recovery current to compete with GaAs devices.
Allows downsizing of mosfet and heatsinks.
■
Internal ceramic insulated devices with equal
thermal conditions for both 300V diodes.
■ Insulation (2500V RMS) allows placement on
sameheatsinkasmosfetandflexible
heatsinking on common or separate heatsink.
■
Matched diodes for typical PFC application
without need for voltage balance network.
■
C = 7pF
STTH1506TPI
Tandem 600V Hyperfast Rectifer
12
DESCRIPTION
The TURBOSWITCH “H” is an ultra high
performance diodecomposedof two300V dicein
series. TURBOSWITCH “H” family drastically cuts
losses in the associated MOSFET when run at
F
/dt.
high dI
3
1
2
(insulated)
3
TOP3I
ABSOLUTE RATINGS (limiting values for both diodes in series)
SymbolParameterValueUnit
V
RRM
I
F(RMS)
I
FSM
T
stg
Tj
TM: TURBOSWITCH is a trademark of STMicroelectronics
May 2002 - Ed: 1A
Repetitive peak reverse voltage
RMS forward current
Surge non repetitive forward currenttp = 10 ms sinusoidal
Storage temperature range
Maximum operating junction temperature
600V
26A
130A
-65 +150°C
+ 150°C
1/5
STTH1506TPI
THERMAL AND POWER DATA
SymbolParameterTest conditionsValueUnit
R
R
R
th (j-c)
th (c)
th (j-c)
P
Junction to casePer diode
Junction to caseTotal
1
Conduction power dissipation for
both diodes
Coupling
I
=15A δ= 0.5
F(AV)
Tc = 70°C
STATIC ELECTRICAL CHARACTERISTICS (for both diodes)
SymbolParameterTests ConditionsMin.Typ.Max.Unit
2.9°C/W
0.3
1.6
50W
*
I
R
Reverse leakage current
V
**
F
Pulse test: * tp = 5ms, δ <2%
Forward voltage dropI
** tp = 380µs, δ <2%
V
R=VRRM
Tj = 25°C
Tj = 125°C
= 15ATj=25°C
F
Tj = 125°C
30200
2.12.6
20µA
3.6V
To evaluate the maximum conduction losses use the following equation:
P=1.8xI
F(AV)
+ 0.053 x I
F2(RMS)
RECOVERY CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
trr
Reverse recovery
time
= 0.5 A Irr = 0.25A
I
F
IR=1A
I
=1A dIF/dt = - 50A/µs
F
Tj = 25°C
16ns
35
VR=30V
S
I
RM
factor
Reverse recovery
current
VR= 400 V IF=15A
dIF/dt = -200 A/µs
Tj = 125°C
4.86.0A
0.4-
TURN-ON SWITCHING CHARACTERISTICS
SymbolParameterTests ConditionsMin.Typ.Max.Unit
tfr
Forward
recovery time
V
FP
Forward
=15A dIF/dt = 100A/µs,
I
F
Tj = 25°C
VFR=1.1xVFmax
IF=15A dIF/dt = 100 A/µsTj = 25°C
200ns
6V
recovery voltage
2/5
STTH1506TPI
Fig.1: Conduction losses versus averagecurrent.
P(W)
55
50
45
40
δ = 0.05
δ = 0.1
δ = 0.2
δ = 0.5
δ = 1
35
30
25
20
15
T
10
5
IF(AV)(A)
0
δ
=tp/T
tp
02468101214161820
Fig. 3: Relative variation of thermal impedance
junction to case versus pulse duration.
Zth(j-c)/Rth(j-c)
1.0
0.9
0.8
0.7
δ = 0.5
0.6
0.5
δ = 0.2
0.4
δ = 0.1
0.3
0.2
Single pulse
0.1
tp(s)
0.0
1.E-031.E-021.E-011.E+00
δ
=tp/T
T
tp
Fig. 2: Forward voltage drop versus forward
current.
IFM(A)
130
120
110
100
T=125°C
j
90
80
Tj=125°C
(Maximum values)
(Maximum values)
70
T=125°C
60
50
j
(Typical values)
40
T=25°C
30
20
10
VFM(V)
j
(Maximum values)
0
012345678
Fig.4: Peak reverserecovery current versus dIF/dt
(90% confidence).
IRM(A)
22
V =400V
R
20
j
T=125°C
18
16
14
12
10
I =0.5 x IFF(AV)
I =0.25 x IFF(AV)
I=IF F(AV)
8
6
4
2
0
dIF/dt(A/µs)
02004006008001000
I =2 x IF F(AV)
Fig. 5: Reverse recovery time versus dIF/dt (90%
confidence).
trr(ns)
100
90
80
70
60
50
I =2 x IF F(AV)
40
30
I=IF F(AV)
20
10
I =0.5 x IFF(AV)
dIF/dt(A/µs)
0
02004006008001000
V =400V
R
j
T=125°C
Fig. 6: Reverse recovery charges versus dIF/dt
(90% confidence).
Qrr(nC)
350
V =400V
R
j
T=125°C
300
250
200
150
100
50
0
02004006008001000
I =2 x IF F(AV)
I=IF F(AV)
I =0.5 x IFF(AV)
dIF/dt(A/µs)
3/5
STTH1506TPI
Fig. 7: Softness factor versus dIF/dt (typical
values).
S factor
0.80
I=I
F F(AV)
R
V =400V
j
T=125°C
0.70
0.60
0.50
0.40
0.30
0.20
02004006008001000
dIF/dt(A/µs)
Fig. 9: Transient peak forward voltage versus
/dt (90% confidence).
dI
F
VFP(V)
16
I=I
F F(AV)
j
T=125°C
14
12
10
8
6
4
2
0
050100150200250300350400450500
dIF/dt(A/µs)
Fig. 8: Relative variations of dynamic parameters
versus junction temperature.
2.50
2.25
2.00
1.75
1.50
1.25
1.00
0.75
0.50
0.25
0.00
255075100125
S factor
IRM
Tj(°C)
I=I
F F(AV)
R
V =400V
j
Reference:T =125°C
Fig. 10: Forward recovery time versus dIF/dt (90%
confidence).
tfr(ns)
400
350
300
250
200
150
100
50
0
0100200300400500
dIF/dt(A/µs)
I=I
F F(AV)
FRF
V =1.1 x V max.
j
T=125°C
Fig. 11: Junction capacitance versus reverse
voltage applied (typical values).
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