• High-Efficiency 32-Bit CPU (TMS320C28x)
– 90 MHz (11.11-ns Cycle Time)
– 16 × 16 and 32 × 32 Multiply and Accumulate
(MAC) Operations
– 16 × 16 Dual MAC
– Harvard Bus Architecture
– Atomic Operations
– Fast Interrupt Response and Processing
– Unified Memory Programming Model
– Code-Efficient (in C/C++ and Assembly)
• Floating-Point Unit (FPU)
– Native Single-Precision Floating-Point
Operations
• Programmable Control Law Accelerator (CLA)
– 32-Bit Floating-Point Math Accelerator
– Executes Code Independently of the Main CPU
• Viterbi, Complex Math, CRC Unit (VCU)
– Extends C28x Instruction Set to Support
Complex Multiply, Viterbi Operations, and Cyclic
Redundency Check (CRC)
• Embedded Memory
– Up to 256KB of Flash
– Up to 100KB of RAM
– 2KB of One-Time Programmable (OTP) ROM
• 6-Channel Direct Memory Access (DMA)
• Low Device and System Cost
– Single 3.3-V Supply
– No Power Sequencing Requirement
– Integrated Power-on Reset and Brown-out
Reset
– Low-Power Operating Modes
– No Analog Support Pin
• Endianness: Little Endian
• JTAG Boundary Scan Support
– IEEE Standard 1149.1-1990 Standard Test
• 128-Bit Security Key and Lock
– Protects Secure Memory Blocks
– Prevents Reverse-Engineering of Firmware
• Serial Port Peripherals
– Two Serial Communications Interface (SCI)
[UART] Modules
– Two Serial Peripheral Interface (SPI) Modules
– One Inter-Integrated-Circuit (I2C) Bus
– One Multichannel Buffered Serial Port (McBSP)
Bus
– One Enhanced Controller Area Network (eCAN)
– Universal Serial Bus (USB) 2.0
(see Device Comparison Table for Availability)
•Full-Speed Device Mode
•Full-Speed or Low-Speed Host Mode
• Up to 54 Individually Programmable, Multiplexed
General-Purpose Input/Output (GPIO) Pins With
Input Filtering
• Advanced Emulation Features
– Analysis and Breakpoint Functions
– Real-Time Debug Through Hardware
• 2806x Packages
– 80-Pin PFP and 100-Pin PZP PowerPAD™
Thermally Enhanced Thin Quad Flatpacks
(HTQFPs)
– 80-Pin PN and 100-Pin PZ Low-Profile Quad
Flatpacks (LQFPs)
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
The F2806x Piccolo™ family of microcontrollers (MCUs) provides the power of the C28x core and CLA
coupled with highly integrated control peripherals in low pin-count devices. This family is code-compatible
with previous C28x-based code, and also provides a high level of analog integration.
An internal voltage regulator allows for single-rail operation. Enhancements have been made to the HighResolution Pulse Width Modulator (HRPWM) module to allow for dual-edge control (frequency
modulation). Analog comparators with internal 10-bit references have been added and can be routed
directly to control the ePWM outputs. The ADC converts from 0 to 3.3-V fixed full-scale range and
supports ratio-metric V
and latency.
REFHI/VREFLO
references. The ADC interface has been optimized for low overhead
www.ti.com
Device Information
PART NUMBERPACKAGEBODY SIZE
TMS320F28069PZPHTQFP (100)14.0 mm × 14.0 mm
TMS320F28069PFPHTQFP (80)12.0 mm × 12.0 mm
TMS320F28069PZLQFP (100)14.0 mm × 14.0 mm
TMS320F28069PNLQFP (80)12.0 mm × 12.0 mm
(1) For more information on these devices, see Section 9, Mechanical Packaging and Orderable
(1) A type change represents a major functional feature difference in a peripheral module. Within a peripheral type, there may be minor differences between devices that do not affect the
basic functionality of the module. These device-specific differences are listed in the TMS320x28xx, 28xxx DSP Peripheral Reference Guide (SPRU566) and in the peripheral reference
guides.
(2) USB is present on TMS320F2806xU, TMS320F2806xM, and TMS320F2806xF devices.
(3) The "Q" temperature option is not available on the TMS320F2806xU devices.
(4) TMS320F2806xM devices are InstaSPIN-MOTION-enabled MCUs. TMS320F2806xF devices are InstaSPIN-FOC-enabled MCUs. For more information, see Section 8.2 for a list of
InstaSPIN Technical Reference Manuals.
Table 3-1. Device Comparison
FEATURETYPE
(1)
28069
28069U
(2) (3)
28069M
(2) (4)
28069F
(2) (4)
(90 MHz)
28068
28068U
(2) (3)
28068M
(2) (4)
28068F
(2) (4)
(90 MHz)
28067
28067U
(2) (3)
(90 MHz)
28066
28066U
(2) (3)
(90 MHz)
28065
28065U
(2) (3)
(90 MHz)
28064
28064U
(2) (3)
(90 MHz)
28063
28063U
(2) (3)
(90 MHz)
28062
28062U
(2) (3)
28062F
(2) (4)
(90 MHz)
Package Type
(PFP andPZP are PowerPAD HTQFPs.
PN andPZ are LQFPs.)
Figure 4-1 shows the pin assignments on the 80-pin PN and PFP packages. Figure 4-2 shows the pin
assignments on the 100-pin PZ and PZP packages.
SPRS698F –NOVEMBER 2010–REVISED MARCH 2016
A.Pin 19: V
exclusive to one another.
Pin 21: V
REFHI
is always connected to V
REFLO
and ADCINA0 share the same pin on the 80-pin PN and PFP devices and their use is mutually
B.The PowerPAD is not connected to the ground on the die. To facilitate effective heat dissipation, the PowerPAD must
be connected to the ground plane of the PCB. It should not be left unconnected. For more details, see the
PowerPAD™ Thermally Enhanced Package Application Report (SLMA002).
A.The PowerPAD is not connected to the ground on the die. To facilitate effective heat dissipation, the PowerPAD must
be connected to the ground plane of the PCB. It should not be left unconnected. For more details, see the
PowerPAD™ Thermally Enhanced Package Application Report (SLMA002).
Figure 4-2. 100-Pin PZ and PZP Packages (Top View)
Table 4-1 describes the signals. With the exception of the JTAG pins, the GPIO function is the default at
reset, unless otherwise mentioned. The peripheral signals that are listed under them are alternate
functions. Some peripheral functions may not be available in all devices. See Table 3-1 for details. Inputs
are not 5-V tolerant. All GPIO pins are I/O/Z and have an internal pullup (PU), which can be selectively
enabled or disabled on a per-pin basis. This feature only applies to the GPIO pins. The pullups on the
PWM pins are not enabled at reset. The pullups on other GPIO pins are enabled upon reset. The AIO pins
do not have an internal pullup.
When the on-chip voltage regulator (VREG) is used, the GPIO19, GPIO26–27, and
GPIO34–38 pins could glitch during power up. If this is unacceptable in an application, 1.8 V
could be supplied externally. There is no power-sequencing requirement when using an
external 1.8-V supply. However, if the 3.3-V transistors in the level-shifting output buffers of
the I/O pins are powered before the 1.9-V transistors, it is possible for the output buffers to
turn on, causing a glitch to occur on the pin during power up. To avoid this behavior, power
the VDDpins before or simultaneously with the V
reached 0.7 V before the V
TCKSee GPIO38ISee GPIO38. JTAG test clock with internal pullup. (↑)
TMSSee GPIO36I
TDISee GPIO35I
TDOSee GPIO37O/Z
V
DD3VFL
TEST24536I/OTest Pin. Reserved for TI. Must be left unconnected.
PZ
PZP
46373.3-V Flash Core Power Pin. This pin should be connected to 3.3 V at all times.
PN
PFP
I/O/ZDESCRIPTION
JTAG
JTAG test reset with internal pulldown (PD). TRST, when driven high, gives the scan
system control of the operations of the device. If this signal is not connected or driven
low, the device operates in its functional mode, and the test reset signals are ignored.
NOTE: TRST is an active-high test pin and must be maintained low at all times during
normal device operation. An external pulldown resistor is required on this pin. The
value of this resistor should be based on drive strength of the debugger pods
applicable to the design. A 2.2-kΩ resistor generally offers adequate protection.
Because this is application-specific, TI recommends validating each target board for
proper operation of the debugger and the application. (↓)
See GPIO36. JTAG test-mode select (TMS) with internal pullup. This serial control
input is clocked into the TAP controller on the rising edge of TCK. (↑)
See GPIO35. JTAG test data input (TDI) with internal pullup. TDI is clocked into the
selected register (instruction or data) on a rising edge of TCK. (↑)
See GPIO37. JTAG scan out, test data output (TDO). The contents of the selected
register (instruction or data) are shifted out of TDO on the falling edge of TCK.
(8-mA drive)
ADCINA716–IADC Group A, Channel 7 input
ADCINA6
COMP3AIComparator Input 3A
AIO6I/ODigital AIO 6
ADCINA51815IADC Group A, Channel 5 input
ADCINA4
COMP2AIComparator Input 2A
AIO4I/ODigital AIO 4
ADCINA320–IADC Group A, Channel 3 input
ADCINA2
COMP1AIComparator Input 1A
AIO2I/ODigital AIO 2
ADCINA12218IADC Group A, Channel 1 input
ADCINA02319I
PZ
PZP
See GPIO19 and
1714
1916
2117
PN
PFP
GPIO38
I/O/ZDESCRIPTION
CLOCK
See GPIO18. Output clock derived from SYSCLKOUT. XCLKOUT is either the same
frequency, one-half the frequency, or one-fourth the frequency of SYSCLKOUT. This is
controlled by bits 1:0 (XCLKOUTDIV) in the XCLK register. At reset, XCLKOUT =
SYSCLKOUT/4. The XCLKOUT signal can be turned off by setting XCLKOUTDIV to 3.
The mux control for GPIO18 must also be set to XCLKOUT for this signal to propogate
to the pin.
See GPIO19 and GPIO38. External oscillator input. Pin source for the clock is
controlled by the XCLKINSEL bit in the XCLK register, GPIO38 is the default selection.
This pin feeds a clock from an external 3.3-V oscillator. In this case, the X1 pin, if
available, must be tied to GND and the on-chip crystal oscillator must be disabled
through bit 14 in the CLKCTL register. If a crystal or resonator is used, the XCLKIN
I
path must be disabled by bit 13 in the CLKCTL register.
NOTE: Designs that use the GPIO38/XCLKIN/TCK pin to supply an external clock for
normal device operation may need to incorporate some hooks to disable this path
during debug using the JTAG connector. This is to prevent contention with the TCK
signal, which is active during JTAG debug sessions. The zero-pin internal oscillators
may be used during this time to clock the device.
On-chip 1.8-V crystal-oscillator input. To use this oscillator, a quartz crystal or a
ceramic resonator must be connected across X1 and X2. In this case, the XCLKIN path
must be disabled by bit 13 in the CLKCTL register. If this pin is not used, it must be tied
to GND.
On-chip crystal-oscillator output. A quartz crystal or a ceramic resonator must be
connected across X1 and X2. If X2 is not used, it must be left unconnected.
RESET
Device Reset (in) and Watchdog Reset (out). Piccolo devices have a built-in power-on
reset (POR) and brown-out reset (BOR) circuitry. During a power-on or brown-out
condition, this pin is driven low by the device. An external circuit may also drive this pin
to assert a device reset. This pin is also driven low by the MCU when a watchdog reset
occurs. During watchdog reset, the XRS pin is driven low for the watchdog reset
duration of 512 OSCCLK cycles. A resistor between 2.2 kΩ and 10 kΩ should be
placed between XRS and V
noise filtering, it should be 100 nF or smaller. These values will allow the watchdog to
properly drive the XRS pin to VOLwithin 512 OSCCLK cycles when the watchdog reset
is asserted. Regardless of the source, a device reset causes the device to terminate
execution. The program counter points to the address contained at the location
0x3F FFC0. When reset is deactivated, execution begins at the location designated by
the program counter. The output buffer of this pin is an open-drain with an internal
pullup. (↑)
ADC, COMPARATOR, ANALOG I/O
IADC Group A, Channel 6 input
IADC Group A, Channel 4 input
IADC Group A, Channel 2 input
ADC Group A, Channel 0 input.
NOTE: V
and their use is mutually exclusive to one another.
and ADCINA0 share the same pin on the 80-pin PN and PFP devices
AIO10I/ODigital AIO 10
ADCINB12923IADC Group B, Channel 1 input
ADCINB02822IADC Group B, Channel 0 input
V
REFLO
2721
ADC External Reference Low.
NOTE: V
is always connected to V
REFLO
CPU AND I/O POWER
V
DDA
V
SSA
2520Analog Power Pin. Tie with a 2.2-μF capacitor (typical) close to the pin.
2621
Analog Ground Pin.
NOTE: V
is always connected to V
REFLO
32
1412
V
DD
3729
6351
CPU and Logic Digital Power Pins. When using internal VREG, place one 1.2-µF
capacitor between each VDDpin and ground. Higher value capacitors may be used.
8165
9172
54
1311
V
DDIO
3830
6149
Digital I/O and Flash Power Pin. Single supply source when VREG is enabled. Place a
2.2-uF decoupling capacitor on each pin. The exact value of the total decoupling
capacitance should be determined by the system voltage regulation solution.
MCLKRAI/OMcBSP receive clock
SCITXDBOSCI-B transmit data
EPWM7AOEnhanced PWM7 output A and HRPWM channel
(1) I = Input, O = Output, Z = High Impedance, OD = Open Drain, ↑ = Pullup, ↓ = Pulldown
(2) The GPIO function (shown in bold italics) is the default at reset. The peripheral signals that are listed under them are alternate functions.
For JTAG pins that have the GPIO functionality multiplexed, the input path to the GPIO block is always valid. The output path from the
GPIO block and the path to the JTAG block from a pin is enabled or disabled based on the condition of the TRST signal. See the
Systems Control and Interrupts chapter of the TMS320x2806x Piccolo Technical Reference Manual (SPRUH18).
(3) Depending on your USB application, additional pins may be required to maintain compliance with the USB 2.0 Specification. For more
information, see the Universal Serial Bus (USB) Controller chapter of the TMS320x2806x Piccolo Technical Reference Manual
(SPRUH18).
over operating free-air temperature range (unless otherwise noted)
MINMAXUNIT
V
(I/O and Flash) with respect to V
Supply voltage
Analog voltageV
Input voltage
Output voltageV
DDIO
VDDwith respect to V
with respect to V
DDA
VIN(3.3 V)–0.34.6
VIN(X1)–0.32.5
O
Input clamp currentIIK(VIN< 0 or VIN> V
Output clamp currentIOK(VO< 0 or VO> V
Junction temperature
Storage temperature
(4)
(4)
T
J
T
stg
SS
SS
SSA
(3)
)
DDIO
)–2020mA
DDIO
–0.34.6
–0.32.5
–0.34.6V
–0.34.6V
–2020mA
–40150°C
–65150°C
V
V
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Section 5.4 is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) Continuous clamp current per pin is ±2 mA.
(4) Long-term high-temperature storage or extended use at maximum temperature conditions may result in a reduction of overall device life.
For additional information, see the IC Package Thermal Metrics Application Report (SPRA953).
5.2ESD Ratings for TMS320F2806xU
VALUEUNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001
V
(ESD)
Electrostatic discharge (ESD)
Charged-device model (CDM), per JEDEC specification JESD22-
(2)
C101
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1)
±2000
±500
V
5.3ESD Ratings for TMS320F2806x, TMS320F2806xM, and TMS320F2806xF
TMS320F2806x, TMS320F2806xM, and TMS320F2806xF in 100-pin PZ and PZP packages
V
(ESD)
TMS320F2806x, TMS320F2806xM, and TMS320F2806xF in 80-pin PN and PFP packages
V
(ESD)
(1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(1) Group 2 pins are as follows: GPIO16, GPIO17, GPIO18, GPIO19, GPIO28, GPIO29, GPIO36, GPIO37.
(2) The "Q" temperature option is not available on the 2806xU devices.
2.973.33.63V
1.711.81.995
0V
2.973.33.63V
0V
+ 0.3V
DDIO
–8
mA
mA
8
–40125
V
°C
°C
5.5Electrical Characteristics
(1)
over recommended operating conditions (unless otherwise noted)
PARAMETERTEST CONDITIONSMINTYPMAX UNIT
V
OH
V
OL
High-level output voltage
Low-level output voltageIOL= IOLMAX0.4V
Pin with pullup
I
IL
Input current
(low level)
enabled
Pin with pulldown
enabled
Pin with pullup
I
IH
Input current
(high level)
enabled
Pin with pulldown
enabled
I
OZ
C
I
Output current, pullup or
pulldown disabled
Input capacitance2pF
V
BOR trip pointFalling V
DDIO
V
BOR hysteresis35mV
DDIO
Supervisor reset release delay
time
VREG VDDoutputInternal VREG on1.9V
(1) When the on-chip VREG is used, its output is monitored by the POR/BOR circuit, which will reset the device should the core voltage
(VDD) go out of range.
IOH= IOHMAX2.4
IOH= 50 μAV
V
= 3.3 V, VIN= 0 V
DDIO
V
= 3.3 V, VIN= 0 V±2
DDIO
V
= 3.3 V, VIN= V
DDIO
V
= 3.3 V, VIN= V
DDIO
VO= V
DDIO
or 0 V±2μA
DDIO
DDIO
DDIO
All GPIO–80–140–205
XRS pin–230–300–375
Time after BOR/POR/OVR event is removed to XRS
release
(3) The TYP numbers are applicable over room temperature and nominal voltage.
(4) The following is done in a loop:
• Data is continuously transmitted out of SPI-A, SPI-B, SCI-A, eCAN-A, McBSP-A, and I2C ports.
• The hardware multiplier is exercised.
• Watchdog is reset.
• ADC is performing continuous conversion.
• COMP1 and COMP2 are continuously switching voltages.
• GPIO17 is toggled.
(5) CLA is continuously performing polynomial calculations.
(6) For F2806x devices that do not have CLA, subtract the IDDcurrent number for CLA (see Table 5-2) from the IDD(VREG disabled)/I
(VREG enabled) current numbers shown in Table 5-1 for operational mode.
(7) If a quartz crystal or ceramic resonator is used as the clock source, the HALT mode shuts down the on-chip crystal oscillator.
(8) To realize the IDDnumber shown for HALT mode, the following must be done:
• PLL2 must be shut down by clearing bit 2 of the PLLCTL register.
• A value of 0x00FF must be written to address 0x6822.
The peripheral - I/O multiplexing implemented in the device prevents all available peripherals
from being used at the same time. This is because more than one peripheral function may
share an I/O pin. It is, however, possible to turn on the clocks to all the peripherals at the
same time, although such a configuration is not useful. If this is done, the current drawn by
the device will be more than the numbers specified in the current consumption tables.
The 2806x devices incorporate a method to reduce the device current consumption. Since each peripheral
unit has an individual clock-enable bit, significant reduction in current consumption can be achieved by
turning off the clock to any peripheral module that is not used in a given application. Furthermore, any one
of the three low-power modes could be taken advantage of to reduce the current consumption even
further. Table 5-2 indicates the typical reduction in current consumption achieved by turning off the clocks.
(1) All peripheral clocks (except CPU Timer clock) are disabled upon
reset. Writing to or reading from peripheral registers is possible only
after the peripheral clocks are turned on.
(2) For peripherals with multiple instances, the current quoted is per
module. For example, the 2 mA value quoted for ePWM is for one
ePWM module.
(3) This number represents the current drawn by the digital portion of
the ADC module. Turning off the clock to the ADC module results in
the elimination of the current drawn by the analog portion of the ADC
(I
) as well.
DDA
(2)
ADC2
I2C3
ePWM2
eCAP2
eQEP2
SCI2
SPI2
HRPWM3
HRCAP3
USB12
CAN2.5
CLA20
McBSP6
(1)
IDDCURRENT
REDUCTION (mA)
(3)
I
current consumption is reduced by 15 mA (typical) when XCLKOUT is turned off.
DDIO
The baseline IDDcurrent (current when the core is executing a dummy loop with no
peripherals enabled) is 40 mA, typical. To arrive at the IDDcurrent for a given application, the
current-drawn by the peripherals (enabled by that application) must be added to the baseline
IDDcurrent.
Following are other methods to reduce power consumption further:
•The flash module may be powered down if code is run off SARAM. This results in a current reduction
of 18 mA (typical) in the VDDrail and 13 mA (typical) in the V
•Savings in I
may be realized by disabling the pullups on pins that assume an output function.
DDIO
5.6.2Current Consumption Graphs (VREG Enabled)
DDIO
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rail.
Figure 5-1. Typical Operational Current Versus Frequency
Figure 5-2. Typical Operational Power Versus Frequency
Based on the end application design and operational profile, the IDDand I
Systems that exceed the recommended maximum power dissipation in the end product may require
additional thermal enhancements. Ambient temperature (TA) varies with the end application and product
design. The critical factor that affects reliability and functionality is TJ, the junction temperature, not the
ambient temperature. Hence, care should be taken to keep TJwithin the specified limits. T
measured to estimate the operating junction temperature TJ. T
is normally measured at the center of
case
the package top-side surface. The thermal application report IC Package Thermal Metrics (SPRA953)
helps to understand the thermal metrics and definitions.
5.9Emulator Connection Without Signal Buffering for the MCU
Figure 5-3 shows the connection between the MCU and JTAG header for a single-processor configuration.
If the distance between the JTAG header and the MCU is greater than 6 inches, the emulation signals
must be buffered. If the distance is less than 6 inches, buffering is typically not needed. Figure 5-3 shows
the simpler, no-buffering situation. For the pullup and pulldown resistor values, see Section 4.2.
currents could vary.
DDIO
case
should be
A.See Figure 6-54 for JTAG/GPIO multiplexing.
Figure 5-3. Emulator Connection Without Signal Buffering for the MCU
The 2806x devices do not have EMU0/EMU1 pins. For designs that have a JTAG Header
onboard, the EMU0/EMU1 pins on the header must be tied to V
(typical) resistor.
Timing parameter symbols used are created in accordance with JEDEC Standard 100. To shorten the
symbols, some of the pin names and other related terminology have been abbreviated as follows:
LOWERCASE SUBSCRIPTS AND THEIR MEANINGS:LETTERS AND SYMBOLS AND THEIR MEANINGS:
aaccess timeHHigh
ccycle time (period)LLow
ddelay timeVValid
ffall timeXUnknown, changing, or don't care level
hhold timeZHigh impedance
rrise time
susetup time
ttransition time
vvalid time
wpulse duration (width)
5.10.2 General Notes on Timing Parameters
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All output signals from the 28x devices (including XCLKOUT) are derived from an internal clock such that
all output transitions for a given half-cycle occur with a minimum of skewing relative to each other.
The signal combinations shown in the following timing diagrams may not necessarily represent actual
cycles. For actual cycle examples, see the appropriate cycle description section of this document.
5.11 Test Load Circuit
This test load circuit is used to measure all switching characteristics provided in this document.
A.Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the
device pin.
B.The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its
transmission line effects must be taken into account. A transmission line with a delay of 2 ns or longer can be used to
produce the desired transmission line effect. The transmission line is intended as a load only. It is not necessary to
add or subtract the transmission line delay (2 ns or longer) from the data sheet timing.
GPIO pins as input [state depends on internal pullup/pulldown (PU/PD)]
User-code dependent
(E)
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5.12 Power Sequencing
There is no power sequencing requirement needed to ensure the device is in the proper state after reset
or to prevent the I/Os from glitching during power up or power down (GPIO19, GPIO26–27, GPIO34–38
do not have glitch-free I/Os). No voltage larger than a diode drop (0.7 V) above V
any digital pin before powering up the device. Voltages applied to pins on an unpowered device can bias
internal p-n junctions in unintended ways and produce unpredictable results.
A.Upon power up, SYSCLKOUT is OSCCLK/4. Since the XCLKOUTDIV bits in the XCLK register come up with a reset
state of 0, SYSCLKOUT is further divided by 4 before it appears at XCLKOUT. XCLKOUT = OSCCLK/16 during this
phase.
B.Boot ROM configures the DIVSEL bits for /1 operation. XCLKOUT = OSCCLK/4 during this phase. Note that
XCLKOUT will not be visible at the pin until explicitly configured by user code.
C.After reset, the boot ROM code samples Boot Mode pins. Based on the status of the Boot Mode pin, the boot code
branches to destination memory or boot code function. If boot ROM code executes after power-on conditions (in
debugger environment), the boot code execution time is based on the current SYSCLKOUT speed. The SYSCLKOUT
will be based on user environment and could be with or without PLL enabled.
D.Using the XRS pin is optional due to the on-chip POR circuitry.
E.The internal pullup or pulldown will take effect when BOR is driven high.
Hold time for boot-mode pins1000t
Pulse duration, XRS low on warm reset32t
Table 5-4. Reset (XRS) Switching Characteristics
over recommended operating conditions (unless otherwise noted)
PARAMETERMINTYPMAXUNIT
t
w(RSL1)
t
w(WDRS)
t
d(EX)
t
INTOSCST
(1)
t
OSCST
(1) Dependent on crystal/resonator and board design.
Pulse duration, XRS driven by device600μs
Pulse duration, reset pulse generated by watchdog512t
Delay time, address/data valid after XRS high32t
Start up time, internal zero-pin oscillator3μs
On-chip crystal-oscillator start-up time110ms
c(OSCCLK)
c(OSCCLK)
c(OSCCLK)
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MINMAXUNIT
c(SCO)
cycles
cycles
cycles
cycles
A.After reset, the Boot ROM code samples BOOT Mode pins. Based on the status of the Boot Mode pin, the boot code
branches to destination memory or boot code function. If Boot ROM code executes after power-on conditions (in
debugger environment), the Boot code execution time is based on the current SYSCLKOUT speed. The
SYSCLKOUT will be based on user environment and could be with or without PLL enabled.
Figure 5-7 shows an example for the effect of writing into PLLCR register. In the first phase, PLLCR =
0x0004 and SYSCLKOUT = OSCCLK × 2. The PLLCR is then written with 0x0008. Right after the PLLCR
register is written, the PLL lock-up phase begins. During this phase, SYSCLKOUT = OSCCLK/2. After the
PLL lock-up is complete, SYSCLKOUT reflects the new operating frequency, OSCCLK × 4.
This section provides the timing requirements and switching characteristics for the various clock options
available on the 2806x MCUs. Table 5-5 lists the cycle times of various clocks.
Table 5-5. 2806x Clock Table and Nomenclature (90-MHz Devices)
MINNOMMAXUNIT
t
, Cycle time11.11500ns
SYSCLKOUT
LSPCLK
(1)
ADC clock
(1) Lower LSPCLK will reduce device power consumption.
(2) This is the default reset value if SYSCLKOUT = 90 MHz.
Internal zero-pin oscillator 1 (INTOSC1) at 30°C
Internal zero-pin oscillator 2 (INTOSC2) at 30°C
Step size (coarse trim)55kHz
Step size (fine trim)14kHz
Temperature drift
Voltage (VDD) drift
(1) In order to achieve better oscillator accuracy (10 MHz ± 1% or better) than shown, refer to the Oscillator Compensation Guide
Application Report (SPRAB84).
(2) Frequency range ensured only when VREG is enabled, VREGENZ = VSS.
(3) Output frequency of the internal oscillators follows the direction of both the temperature gradient and voltage (VDD) gradient. For
example:
• Increase in temperature will cause the output frequency to increase per the temperature coefficient.
• Decrease in voltage (VDD) will cause the output frequency to decrease per the voltage coefficient.
(3)
(3)
(1)(2)
(1)(2)
Frequency10.000MHz
Frequency10.000MHz
3.034.85kHz/°C
175Hz/mV
Figure 5-8. Zero-Pin Oscillator Frequency Movement With Temperature
Table 5-11. Flash/OTP Endurance for T Temperature Material
ERASE/PROGRAM
TEMPERATURE
N
N
Flash endurance for the array (write/erase cycles)0°C to 105°C (ambient)2000050000cycles
f
OTP endurance for the array (write cycles)0°C to 30°C (ambient)1write
OTP
MINTYPMAXUNIT
(1)
(1) Write/erase operations outside of the temperature ranges indicated are not specified and may affect the endurance numbers.
Table 5-12. Flash/OTP Endurance for S Temperature Material
ERASE/PROGRAM
TEMPERATURE
N
N
Flash endurance for the array (write/erase cycles)0°C to 125°C (ambient)2000050000cycles
f
OTP endurance for the array (write cycles)0°C to 30°C (ambient)1write
OTP
MINTYPMAXUNIT
(1)
(1) Write/erase operations outside of the temperature ranges indicated are not specified and may affect the endurance numbers.
Table 5-13. Flash/OTP Endurance for Q Temperature Material
ERASE/PROGRAM
TEMPERATURE
N
N
Flash endurance for the array (write/erase cycles)–40°C to 125°C (ambient)2000050000cycles
f
OTP endurance for the array (write cycles)–40°C to 30°C (ambient)1write
OTP
(1)(2)
MINTYPMAXUNIT
(1) Write/erase operations outside of the temperature ranges indicated are not specified and may affect the endurance numbers.
(2) The "Q" temperature option is not available on the 2806xU devices.
VDDcurrent consumption during Erase/Program cycle
V
current consumption during Erase/Program cycle60
DDIO
V
current consumption during Erase/Program cycleVREG enabled120mA
DDIO
VREG disabled
80
mA
(1) The on-chip flash memory is in an erased state when the device is shipped from TI. As such, erasing the flash memory is not required
before programming, when programming the device for the first time. However, the erase operation is needed on all subsequent
programming operations.
(2) Typical parameters as seen at room temperature including function call overhead, with all peripherals off. It is important to maintain a
stable power supply during the entire flash programming process. It is conceivable that device current consumption during flash
programming could be higher than normal operating conditions. The power supply used should ensure V
times, as specified in the Recommended Operating Conditions of the data sheet. Any brown-out or interruption to power during
on the supply rails at all
MIN
erasing/programming could potentially corrupt the password locations and lock the device permanently. Powering a target board (during
flash programming) through the USB port is not recommended, as the port may be unable to respond to the power demands placed
during the programming process.
The 2806x (C28x) family is a member of the TMS320C2000™ microcontroller (MCU) platform. The C28xbased controllers have the same 32-bit fixed-point architecture as existing C28x MCUs. Each C28x-based
controller, including the 2806x device, is a very efficient C/C++ engine, enabling users to develop not only
their system control software in a high-level language, but also enabling development of math algorithms
using C/C++. The device is as efficient at MCU math tasks as it is at system control tasks that typically are
handled by microcontroller devices. This efficiency removes the need for a second processor in many
systems. The 32 × 32-bit MAC 64-bit processing capabilities enable the controller to handle higher
numerical resolution problems efficiently. Add to this the fast interrupt response with automatic context
save of critical registers, resulting in a device that is capable of servicing many asynchronous events with
minimal latency. The device has an 8-level-deep protected pipeline with pipelined memory accesses. This
pipelining enables it to execute at high speeds without resorting to expensive high-speed memories.
Special branch-look-ahead hardware minimizes the latency for conditional discontinuities. Special store
conditional operations further improve performance.
The C28x control law accelerator is a single-precision (32-bit) floating-point unit that extends the
capabilities of the C28x CPU by adding parallel processing. The CLA is an independent processor with its
own bus structure, fetch mechanism, and pipeline. Eight individual CLA tasks, or routines, can be
specified. Each task is started by software or a peripheral such as the ADC, ePWM, eCAP, eQEP, or CPU
Timer 0. The CLA executes one task at a time to completion. When a task completes the main CPU is
notified by an interrupt to the PIE and the CLA automatically begins the next highest-priority pending task.
The CLA can directly access the ADC Result registers, ePWM+HRPWM, eCAP, and eQEP registers.
Dedicated message RAMs provide a method to pass additional data between the main CPU and the CLA.
The C28x VCU enhances the processing power of C2000™ devices by adding additional assembly
instructions to target complex math, Viterbi decode, and CRC calculations. The VCU instructions
accelerate many applications, including the following:
•Orthogonal frequency-division multiplex (OFDM) used in the PRIME and G3 standards for power line
communications
•Short-range radar complex math calculations
•Power calculations
•Memory and data communication packet checks (CRC)
The VCU features include:
•Instructions to support Cyclic Redundancy Checks (CRCs), which is a polynomial code checksum.
– CRC8
– CRC16
– CRC32
•Instructions to support a flexible software implementation of a Viterbi decoder
– Branch metric calculations for a code rate of 1/2 or 1/3
– Add-Compare Select or Viterbi Butterfly in 5 cycles per butterfly
– Traceback in 3 cycles per stage
– Easily supports a constraint length of K = 7 used in PRIME and G3 standards
•Complex math arithmetic unit
– Single-cycle Add or Subtract
– 2-cycle multiply
– 2-cycle multiply and accumulate (MAC)
– Single-cycle repeat MAC
•Independent register space
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6.1.4Memory Bus (Harvard Bus Architecture)
As with many MCU-type devices, multiple busses are used to move data between the memories and
peripherals and the CPU. The memory bus architecture contains a program read bus, data read bus, and
data write bus. The program read bus consists of 22 address lines and 32 data lines. The data read and
write busses consist of 32 address lines and 32 data lines each. The 32-bit-wide data busses enable
single cycle 32-bit operations. The multiple bus architecture, commonly termed Harvard Bus, enables the
C28x to fetch an instruction, read a data value and write a data value in a single cycle. All peripherals and
memories attached to the memory bus prioritize memory accesses. Generally, the priority of memory bus
accesses can be summarized as follows:
Highest:Data Writes(Simultaneous data and program writes cannot occur on the
memory bus.)
Program Writes(Simultaneous data and program writes cannot occur on the
memory bus.)
Data Reads
Program Reads(Simultaneous program reads and fetches cannot occur on the
memory bus.)
Lowest:Fetches(Simultaneous program reads and fetches cannot occur on the
To enable migration of peripherals between various Texas Instruments (TI) MCU family of devices, the
devices adopt a peripheral bus standard for peripheral interconnect. The peripheral bus bridge multiplexes
the various busses that make up the processor Memory Bus into a single bus consisting of 16 address
lines and 16 or 32 data lines and associated control signals. Three versions of the peripheral bus are
supported. One version supports only 16-bit accesses (called peripheral frame 2). Another version
supports both 16- and 32-bit accesses (called peripheral frame 1).
6.1.6Real-Time JTAG and Analysis
The devices implement the standard IEEE 1149.1 JTAG
Additionally, the devices support real-time mode of operation allowing modification of the contents of
memory, peripheral, and register locations while the processor is running and executing code and
servicing interrupts. The user can also single step through non-time-critical code while enabling timecritical interrupts to be serviced without interference. The device implements the real-time mode in
hardware within the CPU. This is a feature unique to the 28x family of devices, requiring no software
monitor. Additionally, special analysis hardware is provided that allows setting of hardware breakpoint or
data/address watch-points and generating various user-selectable break events when a match occurs.
The F28069, F28068, F28067, and F28066 devices contain 128K × 16 of embedded flash memory,
segregated into eight 16K × 16 sectors. The F28065, F28064, F28063, and F28062 devices contain 64K ×
16 of embedded flash memory, segregated into eight 8K × 16 sectors. All devices also contain a single
1K × 16 of OTP memory at address range 0x3D 7800 – 0x3D 7BF9. The user can individually erase,
program, and validate a flash sector while leaving other sectors untouched. However, it is not possible to
use one sector of the flash or the OTP to execute flash algorithms that erase or program other sectors.
Special memory pipelining is provided to enable the flash module to achieve higher performance. The
flash/OTP is mapped to both program and data space; therefore, it can be used to execute code or store
data information. Addresses 0x3F 7FF0 – 0x3F 7FF5 are reserved for data variables and should not
contain program code.
NOTE
The Flash and OTP wait-states can be configured by the application. This allows applications
running at slower frequencies to configure the flash to use fewer wait-states.
Flash effective performance can be improved by enabling the flash pipeline mode in the
Flash options register. With this mode enabled, effective performance of linear code
execution will be much faster than the raw performance indicated by the wait-state
configuration alone. The exact performance gain when using the Flash pipeline mode is
application-dependent.
For more information on the Flash options, Flash wait-state, and OTP wait-state registers,
see the Systems Control and Interrupts chapter of the TMS320x2806x Piccolo TechnicalReference Manual (SPRUH18).
(1) IEEE Standard 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture
All devices contain these two blocks of single-access memory, each 1K × 16 in size. The stack pointer
points to the beginning of block M1 on reset. The M0 and M1 blocks, like all other memory blocks on C28x
devices, are mapped to both program and data space. Hence, the user can use M0 and M1 to execute
code or for data variables. The partitioning is performed within the linker. The C28x device presents a
unified memory map to the programmer. This makes for easier programming in high-level languages.
6.1.9L4 SARAM, and L0, L1, L2, L3, L5, L6, L7, and L8 DPSARAMs
The device contains up to 48K × 16 of single-access RAM. To ascertain the exact size for a given device,
see the device-specific memory map figures in Section 6.2. This block is mapped to both program and
data space. L0 is 2K in size. L1 and L2 are each 1K in size. L3 is 4K in size. L4, L5, L6, L7, and L8 are
each 8K in size. L0, L1, and L2 are shared with the CLA, which can use these blocks for its data space.
L3 is shared with the CLA, which can use this block for its program space. L5, L6, L7, and L8 are shared
with the DMA, which can use these blocks for its data space. DPSARAM refers to the dual-port
configuration of these blocks.
6.1.10 Boot ROM
The Boot ROM is factory-programmed with boot-loading software. Boot-mode signals are provided to tell
the bootloader software what boot mode to use on power up. The user can select to boot normally or to
download new software from an external connection or to select boot software that is programmed in the
internal Flash/ROM. The Boot ROM also contains standard tables, such as SIN/COS waveforms, for use
in math-related algorithms.
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Table 6-1. Boot Mode Selection
MODEGPIO37/TDO
3110GetMode
2100Wait (see Section 6.1.11 for description)
1010SCI
0000Parallel IO
EMUxx1Emulation Boot
GPIO34/COMP2OUT/
COMP3OUT
TRSTMODE
6.1.10.1 Emulation Boot
When the emulator is connected, the GPIO37/TDO pin cannot be used for boot mode selection. In this
case, the boot ROM detects that an emulator is connected and uses the contents of two reserved SARAM
locations in the PIE vector table to determine the boot mode. If the content of either location is invalid,
then the Wait boot option is used. All boot mode options can be accessed in emulation boot.
6.1.10.2 GetMode
The default behavior of the GetMode option is to boot to flash. This behavior can be changed to another
boot option by programming two locations in the OTP. If the content of either OTP location is invalid, then
boot to flash is used. One of the following loaders can be specified: SCI, SPI, I2C, CAN, or OTP.
The devices support high levels of security to protect the user firmware from being reverse-engineered.
The security features a 128-bit password (hardcoded for 16 wait-states), which the user programs into the
flash. One code security module (CSM) is used to protect the flash/OTP and the L0/L1 SARAM blocks.
The security feature prevents unauthorized users from examining the memory contents through the JTAG
port, executing code from external memory or trying to boot-load some undesirable software that would
export the secure memory contents. To enable access to the secure blocks, the user must write the
correct 128-bit KEY value that matches the value stored in the password locations within the Flash.
In addition to the CSM, the emulation code security logic (ECSL) has been implemented to prevent
unauthorized users from stepping through secure code. Any code or data access to CSM secure memory
while the emulator is connected will trip the ECSL and break the emulation connection. To allow emulation
of secure code, while maintaining the CSM protection against secure memory reads, the user must write
the correct value into the lower 64 bits of the KEY register, which matches the value stored in the lower 64
bits of the password locations within the flash. Note that dummy reads of all 128 bits of the password in
the flash must still be performed. If the lower 64 bits of the password locations are all ones
(unprogrammed), then the KEY value does not need to match.
When initially debugging a device with the password locations in flash programmed (that is, secured), the
CPU will start running and may execute an instruction that performs an access to a protected ECSL area.
If this happens, the ECSL will trip and cause the emulator connection to be cut.
The solution is to use the Wait boot option. This will sit in a loop around a software breakpoint to allow an
emulator to be connected without tripping security. Piccolo devices do not support a hardware wait-inreset mode.
NOTE
•When the code-security passwords are programmed, all addresses between 0x3F 7F80
and 0x3F 7FF5 cannot be used as program code or data. These locations must be
programmed to 0x0000.
•If the code security feature is not used, addresses 0x3F 7F80 through 0x3F 7FEF may
be used for code or data. Addresses 0x3F 7FF0 – 0x3F 7FF5 are reserved for data and
should not contain program code.
•The 128-bit password (at 0x3F 7FF8 – 0x3F 7FFF) must not be programmed to zeros.
Doing so would permanently lock the device.
Disclaimer
Code Security Module Disclaimer
THE CODE SECURITY MODULE (CSM) INCLUDED ON THIS DEVICE WAS DESIGNED
TO PASSWORD PROTECT THE DATA STORED IN THE ASSOCIATED MEMORY
(EITHER ROM OR FLASH) AND IS WARRANTED BY TEXAS INSTRUMENTS (TI), IN
ACCORDANCE WITH ITS STANDARD TERMS AND CONDITIONS, TO CONFORM TO
TI'S PUBLISHED SPECIFICATIONS FOR THE WARRANTY PERIOD APPLICABLE FOR
THIS DEVICE.
TI DOES NOT, HOWEVER, WARRANT OR REPRESENT THAT THE CSM CANNOT BE
COMPROMISED OR BREACHED OR THAT THE DATA STORED IN THE ASSOCIATED
MEMORY CANNOT BE ACCESSED THROUGH OTHER MEANS. MOREOVER, EXCEPT
AS SET FORTH ABOVE, TI MAKES NO WARRANTIES OR REPRESENTATIONS
CONCERNING THE CSM OR OPERATION OF THIS DEVICE, INCLUDING ANY IMPLIED
WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE.
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IN NO EVENT SHALL TI BE LIABLE FOR ANY CONSEQUENTIAL, SPECIAL, INDIRECT,
INCIDENTAL, OR PUNITIVE DAMAGES, HOWEVER CAUSED, ARISING IN ANY WAY
OUT OF YOUR USE OF THE CSM OR THIS DEVICE, WHETHER OR NOT TI HAS BEEN
ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. EXCLUDED DAMAGES INCLUDE,
BUT ARE NOT LIMITED TO LOSS OF DATA, LOSS OF GOODWILL, LOSS OF USE OR
INTERRUPTION OF BUSINESS OR OTHER ECONOMIC LOSS.
6.1.12 Peripheral Interrupt Expansion (PIE) Block
The PIE block serves to multiplex numerous interrupt sources into a smaller set of interrupt inputs. The
PIE block can support up to 96 peripheral interrupts. On the F2806x, 72 of the possible 96 interrupts are
used by peripherals. The 96 interrupts are grouped into blocks of 8 and each group is fed into 1 of
12 CPU interrupt lines (INT1 to INT12). Each of the 96 interrupts is supported by its own vector stored in a
dedicated RAM block that can be overwritten by the user. The vector is automatically fetched by the CPU
on servicing the interrupt. Eight CPU clock cycles are needed to fetch the vector and save critical CPU
registers. Hence the CPU can quickly respond to interrupt events. Prioritization of interrupts is controlled in
hardware and software. Each individual interrupt can be enabled or disabled within the PIE block.
The devices support three masked external interrupts (XINT1–XINT3). Each of the interrupts can be
selected for negative, positive, or both negative and positive edge triggering and can also be enabled or
disabled. These interrupts also contain a 16-bit free-running up counter, which is reset to zero when a
valid interrupt edge is detected. This counter can be used to accurately time-stamp the interrupt. There
are no dedicated pins for the external interrupts. XINT1, XINT2, and XINT3 interrupts can accept inputs
from GPIO0–GPIO31 pins.
6.1.14 Internal Zero Pin Oscillators, Oscillator, and PLL
The device can be clocked by either of the two internal zero-pin oscillators, an external oscillator, or by a
crystal attached to the on-chip oscillator circuit. A PLL is provided supporting up to 16 input-clock-scaling
ratios. The PLL ratios can be changed on-the-fly in software, enabling the user to scale back on operating
frequency if lower power operation is desired. Refer to Section 5, Specifications, for timing details. The
PLL block can be set in bypass mode. A second PLL (PLL2) feeds the HRCAP module.
6.1.15 Watchdog
Each device contains two watchdogs: CPU-watchdog that monitors the core and NMI-watchdog that is a
missing clock-detect circuit. The user software must regularly reset the CPU-watchdog counter within a
certain time frame; otherwise, the CPU-watchdog generates a reset to the processor. The CPU-watchdog
can be disabled if necessary. The NMI-watchdog engages only in case of a clock failure and can either
generate an interrupt or a device reset.
SPRS698F –NOVEMBER 2010–REVISED MARCH 2016
6.1.16 Peripheral Clocking
The clocks to each individual peripheral can be enabled or disabled to reduce power consumption when a
peripheral is not in use. Additionally, the system clock to the serial ports (except I2C) can be scaled
relative to the CPU clock.
6.1.17 Low-power Modes
The devices are full static CMOS devices. Three low-power modes are provided:
IDLE:Places CPU in low-power mode. Peripheral clocks may be turned off selectively and
only those peripherals that need to function during IDLE are left operating. An
enabled interrupt from an active peripheral or the watchdog timer will wake the
processor from IDLE mode.
STANDBY: Turns off clock to CPU and peripherals. This mode leaves the oscillator and PLL
functional. An external interrupt event will wake the processor and the peripherals.
Execution begins on the next valid cycle after detection of the interrupt event
HALT:This mode basically shuts down the device and places it in the lowest possible power-
consumption mode. If the internal zero-pin oscillators are used as the clock source,
the HALT mode turns them off, by default. To keep these oscillators from shutting
down, the INTOSCnHALTI bits in CLKCTL register may be used. The zero-pin
oscillators may thus be used to clock the CPU-watchdog in this mode. If the on-chip
crystal oscillator is used as the clock source, it is shut down in this mode. A reset or
an external signal (through a GPIO pin) or the CPU-watchdog can wake the device
from this mode.
The CPU clock (OSCCLK) and WDCLK should be from the same clock source before attempting to put
the device into HALT or STANDBY.
The device segregates peripherals into four sections. The mapping of peripherals is as follows:
PF0:PIE:PIE Interrupt Enable and Control Registers Plus PIE Vector Table
Flash:Flash Waitstate Registers
Timers:CPU-Timers 0, 1, 2 Registers
CSM:Code Security Module KEY Registers
ADC:ADC Result Registers
CLA:Control Law Accelrator Registers and Message RAMs
PF1:GPIO:GPIO MUX Configuration and Control Registers
eCAN:Enhanced Control Area Network Configuration and Control Registers
PF2:SYS:System Control Registers
SCI:Serial Communications Interface (SCI) Control and RX/TX Registers
SPI:Serial Port Interface (SPI) Control and RX/TX Registers
ADC:ADC Status, Control, and Configuration Registers
I2C:Inter-Integrated Circuit Module and Registers
XINT:External Interrupt Registers
PF3:McBSP:Multichannel Buffered Serial Port Registers
ePWM:Enhanced Pulse Width Modulator Module and Registers
eCAP:Enhanced Capture Module and Registers
eQEP:Enhanced Quadrature Encoder Pulse Module and Registers
Comparators:Comparator Modules
USB:Universal Serial Bus Module and Registers
Most of the peripheral signals are multiplexed with general-purpose input/output (GPIO) signals. This
enables the user to use a pin as GPIO if the peripheral signal or function is not used. On reset, GPIO pins
are configured as inputs. The user can individually program each pin for GPIO mode or peripheral signal
mode. For specific inputs, the user can also select the number of input qualification cycles. This is to filter
unwanted noise glitches. The GPIO signals can also be used to bring the device out of specific low-power
modes.
CPU-Timers 0, 1, and 2 are identical 32-bit timers with presettable periods and with 16-bit clock
prescaling. The timers have a 32-bit count-down register, which generates an interrupt when the counter
reaches zero. The counter is decremented at the CPU clock speed divided by the prescale value setting.
When the counter reaches zero, it is automatically reloaded with a 32-bit period value.
CPU-Timer 0 is for general use and is connected to the PIE block. CPU-Timer 1 is also for general use
and can be connected to INT13 of the CPU. CPU-Timer 2 is reserved for SYS/BIOS. CPU-Timer 2 is
connected to INT14 of the CPU. If SYS/BIOS is not being used, CPU-Timer 2 is available for general use.
CPU-Timer 2 can be clocked by any one of the following:
•SYSCLKOUT (default)
•Internal zero-pin oscillator 1 (INTOSC1)
•Internal zero-pin oscillator 2 (INTSOC2)
•External clock source
6.1.21 Control Peripherals
The devices support the following peripherals that are used for embedded control and communication:
generation, adjustable dead-band generation for leading/trailing edges,
latched/cycle-by-cycle trip mechanism. Some of the PWM pins support the
HRPWM high-resolution duty and period features. The type 1 module found on
2806x devices also supports increased dead-band resolution, enhanced SOC and
interrupt generation, and advanced triggering including trip functions based on
comparator outputs.
eCAP:The enhanced capture peripheral uses a 32-bit time base and registers up to four
programmable events in continuous/one-shot capture modes.
This peripheral can also be configured to generate an auxiliary PWM signal.
eQEP:The enhanced QEP peripheral uses a 32-bit position counter, supports low-speed
measurement using capture unit and high-speed measurement using a 32-bit unit
timer. This peripheral has a watchdog timer to detect motor stall and input error
detection logic to identify simultaneous edge transition in QEP signals.
ADC:The ADC block is a 12-bit converter. The ADC has up to 16 single-ended channels
pinned out, depending on the device. The ADC also contains two sample-and-hold
units for simultaneous sampling.
Comparator:Each comparator block consists of one analog comparator along with an internal
10-bit reference for supplying one input of the comparator.
HRCAP:The high-resolution capture peripheral operates in normal capture mode through a
16-bit counter clocked off of the HCCAPCLK or in high-resolution capture mode by
using built-in calibration logic in conjunction with a TI-supplied calibration library.
The devices support the following serial communication peripherals:
SPI:The SPI is a high-speed, synchronous serial I/O port that allows a serial bit stream
of programmed length (1 to 16 bits) to be shifted into and out of the device at a
programmable bit-transfer rate. Normally, the SPI is used for communications
between the MCU and external peripherals or another processor. Typical
applications include external I/O or peripheral expansion through devices such as
shift registers, display drivers, and ADCs. Multi-device communications are
supported by the master/slave operation of the SPI. The SPI contains a 4-level
receive and transmit FIFO for reducing interrupt servicing overhead.
SCI:The serial communications interface is a 2-wire asynchronous serial port,
commonly known as UART. The SCI contains a 4-level receive and transmit FIFO
for reducing interrupt servicing overhead.
I2C:The inter-integrated circuit (I2C) module provides an interface between a MCU and
other devices compliant with Philips Semiconductors Inter-IC bus ( I2C-bus®)
specification version 2.1 and connected by way of an I2C-bus. External
components attached to this 2-wire serial bus can transmit/receive up to 8-bit data
to or from the MCU through the I2C module. The I2C contains a 4-level receiveand-transmit FIFO for reducing interrupt servicing overhead.
eCAN:This is the enhanced version of the CAN peripheral. The eCAN supports
32 mailboxes, time stamping of messages, and is compliant with ISO11898-1
(CAN 2.0B).
McBSP:The multichannel buffered serial port (McBSP) connects to E1/T1 lines, phone-
quality codecs for modem applications or high-quality stereo audio DAC devices.
The McBSP receive and transmit registers are supported by the DMA to
significantly reduce the overhead for servicing this peripheral. Each McBSP
module can be configured as an SPI as required.
USB:The USB peripheral, which conforms to the USB 2.0 specification, may be used as
either a full-speed (12-Mbps) device controller, or a full-speed (12-Mbps) or lowspeed (1.5-Mbps) host controller. The controller supports a total of six userconfigurable endpoints—all of which can be accessed through DMA, in addition to
a dedicated control endpoint for endpoint zero. All packets transmitted or received
are buffered in 4KB of dedicated endpoint memory. The USB peripheral supports
all four transfer types: Control, Interrupt, Bulk, and Isochronous. Because of the
complexity of the USB peripheral and the associated protocol overhead, a full
software library with application examples is provided within controlSUITE™.
In Figure 6-1 through Figure 6-8, the following apply:
•Memory blocks are not to scale.
•Peripheral Frame 0, Peripheral Frame 1, Peripheral Frame 2, and Peripheral Frame 3 memory maps
are restricted to data memory only. A user program cannot access these memory maps in program
space.
•Protected means the order of Write-followed-by-Read operations is preserved rather than the pipeline
order.
•Certain memory ranges are EALLOW protected against spurious writes after configuration.
•Locations 0x3D 7C80–0x3D 7CC0 contain the internal oscillator and ADC calibration routines. These
locations are not programmable by the user.
•All devices with USB have the USB control registers mapped from 0x4000 to 0x4FFF and 2K ×16 RAM
from 0x40000 to 0x40800. When the clock to the USB module is enabled, this RAM is connected to
the USB controller and acts as the FIFO RAM. When the clock to the USB module is disabled, this
RAM is remapped to the CPU-accessible address space and can be used as general-purpose RAM.
Peripheral Frame 1 and Peripheral Frame 2 are grouped together to enable these blocks to be write/read
peripheral block protected. The protected mode makes sure that all accesses to these blocks happen as
written. Because of the pipeline, a write immediately followed by a read to different memory locations, will
appear in reverse order on the memory bus of the CPU. This can cause problems in certain peripheral
applications where the user expected the write to occur first (as written). The CPU supports a block
protection mode where a region of memory can be protected so that operations occur as written (the
penalty is extra cycles are added to align the operations). This mode is programmable and by default, it
protects the selected zones.
The wait-states for the various spaces in the memory map area are listed in Table 6-5.
Table 6-5. Wait-States
AREAWAIT-STATES (CPU)COMMENTS
M0 and M1 SARAMs0-waitFixed
Peripheral Frame 00-wait
Peripheral Frame 10-wait (writes)Cycles can be extended by peripheral-generated ready.
2-wait (reads)Back-to-back write operations to Peripheral Frame 1 registers will incur
Peripheral Frame 20-wait (writes)Fixed. Cycles cannot be extended by the peripheral.
2-wait (reads)
Peripheral Frame 30-wait (writes)Assumes no conflict between CPU and CLA/DMA cycles. The wait
2-wait (reads)
L0–L8 SARAM0-wait data and programAssumes no CPU conflicts
OTPProgrammableProgrammed through the Flash registers.
1-wait minimum1-wait is minimum number of wait states allowed.
FLASHProgrammableProgrammed through the Flash registers.
0-wait Paged min
1-wait Random min
Random ≥ Paged
FLASH Password16-wait fixedWait states of password locations are fixed.
Boot-ROM0-wait
a 1-cycle stall (1-cycle delay).
states can be extended by peripheral-generated ready.
registers
PIE registers0x00 0CE0 – 0x00 0CFF32No
PIE Vector Table0x00 0D00 – 0x00 0DFF256Yes
DMA registers0x00 1000 – 0x00 11FF512Yes
CLA registers0x00 1400 – 0x00 147F128Yes
CLA to CPU Message RAM (CPU writes ignored)0x00 1480 – 0x00 14FF128NA
CPU to CLA Message RAM (CLA writes ignored)0x00 1500 – 0x00 157F128NA
(1) Registers in Frame 0 support 16-bit and 32-bit accesses.
(2) If registers are EALLOW protected, then writes cannot be performed until the EALLOW instruction is executed. The EDIS instruction
disables writes to prevent stray code or pointers from corrupting register contents.
(3) The Flash Registers are also protected by the Code Security Module (CSM).
These registers are used to control the protection mode of the C28x CPU and to monitor some critical
device signals. The registers are defined in Table 6-10.
Table 6-10. Device Emulation Registers
NAMEADDRESS RANGESIZE (×16)DESCRIPTION
DEVICECNF
PARTID0x3D 7E801Part ID RegisterTMS320F28069PZP/PZ0x009E
Although the core and I/O circuitry operate on two different voltages, these devices have an on-chip
VREG to generate the VDDvoltage from the V
supply. This eliminates the cost and space of a second
DDIO
external regulator on an application board. Additionally, internal power-on reset (POR) and brown-out
reset (BOR) circuits monitor both the VDDand V
rails during power-up and run mode.
DDIO
6.5.1On-chip VREG
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A linear regulator generates the core voltage (VDD) from the V
supply. Therefore, although capacitors
DDIO
are required on each VDDpin to stabilize the generated voltage, power need not be supplied to these pins
to operate the device. Conversely, the VREG can be disabled, should power or redundancy be the
primary concern of the application.
6.5.1.1Using the On-chip VREG
To use the on-chip VREG, the VREGENZ pin should be tied low and the appropriate recommended
operating voltage should be supplied to the V
DDIO
and V
pins. In this case, the VDDvoltage needed by
DDA
the core logic will be generated by the VREG. Each VDDpin requires on the order of 1.2 μF (minimum)
capacitance for proper regulation of the VREG. These capacitors should be located as close as possible
to the VDDpins.
6.5.1.2Disabling the On-chip VREG
To conserve power, it is also possible to disable the on-chip VREG and supply the core logic voltage to
the VDDpins with a more efficient external regulator. To enable this option, the VREGENZ pin must be tied
high.
6.5.2On-chip Power-On Reset (POR) and Brown-Out Reset (BOR) Circuit
Two on-chip supervisory circuits, the power-on reset (POR) and the brown-out reset (BOR) remove the
burden of monitoring the VDDand V
to create a clean reset throughout the device during the entire power-up procedure. The trip point is a
looser, lower trip point than the BOR, which watches for dips in the VDDor V
operation. The POR function is present on both VDDand V
up, the BOR function is present on V
(VREGENZ pin is tied low). Both functions tie the XRS pin low when one of the voltages is below their
respective trip point. Additionally, when the internal voltage regulator is enabled, an over-voltage
protection circuit will tie XRS low if the VDDrail rises above its trip point. See Section 5 for the various trip
points as well as the delay time for the device to release the XRS pin after the under-voltage or overvoltage condition is removed. Figure 6-9 shows the VREG, POR, and BOR. To disable both the VDDand
V
BOR functions, a bit is provided in the BORCFG register. See the Systems Control and Interrupts
DDIO
chapter of the TMS320x2806x Piccolo Technical Reference Manual (SPRUH18) for details.
supply rails from the application board. The purpose of the POR is
DDIO
rails at all times. After initial device power-
DDIO
at all times, and on VDDwhen the internal VREG is enabled
The F2806x devices contain two independent internal zero pin oscillators. By default both oscillators are
turned on at power up, and internal oscillator 1 is the default clock source at this time. For power savings,
unused oscillators may be powered down by the user. The center frequency of these oscillators is
determined by their respective oscillator trim registers, written to in the calibration routine as part of the
boot ROM execution. See Section 6.9 for more information on these oscillators.
6.6.2Crystal Oscillator Option
The on-chip crystal oscillator X1 and X2 pins are 1.8-V level signals and must never have 3.3-V level
signals applied to them. If a system 3.3-V external oscillator is to be used as a clock source, it should be
connected to the XCLKIN pin only. The X1 pin is not intended to be used as a single-ended clock input, it
should be used with X2 and a crystal.
The typical specifications for the external quartz crystal (fundamental mode, parallel resonant) are listed in
Table 6-12. Typical Specifications for External Quartz Crystal
FREQUENCY (MHz)Rd(Ω)CL1(pF)CL2(pF)
522001818
104701515
1501515
2001212
(1) C
should be less than or equal to 5 pF.
shunt
(1)
Figure 6-12. Using the On-chip Crystal Oscillator
NOTE
1. CL1and CL2are the total capacitance of the circuit board and components excluding the
IC and crystal. The value is usually approximately twice the value of the load capacitance
of the crystal.
2. The load capacitance of the crystal is described in the crystal specifications of the
manufacturers.
3. TI recommends that customers have the resonator/crystal vendor characterize the
operation of their device with the MCU chip. The resonator/crystal vendor has the
equipment and expertise to tune the tank circuit. The vendor can also advise the
customer regarding the proper tank component values that will produce proper start up
and stability over the entire operating range.
The devices have an on-chip, PLL-based clock module. This module provides all the necessary clocking
signals for the device, as well as control for low-power mode entry. The PLL has a 5-bit ratio control
PLLCR[DIV] to select different CPU clock rates. The watchdog module should be disabled before writing
to the PLLCR register. The watchdog module can be re-enabled (if need be) after the PLL module has
stabilized, which takes 1 ms. The input clock and PLLCR[DIV] bits should be chosen in such a way that
the output frequency of the PLL (VCOCLK) is at least 50 MHz.
The PLL-based clock module provides four modes of operation:
•INTOSC1 (Internal Zero-pin Oscillator 1): This is the on-chip internal oscillator 1. This can provide
•INTOSC2 (Internal Zero-pin Oscillator 2): This is the on-chip internal oscillator 2. This can provide
•Crystal/Resonator Operation: The on-chip (crystal) oscillator enables the use of an external
•External Clock Source Operation: If the on-chip (crystal) oscillator is not used, this mode allows it to
Before changing clock sources, ensure that the target clock is present. If a clock is not present, then that
clock source must be disabled (using the CLKCTL register) before switching clocks.
the clock for the Watchdog block, core and CPU-Timer 2
the clock for the Watchdog block, core and CPU-Timer 2. Both INTOSC1 and INTOSC2 can be
independently chosen for the Watchdog block, core and CPU-Timer 2.
crystal/resonator attached to the device to provide the time base. The crystal/resonator is connected to
the X1/X2 pins. Some devices may not have the X1/X2 pins. See Table 4-1 for details.
be bypassed. The device clocks are generated from an external clock source input on the XCLKIN pin.
Note that the XCLKIN is multiplexed with GPIO19 or GPIO38 pin. The XCLKIN input can be selected
as GPIO19 or GPIO38 through the XCLKINSEL bit in XCLK register. The CLKCTL[XCLKINOFF] bit
disables this clock input (forced low). If the clock source is not used or the respective pins are used as
GPIOs, the user should disable at boot time.
Table 6-15. Possible PLL Configuration Modes
PLL MODEREMARKSPLLSTS[DIVSEL]CLKIN AND SYSCLKOUT
PLL OffInvoked by the user setting the PLLOFF bit in the PLLSTS register. The
PLL block is disabled in this mode. This can be useful to reduce system
noise and for low power operation. The PLLCR register must first be set
to 0x0000 (PLL Bypass) before entering this mode. The CPU clock
(CLKIN) is derived directly from the input clock on either X1/X2, X1 or
XCLKIN.
PLL BypassPLL Bypass is the default PLL configuration upon power-up or after an
external reset (XRS). This mode is selected when the PLLCR register is
set to 0x0000 or while the PLL locks to a new frequency after the
PLLCR register has been modified. In this mode, the PLL itself is
bypassed but the PLL is not turned off.
PLL EnableAchieved by writing a non-zero value n into the PLLCR register. Upon
writing to the PLLCR the device will switch to PLL Bypass mode until the
PLL locks.
In addition to the main system PLL, these devices also contain a second PLL (PLL2) which can be used to
clock the USB and HRCAP peripherals. The PLL supports multipliers of 1 to 15 and has a fixed divide-bytwo on its output.
PLL2 may be clocked from the following three sources by modifying the PLL2CLKSRCSEL bits
appropriately in the PLL2CTL register:
•INTOSC1 (Internal Zero-pin Oscillator 1): This is the on-chip internal oscillator 1 and provides a 10MHz clock. If used as a clock source for HRCAP, the oscillator compensation routine should be called
frequently. Because of accuracy requirements, INTOSC1 cannot be used as a clock source for the
USB.
•Crystal/Resonator Operation: The (crystal) oscillator enables the use of an external crystal or resonator
attached to the device to provide the time base. The crystal or resonator is connected to the X1/X2
pins.
•External Clock Source Operation: This mode allows the reference clock to be derived from an external
single-ended clock source connected to either GPIO19 or GPIO38. The XCLKINSEL bit in the XCLK
register should be set appropriately to enable the selected GPIO to drive XCLKIN.
NOTE
For proper operation of the USB module, PLL2 should be configured to generate a 120-MHz
clock. This will be divided by two to yield the desired 60 MHz for the USB peripheral.
HRCAP supports a maximum clock input frequency of 120 MHz.
The2806xdevicesmaybeclockedfromeitheroneoftheinternalzero-pinoscillators
(INTOSC1/INTOSC2), the on-chip crystal oscillator, or from an external clock input. Regardless of the
clock source, in PLL-enabled and PLL-bypass mode, if the input clock to the PLL vanishes, the PLL will
issue a limp-mode clock at its output. This limp-mode clock continues to clock the CPU and peripherals at
a typical frequency of 1–5 MHz.
When the limp mode is activated, a CLOCKFAIL signal is generated that is latched as an NMI interrupt.
Depending on how the NMIRESETSEL bit has been configured, a reset to the device can be fired
immediately or the NMI watchdog counter can issue a reset when it overflows. In addition to this, the
Missing Clock Status (MCLKSTS) bit is set. The NMI interrupt could be used by the application to detect
the input clock failure and initiate necessary corrective action such as switching over to an alternative
clock source (if available) or initiate a shut-down procedure for the system.
If the software does not respond to the clock-fail condition, the NMI watchdog triggers a reset after a
preprogrammed time interval. Figure 6-14 shows the interrupt mechanisms involved.
SPRS698F –NOVEMBER 2010–REVISED MARCH 2016
6.6.6CPU-Watchdog Module
The CPU-watchdog module on the 2806x device is similar to the one used on the 281x/280x/283xx
devices. This module generates an output pulse, 512 oscillator clocks wide (OSCCLK), whenever the 8-bit
watchdog up counter has reached its maximum value. To prevent this, the user must disable the counter
or the software must periodically write a 0x55 + 0xAA sequence into the watchdog key register that resets
the watchdog counter. Figure 6-15 shows the various functional blocks within the watchdog module.
Normally, when the input clocks are present, the CPU-watchdog counter decrements to initiate a CPUwatchdog reset or WDINT interrupt. However, when the external input clock fails, the CPU-watchdog
counter stops decrementing (that is, the watchdog counter does not change with the limp-mode clock).
NOTE
The CPU-watchdog is different from the NMI watchdog. The CPU-watchdog is the legacy
watchdog that is present in all 28x devices.
NOTE
Applications in which the correct CPU operating frequency is absolutely critical should
implement a mechanism by which the MCU will be held in reset, should the input clocks ever
fail. For example, an R-C circuit may be used to trigger the XRS pin of the MCU, should the
capacitor ever get fully charged. An I/O pin may be used to discharge the capacitor on a
periodic basis to prevent it from getting fully charged. Such a circuit would also help in
detecting failure of the flash memory.
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A.The WDRST signal is driven low for 512 OSCCLK cycles.
The WDINT signal enables the watchdog to be used as a wakeup from IDLE/STANDBY mode.
In STANDBY mode, all peripherals are turned off on the device. The only peripheral that remains
functional is the CPU-watchdog. This module will run off OSCCLK. The WDINT signal is fed to the LPM
block so that it can wake the device from STANDBY (if enabled). See Section 6.7 for more details.
In IDLE mode, the WDINT signal can generate an interrupt to the CPU, through the PIE, to take the CPU
72
out of IDLE mode.
In HALT mode, the CPU-watchdog can be used to wake up the device through a device reset.
(1) The Exit column lists which signals or under what conditions the low power mode is exited. A low signal, on any of the signals, exits the
low power condition. This signal must be kept low long enough for an interrupt to be recognized by the device. Otherwise, the low-power
mode will not be exited and the device will go back into the indicated low power mode.
(2) The JTAG port can still function even if the CPU clock (CLKIN) is turned off.
(3) The WDCLK must be active for the device to go into HALT mode.
1X
(CPU-watchdog still running)
(on-chip crystal oscillator and
PLL turned off, zero-pin oscillator
and CPU-watchdog state
dependent on user code.)
On
Off
OffOff
OffOff
XRS, CPU-watchdog interrupt, any
enabled interrupt
XRS, CPU-watchdog interrupt, GPIO
Port A signal, debugger
XRS, GPIO Port A signal, debugger
CPU-watchdog
The various low-power modes operate as follows:
(1)
(2)
(2)
,
IDLE Mode:This mode is exited by any enabled interrupt that is recognized by the
processor. The LPM block performs no tasks during this mode as long as
the LPMCR0(LPM) bits are set to 0,0.
STANDBY Mode:Any GPIO port A signal (GPIO[31:0]) can wake the device from STANDBY
mode. The user must select which signals will wake the device in the
GPIOLPMSEL register. The selected signals are also qualified by the
OSCCLK before waking the device. The number of OSCCLKs is specified in
the LPMCR0 register.
HALT Mode:CPU-watchdog, XRS, and any GPIO port A signal (GPIO[31:0]) can wake
the device from HALT mode. The user selects the signal in the
GPIOLPMSEL register.
NOTE
The low-power modes do not affect the state of the output pins (PWM pins included). They
will be in whatever state the code left them in when the IDLE instruction was executed. See
the Systems Control and Interrupts chapter of the TMS320x2806x Piccolo TechnicalReference Manual (SPRUH18) for more details.
Eight PIE block interrupts are grouped into one CPU interrupt. In total, 12 CPU interrupt groups, with
8 interrupts per group equals 96 possible interrupts. Table 6-17 shows the interrupts used by 2806x
devices.
The TRAP #VectorNumber instruction transfers program control to the interrupt service routine
corresponding to the vector specified. TRAP #0 attempts to transfer program control to the address
pointed to by the reset vector. The PIE vector table does not, however, include a reset vector. Therefore,
TRAP #0 should not be used when the PIE is enabled. Doing so will result in undefined behavior.
When the PIE is enabled, TRAP #1 through TRAP #12 will transfer program control to the interrupt service
routine corresponding to the first vector within the PIE group. For example: TRAP #1 fetches the vector
from INT1.1, TRAP #2 fetches the vector from INT2.1, and so forth.
Table 6-18. PIE Configuration and Control Registers
NAMEADDRESSSIZE (×16)DESCRIPTION
PIECTRL0x0CE01PIE, Control Register
PIEACK0x0CE11PIE, Acknowledge Register
PIEIER10x0CE21PIE, INT1 Group Enable Register
PIEIFR10x0CE31PIE, INT1 Group Flag Register
PIEIER20x0CE41PIE, INT2 Group Enable Register
PIEIFR20x0CE51PIE, INT2 Group Flag Register
PIEIER30x0CE61PIE, INT3 Group Enable Register
PIEIFR30x0CE71PIE, INT3 Group Flag Register
PIEIER40x0CE81PIE, INT4 Group Enable Register
PIEIFR40x0CE91PIE, INT4 Group Flag Register
PIEIER50x0CEA1PIE, INT5 Group Enable Register
PIEIFR50x0CEB1PIE, INT5 Group Flag Register
PIEIER60x0CEC1PIE, INT6 Group Enable Register
PIEIFR60x0CED1PIE, INT6 Group Flag Register
PIEIER70x0CEE1PIE, INT7 Group Enable Register
PIEIFR70x0CEF1PIE, INT7 Group Flag Register
PIEIER80x0CF01PIE, INT8 Group Enable Register
PIEIFR80x0CF11PIE, INT8 Group Flag Register
PIEIER90x0CF21PIE, INT9 Group Enable Register
PIEIFR90x0CF31PIE, INT9 Group Flag Register
PIEIER100x0CF41PIE, INT10 Group Enable Register
PIEIFR100x0CF51PIE, INT10 Group Flag Register
PIEIER110x0CF61PIE, INT11 Group Enable Register
PIEIFR110x0CF71PIE, INT11 Group Flag Register
PIEIER120x0CF81PIE, INT12 Group Enable Register
PIEIFR120x0CF91PIE, INT12 Group Flag Register
Reserved0x0CFA –
0x0CFF
(1) The PIE configuration and control registers are not protected by EALLOW mode. The PIE vector table
Each external interrupt can be enabled or disabled or qualified using positive, negative, or both positive
and negative edge. For more information, see the Systems Control and Interrupts chapter of the
TMS320x2806x Piccolo Technical Reference Manual (SPRUH18).
(1) For an explanation of the input qualifier parameters, see Table 6-76.
(2) This timing is applicable to any GPIO pin configured for ADCSOC functionality.
The control law accelerator extends the capabilities of the C28x CPU by adding parallel processing. Timecritical control loops serviced by the CLA can achieve low ADC sample to output delay. Thus, the CLA
enables faster system response and higher frequency control loops. Using the CLA for time-critical tasks
frees up the main CPU to perform other system and communication functions concurently. The following is
a list of major features of the CLA.
•Clocked at the same rate as the main CPU (SYSCLKOUT).
•An independent architecture allowing CLA algorithm execution independent of the main C28x CPU.
–Complete bus architecture:
•Program address bus and program data bus
•Data address bus, data read bus, and data write bus
–Independent eight-stage pipeline.
–12-bit program counter (MPC)
–Four 32-bit result registers (MR0–MR3)
–Two 16-bit auxillary registers (MAR0, MAR1)
–Status register (MSTF)
•Instruction set includes:
–IEEE single-precision (32-bit) floating-point math operations
–Floating-point math with parallel load or store
–Floating-point multiply with parallel add or subtract
–1/X and 1/sqrt(X) estimations
–Data type conversions.
–Conditional branch and call
–Data load and store operations
•The CLA program code can consist of up to eight tasks or interrupt service routines.
–The start address of each task is specified by the MVECT registers.
–No limit on task size as long as the tasks fit within the CLA program memory space.
–One task is serviced at a time through to completion. There is no nesting of tasks.
–Upon task completion, a task-specific interrupt is flagged within the PIE.
–When a task finishes, the next highest-priority pending task is automatically started.
•Task trigger mechanisms:
–C28x CPU through the IACK instruction
–Task1 to Task7: the corresponding ADC, ePWM, eQEP, or eCAP module interrupt. For example:
•Task1: ADCINT1 or EPWM1_INT
•Task2: ADCINT2 or EPWM2_INT
•Task4: ADCINT4 or EPWM4_INT or EQEPx_INT or ECAPx_INT
•Task7: ADCINT7 or EPWM7_INT or EQEPx_INT or ECAPx_INT
–Task8: ADCINT8 or by CPU Timer 0 or EQEPx_INT or ECAPx_INT.
•Memory and Shared Peripherals:
–Two dedicated message RAMs for communication between the CLA and the main CPU.
–The C28x CPU can map CLA program and data memory to the main CPU space or CLA space.
–The CLA has direct access to the ADC Result registers, comparator registers, and the eCAP, eQEP, and
0x14281–CLA Program Counter
0x142A1–CLA Aux Register 0
0x142B1–CLA Aux Register 1
0x142E2–CLA STF Register
0x14302–CLA R0H Register
0x14342–CLA R1H Register
0x14382–CLA R2H Register
0x143C2–CLA R3H Register
(1) All registers in this table are CSM protected
(2) The main C28x CPU has read only access to this register for debug purposes. The main CPU cannot perform CPU or debugger writes
to this register.
ADDRESS RANGESIZE (×16)DESCRIPTION
0x1480 – 0x14FF128CLA to CPU Message RAM
0x1500 – 0x157F128CPU to CLA Message RAM
A 12-bit ADC core is implemented that has different timings than the 12-bit ADC used on the F280x and
F2833x devices. The ADC wrapper is modified to incorporate the new timings and also other
enhancements to improve the timing control of start of conversions. Figure 6-20 shows the interaction of
the analog module with the rest of the F2806x system.
The core of the ADC contains a single 12-bit converter fed by two sample-and-hold circuits. The sampleand-hold circuits can be sampled simultaneously or sequentially. These, in turn, are fed by a total of up to
16 analog input channels. The converter can be configured to run with an internal bandgap reference to
create true-voltage based conversions or with a pair of external voltage references (V
create ratiometric-based conversions.
Contrary to previous ADC types, this ADC is not sequencer-based. The user can easily create a series of
conversions from a single trigger. However, the basic principle of operation is centered around the
configurations of individual conversions, called SOCs, or Start-Of-Conversions.
Functions of the ADC module include:
•12-bit ADC core with built-in dual sample-and-hold (S/H)
•Simultaneous sampling or sequential sampling modes
•Full range analog input: 0 V to 3.3 V fixed, or V
analog voltage is derived by:
ADCSOC15CTL
ADCREFTRIM0x71401YesReference Trim Register
ADCOFFTRIM0x71411YesOffset Trim Register
COMPHYSTCTL0x714C1YesComparator Hysteresis Control Register
ADCREV0x714F1NoRevision Register
It is recommended that the connections for the analog power pins be kept, even if the ADC is not used.
Following is a summary of how the ADC pins should be connected, if the ADC is not used in an
application:
•V
•V
•V
•ADCINAn, ADCINBn, V
When the ADC module is used in an application, unused ADC input pins should be connected to analog
ground (V
NOTE: Unused ADCIN pins that are multiplexed with AIO function should not be directly connected to
analog ground. They should be grounded through a 1-kΩ resistor. This is to prevent an errant code from
configuring these pins as AIO outputs and driving grounded pins to a logic-high state.
When the ADC is not used, be sure that the clock to the ADC module is not turned on to realize power
savings.
DNL (Differential nonlinearity), no missing codes–11.5LSB
Offset error
Executing a single self-
(2)
recalibration
Executing periodic self-
recalibration
(3)
(4)
–2020
–44
Overall gain error with internal reference–6060LSB
Overall gain error with external reference–4040LSB
Channel-to-channel offset variation–44LSB
Channel-to-channel gain variation–44LSB
ADC temperature coefficient with internal reference–50ppm/°C
ADC temperature coefficient with external reference–20ppm/°C
V
REFLO
V
REFHI
–100µA
100µA
ANALOG INPUT
Analog input voltage with internal reference03.3V
Analog input voltage with external referenceV
V
REFLO
V
REFHI
input voltage
input voltage
(5)
(6)
with V
REFLO
= V
SSA
REFLO
V
SSA
2.64V
1.98V
V
REFHI
0.66V
DDA
DDA
Input capacitance5pF
Input leakage current±2μA
(1) INL will degrade when the ADC input voltage goes above V
(2) 1 LSB has the weighted value of full-scale range (FSR)/4096. FSR is 3.3 V with internal reference and V
reference.
DDA
.
REFHI
- V
REFLO
for external
(3) For more details, see the TMS320F28069, TMS320F28068, TMS320F28067, TMS320F28066, TMS320F28065, TMS320F28064,
TMS320F28063, TMS320F28062 Piccolo MCUs Silicon Errata (SPRZ342).
(4) Periodic self-recalibration will remove system-level and temperature dependencies on the ADC zero offset error.
(5) V
(6) V
is always connected to V
REFLO
must not exceed V
REFHI
and PFP devices, the input signal on ADCINA0 must not exceed V
DDA
on the 80-pin PN and PFP devices.
SSA
when using either internal or external reference modes. Since V
Bandgap On (ADCBGPWD = 1)
Reference On (ADCREFPWD = 1)
16mA
ADC Powered Up (ADCPWDN = 1)
ADC Clock Enabled
Mode B – Quick Wake Mode
Bandgap On (ADCBGPWD = 1)
Reference On (ADCREFPWD = 1)
4mA
ADC Powered Up (ADCPWDN = 0)
ADC Clock Enabled
Mode C – Comparator-Only Mode
Bandgap On (ADCBGPWD = 1)
Reference On (ADCREFPWD = 0)
1.5mA
ADC Powered Up (ADCPWDN = 0)
ADC Clock Enabled
Mode D – Off Mode
Bandgap On (ADCBGPWD = 0)
Reference On (ADCREFPWD = 0)
0.075mA
ADC Powered Up (ADCPWDN = 0)
6.9.2.1.3.1 Internal Temperature Sensor
Table 6-29. Temperature Sensor Coefficient
PARAMETER
T
SLOPE
T
OFFSET
Degrees C of temperature movement per measured ADC LSB change of the
temperature sensor
ADC output at 0°C of the temperature sensor1750LSB
(1) The temperature sensor slope and offset are given in terms of ADC LSBs using the internal reference of the ADC. Values must be
adjusted accordingly in external reference mode to the external reference voltage.
(2) ADC temperature coeffieicient is accounted for in this specification
(3) Output of the temperature sensor (in terms of LSBs) is sign-consistent with the direction of the temperature movement. Increasing
temperatures will give increasing ADC values relative to an initial value; decreasing temperatures will give decreasing ADC values
relative to an initial value.
(1)
MINTYPMAXUNIT
(2)(3)
0.18
°C/LSB
6.9.2.1.3.2 ADC Power-Up Control Bit Timing
Table 6-30. ADC Power-Up Delays
PARAMETER
t
d(PWD)
Delay time for the ADC to be stable after power up1ms
(1) Timings maintain compatibility to the ADC module. The 2806x ADC supports driving all 3 bits at the same time t
The ADC channel and Comparator functions are always available. The digital I/O function is available only
when the respective bit in the AIOMUX1 register is 0. In this mode, reading the AIODAT register reflects
the actual pin state.
The digital I/O function is disabled when the respective bit in the AIOMUX1 register is 1. In this mode,
reading the AIODAT register reflects the output latch of the AIODAT register and the input digital I/O buffer
is disabled to prevent analog signals from generating noise.
On reset, the digital function is disabled. If the pin is used as an analog input, users should keep the AIO
function disabled for that pin.
Figure 6-30 shows the interaction of the Comparator modules with the rest of the system.
Figure 6-30. Comparator Block Diagram
Table 6-31. Comparator Control Registers
REGISTER
NAME
COMPCTL0x64000x64200x64401YesComparator Control Register
COMPSTS0x64020x64220x64421NoComparator Status Register
DACCTL0x64040x64240x64441YesDAC Control Register
DACVAL0x64060x64260x64461NoDAC Value Register
RAMPMAXREF_
ACTIVE
RAMPMAXREF_
SHDW
RAMPDECVAL_
ACTIVE
RAMPDECVAL_
SHDW
RAMPSTS0x64100x64300x64501NoRamp Generator Status Register
COMP1
ADDRESS
0x64080x64280x64481No
0x640A0x642A0x644A1No
0x640C0x642C0x644C1No
0x640E0x642E0x644E1No
COMP2
ADDRESS
COMP3
ADDRESS
SIZE
(×16)
EALLOW
PROTECTED
DESCRIPTION
Ramp Generator Maximum Reference
(Active) Register
Ramp Generator Maximum Reference
(Shadow) Register
Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero through full
scale. The point used as zero occurs one-half LSB before the first code transition. The full-scale point is
defined as level one-half LSB beyond the last code transition. The deviation is measured from the center
of each particular code to the true straight line between these two points.
Differential Nonlinearity
An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal
value. A differential nonlinearity error of less than ±1 LSB ensures no missing codes.
Zero Offset
The major carry transition should occur when the analog input is at zero volts. Zero error is defined as the
deviation of the actual transition from that point.
Gain Error
The first code transition should occur at an analog value one-half LSB above negative full scale. The last
transition should occur at an analog value one and one-half LSB below the nominal full scale. Gain error is
the deviation of the actual difference between first and last code transitions and the ideal difference
between first and last code transitions.
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Signal-to-Noise Ratio + Distortion (SINAD)
SINAD is the ratio of the rms value of the measured input signal to the rms sum of all other spectral
components below the Nyquist frequency, including harmonics but excluding DC. The value for SINAD is
expressed in decibels.
Effective Number of Bits (ENOB)
For a sine wave, SINAD can be expressed in terms of the number of bits. Using the following
formula,it is possible to get a measure of performance expressed as N, the effective
number of bits. Thus, effective number of bits for a device for sine wave inputs at a given input frequency
can be calculated directly from its measured SINAD.
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of the first nine harmonic components to the rms value of the measured
input signal and is expressed as a percentage or in decibels.
Spurious Free Dynamic Range (SFDR)
SFDR is the difference in dB between the rms amplitude of the input signal and the peak spurious signal.
The device includes the four-pin serial peripheral interface (SPI) module. Up to two SPI modules are
available. The SPI is a high-speed, synchronous serial I/O port that allows a serial bit stream of
programmed length (1 to 16 bits) to be shifted into and out of the device at a programmable bit-transfer
rate. Normally, the SPI is used for communications between the MCU and external peripherals or another
processor. Typical applications include external I/O or peripheral expansion through devices such as shift
registers, display drivers, and ADCs. Multidevice communications are supported by the master/slave
operation of the SPI.
NOTE: All four pins can be used as GPIO if the SPI module is not used.
•Two operational modes: master and slave
Baud rate: 125 different programmable rates.
SPRS698F –NOVEMBER 2010–REVISED MARCH 2016
•Data word length: 1 to 16 data bits
•Four clocking schemes (controlled by clock polarity and clock phase bits) include:
–Falling edge without phase delay: SPICLK active-high. SPI transmits data on the falling edge of the SPICLK
signal and receives data on the rising edge of the SPICLK signal.
–Falling edge with phase delay: SPICLK active-high. SPI transmits data one half-cycle ahead of the falling edge
of the SPICLK signal and receives data on the falling edge of the SPICLK signal.
–Rising edge without phase delay: SPICLK inactive-low. SPI transmits data on the rising edge of the SPICLK
signal and receives data on the falling edge of the SPICLK signal.
–Rising edge with phase delay: SPICLK inactive-low. SPI transmits data one half-cycle ahead of the falling
edge of the SPICLK signal and receives data on the rising edge of the SPICLK signal.
•Simultaneous receive and transmit operation (transmit function can be disabled in software)
•Transmitter and receiver operations are accomplished through either interrupt-driven or polled algorithms.
•Nine SPI module control registers: Located in control register frame beginning at address 7040h.
NOTE
All registers in this module are 16-bit registers that are connected to Peripheral Frame 2.
When a register is accessed, the register data is in the lower byte (7–0), and the upper byte
(15–8) is read as zeros. Writing to the upper byte has no effect.
Enhanced feature:
•4-level transmit/receive FIFO
•Delayed transmit control
•Bi-directional 3 wire SPI mode support
•Audio data receive support through SPISTE inversion