If TX power is low, turn on transmitter in local mode using Phoenix. Check:
1Current (0.7 - 1 A for max power, mode and channel dependent),
2Perform visual inspection of PWB under microscope to check proper placement,
rotation, and soldering of components.
3Look for presence of TX signal on spectrum analyzer at the correct frequency. If
signal is not on frequency, check in 100 MHz span. If signal is present but off frequency, check synthesizer. If signal is not present, or present but low in amplitude, use probing Tables 1 through 7 to determine where in the chain the fault
occurs, with AGC PDMs set for known transmit power as listed in Table 1.
4Check that AGC PDMs are set for desired TX power according to Table 1 and
ensure AGC voltages are correct.
5According to Tables 2 and 3 (cell/AMPs), check the LOs for proper frequency and
amplitude.
6Ensure power supplies to transmitter have correct voltage, as per Table 13.
Check initial current consumption at start-up to make sure phone is consuming correct
amount of current.
Explanation of Result
Phones current consumption is measured and should be between 5mA and 100 mA.
Manual Verification
Check using Power Supply and Multimeter, example follows. Power Off phone and follow
setup below to verify if phone’s current consumption is correct.
1Positive Banana connector on Test Fixture to Power Supply +
2Ground Banana connector on Test Fixture to | on Multimeter
3Jumper cable between Power Supply (-) and Multimeter (input low)
4Set Multimeter to measure current (DC|)
5Multimeter should have an initial reading, this is the current being drawn by the
6Place phone in Test Fixture
7Press Power key to turn phone on
8Observe current draw at Multimeter. It should be between 5.0mA and 100.0mA.
Troubleshooting
If phone drains all available current:
Check VBAT and do a visual inspection of all baseband ICs including orientation. VBAT
supplies the D200 (UEM), N603 (Tomcat), N801 (PA), X101, N100, B302, M300, N300,
and X470.
Text Fixture. Null out the Multimeter to Zero the reading.
If the phone has initial current consumption at start-up then powers down:
If, after a few seconds, all circuits power down, it is normally caused because the watchdog signal between UEM (200) and UPP (D400) has expired. Watchdog is used by the
phone for fault detection.
•Check voltage regulators for correct voltage. If voltage is low or not
present, check for shorts.
The purpose of this test is to verify that the phone software was downloaded at panel
flash. If download was not successful, phone will try and flash for a second time.
Explanation of Result
Pass or Fail
Manual Verification
Manual flashing using Prommer Box and Phoenix at bench.
1Make sure correct connection is configured at FPS-8. First, set up FPS-8 with
serial (AXS-4) and parallel cables. Next, power up box with 6-volt supply and
place communication cable XCS-4 between FPS-8 and Flash Adapter (FLA-44),
FLAL Fixture MJS-82, or JBV-1 (with adapter MJF-28).
2Make sure that Phoenix’s connection is correct. In Phoenix, select File>Manage
Connections>Add>Mode to manual>Media to FBUS>Port NUM 1 or 2 (this is
dependent on Local PC com port selection)>Bit Rate to
115200>COMBOXDEF_MEDIA to FBUS; then Apply.
3Check that Prommer Box FPS-8 is correctly configured. In Phoenix, go to Flash-
ing>FPS-8/FPS-8C Maintenance. Make sure current version is A2.10.
4Next, try and flash phone using correct SW version. In Phoenix: Flashing>FPS-8
Flash>Press Flash. Next select OK from pop-up screen. Under next screen, Flash
File Selection, choose Image File “set”. In correct directory where you store your
flash files (usually programs, then Nokia, Phoenix, Flash) select correct Flash SW
xxxxxxx.nep (if not sure what correct SW to use, file name should match SW in a
known good phone. To check this, take good phone in Phoenix and go Product>Phone Information and check MCU SW Version). Once correct SW file is
found, select OK. You will be prompted to save settings, select “yes”. Flashing
should begin at this point. For first time, set up of prommer this could take a few
minutes due to PC loading file to prommer RAM first. After first use, prommer
stores this in internal RAM and should proceed faster with subsequent phones
downloading of flash software. If phone passes, then more than likely a false fail.
If phone fails, read prommer failure code and use Code Sheet in TS.
Troubleshooting
Make sure phone has PSN and SW version is correct by checking Phone Information. Reference the following guides to TS flash problem: Haukka BB Operation doc, Prommer
Codes, and Flash Block Diagram.
Test 5 ST DBUS
Description
The purpose of this test is to verify that the connections between the DSP inside the UPP
and the UEM, via the DBUS, are intact. The DSP will write an arbitrary value to DBUS
General Control register in UEM; then DSP will read DBUS from General Control register
in UEM and valid repeatability.
Explanation of Result
Pass or Fail
Manual Verification
In Phoenix, put phone in Local Mode. Next, BB Self Tests - select ST_UEM_DBUS_TEST,
then Run.
Troubleshooting
Connections tested at UPP: DBUSDA (pad L3) check test point J414, DBUSCLK (pad K3)
check test point J413, DBUSEN1X (pad J3) check test point J415. At UEM: DBUSDA (pad
A11), DBUSCLK (pad D10), and DBUSENX (pad B10). Bus interface name is RFCONVCTRL(2:0).
Test 6 ST CBUS
Description
The purpose of this test is to verify that the connections between the MCU inside the
UPP and the UEM, via the CBUS, are intact. The MCU will read CBusADCR register and
verify UEM chip version is valid.
In Phoenix, put phone in Local Mode; next, BB Self Tests - select ST_UEM_CBUS_IF_TEST,
then Run.
Troubleshooting
Connections tested at UPP: CBUSDA (pad G2) check test point J407, CBUSCLK (padG1)
check test point J406, CBUSENX (pad F3) check test point J408. At UEM: CBUSDA (pad
B7), CBUSCLK (pad A8), and CBUSENX (pad C8). Bus interface name is AUDUEMCTRL
(3:0).
Test 7 ST Aux DA
Description
The purpose of this test is to verify the AUXD and UEMINT data connections between the
UPP and the UEM are intact. MCU will set the UEM looptest mode by programming the
Loop Test bit in the CBUS General Control 2 register. Next, DSP will write a word to AuxD
register, thus causing a rising edge on the AuxD line. MCU will verify that UEMInt occurs.
Explanation of Result
Pass or Fail
Manual Verification
In Phoenix, put phone in Local Mode; next BB Self Tests - select
ST_AUX_DA_LOOP_TEST; then Run.
Troubleshooting
Connections tested: 1) UPP: AUXDA (pad L2) via bus interface RFCONVDA(5) to UEM:
AUXDA (pad D11). 2) UPP: UEMINT (pad J2) check test point J405, via bus interface
AUDUEMCTRL(0) to UEM; UEMINT (pad A10).
Test 8 ST EAR Data
Description
The purpose of this test is to verify the EAR and MIC data connections between the UPP
and the UEM are intact. MCU will set the UEM looptest mode by programming the Loop
Test bit in the CBUS General Control 2 register. Next, DSP will write an arbitrary pattern
to CodexRx register and then read the data from the Codec Tx register.
Explanation of Result
Pass or Fail
Manual Verification
In Phoenix, put phone in Local Mode. Next, BB Self Tests - select
Connections tested at UPP: EARDATA (pad B6), MICDATA (pad A6), and at UEM: EARDATA
(pad E2), MICDATA (pad F2). Bus interface name is AUDIODATA (1:0).
Test 9 ST SleeepX
Description
The purpose of this test is to verify the Sleep connection between the UPP and the UEM
is intact. This function tests the connection of pin_out and pin_in signals between UPP
and UEM. The result depends on functionality of UEM loopback modes and condition of
signal lines. The MCU will set UEM in looptest mode by programming via CBUS. MCU will
then read sleep clock counter registers and store value. MCU then toggles SleepX signal
High then Low and reads counters again. Expected value is 1 higher than previous count.
Explanation of Result
Pass or Fail
Manual Verification
In Phoenix, put phone in Local Mode. Next, BB Self Tests - select
ST_SLEEP_X_LOOP_TEST, then Run.
Troubleshooting
Connections tested are CBUS see Test 6, Sleepclock (J404) at UEM (D9) to UPP (H3).
SleepX (J403) at UEM (pad B11) from UPP (pad L1). Bus interface between UPP and UEM
is PUSL (2:0). Check also at UEM the OSCCAP (C234).
Test 10 ST TX / DP
Description
To verify that the Tx/Rx | lines between UPP and UEM are intact. MCU will set UEM into
Looptest mode by programming the Loop Test bit via CBUS General Control 2 register.
DSP will set Parallel-series bypass switches for both Rx and Tx in the MFI block of the
UPP by programming the TxBypass and RxBypass bits in the MFI Control Register. DSP
will write arbitrary value to TxRam of MFI, then DSP will read this data from RxRAM of
the MFI.
Explanation of Result
Pass or Fail
Manual Verification
In Phoenix, put phone in Local Mode. Next, BB Self Tests - select ST_TX_IDP_LOOP_TEST,
then Run.
Troubleshooting
Connections tested are CBUS see Test 6, Connections tested at UPP: RXID (pad L4), TXID
(pad M2) and at UEM: RXID (pad C11), TXID (pad A12). Bus interface name is RFCONVDA
(5:0).
Test 11 ST TX Q DP
Description
To verify that the Tx/Rx Q lines between UPP and UEM are intact.
Explanation of Result
Pass or Fail
Manual Verification
In Phoenix, put phone in Local Mode. Next, BB Self Tests - select
ST_TX_IQ_DP_LOOP_TEST, then Run.
Troubleshooting
Connections tested are CBUS see Test 7. Connections tested at UPP: RXQD (pad N4),
TXQD (pad N2), and at UEM: RXQD (pad A14), TXQD (pad B12). Bus interface name is
RFCONVDA (5:0).
Test 12 ST MIF Loopback
Description
The purpose of this test is to verify that the Tx/Rx IQ paths inside the MFI block of the
UPP are intact. DSP will swt IQSTWrap in MFI Control Register. Next, DSP will set six of
the TX and Rx buffers to be the same. Sets Serial-Parallel bypass switches On. DSP will
write a varying pattern to both halves of the Tx buffer, then read Rx buffer and verify
data written is data received.
NOTE: This test does not test the connectivity between any two points in the HW (nodes
inside of a chip do not qualify for connectivity). This test ascertains the cause of the UEM
IQ Loopback Selftest failure, and determines whether the UPP or the UEM or the connection between them caused the UEM IQ to Loopback Selftest fail.
Explanation of Result
Pass or Fail
Manual Verification
In Phoenix, put phone in Local mode: Next, BB Self Tests - select
ST_MFI_IQ_LOOPBACK_TEST, then Run.
Troubleshooting
Connections tested are UPP only. If this test passes and Test 11 fails, then the problem is
in UEM. If both Test 11 and Test 12 fail, the problem is in UPP.
The purpose of this test is to verify connections from 32kHz oscillator to the UEM, then
from UEM to SleepClk to the UPP. Also tested is AFCOUT of the UEM to the VCTCXO, and
from VCTCXO to RF clock to UPP are intact. UPP sets AFCR for UEM to set AFCOUT to mid
range. Next, DSP will measure how many 19.2MHz clock cycles are present in 1024
cycles of the 32kHz clock. Next, AFCOUT is set to maximum value by writing to AFCR in
UEM. Again measurement is taken as previously mentioned. The two measurements are
subtracted. Then, AFCOUT is set to minimum value and again measured and compared to
mid-value results. Expected values are validated by pass or fail.
Explanation of Result
Pass or Fail
Manual Verification
In Phoenix, put phone in Local Mode. Next, BB Self Tests - select
ST_APOLL_SLEEP_CLK_TEST, then Run.
Troubleshooting
Connections tested are DBUS (see Test 5), VCTCXO circuit including AFC control voltage
from UEM, Sleepclock at UEM, and also RFCLK to UPP via V500 and C524. Check also at
UEM the OSCCAP (C234).
Test 14 ST Batman VHFPLL
Description
This is one of the phone’s self tests which gives either a pass or fail result only. The VHF
PLL is inside the Batman IC. The phone checks the VHFPLL’s lock detect bit. If this bit
indicates that the PLL is unlocked, the test will fail.
Explanation of Result
Pass or Fail
Manual Verification
Turn on the Cell receiver to any channel and probe at C702 (probing point TP49 in
Table 10 using an RF probe connected to a spectrum analyzer tuned to 256.2MHz. If the
PLL is locked, it will be stable in frequency. If it is unlocked, you may have to use a wide
span, so see if it may be far off frequency.
Troubleshooting
First check that V701 has the proper orientation, then check C701, C714, R703, R702,
C715, R704, C716, L701, and C702. Also, check power supplies to Batman, particularly
check for 2.7v on VR5 at C710, and on VR7 at C708, and check for 1.8v on VIO. Next
check if CLK 19M2_B (C512) the reference frequency for PLL is at 19.2MHz. If no fault is
found, replace N701 (Batman).
This is one of the phone’s self-tests which gives either a pass or fail result. The VHFPLL is
inside the Robin IC. The phone checks the VHFPLL’s lock detect bit. If this bit indicates
that the PLL is unlocked, the test will fail.
Explanation of Result
Pass or Fail
Manual Verification
Turn on the Cell CDMA transmitter to any channel and probe at C638 (probing point
TP27 in Table 2) using an RF probe connected to a spectrum analyzer tuned to 345.2MHz.
If th PLL is locked, it will be stable in frequency. If it is unlocked, you may have to use a
wide span to see it since it may be far off frequency.
Troubleshooting
First, check that V601 and V602 have the proper orientation, then check C612, C613,
R607, R605, C632, R606, C638, L611, C631, C630, C629, C637, R609, C618, and R613.
Check power supplies to N601 (Robin) and ensure there is 2.7v on VR3 and VR6, and 1.8v
on VIO (Table 13). Next, check if CLK 19M2_R (C513) the reference frequency for PLL is
at 19.2MHz. If no problems are found, replace Robin.
Test 16 ST TX Detector CELL
Description
This is one of the phone’s self-tests which gives either a pass or fail result only. The
phone transmits at several power levels and checks the ADC value of the power detector.
The ADC value is measured first for a set of AGC values, then each AGC value is changed
one at a time to make sure that the ADC changes as each AGC value is changed individually.
Explanation of Result
Pass or Fail
Manual Verification
Using Main Mode: turn on the Cell CDMA TX with channel set to 384, and turn on IS95
modulation using CDMA control.
Record the TX signal power from the antenna connector using a spectrum analyzer centered at 836.52Mhz. (The self-test measures the power detector reading instead, but at
the present time this cannot be done with Phoenix, therefore an easy way to check functionality without removing the covers is to check transmitted power. If the covers are
removed, the voltage on PWR_OUT, at probing point J603 can be measured.) Transmitted
power should be greater than 24dBm. (PWR_OUT greater than 1.91v, which corresponds
to the power detector ADC=700).
For each of the next three cases, TX power should be less than 24dBm (less than 1.91v on
PWR_OUT.
1. TX_IF_AGC to -80
TX_RF_AGC to -512,
PA_AGC to -512
2.TX_IF_AGC to +511,
TX_RF_AGC to -512,
PA_AGC to +511
3.TX_IF_AGC to -80
TX_RF_AGC to +511
PA_AGC to +511.
Troubleshooting
If there is a failure associated with only some of the cases above, check the AGC voltages
and components of the associated PDMs as described in Table 1. For problems with the IF
or RF AGC, also check Robin and supporting components. For PA AGC problems, also
check the PA and supporting components. If all of the above cases fail, troubleshoot the
TX chain as described in Probing/Troubleshooting Tables. If all the output powers are
passing, then perhaps the test is failing because the ADC voltage is wrong (which at this
point we cannot read, so we are measuring the actual output power). This can be verified
by measuring the voltage on the PWROUT probing point J603, the limit is 1.64v. If the
voltages are wrong, then check the power detector at R801, L801, R805, and C807, and
also Robin. If the voltages are correct and it still fails, check the UEM (D200).
Test 17 SN CELL PA Temp
Description
This is one of the phone’s self-tunings, which reads the ADC voltage of a thermistor
R808, and checks to make sure the phone is at room temperature. The reason for this is
that we don’t want to tune a phone while it is hot or cold.
Explanation of Result
The phone reports the ADC voltage value of the thermistor, and it should be within the
limits.
Manual Verification
Ensure the phone is cool by letting it cool down for several minutes, and retest, keeping