Analog Devices AD5305 15 25 f Datasheet

2.5 V to 5.5 V, 500 A, 2-Wire Interface
Quad Voltage Output, 8-/10-/12-Bit DACs
FEATURES AD5305: 4 Buffered 8-Bit DACs in 10-Lead MSOP
A Version: 1 LSB INL, B Version: 0.625 LSB INL
AD5315: 4 Buffered 10-Bit DACs in 10-Lead MSOP
A Version: 4 LSB INL, B Version: 2.5 LSB INL
AD5325: 4 Buffered 12-Bit DACs in 10-Lead MSOP
A Version: 16 LSB INL, B Version: 10 LSB INL Low Power Operation: 500 A @ 3 V, 600 A @ 5 V 2-Wire (I
2
C® Compatible) Serial Interface
2.5 V to 5.5 V Power Supply Guaranteed Monotonic by Design over All Codes Power-Down to 80 nA @ 3 V, 200 nA @ 5 V Three Power-Down Modes Double-Buffered Input Logic Output Range: 0 V to V
REF
Power-On Reset to 0 V Simultaneous Update of Outputs (LDAC Function) Software Clear Facility Data Readback Facility On-Chip Rail-to-Rail Output Buffer Amplifiers Temperature Range –40C to +105ⴗC
APPLICATIONS Portable Battery-Powered Instruments Digital Gain and Offset Adjustment Programmable Voltage and Current Sources Programmable Attenuators Industrial Process Control

FUNCTIONAL BLOCK DIAGRAM

*

GENERAL DESCRIPTION

The AD5305/AD5315/AD5325 are quad 8-, 10-, and 12-bit buffered voltage output DACs in a 10-lead MSOP that operate from a single 2.5 V to 5.5 V supply, consuming 500 µA at 3 V. Their on-chip output amplifiers allow rail-to-rail output swing with a slew rate of 0.7 V/µs. A 2-wire serial interface, which operates at clock rates up to 400 kHz, is used. This interface is SMBus compatible at V
< 3.6 V. Multiple devices can be
DD
placed on the same bus.
The references for the four DACs are derived from one reference pin. The outputs of all DACs may be updated simultaneously using the software LDAC function. The parts incorporate a power-on reset circuit, which ensures that the DAC outputs power up to 0 V and remain there until a valid write takes place to the device. There is also a software clear function that resets all input and DAC registers to 0 V. The parts contain a power-down feature that reduces the current consumption of the devices to 200 nA @ 5 V (80 nA @ 3 V).
The low power consumption of these parts in normal operation makes them ideally suited to portable battery-operated equipment. The power consumption is 3 mW at 5 V, 1.5 mW at 3 V, reducing to 1 µW in power-down mode.
V
DD
LDAC
INPUT
REGISTER
SCL
SDA
A0
*Protected by U.S.Patent No. 5,969,657and 5,684,481.
INTERFACE
LOGIC
POWER-ON
RESET
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
AD5305/AD5315/AD5325
REV. F
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
REF IN
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
GND
STRING
DAC A
STRING
DAC B
STRING
DAC C
STRING
DAC D
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © 2004 Analog Devices, Inc. All rights reserved.
BUFFER
POWER-DOWN
LOGIC
A
V
OUT
BBUFFER
V
OUT
V
CBUFFER
OUT
V
DBUFFER
OUT
AD5305/AD5315/AD5325–SPECIFICATIONS
C
= 200 pF to GND; all specifications T
L
Parameter
1
DC PERFORMANCE
3, 4
A Version Min Typ Max Min Typ Max Unit Conditions/Comments
MIN
to T
, unless otherwise noted.)
MAX
2
B Version
2
(VDD = 2.5 V to 5.5 V; V
= 2 V; RL = 2 k to GND;
REF
AD5305
Resolution 8 8 Bits Relative Accuracy ±0.15 ±1 ±0.15 ±0.625 LSB Differential Nonlinearity ±0.02 ±0.25 ±0.02 ±0.25 LSB Guaranteed Monotonic by Design
over All Codes
AD5315
Resolution 10 10 Bits Relative Accuracy ±0.5 ±4 ±0.5 ±2.5 LSB Differential Nonlinearity ±0.05 ±0.5 ±0.05 ±0.5 LSB Guaranteed Monotonic by Design
over All Codes
AD5325
Resolution 12 12 Bits Relative Accuracy ±2 ±16 ±2 ±10 LSB Differential Nonlinearity ±0.2 ±1 ±0.2 ±1 LSB Guaranteed Monotonic by Design
over All Codes
Offset Error ±0.4 ±3 ±0.4 ±3% of FSR Gain Error ±0.15 ±1 ±0.15 ±1% of FSR Lower Deadband 20 60 20 60 mV Lower deadband exists only if
Offset Error Drift Gain Error Drift Power Supply Rejection Ratio DC Crosstalk
DAC REFERENCE INPUTS
V
Input Range 0.25 V
REF
V
Input Impedance 37 45 37 45 k Normal Operation
REF
5
5
5
5
5
–12 –12 ppm of FSR/°C –5 –5 ppm of FSR/°C –60 –60 dB ⌬VDD = ± 10% 200 200 µVR
DD
0.25 V
DD
V
>10 >10 M Power-Down Mode
offset error is negative.
= 2 k to GND or V
L
DD
Reference Feedthrough –90 –90 dB Frequency = 10 kHz
OUTPUT CHARACTERISTICS
Minimum Output Voltage
Maximum Output Voltage
5
6
6
0.001 0.001 V This is a measure of the minimum and maximum drive capability
VDD – 0.001 VDD – 0.001 V of the output amplifier.
DC Output Impedance 0.5 0.5 Short Circuit Current 25 25 mA VDD = 5 V
16 16 mA VDD = 3 V
Power-Up Time 2.5 2.5 µs Coming out of Power-Down Mode.
VDD = 5 V
55µs Coming out of Power-Down Mode.
VDD = 3 V
LOGIC INPUTS (A0)
5
Input Current ±1 ±1 µA VIL, Input Low Voltage 0.8 0.8 V VDD = 5 V ± 10%
0.6 0.6 V VDD = 3 V ± 10%
0.5 0.5 V VDD = 2.5 V
VIH, Input High Voltage 2.4 2.4 V VDD = 5 V ± 10%
2.1 2.1 V VDD = 3 V ± 10%
2.0 2.0 V VDD = 2.5 V
Pin Capacitance 3 3 pF
LOGIC INPUTS (SCL, SDA)
VIH, Input High Voltage 0.7 V VIL, Input Low Voltage –0.3 0.3 VDD–0.3 0.3 VDDVSMBus Compatible at VDD < 3.6 V
5
DD
VDD + 0.3 0.7 V
DD
VDD + 0.3 VSMBus Compatible at VDD < 3.6 V
IIN, Input Leakage Current ± 1 ±1 µA V
, Input Hysteresis 0.05 V
HYST
CIN, Input Capacitance 8 8 pF
DD
0.05 V
DD
V
Glitch Rejection 50 50 ns Input filtering suppresses noise
spikes of less than 50 ns.
LOGIC OUTPUT (SDA)
VOL, Output Low Voltage 0.4 0.4 V I
Three-State Leakage Current ±1 ±1 µA
5
= 3 mA
0.6 0.6 V I
SINK
SINK
= 6 mA
Three-State Output Capacitance 8 8 pF
REV. F–2–
AD5305/AD5315/AD5325
Parameter
POWER REQUIREMENTS
V IDD (Normal Mode)
IDD (Power-Down Mode) VIH = VDD and VIL = GND
NOTES
1
See the Terminology section.
2
Temperature range (A, B Version): –40°C to +105°C; typical at +25°C.
3
DC specifications tested with the outputs unloaded.
4
Linearity is tested using a reduced code range: AD5305 (Code 8 to 248); AD5315 (Code 28 to 995); AD5325 (Code 115 to 3981).
5
Guaranteed by design and characterization, not production tested.
6
For the amplifier output to reach its minimum voltage, offset error must be negative; to reach its maximum voltage, V positive.
7
IDD specification is valid for all DAC codes. Interface inactive. All DACs active and excluding load currents.
Specifications subject to change without notice.
1
DD
VDD = 4.5 V to 5.5 V 600 900 600 900 µA VDD = 2.5 V to 3.6 V 500 700 500 700 µA
VDD = 4.5 V to 5.5 V 0.2 1 0.2 1 µAI
VDD = 2.5 V to 3.6 V 0.08 1 0.08 1 µAI
7

AC CHARACTERISTICS

Parameter
2
A Version Min Typ Max Min Typ Max Unit Conditions/Comments
2.5 5.5 2.5 5.5 V
(VDD = 2.5 V to 5.5 V; RL = 2 k to GND; CL = 200 pF to GND; all specifications T
1
otherwise noted.)
2
A, B Version
B Version
3
Min Typ Max Unit Conditions/Comments
Output Voltage Settling Time V
2
VIH = VDD and VIL = GND
= 4 µA (Max) During 0
DD
Readback on SDA
= 1.5 µA (Max) During 0
DD
Readback on SDA
= VDD and offset plus gain error must be
REF
to T
MAX
, unless
= VDD = 5 V
REF
MIN
AD5305 6 8 µs 1/4 Scale to 3/4 Scale Change (0x40 to 0xC0) AD5315 7 9 µs 1/4 Scale to 3/4 Scale Change (0x100 to 0x300) AD5325 8 10 µs 1/4 Scale to 3/4 Scale Change (0x400 to 0xC00)
Slew Rate 0.7 V/µs Major-Code Transition Glitch Energy 12 nV-s 1 LSB Change around Major Carry Digital Feedthrough 1 nV-s Digital Crosstalk 1 nV-s DAC-to-DAC Crosstalk 3 nV-s Multiplying Bandwidth 200 kHz V Total Harmonic Distortion –70 dB V
NOTES
1
Guaranteed by design and characterization, not production tested.
2
See the Terminology section.
3
Temperature range (A, B Version): –40°C to +105°C; typical at +25°C.
Specifications subject to change without notice.
= 2 V ± 0.1 V p-p
REF
= 2.5 V ± 0.1 V p-p, Frequency = 10 kHz
REF
REV. F
–3–
AD5305/AD5315/AD5325
, T
MAX
1, 2
(VDD = 2.5 V to 5.5 V; all specifications T
MIN
to T
, unless otherwise noted.)
MAX

TIMING CHARACTERISTICS

Limit at T
MIN
Parameter (A, B Version) Unit Conditions/Comments
f
SCL
t
1
t
2
t
3
t
4
t
5
3
t
6
t
7
t
8
t
9
t
10
t
11
C
B
NOTES
1
See Figure 1.
2
Guaranteed by design and characterization; not production tested.
3
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to VIH min of the SCL signal) in order to bridge the undefined region of SCL’s falling edge.
4
CB is the total capacitance of one bus line in pF. tR and tF measured between 0.3 VDD and 0.7 VDD.
Specifications subject to change without notice.
400 kHz max SCL Clock Frequency
2.5 µs min SCL Cycle Time
0.6 µs min t
1.3 µs min t
0.6 µs min t 100 ns min t
0.9 µs max t 0 µs min t
0.6 µs min t
0.6 µs min t
1.3 µs min t
, SCL High Time
HIGH
, SCL Low Time
LOW
, Start/Repeated Start Condition Hold Time
HD,STA
, Data Setup Time
SU,DAT
, Data Hold Time
HD,DAT
, Data Hold Time
HD,DAT
, Setup Time for Repeated Start
SU,STA
, Stop Condition Setup Time
SU,STO
, Bus Free Time between a STOP and a START Condition
BUF
300 ns max tR, Rise Time of SCL and SDA when Receiving 0 ns min t
, Rise Time of SCL and SDA when Receiving (CMOS Compatible)
R
250 ns max tF, Fall Time of SDA when Transmitting 0 ns min t 300 ns max t 20 + 0.1C
4
B
ns min tF, Fall Time of SCL and SDA when Transmitting
, Fall Time of SDA when Receiving (CMOS Compatible)
F
, Fall Time of SCL and SDA when Receiving
F
400 pF max Capacitive Load for Each Bus Line
SDA
SCL
t
9
t
4
START
CONDITION
t
3
t
10
t
6
t
t
11
2
t
5
Figure 1. 2-Wire Serial Interface Timing Diagram
t
7
REPEATED
START
CONDITION
t
4
t
1
t
8
STOP
CONDITION
REV. F–4–
AD5305/AD5315/AD5325

ABSOLUTE MAXIMUM RATINGS

(TA = 25°C, unless otherwise noted.)
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
SCL, SDA to GND . . . . . . . . . . . . . . . . –0.3 V to V
A0 to GND . . . . . . . . . . . . . . . . . . . . . . –0.3 V to V
Reference Input Voltage to GND . . . . . –0.3 V to V
A–D to GND . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
V
OUT
Operating Temperature Range
Industrial (A, B Version) . . . . . . . . . . . . . . –40°C to +105°C
Storage Temperature Range . . . . . . . . . . . . . –65°C to +150°C
Junction Temperature (T
max) . . . . . . . . . . . . . . . . . . . 150°C
J
1, 2
+ 0.3 V
DD
+ 0.3 V
DD
+ 0.3 V
DD
MSOP
Power Dissipation . . . . . . . . . . . . . . . . . . .(T
max – TA)/
J
␪JA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 206°C/W
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 44°C/W
JC
Reflow Soldering
Peak Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . 220°C
Time at Peak Temperature . . . . . . . . . . . . . 10 sec to 40 sec
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma­nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating condi­tions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.

ORDERING GUIDE

Model Temperature Range Package Description Package Option Branding
AD5305ARM –40°C to +105°C 10-Lead MSOP RM-10 DEA AD5305ARM-REEL7 –40°C to +105°C 10-Lead MSOP RM-10 DEA AD5315ARM –40°C to +105°C 10-Lead MSOP RM-10 DFA AD5315ARM-REEL7 –40°C to +105°C 10-Lead MSOP RM-10 DFA AD5325ARM –40°C to +105°C 10-Lead MSOP RM-10 DGA AD5325ARM-REEL7 –40°C to +105°C 10-Lead MSOP RM-10 DGA AD5305BRM –40°C to +105°C 10-Lead MSOP RM-10 DEB AD5305BRM-REEL –40°C to +105°C 10-Lead MSOP RM-10 DEB AD5305BRM-REEL7 –40°C to +105°C 10-Lead MSOP RM-10 DEB AD5315BRM –40°C to +105°C 10-Lead MSOP RM-10 DFB AD5315BRM-REEL –40°C to +105°C 10-Lead MSOP RM-10 DFB AD5315BRM-REEL7 –40°C to +105°C 10-Lead MSOP RM-10 DFB AD5325BRM –40°C to +105°C 10-Lead MSOP RM-10 DGB AD5325BRM-REEL –40°C to +105°C 10-Lead MSOP RM-10 DGB AD5325BRM-REEL7 –40°C to +105°C 10-Lead MSOP RM-10 DGB
JA
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD5305/AD5315/AD5325 feature proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
REV. F
–5–
AD5305/AD5315/AD5325

PIN CONFIGURATION

V
1
DD
A
B
C
AD5305/
2
AD5315/
3
AD5325
TOP VIEW
4
(Not to Scale)
5
V
OUT
V
OUT
V
OUT
REFIN

PIN FUNCTION DESCRIPTIONS

Pin No. Mnemonic Function
1V
DD
Power Supply Input. These parts can be operated from 2.5 V to 5.5 V and the supply should be decoupled to GND.
2V
3V
4V
ABuffered Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
BBuffered Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
CBuffered Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
5 REFIN Reference Input Pin for All Four DACs. It has an input range from 0.25 V to V
6V
DBuffered Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
OUT
7GND Ground Reference Point for All Circuitry on the Part.
8 SDA Serial Data Line. This is used in conjunction with the SCL line to clock data into or out of the 16-bit
input shift register. It is a bidirectional open-drain data line that should be pulled to the supply with an external pull-up resistor.
9 SCL Serial Clock Line. This is used in conjunction with the SDA line to clock data into or out of the 16-bit
input shift register. Clock rates of up to 400 kbit/s can be accommodated in the 2-wire interface.
10 A0 Address Input. Sets the least significant bit of the 7-bit slave address.
A0
10
SCL
9
SDA
8
GND
7
6
V
D
OUT
.
DD
TERMINOLOGY Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is a measure of the maximum deviation, in LSB, from a straight line passing through the endpoints of the DAC transfer function. Typical INL versus code plots can be seen in TPCs 1, 2, and 3.

Differential Nonlinearity

Differential nonlinearity (DNL) is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB maximum ensures monotonicity. This DAC is guaranteed monotonic by design. Typical DNL versus code plots can be seen in TPCs 4, 5, and 6.

Offset Error

This is a measure of the offset error of the DAC and the output amplifier. It is expressed as a percentage of the full-scale range.

Gain Error

This is a measure of the span error of the DAC. It is the devia­tion in slope of the actual DAC transfer characteristic from the ideal expressed as a percentage of the full-scale range.

Offset Error Drift

This is a measure of the change in offset error with changes in temperature. It is expressed in (ppm of full-scale range)/°C.

Gain Error Drift

This is a measure of the change in gain error with changes in temperature. It is expressed in (ppm of full-scale range)/°C.

Power Supply Rejection Ratio (PSRR)

This indicates how the output of the DAC is affected by changes in the supply voltage. PSRR is the ratio of the change in V a change in V in dB. V
REF
for full-scale output of the DAC. It is measured
DD
is held at 2 V and VDD is varied ±10%.
OUT
to

DC Crosstalk

This is the dc change in the output level of one DAC at midscale in response to a full-scale code change (all 0s to all 1s and vice versa) and output change of another DAC. It is expressed in µV.

Reference Feedthrough

This is the ratio of the amplitude of the signal at the DAC out­put to the reference input when the DAC output is not being updated. It is expressed in dB.
REV. F–6–
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