Datasheet FAN3223, FAN3224, FAN3225 Datasheet (Fairchild)

FAN3223 / FAN3224 / FAN3225 Dual 4A High-Speed, Low-Side Gate Drivers
Features
DD
= 12V
= 6V
OUT
Choice of TTL or CMOS Input Thresholds Three Versions of Dual Independent Drivers:
- Dual Inverting + Enable (FAN3223)
- Dual Non-Inverting + Enable (FAN3224)
- Dual-Inputs (FAN3225)
Internal Resistors Turn Driver Off If No Inputs MillerDrive™ Technology 12ns / 9ns Typical Rise/Fall Times with 2.2nF Load Typical Propagation Delay Under 20ns Matched
within 1ns to the Other Channel
Double Current Capability by Paralleling Channels 8-Lead 3x3mm MLP or 8-Lead SOIC Package Rated from –40°C to +125°C Ambient
Applications
Switch-Mode Power Supplies
  High-Efficiency MOSFET Switching Synchronous Rectifier Circuits DC-to-DC Converters Motor Control
Description
The FAN3223-25 family of dual 4A gate drivers is designed to drive N-channel enhancement-mode MOSFETs in low-side switching applications by providing high peak current pulses during the short switching intervals. The driver is available with either TTL or CMOS input thresholds. Internal circuitry provides an under-voltage lockout function by holding the output LOW until the supply voltage is within the operating range. In addition, the drivers feature matched internal propagation delays between A and B channels for applications requiring dual gate drives with critical timing, such as synchronous rectifiers. This also enables connecting two drivers in parallel to effectively double the current capability driving a single MOSFET.
The FAN322X drivers incorporate MillerDrive™ architecture for the final output stage. This bipolar­MOSFET combination provides high current during the Miller plateau stage of the MOSFET turn-on / turn-off process to minimize switching loss, while providing rail­to-rail voltage swing and reverse current capability.
The FAN3223 offers two inverting drivers and the FAN3224 offers two non-inverting drivers. Each device has dual independent enable pins that default to ON if not connected. In the FAN3225, each channel has dual inputs of opposite polarity, which allows configuration as non-inverting or inverting with an optional enable function using the second input. If one or both inputs are left unconnected, internal resistors bias the inputs such that the output is pulled LOW to hold the power MOSFET OFF.
Related Resources
AN-6069 — Application Review and Comparative Evaluation of Low-Side Gate Drivers
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
July 2012
FAN3223 FAN3224 FAN3225
Figure 1. Pin Configurations
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9
Ordering Information
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Part Number Logic
FAN3223CMPX
FAN3223CMX SOIC-8 Tape & Reel 2,500
FAN3223TMPX
FAN3223TMX SOIC-8 Tape & Reel 2,500
FAN3224CMPX
FAN3224CMX SOIC-8 Tape & Reel 2,500
FAN3224TMPX
FAN3224TMX SOIC-8 Tape & Reel 2,500
FAN3225CMPX
FAN3225CMX SOIC-8 Tape & Reel 2,500
FAN3225TMPX
FAN3225TMX SOIC-8 Tape & Reel 2,500
Dual Inverting Channels + Dual Enable
Dual Non-Inverting Channels + Dual Enable
Dual Channels of Two-Input / One­Output Drivers
Input
Threshold
CMOS
TTL
CMOS
TTL
CMOS
TTL
Package
3x3mm MLP-8 Tape & Reel 3,000
3x3mm MLP-8 Tape & Reel 3,000
3x3mm MLP-8 Tape & Reel 3,000
3x3mm MLP-8 Tape & Reel 3,000
3x3mm MLP-8 Tape & Reel 3,000
3x3mm MLP-8 Tape & Reel 3,000
Packing
Method
Quantity per Reel
Package Outlines
Figure 2. 3x3mm MLP-8 (Top View) Figure 3. SOIC-8 (Top View)
Thermal Characteristics
Package
8-Lead 3x3mm Molded Leadless Package (MLP)
8-Pin Small Outline Integrated Circuit (SOIC)
(1)
(2)
JL
1.2 64 42 2.8 0.7 °C/W
38 29 87 41 2.3 °C/W
(3)
JT
JA
(4)
JB
(5)
JT
Notes:
1. Estimates derived from thermal simulation; actual values depend on the application.
2. Theta_JL ( thermal pad) that are typically soldered to a PCB.
3. Theta_JT ( held at a uniform temperature by a top-side heatsink.
4. Theta_JA (Θ The value given is for natural convection with no heatsink using a 2S2P board, as specified in JEDEC standards JESD51-2, JESD51-5, and JESD51-7, as appropriate.
5. Psi_JB ( application circuit board reference point for the thermal environment defined in Note 4. For the MLP-8 package, the board reference is defined as the PCB copper connected to the thermal pad and protruding from either end of the package. For the SOIC-8 package, the board reference is defined as the PCB copper adjacent to pin 6.
6. Psi_JT ( the center of the top of the package for the thermal environment defined in Note 4.
): Thermal resistance between the semiconductor junction and the bottom surface of all the leads (including any
JL
): Thermal resistance between the semiconductor junction and the top surface of the package, assuming it is
JT
): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking, and airflow.
JA
): Thermal characterization parameter providing correlation between semiconductor junction temperature and an
JB
): Thermal characterization parameter providing correlation between the semiconductor junction temperature and
JT
(6)
Units
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 2
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
FAN3223 FAN3224 FAN3225
Figure 4. PinAssignments (Repeated)
Pin Definitions
Name Pin Description
ENA
ENB
GND
INA
INA+
INA-
INB
INB+
INB-
OUTA
OUTB
OUTA
OUTB
VDD
Enable Input for Channel A. Pull pin LOW to inhibit driver A. ENA has TTL thresholds for both TTL and CMOS INx threshold.
Enable Input for Channel B. Pull pin LOW to inhibit driver B. ENB has TTL thresholds for both TTL and CMOS INx threshold.
Ground. Common ground reference for input and output circuits.
Input to Channel A.
Non-Inverting Input to Channel A. Connect to VDD to enable output.
Inverting Input to Channel A. Connect to GND to enable output.
Input to Channel B.
Non-Inverting Input to Channel B. Connect to VDD to enable output.
Inverting Input to Channel B. Connect to GND to enable output.
Gate Drive Output A: Held LOW unless required input(s) are present and V
Gate Drive Output B: Held LOW unless required input(s) are present and V
is above UVLO threshold.
DD
is above UVLO threshold.
DD
Gate Drive Output A (inverted from the input): Held LOW unless required input is present and VDD is above UVLO threshold.
Gate Drive Output B (inverted from the input): Held LOW unless required input is present and VDD is above UVLO threshold.
Thermal Pad (MLP only). Exposed metal on the bottom of the package; may be left floating or connected
P1
to GND; NOT suitable for carrying current.
Supply Voltage. Provides power to the IC.
Output Logic
FAN3223 (x=A or B) FAN3224 (x=A or B) FAN3225 (x=A or B)
ENx INx
OUTx
0 0 0 0 0
0 1
(7)
1
0 1 1
(7)
1
1
(7)
0 0 1 0 0
(7)
0 1
Note:
7. Default input signal if no external connection is made.
ENx INx OUTx INx+ INx OUTx
(7)
0 0
(7)
0
(7)
1 1 1 1
(7)
0 1 0 1
(7)
0 0
(7)
1
(7)
0
(7)
0
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 3
Block Diagrams
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 5. FAN3223 Block Diagram
Figure 6. FAN3224 Block Diagram
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 4
Block Diagrams
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 7. FAN3225 Block Diagram
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 5
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only.
Symbol Parameter Min. Max. Unit
VDD VDD to PGND -0.3 20.0 V
VEN ENA and ENB to GND GND - 0.3 VDD + 0.3 V
VIN INA, INA+, INA–, INB, INB+ and INB– to GND GND - 0.3 VDD + 0.3 V
V
OUTA and OUTB to GND GND - 0.3 VDD + 0.3 V
OUT
TL Lead Soldering Temperature (10 Seconds) +260 ºC
TJ Junction Temperature -55 +150 ºC
T
Storage Temperature -65 +150 ºC
STG
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to Absolute Maximum Ratings.
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Symbol Parameter Min. Max. Unit
VDD Supply Voltage Range 4.5 18.0 V
VEN Enable Voltage ENA and ENB 0 VDD V
VIN Input Voltage INA, INA+, INA–, INB, INB+ and INB– 0 VDD V
TA Operating Ambient Temperature -40 +125 ºC
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 6
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Electrical Characteristics
Unless otherwise noted, VDD=12V, TJ=-40°C to +125°C. Currents are defined as positive into the device and negative out of the device.
Symbol Parameter Conditions Min. Typ. Max. Unit
Supply
VDD Operating Range 4.5 18.0 V
IDD
Supply Current, Inputs / EN Not Connected
VON Turn-On Voltage INA=ENA=VDD, INB=ENB=0V 3.5 3.9 4.3 V
V
Turn-Off Voltage INA=ENA=VDD, INB=ENB=0V 3.3 3.7 4.1 V
OFF
Inputs (FAN322xT)
V
INx Logic Low Threshold 0.8 1.2 V
INL_T
V
INx Logic High Threshold 1.6 2.0 V
INH_T
I
Non-inverting Input IN from 0 to VDD -1.5 175.0 µA
IN+
I
Inverting Input IN from 0 to VDD -175.0 1.5 µA
IN-
V
TTL Logic Hysteresis Voltage 0.2 0.4 0.8 V
HYS_T
Inputs (FAN322xC)
V
INx Logic Low Threshold 30 38 %V
INL_C
V
INx Logic High Threshold 55 70 %V
INH_C
I
IN Current, Low IN from 0 to VDD -1 175 µA
INL
I
IN Current, High IN from 0 to VDD -175 1 µA
INH
V
CMOS Logic Hysteresis Voltage 17 %V
HYS_C
(9)
(9)
ENABLE (FAN3223C, FAN3223T, FAN3224C, FAN3224T)
V
Enable Logic Low Threshold EN from 5V to 0V 0.8 1.2 V
ENL
V
Enable Logic High Threshold EN from 0V to 5V 1.6 2.0 V
ENH
V
TTL Logic Hysteresis Voltage
HYS_T
RPU Enable Pull-up Resistance
tD3 EN to Output Propagation Delay
tD4 EN to Output Propagation Delay
(10)
0.4 V
(10)
100 k
(11)
(11)
All except FAN3225C 0.70 0.95 mA
FAN3225C
(8)
0.21 0.35 mA
0V to 5V EN, 1V/ns Slew Rate 9 17 26 ns
5V to 0V EN, 1V/ns Slew Rate 11 18 28 ns
Continued on the following page…
DD
DD
DD
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 7
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Electrical Characteristics (Continued)
Unless otherwise noted, VDD=12V, TJ=-40°C to +125°C. Currents are defined as positive into the device and negative out of the device.
Symbol Parameter Conditions Min. Typ. Max. Unit
Output
I
OUT Current, Mid-Voltage, Sinking
SINK
I
OUT Current, Mid-Voltage, Sourcing
SOURCE
I
OUT Current, Peak, Sinking
PK_SINK
I
PK_SOURCE
tD1, tD2
OUT Current, Peak, Sourcing
t
Output Rise Time
RISE
t
Output Fall Time
FALL
Output Propagation Delay, CMOS
(12)
Inputs
(11)
(11)
C
C
(10)
(10)
C
(10)
C
tD1, tD2 Output Propagation Delay, TTL Inputs
T
DEL.MATCH
Propagation Matching Between Channels
I
Output Reverse Current Withstand
RVS
(10)
Notes:
8. Lower supply current due to inactive TTL circuitry.
9. EN inputs have TTL thresholds; refer to the ENABLE section
10. Not tested in production.
11. See Timing Diagrams of Figure 10 and Figure 11.
12. See Timing Diagrams of Figure 8 and Figure 9.
OUT at VDD/2, C
=0.22µF, f=1kHz
LOAD
OUT at V
(10)
C
LOAD
LOAD
LOAD
LOAD
LOAD
0 - 12V
(12)
0 - 5VIN, 1V/ns Slew Rate 9 17 29 ns
/2,
DD
=0.22µF, f=1kHz
=0.22µF, f=1kHz 5 A
=0.22µF, f=1kHz -5 A
=2200pF 12 20 ns
=2200pF 9 17 ns
, 1V/ns Slew Rate 10 18 29 ns
IN
INA=INB, OUTA and OUTB at 50% point
4.3 A
-2.8 A
2 4 ns
500 mA
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 8
Timing Diagrams
Figure 8. Non-Inverting (EN HIGH or Floating) Figure 9. Inverting (EN HIGH or Floating)
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
HIGH
Input
LOW
90%
Output
10%
V
Enable
V
ENH
ENL
t
D3
t
RISE
Figure 10. Non-Inverting (IN HIGH) Figure 11. Inverting (IN LOW)
t
D4
t
FALL
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 9
(13)
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 12. IDD (Static) vs. Supply Voltage
Figure 14. IDD(Static) vs. Supply Voltage
(13)
Figure 13. IDD (Static) vs. Supply Voltage
(13)
Figure 15. IDD (No-Load) vs. Frequency Figure 16. IDD (No-Load) vs. Frequency
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 10
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 17. IDD (2.2nF Load) vs. Frequency Figure 18. IDD (2.2nF Load) vs. Frequency
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 19. IDD (Static) vs. Temperature
Figure 21. IDD (Static) vs. Temperature
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 11
(13)
Figure 20. IDD (Static) vs. Temperature
(13)
(13)
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 22. Input Thresholds vs. Supply Voltage Figure 23. Input Thresholds vs. Supply Voltage
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 24. Input Threshold % vs. Supply Voltage
Figure 25. Input Thresholds vs. Temperature Figure 26. Input Thresholds vs. Temperature
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 12
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 27. UVLO Thresholds vs. Temperature Figure 28. UVLO Threshold vs. Temperature
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 29. Propagation Delay vs. Supply Voltage Figure 30. Propagation Delay vs. Supply Voltage
Figure 31. Propagation Delay vs. Supply Voltage Figure 32. Propagation Delay vs. Supply Voltage
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 13
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 33. Propagation Delays vs. Temperature Figure 34. Propagation Delays vs. Temperature
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 35. Propagation Delays vs. Temperature Figure 36. Propagation Delays vs. Temperature
Figure 37. Fall Time vs. Supply Voltage Figure 38. Rise Time vs. Supply Voltage
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 14
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 39. Rise and Fall Times vs. Temperature
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 40. Rise/Fall Waveforms with 2.2nF Load Figure 41. Rise/Fall Waveforms with 10nF Load
Figure 42. Quasi-Static Source Current
with VDD=12V
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 15
(14)
Figure 43. Quasi-Static Sink Current with VDD=12V
(14)
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 44. Quasi-Static Source Current
with VDD=8V
(14)
Figure 45. Quasi-Static Sink Current with VDD=8V
Notes:
13. For any inverting inputs pulled low, non-inverting inputs pulled high, or outputs driven high, static I
increases by
DD
the current flowing through the corresponding pull-up/down resistor shown in the block diagram.
14. The initial spike in each current waveform is a measurement artifact caused by the stray inductance of the current-measurement loop.
Test Circuit
(14)
Figure 46. Quasi-Static I
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 16
OUT
/ V
OUT
Test Circuit
Applications Information
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Input Thresholds
Each member of the FAN322x driver family consists of two identical channels that may be used independently at rated current or connected in parallel to double the individual current capacity. In the FAN3223 and FAN3224, channels A and B can be enabled or disabled independently using ENA or ENB, respectively. The EN pin has TTL thresholds for parts with either CMOS or TTL input thresholds. If ENA and ENB are not connected, an internal pull-up resistor enables the driver channels by default. ENA and ENB have TTL thresholds in parts with either TTL or CMOS INx threshold. If the channel A and channel B inputs and outputs are connected in parallel to increase the driver current capacity, ENA and ENB should be connected and driven together.
The FAN322x family offers versions in either TTL or CMOS input thresholds. In the FAN322xT, the input thresholds meet industry-standard TTL-logic thresholds independent of the V
voltage, and there is a
DD
hysteresis voltage of approximately 0.4V. These levels permit the inputs to be driven from a range of input logic signal levels for which a voltage over 2V is considered logic HIGH. The driving signal for the TTL inputs should have fast rising and falling edges with a slew rate of 6V/µs or faster, so a rise time from 0 to 3.3V should be 550ns or less. With reduced slew rate, circuit noise could cause the driver input voltage to exceed the hysteresis voltage and retrigger the driver input, causing erratic operation.
In the FAN322xC, the logic input thresholds are dependent on the V logic rising edge threshold is approximately 55% of V
level and, with VDD of 12V, the
DD
DD
and the input falling edge threshold is approximately 38% of VDD. The CMOS input configuration offers a hysteresis voltage of approximately 17% of V
. The
DD
CMOS inputs can be used with relatively slow edges (approaching DC) if good decoupling and bypass techniques are incorporated in the system design to prevent noise from violating the input voltage hysteresis window. This allows setting precise timing intervals by fitting an R-C circuit between the controlling signal and the IN pin of the driver. The slow rising edge at the IN pin of the driver introduces a delay between the controlling signal and the OUT pin of the driver.
Static Supply Current
In the IDD (static) typical performance characteristics
(Figure 12 - Figure 14 and Figure 19 - Figure 21) , the
curve is produced with all inputs/enables floating (OUT is low) and indicates the lowest static I tested configuration. For other states, additional current flows through the 100k resistors on the inputs and
outputs shown in the block diagram of each part (see Figure 5 - Figure 7). In these cases, the actual static I
current is the value obtained from the curves plus this additional current.
current for the
DD
DD
MillerDrive™ Gate Drive Technology
FAN322x gate drivers incorporate the MillerDrive™ architecture shown in Figure 47. For the output stage, a combination of bipolar and MOS devices provide large currents over a wide range of supply voltage and temperature variations. The bipolar devices carry the bulk of the current as OUT swings between 1/3 to 2/3 VDD and the MOS devices pull the output to the HIGH or LOW rail.
The purpose of the MillerDrive™ architecture is to speed up switching by providing high current during the Miller plateau region when the gate-drain capacitance of the MOSFET is being charged or discharged as part of the turn-on / turn-off process.
For applications that have zero voltage switching during the MOSFET turn-on or turn-off interval, the driver supplies high peak current for fast switching even though the Miller plateau is not present. This situation often occurs in synchronous rectifier applications because the body diode is generally conducting before the MOSFET is switched ON.
The output pin slew rate is determined by V
voltage
DD
and the load on the output. It is not user adjustable, but a series resistor can be added if a slower rise or fall time at the MOSFET gate is needed.
V
DD
Input
stage
V
OUT
Figure 47. MillerDrive™ Output Architecture
Under-Voltage Lockout
The FAN322x start-up logic is optimized to drive ground-referenced N-channel MOSFETs with an under­voltage lockout (UVLO) function to ensure that the IC starts up in an orderly fashion. When V below the 3.9V operational level, this circuit holds the output LOW, regardless of the status of the input pins. After the part is active, the supply voltage must drop
0.2V before the part shuts down. This hysteresis helps prevent chatter when low V
supply voltages have
DD
noise from the power switching. This configuration is not suitable for driving high-side P-channel MOSFETs because the low output voltage of the driver would turn the P-channel MOSFET ON with VDD below 3.9V.
is rising, yet
DD
VDD Bypass Capacitor Guidelines
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 17
To enable this IC to turn a device ON quickly, a local high-frequency bypass capacitor C ESL should be connected between the VDD and GND pins with minimal trace length. This capacitor is in addition to bulk electrolytic capacitance of 10µF to 47µF commonly found on driver and controller bias circuits.
A typical criterion for choosing the value of C keep the ripple voltage on the V is often achieved with a value 20 times the equivalent load capacitance C
, defined here as Q
EQV
Ceramic capacitors of 0.1µF to 1µF or larger are common choices, as are dielectrics, such as X5R and X7R with good temperature characteristics and high pulse current capability.
If circuit noise affects normal operation, the value of
may be increased to 50-100 times the C
C
BYP
C
may be split into two capacitors. One should be a
BYP
larger value, based on equivalent load capacitance, and the other a smaller value, such as 1-10nF mounted closest to the VDD and GND pins to carry the higher frequency components of the current pulses. The bypass capacitor must provide the pulsed current from both of the driver channels and, if the drivers are switching simultaneously, the combined peak current sourced from the C
would be twice as large as when
BYP
a single channel is switching.
with low ESR and
BYP
is to
supply to 5%. This
DD
BYP
GATE/VDD
EQV
.
, or
The FAN322x is compatible with many other
industry-standard drivers. In single input parts with enable pins, there is an internal 100k resistor tied to VDD to enable the driver by default; this should be considered in the PCB layout.
The turn-on and turn-off current paths should be
minimized, as discussed in the following section.
Figure 48 shows the pulsed gate drive current path when the gate driver is supplying gate charge to turn the MOSFET ON. The current is supplied from the local bypass capacitor, C the MOSFET gate and to ground. To reach the high peak currents possible, the resistance and inductance in the path should be minimized. The localized C to contain the high peak current pulses within this driver­MOSFET circuit, preventing them from disturbing the sensitive analog circuitry in the PWM controller.
, and flows through the driver to
BYP
BYP
acts
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Layout and Connection Guidelines
The FAN3223-25 family of gate drivers incorporates fast-reacting input circuits, short propagation delays, and powerful output stages capable of delivering current peaks over 4A to facilitate voltage transition times from under 10ns to over 150ns. The following layout and connection guidelines are strongly recommended:
Keep high-current output and power ground paths
separate logic and enable input signals and signal ground paths. This is especially critical when dealing with TTL-level logic thresholds at driver inputs and enable pins.
Keep the driver as close to the load as possible to
minimize the length of high-current traces. This reduces the series inductance to improve high­speed switching, while reducing the loop area that can radiate EMI to the driver inputs and surrounding circuitry.
If the inputs to a channel are not externally
connected, the internal 100k resistors indicated on block diagrams command a low output. In noisy environments, it may be necessary to tie inputs of an unused channel to VDD or GND using short traces to prevent noise from causing spurious output switching.
Many high-speed power circuits can be susceptible
to noise injected from their own output or other external sources, possibly causing output re­triggering. These effects can be obvious if the circuit is tested in breadboard or non-optimal circuit layouts with long input, enable, or output leads. For best results, make connections to all pins as short and direct as possible.
Figure 48. Current Path for MOSFET Turn-on
Figure 49 shows the current path when the gate driver turns the MOSFET OFF. Ideally, the driver shunts the current directly to the source of the MOSFET in a small circuit loop. For fast turn-off times, the resistance and inductance in this path should be minimized.
Figure 49. Current Path for MOSFET Turn-off
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 18
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Truth Table of Logic Operation
The FAN3225 truth table indicates the operational states using the dual-input configuration. In a non-inverting driver configuration, the IN- pin should be a logic LOW signal. If the IN- pin is connected to logic HIGH, a disable function is realized, and the driver output remains LOW regardless of the state of the IN+ pin.
IN+ IN- OUT
0 0 0
0 1 0
1 0 1
1 1 0
In the non-inverting driver configuration in Figure 50, the IN- pin is tied to ground and the input signal (PWM) is applied to IN+ pin. The IN- pin can be connected to logic HIGH to disable the driver and the output remains LOW, regardless of the state of the IN+ pin.
Operational Waveforms
At power-up, the driver output remains LOW until the
voltage reaches the turn-on threshold. The
V
DD
magnitude of the OUT pulses rises with V steady-state V
is reached. The non-inverting
DD
operation illustrated in Figure 52 shows that the output remains LOW until the UVLO threshold is reached, then the output is in-phase with the input.
until
DD
Figure 50. Dual-Input Driver Enabled,
Non-Inverting Configuration
In the inverting driver application in Figure 51, the IN+ pin is tied HIGH. Pulling the IN+ pin to GND forces the output LOW, regardless of the state of the IN- pin.
Figure 51. Dual-Input Driver Enabled,
Inverting Configuration
Figure 52. Non-Inverting Start-Up Waveforms
For the inverting configuration of Figure 51, startup waveforms are shown in Figure 53. With IN+ tied to VDD and the input signal applied to IN–, the OUT pulses are inverted with respect to the input. At power­up, the inverted output remains LOW until the V
DD
voltage reaches the turn-on threshold, then it follows the input with inverted phase.
Figure 53. Inverting Startup Waveforms
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 19
Thermal Guidelines
Gate drivers used to switch MOSFETs and IGBTs at high frequencies can dissipate significant amounts of power. It is important to determine the driver power dissipation and the resulting junction temperature in the application to ensure that the part is operating within acceptable temperature limits.
The total power dissipation in a gate driver is the sum of two components, P
P
= P
TOTAL
GATE
GATE
+ P
and P
DYNAMIC
Gate Driving Loss: The most significant power loss results from supplying gate current (charge per unit time) to switch the load MOSFET ON and OFF at the switching frequency. The power dissipation that results from driving a MOSFET at a specified gate­source voltage, V switching frequency, F
P
= QG • VGS • FSW • n (2)
GATE
, with gate charge, QG, at
GS
SW
n is the number of driver channels in use (1 or 2).
Dynamic Pre-drive / Shoot-through Current: A power loss resulting from internal current consumption under dynamic operating conditions, including pin pull-up / pull-down resistors, can be obtained using the “I
(No-Load) vs. Frequency”
DD
graphs in Typical Performance Characteristics to determine the current I under actual operating conditions:
P
DYNAMIC
= I
• VDD • n (3)
DYNAMIC
Once the power dissipated in the driver is determined, the driver junction rise with respect to circuit board can be evaluated using the following thermal equation,
assuming
was determined for a similar thermal
JB
design (heat sinking and air flow):
T
= P
J
TOTAL
+ TB (4)
JB
where: T
= driver junction temperature
J
= (psi) thermal characterization parameter
JB
relating temperature rise to total power dissipation
T
= board temperature in location as defined in
B
the Thermal Characteristics table.
:
DYNAMIC
(1)
, is determined by:
drawn from VDD
DYNAMIC
To give a numerical example, if the synchronous rectifier switches in the forward converter of Figure 54 are FDMS8660S, the datasheet gives a total gate charge of 60nC at V
= 7V, so two devices in parallel
GS
would have 120nC gate charge. At a switching frequency of 300kHz, the total power dissipation is:
P
= 120nC • 7V • 300kHz • 2 = 0.5W (5)
GATE
P
P
= 1.5mA • 7V • 2 = 0.021W (6)
DYNAMIC
= 0.52W (7)
TOTAL
The SOIC-8 has a junction-to-board thermal characterization parameter of
= 42°C/W. In a
JB
system application, the localized temperature around the device is a function of the layout and construction of the PCB along with airflow across the surfaces. To ensure reliable operation, the maximum junction temperature of the device must be prevented from exceeding the maximum rating of 150°C; with 80% derating, T
would be limited to 120°C. Rearranging
J
Equation 4 determines the board temperature required to maintain the junction temperature below 120°C:
T
= TJ - P
B,MAX
T
= 120°C – 0.52W • 42°C/W = 98°C (9)
B,MAX
TOTAL
(8)
JB
For comparison, replace the SOIC-8 used in the previous example with the 3x3mm MLP package with
= 2.8°C/W. The 3x3mm MLP package could operate
JB
at a PCB temperature of 118°C, while maintaining the junction temperature below 120°C. This illustrates that the physically smaller MLP package with thermal pad offers a more conductive path to remove the heat from the driver. Consider tradeoffs between reducing overall circuit size with junction temperature reduction for increased reliability.
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 20
Typical Application Diagrams
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Figure 54. High Current Forward Converter
with Synchronous Rectification
Figure 56. Secondary Controlled Full Bridge with Current Doubler Output, Synchronous
Figure 55. Center-tapped Bridge Output with
Synchronous Rectifiers
Rectifiers (Simplified)
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 21
Table 1. Related Products
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
Type
Single 1A FAN3111C +1.1A / -0.9A CMOS Single Channel of Dual-Input/Single-Output SOT23-5, MLP6
Single 1A FAN3111E +1.1A / -0.9A External
Single 2A FAN3100C +2.5A / -1.8A CMOS Single Channel of Two-Input/One-Output SOT23-5, MLP6
Single 2A FAN3100T +2.5A / -1.8A TTL Single Channel of Two-Input/One-Output SOT23-5, MLP6
Dual 2A FAN3216T +2.4A / -1.6A TTL Dual Inverting Channels SOIC8
Dual 2A FAN3217T +2.4A / -1.6A TTL Dual Non-Inverting Channels SOIC8
Dual 2A FAN3226C +2.4A / -1.6A CMOS Dual Inverting Channels + Dual Enable SOIC8, MLP8
Dual 2A FAN3226T +2.4A / -1.6A TTL Dual Inverting Channels + Dual Enable SOIC8, MLP8
Dual 2A FAN3227C +2.4A / -1.6A CMOS Dual Non-Inverting Channels + Dual Enable SOIC8, MLP8
Dual 2A FAN3227T +2.4A / -1.6A TTL Dual Non-Inverting Channels + Dual Enable SOIC8, MLP8
Dual 2A FAN3228C +2.4A / -1.6A CMOS Dual Channels of Two-Input/One-Output, Pin Config.1 SOIC8, MLP8
Dual 2A FAN3228T +2.4A / -1.6A TTL Dual Channels of Two-Input/One-Output, Pin Config.1 SOIC8, MLP8
Dual 2A FAN3229C +2.4A / -1.6A CMOS Dual Channels of Two-Input/One-Output, Pin Config.2 SOIC8, MLP8
Dual 2A FAN3229T +2.4A / -1.6A TTL Dual Channels of Two-Input/One-Output, Pin Config.2 SOIC8, MLP8
Dual 2A FAN3268T +2.4A / -1.6A TTL
Part
Number
Gate Drive
(Sink/Src)
(15)
Threshold
Input
(16)
Single Non-Inverting Channel with External Reference SOT23-5, MLP6
20V Non-Inverting Channel (NMOS) and Inverting Channel (PMOS) + Dual Enables
Logic Package
SOIC8
Dual 2A FAN3278T +2.4A / -1.6A TTL
Dual 4A FAN3213T +2.5A / -1.8A TTL Dual Inverting Channels SOIC8
Dual 4A FAN3214T +2.5A / -1.8A TTL Dual Non-Inverting Channels SOIC8
Dual 4A FAN3223C +4.3A / -2.8A CMOS Dual Inverting Channels + Dual Enable SOIC8, MLP8
Dual 4A FAN3223T +4.3A / -2.8A TTL Dual Inverting Channels + Dual Enable SOIC8, MLP8
Dual 4A FAN3224C +4.3A / -2.8A CMOS Dual Non-Inverting Channels + Dual Enable SOIC8, MLP8
Dual 4A FAN3224T +4.3A / -2.8A TTL Dual Non-Inverting Channels + Dual Enable SOIC8, MLP8
Dual 4A FAN3225C +4.3A / -2.8A CMOS Dual Channels of Two-Input/One-Output SOIC8, MLP8
Dual 4A FAN3225T +4.3A / -2.8A TTL Dual Channels of Two-Input/One-Output SOIC8, MLP8
Single 9A FAN3121C +9.7A / -7.1A CMOS Single Inverting Channel + Enable SOIC8, MLP8
Single 9A FAN3121T +9.7A / -7.1A TTL Single Inverting Channel + Enable SOIC8, MLP8
Single 9A FAN3122T +9.7A / -7.1A CMOS Single Non-Inverting Channel + Enable SOIC8, MLP8
Single 9A FAN3122C +9.7A / -7.1A TTL Single Non-Inverting Channel + Enable SOIC8, MLP8
30V Non-Inverting Channel (NMOS) and Inverting Channel (PMOS) + Dual Enables
SOIC8
Notes:
15. Typical currents with OUTx at 6V and V
DD=
12V.
16. Thresholds proportional to an externally supplied reference voltage.
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 22
Physical Dimensions
2X
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
0.8 MAX
0.05
0.00
SEATING PLANE
2X
RECOMMENDED LAND PATTERN
A. CONFORMS TO JEDEC REGISTRATION MO-229,
VARIATION VEEC, DATED 11/2001
B. DIMENSIONS ARE IN MILLIMETERS.
C. DIMENSIONS AND TOLERANCES PER
ASME Y14.5M, 1994
D. FILENAME: MKT-MLP08Drev2
Figure 57. 3x3mm, 8-Lead Molded Leadless Package (MLP)
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 23
Physical Dimensions (Continued)
5.00
4.80
3.81
8
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
A
0.65
5
B
6.20
5.80
4.00
1.75
5.60
3.80
PIN ONE
INDICATOR
(0.33)
1
0.25
4
1.27
1.27
CMBA0.25
LAND PATTERN RECOMMENDATION
SEE DETAIL A
0.10
0.25
1.75 MAX
0.51
0.33
0.50
R0.10
0.25
R0.10
8° 0°
0.90
0.406
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/
(1.04)
DETAIL A
SCALE: 2:1
C
0.10 C
x 45°
GAGE PLANE
0.36
SEATING PLANE
Figure 58. 8-Lead SOIC
0.19
OPTION A - BEVEL EDGE
OPTION B - NO BEVEL EDGE
NOTES: UNLESS OTHERWISE SPECIFIED
A) THIS PACKAGE CONFORMS TO JEDEC MS-012, VARIATION AA, ISSUE C, B) ALL DIMENSIONS ARE IN MILLIMETERS. C) DIMENSIONS DO NOT INCLUDE MOLD FLASH OR BURRS. D) LANDPATTERN STANDARD: SOIC127P600X175-8M. E) DRAWING FILENAME: M08AREV13
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 24
FAN3223 / FAN3224 / FAN3225 — Dual 4A High-Speed, Low-Side Gate Drivers
© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com FAN3223 / FAN3224 / FAN3225 • Rev. 1.0.9 25
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