incorporate up to nine of these
devices on one bus, as outlined in Table 9.
The 2-wire serial bus protocol operates as follows:
The master initiates data transfer by establishing a start
1.
condition when a high-to-low transition on the SDA line
occurs while SCL is high. The following byte is the address
byte, which consists of the 7-bit slave address. The slave
address corresponding to the transmitted address responds
by pulling SDA low during the ninth clock pulse (this is
termed the acknowledge bit). At this stage, all other devices
on the bus remain idle while the selected device waits for
data to be written to or read from its shift register.
Data is transmitted over the serial bus in sequences of nine
2.
clock pulses (eight data bits followed by an acknowledge
bit). The transitions on the SDA line must occur during the
low period of SCL and remain stable during the high
period of SCL.
When all data bits have been read or written, a stop
3.
condition is established. In write mode, the master pulls
th
the SDA line high during the 10
clock pulse to establish a
stop condition. In read mode, the master issues a no
acknowledge for the ninth clock pulse (that is, the SDA line
remains high). The master brings the SDA line low before
th
clock pulse, and then high during the 10th clock
the 10
pulse to establish a stop condition.
WRITE OPERATION
When writing to the AD56x5R/AD56x5, the user must begin
W
with a start command followed by an address byte (R/
= 0),
after which the DAC acknowledges that it is prepared to receive
data by pulling SDA low. The AD5665 requires two bytes of
data for the DAC and a command byte that controls various
DAC functions. Three bytes of data must, therefore, be written
to the DAC, the command byte followed by the most significant
data byte and the least significant data byte, as shown in
and . After these data bytes are acknowledged by the
Figure 58
Figure 57
AD56x5R/AD56x5, a stop condition follows.
READ OPERATION
When reading data back from the AD56x5R/AD56x5, the
user begins with a start command followed by an address byte
W
= 1), after which the DAC acknowledges that it is prepared
(R/
to transmit data by pulling SDA low. Two bytes of data are then
read from the DAC, which are both acknowledged by the master
as shown in and . A stop condition follows. Figure 59Figure 60
Rev. B | Page 23 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
(
(
(
SCL
SDA
START BY
MASTER
SCL
CONTINUED)
SDA
(CONTINUED)
SCL
SDA
START BY
MASTER
SCL
CONTINUED)
1991
R/W
ACK. BY
FRAME 1
191
DB15 DB14 DB13 DB12 DB11 DB10 DB9
SLAVE ADDRESS
MOST SIGNIFICANT
FRAME 3
DATA BYTE
Figure 57. I
1991
FRAME 1
191
SLAVE ADDRESS
AD56x5
DB8
ACK. BY
AD56x5
2
C Write Operation (10-Lead Package)
R/W
ACK. BY
AD56x5
DB23A0A110001DB22 DB21 DB20 DB19 DB18 DB17 DB16
FRAME 2
COMMAND BYTE
DB7 DB6 DB5 DB4DB3 DB2 DB1DB0
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
DB23A0A1A2100A3DB22 DB21 DB20 DB19 DB18 DB17 DB16
FRAME 2
COMMAND BYTE
ACK. BY
AD56x5
9
STOP BY
ACK. BY
MASTER
AD56x5
6341-103
ACK. BY
AD56x5
9
SDA
(CONTINUED)
SCL
SDA
START BY
MASTER
SCL
CONTINUED)
SDA
(CONTINUED)
DB15 DB14 DB13 DB12 DB11 DB10 DB9
FRAME 3
MOST SIGNIFICANT
DATA BYTE
Figure 58. I
1991
FRAME 1
191
DB15 DB14 DB13 DB12 DB11 DB10 DB9
SLAVE ADDRESS
MOST SIGNIFICANT
FRAME 3
DATA BYTE
Figure 59. I
DB8
ACK. BY
AD56x5
2
C Write Operation (14-Lead Package)
R/W
ACK. BY
AD56x5
DB8
ACK. BY
MASTER
2
C Read Operation (10-Lead Package)
DB7 DB6 DB5 DB4DB3 DB2 DB1DB0
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
DB23A0A110001DB22 DB21 DB20 DB19 DB18 DB17 DB16
FRAME 2
COMMAND BYTE
DB7 DB6 DB5 DB4DB3 DB2 DB1DB0
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
STOP BY
ACK. BY
MASTER
AD56x5
6341-104
ACK. BY
MASTER
9
STOP BY
NO ACK.
MASTER
6341-101
Rev. B | Page 24 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
(
SCL
SDA
START BY
MASTER
SCL
CONTINUED)
SDA
(CONTINUED)
SCL
SDA
START BY
MASTER
1991
R/W
ACK. BY
FRAME 1
191
DB15 DB14 DB13 DB12 DB11 DB10 DB9
SLAVE ADDRESS
MOST SIGNIFICANT
FRAME 3
DATA BYTE
Figure 60. I
FAST MODEHIGH-SPEED MODE
1919
00001X XX001A3A2A1A0R/W
HS-MODE
MASTER CODE
AD56x5
2
C Read Operation (14-Lead Package)
DB23A0A1A2100A3DB22 DB21 DB20 DB19 DB18 DB17 DB16
FRAME 2
COMMAND BYTE
DB8
ACK. BY
MASTER
NO ACK. SR
DB7 DB6 DB5 DB4DB3 DB2 DB1DB0
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
SERIAL BUS
ADDRESS BYTE
ACK. BY
MASTER
9
NO ACK.
STOP BY
MASTER
ACK. BY
AD56x5
6341-102
6341-105
Figure 61. Placing the AD56x5RBRUZ-2/AD56x5RBRUZ-2REEL7 in High Speed Mode
HIGH SPEED MODE INPUT SHIFT REGISTER
Some models offer high speed serial communication with a
clock frequency of 3.4 MHz. See the Ordering Guide for a full
list of models.
High speed mode communication commences after the master
addresses all devices connected to the bus with the Master Code
00001XXX to indicate that a high speed mode transfer is to
begin. No device connected to the bus is permitted to acknowledge the high speed master code; therefore, the code is followed
by a no acknowledge. Next, the master must issue a repeated
start followed by the device address. The selected device then
acknowledges its address. All devices continue to operate in
high speed mode until the master issues a stop condition. When
the stop condition is issued, the devices return to standard/fast
CLR
mode. The part also returns to standard/fast mode when
is
activated while the part is in high speed mode.
The input shift register is 24 bits wide. Data is loaded into the
device as a 24-bit word under the control of a serial clock
input, SCL. The timing diagram for this operation is shown in
Figure 3. The eight MSBs make up the command byte. DB23
is reserved and should always be set to 0 when writing to the
device. DB22 (S) is used to select multiple byte operation.
The next three bits are the command bits (C2, C1, and C0)
that control the mode of operation of the device. See Table 10
for details. The last three bits of the first byte are the address bits
(A2, A1, and A0). See Table 11 for details. The rest of the bits
are the 16-/14-/12-bit data-word. The data-word comprises the
16-/14-/12-bit input code followed by two or four don’t care bits
for the AD5645R and the AD5625R/AD5625, respectively (see
Figure 64 through Figure 66).
MULTIPLE BYTE OPERATION
Multiple byte operation is supported on the AD56x5R/AD56x5.
A 2-byte operation is useful for applications that require fast
DAC updating and do not need to change the command byte.
The S bit (DB22) in the command register can be set to 1 for
2-byte mode of operation (see Figure 63). For standard 3-byte
and 4-byte operation, the S bit (DB22) in the command byte
should be set to 0 (see Figure 62).
Rev. B | Page 25 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
SLAVE
ADDRESS
S = 0
COMMAND
BYTE
BLOCK 1
MOST SIGNIFICANT
DATA BYTE
LEAST SI GNIFI CANT
DATA BYTE
S = 0
COMMAND
BYTE
BLOCK 2
MOST SI GNIFI CANT
DATA BYTE
LEAST SI GNIFI CANT
DATA BYTE
S = 0
COMMAND
BYTE
BLOCK n
MOST SI GNIFI CANT
DATA BYTE
LEAST SIGNIFICANT
DATA BYTE
Figure 62. Multiple Block Write with Command Byte in Each Block (S = 0)
SLAVE
ADDRESS
S = 1
COMMAND
BYTE
BLOCK 1
MOST SIG NIFICANT
DATA BYT E
S = 1
LEAST SI GNIFICANT
DATA BYT E
MOST SI GNIFICANT
DATA BYTE
Figure 63. Multiple Block Write with Initial Command Byte Only (S = 1)
Broadcast addressing is supported on the AD56x5R/AD56x5
in write mode only. Broadcast addressing can be used to synchronously update or power down multiple AD56x5R/AD56x5
devices. When the broadcast address is used, the AD56x5R/
AD56x5 responds regardless of the states of the address pins.
The AD56x5R/AD56x5 broadcast address is 00010000.
Table 10. Command Definition
C2 C1 C0 Command
0 0 0 Write to input Register n
0 0 1 Update DAC Register n
0 1 0
0 1 1 Write to and update DAC Channel n
1 0 0 Power up/power down
1 0 1 Reset
1 1 0
1 1 1 Internal reference setup (on/off )
Table 11. DAC Address Command
A2 A1 A0 ADDRESS (n)
0 0 0 DAC A
0 0 1 DAC B
0 1 0 DAC C
0 1 1 DAC D
1 1 1 All DACs
Write to input Register n, update all
(software LDAC)
register setup
LDAC
LDAC FUNCTION
The AD56x5R/AD56x5 DACs have double-buffered interfaces
consisting of two banks of registers: input registers and DAC
registers. The input registers are connected directly to the input
shift register, and the digital code is transferred to the relevant
input register upon completion of a valid write sequence. The
DAC registers contain the digital code used by the resistor strings.
LDAC
Access to the DAC registers is controlled by the
When the
LDAC
pin is high, the DAC registers are latched
and the input registers can change state without affecting the
LDAC
contents of the DAC registers. When
is brought low,
however, the DAC registers become transparent and the contents of
the input registers are transferred to them. The double-buffered
interface is useful if the user requires simultaneous updating of
all DAC outputs. The user can write to one of the input registers
LDAC
individually and then, by bringing
low when writing to
the other DAC input register, all outputs update simultaneously.
These parts each contain an extra feature whereby a DAC register
is not updated unless its input register has been updated since
LDAC
the last time
was brought low. Normally, when
brought low, the DAC registers are filled with the contents of the
input registers. In the case of the AD56x5R/AD56x5, the DAC
register updates only if the input register has changed since the
last time the DAC register was updated, thereby removing
unnecessary digital crosstalk.
The outputs of all DACs can be simultaneously updated, using
LDAC
the hardware
pin.
.
pin.
LDAC
is
Rev. B | Page 27 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
Synchronous
The DAC registers are updated after new data is read in.
can be permanently low or pulsed.
Asynchronous
The outputs are not updated at the same time that the input
registers are written to. When
registers are updated with the contents of the input register.
LDAC
The
the hardware
parts that do not have the hardware
This register allows the user to select which combination of
channels to simultaneously update when the hardware
pin is executed. Setting the
channel means that the update of this channel is controlled by
LDAC
the
updates; that is, the DAC register is updated after new data is
read in, regardless of the state of the
effectively sees the
LDAC
for the
useful in applications when the user wants to simultaneously
update select channels while the rest of the channels are
synchronously updating.
Writing to the DAC using Command 110 loads the 4-bit
register [DB3:DB0]. The default for each channel is 0; that is,
LDAC
the
the DAC register is updated, regardless of the state of the
pin. See for the contents of the input shift register
during the
register gives the user full flexibility and control over
LDAC
pin (and software
LDAC
on the 10-lead
LDAC
pin—see ).
Table 12
LDAC
LDAC
bit register to 0 for a DAC
pin. If this bit is set to 1, this channel synchronously
LDAC
pin. The device
LDAC
pin as being pulled low. See
Table 13
Table 12.
LFCSP (Load DAC Register)
LDAC
(DB3 to DB0)
0
1
Table 13.
TSSOP (Load DAC Register)
LDAC
(DB3 to DB0)
0 1/0
1
Bits
Bits
LDAC
Register Mode of Operation on the 10-Lead
LDAC
Register Mode of Operation on the 14-Lead
register mode of operation. This flexibility is
LDAC
pin works normally. Setting the bits to 1 means that
LDAC
Figure 67
LDAC
register setup command.
110A2A1A0XXXXXXXXXXXX
Mode of Operation
LDAC
Normal operation (default), DAC register
update is controlled by the write command.
The DAC registers are updated after new data
is read in.
Pin
LDAC
x = don’t
care
Operation
LDAC
Determined by the LDAC
pin.
The DAC registers are updated
after new data is read in.
DAC D DAC C DAC B DAC A
RESERVED
COMMAND
CARE
DON’T
DAC ADDRESS
(DON’T CARE)
DON’T CAREDON’ T CARE
LDAC
Figure 67.
Setup Command
DAC SELECT
(0 = LDAC PIN ENABLED)
06341-115
Rev. B | Page 28 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
POWER-DOWN MODES
Command 100 is reserved for the power-up/power-down
function. The power-up/power-down modes are programmed
by setting Bit DB5 and Bit DB4. This defines the output state of
the DAC amplifier, as shown in Tabl e 14 . Bit DB3 to Bit DB0
determine to which DAC or DACs the power-up/power-down
command is applied. Setting one of these bits to 1 applies the
power-up/power-down state defined by DB5 and DB4 to the
corresponding DAC. If a bit is 0, the state of the DAC is
unchanged. Figure 69 shows the contents of the input shift
register for the power-up/power-down command.
When Bit DB5 and Bit DB4 are set to 0, the part works normally
with its normal power consumption of 1 mA at 5 V. However,
for the three power-down modes, the supply current falls to
480 nA at 5 V. Not only does the supply current fall, but the
output stage is also internally switched from the output of the
amplifier to a resistor network of known values. This allows the
output impedance of the part to be known while the part is in
power-down mode. The outputs can either be connected
internally to GND through a 1 k or 100 k resistor or be left
open-circuited (three-state) as shown in Figure 66.
Note that the 14-lead TSSOP models offer the power-down
function when the part is operated with a V
The 10-lead LFCSP models offer the power-down function
when the part is powered with a V
of 2.7 V to 5.5 V.
DD
of 3.6 V to 5.5 V.
DD
Table 14. Modes of Operation for the AD56x5R/AD56x5
DB5 DB4 Operating Mode
0 0 Normal operation
Power-down modes
0 1 1 kΩ pull-down resistor to GND
1 0 100 kΩ pull-down resistor to GND
1 1 Three-state, high impedance
RESISTOR
STRING DAC
Figure 68. Output Stage During Power-Down
AMPLIFIER
POWER-DOW N
CIRCUITRY
RESISTOR
NETWORK
V
OUT
06341-038
The bias generator, output amplifier, resistor string, and other
associated linear circuitry are shut down when power-down
mode is activated. However, the contents of the DAC register
are unaffected when in power-down. The time to exit powerdown is typically 4 µs for V
The AD56x5R/AD56x5 contain a power-on reset circuit that
controls the output voltage during power-up. The 10-lead
version of the device powers up to 0 V. The 14-lead version has
a power-on reset (POR) pin that allows the output voltage to
be selected. By connecting the POR pin to GND, the AD56x5R/
AD56x5 output powers up to 0 V; by connecting the POR pin to
, the AD56x5R/AD56x5 output powers up to midscale. The
V
DD
output remains powered up at this level until a valid write sequence
is made to the DAC. This is useful in applications where it is
important to know the state of the output of the DAC while it is
in the process of powering up.
or
Any events on
LDAC
There is also a software reset function. Command 101 is the
software reset command. The software reset command contains
two reset modes that are software programmable by setting bit
DB0 in the input shift register.
Table 15 shows how the state of the bit corresponds to the
software reset modes of operation of the devices. Figure 70
shows the contents of the input shift register during the
software reset mode of operation.
during power-on reset are ignored.
CLR
Table 15. Software Reset Modes for the AD56x5R/AD56x5
The on-chip reference is off at power-up by default. It can be
turned on by sending the reference setup command (111) and
setting DB0 in the input shift register. Tabl e 16 shows how the
state of the bit corresponds to the mode of operation.
Table 16. Reference Setup Command
DB0 Action
0 Internal reference off (default)
1 Internal reference on
USING A REFERENCE AS A POWER SUPPLY FOR
THE AD56x5R/AD56x5
Because the supply current required by the AD56x5R/AD56x5 is
extremely low, an alternative option is to use a voltage reference
to supply the required voltage to the part (see Figure 72). This is
especially useful if the power supply is noisy or if the system
supply voltages are at some value other than 5 V or 3 V, for
example, 15 V. The voltage reference outputs a steady supply
voltage for the AD56x5R/AD56x5. If the low dropout REF195 is
used, it must supply 450 µA of current to the AD56x5R/AD56x5
with no load on the output of the DAC. When the DAC output
is loaded, the REF195 also must supply the current to the load.
The total current required (with a 5 kΩ load on the DAC
output) is
1 mA + (5 V/5 k) = 2 mA
The load regulation of the REF195 is typically 2 ppm/mA,
resulting in a 4 ppm (20 µV) error for the 2 mA current drawn
from it. This corresponds to a 0.263 LSB error.
15
5V
REF195
V
2-WIRE
SERIAL
INTERFACE
Figure 72. REF195 as Power Supply to the AD56x5R/AD56x5
SCL
SDA
BIPOLAR OPERATION USING THE
AD56x5R/AD56x5
The AD56x5R/AD56x5 have been designed for single-supply
operation, but a bipolar output range is also possible using the
circuit shown in Figure 73. The circuit gives an output voltage
range of ±5 V. Rail-to-rail operation at the amplifier output is
achievable using an AD820 or an OP295 as the output amplifier.
The output voltage for any input code can be calculated as follows:
⎡
⎛
×=
VV
⎜
⎢
O
⎣
where D represents the input code in decimal (0 to 65,535).
If V
= 5 V, R1 = R2 = 10 kΩ,
DD
10
⎛
V
⎜
O
⎝
This is an output voltage range of ±5 V, with 0x0000 corresponding to a −5 V output and 0xFFFF corresponding to a
+5 V output.
×=D
536,65
536,65
⎝
⎞
V5
−
⎟
⎠
AD5625R/
AD5645R/
AD5665R/
AD5625/
AD5665
⎞
⎛
×
⎟
⎜
⎝
⎠
DD
GND
R1
= 0V TO 5V
V
OUT
06341-043
+
R2R1D
⎞
V
⎟
DDDD
⎠
⎤
R2
⎞
⎛
×−
⎟
⎜
⎥
R1
⎠
⎝
⎦
R2 = 10kΩ
R1 = 10kΩ
+5
Figure 73. Bipolar Operation with the AD56x5R/AD56x5
V
0.1µF10µF
DD
AD5625R/
AD5645R/
AD5665R/
AD5625/
AD5665
2-WIRE
SERIAL
INTERFACE
V
OUT
SDASCLGND
+5V
AD820/
OP295
–5V
V
±5V
O
06341-044
POWER SUPPLY BYPASSING AND GROUNDING
When accuracy is important in a circuit, it is helpful to carefully
consider the power supply and ground return layout on the board.
The printed circuit board containing the AD56x5R/AD56x5
should have separate analog and digital sections, each having its
own area of the board. If the AD56x5R/AD56x5 are in a system
where other devices require an AGND-to-DGND connection,
the connection should be made at one point only. This ground
point should be as close as possible to the AD56x5R/AD56x5.
The power supply to the AD56x5R/AD56x5 should be bypassed
with 10 µF and 0.1 µF capacitors. The capacitors should be
located as close as possible to the device, with the 0.1 µF capacitor ideally right up against the device. The 10 µF capacitor is
the tantalum bead type. It is important that the 0.1 µF capacitor
have low effective series resistance (ESR) and low effective
series inductance (ESI), for example, common ceramic types of
capacitors. This 0.1 µF capacitor provides a low impedance path
to ground for high frequencies caused by transient currents due
to internal logic switching.
The power supply line itself should have as large a trace as
possible to provide a low impedance path and to reduce glitch
effects on the supply line. Clocks and other fast switching
digital signals should be shielded from other parts of the board
by digital ground. Avoid crossover of digital and analog signals
if possible. When traces cross on opposite sides of the board,
ensure that they run at right angles to each other to reduce
feedthrough effects through the board. The best board layout
technique is the microstrip technique where the component
side of the board is dedicated to the ground plane only, and the
signal traces are placed on the solder side. However, this is not
always possible with a 2-layer board.
Rev. B | Page 31 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
OUTLINE DIMENSIONS
3.00
BSC SQ
0.30
0.23
0.18
0.50 BSC
PIN 1 INDEX
AREA
0.80
0.75
0.70
SEATING
PLANE
6
*
EXPOSED
0.50
0.40
0.30
TOP VIEW
0.80 MAX
0.55 NOM
*
FOR PROPER CONNECTION OF THE EXPOSED PAD PLEASE REFER TO
THE PIN CONF IGURATIO N AND FUNCTIO N DESCRIPTIO NS SECTIO N
OF THIS DATA SHEET.
0.05 MAX
0.02 NOM
0.20 REF
(BOTTOM VIEW)
5
PAD
2.48
2.38
2.23
10
1.74
1.64
1.49
1
N
I
1
P
A
R
O
T
N
D
C
I
I
)
0
2
R
.
0
(
031208-B
Figure 74. 10-Lead Lead Frame Chip Scale Package [LFCSP_WD]
3 mm × 3 mm Body, Very Very Thin, Dual Lead
(CP-10-9)
Dimensions shown in millimeters
5.10
5.00
4.90
4.50
4.40
4.30
PIN 1
1.05
1.00
0.80
0.15
0.05
COPLANARITY
0.10
14
1
0.65 BSC
0.30
0.19
COMPLIANT TO JEDEC STANDARDS MO-153-AB-1
8
6.40
BSC
7
1.20
0.20
MAX
SEATING
PLANE
0.09
8°
0°
0.75
0.60
0.45
061908-A
Figure 75. 14-Lead Thin Shrink Small Outline Package [TSSOP]
(RU-14)
Dimensions shown in millimeters
Rev. B | Page 32 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
ORDERING GUIDE
Package
Description
Model
1
Temperature
Range Accuracy
On-Chip
Reference
Maximum
2
C Speed
I
AD5625BCPZ-R2 −40°C to +105°C ±1 LSB INL None 400 kHz 10-Lead LFCSP_WD CP-10-9 D8V
AD5625BCPZ-REEL7 −40°C to +105°C ±1 LSB INL None 400 kHz 10-Lead LFCSP_WD CP-10-9 D8V
AD5625BRUZ −40°C to +105°C ±1 LSB INL None 400 kHz 14-Lead TSSOP RU-14
AD5625BRUZ-REEL7 −40°C to +105°C ±1 LSB INL None 400 kHz 14-Lead TSSOP RU-14
AD5625RBCPZ-R2 −40°C to +105°C ±1 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 D8S
AD5625RBCPZ-REEL7 −40°C to +105°C ±1 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 D8S
AD5625RACPZ-REEL7 −40°C to +105°C ±4 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 DEU
AD5625RACPZ-1RL7 −40°C to +105°C ±4 LSB INL 2.5 V 400 kHz 10-Lead LFCSP_WD CP-10-9 DFW
AD5625RBRUZ-1 −40°C to +105°C ±1 LSB INL 2.5 V 400 kHz 14-Lead TSSOP RU-14
AD5625RBRUZ-1REEL7 −40°C to +105°C ±1 LSB INL 2.5 V 400 kHz 14-Lead TSSOP RU-14
AD5625RBRUZ-2 −40°C to +105°C ±1 LSB INL 2.5 V 3.4 MHz 14-Lead TSSOP RU-14
AD5625RBRUZ-2REEL7 −40°C to +105°C ±1 LSB INL 2.5 V 3.4 MHz 14-Lead TSSOP RU-14
AD5645RBCPZ-R2 −40°C to +105°C ±4 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 D89
AD5645RBCPZ-REEL7 −40°C to +105°C ±4 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 D89
AD5645RBRUZ −40°C to +105°C ±4 LSB INL 2.5 V 400 kHz 14-Lead TSSOP RU-14
AD5645RBRUZ-REEL7 −40°C to +105°C ±4 LSB INL 2.5 V 400 kHz 14-Lead TSSOP RU-14
AD5665BCPZ-R2 −40°C to +105°C ±16 LSB INL None 400 kHz 10-Lead LFCSP_WD CP-10-9 D6U
AD5665BCPZ-REEL7 −40°C to +105°C ±16 LSB INL None 400 kHz 10-Lead LFCSP_WD CP-10-9 D6U
AD5665BRUZ −40°C to +105°C ±16 LSB INL None 400 kHz 14-Lead TSSOP RU-14
AD5665BRUZ-REEL7 −40°C to +105°C ±16 LSB INL None 400 kHz 14-Lead TSSOP RU-14
AD5665RBCPZ-R2 −40°C to +105°C ±16 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 DA2
AD5665RBCPZ-REEL7 −40°C to +105°C ±16 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 DA2
AD5665RBRUZ-1 −40°C to +105°C ±16 LSB INL 2.5 V 400 kHz 14-Lead TSSOP RU-14
AD5665RBRUZ-1REEL7 −40°C to +105°C ±16 LSB INL 2.5 V 400 kHz 14-Lead TSSOP RU-14
AD5665RBRUZ-2 −40°C to +105°C ±16 LSB INL 2.5 V 3.4 MHz 14-Lead TSSOP RU-14
AD5665RBRUZ-2REEL7 −40°C to +105°C ±16 LSB INL 2.5 V 3.4 MHz 14-Lead TSSOP RU-14
EVAL-AD5665REBZ1
TSSOP Evaluation
Board
EVAL-AD5665REBZ2
LFCSP Evaluation
Board
1
Z = RoHS Compliant Part.
Package
Option Branding
Rev. B | Page 33 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
NOTES
Rev. B | Page 34 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
NOTES
Rev. B | Page 35 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
NOTES
I2C refers to a communications protocol originally developed by Philips Semiconductors (now NXP Semiconductors).