Analog Devices AD53033 Datasheet

High Performance Driver/Comparator

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FEATURES
250 MHz Operation
Driver/Comparator Included
52-Lead LQFP Package with Built-in Heat Sink

APPLICATIONS
Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems
Instrumentation and Characterization Equipment

PRODUCT DESCRIPTION

The AD53033 is a single chip that performs the pin electronics
functions of driver and comparator (D-C) in ATE VLSI and
memory testers.

The driver is a proprietary design that features three active
states: Data High Mode, Data Low Mode and Term Mode as
well as an Inhibit State. This facilitates the implementation of
high speed active termination. The output voltage range is –3 V
to +8 V to accommodate a wide variety of test devices. The
output leakage is typically less than 250 nA over the entire sig­nal range.

The dual comparator, with an input range equal to the driver
output range, features built-in latches and ECL-compatible

outputs. The outputs are capable of driving 50 Ω signal lines

terminated to –2 V. Signal tracking capability is upwards of
5 V/ns.

Also included on the chip is an onboard temperature sensor
whose purpose is to give an indication of the surface tempera-

ture of the D-C. This information can be used to measure θ
and θ

or flag an alarm if proper cooling is lost. Output from the

JA

JC

on a Single Chip

AD53033

FUNCTIONAL BLOCK DIAGRAM

VCCVCCV

51 52 39 40 4132

47

VH

45

VTERM

37

DATA

38

DATAB

IOD

43
42

IODB

49

RLD

50

RLDB

31

V

L

HCOMP

LEH

LEHB

QH

QHB

QL

QLB

LEL

LELB

LCOMP

PWRGND ECLGND HQGND2

NC = NO CONNECT

sensor is a current sink that is proportional to absolute tempera-

ture. The gain is trimmed to a nominal value of 1.0 µA/K. As
an example, the output current can be sensed by using a 10 kΩ

resistor connected from +10 V to the THERM (IOUT) pin. A
voltage drop across the resistor will be developed that equals:

10K × 1 µA/K = 10 mV/K = 2.98 V at room temperature.

VEEVEEVEEV

CC

DRIVER

COMPARATOR

2, 5, 89, 33, 44, 46, 48

AD53033

50V

1.0mA/K

EE

VHDCPL

V

OUT

VLDCPL

NC

THERM

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reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] World Wide Web Site: http://www.analog.com
Fax: [phone] © Analog Devices, Inc., 1999

AD53033–SPECIFICATIONS

DRIVER SPECIFICATIONS

(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V = ⴞ3% unless otherwise noted. All temperature coefficients are
measured at TJ = +75ⴗC to +95ⴗC). CHDCPL = CLDCPL = 39 nF.

Parameter Min Typ Max Units Test Conditions

DIFFERENTIAL INPUT CHARACTERISTICS

(DATA to DATA, IOD to IOD, RLD to RLD)

Input Voltage –2 0 V
Differential Input Range ECL

Bias Current –250 +250 µAV

REFERENCE INPUTS

Bias Currents –50 +50 µAV

OUTPUT CHARACTERISTICS

Logic High Range –2 8 V DATA = H, VH = –2 V to +8 V

Logic Low Range –3 5 V DATA = L, VL = –3 V to +5 V, VH = +6 V
Amplitude (VH and VL) 0.1 9 V VL = 0.0 V, VH = +0.1 V, VT = 0 V
Absolute Accuracy VL = –2 V, VH = +7 V, VT = 0 V

VH Offset –50 +50 mV DATA = H, VH = 0 V, VL = –3 V, VT = +3 V
VH Gain + Linearity Error 0.3 – 5 +0.3 + 5 % of VH + mV DATA = H, VH = –2 V to +8 V, VL = –3 V, VT = +3 V
VL Offset –50 +50 mV DATA = L, VL = –3 V, VH = +6 V, VT = +7.5 V
VL Gain + Linearity Error –0.3 – 5 +0.3 + 5 % of VL + mV DATA = L, VL = 0 V , VH = +6 V, VT = +7.5 V

Offset TC 0.5 mV/°CV

Output Resistance

V

= –2 V 44 46 48 Ω V

H

V

= +8 V 44 46 48 Ω V

H

V

= –3 V 44 46 48 Ω V

L

V

= +5 V 44 46 48 Ω V

L

V

= +3 V 46 Ω V

H

Dynamic Current Limit 100 mA C
Static Current Limit –85 +85 mA Output to –3 V, VH = +8 V, VL = –1 V, VT = 0 V

V

TERM

Voltage Range –3 8.0 V TERM MODE, VT = –3 V to +8 V, VL = 0 V, VH = 3 V
V

Offset –50 +50 mV TERM MODE, VT = 0 V, VL = 0 V, VH = 3 V

TERM

V

Gain + Linearity Error –0.3 + 5 +0.3 + 5 % of V

TERM

+ mV TERM MODE, VT = –3 V to +8 V, VL = 0 V, VH = 3 V

SET

Offset TC 0.5 mV/°CV
Output Resistance 44 46 49 Ω I

DYNAMIC PERFORMANCE, (VH AND VL)

Propagation Delay Time 1.1 1.6 2.1 ns Measured at 50%, VH = +400 mV, VL = –400 mV

Propagation Delay TC 2 ps/°C Measured at 50%, V

Delay Matching, Edge to Edge <100 ps Measured at 50%, VH = +400 mV, VL = –400 mV
Rise and Fall Times

1 V Swing 0.6 ns Measured 20%–80%, VL = 0 V, VH = 1 V
3 V Swing 1.0 ns Measured 20%–80%, VL = 0 V, VH = 3 V
5 V Swing 1.7 ns Measured 10%–90%, VL = 0 V, VH = 5 V
9 V Swing 3.0 ns Measured 10%–90%, VL = –2 V, VH = 7 V

Rise and Fall Time Temperature Coefficient

1 V Swing ±1 ps/°C Measured 20%–80%, V
3 V Swing ±2 ps/°C Measured 20%–80%, V
5 V Swing ±4 ps/°C Measured 10%–90%, V

Overshoot and Preshoot –3.0 – 50 +3.0 + 50 % of Step + mV VL, VH = –0.1 V, 0.1 V, VL, VH = 0.0 V, 1.0 V

Settling Time

to 15 mV <50 ns VL = 0 V, VH = 0.5 V

to 4 mV <10 µsV

= –2 V, 0.0 V

IN

, VH, VT = 5 V

L

VL = –3 V (VH = –2 V to +6 V)
VL = –1 V (VH = +6 V to +8 V)

= 0 V, VH = +5 V, VT = 0 V

L

= –3 V, VT = 0 V, I

L

= –1 V, VT = 0 V, I

L

= +6 V, VT = 0 V, I

H

= +6 V, VT = 0 V, I

H

= 0 V, VT = 0 V, I

L

= 39 nF, VH = +7 V, VL = –2 V, VT = 0 V

BYP

= 0, +1, +30 mA

OUT

= 0, –1, –30 mA

OUT

= 0, +1, +30 mA

OUT

= 0, –1, –30 mA

OUT

= –30 mA (Trim Point)

OUT

DATA = H and Output to +8 V, VH = +6 V,
VL = –3 V, VT = 0 V, DATA = L

= 0 V, VL = 0 V, VH = 3 V

T

= +30 mA, +1.0 mA, VT = –3.0 V, VH = 3 V, VL = 0 V

OUT

I

= –30 mA, –1.0 mA, VT = +8.0 V, VH = 3 V, VL = 0 V

OUT

I

= ±30 mA, ±1.0 mA, V

OUT

= 0 V, VH = 3 V, VL = 0 V

T

= +400 mV, VL = –400 mV

H

= 0 V, VH = 1 V

L

= 0 V, VH = 3 V

L

= 0 V, VH = 5 V

L

VL, VH = 0.0 V, 3.0 V, VL, VH = 0.0 V, 5.0 V
VL, VH = –2.0 V, 7.0 V

= 0 V, VH = 0.5 V

L

–2–

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