AGND 20, 21 Analog ground
ANALOG IN 19 I Analog input
CLK 12 I Clock input
DGND 2, 24 Digital ground
D1–D8 3–10 O Digital data out. D1:LSB, D8:MSB
OE 1 I Output enable. When OE = L, data is enabled. When OE = H, D1–D8 is high impedance.
V
DDA
14, 15, 18 Analog V
DD
V
DDD
11, 13 Digital V
DD
REFB 23 I ADC reference voltage in (bottom)
REFBS 22 Reference voltage (bottom). When using the internal voltage divider to generate a nominal 2-V reference,
the REFBS terminal is shorted to the REFB terminal and the REFTS terminal is shorted to the REFT terminal
(see Figure 13 and Figure 14).
REFT 17 I Reference voltage in (top)
REFTS 16 Reference voltage (top). When using the internal voltage divider to generate a nominal 2-V reference, the
REFTS terminal is shorted to the REFT terminal and the REFBS terminal is shorted to the REFB terminal
(see Figure 13 and Figure 14).
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
†
Supply voltage, V
DDA
, V
DDD
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference voltage input range, V
I(REFT)
, V
I(REFB)
, V
I(REFBS)
, V
I(REFTS)
AGND to V
DDA
. . . . . . . . . . . . . . .
Analog input voltage range, V
I(ANLG)
AGND to V
DDA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range, V
I(DGTL)
DGND to V
DDD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital output voltage range, V
O(DGTL)
DGND to V
DDD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
: TLC5540C 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TLC5540I –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
–55°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.