NEC UPA1727 Datasheet

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NEC UPA1727 Datasheet

DATA SHEET

MOS FIELD EFFECT TRANSISTOR

μPA1727

SWITCHING

N-CHANNEL POWER MOS FET

INDUSTRIAL USE

DESCRIPTION

The μPA1727 is N-Channel MOS Field Effect Transistor designed for high current switching applications.

FEATURES

Single chip type

Low On-state Resistance

RDS(on)1 = 14 mΩ (TYP.) (VGS = 10 V, ID = 5.0 A)

RDS(on)2 = 17 mΩ (TYP.) (VGS = 4.5 V, ID = 5.0 A)

RDS(on)3 = 19 mΩ (TYP.) (VGS = 4.0 V, ID = 5.0 A)

Low Ciss : Ciss = 2400 pF (TYP.)

Built-in G-S protection diode

Small and surface mount package (Power SOP8)

PACKAGE DRAWING (Unit : mm)

8 5

1, 2, 3

;

Source

4

;

Gate

5, 6, 7, 8 ;

Drain

 

1

 

4

 

6.0 ±0.3

 

 

 

 

4.4

 

Max.1.8

1.44

5.37 Max.

0.15

0.8

 

 

 

 

 

 

 

 

 

+0.10

–0.05

 

 

 

Min.

 

 

 

0.5 ±0.2

 

 

1.27

0.78 Max.

 

0.10

 

0.05

0.40 –0.05+0.10

0.12 M

 

 

ORDERING INFORMATION

PART NUMBER

PACKAGE

 

 

μPA1727

Power SOP8

 

 

ABSOLUTE MAXIMUM RATINGS (TA = 25 °C, All terminals are connected.)

Drain to Source Voltage (VGS = 0 V)

VDSS

60

V

EQUIVALENT CIRCUIT

 

 

 

 

Gate to Source Voltage (VDS = 0 V)

VGSS

±20

V

 

 

 

 

 

 

 

 

 

Drain Current (DC)

ID(DC)

±10

A

 

 

 

Drain

 

 

 

 

 

 

 

 

 

Drain Current (Pulse) Note1

ID(pulse)

±40

A

 

 

 

 

 

 

 

 

Body

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Total Power Dissipation (TA = 25 °C) Note2

PT

2.0

W

Gate

 

 

 

 

 

 

Diode

 

 

 

 

 

 

Channel Temperature

Tch

150

°C

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Storage Temperature

Tstg

–55 to + 150

°C

Gate

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Single Avalanche Current Note3

IAS

10

A

Protection

Source

Diode

 

 

 

 

 

 

 

 

 

 

 

Single Avalanche Energy Note3

EAS

200

mJ

 

 

 

 

 

 

 

 

 

Notes 1. PW 10 μs, Duty cycle 1 %

2. Mounted on ceramic substrate of 1200 mm2 x 2.2 mm 3. Starting Tch = 25 °C, R G = 25 Ω, VGS = 20 V 0 V

Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage Exceeding the rated voltage may be applied to this device.

The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.

Not all devices/types available in every country. Please check with local NEC representative for availability and additional information.

Document No. G14330EJ1V0DS00 (1st edition) Date Published January 2000 NS CP(K) Printed in Japan

The mark shows major revised points.

©

1999,2000

 

μPA1727

ELECTRICAL CHARACTERISTICS (TA = 25 °C, All terminals are connected.)

CHARACTERISTICS

SYMBOL

TEST CONDITIONS

MIN.

TYP.

MAX.

UNIT

 

 

 

 

 

 

 

Drain to Source On-state Resistance

RDS(on)1

VGS = 10 V, ID = 5.0 A

 

14

19

mΩ

 

 

 

 

 

 

 

 

RDS(on)2

VGS = 4.5 V, ID = 5.0 A

 

17

22

mΩ

 

 

 

 

 

 

 

 

RDS(on)3

VGS = 4.0 V, ID = 5.0 A

 

19

25

mΩ

 

 

 

 

 

 

 

Gate to Source Cut-off Voltage

VGS(off)

VDS = 10 V, ID = 1 mA

1.5

2.0

2.5

V

 

 

 

 

 

 

 

Forward Transfer Admittance

| yfs |

VDS = 10 V, ID = 5.0 A

8.0

14

 

S

 

 

 

 

 

 

 

Drain Leakage Current

IDSS

VDS = 60 V, VGS = 0 V

 

 

10

μA

 

 

 

 

 

 

 

Gate to Source Leakage Current

IGSS

VGS = ±20 V, VDS = 0 V

 

 

±10

μA

 

 

 

 

 

 

 

Input Capacitance

Ciss

VDS = 10 V

 

2400

 

pF

 

 

 

 

 

 

 

Output Capacitance

Coss

VGS = 0 V

 

400

 

pF

 

 

 

 

 

 

 

Reverse Transfer Capacitance

Crss

f = 1 MHz

 

200

 

pF

 

 

 

 

 

 

 

Turn-on Delay Time

td(on)

ID = 5.0 A

 

24

 

ns

 

 

 

 

 

 

 

Rise Time

tr

VGS(on) = 10 V

 

120

 

ns

 

 

 

 

 

 

 

Turn-off Delay Time

td(off)

VDD = 30 V

 

120

 

ns

 

 

RG = 10 Ω

 

 

 

 

Fall Time

tf

 

71

 

ns

 

 

 

 

 

 

 

Total Gate Charge

QG

ID = 10 A

 

45

 

nC

 

 

 

 

 

 

 

Gate to Source Charge

QGS

VDD = 48 V

 

5.9

 

nC

 

 

 

 

 

 

 

Gate to Drain Charge

QGD

VGS = 10 V

 

13

 

nC

 

 

 

 

 

 

 

Body Diode Forward Voltage

VF(S-D)

IF = 10 A, VGS = 0 V

 

0.8

 

V

 

 

 

 

 

 

 

Reverse Recovery Time

trr

IF = 10 A, VGS = 0 V

 

45

 

ns

 

 

di/dt = 100A/μs

 

 

 

 

Reverse Recovery Charge

Qrr

 

84

 

nC

 

 

 

 

 

 

 

TEST CIRCUIT 1 AVALANCHE CAPABILITY

TEST CIRCUIT 2 SWITCHING TIME

 

 

 

D.U.T.

 

 

 

 

 

 

 

RG = 25 Ω

L

 

D.U.T.

 

 

 

 

 

 

 

 

VGS

 

 

 

PG.

 

 

 

RL

 

 

90 %

 

 

 

VGS

 

 

VGS(on)

50 Ω

VDD

 

 

10 %

 

 

 

RG

Wave Form

 

 

 

VGS = 20 0 V

 

 

VDD

0

 

 

 

 

 

PG.

 

 

 

 

 

 

 

 

 

ID

90 %

 

90 %

 

BVDSS

 

 

 

 

 

ID

IAS

VGS

ID

0 10 %

 

10 %

 

VDS

 

 

 

0

 

 

 

ID

 

Wave Form

 

 

 

 

 

 

 

 

 

 

 

 

 

 

td(on)

tr

td(off)

tf

VDD

 

 

τ

 

 

 

 

τ = 1 μs

 

 

ton

 

toff

 

 

 

 

 

 

 

 

Starting Tch

 

Duty Cycle 1 %

 

 

 

 

 

TEST CIRCUIT 3 GATE CHARGE

 

D.U.T.

 

 

IG = 2 mA

RL

 

 

PG.

50 Ω

VDD

2

Data Sheet G14330EJ1V0DS00

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