• High-Efficiency 32-Bit CPU (TMS320C28x)
– 90 MHz (11.11-ns Cycle Time)
– 16 × 16 and 32 × 32 Multiply and Accumulate
(MAC) Operations
– 16 × 16 Dual MAC
– Harvard Bus Architecture
– Atomic Operations
– Fast Interrupt Response and Processing
– Unified Memory Programming Model
– Code-Efficient (in C/C++ and Assembly)
• Floating-Point Unit (FPU)
– Native Single-Precision Floating-Point
Operations
• Programmable Control Law Accelerator (CLA)
– 32-Bit Floating-Point Math Accelerator
– Executes Code Independently of the Main CPU
• Viterbi, Complex Math, CRC Unit (VCU)
– Extends C28x Instruction Set to Support
Complex Multiply, Viterbi Operations, and Cyclic
Redundency Check (CRC)
• Embedded Memory
– Up to 256KB of Flash
– Up to 100KB of RAM
– 2KB of One-Time Programmable (OTP) ROM
• 6-Channel Direct Memory Access (DMA)
• Low Device and System Cost
– Single 3.3-V Supply
– No Power Sequencing Requirement
– Integrated Power-on Reset and Brown-out
Reset
– Low-Power Operating Modes
– No Analog Support Pin
• Endianness: Little Endian
• JTAG Boundary Scan Support
– IEEE Standard 1149.1-1990 Standard Test
• 128-Bit Security Key and Lock
– Protects Secure Memory Blocks
– Prevents Reverse-Engineering of Firmware
• Serial Port Peripherals
– Two Serial Communications Interface (SCI)
[UART] Modules
– Two Serial Peripheral Interface (SPI) Modules
– One Inter-Integrated-Circuit (I2C) Bus
– One Multichannel Buffered Serial Port (McBSP)
Bus
– One Enhanced Controller Area Network (eCAN)
– Universal Serial Bus (USB) 2.0
(see Device Comparison Table for Availability)
•Full-Speed Device Mode
•Full-Speed or Low-Speed Host Mode
• Up to 54 Individually Programmable, Multiplexed
General-Purpose Input/Output (GPIO) Pins With
Input Filtering
• Advanced Emulation Features
– Analysis and Breakpoint Functions
– Real-Time Debug Through Hardware
• 2806x Packages
– 80-Pin PFP and 100-Pin PZP PowerPAD™
Thermally Enhanced Thin Quad Flatpacks
(HTQFPs)
– 80-Pin PN and 100-Pin PZ Low-Profile Quad
Flatpacks (LQFPs)
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
The F2806x Piccolo™ family of microcontrollers (MCUs) provides the power of the C28x core and CLA
coupled with highly integrated control peripherals in low pin-count devices. This family is code-compatible
with previous C28x-based code, and also provides a high level of analog integration.
An internal voltage regulator allows for single-rail operation. Enhancements have been made to the HighResolution Pulse Width Modulator (HRPWM) module to allow for dual-edge control (frequency
modulation). Analog comparators with internal 10-bit references have been added and can be routed
directly to control the ePWM outputs. The ADC converts from 0 to 3.3-V fixed full-scale range and
supports ratio-metric V
and latency.
REFHI/VREFLO
references. The ADC interface has been optimized for low overhead
www.ti.com
Device Information
PART NUMBERPACKAGEBODY SIZE
TMS320F28069PZPHTQFP (100)14.0 mm × 14.0 mm
TMS320F28069PFPHTQFP (80)12.0 mm × 12.0 mm
TMS320F28069PZLQFP (100)14.0 mm × 14.0 mm
TMS320F28069PNLQFP (80)12.0 mm × 12.0 mm
(1) For more information on these devices, see Section 9, Mechanical Packaging and Orderable
(1) A type change represents a major functional feature difference in a peripheral module. Within a peripheral type, there may be minor differences between devices that do not affect the
basic functionality of the module. These device-specific differences are listed in the TMS320x28xx, 28xxx DSP Peripheral Reference Guide (SPRU566) and in the peripheral reference
guides.
(2) USB is present on TMS320F2806xU, TMS320F2806xM, and TMS320F2806xF devices.
(3) The "Q" temperature option is not available on the TMS320F2806xU devices.
(4) TMS320F2806xM devices are InstaSPIN-MOTION-enabled MCUs. TMS320F2806xF devices are InstaSPIN-FOC-enabled MCUs. For more information, see Section 8.2 for a list of
InstaSPIN Technical Reference Manuals.
Table 3-1. Device Comparison
FEATURETYPE
(1)
28069
28069U
(2) (3)
28069M
(2) (4)
28069F
(2) (4)
(90 MHz)
28068
28068U
(2) (3)
28068M
(2) (4)
28068F
(2) (4)
(90 MHz)
28067
28067U
(2) (3)
(90 MHz)
28066
28066U
(2) (3)
(90 MHz)
28065
28065U
(2) (3)
(90 MHz)
28064
28064U
(2) (3)
(90 MHz)
28063
28063U
(2) (3)
(90 MHz)
28062
28062U
(2) (3)
28062F
(2) (4)
(90 MHz)
Package Type
(PFP andPZP are PowerPAD HTQFPs.
PN andPZ are LQFPs.)
Figure 4-1 shows the pin assignments on the 80-pin PN and PFP packages. Figure 4-2 shows the pin
assignments on the 100-pin PZ and PZP packages.
SPRS698F –NOVEMBER 2010–REVISED MARCH 2016
A.Pin 19: V
exclusive to one another.
Pin 21: V
REFHI
is always connected to V
REFLO
and ADCINA0 share the same pin on the 80-pin PN and PFP devices and their use is mutually
B.The PowerPAD is not connected to the ground on the die. To facilitate effective heat dissipation, the PowerPAD must
be connected to the ground plane of the PCB. It should not be left unconnected. For more details, see the
PowerPAD™ Thermally Enhanced Package Application Report (SLMA002).
A.The PowerPAD is not connected to the ground on the die. To facilitate effective heat dissipation, the PowerPAD must
be connected to the ground plane of the PCB. It should not be left unconnected. For more details, see the
PowerPAD™ Thermally Enhanced Package Application Report (SLMA002).
Figure 4-2. 100-Pin PZ and PZP Packages (Top View)
Table 4-1 describes the signals. With the exception of the JTAG pins, the GPIO function is the default at
reset, unless otherwise mentioned. The peripheral signals that are listed under them are alternate
functions. Some peripheral functions may not be available in all devices. See Table 3-1 for details. Inputs
are not 5-V tolerant. All GPIO pins are I/O/Z and have an internal pullup (PU), which can be selectively
enabled or disabled on a per-pin basis. This feature only applies to the GPIO pins. The pullups on the
PWM pins are not enabled at reset. The pullups on other GPIO pins are enabled upon reset. The AIO pins
do not have an internal pullup.
When the on-chip voltage regulator (VREG) is used, the GPIO19, GPIO26–27, and
GPIO34–38 pins could glitch during power up. If this is unacceptable in an application, 1.8 V
could be supplied externally. There is no power-sequencing requirement when using an
external 1.8-V supply. However, if the 3.3-V transistors in the level-shifting output buffers of
the I/O pins are powered before the 1.9-V transistors, it is possible for the output buffers to
turn on, causing a glitch to occur on the pin during power up. To avoid this behavior, power
the VDDpins before or simultaneously with the V
reached 0.7 V before the V
TCKSee GPIO38ISee GPIO38. JTAG test clock with internal pullup. (↑)
TMSSee GPIO36I
TDISee GPIO35I
TDOSee GPIO37O/Z
V
DD3VFL
TEST24536I/OTest Pin. Reserved for TI. Must be left unconnected.
PZ
PZP
46373.3-V Flash Core Power Pin. This pin should be connected to 3.3 V at all times.
PN
PFP
I/O/ZDESCRIPTION
JTAG
JTAG test reset with internal pulldown (PD). TRST, when driven high, gives the scan
system control of the operations of the device. If this signal is not connected or driven
low, the device operates in its functional mode, and the test reset signals are ignored.
NOTE: TRST is an active-high test pin and must be maintained low at all times during
normal device operation. An external pulldown resistor is required on this pin. The
value of this resistor should be based on drive strength of the debugger pods
applicable to the design. A 2.2-kΩ resistor generally offers adequate protection.
Because this is application-specific, TI recommends validating each target board for
proper operation of the debugger and the application. (↓)
See GPIO36. JTAG test-mode select (TMS) with internal pullup. This serial control
input is clocked into the TAP controller on the rising edge of TCK. (↑)
See GPIO35. JTAG test data input (TDI) with internal pullup. TDI is clocked into the
selected register (instruction or data) on a rising edge of TCK. (↑)
See GPIO37. JTAG scan out, test data output (TDO). The contents of the selected
register (instruction or data) are shifted out of TDO on the falling edge of TCK.
(8-mA drive)
ADCINA716–IADC Group A, Channel 7 input
ADCINA6
COMP3AIComparator Input 3A
AIO6I/ODigital AIO 6
ADCINA51815IADC Group A, Channel 5 input
ADCINA4
COMP2AIComparator Input 2A
AIO4I/ODigital AIO 4
ADCINA320–IADC Group A, Channel 3 input
ADCINA2
COMP1AIComparator Input 1A
AIO2I/ODigital AIO 2
ADCINA12218IADC Group A, Channel 1 input
ADCINA02319I
PZ
PZP
See GPIO19 and
1714
1916
2117
PN
PFP
GPIO38
I/O/ZDESCRIPTION
CLOCK
See GPIO18. Output clock derived from SYSCLKOUT. XCLKOUT is either the same
frequency, one-half the frequency, or one-fourth the frequency of SYSCLKOUT. This is
controlled by bits 1:0 (XCLKOUTDIV) in the XCLK register. At reset, XCLKOUT =
SYSCLKOUT/4. The XCLKOUT signal can be turned off by setting XCLKOUTDIV to 3.
The mux control for GPIO18 must also be set to XCLKOUT for this signal to propogate
to the pin.
See GPIO19 and GPIO38. External oscillator input. Pin source for the clock is
controlled by the XCLKINSEL bit in the XCLK register, GPIO38 is the default selection.
This pin feeds a clock from an external 3.3-V oscillator. In this case, the X1 pin, if
available, must be tied to GND and the on-chip crystal oscillator must be disabled
through bit 14 in the CLKCTL register. If a crystal or resonator is used, the XCLKIN
I
path must be disabled by bit 13 in the CLKCTL register.
NOTE: Designs that use the GPIO38/XCLKIN/TCK pin to supply an external clock for
normal device operation may need to incorporate some hooks to disable this path
during debug using the JTAG connector. This is to prevent contention with the TCK
signal, which is active during JTAG debug sessions. The zero-pin internal oscillators
may be used during this time to clock the device.
On-chip 1.8-V crystal-oscillator input. To use this oscillator, a quartz crystal or a
ceramic resonator must be connected across X1 and X2. In this case, the XCLKIN path
must be disabled by bit 13 in the CLKCTL register. If this pin is not used, it must be tied
to GND.
On-chip crystal-oscillator output. A quartz crystal or a ceramic resonator must be
connected across X1 and X2. If X2 is not used, it must be left unconnected.
RESET
Device Reset (in) and Watchdog Reset (out). Piccolo devices have a built-in power-on
reset (POR) and brown-out reset (BOR) circuitry. During a power-on or brown-out
condition, this pin is driven low by the device. An external circuit may also drive this pin
to assert a device reset. This pin is also driven low by the MCU when a watchdog reset
occurs. During watchdog reset, the XRS pin is driven low for the watchdog reset
duration of 512 OSCCLK cycles. A resistor between 2.2 kΩ and 10 kΩ should be
placed between XRS and V
noise filtering, it should be 100 nF or smaller. These values will allow the watchdog to
properly drive the XRS pin to VOLwithin 512 OSCCLK cycles when the watchdog reset
is asserted. Regardless of the source, a device reset causes the device to terminate
execution. The program counter points to the address contained at the location
0x3F FFC0. When reset is deactivated, execution begins at the location designated by
the program counter. The output buffer of this pin is an open-drain with an internal
pullup. (↑)
ADC, COMPARATOR, ANALOG I/O
IADC Group A, Channel 6 input
IADC Group A, Channel 4 input
IADC Group A, Channel 2 input
ADC Group A, Channel 0 input.
NOTE: V
and their use is mutually exclusive to one another.
and ADCINA0 share the same pin on the 80-pin PN and PFP devices
AIO10I/ODigital AIO 10
ADCINB12923IADC Group B, Channel 1 input
ADCINB02822IADC Group B, Channel 0 input
V
REFLO
2721
ADC External Reference Low.
NOTE: V
is always connected to V
REFLO
CPU AND I/O POWER
V
DDA
V
SSA
2520Analog Power Pin. Tie with a 2.2-μF capacitor (typical) close to the pin.
2621
Analog Ground Pin.
NOTE: V
is always connected to V
REFLO
32
1412
V
DD
3729
6351
CPU and Logic Digital Power Pins. When using internal VREG, place one 1.2-µF
capacitor between each VDDpin and ground. Higher value capacitors may be used.
8165
9172
54
1311
V
DDIO
3830
6149
Digital I/O and Flash Power Pin. Single supply source when VREG is enabled. Place a
2.2-uF decoupling capacitor on each pin. The exact value of the total decoupling
capacitance should be determined by the system voltage regulation solution.
MCLKRAI/OMcBSP receive clock
SCITXDBOSCI-B transmit data
EPWM7AOEnhanced PWM7 output A and HRPWM channel
(1) I = Input, O = Output, Z = High Impedance, OD = Open Drain, ↑ = Pullup, ↓ = Pulldown
(2) The GPIO function (shown in bold italics) is the default at reset. The peripheral signals that are listed under them are alternate functions.
For JTAG pins that have the GPIO functionality multiplexed, the input path to the GPIO block is always valid. The output path from the
GPIO block and the path to the JTAG block from a pin is enabled or disabled based on the condition of the TRST signal. See the
Systems Control and Interrupts chapter of the TMS320x2806x Piccolo Technical Reference Manual (SPRUH18).
(3) Depending on your USB application, additional pins may be required to maintain compliance with the USB 2.0 Specification. For more
information, see the Universal Serial Bus (USB) Controller chapter of the TMS320x2806x Piccolo Technical Reference Manual
(SPRUH18).
over operating free-air temperature range (unless otherwise noted)
MINMAXUNIT
V
(I/O and Flash) with respect to V
Supply voltage
Analog voltageV
Input voltage
Output voltageV
DDIO
VDDwith respect to V
with respect to V
DDA
VIN(3.3 V)–0.34.6
VIN(X1)–0.32.5
O
Input clamp currentIIK(VIN< 0 or VIN> V
Output clamp currentIOK(VO< 0 or VO> V
Junction temperature
Storage temperature
(4)
(4)
T
J
T
stg
SS
SS
SSA
(3)
)
DDIO
)–2020mA
DDIO
–0.34.6
–0.32.5
–0.34.6V
–0.34.6V
–2020mA
–40150°C
–65150°C
V
V
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Section 5.4 is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) Continuous clamp current per pin is ±2 mA.
(4) Long-term high-temperature storage or extended use at maximum temperature conditions may result in a reduction of overall device life.
For additional information, see the IC Package Thermal Metrics Application Report (SPRA953).
5.2ESD Ratings for TMS320F2806xU
VALUEUNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001
V
(ESD)
Electrostatic discharge (ESD)
Charged-device model (CDM), per JEDEC specification JESD22-
(2)
C101
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1)
±2000
±500
V
5.3ESD Ratings for TMS320F2806x, TMS320F2806xM, and TMS320F2806xF
TMS320F2806x, TMS320F2806xM, and TMS320F2806xF in 100-pin PZ and PZP packages
V
(ESD)
TMS320F2806x, TMS320F2806xM, and TMS320F2806xF in 80-pin PN and PFP packages
V
(ESD)
(1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(1) Group 2 pins are as follows: GPIO16, GPIO17, GPIO18, GPIO19, GPIO28, GPIO29, GPIO36, GPIO37.
(2) The "Q" temperature option is not available on the 2806xU devices.
2.973.33.63V
1.711.81.995
0V
2.973.33.63V
0V
+ 0.3V
DDIO
–8
mA
mA
8
–40125
V
°C
°C
5.5Electrical Characteristics
(1)
over recommended operating conditions (unless otherwise noted)
PARAMETERTEST CONDITIONSMINTYPMAX UNIT
V
OH
V
OL
High-level output voltage
Low-level output voltageIOL= IOLMAX0.4V
Pin with pullup
I
IL
Input current
(low level)
enabled
Pin with pulldown
enabled
Pin with pullup
I
IH
Input current
(high level)
enabled
Pin with pulldown
enabled
I
OZ
C
I
Output current, pullup or
pulldown disabled
Input capacitance2pF
V
BOR trip pointFalling V
DDIO
V
BOR hysteresis35mV
DDIO
Supervisor reset release delay
time
VREG VDDoutputInternal VREG on1.9V
(1) When the on-chip VREG is used, its output is monitored by the POR/BOR circuit, which will reset the device should the core voltage
(VDD) go out of range.
IOH= IOHMAX2.4
IOH= 50 μAV
V
= 3.3 V, VIN= 0 V
DDIO
V
= 3.3 V, VIN= 0 V±2
DDIO
V
= 3.3 V, VIN= V
DDIO
V
= 3.3 V, VIN= V
DDIO
VO= V
DDIO
or 0 V±2μA
DDIO
DDIO
DDIO
All GPIO–80–140–205
XRS pin–230–300–375
Time after BOR/POR/OVR event is removed to XRS
release
(3) The TYP numbers are applicable over room temperature and nominal voltage.
(4) The following is done in a loop:
• Data is continuously transmitted out of SPI-A, SPI-B, SCI-A, eCAN-A, McBSP-A, and I2C ports.
• The hardware multiplier is exercised.
• Watchdog is reset.
• ADC is performing continuous conversion.
• COMP1 and COMP2 are continuously switching voltages.
• GPIO17 is toggled.
(5) CLA is continuously performing polynomial calculations.
(6) For F2806x devices that do not have CLA, subtract the IDDcurrent number for CLA (see Table 5-2) from the IDD(VREG disabled)/I
(VREG enabled) current numbers shown in Table 5-1 for operational mode.
(7) If a quartz crystal or ceramic resonator is used as the clock source, the HALT mode shuts down the on-chip crystal oscillator.
(8) To realize the IDDnumber shown for HALT mode, the following must be done:
• PLL2 must be shut down by clearing bit 2 of the PLLCTL register.
• A value of 0x00FF must be written to address 0x6822.
The peripheral - I/O multiplexing implemented in the device prevents all available peripherals
from being used at the same time. This is because more than one peripheral function may
share an I/O pin. It is, however, possible to turn on the clocks to all the peripherals at the
same time, although such a configuration is not useful. If this is done, the current drawn by
the device will be more than the numbers specified in the current consumption tables.
The 2806x devices incorporate a method to reduce the device current consumption. Since each peripheral
unit has an individual clock-enable bit, significant reduction in current consumption can be achieved by
turning off the clock to any peripheral module that is not used in a given application. Furthermore, any one
of the three low-power modes could be taken advantage of to reduce the current consumption even
further. Table 5-2 indicates the typical reduction in current consumption achieved by turning off the clocks.
(1) All peripheral clocks (except CPU Timer clock) are disabled upon
reset. Writing to or reading from peripheral registers is possible only
after the peripheral clocks are turned on.
(2) For peripherals with multiple instances, the current quoted is per
module. For example, the 2 mA value quoted for ePWM is for one
ePWM module.
(3) This number represents the current drawn by the digital portion of
the ADC module. Turning off the clock to the ADC module results in
the elimination of the current drawn by the analog portion of the ADC
(I
) as well.
DDA
(2)
ADC2
I2C3
ePWM2
eCAP2
eQEP2
SCI2
SPI2
HRPWM3
HRCAP3
USB12
CAN2.5
CLA20
McBSP6
(1)
IDDCURRENT
REDUCTION (mA)
(3)
I
current consumption is reduced by 15 mA (typical) when XCLKOUT is turned off.
DDIO
The baseline IDDcurrent (current when the core is executing a dummy loop with no
peripherals enabled) is 40 mA, typical. To arrive at the IDDcurrent for a given application, the
current-drawn by the peripherals (enabled by that application) must be added to the baseline
IDDcurrent.
Following are other methods to reduce power consumption further:
•The flash module may be powered down if code is run off SARAM. This results in a current reduction
of 18 mA (typical) in the VDDrail and 13 mA (typical) in the V
•Savings in I
may be realized by disabling the pullups on pins that assume an output function.
DDIO
5.6.2Current Consumption Graphs (VREG Enabled)
DDIO
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rail.
Figure 5-1. Typical Operational Current Versus Frequency
Figure 5-2. Typical Operational Power Versus Frequency
Based on the end application design and operational profile, the IDDand I
Systems that exceed the recommended maximum power dissipation in the end product may require
additional thermal enhancements. Ambient temperature (TA) varies with the end application and product
design. The critical factor that affects reliability and functionality is TJ, the junction temperature, not the
ambient temperature. Hence, care should be taken to keep TJwithin the specified limits. T
measured to estimate the operating junction temperature TJ. T
is normally measured at the center of
case
the package top-side surface. The thermal application report IC Package Thermal Metrics (SPRA953)
helps to understand the thermal metrics and definitions.
5.9Emulator Connection Without Signal Buffering for the MCU
Figure 5-3 shows the connection between the MCU and JTAG header for a single-processor configuration.
If the distance between the JTAG header and the MCU is greater than 6 inches, the emulation signals
must be buffered. If the distance is less than 6 inches, buffering is typically not needed. Figure 5-3 shows
the simpler, no-buffering situation. For the pullup and pulldown resistor values, see Section 4.2.
currents could vary.
DDIO
case
should be
A.See Figure 6-54 for JTAG/GPIO multiplexing.
Figure 5-3. Emulator Connection Without Signal Buffering for the MCU
The 2806x devices do not have EMU0/EMU1 pins. For designs that have a JTAG Header
onboard, the EMU0/EMU1 pins on the header must be tied to V
(typical) resistor.
Timing parameter symbols used are created in accordance with JEDEC Standard 100. To shorten the
symbols, some of the pin names and other related terminology have been abbreviated as follows:
LOWERCASE SUBSCRIPTS AND THEIR MEANINGS:LETTERS AND SYMBOLS AND THEIR MEANINGS:
aaccess timeHHigh
ccycle time (period)LLow
ddelay timeVValid
ffall timeXUnknown, changing, or don't care level
hhold timeZHigh impedance
rrise time
susetup time
ttransition time
vvalid time
wpulse duration (width)
5.10.2 General Notes on Timing Parameters
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All output signals from the 28x devices (including XCLKOUT) are derived from an internal clock such that
all output transitions for a given half-cycle occur with a minimum of skewing relative to each other.
The signal combinations shown in the following timing diagrams may not necessarily represent actual
cycles. For actual cycle examples, see the appropriate cycle description section of this document.
5.11 Test Load Circuit
This test load circuit is used to measure all switching characteristics provided in this document.
A.Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the
device pin.
B.The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its
transmission line effects must be taken into account. A transmission line with a delay of 2 ns or longer can be used to
produce the desired transmission line effect. The transmission line is intended as a load only. It is not necessary to
add or subtract the transmission line delay (2 ns or longer) from the data sheet timing.
GPIO pins as input [state depends on internal pullup/pulldown (PU/PD)]
User-code dependent
(E)
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5.12 Power Sequencing
There is no power sequencing requirement needed to ensure the device is in the proper state after reset
or to prevent the I/Os from glitching during power up or power down (GPIO19, GPIO26–27, GPIO34–38
do not have glitch-free I/Os). No voltage larger than a diode drop (0.7 V) above V
any digital pin before powering up the device. Voltages applied to pins on an unpowered device can bias
internal p-n junctions in unintended ways and produce unpredictable results.
A.Upon power up, SYSCLKOUT is OSCCLK/4. Since the XCLKOUTDIV bits in the XCLK register come up with a reset
state of 0, SYSCLKOUT is further divided by 4 before it appears at XCLKOUT. XCLKOUT = OSCCLK/16 during this
phase.
B.Boot ROM configures the DIVSEL bits for /1 operation. XCLKOUT = OSCCLK/4 during this phase. Note that
XCLKOUT will not be visible at the pin until explicitly configured by user code.
C.After reset, the boot ROM code samples Boot Mode pins. Based on the status of the Boot Mode pin, the boot code
branches to destination memory or boot code function. If boot ROM code executes after power-on conditions (in
debugger environment), the boot code execution time is based on the current SYSCLKOUT speed. The SYSCLKOUT
will be based on user environment and could be with or without PLL enabled.
D.Using the XRS pin is optional due to the on-chip POR circuitry.
E.The internal pullup or pulldown will take effect when BOR is driven high.
Hold time for boot-mode pins1000t
Pulse duration, XRS low on warm reset32t
Table 5-4. Reset (XRS) Switching Characteristics
over recommended operating conditions (unless otherwise noted)
PARAMETERMINTYPMAXUNIT
t
w(RSL1)
t
w(WDRS)
t
d(EX)
t
INTOSCST
(1)
t
OSCST
(1) Dependent on crystal/resonator and board design.
Pulse duration, XRS driven by device600μs
Pulse duration, reset pulse generated by watchdog512t
Delay time, address/data valid after XRS high32t
Start up time, internal zero-pin oscillator3μs
On-chip crystal-oscillator start-up time110ms
c(OSCCLK)
c(OSCCLK)
c(OSCCLK)
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MINMAXUNIT
c(SCO)
cycles
cycles
cycles
cycles
A.After reset, the Boot ROM code samples BOOT Mode pins. Based on the status of the Boot Mode pin, the boot code
branches to destination memory or boot code function. If Boot ROM code executes after power-on conditions (in
debugger environment), the Boot code execution time is based on the current SYSCLKOUT speed. The
SYSCLKOUT will be based on user environment and could be with or without PLL enabled.