PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
– 16 x 16 and 32 x 32 MAC OperationsSupports 45 Peripheral Interrupts
– 16 x 16 Dual MAC• Three 32-Bit CPU-Timers
– Harvard Bus Architecture• 128-Bit Security Key/Lock
– Atomic Operations– Protects Flash/ROM/OTP and L0/L1 SARAM
– Fast Interrupt Response and Processing– Prevents Firmware Reverse-Engineering
– Unified Memory Programming Model• Motor Control Peripherals
– 4M Linear Program/Data Address Reach– Two Event Managers (EVA, EVB)
– Code-Efficient (in C/C++ and Assembly)– Compatible to 240xA Devices
– TMS320F24x/LF240x Processor Source Code• Serial Port Peripherals
Compatible
• On-Chip Memory
– Flash Devices: Up to 128K x 16 Flash(SCIs), Standard UART
(Four 8K x 16 and Six 16K x 16 Sectors)
– ROM Devices: Up to 128K x 16 ROM
– 1K x 16 OTP ROM
– L0 and L1: 2 Blocks of 4K x 16 Each
Single-Access RAM (SARAM)
– H0: 1 Block of 8K x 16 SARAM
– M0 and M1: 2 Blocks of 1K x 16 Each
SARAM
• Boot ROM (4K x 16)
– With Software Boot Modes
– Standard Math Tables
• External Interface (2812)
– Over 1M x 16 Total Memory
– Programmable Wait States
– Programmable Read/Write Strobe Timing
– Three Individual Chip Selects
– Watchdog Timer Module
• Three External Interrupts
• Peripheral Interrupt Expansion (PIE) Block That
– Serial Peripheral Interface (SPI)
– Two Serial Communications Interfaces
– Enhanced Controller Area Network (eCAN)
– Multichannel Buffered Serial Port (McBSP)
• 12-Bit ADC, 16 Channels
– 2 x 8 Channel Input Multiplexer
– Two Sample-and-Hold
– Single/Simultaneous Conversions
– Fast Conversion Rate: 80 ns/12.5 MSPS
• Up to 56 General-Purpose I/O (GPIO) Pins
• Advanced Emulation Features
– Analysis and Breakpoint Functions
– Real-Time Debug via Hardware
• Development Tools Include
– ANSI C/C++ Compiler/Assembler/Linker
– Code Composer Studio™ IDE
– DSP/BIOS™
– JTAG Scan Controllers
(1)
• Low-Power Modes and Power Savings
– IDLE, STANDBY, HALT Modes Supported
– Disable Individual Peripheral Clocks
(1) IEEE Standard 1149.1-1990 IEEE Standard Test Access Port
and Boundary-Scan Architecture
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
3eZdsp is a trademark of Spectrum Digital Incorporated.
4All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
• Package Options• Temperature Options
– 179-Ball MicroStar BGA™ With External– A: –40°C to 85°C (GHH, ZHH, PGF, PBK)
Memory Interface (GHH, ZHH) (2812)
– 176-Pin Low-Profile Quad Flatpack (LQFP)
With External Memory Interface (PGF) (2812)
– S: –40°C to 125°C (GHH, ZHH, PGF, PBK)
– Q: –40°C to 125°C (PGF, PBK)
[Q100 Qualification]
– 128-Pin LQFP Without External Memory
Interface (PBK) (2810, 2811)
1.2Getting Started
This section gives a brief overview of the steps to take when first developing for a C28x™ device. For
more detail on each of these steps, see the following:
•Getting Started With TMS320C28x Digital Signal Controllers (literature number SPRAAM0)
•C2000 Getting Started Website (http://www.ti.com/c2000getstarted)
•TMS320F28x DSC Development and Experimenter’s Kits (http://www.ti.com/f28xkits)
This section provides a summary of each device’s features, lists the pin assignments, and describes the
function of each pin. This document also provides detailed descriptions of peripherals, electrical
specifications, parameter measurement information, and mechanical data about the available packaging.
2.1Description
The TMS320F2810, TMS320F2811, TMS320F2812, TMS320C2810, TMS320C2811, and TMS320C2812
devices, members of the TMS320C28x™ DSP generation, are highly integrated, high-performance
solutions for demanding control applications. The functional blocks and the memory maps are described in
Section 3, Functional Overview.
Throughout this document, TMS320F2810, TMS320F2811, and TMS320F2812 are abbreviated as F2810,
F2811, and F2812, respectively. F281x denotes all three Flash devices. TMS320C2810, TMS320C2811,
and TMS320C2812 are abbreviated as C2810, C2811, and C2812, respectively. C281x denotes all three
ROM devices. 2810 denotes both F2810 and C2810 devices; 2811 denotes both F2811 and C2811
devices; and 2812 denotes both F2812 and C2812 devices.
● Channels161616161616
32-Bit CPU Timers–333333
Serial Peripheral Interface (SPI)0YesYesYesYesYesYes
Serial Communications Interfaces A and BSCIA,SCIA,SCIA,SCIA,SCIA,SCIA,
(SCIA and SCIB)SCIBSCIBSCIBSCIBSCIBSCIB
Controller Area Network (CAN)0YesYesYesYesYesYes
Multichannel Buffered Serial Port (McBSP)0YesYesYesYesYesYes
Digital I/O Pins (Shared)–565656565656
External Interrupts–333333
Supply Voltage–1.8-V Core (135 MHz), 1.9-V Core (150 MHz), 3.3-V I/O
number SPRZ193) has been posted on the Texas Instruments (TI) website. It will be updated as needed.
(2) A type change represents a major functional feature difference in a peripheral module. Within a peripheral type, there may be minor
differences between devices that do not affect the basic functionality of the module. These device-specific differences are listed in the
TMS320x28xx, 28xxx DSP Peripheral Reference Guide (literature number SPRU566) and in the peripheral reference guides.
(3) On C281x devices, OTP is replaced by a 1K x 16 block of ROM.
(4) See Section 5.1, Device and Development Support Tool Nomenclature, for descriptions of device stages.
(4)
176-pin PGF––Yes––Yes
179-ball GHH––Yes––Yes
179-ball ZHH––Yes––Yes
A: –40°C to 85°C–YesYesYesYesYesYes
S: –40°C to 125°C–YesYesYesYesYesYes
Q: –40°C to 125°C
Figure 2-1 illustrates the ball locations for the 179-ball GHH and ZHH ball grid array (BGA) packages.
Figure 2-2 shows the pin assignments for the 176-pin PGF low-profile quad flatpack (LQFP) and
Figure 2-3 shows the pin assignments for the 128-pin PBK LQFP. Table 2-2 describes the function(s) of
each pin.
2.3.1Terminal Assignments for the GHH/ZHH Packages
See Table 2-2 for a description of each terminal’s function(s).
The TMS320F2812 and TMS320C2812 176-pin PGF low-profile quad flatpack (LQFP) pin assignments
are shown in Figure 2-2. See Table 2-2 for a description of each pin’s function(s).
www.ti.com
Figure 2-2. TMS320F2812 and TMS320C2812 176-Pin PGF LQFP (Top View)
The TMS320F2810, TMS320F2811, TMS320C2810, and TMS320C2811 128-pin PBK low-profile quad
flatpack (LQFP) pin assignments are shown in Figure 2-3. See Table 2-2 for a description of each pin’s
function(s).
SPRS174S–APRIL 2001–REVISED MARCH 2011
Figure 2-3. TMS320F2810, TMS320F2811, TMS320C2810, and TMS320C2811 128-Pin PBK LQFP
(1) Typical drive strength of the output buffer for all pins is 4 mA except for TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins, which are
8 mA.
(2) I = Input, O = Output, Z = High impedance
(3) PU = pin has internal pullup; PD = pin has internal pulldown. Pullup/pulldown strength is given in Section 6.3, Electrical Characteristics
XHOLDE7159–IPUinto a high-impedance state. The XINTF will
XHOLDAK1082–O/Z–
XZCS0AND1P144–O/Z–XZCS0AND1 is active (low) when an access
XZCS2P1388–O/Z–(low) when an access to the XINTF Zone 2 is
XZCS6AND7B13133–O/Z–XZCS6AND7 is active (low) when an access
XWEN1184–O/Z–
XRDM342–O/Z–basis, by the Lead, Active, and Trail periods in
XR/WN451–O/Z–
XREADYB6161–IPUXREADY can be configured to be a
179-BALL176-PIN128-PIN
GHH/ZHHPGFPBK
(2)
PU/PD
(3)
Microprocessor/Microcomputer Mode Select.
Switches between microprocessor and
microcomputer mode. When high, Zone 7 is
enabled on the external interface. When low,
Zone 7 is disabled from the external interface,
and on-chip boot ROM may be accessed
instead. This signal is latched into the
XINTCNF2 register on a reset and the user
can modify this bit in software. The state of the
XMP/MC pin is ignored after reset.
External Hold Request. XHOLD, when active
(low), requests the XINTF to release the
external bus and place all buses and strobes
release the bus when any current access is
complete and there are no pending accesses
on the XINTF.
External Hold Acknowledge. XHOLDA is
driven active (low) when the XINTF has
granted a XHOLD request. All XINTF buses
and strobe signals will be in a high-impedance
state. XHOLDA is released when the XHOLD
signal is released. External devices should
only drive the external bus when XHOLDA is
active (low).
XINTF Zone 0 and Zone 1 Chip Select.
to the XINTF Zone 0 or Zone 1 is performed.
XINTF Zone 2 Chip Select. XZCS2 is active
performed.
XINTF Zone 6 and Zone 7 Chip Select.
to the XINTF Zone 6 or Zone 7 is performed.
Write Enable. Active-low write strobe. The
write strobe waveform is specified, per zone
basis, by the Lead, Active, and Trail periods in
the XTIMINGx registers.
Read Enable. Active-low read strobe. The
read strobe waveform is specified, per zone
the XTIMINGx registers. NOTE: The XRD and
XWE signals are mutually exclusive.
Read Not Write Strobe. Normally held high.
When low, XR/W indicates write cycle is
active; when high, XR/W indicates read cycle
is active.
Ready Signal. Indicates peripheral is ready to
complete the access when asserted to 1.
synchronous or an asynchronous input. See
the timing diagrams for more details.
X1/XCLKINK97758I–X1/XCLKIN pin is referenced to the 1.8-V (or
X2M97657O–Oscillator Output
XCLKOUTF1111987O–XCLKOUT = SYSCLKOUT/4. The XCLKOUT
TESTSELA1313497IPD
XRSD6160113I/OPUwhen a watchdog reset occurs. During
TEST1M76751I/O–devices, this pin is a “no connect (NC)”
TEST2N76650I/O–devices, this pin is a “no connect (NC)”
179-BALL176-PIN128-PIN
GHH/ZHHPGFPBK
JTAG AND MISCELLANEOUS SIGNALS
(2)
PU/PD
(3)
Oscillator Input – input to the internal
oscillator. This pin is also used to feed an
external clock. The 28x can be operated with
an external clock source, provided that the
proper voltage levels be driven on the
X1/XCLKIN pin. It should be noted that the
1.9-V) core digital power supply (VDD), rather
than the 3.3-V I/O supply (V
diode may be used to clamp a buffered clock
signal to ensure that the logic-high level does
not exceed VDD(1.8 V or 1.9 V) or a 1.8-V
oscillator may be used.
Output clock derived from SYSCLKOUT to be
used for external wait-state generation and as
a general-purpose clock source. XCLKOUT is
either the same frequency, 1/2 the frequency,
or 1/4 the frequency of SYSCLKOUT. At reset,
signal can be turned off by setting bit 3
(CLKOFF) of the XINTCNF2 register to 1.
Unlike other GPIO pins, the XCLKOUT pin is
not placed in a high-impedance state during
reset.
Test Pin. Reserved for TI. Must be connected
to ground.
Device Reset (in) and Watchdog Reset (out).
Device reset. XRS causes the device to
terminate execution. The PC will point to the
address contained at the location 0x3FFFC0.
When XRS is brought to a high level,
execution begins at the location pointed to by
the PC. This pin is driven low by the DSP
watchdog reset, the XRS pin will be driven low
for the watchdog reset duration of
512 XCLKIN cycles.
The output buffer of this pin is an open-drain
with an internal pullup (100 µA, typical). It is
recommended that this pin be driven by an
open-drain device.
Test Pin. Reserved for TI. On F281x devices,
TEST1 must be left unconnected. On C281x
(i.e., this pin is not connected to any circuitry
internal to the device).
Test Pin. Reserved for TI. On F281x devices,
TEST2 must be left unconnected. On C281x
(i.e., this pin is not connected to any circuitry
internal to the device).
TCKA1213699IPUJTAG test clock with internal pullup
TMSD1312692IPUpullup. This serial control input is clocked into
TDIC1313196IPUTDI is clocked into the selected register
TDOD1212793O/Z–
EMU0D11137100I/O/ZPU
179-BALL176-PIN128-PIN
GHH/ZHHPGFPBK
JTAG
(2)
PU/PD
(3)
JTAG test reset with internal pulldown. TRST,
when driven high, gives the scan system
control of the operations of the device. If this
signal is not connected or driven low, the
device operates in its functional mode, and the
test reset signals are ignored.
NOTE: Do not use pullup resistors on TRST; it
has an internal pulldown device. TRST is an
active-high test pin and must be maintained
low at all times during normal device
operation. In a low-noise environment, TRST
may be left floating. In other instances, an
external pulldown resistor is highly
recommended. The value of this resistor
should be based on drive strength of the
debugger pods applicable to the design. A
2.2-kΩ resistor generally offers adequate
protection. Since this is application-specific, it
is recommended that each target board be
validated for proper operation of the debugger
and the application.
JTAG test-mode select (TMS) with internal
the TAP controller on the rising edge of TCK.
JTAG test data input (TDI) with internal pullup.
(instruction or data) on a rising edge of TCK.
JTAG scan out, test data output (TDO). The
contents of the selected register (instruction or
data) is shifted out of TDO on the falling edge
of TCK.
Emulator pin 0. When TRST is driven high,
this pin is used as an interrupt to or from the
emulator system and is defined as input/output
through the JTAG scan. This pin is also used
to put the device into boundary-scan mode.
With the EMU0 pin at a logic-high state and
the EMU1 pin at a logic-low state, a rising
edge on the TRST pin would latch the device
into boundary-scan mode.
NOTE: An external pullup resistor is
recommended on this pin. The value of this
resistor should be based on the drive strength
of the debugger pods applicable to the design.
A 2.2-kΩ to 4.7-kΩ resistor is generally
adequate. Since this is application-specific, it
is recommended that each target board be
validated for proper operation of the debugger
and the application.
Emulator pin 1. When TRST is driven high,
this pin is used as an interrupt to or from the
emulator system and is defined as input/output
through the JTAG scan. This pin is also used
to put the device into boundary-scan mode.
With the EMU0 pin at a logic-high state and
the EMU1 pin at a logic-low state, a rising
edge on the TRST pin would latch the device
into boundary-scan mode.
NOTE: An external pullup resistor is
recommended on this pin. The value of this
resistor should be based on the drive strength
of the debugger pods applicable to the design.
A 2.2-kΩ to 4.7-kΩ resistor is generally
adequate. Since this is application-specific, it
is recommended that each target board be
validated for proper operation of the debugger
and the application.
8-channel analog inputs for
Sample-and-Hold A. The ADC pins should not
be driven before the V
pins have been fully powered up.
DDA1
, V
DDA2
, and V
8-channel analog inputs for
Sample-and-Hold B. The ADC pins should not
be driven before the V
pins have been fully powered up.
DDA1
, V
DDA2
, and V
ADC Voltage Reference Output (2 V).
Requires a low ESR (under 1.5 Ω) ceramic
bypass capacitor of 10 µF to analog ground.
[Can accept external reference input (2 V) if
the software bit is enabled for this mode.
1–10 µF low ESR capacitor can be used in the
external reference mode.]
NOTE: Use the ADC Clock rate to derive the
ESR specification from the capacitor data
sheet that is used in the system.
ADC Voltage Reference Output (1 V).
Requires a low ESR (under 1.5 Ω) ceramic
bypass capacitor of 10 µF to analog ground.
[Can accept external reference input (1 V) if
the software bit is enabled for this mode.
1–10 µF low ESR capacitor can be used in the
external reference mode.]
NOTE: Use the ADC Clock rate to derive the
ESR specification from the capacitor data
sheet that is used in the system.
ADCBGREFINE6164116––
AVSSREFBGE31212––ADC Analog GND
AVDDREFBGE11313––ADC Analog Power (3.3-V)
ADCLOB3175127––
V
SSA1
V
SSA2
V
DDA1
V
DDA2
V
SS1
V
DD1
V
DDAIO
V
SSAIO
F31515––ADC Analog GND
C5165117––ADC Analog GND
F41414––ADC Analog 3.3-V Supply
A5166118––ADC Analog 3.3-V Supply
C6163115––ADC Digital GND
A6162114––ADC Digital 1.8-V (or 1.9-V) Supply
B211––3.3-V Analog I/O Power Pin
A2176128––Analog I/O Ground Pin
GPIOA0 - PWM1 (O)M129268I/OPUGPIO or PWM Output Pin #1
GPIOA1 - PWM2 (O)M149369I/OPUGPIO or PWM Output Pin #2
GPIOA2 - PWM3 (O)L129470I/OPUGPIO or PWM Output Pin #3
GPIOA3 - PWM4 (O)L139571I/OPUGPIO or PWM Output Pin #4
GPIOA4 - PWM5 (O)K119872I/OPUGPIO or PWM Output Pin #5
GPIOA5 - PWM6 (O)K1410175I/OPUGPIO or PWM Output Pin #6
GPIOA6 -
T1PWM_T1CMP (I)
GPIOA7 -
T2PWM_T2CMP (I)
J1110276I/OPUGPIO or Timer 1 Output
J1310477I/OPUGPIO or Timer 2 Output
GPIOA8 - CAP1_QEP1 (I)H1010678I/OPUGPIO or Capture Input #1
GPIOA9 - CAP2_QEP2 (I)H1110779I/OPUGPIO or Capture Input #2
GPIOA10 - CAP3_QEPI1 (I)H1210980I/OPUGPIO or Capture Input #3
GPIOA11 - TDIRA (I)F1411685I/OPUGPIO or Timer Direction
GPIOA12 - TCLKINA (I)F1311786I/OPUGPIO or Timer Clock Input
GPIOA13 - C1TRIP (I)E1312289I/OPUGPIO or Compare 1 Output Trip
GPIOA14 - C2TRIP (I)E1112390I/OPUGPIO or Compare 2 Output Trip
GPIOA15 - C3TRIP (I)F1012491I/OPUGPIO or Compare 3 Output Trip
GPIOB OR EVB SIGNALS
GPIOB0 - PWM7 (O)N24533I/OPUGPIO or PWM Output Pin #7
GPIOB1 - PWM8 (O)P24634I/OPUGPIO or PWM Output Pin #8
GPIOB2 - PWM9 (O)N34735I/OPUGPIO or PWM Output Pin #9
GPIOB3 - PWM10 (O)P34836I/OPUGPIO or PWM Output Pin #10
GPIOB4 - PWM11 (O)L44937I/OPUGPIO or PWM Output Pin #11
GPIOB5 - PWM12 (O)M45038I/OPUGPIO or PWM Output Pin #12
GPIOB6 -
T3PWM_T3CMP (I)
GPIOB7 -
T4PWM_T4CMP (I)
K55340I/OPUGPIO or Timer 3 Output
N55541I/OPUGPIO or Timer 4 Output
GPIOB8 - CAP4_QEP3 (I)M55743I/OPUGPIO or Capture Input #4
GPIOB9 - CAP5_QEP4 (I)M65944I/OPUGPIO or Capture Input #5
GPIOB10 - CAP6_QEPI2 (I)P66045I/OPUGPIO or Capture Input #6
GPIOB11 - TDIRB (I)L87154I/OPUGPIO or Timer Direction
GPIOB12 - TCLKINB (I)K87255I/OPUGPIO or Timer Clock Input
(2)
PU/PD
(3)
DESCRIPTION
3 3-V I/O Digital Power Pins
3.3-V Flash Core Power Pin. This pin should
be connected to 3.3 V at all times after
power-up sequence requirements have been
met. This pin is used as V
and must be connected to 3.3 V in ROM parts
GPIOB13 - C4TRIP (I)N66146I/OPUGPIO or Compare 4 Output Trip
GPIOB14 - C5TRIP (I)L66247I/OPUGPIO or Compare 5 Output Trip
GPIOB15 - C6TRIP (I)K76348I/OPUGPIO or Compare 6 Output Trip
GPIOD0 T1CTRIP_PDPINTA (I)
GPIOD1 -GPIO or Timer 2 Compare Output Trip or
T2CTRIP/EVASOC (I)External ADC Start-of-Conversion EV-A
GPIOD5 T3CTRIP_PDPINTB (I)
GPIOD6 -GPIO or Timer 4 Compare Output Trip or
T4CTRIP/EVBSOC (I)External ADC Start-of-Conversion EV-B
GPIOE0 - XINT1_XBIO (I)D9149106I/O/Z–GPIO or XINT1 or XBIO input
GPIOE1 -
XINT2_ADCSOC (I)
GPIOE2 - XNMI_XINT13 (I)E8150107I/OPUGPIO or XNMI or XINT13
GPIOF0 - SPISIMOA (O)M14031I/O/Z–GPIO or SPI slave in, master out
GPIOF1 - SPISOMIA (I)N14132I/O/Z–GPIO or SPI slave out, master in
GPIOF2 - SPICLKA (I/O)K23427I/O/Z–GPIO or SPI clock
GPIOF3 - SPISTEA (I/O)K43528I/O/Z–GPIO or SPI slave transmit enable
GPIOF4 - SCITXDA (O)C7155111I/OPUGPIO or SCI asynchronous serial port TX data
GPIOF5 - SCIRXDA (I)A7157112I/OPUGPIO or SCI asynchronous serial port RX data
GPIOF6 - CANTXA (O)N128764I/OPUGPIO or eCAN transmit data
GPIOF7 - CANRXA (I)N138965I/OPUGPIO or eCAN receive data
GPIOF8 - MCLKXA (I/O)J12823I/OPUGPIO or McBSP transmit clock
GPIOF9 - MCLKRA (I/O)H22521I/OPUGPIO or McBSP receive clock
GPIOF10 - MFSXA (I/O)H42622I/OPUGPIO or McBSP transmit frame synch
GPIOF11 - MFSRA (I/O)J22924I/OPUGPIO or McBSP receive frame synch
GPIOF12 - MDXA (O)G12219I/O–GPIO or McBSP transmitted serial data
GPIOF13 - MDRA (I)G22018I/OPUGPIO or McBSP received serial data
179-BALL176-PIN128-PIN
GHH/ZHHPGFPBK
GPIOD OR EVA SIGNALS
H1411081I/OPUGPIO or Timer 1 Compare Output Trip
G1011584I/OPU
GPIOD OR EVB SIGNALS
P107960I/OPUGPIO or Timer 3 Compare Output Trip
P118361I/OPU
GPIOE OR INTERRUPT SIGNALS
D8151108I/O/Z–GPIO or XINT2 or ADC start-of-conversion
Other than the power supply pins, no pin should be driven before the 3.3-V rail has reached
recommended operating conditions. However, it is acceptable for an I/O pin to ramp along
with the 3.3-V supply.
(3)
This pin has three functions:
1. XF – General-purpose output pin.
2. XPLLDIS – This pin is sampled during
reset to check whether the PLL must be
disabled. The PLL will be disabled if this
pin is sensed low. HALT and STANDBY
modes cannot be used when the PLL is
disabled.
3. GPIO – GPIO function
GPIO or SCI asynchronous serial port transmit
data
A.45 of the possible 96 interrupts are used on the devices.
B.XINTF is available on the F2812 and C2812 devices only.
C. On C281x devices, the OTP is replaced with a 1K x 16 block of ROM.
A.Memory blocks are not to scale.
B.Reserved locations are reserved for future expansion. Application should not access these areas.
C. Boot ROM and Zone 7 memory maps are active either in on-chip or XINTF zone depending on MP/MC, not in both.
D. Peripheral Frame 0, Peripheral Frame 1, and Peripheral Frame 2 memory maps are restricted to data memory only.
E.“Protected” means the order of Write followed by Read operations is preserved rather than the pipeline order.
F.Certain memory ranges are EALLOW protected against spurious writes after configuration.
G. Zones 0 and 1 and Zones 6 and 7 share the same chip select; hence, these memory blocks have mirrored locations.
Only one of these vector maps - M0 vector, PIE vector, BROM vector - should be enabled at a time.
LEGEND:
Block
Start Address
Low 64K
(24x/240x Equivalent Data Space)
High 64K
(24x/240x Equivalent
Program Space)
0x00 0000
M0 Vector - RAM (32 x 32)
(Enabled if VMAP = 0)
×
BROM Vector - ROM (32 x 32)
(Enabled if VMAP = 1, MP/= 0, ENPIE = 0)MC
×
Data Space
Prog Space
M0 SARAM (1K x 16)
M1 SARAM (1K x 16)
×
Peripheral Frame 0
0x00 0040
0x00 0400
0x00 0800
PIE Vector - RAM
(256 x 16)
(Enabled if
VMAP = 1, ENPIE = 1)
L0 SARAM (4K x 16, Secure Block)
Peripheral Frame 1
(Protected)
Peripheral Frame 2
(Protected)
L1 SARAM (4K x 16, Secure Block)
×
OTP (or ROM) (1K x 16, Secure Block)
Flash (or ROM) (128K x 16, Secure Block)
128-Bit Password
H0 SARAM (8K x 16)
Boot ROM (4K x 16)
(Enabled if MP/= 0)MC
0x00 0D00
0x00 0E00
0x00 2000
0x00 6000
0x00 7000
0x00 8000
0x00 9000
0x00 A000
0x3D 7800
0x3D 7C00
0x3F 7FF8
0x3F 8000
0x3F A000
0x3F F000
0x3F FFC0
On-Chip Memory
0x3D 8000
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved (1K)
Reserved
TMS320F2810, TMS320F2811, TMS320F2812
TMS320C2810, TMS320C2811, TMS320C2812
www.ti.com
SPRS174S–APRIL 2001–REVISED MARCH 2011
A.Memory blocks are not to scale.
B.Reserved locations are reserved for future expansion. Application should not access these areas.
C. Peripheral Frame 0, Peripheral Frame 1, and Peripheral Frame 2 memory maps are restricted to data memory only.
User program cannot access these memory maps in program space.
D. “Protected” means the order of Write followed by Read operations is preserved rather than the pipeline order.
E.Certain memory ranges are EALLOW protected against spurious writes after configuration.
A.Memory blocks are not to scale.
B.Reserved locations are reserved for future expansion. Application should not access these areas.
C. Peripheral Frame 0, Peripheral Frame 1, and Peripheral Frame 2 memory maps are restricted to data memory only.
User program cannot access these memory maps in program space.
D. “Protected” means the order of Write followed by Read operations is preserved rather than the pipeline order.
E.Certain memory ranges are EALLOW protected against spurious writes after configuration.