NEC PD4481161, PD4481181, PD4481321, PD4481361 DATA SHEET

查询UPD4481161GF-A65供应商查询UPD4481161GF-A65供应商
DATA SHEET
MOS INTEGRATED CIRCUIT
µ
PD4481161, 4481181, 4481321, 4481361
8M-BIT ZEROSBTM SRAM
FLOW THROUGH OPERATION
Description
The µPD4481161 is a 524,288-word by 16-bit, the µPD4481181 is a 524,288-word by 18-bit, the µPD4481321 is a
262,144-word by 32-bit and the µPD4481361 is a 262,144-word by 36-bit ZEROSB static RAM fabricated with
advanced CMOS technology using full CMOS six-transistor memory cell.
PD4481161, µPD4481181, µPD4481321 and µPD4481361 are optimized to eliminate dead cycles for read to
The
µ
write, or write to read transitions. These ZEROSB static RAMs integrate unique synchronous peripheral circuitry, 2-bit
burst counter and output buffer as well as SRAM core. All input registers are controlled by a positive edge of the
single clock input (CLK).
PD4481161, µPD4481181, µPD4481321 and µPD4481361 are suitable for applications which require
The
µ
synchronous operation, high speed, low voltage, high density and wide bit configuration, such as buffer memory.
ZZ has to be set LOW at the normal operation. When ZZ is set HIGH, the SRAM enters Power Down State
(“Sleep”). In the “Sleep” state, the SRAM internal state is preserved. When ZZ is set LOW again, the SRAM resumes
normal operation.
PD4481161, µPD4481181, µPD4481321 and µPD4481361 are packaged in 100-pin PLASTIC LQFP with a
µ
The
1.4 mm package thickness for high density and low capacitive loading.
Features
Low voltage core supply : V
Synchronous operation
Operating temperature : T
100 percent bus utilization
Internally self-timed write control
Burst read / write : Interleaved burst and linear burst sequence
Fully registered inputs and outputs for flow through operation
All registers triggered off positive clock edge
3.3V or 2.5V LVTTL Compatible : All inputs and outputs
Fast clock access time : 6.5 ns (133 MHz), 7.5 ns (117 MHz), 8.5 ns (100 MHz)
Asynchronous output enable : /G
Burst sequence selectable : MODE
Sleep mode : ZZ (ZZ = Open or Low : Normal operation)
Separate byte write enable : /BW1 to /BW4 (
Three chip enables for easy depth expansion
Common I/O using three state outputs
The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics sales representative for availability and additional information.
= 3.3 ± 0.165 V (-A65, -A75, -A85, -A65Y, -A75Y, -A85Y)
DD
V
= 2.5 ± 0.125 V (-C75, -C85, -C75Y, -C85Y)
DD
= 0 to 70 °C (-A65, -A75, -A85, -C75, -C85)
A
TA = 40 to +85 °C (-A65Y, -A75Y, -A85Y, -C75Y, -C85Y)
PD4481321 and µPD4481361)
µ
/BW1 and /BW2 (µPD4481161 and µPD4481181)
Document No. M15561EJ3V0DS00 (3rd edition) Date Published December 2002 NS CP(K) Printed in Japan
The mark
shows major revised points.



2001
µ
PD4481161, 4481181, 4481321, 4481361
Ordering Information
Part number Access Clock Core Supply I/O Interface Operating Package
Time Frequency Voltage Temperature
ns MHz V °C
PD4481161GF-A65 6.5 133 3.3 ± 0.165 3.3 V LVTTL
µ
PD4481161GF-A75 7.5 117 3.3 V or 2.5 V LVTTL LQFP (14 x 20)
µ
PD4481161GF-A85 8.5 100
µ
PD4481181GF-A65 6.5 133 3.3 V LVTTL
µ
PD4481181GF-A75 7.5 117 3.3 V or 2.5 V LVTTL
µ
PD4481181GF-A85 8.5 100
µ
PD4481321GF-A65 6.5 133 3.3 V LVTTL
µ
PD4481321GF-A75 7.5 117 3.3 V or 2.5 V LVTTL
µ
PD4481321GF-A85 8.5 100
µ
PD4481361GF-A65 6.5 133 3.3 V LVTTL
µ
PD4481361GF-A75 7.5 117 3.3 V or 2.5 V LVTTL
µ
PD4481361GF-A85 8.5 100
µ
PD4481161GF-C75 7.5 117 2.5 ± 0.125 2.5 V LVTTL
µ
PD4481161GF-C85 8.5 100
µ
PD4481181GF-C75 7.5 117
µ
PD4481181GF-C85 8.5 100
µ
PD4481321GF-C75 7.5 117
µ
PD4481321GF-C85 8.5 100
µ
PD4481361GF-C75 7.5 117
µ
PD4481361GF-C85 8.5 100
µ
Note
Note
Note
Note
0 to 70 100-pin PLASTIC
(1/2)
Although 2.5V LVTTL interface can also be used, a performance becomes equivalent to -A75 (117 MHz).
Note
2
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
Part number Access Clock Core Supply I/O Interface Operating Package
Time Frequency Voltage Temperature
ns MHz V °C
PD4481161GF-A65Y 6.5 133 3.3 ± 0.165 3.3 V LVTTL
µ
PD4481161GF-A75Y 7.5 117 3.3 V or 2.5 V LVTTL LQFP (14 x 20)
µ
PD4481161GF-A85Y 8.5 100
µ
PD4481181GF-A65Y 6.5 133 3.3 V LVTTL
µ
PD4481181GF-A75Y 7.5 117 3.3 V or 2.5 V LVTTL
µ
PD4481181GF-A85Y 8.5 100
µ
PD4481321GF-A65Y 6.5 133 3.3 V LVTTL
µ
PD4481321GF-A75Y 7.5 117 3.3 V or 2.5 V LVTTL
µ
PD4481321GF-A85Y 8.5 100
µ
PD4481361GF-A65Y 6.5 133 3.3 V LVTTL
µ
PD4481361GF-A75Y 7.5 117 3.3 V or 2.5 V LVTTL
µ
PD4481361GF-A85Y 8.5 100
µ
PD4481161GF-C75Y 7.5 117 2.5 ± 0.125 2.5 V LVTTL
µ
PD4481161GF-C85Y 8.5 100
µ
PD4481181GF-C75Y 7.5 117
µ
PD4481181GF-C85Y 8.5 100
µ
PD4481321GF-C75Y 7.5 117
µ
PD4481321GF-C85Y 8.5 100
µ
PD4481361GF-C75Y 7.5 117
µ
PD4481361GF-C85Y 8.5 100
µ
Note
Note
Note
Note
40 to +85 100-pin PLASTIC
(2/2)
Although 2.5V LVTTL interface can also be used, a performance becomes equivalent to -A75Y (117 MHz).
Note
Data Sheet M15561EJ3V0DS
3
Pin Configurations
/××× indicates active low signal.
µ
PD4481161, 4481181, 4481321, 4481361
100-pin PLASTIC LQFP (14 ×××× 20)
[
µµµµ
PD4481161GF,
µµµµ
PD4481181GF]
Marking Side
NC
NC
NC
V
DD
V
SS
NC
NC
I/O9
I/O10
V
SS
V
DD
I/O11
I/O12
V
V
V
V
I/O13
I/O14
V
DD
V
SS
I/O15
I/O16
I/OP2, NC
NC
V
SS
V
DD
NC
NC
NC
A6A7/CE
CE2NCNC
/BW2
/BW1
/CE2
VDDVSSCLK
/WE
/CKE/GADVNCA17A8A9
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
1
2
3
Q
Q
4
5
6
7
8
9
Q
Q
10
11
12
13
SS
DD
DD
SS
14
15
16
17
18
19
Q
Q
20
21
22
23
24
25
Q
Q
26
27
28
29
30
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
A18
NC
NC
DD
Q
V
V
SS
Q
NC
I/OP1, NC
I/O8
I/O7
V
SS
Q
V
DD
Q
I/O6
I/O5
V
SS
V
SS
V
DD
ZZ
I/O4
I/O3
V
DD
Q
V
SS
Q
I/O2
I/O1
NC
NC
V
SS
Q
V
DD
Q
NC
NC
NC
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
A5A4A3A2A1
A0
NC
NC
SS
V
MODE
Remark Refer to Package Drawing for the 1-pin index mark.
4
Data Sheet M15561EJ3V0DS
DD
NC
NC
V
A10
A11
A12
A13
A14
A15
A16
Pin Identifications
µ
PD4481161, 4481181, 4481321, 4481361
µµµµ
PD4481161GF,
[
Symbol Pin No. Description
A0 to A18 37, 36, 35, 34, 33, 32, 100, 99, 82, 81, Synchronous Address Input
I/O1 to I/O16 58, 59, 62, 63, 68, 69, 72, 73, 8, 9, 12, 13, Synchronous Data In,
I/OP1, NC
I/OP2, NC
ADV 85 Synchronous Address Load / Advance Input
/CE, CE2, /CE2 98, 97, 92 Synchronous Chip Enable Input
/WE 88 Synchronous Write Enable Input
/BW1, /BW2 93, 94 Synchronous Byte Write Enable Input
/G 86 Asynchronous Output Enable Input
CLK 89 Clock Input
/CKE 87 Synchronous Clock Enable Input
MODE 31 Asynchronous Burst Sequence Select Input
ZZ 64 Asynchronous Power Down State Input
DD
V
SS
V
VDDQ 4, 11, 20, 27, 54, 61, 70, 77 Output Buffer Power Supply
VSSQ 5, 10, 21, 26, 55, 60, 71, 76 Output Buffer Ground
NC 1, 2, 3, 6, 7, 25, 28, 29, 30, 38, 39, 42, 43, No Connection
Note
Note
µµµµ
PD4481181GF]
44, 45, 46, 47, 48, 49, 50, 83, 80
18, 19, 22, 23 Synchronous / Asynchronous Data Out
74 Synchronous Data In (Parity),
24 Synchronous / Asynchronous Data Out (Parity)
Have to tied to VDD or VSS during normal operation
15, 16, 41, 65, 91 Power Supply
14, 17, 40, 66, 67, 90 Ground
51, 52, 53, 56, 57, 75, 78, 79, 84, 95, 96
NC (No Connection) is used in the µPD4481161GF.
Note
I/OP1 and I/OP2 are used in the µPD4481181GF.
Data Sheet M15561EJ3V0DS
5
µ
PD4481161, 4481181, 4481321, 4481361
100-pin PLASTIC LQFP (14 ×××× 20)
I/OP3, NC
I/O17
I/O18
V
DD
V
SS
I/O19
I/O20
I/O21
I/O22
V
SS
V
DD
I/O23
I/O24
V
V
V
V
I/O25
I/O26
V
DD
V
SS
I/O27
I/O28
I/O29
I/O30
V
SS
V
DD
I/O31
I/O32
I/OP4, NC
µµµµ
[
PD4481321GF,
µµµµ
PD4481361GF]
Marking Side
A6A7/CE
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
1
2
3
Q
Q
4
5
6
7
8
9
Q
Q
10
11
12
13
SS
DD
DD
SS
14
15
16
17
18
19
Q
Q
20
21
22
23
24
25
Q
Q
26
27
28
29
30
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
CE2
/BW4
/BW3
/BW2
/BW1
/CE2
VDDVSSCLK
/WE
/CKE/GADVNCA17A8A9
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/OP2, NC
I/O16
I/O15
DD
Q
V
V
SS
Q
I/O14
I/O13
I/O12
I/O11
V
SS
Q
V
DD
Q
I/O10
I/O9
V
SS
V
SS
V
DD
ZZ
I/O8
I/O7
V
DD
Q
V
SS
Q
I/O6
I/O5
I/O4
I/O3
V
SS
Q
DD
Q
V
I/O2
I/O1
I/OP1, NC
A5A4A3A2A1
A0
NC
NC
MODE
Remark Refer to Package Drawing for the1-pin index mark.
6
Data Sheet M15561EJ3V0DS
SS
DD
NC
V
NC
V
A10
A11
A12
A13
A14
A15
A16
µ
PD4481161, 4481181, 4481321, 4481361
µµµµ
PD4481321GF,
[
Symbol Pin No. Description
A0 to A17 37, 36, 35, 34, 33, 32, 100, 99, 82, 81, 44, Synchronous Address Input
I/O1 to I/O32 52, 53, 56, 57, 58, 59, 62, 63, 68, 69, 72, Synchronous Data In,
I/OP1, NC
I/OP2, NC
I/OP3, NC
I/OP4, NC
ADV 85 Synchronous Address Load / Advance Input
/CE, CE2, /CE2 98, 97, 92 Synchronous Chip Enable Input
/WE 88 Synchronous Write Enable Input
/BW1 to /BW4 93, 94, 95, 96 Synchronous Byte Write Enable Input
/G 86 Asynchronous Output Enable Input
CLK 89 Clock Input
/CKE 87 Synchronous Clock Enable Input
MODE 31 Asynchronous Burst Sequence Select Input
ZZ 64 Asynchronous Power Down State Input
DD
V
SS
V
VDDQ 4, 11, 20, 27, 54, 61, 70, 77 Output Buffer Power Supply
VSSQ 5, 10, 21, 26, 55, 60, 71, 76 Output Buffer Ground
NC 38, 39, 42, 43, 84 No Connection
Note
Note
Note
Note
µµµµ
PD4481361GF]
45, 46, 47, 48, 49, 50, 83
73, 74, 75, 78, 79, 2, 3, 6, 7, 8, 9, 12, 13, Synchronous / Asynchronous Data Out
18, 19, 22, 23, 24, 25, 28, 29
51 Synchronous Data In (Parity),
80 Synchronous / Asynchronous Data Out (Parity)
1
30
Have to tied to VDD or VSS during normal operation
15, 16, 41, 65, 91 Power Supply
14, 17, 40, 66, 67, 90 Ground
Note NC (No Connection) is used in the
I/OP1 to I/OP4 are used in the µPD4481361GF.
PD4481321GF.
µ
Data Sheet M15561EJ3V0DS
7
Block Diagrams
µ
PD4481161, 4481181, 4481321, 4481361
µµµµ
[
PD4481161,
A0 to A18
MODE
CLK
/CKE
ADV /BW1 /BW2
/WE
/G
/CE
CE2
/CE2
ZZ Power down control
µ
µ
PD4481181]
µ µ
K
Address register 0
Read
19 17
A1 A0
ADV
K
Write address register
Write registry and
data coherency
control logic
logic
Burst
logic
A1’ A0’
19
Write
drivers
19
19
Memory Cell Array
512 x 16 columns
(8,388,608 bits)
512 x 18 columns
(9,437,184 bits)
1,024 rows
Sense amplifiers
16/18
16/18
Data steering
Input register
16/18
E
Output buffers
I/O1 to I/O16 I/OP1, I/OP2
E
16/18
Burst Sequence
µµµµ
[
PD4481161,
Interleaved Burst Sequence Table (MODE = V
External Address A18 to A2, A1, A0
1st Burst Address A18 to A2, A1, /A0
2nd Burst Address A18 to A2, /A1, A0
3rd Burst Address A18 to A2, /A1, /A0
µ
µ
PD4481181]
µ µ
DD
)
Linear Burst Sequence Table (MODE = VSS)
External Address A18 to A2, 0, 0 A18 to A2, 0, 1 A18 to A2, 1, 0 A18 to A2, 1, 1
1st Burst Address A18 to A2, 0, 1 A18 to A2, 1, 0 A18 to A2, 1, 1 A18 to A2, 0, 0
2nd Burst Address A18 to A2, 1, 0 A18 to A2, 1, 1 A18 to A2, 0, 0 A18 to A2, 0, 1
3rd Burst Address A18 to A2, 1, 1 A18 to A2, 0, 0 A18 to A2, 0, 1 A18 to A2, 1, 0
8
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
µµµµ
[
PD4481321,
A0 to A17
MODE
CLK
/CKE
ADV /BW1 /BW2 /BW3 /BW4
/WE
/G
/CE
CE2
/CE2
ZZ Power down control
µ
µ
PD4481361]
µ µ
K
Address register 0
18 16
A1 A0
ADV
K
Write address register
Write registry and
data coherency
control logic
Read
logic
Burst logic
A1 A0
18
Write
drivers
18
18
Memory Cell Array
1,024 rows
256 x 32 columns
(8,388,608 bits)
256 x 36 columns
(9,437,184 bits)
Sense amplifiers
32/36
32/36
Data steering
Input register
32/36
E
Output buffers
I/O1 to I/O32 I/OP1 to I/OP4
E
32/36
µµµµ
[
PD4481321,
Interleaved Burst Sequence Table (MODE = V
µ
µ
PD4481361]
µ µ
DD
)
External Address A17 to A2, A1, A0
1st Burst Address A17 to A2, A1, /A0
2nd Burst Address A17 to A2, /A1, A0
3rd Burst Address A17 to A2, /A1, /A0
Linear Burst Sequence Table (MODE = VSS)
External Address A17 to A2, 0, 0 A17 to A2, 0, 1 A17 to A2, 1, 0 A17 to A2, 1, 1
1st Burst Address A17 to A2, 0, 1 A17 to A2, 1, 0 A17 to A2, 1, 1 A17 to A2, 0, 0
2nd Burst Address A17 to A2, 1, 0 A17 to A2, 1, 1 A17 to A2, 0, 0 A17 to A2, 0, 1
3rd Burst Address A17 to A2, 1, 1 A17 to A2, 0, 0 A17 to A2, 0, 1 A17 to A2, 1, 0
Data Sheet M15561EJ3V0DS
9
State Diagram
µ
PD4481161, 4481181, 4481321, 4481361
DS BURST
DS DS
DESELECT
READ
DS DS
WRITE
READ
BURST
Command Operation
DS Deselect
Read New Read
Write New Write
Burst Burst Read, Burst Write or Continue Deselect
BEGIN
READ
READ BURST BURST WRITE
BURST
READ
READ
WRITE
BEGIN WRITE
READWRITE
BURST
WRITE
WRITE
BURST
Remarks 1. States change on the rising edge of the clock.
2. A Stall or Ignore Clock Edge cycle is not shown in the above diagram. This is because /CKE HIGH only
blocks the clock (CLK) input and does not change the state of the device.
10
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
Asynchronous Truth Table
Operation /G I/O
Read Cycle L Dout
Read Cycle H High-Z
Write Cycle × High-Z, Din
Deselected × High-Z
Remark × : don’t care
Synchronous Truth Table
Operation /CE CE2 /CE2 ADV /WE /BWs /CKE CLK I/O Address Note
Deselected H ××L ××LL → H High-Z None 1
Deselected × L × L ××LL → H High-Z None 1
Deselected ××HL××LL → H High-Z None 1
Continue Deselected ×××H ××LL → H High-Z None 1
Read Cycle / Begin Burst L H L L H × LL → H Dout External
Read Cycle / Continue Burst ×××H ×× LL → H Dout Next
Write Cycle / Begin Burst LHLLLLLL H Din External
Write Cycle / Continue Burst ×××H × LLL → HDin Next
Write Cycle / Write Abort L H L L L H L L H High-Z External
Write Cycle / Write Abort ×××H × HLL → H High-Z Next
Stall / Ignore Clock Edge ЧЧЧЧЧЧHL → H Current 2
Notes 1. Deselect status is held until new “Begin Burst” entry.
2. If an Ignore Clock Edge command occurs during a read operation, the I/O bus will remain active (low
impedance). If it occurs during a write cycle, the bus will remain high impedance. No write operation will
be performed during the Ignore Clock Edge cycle.
Remarks 1. × : don’t care
2. /BWs = L means any one or more byte write enables (/BW1, /BW2, /BW3 or /BW4) are LOW.
/BWs = H means all byte write enables (/BW1, /BW2, /BW3 or /BW4) are HIGH.
Data Sheet M15561EJ3V0DS
11
Partial Truth Table for Write Enables
µ
PD4481161, 4481181, 4481321, 4481361
µµµµ
PD4481161,
[
Read Cycle H ××
Write Cycle / Byte 1 (I/O [1:8], I/OP1) L L H
Write Cycle / Byte 2 (I/O [9:16], I/OP2) L H L
Write Cycle / All Bytes L L L
Write Abort / NOP L H H
µ
µ
PD4481181]
µ µ
Operation /WE /BW1 /BW2
Remark × : don’t care
µµµµ
[
PD4481321,
Read Cycle H ××××
Write Cycle / Byte 1 (I/O [1:8], I/OP1) L L H H H
Write Cycle / Byte 2 (I/O [9:16], I/OP2) L H L H H
Write Cycle / Byte 3 (I/O [17:24], I/OP3) L H H L H
Write Cycle / Byte 4 (I/O [25:32], I/OP4) L H H H L
Write Cycle / All Bytes L L L L L
Write Abort / NOP L H H H H
µ
µ
PD4481361]
µ µ
Operation /WE /BW1 /BW2 /BW3 /BW4
Remark × : don’t care
ZZ (Sleep) Truth Table
ZZ Chip Status
0.2 V Active
Open Active
VDD 0.2 V Sleep
12
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
Electrical Specifications
Absolute Maximum Ratings
Parameter Symbol Conditions MIN. TYP. MAX. Unit
Supply voltage V
Output supply voltage VDDQ –0.5 V
Input voltage V
Input / Output voltage V
Operating ambient T
temperature -A65Y, -A75Y, -A85Y, -C75Y, -C85Y –40 +85
Storage temperature T
–2.0 V (MIN.) (Pulse width : 2 ns)
Note
Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
DD
-A65, -A75, -A85 –0.5 +4.0 V
-A65Y, -A75Y, -A85Y
-C75, -C85 –0.5 +3.0
-C75Y, -C85Y
DD
Note
IN
I/O
A
stg
-A65, -A75, -A85, -C75, -C85 0 70 °C
–0.5
–0.5
Note
DD
V
+ 0.5 V
VDDQ + 0.5 V
–55 +125 °C
V
Recommended DC Operating Conditions (1/2)
Parameter Symbol Conditions -A65, -A75, -A85 Unit
-A65Y, -A75Y, -A85Y
MIN. TYP. MAX.
Supply voltage V
DD
3.135 3.3 3.465 V
2.5 V LVTTL Interface
Output supply voltage VDDQ 2.375 2.5 2.9 V
High level input voltage V
Low level input voltage V
IH
IL
1.7 VDDQ + 0.3 V
Note
–0.3
+0.7 V
3.3 V LVTTL Interface
Output supply voltage VDDQ 3.135 3.3 3.465 V
High level input voltage V
Low level input voltage V
–0.8 V (MIN.) (Pulse width : 2 ns)
Note
IH
IL
2.0 VDDQ + 0.3 V
Note
–0.3
+0.8 V
Recommended DC Operating Conditions (2/2)
Parameter Symbol Conditions -C75, -C85 Unit
-C75Y, -C85Y
MIN. TYP. MAX.
Supply voltage V
Output supply voltage VDDQ 2.375 2.5 2.625 V
High level input voltage V
Low level input voltage V
DD
IH
IL
2.375 2.5 2.625 V
1.7 VDDQ + 0.3 V
Note
–0.3
+0.7 V
Note –0.8 V (MIN.) (Pulse width : 2 ns)
Data Sheet M15561EJ3V0DS
13
µ
PD4481161, 4481181, 4481321, 4481361
DC Characteristics (VDD = 3.3 ± 0.165 V or 2.5 ± 0.125 V)
Parameter Symbol Test condition MIN. TYP. MAX. Unit
LI
Input leakage current I
I/O leakage current I
Operating supply current I
Standby supply current I
Power down supply current I
I
I
SBZZ
IN
V
(except ZZ, MODE) = 0 V to V
LO
I/O
V
= 0 V to VDDQ, Outputs are disabled. –2 +2
DD
Device selected, -A65 250 mA
Cycle = MAX., -A65Y
IN
V
VIL or VIN ≥ VIH, -A75, -C75 225
I/O
I
= 0 mA -A75Y, -C75Y
SB
Device deselected, Cycle = 0 MHz, 30 mA
IN
V
VIL or VIN ≥ VIH, All inputs are static.
SB1
Device deselected, Cycle = 0 MHz, 15
IN
V
0.2 V or VIN ≥ V
I/O
V
0.2 V, All inputs are static.
SB2
Device deselected, Cycle = MAX., 110
IN
V
VIL or VIN ≥ V
ZZ ≥ VDD – 0.2 V, V
DD
IH
I/O
≤ VDDQ + 0.2 V 15 mA
DD
–2 +2
-A85, -C85 200
-A85Y, -C85Y
– 0.2 V,
A
µ
A
µ
2.5 V LVTTL Interface
High level output voltage V
Low level output voltage V
OHIOH
I
OLIOL
I
= –2.0 mA 1.7 V
OH
= –1.0 mA 2.1
= +2.0 mA 0.7 V
OL
= +1.0 mA 0.4
3.3 V LVTTL Interface
High level output voltage V
Low level output voltage V
OHIOH
OLIOL
= –4.0 mA 2.4 V
= +8.0 mA 0.4 V
Capacitance (TA = 25 °°°°C, f = 1MHz)
Parameter Symbol Test condition MIN. TYP. MAX. Unit
Input capacitance C
Input / Output capacitance C
Clock input capacitance C
IN
VIN = 0 V 6.0 pF
I/O
I/O
V
= 0 V 8.0 pF
clkVclk
= 0 V 6.0 pF
Remark These parameters are periodically sampled and not 100% tested.
14
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
AC Characteristics (VDD = 3.3 ± 0.165 V or 2.5 ± 0.125 V)
AC Test Conditions
2.5 V LVTTL Interface
Input waveform (Rise / Fall time ≤≤≤≤ 2.4 ns)
2.4 V
1.2 V
V
SS
Output waveform
3.3 V LVTTL Interface
Test points
Test points1.2 V 1.2 V
1.2 V
Input waveform (Rise / Fall time
3.0 V
V
SS
Output waveform
Output load condition
CL : 30 pF
5 pF (TKHQX1, TKHQX2, TGLQX, TGHQZ, TKHQZ)
I/O (Output)
≤≤≤≤ 3.0 ns)
1.5 V
Test points
Test points1.5 V 1.5 V
Figure External load at test
O = 50
Z
1.5 V
Remark C
50
VT = +1.2 V / +1.5 V
includes capacitances of the probe and jig, and stray capacitances.
L
Data Sheet M15561EJ3V0DS
L
C
15
µ
PD4481161, 4481181, 4481321, 4481361
Read and Write Cycle (2.5 V LVTTL Interface)
Parameter Symbol -A65, -A75, -C75 -A85, -C85 Unit Note
-A65Y, -A75Y, -C75Y -A85Y, -C85Y
(117 MHz) (100 MHz)
Standard Alias MIN. MAX. MIN. MAX.
Cycle time TKHKH TCYC 8.6 10 ns
Clock access time TKHQV TCD 7.5 8.5 ns
Output enable access time TGLQV TOE 3.5 3.5 ns
Clock high to output active TKHQX1 TDC1 2.5 2.5 ns 1, 2
Clock high to output change TKHQX2 TDC2 2.5 2.5 ns
Output enable to output active TGLQX TOLZ 0 0 ns 1
Output disable to output High-Z TGHQZ TOHZ 0 3.5 0 3.5 ns 1
Clock high to output High-Z TKHQZ TCZ 2.5 5 2.5 5 ns 1, 2
Clock high pulse width TKHKL TCH 2.5 2.5 ns
Clock low pulse width TKLKH TCL 2.5 2.5 ns
Setup times Address TAVKH TAS 1.5 2 ns
Address advance TADVVKH TADVS
Clock enable TEVKH TCES
Chip enable TCVKH TCSS
Data in TDVKH TDS
Write enable TWVKH TWS
Hold times Address TKHAX TAH 0.5 0.5 ns
Address advance TKHADVX TADVH
Clock enable TKHEX TCEH
Chip enable TKHCX TCSH
Data in TKHDX TDH
Write enable TKHWX TWH
Power down entry time TZZE TZZE 8.6 10 ns
Power down recovery time TZZR TZZR 8.6 10 ns
Notes 1. Transition is measured ±200 mV from steady state.
2. To avoid bus contention, the output buffers are designed such that TKHQZ (device turn-off) is faster than
TKHQX1 (device turn-on) at a given temperature and voltage. The specs as shown do not imply bus
contention because TKHQX1 is a min. parameter that is worse case at totally different conditions (TA
max.) than TKHQZ, which is a max. parameter (worse case at TA max., VDD min.).
VDD
16
Data Sheet M15561EJ3V0DS
min.,
µ
PD4481161, 4481181, 4481321, 4481361
Read and Write Cycle (3.3 V LVTTL Interface)
Parameter Symbol -A65 -A75 -A85 Unit Note
-A65Y -A75Y -A85Y
(133 MHz) (117 MHz) (100 MHz)
Standard Alias MIN. MAX. MIN. MAX. MIN. MAX.
Cycle time TKHKH TCYC 7.5 8.6 10 ns
Clock access time TKHQV TCD 6.5 7.5 8.5 ns
Output enable access time TGLQV TOE 3.5 3.5 3.5 ns
Clock high to output active TKHQX1 TDC1 2.5 2.5 2.5 ns 1, 2
Clock high to output change TKHQX2 TDC2 2.5 2.5 2.5 ns
Output enable to output active TGLQX TOLZ 0 0 0 ns 1
Output disable to output High-Z TGHQZ TOHZ 0 3.5 0 3.5 0 3.5 ns 1
Clock high to output High-Z TKHQZ TCZ 2.5 5 2.5 5 2.5 5 ns 1, 2
Clock high pulse width TKHKL TCH 2.5 2.5 2.5 ns
Clock low pulse width TKLKH TCL 2.5 2.5 2.5 ns
Setup times Address TAVKH TAS 1.5 1.5 2 ns
Address advance TADVVKH TADVS
Clock enable TEVKH TCES
Chip enable TCVKH TCSS
Data in TDVKH TDS
Write enable TWVKH TWS
Hold times Address TKHAX TAH 0.5 0.5 0.5 ns
Address advance TKHADVX TADVH
Clock enable TKHEX TCEH
Chip enable TKHCX TCSH
Data in TKHDX TDH
Write enable TKHWX TWH
Power down entry time TZZE TZZE 7.5 8.6 10 ns
Power down recovery time TZZR TZZR 7.5 8.6 10 ns
Notes 1. Transition is measured ±200 mV from steady state.
2. To avoid bus contention, the output buffers are designed such that TKHQZ (device turn-off) is faster than
TKHQX1 (device turn-on) at a given temperature and voltage. The specs as shown do not imply bus
contention because TKHQX1 is a min. parameter that is worse case at totally different conditions (TA
max.) than TKHQZ, which is a max. parameter (worse case at TA max., VDD min.).
VDD
Data Sheet M15561EJ3V0DS
min.,
17
READ / WRITE CYCLE
µ
PD4481161, 4481181, 4481321, 4481361
/CEs
/BWs
Address
CLK
TEVKH TKHEX
/CKE
TCVKH TKHCX
Note 1
TADVVKH TKHADVX
ADV
TWVKH TKHWX
/WE
TWVKH TKHWX
Note 2
12345678910
A1 A3 A4 A5 A6
TKHKH
TKLKHTKHKL
A2 A7
TAVKH TKHAX
Data In
Data Out
High-Z High-Z High-Z
High-Z High-Z
D (A1) D (A2)
TDVKH TKHDX TKHQX1
D (A2+1)
TKHQV
TKHQX2
Q (A3) Q (A4)
TGHQZ
TGLQV TKHQZ
Q (A4+1)
TGLQX
D (A5)
Q (A6) Q (A7)
TKHQX2
/G
Command
WRITE
D (A1)
WRITE
D (A2)
BURST WRITE
D (A2+1)
READ Q (A3)
READ
Q (A4)
BURST
READ
Q (A4+1)
WRITE
D (A5)
READ Q (A6)
WRITE
Q (A7)
DESELECT
Notes 1. /CEs refers to /CE, CE2 and /CE2. When /CEs is LOW, /CE and /CE2 are LOW and CE2 is HIGH. When
/CEs is HIGH, /CE and /CE2 are HIGH and CE2 is LOW.
/BWs refers to /BW1, /BW2, /BW3 and /BW4. When /BWs is LOW, any one or more byte write enables
2.
(/BW1, /BW2, /BW3 or /BW4) are LOW.
18
Data Sheet M15561EJ3V0DS
NOP, STALL AND DESELECT CYCLE
12345678910
CLK
/CKE
/CEs
ADV
/WE
/BWs
µ
PD4481161, 4481181, 4481321, 4481361
Address
Data In
Data Out
Command
High-Z
High-Z
WRITE
D (A1)
A2A1 A3 A4 A5
READ Q (A3)
High-Z
Q (A3)
WRITE
D (A4)
D (A4)
High-Z
STALL NOP
D (A1)
READ Q (A2)
Q (A2)
STALL
TKHQX2
READ Q (A5)
TKHQZ
Q (A5)
DESELECT
High-Z
High-Z
CONTINUE DESELECT
Data Sheet M15561EJ3V0DS
19
POWER DOWN (ZZ) CYCLE
µ
PD4481161, 4481181, 4481321, 4481361
CLK
/CKE
Note
/CEs
ADV
Note
/WE
/BWs
Address
Data Out
12345678910
A1
/G
High-Z High-Z
TKHKH
TKHKL TKLKH
Q (A1)
11 12
A2
Q1 (A2)
Q2 (A2)
ZZ
TZZE TZZR
Power Down (I
/WE or /CEs must be held HIGH at CLK rising edge (clock edge No.3 in this figure) prior to power down state
Note
SBZZ
) State
entry.
20
Data Sheet M15561EJ3V0DS
Package Drawing
100-PIN PLASTIC LQFP (14x20)
A B
µ
PD4481161, 4481181, 4481321, 4481361
81
100
80
1
51
50
31
30
F
G
H
M
I
K
P
SN
NOTE
Each lead centerline is located within 0.13 mm of its true position (T.P.) at maximum material condition.
L
detail of lead end
S
C D
R
Q
J
S
M
ITEM MILLIMETERS
A
22.0±0.2
B
20.0±0.2 C 14.0±0.2 D
16.0±0.2 F 0.825 G
0.575 H 0.32
I 0.13 J K L
M 0.17
N P Q
R3° S 1.7 MAX.
+0.08
0.07
0.65 (T.P.)
1.0±0.2
0.5±0.2
+0.06
0.05
0.10
1.4
0.125±0.075
+7°
3°
S100GF-65-8ET-1
Data Sheet M15561EJ3V0DS
21
Recommended Soldering Condition
µ
PD4481161, 4481181, 4481321, 4481361
Please consult with our sales offices for soldering conditions of the
Types of Surface Mount Devices
PD4481161GF : 100-pin PLASTIC LQFP (14 x 20)
µ
PD4481181GF : 100-pin PLASTIC LQFP (14 x 20)
µ
PD4481321GF : 100-pin PLASTIC LQFP (14 x 20)
µ
PD4481361GF : 100-pin PLASTIC LQFP (14 x 20)
µ
PD4481161, 4481181, 4481321 and 4481361.
µ
22
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
Revision History
Edition/ Page Type of Location Description
Date This Previous revision (Previous edition This edition)
edition edition
3rd edition/ Throughout Throughout Modification
Dec. 2002 Addition
Preliminary Data Sheet Data Sheet
Extended operating temperature products
(TA = 40 to +85 °C)
Data Sheet M15561EJ3V0DS
23
[MEMO]
µ
PD4481161, 4481181, 4481321, 4481361
24
Data Sheet M15561EJ3V0DS
[MEMO]
µ
PD4481161, 4481181, 4481321, 4481361
Data Sheet M15561EJ3V0DS
25
[MEMO]
µ
PD4481161, 4481181, 4481321, 4481361
26
Data Sheet M15561EJ3V0DS
µ
PD4481161, 4481181, 4481321, 4481361
NOTES FOR CMOS DEVICES
1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices on it.
2 HANDLING OF UNUSED INPUT PINS FOR CMOS
Note: No connection for CMOS device inputs can be cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
DD
pin should be connected to V being an output pin. All handling related to the unused pins must be judged device by device and related specifications governing the devices.
or GND with a resistor, if it is considered to have a possibility of
3 STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note: Power-on does not necessarily define initial status of MOS device. Production process of MOS does not define the initial operation status of the device. Immediately after the power source is turned ON, the devices with reset function have not yet been initialized. Hence, power-on does not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function.
Data Sheet M15561EJ3V0DS
27
µ
PD4481161, 4481181, 4481321, 4481361
ZEROSB is a trademark of NEC Electronics Corporation.
The information in this document is current as of December, 2002. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC Electronics data sheets or data books, etc., for the most up-to-date specifications of NEC Electronics products. Not all products and/or types are available in every country. Please check with an NEC Electronics sales representative for availability and additional information.
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M8E 02. 11-1
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