12-/14-/16-bit nanoDACs
On-chip, 2.5 V, 5 ppm/°C reference in TSSOP
On-chip, 2.5 V, 10 ppm/°C reference in LFCSP
On-chip, 1.25 V, 10 ppm/°C reference in LFCSP
AD5625/AD5665
12-/16-bit nanoDACs
External reference only
3 mm × 3 mm 10-lead LFCSP and 14-lead TSSOP
2.7 V to 5.5 V power supply
Guaranteed monotonic by design
Power-on reset to zero scale/midscale
Per channel power-down
Hardware
2
I
C-compatible serial interface supports standard (100 kHz),
LDAC
and
functions
CLR
fast (400 kHz), and high speed (3.4 MHz) modes
APPLICATIONS
Process control
Data acquisition systems
Portable battery-powered instruments
Digital gain and offset adjustment
Programmable voltage and current sources
Programmable attenuators
GENERAL DESCRIPTION
The AD5625R/AD5645R/AD5665R and AD5625/AD5665
members of the nanoDAC® family are low power, quad, 12-/
14-/16-bit, buffered voltage-out DACs with/without an on-chip
reference. All devices operate from a single 2.7 V to 5.5 V supply,
are guaranteed monotonic by design, and have an I
serial interface.
The AD5625R/AD5645R/AD5665R have an on-chip reference.
The LFCSP versions of the AD56x5R have a 1.25 V or 2.5 V,
10 ppm/°C reference, giving a full-scale output range of 2.5 V or
5 V; the TSSOP versions of the AD56x5R have a 2.5 V, 5 ppm/°C
reference, giving a full-scale output range of 5 V. The on-chip
reference is off at power-up, allowing the use of an external
reference. The internal reference is enabled via a software write.
The AD5625/AD5665 require an external reference voltage to
set the output range of the DAC.
The part incorporates a power-on reset circuit that ensures that
the DAC output powers up to 0 V (POR = GND) or midscale
(POR = V
) and remains there until a valid write occurs. The
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
2
C-compatible
FUNCTIONAL BLOCK DIAGRAMS
REFIN
STRING
STRING
STRING
STRING
STRING
STRING
STRING
STRING
V
REFOUT
1.25V/2.5V REF
DAC A
DAC B
DAC C
DAC D
REFIN
DAC A
DAC B
DAC C
DAC D
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
DD
AD5625R/AD5645R/AD5665R
DDR1
DDR2
SCL
SDA
NOTES
1. THE FOLLOWING PINS ARE AVAILABLE ONLY ON 14-LEAD PACKAGE:
ADDR2, LDAC, CLR, POR.
INTERFACE
LDAC CLRPOR
INPUT
REGISTER
INPUT
REGISTER
LOGIC
INPUT
REGISTER
INPUT
REGISTER
POWER-ON RE SETPOWER-DOWN LOGIC
GND
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
Figure 1. AD5625R/AD5645R/AD5665R
DD
AD5625/AD5665
ADDR1
ADDR2
SCL
SDA
NOTES
1. THE FOL LOWI NG PINS ARE AVAI LABLE ONL Y ON 14-LEAD PACKAG E:
ADDR2, LDAC, CLR, POR.
INTERFACE
LDAC CLRPOR
INPUT
REGISTE R
INPUT
REGISTE R
LOGIC
INPUT
REGISTE R
INPUT
REGISTE R
POWER-O N RESETPOWER-DOWN LOGIC
GND
DAC
REGISTE R
DAC
REGISTE R
DAC
REGISTE R
DAC
REGISTE R
Figure 2. AD5625/AD5665
The AD56x5R/AD56x5 use a 2-wire I2C-compatible serial
interface that operates in standard (100 kHz), fast (400 kHz),
and high speed (3.4 MHz) modes.
Differential Nonlinearity ±1 ±0.25 LSB Guaranteed monotonic by design
Zero-Code Error 2 10 2 10 mV All 0s loaded to DAC register
Offset Error ±1 ±10 ±1 ±10 mV
Full-Scale Error −0.1 ±0.5 −0.1 ±0.5 % FSR All 1s loaded to DAC register
Gain Error ±0.1 ±1.25 ±0.1 ±1 % FSR
Zero-Code Error Drift ±2 ±2 µV/°C
Gain Temperature Coefficient ±2.5 ±2.5 ppm Of FSR/°C
DC Power Supply Rejection
−100 −100 dB DAC code = midscale; V
Ratio
DC Crosstalk (External
15 15 µV
Reference)
10 10 µV/mA Due to load current change
8 8 µV Due to powering down (per channel)
DC Crosstalk (Internal
25 25 µV
Reference)
20 20 µV/mA Due to load current change
10 10 µV Due to powering down (per channel)
OUTPUT CHARACTERISTICS
3
Output Voltage Range 0 VDD 0 VDD V Internal reference disabled
0
2 ×
V
REF
Capacitive Load Stability 2 2 nF RL = ∞
10 10 nF RL = 2 kΩ
DC Output Impedance 0.5 0.5 Ω
Short-Circuit Current 30 30 mA VDD = 5 V
Power-Up Time 4 4 µs
REFERENCE INPUTS
Reference Current 210 260 210 260 µA V
Reference Input Range 0.75 VDD 0.75 VDD V
Reference Input Impedance 26 26 kΩ
REFERENCE OUTPUT (1.25 V)
Output Voltage 1.247 1.253 1.247 1.253 V At ambient
Reference TC
3
±10 ±10 ppm/°C
Output Impedance 7.5 7.5 kΩ
= VDD; all specifications T
REFIN
2 ×
V
Rev. B | Page 3 of 36
to T
MIN
Due to full-scale output change,
R
Due to full-scale output change,
R
, unless otherwise noted.
MAX
= 2 kΩ to GND or V
L
= 2 kΩ to GND or V
L
Internal reference enabled
REF
Coming out of power-down mode;
VDD = 5 V
= VDD = 5.5 V
REF
= 5 V ± 10%
DD
DD
DD
1
AD5625R/AD5645R/AD5665R, AD5625/AD5665
A Grade B Grade
Parameter Min Typ Max Min Typ Max Unit Test Conditions/Comments1
REFERENCE OUTPUT (2.5 V) VDD = 4.5 V to 5.5 V
Output Voltage 2.495 2.505 2.495 2.505 V At ambient
Reference TC3 ±10 ±5 ±10 ppm/°C
Output Impedance 7.5 7.5 kΩ
LOGIC INPUTS (ADDRx, CLR,
, POR)3
LDAC
IIN, Input Current ±1 ±1 μA
V
, Input Low Voltage 0.15 × VDD 0.15 × VDD V
INL
V
, Input High Voltage 0.85 × VDD 0.85 × VDD V
INH
CIN, Pin Capacitance 2 2 pF
V
, Input Hysteresis 0.1 × VDD 0.1 × VDD V
HYST
LOGIC INPUTS (SDA, SCL)3
IIN, Input Current ±1 ±1 μA
V
, Input Low Voltage 0.3 × VDD 0.3 × VDD V
INL
V
, Input High Voltage 0.7 × VDD 0.7 × VDD V
INH
CIN, Pin Capacitance 2 2 pF
V
, Input Hysteresis 0.1 × VDD 0.1 × VDD V High speed mode
HYST
0.05 × VDD 0.05 × VDD V Fast mode
LOGIC OUTPUTS (SDA)3
VOL, Output Low Voltage 0.4 0.4 V I
0.6 0.6 V I
Floating-State Leakage
Current
Floating-State Output
Capacitance
POWER REQUIREMENTS
VDD 2.7 5.5 2.7 5.5 V
IDD (Normal Mode)4 V
VDD = 4.5 V to 5.5 V 1.0 1.16 1.0 1.16 mA Internal reference off
VDD = 2.7 V to 3.6 V 0.9 1.05 0.9 1.05 mA Internal reference off
VDD = 4.5 V to 5.5 V 1.9 2.14 1.9 2.14 mA Internal reference on
VDD = 2.7 V to 3.6 V 1.4 1.59 1.4 1.59 mA Internal reference on
IDD (All Power-Down Modes)5
VDD = 2.7 V to 5.5 V 0.48 1 0.48 1 μA VIH = VDD, VIL = GND (LFCSP)
VDD = 3.6 V to 5.5 V 0.48 1 0.48 1 μA VIH = VDD, VIL = GND (TSSOP)
1
Temperature range of A and B grades is −40°C to +105°C.
2
Linearity calculated using a reduced code range: AD5665R (Code 512 to Code 65,024), AD5645R (Code 128 to Code 16,256), AD5625R (Code 32 to Code 4064). Output
unloaded.
3
Guaranteed by design and characterization; not production tested.
4
Interface inactive. All DACs active. DAC outputs unloaded.
5
All DACs powered down. Power-down function is not available on 14-lead TSSOP parts when the part is powered with VDD < 3.6 V.
= 3 mA
SINK
= 6 mA
SINK
±1 ±1 μA
2 2 pF
= VDD, VIL = GND, full-scale loaded
IH
Rev. B | Page 4 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
SPECIFICATIONS—AD5665/AD5625
VDD = 2.7 V to 5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; V
Table 3.
B Grade
Parameter Min Typ Max Unit Test Conditions/Comments
STATIC PERFORMANCE
2
AD5665
Resolution 16 Bits
Relative Accuracy ±8 ±16 LSB
Differential Nonlinearity ±1 LSB Guaranteed monotonic by design
AD5625
Resolution 12 Bits
Relative Accuracy ±0.5 ±1 LSB
Differential Nonlinearity ±0.25 LSB Guaranteed monotonic by design
Zero-Code Error 2 10 mV All 0s loaded to DAC register
Offset Error ±1 ±10 mV
Full-Scale Error −0.1 ±0.5 % FSR All 1s loaded to DAC register
Gain Error ±0.1 ±1 % FSR
Zero-Code Error Drift ±2 µV/°C
Gain Temperature Coefficient ±2.5 ppm Of FSR/°C
DC Power Supply Rejection Ratio −100 dB DAC code = midscale; VDD = 5 V ± 10%
DC Crosstalk (External Reference) 15 µV
10 µV/mA Due to load current change
8 µV Due to powering down (per channel)
DC Crosstalk (Internal Reference) 25 µV
20 µV/mA Due to load current change
10 µV Due to powering down (per channel)
OUTPUT CHARACTERISTICS
3
Output Voltage Range 0 VDD V
Capacitive Load Stability 2 nF RL = ∞
10 nF RL = 2 kΩ
DC Output Impedance 0.5 Ω
Short-Circuit Current 30 mA VDD = 5 V
Power-Up Time 4 µs Coming out of power-down mode; VDD = 5 V
REFERENCE INPUTS
Reference Current 210 260 µA V
Reference Input Range 0.75 VDD V
Reference Input Impedance 26 kΩ
3
LOGIC INPUTS (ADDRx, CLR, LDAC, POR)
IIN, Input Current ±1 µA
V
, Input Low Voltage 0.15 × VDD V
INL
V
, Input High Voltage 0.85 × VDD V
INH
CIN, Pin Capacitance 2 pF
V
, Input Hysteresis 0.1 × VDD V
HYST
LOGIC INPUTS (SDA, SCL)
3
IIN, Input Current ±1 µA
V
, Input Low Voltage 0.3 × VDD V
INL
V
, Input High Voltage 0.7 × VDD V
INH
CIN, Pin Capacitance 2 pF
V
, Input Hysteresis 0.1 × VDD V High speed mode
HYST
0.05 × VDD V Fast mode
= VDD; all specifications T
REFIN
MIN
to T
, unless otherwise noted.
MAX
1
Due to full-scale output change,
= 2 kΩ to GND or V
R
L
DD
Due to full-scale output change,
R
= 2 kΩ to GND or V
L
DD
= VDD = 5.5 V
REF
Rev. B | Page 5 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
B Grade
Parameter Min Typ Max Unit Test Conditions/Comments
LOGIC OUTPUTS (SDA)
VOL, Output Low Voltage 0.4 V I
0.6 V I
3
= 3 mA
SINK
= 6 mA
SINK
Floating-State Leakage Current ±1 µA
Floating-State Output Capacitance 2 pF
POWER REQUIREMENTS
VDD 2.7 5.5 V
IDD (Normal Mode)
4
V
= VDD, VIL = GND, full-scale loaded
IH
VDD = 4.5 V to 5.5 V 1.0 1.16 mA
VDD = 2.7 V to 3.6 V 0.9 1.05 mA
IDD (All Power-Down Modes)
5
VDD = 2.7 V to 5.5 V 0.48 1 µA VIH = VDD, VIL = GND (LFCSP)
VDD = 3.6 V to 5.5 V 0.48 1 µA VIH = VDD, VIL = GND (TSSOP)
1
Temperature range of B grade is −40°C to +105°C.
2
Linearity calculated using a reduced code range: AD5665 (Code 512 to Code 65,024), AD5625 (Code 32 to Code 4064). Output unloaded.
3
Guaranteed by design and characterization; not production tested.
4
Interface inactive. All DACs active. DAC outputs unloaded.
5
All DACs powered down. Power-down function is not available on 14-lead TSSOP parts when the part is powered with VDD < 3.6 V.
1
Rev. B | Page 6 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; V
= VDD; all specifications T
REFIN
MIN
to T
, unless otherwise noted.
MAX
Table 4.
Parameter
1, 2
Min Typ Max Unit Test Conditions/Comments
3
Output Voltage Settling Time
AD5625R/AD5625 3 4.5 µs ¼ to ¾ scale settling to ±0.5 LSB
AD5645R 3.5 5 µs ¼ to ¾ scale settling to ±0.5 LSB
AD5665R/AD5665 4 7 µs ¼ to ¾ scale settling to ±2 LSB
Slew Rate 1.8 V/µs
Digital-to-Analog Glitch Impulse 1 LSB change around major carry
15 nV-s LFCSP
5 nV-s TSSOP
Digital Feedthrough 0.1 nV-s
Reference Feedthrough −90 dB V
= 2 V ± 0.1 V p-p, frequency 10 Hz to 20 MHz
REF
Digital Crosstalk 0.1 nV-s
Analog Crosstalk 1 nV-s External reference
4 nV-s Internal reference
DAC-to-DAC Crosstalk 1 nV-s External reference
4 nV-s Internal reference
Multiplying Bandwidth 340 kHz V
Total Harmonic Distortion −80 dB V
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C, typical @ 25°C.
Rev. B | Page 7 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
I2C TIMING SPECIFICATIONS
VDD = 2.7 V to 5.5 V; all specifications T
MIN
to T
, f
= 3.4 MHz, unless otherwise noted.1
MAX
SCL
Table 5.
Parameter Test Conditions
3
f
SCL
Standard mode 100 kHz Serial clock frequency
2
Min Max Unit Description
Fast mode 400 kHz
High speed mode, CB = 100 pF 3.4 MHz High speed mode, CB = 400 pF 1.7 MHz
t1 Standard mode 4 s t
, SCL high time
HIGH
Fast mode 0.6 s
High speed mode, CB = 100 pF 60 ns High speed mode, CB = 400 pF 120 ns
t2 Standard mode 4.7 s t
, SCL low time
LOW
Fast mode 1.3 s
High speed mode, CB = 100 pF 160 ns High speed mode, CB = 400 pF 320 ns
t3 Standard mode 250 ns t
, data setup time
SU;DAT
Fast mode 100 ns
High speed mode 10 ns
t4 Standard mode 0 3.45 s t
, data hold time
HD;DAT
Fast mode 0 0.9 s
High speed mode, CB = 100 pF 0 70 ns High speed mode, CB = 400 pF 0 150 ns
t5 Standard mode 4.7 s t
, setup time for a repeated start condition
SU;STA
Fast mode 0.6 s High speed mode 160 ns
t6 Standard mode 4 s t
, hold time (repeated) start condition
HD;STA
Fast mode 0.6 s High speed mode 160 ns
t7 Standard mode 4.7 s
, bus-free time between a stop and a start
t
BUF
condition
Fast mode 1.3 s
t8 Standard mode 4 s t
, setup time for a stop condition
SU;STO
Fast mode 0.6 s
High speed mode 160 ns
t9 Standard mode 1000 ns t
, rise time of SDA signal
RDA
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns High speed mode, CB = 400 pF 20 160 ns
t10 Standard mode 300 ns t
, fall time of SDA signal
FDA
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns High speed mode, CB = 400 pF 20 160 ns
t11 Standard mode 1000 ns t
, rise time of SCL signal
RCL
Fast mode 300 ns
High speed mode, CB = 100 pF 10 40 ns High speed mode, CB = 400 pF 20 80 ns
t
Standard mode 1000 ns
11A
, rise time of SCL signal after a repeated start
t
RCL1
condition and after an acknowledge bit
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns High speed mode, CB = 400 pF 20 160 ns
Rev. B | Page 8 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
Parameter Test Conditions
t12 Standard mode 300 ns t
2
Min Max Unit Description
, fall time of SCL signal
FCL
Fast mode 300 ns High speed mode, CB = 100 pF 10 40 ns High speed mode, CB = 400 pF 20 80 ns
t13 Standard mode 10 ns
pulse width low
LDAC
Fast mode 10 ns
High speed mode 10 ns
t14 Standard mode 300 ns
Falling edge of ninth SCL clock pulse of last byte
of a valid write to LDAC
falling edge
Fast mode 300 ns
High speed mode 30 ns
t15 Standard mode 20 ns
pulse width low
CLR
Fast mode 20 ns
High speed mode 20 ns
4
t
SP
Fast mode 0 50 ns Pulse width of spike suppressed
High speed mode 0 10 ns
1
See Figure 3. High speed mode timing specification applies only to the AD5625RBRUZ-2/AD5625RBRUZ-2REEL7 and AD5665RBRUZ-2/AD5665RBRUZ-2REEL7.
2
CB refers to the capacitance on the bus line.
3
The SDA and SCL timing is measured with the input filters enabled. Switching off the input filters improves the transfer rate but has a negative effect on the EMC
behavior of the part.
4
Input filtering on the SCL and SDA inputs suppresses noise spikes that are less than 50 ns for fast mode or less than 10 ns for high speed mode.
t
t
SCL
SDA
t
7
PSSP
2
t
6
11
t
4
t
12
t
1
t
3
t
6
t
5
t
10
t
8
t
14
t
9
LDAC*
CLR
*ASYNCHRONOUS LDAC UPDAT E MODE.
t
15
Figure 3. 2-Wire Serial Interface Timing Diagram
t
13
06341-003
Rev. B | Page 9 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 6.
Parameter Rating
VDD to GND −0.3 V to +7 V
V
to GND −0.3 V to VDD + 0.3 V
OUT
V
REFIN/VREFOUT
Digital Input Voltage to GND −0.3 V to VDD + 0.3 V
Operating Temperature Range, Industrial −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (TJ maximum) 150°C
Power Dissipation (TJ max − TA)/θJA
θJA Thermal Impedance
LFCSP_WD (4-Layer Board) 61°C/W
TSSOP 150.4°C/W
Reflow Soldering Peak Temperature,
RoHS Compliant
to GND −0.3 V to VDD + 0.3 V
260°C ± 5°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. B | Page 10 of 36
AD5625R/AD5645R/AD5665R, AD5625/AD5665
V
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
1
LDAC
2
ADDR1
V
OUT
V
OUT
POR
REFIN/VREFOUT
V
DD
A
C
AD5625R/
3
AD5645R/
4
AD5665R
TOP VIEW
5
(Not to Scale)
6
7
Figure 4. Pin Configuration (14-Lead TSSOP), R Suffix Version
1
LDAC
2
ADDR1
V
V
OUT
V
OUT
POR
V
REFIN
DD
A
C
AD5625/
3
AD5665
4
TOP VIEW
(Not to Scale)
5
6
7
Figure 5. Pin Configuration (14-Lead TSSOP)
14
13
12
11
10
9
8
14
SCL
13
SDA
12
GND
11
V
10
V
9
CLR
8
ADDR2
SCL
SDA
GND
V
OUT
V
OUT
CLR
ADDR2
B
D
OUT
OUT
1
V
A
OUT
2
V
B
OUT
3
B
D
06341-120
GND
4
V
C
OUT
5
V
D
OUT
EXPOSED PAD TIED TO GND.
Figure 6. Pin Configuration (10-Lead LFCSP), R Suffix Version
V
A
OUT
V
B
OUT
GND
V
C
OUT
V
D
OUT
6341-121
EXPOSED PAD TIED TO GND.
Figure 7. Pin Configuration (10-Lead LFCSP)
Table 7. Pin Function Descriptions
Pin Number
14-Lead 10-Lead Mnemonic Description
1 N/A
LDAC
Pulsing this pin low allows any or all DAC registers to be updated if the input registers have new data.
This allows simultaneous update of all DAC outputs. Alternatively, this pin can be tied permanently
low.
2 N/A ADDR1
Three-State Address Input. Sets the two least significant bits (Bit A1, Bit A0) of the 7-bit slave address
(see Table 9).
3 9 V
DD
Power Supply Input. These parts can be operated from 2.7 V to 5.5 V, and the supply should be
decoupled with a 10 F capacitor in parallel with a 0.1 F capacitor to GND.
4 1 V
5 4 V
6 N/A POR
A Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
C Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
Power-On Reset Pin. Tying the POR pin to GND powers up the part to 0 V. Tying the POR pin to V
powers up the part to midscale.
7 10 V
REFIN/VREFOUT
The AD56x5R have a common pin for reference input and reference output. When using the internal
reference, this is the reference output pin. When using an external reference, this is the reference
input pin. The default for this pin is as a reference input. (The internal reference and reference output
are only available on R suffix versions.) The AD56x5 has a reference input pin only.
8 N/A ADDR2
9 N/A
CLR
Three-State Address Input. Sets Bit A3 and Bit A2 of the 7-bit slave address (see Table 9).
Asynchronous Clear Input. The CLR input is falling-edge sensitive. While CLR is low, all LDAC pulses
are ignored. When CLR
is activated, zero scale is loaded to all input and DAC registers. This clears the
output to 0 V. The part exits clear code mode on the falling edge of the ninth clock pulse of the last
byte of the valid write. If CLR
is activated during a write sequence, the write is aborted. If CLR is
activated during high speed mode, the part exits high speed mode.
10 5 V
11 2 V
12 3 GND
13 8 SDA
D Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
OUT
B Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
Ground Reference Point for All Circuitry on the Part.
Serial Data Line. This is used in conjunction with the SCL line to clock data into or out of the 16-bit
input register. It is a bidirectional, open-drain data line that should be pulled to the supply with an
external pull-up resistor.
14 7 SCL
Serial Clock Line. This is used in conjunction with the SDA line to clock data into or out of the 16-bit
input register.
N/A 6 ADDR
Three-State Address Input. Sets the two least significant bits (Bit A1, Bit A0) of the 7-bit slave address
(see Table 8).
EPAD For the 10-lead LFCSP, the exposed pad must be tied to GND.
Rev. B | Page 11 of 36
AD5625R/
AD5645R/
AD5665R
TOP VIEW
(Not to Scale)
1
AD5625/
2
AD5665
3
TOP VIEW
(Not to Scale)
4
5
10
V
REFIN/VREFOUT
9
V
DD
8
SDA
7
SCL
6
ADDR
10
9
8
7
6
V
REFIN
V
DD
SDA
SCL
ADDR
06341-122
06341-123
DD
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