The µPA603T is a mini-mold device provided with two
MOS FET circuits. It achieves high-density mounting and
saves mounting costs.
FEATURES
• Two MOS FET circuits in package the same size as
SC-59
µ
• Complement to
• Automatic mounting supported
PA602T
PACKAGE DIMENSIONS (in millimeters)
+0.1
–0.5
0.65
1.5
2.8 ±0.2
+0.1
0.32
–0.05
0.950.95
1.9
2.9 ±0.2
+0.1
0.16
–0.06
0.8
1.1 to 1.4
0 to 0.1
PIN CONNECTION (Top view)
ABSOLUTE MAXIMUM RATINGS (TA = 25 ˚C)
PARAMETERSYMBOLRATINGSUNIT
Drain to Source VoltageVDSS–50V
Gate to Source VoltageVGSS+16V
Drain Current (DC)ID(DC)–100mA
Drain Current (pulse)ID(pulse)*–200mA
Total Power DissipationPT300 (Total)mW
Channel TemperatureTch150˚C
Storage TemperatureTstg–55 to +150˚C
* PW ≤ 10 ms, Dury Cycle ≤ 50 %
Document No. G11250EJ1V0DS00 (1st edition)
Date Published June 1996 P
Printed in Japan
RDS(on)1VGS = –4.0 V, ID = –10 mA–60100Ω
RDS(on)2VGS = –10 V, ID = –10 mA–4060Ω
VDD = –5.0 V, ID = –10 mA, RL = 500 Ω
–75–ns
µ
A
µ
A
Marking: JA
SWITCHING TIME MEASUREMENT CIRCUIT AND CONDITIONS
V
L
PG.
0
V
GS
τ
τ = 1 s
µ
Duty Cycle ≤ 1 %
DUT
G
R
R
VDD
Gate
voltage
waveform
ID
Drain
current
waveform
GS
10 %
t
d(on)trtd(off)tf
0
10 %10 %
90 %
V
ID
GS(on)
90 %
90 %
2
TYPICAL CHARACTERISTICS (TA = 25 ˚C)
µ
PA603T
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
dT - Derating Factor - %
20
0
40206080 100 120 140 160255075100125150
T
C
- Case Temperature - ˚C
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
–120
Pulsed
measurement
–100
–8 V
–6 V
–4 V
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
350
300
250
200
150
Per one unit
100
- Total Power Dissipation - mW
T
50
P
0
A
- Ambient Temperature - ˚C
T
TRANSFER CHARACTERISTICS
–100
–10
Free air
Total
–80
–60
–40
- Drain Current - mA
D
I
–20
0
–2–4–6–8–10–12 –14
DS
- Drain to Source Voltage - V
V
GATE TO SOURCE CUTOFF VOLTAGE
vs. CHANNEL TEMPERATURE
–2.4
–2.2
–2.0
–1.8
–1.6
- Gate Cut-off Voltage - V
GS(off)
–1.4
V
–1.2
–30
0306090120150
ch
- Channel Temperature - ˚C
T
VGS = –2 V
DS
= –5.0 V
V
I
D
= –1 A
µ
–1
TA = 150 ˚C
75 ˚C
–0.1
- Drain Current - mA
D
I
25 ˚C
–25 ˚C
–0.01
–0.001
0
–5–10–15
GS
- Gate to Source Voltage - V
V
FORWARD TRANSFER ADMITTANCE
vs. DRAIN CURRENT
100
DS
= –5.0 V
V
50
20
10
TA = –25 ˚C
25 ˚C
5
75 ˚C
150 ˚C
2
| - Forward Transfer Admittance - mS
fs
|y
1
–1
–2–5–10–20–50–100
D
- Drain Current mA
I
DS
= –5.0 V
V
Pulsed
measurement
3
µ
PA603T
DRAIN TO SOURCE ON-STATE RESISTANCE
vs. GATE TO SOURCE VOLTAGE
100
ID = –1 mA
ID = –10 mA
50
RDS(on) - Drain to Source On-State Resistance - Ω
0
–4–8–12–16–20
GS - Gate to Source Voltage - V
V
DRAIN TO SOURCE ON-STATE RESISTANCE
vs. CHANNEL TEMPERATURE
140
GS = –4 V
V
I
D = –10 mA
120
100
80
60
40
RDS(on) - Drain to Source On-State Resistance - Ω
20
–30
0306090120150
ch - Channel Temperature - ˚C
T
Pulsed
measurement
DRAIN TO SOURCE ON-STATE RESISTANCE
vs. DRAIN CURRENT
150
100
TA = 150 ˚C
75 ˚C
25 ˚C
50
RDS(on) - Drain to Source On-State Resistance - Ω
0
–1
–25 ˚C
–2–5–10–20–50–100
D - Drain Current - mA
I
CAPACITANCE vs.
DRAIN TO SOURCE VOLTAGE
100
50
20
10
5
2
1
0.5
Ciss, Coss, Crss - Capacitance - pF
0.2
0.1
–1–2–5–10 –20–50 –100
–0.5
DS - Drain to Source Voltage - V
V
VGS = –4 V
Pulsed
measurement
VGS = 0
f = 1 MHz
Ciss
Coss
Crss
500
200
100
50
20
10
td(on), tr, td(off), tf - Switching Time - ns
5
–10–20–50 –100 –200–500
–5
4
SWITCHING CHARACTERISTICS
VDD = –5.0 V
V
GS = –4 V
tr
RG = 10 Ω
td(on)
tf
td(off)
D - Drain Current - mA
I
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
100
10
1
ISD - Source to Drain Current - mA
0.1
0.5
0.60.70.80.91
SD - Source to Drain Voltage - V
V
µ
PA603T
REFERENCE
Document NameDocument No.
NEC semiconductor device reliability/quality control systemTEI-1202
Quality grade on NEC semiconductor devicesIEI-1209
Semiconductor device mounting technology manualC10535E
Guide to quality assurance for semiconductor devicesMEI-1202
Semiconductor selection guideX10679E
5
µ
PA603T
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
“Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on
a customer designated “quality assurance program“ for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard:Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special:Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific:Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact NEC Sales Representative in advance.
Anti-radioactive design is not implemented in this product.
M4 94.11
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