The µPD4481161 is a 524,288-word by 16-bit, the µPD4481181 is a 524,288-word by 18-bit, the µPD4481321 is a
262,144-word by 32-bit and the µPD4481361 is a 262,144-word by 36-bit ZEROSB static RAM fabricated with
advanced CMOS technology using full CMOS six-transistor memory cell.
PD4481161, µPD4481181, µPD4481321 and µPD4481361 are optimized to eliminate dead cycles for read to
The
µ
write, or write to read transitions. These ZEROSB static RAMs integrate unique synchronous peripheral circuitry, 2-bit
burst counter and output buffer as well as SRAM core. All input registers are controlled by a positive edge of the
single clock input (CLK).
PD4481161, µPD4481181, µPD4481321 and µPD4481361 are suitable for applications which require
The
µ
synchronous operation, high speed, low voltage, high density and wide bit configuration, such as buffer memory.
ZZ has to be set LOW at the normal operation. When ZZ is set HIGH, the SRAM enters Power Down State
(“Sleep”). In the “Sleep” state, the SRAM internal state is preserved. When ZZ is set LOW again, the SRAM resumes
normal operation.
PD4481161, µPD4481181, µPD4481321 and µPD4481361 are packaged in 100-pin PLASTIC LQFP with a
µ
The
1.4 mm package thickness for high density and low capacitive loading.
Features
• Low voltage core supply : V
• Synchronous operation
• Operating temperature : T
• 100 percent bus utilization
• Internally self-timed write control
• Burst read / write : Interleaved burst and linear burst sequence
• Fully registered inputs and outputs for flow through operation
• All registers triggered off positive clock edge
• 3.3V or 2.5V LVTTL Compatible : All inputs and outputs
• Fast clock access time : 6.5 ns (133 MHz), 7.5 ns (117 MHz), 8.5 ns (100 MHz)
• Asynchronous output enable : /G
• Burst sequence selectable : MODE
• Sleep mode : ZZ (ZZ = Open or Low : Normal operation)
• Separate byte write enable : /BW1 to /BW4 (
• Three chip enables for easy depth expansion
• Common I/O using three state outputs
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics
sales representative for availability and additional information.
CautionExposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
DD
-A65, -A75, -A85–0.5+4.0V
-A65Y, -A75Y, -A85Y
-C75, -C85–0.5+3.0
-C75Y, -C85Y
DD
Note
IN
I/O
A
stg
-A65, -A75, -A85, -C75, -C85070°C
–0.5
–0.5
Note
DD
V
+ 0.5V
VDDQ + 0.5V
–55+125°C
V
Recommended DC Operating Conditions (1/2)
ParameterSymbolConditions-A65, -A75, -A85Unit
-A65Y, -A75Y, -A85Y
MIN.TYP.MAX.
Supply voltageV
DD
3.1353.33.465V
2.5 V LVTTL Interface
Output supply voltageVDDQ2.3752.52.9V
High level input voltageV
Low level input voltageV
IH
IL
1.7VDDQ + 0.3V
Note
–0.3
+0.7V
3.3 V LVTTL Interface
Output supply voltageVDDQ3.1353.33.465V
High level input voltageV
Low level input voltageV
–0.8 V (MIN.) (Pulse width : 2 ns)
Note
IH
IL
2.0VDDQ + 0.3V
Note
–0.3
+0.8V
Recommended DC Operating Conditions(2/2)
ParameterSymbolConditions-C75, -C85Unit
-C75Y, -C85Y
MIN.TYP.MAX.
Supply voltageV
Output supply voltageVDDQ2.3752.52.625V
High level input voltageV
Low level input voltageV
DD
IH
IL
2.3752.52.625V
1.7VDDQ + 0.3V
Note
–0.3
+0.7V
Note –0.8 V (MIN.) (Pulse width : 2 ns)
Data Sheet M15561EJ3V0DS
13
µ
PD4481161, 4481181, 4481321, 4481361
DC Characteristics (VDD = 3.3 ± 0.165 V or 2.5 ± 0.125 V)
ParameterSymbolTest conditionMIN.TYP.MAX.Unit
LI
Input leakage currentI
I/O leakage currentI
Operating supply currentI
Standby supply currentI
Power down supply currentI
I
I
SBZZ
IN
V
(except ZZ, MODE) = 0 V to V
LO
I/O
V
= 0 V to VDDQ, Outputs are disabled.–2+2
DD
Device selected,-A65250mA
Cycle = MAX.,-A65Y
IN
V
VIL or VIN ≥ VIH,-A75, -C75225
≤
I/O
I
= 0 mA-A75Y, -C75Y
SB
Device deselected, Cycle = 0 MHz,30mA
IN
V
VIL or VIN ≥ VIH, All inputs are static.
≤
SB1
Device deselected, Cycle = 0 MHz,15
IN
V
0.2 V or VIN ≥ V
≤
I/O
V
0.2 V, All inputs are static.
≤
SB2
Device deselected, Cycle = MAX.,110
IN
V
VIL or VIN ≥ V
≤
ZZ ≥ VDD – 0.2 V, V
DD
IH
I/O
≤ VDDQ + 0.2 V15mA
DD
–2+2
-A85, -C85200
-A85Y, -C85Y
– 0.2 V,
A
µ
A
µ
2.5 V LVTTL Interface
High level output voltageV
Low level output voltageV
OHIOH
I
OLIOL
I
= –2.0 mA1.7V
OH
= –1.0 mA2.1
= +2.0 mA0.7V
OL
= +1.0 mA0.4
3.3 V LVTTL Interface
High level output voltageV
Low level output voltageV
OHIOH
OLIOL
= –4.0 mA2.4V
= +8.0 mA0.4V
Capacitance (TA = 25 °°°°C, f = 1MHz)
ParameterSymbolTest conditionMIN.TYP.MAX.Unit
Input capacitanceC
Input / Output capacitanceC
Clock input capacitanceC
IN
VIN = 0 V6.0pF
I/O
I/O
V
= 0 V8.0pF
clkVclk
= 0 V6.0pF
Remark These parameters are periodically sampled and not 100% tested.
14
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
AC Characteristics (VDD = 3.3 ± 0.165 V or 2.5 ± 0.125 V)
AC Test Conditions
2.5 V LVTTL Interface
Input waveform (Rise / Fall time ≤≤≤≤ 2.4 ns)
2.4 V
1.2 V
V
SS
Output waveform
3.3 V LVTTL Interface
Test points
Test points1.2 V1.2 V
1.2 V
Input waveform (Rise / Fall time
3.0 V
V
SS
Output waveform
Output load condition
CL : 30 pF
5 pF (TKHQX1, TKHQX2, TGLQX, TGHQZ, TKHQZ)
I/O (Output)
≤≤≤≤ 3.0 ns)
1.5 V
Test points
Test points1.5 V1.5 V
Figure External load at test
O = 50 Ω
Z
1.5 V
Remark C
50 Ω
VT = +1.2 V / +1.5 V
includes capacitances of the probe and jig, and stray capacitances.
L
Data Sheet M15561EJ3V0DS
L
C
15
µ
PD4481161, 4481181, 4481321, 4481361
Read and Write Cycle (2.5 V LVTTL Interface)
ParameterSymbol-A65, -A75, -C75-A85, -C85UnitNote
-A65Y, -A75Y, -C75Y-A85Y, -C85Y
(117 MHz)(100 MHz)
StandardAliasMIN.MAX.MIN.MAX.
Cycle timeTKHKHTCYC8.6–10–ns
Clock access timeTKHQVTCD–7.5–8.5ns
Output enable access timeTGLQVTOE–3.5–3.5ns
Clock high to output activeTKHQX1TDC12.5–2.5–ns1, 2
Clock high to output changeTKHQX2TDC22.5–2.5–ns
Output enable to output activeTGLQXTOLZ0–0–ns1
Output disable to output High-ZTGHQZTOHZ03.503.5ns1
Clock high to output High-ZTKHQZTCZ2.552.55ns1, 2
Clock high pulse widthTKHKLTCH2.5–2.5–ns
Clock low pulse widthTKLKHTCL2.5–2.5–ns
Setup times AddressTAVKHTAS1.5–2–ns
Address advance TADVVKH TADVS
Clock enableTEVKHTCES
Chip enableTCVKHTCSS
Data inTDVKHTDS
Write enableTWVKHTWS
Hold timesAddressTKHAXTAH0.5–0.5–ns
Address advance TKHADVX TADVH
Clock enableTKHEXTCEH
Chip enableTKHCXTCSH
Data inTKHDXTDH
Write enableTKHWXTWH
Power down entry timeTZZETZZE–8.6–10ns
Power down recovery timeTZZRTZZR–8.6–10ns
Notes 1. Transition is measured ±200 mV from steady state.
2. To avoid bus contention, the output buffers are designed such that TKHQZ (device turn-off) is faster than
TKHQX1 (device turn-on) at a given temperature and voltage. The specs as shown do not imply bus
contention because TKHQX1 is a min. parameter that is worse case at totally different conditions (TA
max.) than TKHQZ, which is a max. parameter (worse case at TA max., VDD min.).
VDD
16
Data Sheet M15561EJ3V0DS
min.,
µ
PD4481161, 4481181, 4481321, 4481361
Read and Write Cycle (3.3 V LVTTL Interface)
ParameterSymbol-A65-A75-A85UnitNote
-A65Y-A75Y-A85Y
(133 MHz)(117 MHz)(100 MHz)
StandardAliasMIN.MAX.MIN.MAX.MIN.MAX.
Cycle timeTKHKHTCYC7.5–8.6–10–ns
Clock access timeTKHQVTCD–6.5–7.5–8.5ns
Output enable access timeTGLQVTOE–3.5–3.5–3.5ns
Clock high to output activeTKHQX1TDC12.5–2.5–2.5–ns1, 2
Clock high to output changeTKHQX2TDC22.5–2.5–2.5–ns
Output enable to output activeTGLQXTOLZ0–0–0–ns1
Output disable to output High-ZTGHQZTOHZ03.503.503.5ns1
Clock high to output High-ZTKHQZTCZ2.552.552.55ns1, 2
Clock high pulse widthTKHKLTCH2.5–2.5–2.5–ns
Clock low pulse widthTKLKHTCL2.5–2.5–2.5–ns
Setup times AddressTAVKHTAS1.5–1.5–2–ns
Address advance TADVVKH TADVS
Clock enableTEVKHTCES
Chip enableTCVKHTCSS
Data inTDVKHTDS
Write enableTWVKHTWS
Hold timesAddressTKHAXTAH0.5–0.5–0.5–ns
Address advance TKHADVX TADVH
Clock enableTKHEXTCEH
Chip enableTKHCXTCSH
Data inTKHDXTDH
Write enableTKHWXTWH
Power down entry timeTZZETZZE–7.5–8.6–10ns
Power down recovery timeTZZRTZZR–7.5–8.6–10ns
Notes 1. Transition is measured ±200 mV from steady state.
2. To avoid bus contention, the output buffers are designed such that TKHQZ (device turn-off) is faster than
TKHQX1 (device turn-on) at a given temperature and voltage. The specs as shown do not imply bus
contention because TKHQX1 is a min. parameter that is worse case at totally different conditions (TA
max.) than TKHQZ, which is a max. parameter (worse case at TA max., VDD min.).
VDD
Data Sheet M15561EJ3V0DS
min.,
17
READ / WRITE CYCLE
µ
PD4481161, 4481181, 4481321, 4481361
/CEs
/BWs
Address
CLK
TEVKH TKHEX
/CKE
TCVKH TKHCX
Note 1
TADVVKH TKHADVX
ADV
TWVKH TKHWX
/WE
TWVKH TKHWX
Note 2
12345678910
A1A3A4A5A6
TKHKH
TKLKHTKHKL
A2A7
TAVKHTKHAX
Data In
Data Out
High-ZHigh-ZHigh-Z
High-ZHigh-Z
D (A1)D (A2)
TDVKH TKHDXTKHQX1
D (A2+1)
TKHQV
TKHQX2
Q (A3)Q (A4)
TGHQZ
TGLQV TKHQZ
Q (A4+1)
TGLQX
D (A5)
Q (A6)Q (A7)
TKHQX2
/G
Command
WRITE
D (A1)
WRITE
D (A2)
BURST
WRITE
D (A2+1)
READ
Q (A3)
READ
Q (A4)
BURST
READ
Q (A4+1)
WRITE
D (A5)
READ
Q (A6)
WRITE
Q (A7)
DESELECT
Notes 1. /CEs refers to /CE, CE2 and /CE2. When /CEs is LOW, /CE and /CE2 are LOW and CE2 is HIGH. When
/CEs is HIGH, /CE and /CE2 are HIGH and CE2 is LOW.
/BWs refers to /BW1, /BW2, /BW3 and /BW4. When /BWs is LOW, any one or more byte write enables
2.
(/BW1, /BW2, /BW3 or /BW4) are LOW.
18
Data Sheet M15561EJ3V0DS
NOP, STALL AND DESELECT CYCLE
12345678910
CLK
/CKE
/CEs
ADV
/WE
/BWs
µ
PD4481161, 4481181, 4481321, 4481361
Address
Data In
Data Out
Command
High-Z
High-Z
WRITE
D (A1)
A2A1A3A4A5
READ
Q (A3)
High-Z
Q (A3)
WRITE
D (A4)
D (A4)
High-Z
STALLNOP
D (A1)
READ
Q (A2)
Q (A2)
STALL
TKHQX2
READ
Q (A5)
TKHQZ
Q (A5)
DESELECT
High-Z
High-Z
CONTINUE
DESELECT
Data Sheet M15561EJ3V0DS
19
POWER DOWN (ZZ) CYCLE
µ
PD4481161, 4481181, 4481321, 4481361
CLK
/CKE
Note
/CEs
ADV
Note
/WE
/BWs
Address
Data Out
12345678910
A1
/G
High-ZHigh-Z
TKHKH
TKHKL TKLKH
Q (A1)
1112
A2
Q1 (A2)
Q2 (A2)
ZZ
TZZETZZR
Power Down (I
/WE or /CEs must be held HIGH at CLK rising edge (clock edge No.3 in this figure) prior to power down state
Note
SBZZ
) State
entry.
20
Data Sheet M15561EJ3V0DS
Package Drawing
100-PIN PLASTIC LQFP (14x20)
A
B
µ
PD4481161, 4481181, 4481321, 4481361
81
100
80
1
51
50
31
30
F
G
H
M
I
K
P
SN
NOTE
Each lead centerline is located within 0.13 mm of
its true position (T.P.) at maximum material condition.
L
detail of lead end
S
CD
R
Q
J
S
M
ITEM MILLIMETERS
A
22.0±0.2
B
20.0±0.2
C14.0±0.2
D
16.0±0.2
F0.825
G
0.575
H0.32
I0.13
J
K
L
M0.17
N
P
Q
R3°
S1.7 MAX.
+0.08
−0.07
0.65 (T.P.)
1.0±0.2
0.5±0.2
+0.06
−0.05
0.10
1.4
0.125±0.075
+7°
−3°
S100GF-65-8ET-1
Data Sheet M15561EJ3V0DS
21
Recommended Soldering Condition
µ
PD4481161, 4481181, 4481321, 4481361
Please consult with our sales offices for soldering conditions of the
Types of Surface Mount Devices
PD4481161GF : 100-pin PLASTIC LQFP (14 x 20)
µ
PD4481181GF : 100-pin PLASTIC LQFP (14 x 20)
µ
PD4481321GF : 100-pin PLASTIC LQFP (14 x 20)
µ
PD4481361GF : 100-pin PLASTIC LQFP (14 x 20)
µ
PD4481161, 4481181, 4481321 and 4481361.
µ
22
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
Revision History
Edition/PageType ofLocationDescription
DateThisPreviousrevision(Previous edition → This edition)
editionedition
3rd edition/ Throughout Throughout Modification
Dec. 2002Addition
−
−
Preliminary Data Sheet → Data Sheet
Extended operating temperature products
(TA = −40 to +85 °C)
Data Sheet M15561EJ3V0DS
23
[MEMO]
µ
PD4481161, 4481181, 4481321, 4481361
24
Data Sheet M15561EJ3V0DS
[MEMO]
µ
PD4481161, 4481181, 4481321, 4481361
Data Sheet M15561EJ3V0DS
25
[MEMO]
µ
PD4481161, 4481181, 4481321, 4481361
26
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
DD
pin should be connected to V
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
or GND with a resistor, if it is considered to have a possibility of
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
Data Sheet M15561EJ3V0DS
27
µ
PD4481161, 4481181, 4481321, 4481361
ZEROSB is a trademark of NEC Electronics Corporation.
•
The information in this document is current as of December, 2002. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC Electronics data
sheets or data books, etc., for the most up-to-date specifications of NEC Electronics products. Not
all products and/or types are available in every country. Please check with an NEC Electronics sales
representative for availability and additional information.
No part of this document may be copied or reproduced in any form or by any means without the prior
•
written consent of NEC Electronics. NEC Electronics assumes no responsibility for any errors that may
appear in this document.
•
NEC Electronics does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from the use of NEC Electronics products listed in this document
or any other liability arising from the use of such products. No license, express, implied or otherwise, is
granted under any patents, copyrights or other intellectual property rights of NEC Electronics or others.
Descriptions of circuits, software and other related information in this document are provided for illustrative
•
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of a customer's equipment shall be done under the full
responsibility of the customer. NEC Electronics assumes no responsibility for any losses incurred by
customers or third parties arising from the use of these circuits, software and information.
•
While NEC Electronics endeavors to enhance the quality, reliability and safety of NEC Electronics products,
customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To
minimize risks of damage to property or injury (including death) to persons arising from defects in NEC
Electronics products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment and anti-failure features.
•
NEC Electronics products are classified into the following three quality grades: "Standard", "Special" and
"Specific".
The "Specific" quality grade applies only to NEC Electronics products developed based on a customerdesignated "quality assurance program" for a specific application. The recommended applications of an NEC
Electronics product depend on its quality grade, as indicated below. Customers must check the quality grade of
each NEC Electronics product before using it in a particular application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots.
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support).
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC Electronics products is "Standard" unless otherwise expressly specified in NEC
Electronics data sheets or data books, etc. If customers wish to use NEC Electronics products in applications
not intended by NEC Electronics, they must contact an NEC Electronics sales representative in advance to
determine NEC Electronics' willingness to support a given application.
(Note)
(1) "NEC Electronics" as used in this statement means NEC Electronics Corporation and also includes its
majority-owned subsidiaries.
(2) "NEC Electronics products" means any product developed or manufactured by or for NEC Electronics (as
defined above).
M8E 02. 11-1
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