FEATURES
AD5305: 4 Buffered 8-Bit DACs in 10-Lead MSOP
A Version: ⴞ1 LSB INL, B Version: ⴞ0.625 LSB INL
AD5315: 4 Buffered 10-Bit DACs in 10-Lead MSOP
A Version: ⴞ4 LSB INL, B Version: ⴞ2.5 LSB INL
AD5325: 4 Buffered 12-Bit DACs in 10-Lead MSOP
A Version: ⴞ16 LSB INL, B Version: ⴞ10 LSB INL
Low Power Operation: 500 A @ 3 V, 600 A @ 5 V
2-Wire (I
2
C® Compatible) Serial Interface
2.5 V to 5.5 V Power Supply
Guaranteed Monotonic by Design over All Codes
Power-Down to 80 nA @ 3 V, 200 nA @ 5 V
Three Power-Down Modes
Double-Buffered Input Logic
Output Range: 0 V to V
REF
Power-On Reset to 0 V
Simultaneous Update of Outputs (LDAC Function)
Software Clear Facility
Data Readback Facility
On-Chip Rail-to-Rail Output Buffer Amplifiers
Temperature Range –40ⴗC to +105ⴗC
APPLICATIONS
Portable Battery-Powered Instruments
Digital Gain and Offset Adjustment
Programmable Voltage and Current Sources
Programmable Attenuators
Industrial Process Control
FUNCTIONAL BLOCK DIAGRAM
AD5305/AD5315/AD5325
*
GENERAL DESCRIPTION
The AD5305/AD5315/AD5325 are quad 8-, 10-, and 12-bit
buffered voltage output DACs in a 10-lead MSOP that operate
from a single 2.5 V to 5.5 V supply, consuming 500 µA at 3 V.
Their on-chip output amplifiers allow rail-to-rail output swing
with a slew rate of 0.7 V/µs. A 2-wire serial interface, which
operates at clock rates up to 400 kHz, is used. This interface is
SMBus compatible at V
< 3.6 V. Multiple devices can be
DD
placed on the same bus.
The references for the four DACs are derived from one reference
pin. The outputs of all DACs may be updated simultaneously
using the software LDAC function. The parts incorporate a
power-on reset circuit, which ensures that the DAC outputs power
up to 0 V and remain there until a valid write takes place to the
device. There is also a software clear function that resets all input
and DAC registers to 0 V. The parts contain a power-down
feature that reduces the current consumption of the devices to
200 nA @ 5 V (80 nA @ 3 V).
The low power consumption of these parts in normal operation
makes them ideally suited to portable battery-operated equipment.
The power consumption is 3 mW at 5 V, 1.5 mW at 3 V, reducing
to 1 µW in power-down mode.
V
DD
LDAC
INPUT
REGISTER
SCL
SDA
A0
*Protected by U.S.Patent No. 5,969,657and 5,684,481.
INTERFACE
LOGIC
POWER-ON
RESET
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
AD5305/AD5315/AD5325
REV. F
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
Temperature range (A, B Version): –40°C to +105°C; typical at +25°C.
3
DC specifications tested with the outputs unloaded.
4
Linearity is tested using a reduced code range: AD5305 (Code 8 to 248); AD5315 (Code 28 to 995); AD5325 (Code 115 to 3981).
5
Guaranteed by design and characterization, not production tested.
6
For the amplifier output to reach its minimum voltage, offset error must be negative; to reach its maximum voltage, V
positive.
7
IDD specification is valid for all DAC codes. Interface inactive. All DACs active and excluding load currents.
Specifications subject to change without notice.
1
DD
VDD = 4.5 V to 5.5 V600900600900µA
VDD = 2.5 V to 3.6 V500700500700µA
VDD = 4.5 V to 5.5 V0.210.21µAI
VDD = 2.5 V to 3.6 V0.0810.081µAI
7
AC CHARACTERISTICS
Parameter
2
A Version
MinTypMaxMinTypMaxUnitConditions/Comments
2.55.52.55.5V
(VDD = 2.5 V to 5.5 V; RL = 2 k⍀ to GND; CL = 200 pF to GND; all specifications T
1
otherwise noted.)
2
A, B Version
B Version
3
MinTypMaxUnitConditions/Comments
Output Voltage Settling TimeV
2
VIH = VDD and VIL = GND
= 4 µA (Max) During 0
DD
Readback on SDA
= 1.5 µA (Max) During 0
DD
Readback on SDA
= VDD and offset plus gain error must be
REF
to T
MAX
, unless
= VDD = 5 V
REF
MIN
AD530568µs1/4 Scale to 3/4 Scale Change (0x40 to 0xC0)
AD531579µs1/4 Scale to 3/4 Scale Change (0x100 to 0x300)
AD5325810µs1/4 Scale to 3/4 Scale Change (0x400 to 0xC00)
Slew Rate0.7V/µs
Major-Code Transition Glitch Energy12nV-s1 LSB Change around Major Carry
Digital Feedthrough1nV-s
Digital Crosstalk1nV-s
DAC-to-DAC Crosstalk3nV-s
Multiplying Bandwidth200kHzV
Total Harmonic Distortion–70dBV
NOTES
1
Guaranteed by design and characterization, not production tested.
2
See the Terminology section.
3
Temperature range (A, B Version): –40°C to +105°C; typical at +25°C.
Specifications subject to change without notice.
= 2 V ± 0.1 V p-p
REF
= 2.5 V ± 0.1 V p-p, Frequency = 10 kHz
REF
REV. F
–3–
AD5305/AD5315/AD5325
, T
MAX
1, 2
(VDD = 2.5 V to 5.5 V; all specifications T
MIN
to T
, unless otherwise noted.)
MAX
TIMING CHARACTERISTICS
Limit at T
MIN
Parameter(A, B Version)UnitConditions/Comments
f
SCL
t
1
t
2
t
3
t
4
t
5
3
t
6
t
7
t
8
t
9
t
10
t
11
C
B
NOTES
1
See Figure 1.
2
Guaranteed by design and characterization; not production tested.
3
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to VIH min of the SCL signal) in order to bridge the undefined region of
SCL’s falling edge.
4
CB is the total capacitance of one bus line in pF. tR and tF measured between 0.3 VDD and 0.7 VDD.
Specifications subject to change without notice.
400kHz maxSCL Clock Frequency
2.5µs minSCL Cycle Time
0.6µs mint
1.3µs mint
0.6µs mint
100ns mint
0.9µs maxt
0µs mint
0.6µs mint
0.6µs mint
1.3µs mint
, SCL High Time
HIGH
, SCL Low Time
LOW
, Start/Repeated Start Condition Hold Time
HD,STA
, Data Setup Time
SU,DAT
, Data Hold Time
HD,DAT
, Data Hold Time
HD,DAT
, Setup Time for Repeated Start
SU,STA
, Stop Condition Setup Time
SU,STO
, Bus Free Time between a STOP and a START Condition
BUF
300ns maxtR, Rise Time of SCL and SDA when Receiving
0ns mint
, Rise Time of SCL and SDA when Receiving (CMOS Compatible)
R
250ns maxtF, Fall Time of SDA when Transmitting
0ns mint
300ns maxt
20 + 0.1C
4
B
ns mintF, Fall Time of SCL and SDA when Transmitting
, Fall Time of SDA when Receiving (CMOS Compatible)
F
, Fall Time of SCL and SDA when Receiving
F
400pF maxCapacitive Load for Each Bus Line
SDA
SCL
t
9
t
4
START
CONDITION
t
3
t
10
t
6
t
t
11
2
t
5
Figure 1. 2-Wire Serial Interface Timing Diagram
t
7
REPEATED
START
CONDITION
t
4
t
1
t
8
STOP
CONDITION
REV. F–4–
AD5305/AD5315/AD5325
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C, unless otherwise noted.)
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
SCL, SDA to GND . . . . . . . . . . . . . . . . –0.3 V to V
A0 to GND . . . . . . . . . . . . . . . . . . . . . . –0.3 V to V
Reference Input Voltage to GND . . . . . –0.3 V to V
A–D to GND . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
Time at Peak Temperature . . . . . . . . . . . . . 10 sec to 40 sec
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.
AD5305ARM–40°C to +105°C10-Lead MSOPRM-10DEA
AD5305ARM-REEL7–40°C to +105°C10-Lead MSOPRM-10DEA
AD5315ARM–40°C to +105°C10-Lead MSOPRM-10DFA
AD5315ARM-REEL7–40°C to +105°C10-Lead MSOPRM-10DFA
AD5325ARM–40°C to +105°C10-Lead MSOPRM-10DGA
AD5325ARM-REEL7–40°C to +105°C10-Lead MSOPRM-10DGA
AD5305BRM–40°C to +105°C10-Lead MSOPRM-10DEB
AD5305BRM-REEL–40°C to +105°C10-Lead MSOPRM-10DEB
AD5305BRM-REEL7–40°C to +105°C10-Lead MSOPRM-10DEB
AD5315BRM–40°C to +105°C10-Lead MSOPRM-10DFB
AD5315BRM-REEL–40°C to +105°C10-Lead MSOPRM-10DFB
AD5315BRM-REEL7–40°C to +105°C10-Lead MSOPRM-10DFB
AD5325BRM–40°C to +105°C10-Lead MSOPRM-10DGB
AD5325BRM-REEL–40°C to +105°C10-Lead MSOPRM-10DGB
AD5325BRM-REEL7–40°C to +105°C10-Lead MSOPRM-10DGB
JA
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD5305/AD5315/AD5325 feature proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions
are recommended to avoid performance degradation or loss of functionality.
REV. F
–5–
AD5305/AD5315/AD5325
PIN CONFIGURATION
V
1
DD
A
B
C
AD5305/
2
AD5315/
3
AD5325
TOP VIEW
4
(Not to Scale)
5
V
OUT
V
OUT
V
OUT
REFIN
PIN FUNCTION DESCRIPTIONS
Pin No.MnemonicFunction
1V
DD
Power Supply Input. These parts can be operated from 2.5 V to 5.5 V and the supply should be
decoupled to GND.
2V
3V
4V
ABuffered Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
BBuffered Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
CBuffered Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
5REFINReference Input Pin for All Four DACs. It has an input range from 0.25 V to V
6V
DBuffered Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
OUT
7GNDGround Reference Point for All Circuitry on the Part.
8SDASerial Data Line. This is used in conjunction with the SCL line to clock data into or out of the 16-bit
input shift register. It is a bidirectional open-drain data line that should be pulled to the supply with an
external pull-up resistor.
9SCLSerial Clock Line. This is used in conjunction with the SDA line to clock data into or out of the 16-bit
input shift register. Clock rates of up to 400 kbit/s can be accommodated in the 2-wire interface.
10A0Address Input. Sets the least significant bit of the 7-bit slave address.
A0
10
SCL
9
SDA
8
GND
7
6
V
D
OUT
.
DD
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSB, from a straight
line passing through the endpoints of the DAC transfer function.
Typical INL versus code plots can be seen in TPCs 1, 2, and 3.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. Typical DNL versus code plots can be
seen in TPCs 4, 5, and 6.
Offset Error
This is a measure of the offset error of the DAC and the output
amplifier. It is expressed as a percentage of the full-scale range.
Gain Error
This is a measure of the span error of the DAC. It is the deviation in slope of the actual DAC transfer characteristic from the
ideal expressed as a percentage of the full-scale range.
Offset Error Drift
This is a measure of the change in offset error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Power Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in V
a change in V
in dB. V
REF
for full-scale output of the DAC. It is measured
DD
is held at 2 V and VDD is varied ±10%.
OUT
to
DC Crosstalk
This is the dc change in the output level of one DAC at midscale
in response to a full-scale code change (all 0s to all 1s and vice
versa) and output change of another DAC. It is expressed in µV.
Reference Feedthrough
This is the ratio of the amplitude of the signal at the DAC output to the reference input when the DAC output is not being
updated. It is expressed in dB.
REV. F–6–
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