Analog Devices AD660SQ-883B, AD660SQ, AD660BR, AD660BN, AD660AR, AD660AN Datasheet
Specifications and Main Features
Frequently Asked Questions
User Manual
16-BIT LATCH
16-BIT DAC
CONTROL
LOGIC
+10V REF
16-BIT LATCH
20
24
22
21
51112
16
15
14
13
17
18
19
23
AD660
10k
10.05k
10k
SIN/
DB0
DB7
S
OUT
SPAN/
BIP
OFFSET
V
OUT
AGND
REF OUT
REF IN
LDAC
SER
DGND
–V
EE+VCC+VLL
1234
LBE
CS
HBE
CLR
MSB/LSB/
DB1
UNI/BIP CLR/
Monolithic 16-Bit
a
FEATURES
Complete 16-Bit D/A Function
On-Chip Output Amplifier
On-Chip Buried Zener Voltage Reference
61 LSB Integral Linearity
15-Bit Monotonic over Temperature
Microprocessor Compatible
Serial or Byte Input
Double Buffered Latches
Fast (40 ns) Write Pulse
Asynchronous Clear (to 0 V) Function
Serial Output Pin Facilitates Daisy Chaining
Unipolar or Bipolar Output
Low Glitch: 15 nV-s
Low THD+N: 0.009%
PRODUCT DESCRIPTION
The AD660 DACPORT is a complete 16-bit monolithic D/A
converter with an on-board voltage reference, double buffered
latches and output amplifier. It is manufactured on Analog Devices’ BiMOS II process. This process allows the fabrication of
low power CMOS logic functions on the same chip as high precision bipolar linear circuitry.
The AD660’s architecture ensures 15-bit monotonicity over
time and temperature. Integral and differential nonlinearity is
maintained at ±0.003% max. The on-chip output amplifier provides a voltage output settling time of 10 µs to within 1/2 LSB
for a full-scale step.
The AD660 has an extremely flexible digital interface. Data can
be loaded into the AD660 in serial mode or as two 8-bit bytes.
This is made possible by two digital input pins which have dual
functions. The serial mode input format is pin selectable to be
MSB or LSB first. The serial output pin allows the user to daisy
chain several AD660s by shifting the data through the input
latch into the next DAC thus minimizing the number of control
lines required to SIN,
mat is also flexible in that the high byte or low byte data can be
loaded first. The double buffered latch structure eliminates data
skew errors and provides for simultaneous updating of DACs in
a multi-DAC system.
The AD660 is available in five grades. AN and BN versions are
specified from –40°C to +85°C and are packaged in a 24-pin
300 mil plastic DIP. AR and BR versions are also specified from
–40°C to +85°C and are packaged in a 24-pin SOIC. The SQ
version is packaged in a 24-pin 300 mil cerdip package and is
also available compliant to MIL-STD-883. Refer to the AD660/
883B data sheet for specifications and test conditions.
DACPORT is a registered trademark of Analog Devices, Inc.
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
CS and LDAC. The byte mode input for-
Serial/Byte DACPORT
AD660
FUNCTIONAL BLOCK DIAGRAM
PRODUCT HIGHLIGHTS
1. The AD660 is a complete 16-bit DAC, with a voltage reference, double buffered latches and output amplifier on a single chip.
2. The internal buried Zener reference is laser trimmed to
10.000 volts with a ± 0.1% maximum error and a temperature drift performance of ± 15 ppm/°C. The reference is
available for external applications.
3. The output range of the AD660 is pin programmable and can
be set to provide a unipolar output range of 0 V to +10 V or
a bipolar output range of –10 V to +10 V. No external components are required.
4. The AD660 is both dc and ac specified. DC specifications
include ±1 LSB INL and ±1 LSB DNL errors. AC specifications include 0.009% THD+N and 83 dB SNR.
5. The double buffered latches on the AD660 eliminate data
skew errors and allow simultaneous updating of DACs in
multi-DAC applications.
6. The CLEAR function can asynchronously set the output to
0 V regardless of whether the DAC is in unipolar or bipolar
mode.
7. The output amplifier settles within 10 µs to ±1/2 LSB for a
full-scale step and within 2.5 µs for a 1 LSB step over tem-
perature. The output glitch is typically 15 nV-s when a fullscale step is loaded.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700Fax: 617/326-8703
AD660–SPECIFICATIONS
(TA = +258C, VCC = +15 V, VEE = –15 V, VLL = +5 V unless otherwise noted)
ParameterMinTypMaxMinTypMaxUnits
AD660AN/AR/SQ AD660BN/BR
RESOLUTION1616Bits
DIGITAL INPUTS (T
V
(Logic “1”)2.05.5**Volts
IH
V
(Logic “0”)00.8**Volts
IL
I
(VIH = 5 5 V)±10*µA
IH
IIL (VIL = 0 V)±10*µA
MIN
to T
TRANSFER FUNCTION CHARACTERISTICS
MAX
)
1
Integral Nonlinearity±2±1LSB
to T
T
MIN
Differential Nonlinearity±2±1LSB
T
MIN
Monotonicity Over Temperature1415Bits
Gain Error
Gain Drift (T
DAC Gain Error
DAC Gain Drift
to T
2, 3
MAX
MAX
MIN
to T
4
4
)2515ppm/°C
MAX
±4±2LSB
±4±2LSB
±0.10*% of FSR
±0.05*% of FSR
10*ppm/°C
Unipolar Offset±2.5*mV
Unipolar Offset Drift (T
Bipolar Zero Error±7.5*mV
Bipolar Zero Error Drift (T
For 16-bit resolution, 1 LSB = 0.0015% of FSR. For 15-bit resolution, 1 LSB = 0.003% of FSR. For 14-bit resolution, 1 LSB = 0.006% of FSR. FSR stands for
Full-Scale Range and is 10 V in a Unipolar Mode and 20 V in Bipolar Mode.
2
Gain error and gain drift are measured using the internal reference. The internal reference is the main contributor to gain drift. If lower gain drift is required, the
AD660 can be used with a precision external reference such as the AD587, AD586 or AD688.
3
Gain Error is measured with fixed 50 Ω resistors as shown in the Application section. Eliminating these resistors increases the gain error by 0.25% of FSR (Unipolar
mode) or 0.50% of FSR (Bipolar mode).
4
DAC Gain Error and Drift are measured with an external voltage reference. They represent the error contributed by the DAC alone, for use with an external reference.
5
External current is defined as the current available in addition to that supplied to REF IN and SPAN/BIPOLAR OFFSET on the AD660.
6
Operation on ±12 V supplies is possible using an external reference such as the AD586 and reducing the output range. Refer to the Internal/External Reference section.
*Indicates that the specification is the same as AD660AN/AR/SQ.
Specifications subject to change without notice.
–2–
REV. A
AD660
WARNING!
ESD SENSITIVE DEVICE
AC PERFORMANCE CHARACTERISTICS
(With the exception of Total Harmonic Distortion + Noise and Signal-to-Noise
Ratio, these characteristics are included for design guidance only and are not subject to test. THD+N and SNR are 100% tested.
T
≤ TA ≤ T
MIN
ParameterLimitUnitsTest Conditions/Comments
Output Settling Time13µs max20 V Step, TA = +25°C
(Time to ±0.0008% FS8µs typ20 V Step, T
with 2 kΩ, 1000 pF Load)10µs typ20 V Step, T
Total Harmonic Distortion + Noise
A, B, S Grade0.009% max0 dB, 990.5 Hz; Sample Rate = 96 kHz; T
A, B, S Grade0.056% max–20 dB, 990.5 Hz; Sample Rate = 96 kHz; T
A, B, S Grade5.6% max–60 dB, 990.5 Hz; Sample Rate = 96 kHz; T
Signal-to-Noise Ratio83dB minT
Digital-to-Analog Glitch Impulse15nV-s typDAC Alternately Loaded with 8000H and 7FFF
Digital Feedthrough2nV-s typDAC Alternately Loaded with 0000H and FFFFH; CS High
, VCC = +15 V, VEE = –15 V, VLL = +5 V except where noted.)
MAX
6µs typ10 V Step, TA = +25°C
8µs typ10 V Step, T
2.5µs typ1 LSB Step, T
= +25°C
A
= +25°C
A
≤ TA ≤ T
MIN
≤ TA ≤ T
MIN
≤ TA ≤ T
MIN
MAX
MAX
MAX
= +25°C
A
= +25°C
A
= +25°C
A
H
Output Noise Voltage120nV/√
Hz typMeasured at V
; 20 V Span; Excludes Reference
OUT
Density (1 kHz – 1 MHz)
Reference Noise125nV/√Hz typMeasured at REF OUT
Specifications subject to change without notice.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD660 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
ABSOLUTE MAXIMUM RATINGS*
PIN CONFIGURATION
VCC to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +17.0 V
–V
+V
+V
DGND
DB7, 15
DB6, 14
DB5, 13
DB4, 12
DB3, 11
DB2, 10
EE
CC
LL
1
2
3
4
5
6
7
8
9
10
11
12
AD660
TOP VIEW
(Not to Scale)
V
to AGND . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –17.0 V
EE
V
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
DB1, 9, MSB/LSB
DB0, 8, SIN
24
REF OUT
23
REF IN
SPAN,
22
BIPOLAR OFFSET
V
21
OUT
20
AGND
19
LDAC
18
CLR
17
SER
16
HBE
15
LBE, UNI/BIP CLEAR
14
CS
13
S
OUT
REV. A
–3–
AD660
ORDERING GUIDE
TemperatureLinearity Error MaxLinearity Error Max Gain TC max PackagePackage
ModelRange+25°CT
AD660AN–40°C to +85°C±2 LSB±4 LSB25Plastic DIPN-24
AD660AR–40°C to +85°C±2 LSB±4 LSB25SOICR-24
AD660BN–40°C to +85°C±1 LSB±2 LSB15Plastic DIPN-24
AD660BR–40°C to +85°C±1 LSB±2 LSB15SOICR-24
AD660SQ–55°C to +125°C±2 LSB±4 LSB25CerdipQ-24
AD660SQ/883B** –55°C to +125°C±2 LSB********
*N = Plastic DIP; Q = Cerdip; R = SOIC.
**Refer to AD660/883B military data sheet.
MIN
– T
MAX
ppm/°CDescription Option*
TIMING CHARACTERISTICS
VCC = +15 V, VEE = –15 V, VLL = +5 V, VHI = 2.4 V, VLO = 0.4 V
ParameterLimit +25°CLimit –55°C to +125°CUnits
(Figure la)
t
CS
t
DS
t
DH
t
BES
t
BEH
t
LH
t
LW
4050ns min
4050ns min
010ns min
4050ns min
010ns min
80100ns min
4050ns min
(Figure lb)
t
CLK
t
LO
t
HI
t
SS
t
DS
t
DH
t
SH
t
LH
t
LW
80100ns min
3050ns min
3050ns min
010ns min
4050ns min
010ns min
010ns min
80100ns min
4050ns min
(Figure lc)
t
CLR
t
SET
t
HOLD
80110ns min
80110ns min
010ns min
(Figure ld)
t
PROP
t
DS
Specifications subject to change without notice.
50100ns min
5080ns min
BIT 0–7
HBE OR
LBE
CS
LDAC
t
t
DH
BEH
t
LH
t
DS
t
BES
t
CS
Figure 1a. AD660 Byte Load Timing
t
LW
REV. A–4–
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