4
UCC2882/-1
UCC3882/-1
CAM: This pin is the inverting input to the current ampli-
fier. The average load current feedback from the ISOUT
pin is applied through a resistor to this pin. The current
loop compensation network is also connected to this pin
(see CAO below).
CAO: This pin is the current amplifier output. The current
loop compensation network is connected between this
pin and the CAM pin. The voltage on this pin is the input
to the PWM comparator and regulates the output voltage
of the system. The voltage at this output ranges from below 0.5V (forcing 0% duty cycle) to above 2.5V forcing
maximum duty cycle. A 3V clamp circuit prevents the
CAO voltage from rising excessively past the oscillator
peak voltage, for excellent transient response.
COMP: This pin is the voltage error amplifier output voltage. The system voltage compensation network is applied between COMP and VFB. A 1.37V clamp above
COMMAND is used to force the power supply into current limit mode when the output is short circuited. See
the Applications Section for programming current limit.
COMMAND: This pin is the output of the 5-bit digital-to-analog (DAC) converter and is the non-inverting input of the voltage error amplifier. The voltage on this pin
sets the switching regulator output voltage. The COMMAND voltage is set by the DAC input pins D0-D4, according to Table 1. The COMMAND source impedance is
typically 1.2kΩ and must therefore drive only high impedance inputs if accuracy is to be maintained. Bypass
COMMAND with a 0.01µF, low ESR, low ESL capacitor
for best circuit noise immunity.
CT: This pin is used with RT to program the internal
PWM oscillator frequency. Use a high quality capacitor
for best oscillator accuracy. See the Applications Section
for programming the oscillator.
D0-D4: These are the digital input control codes for the
DAC (See Table 1). The DAC is comprised of two ranges
set by D4 and with D0 representing the least significant
bit (LSB) and D3, the most significant bit (MSB). A bit is
set low by being connected to GND; a bit is set high by
floating it, or connecting it to a 5V source. Each control
pin is pulled up to approximately 5V by an internal pull
up.
EN: This input is used to disable the GATEHI and
GATELO outputs, resulting in disabling the power supply.
Pulling EN to GND causes the GATEHI and GATELO
outputs to be held low, while floating the pin or pulling it
up to 5V ensures normal operation. EN is pulled up to 5V
internally.
GATEHI: This output provides a low impedance totem
pole driver to drive the high-side external MOSFET. A series resistor between this pin and the gate of the external
MOSFET is recommended to prevent gate drive ringing
and overshoot. Good layout techniques should be used
to prevent GATEHI from ringing more than 0.3V below
PGND. The VDRVHI pin provides the power for the
GATEHI pin. GATEHI is disabled during UVLO and
overvoltage conditions. For the 2882/3882 only, GATEHI
is also disabled when the COMMAND voltage is programmed between 1.3 and 1.75V, or where the D0-D4
pins are all logic high levels, indicating no processor
present.
PIN DESCRIPTIONS
ELECTRICAL CHARACTERISTICS: Unless otherwise specified, VIN = VDRVHI = VDRVLO = 12V, VSNS = 3.5V, V
D0
= V
D1
= VD2= VD3= VD4= 0V, RT= 13k, CT= 1.8nF, EN = Open, 0°C < TA< 70°C, TA=TJ.
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
Turn On Delay
GATEHI Turn Off to GATELO Turn On 150 ns
GATELO Turn Off to GATEHI Turn On 135 ns
Foldback Current Limit
Clamp Level V
COMMAND = VSNS 1.37 V
V
FB = VCOMMAND – 100mV (Note 3)
V
SNS = 0 0.71 V
V
FB = VCOMMAND – 100mV (Note 3)
System Short Circuit Current Limit V
COMMAND = 2.3V 14.4 17 22 A
V
FB = 0V (Note 4)
Note 1: This test measures the combined errors of the COMMAND voltage and the voltage amplifier offset voltage. Applies to all
DAC codes from 1.8V to 3.5V.
Note 2: This percentage is measured with respect to the ideal COMMAND voltage programmed by the D0 - D4 pins.
Note 3: This voltage is measured with respect to the COMMAND voltage.
Note 4: The calculation of this parameter assumes an offchip sense resistor value of 0.005
Ω
. This test encompasses all sources
of error from the IC.