Designed Specifically for High-Speed
Memory Decoders and Data Transmission
Systems
D
Incorporate Three Enable Inputs to Simplify
Cascading and/or Data Reception
D
Package Options Include Plastic
Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
SN54ALS138A, SN54AS138 ...J PACKAGE
SN74ALS138A, SN74AS138 ...D OR N PACKAGE
G2A
G2B
G1
Y7
GND
(TOP VIEW)
A
1
B
2
C
3
4
5
6
7
8
16
15
14
13
12
11
10
V
CC
Y0
Y1
Y2
Y3
Y4
Y5
Y6
9
The ′ALS138A and ′AS138 are 3-line to 8-line
decoders/demultiplexers designed for highperformance memory-decoding or data-routing
SN54ALS138A, SN54AS138 . . . FK PACKAGE
(TOP VIEW)
applications requiring very short propagation
delay times. In high-performance systems, these
devices can be used to minimize the effects of
system decoding. When employed with
high-speed memories with a fast enable circuit,
the delay times of the decoder and the enable time
of the memory are usually less than the typical
access time of the memory . The ef fective system
delay introduced by the Schottky-clamped system
decoder is negligible.
The conditions at the binary-select (A, B, and C)
inputs and the three enable (G1, G2A
, and G2B)
inputs select one of eight output lines. Two
BANC
3 2 1 20 19
C
4
NC
G1
5
6
7
8
910111213
Y7
G2A
G2B
NC – No internal connection
GND
NC
CC
V
Y6
Y0
18
17
16
15
14
Y5
Y1
Y2
NC
Y3
Y4
active-low and one active-high enable inputs
reduce the need for external gates or inverters when expanding. A 24-line decoder can be implemented without
external inverters and a 32-line decoder requires only one inverter. An enable input can be used as a data input
for demultiplexing applications.
The SN54ALS138A and SN54AS138 are characterized for operation over the full military temperature range
of –55°C to 125°C. The SN74ALS138A and SN74AS138 are characterized for operation from 0°C to 70°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
PHL
FROM
INPUT
TO
OUTPUT
RL = 500 Ω
TA = MIN to MAX
SN54AS138SN74AS138
MINMAXMINMAX
211210
21129.5
211.5210
211210
2927.5
21028.5
,
†
UNIT
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
(see Note A)
SN54ALS138A, SN54AS138, SN74ALS138A, SN74AS138
3-LINE TO 8-LINE DECODERS/DEMULTIPLEXERS
SDAS055E – APRIL 1982 – REVISED JUL Y 1996
PARAMETER MEASUREMENT INFORMATION
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES
7 V
V
CC
S1
R
L
Test
Point
C
L
R
L
From Output
Under Test
C
(see Note A)
Test
Point
L
From Output
Under Test
(see Note A)
R1
C
L
RL = R1 = R2
Test
Point
R2
LOAD CIRCUIT FOR
BI-STATE
TOTEM-POLE OUTPUTS
Timing
Input
t
su
Data
Input
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note B)
Waveform 2
S1 Open
(see Note B)
t
PZL
t
PZH
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
VOLTAGE WAVEFORMS
1.3 V
t
PHZ
1.3 V
1.3 V
t
1.3 V1.3 V
1.3 V1.3 V
FOR OPEN-COLLECTOR OUTPUTS
h
t
PLZ
LOAD CIRCUIT
3.5 V
0.3 V
3.5 V
0.3 V
3.5 V
0.3 V
[
3.5 V
V
OL
0.3 V
V
OH
0.3 V
[
0 V
High-Level
Low-Level
Out-of-Phase
(see Note C)
Pulse
Pulse
Input
In-Phase
Output
Output
LOAD CIRCUIT
FOR 3-STATE OUTPUTS
1.3 V1.3 V
t
w
1.3 V1.3 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.3 V1.3 V
t
PLH
t
PHL
1.3 V1.3 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.3 V1.3 V
t
PHL
t
PLH
3.5 V
0.3 V
3.5 V
0.3 V
3.5 V
0.3 V
V
V
V
V
OH
OL
OH
OL
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOL VE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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