TL16C550B, TL16C550BI
ASYNCHRONOUS COMMUNICATIONS ELEMENT
SLLS136B – JANUARY 1994 – REVISED AUGUST 1996
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
system timing requirements over recommended ranges of supply voltage and operating free-air
temperature
PARAMETER ALT. SYMBOL FIGURE TEST CONDITIONS MIN MAX UNIT
t
cR
Cycle time, read (tw7 + td8 + td9) RC 87 ns
t
cW
Cycle time, write (tw6 + td5 + td6) WC 87 ns
t
w1
Pulse duration, clock high t
XH
1 f = 9 MHz maximum 40 ns
t
w2
Pulse duration, clock low t
XL
1 f = 9 MHz maximum 40 ns
t
w5
Pulse duration, address strobe low t
ADS
2,3 9 ns
t
w6
Pulse duration, write strobe t
WR
2 40 ns
t
w7
Pulse duration, read strobe tRD 3 40 ns
t
w8
Pulse duration, master reset t
MR
1 µs
t
su1
Setup time, address valid before ADS↑ t
AS
2,3 8 ns
t
su2
Setup time, chip select valid before ADS↑ t
CS
2,3 8 ns
t
su3
Setup time, data valid before WR1↓ or WR2↑ t
DS
2 15 ns
t
h1
Hold time, address low after ADS↑ t
AH
2,3 0 ns
t
h2
Hold time, chip select valid after ADS↑ t
CH
2,3 0 ns
t
h3
Hold time, chip select valid after WR1↑ or WR2↓ t
WCS
2 10 ns
t
h4
Hold time, address valid after WR1↑ or WR2↓ t
WA
2 10 ns
t
h5
Hold time, data valid after WR1↑ or WR2↓ t
DH
2 5 ns
t
h6
Hold time, chip select valid after RD1↑ or RD2↓ t
RCS
3 10 ns
t
h7
Hold time, address valid after RD1↑ or RD2↓ t
RA
3 20 ns
t
d4
†
Delay time, chip select valid before WR1↓ or WR2↑ t
CSW
2 7 ns
t
d5
†
Delay time, address valid before WR1↓ or WR2↑ t
AW
2 7 ns
t
d6
†
Delay time, write cycle, WR1↑ or WR2↓ to ADS↓ t
WC
2 40 ns
t
d7
†
Delay time, chip select valid to RD1↓ or RD2↑ t
CSR
3 7 ns
t
d8
†
Delay time, address valid to RD1↓ or RD2↑ t
AR
3 7 ns
t
d9
Delay time, read cycle, RD1↑ or RD2↓ to ADS↓ tRC 3 40 ns
t
d10
Delay time, RD1↓ or RD2↑ to data valid t
RVD
3 CL = 75 pF 45 ns
t
d11
Delay time, RD1↑ or RD2↓ to floating data t
HZ
3 CL = 75 pF 20 ns
†
Only applies when ADS is low
system switching characteristics over recommended ranges of supply voltage and operating
free-air temperature (see Note 2)
PARAMETER ALT. SYMBOL FIGURE TEST CONDITIONS MIN MAX UNIT
t
dis(R)
Disable time, RD1↑↓ or RD2↓↑ to DDIS↑↓ t
RDD
3 CL = 75 pF 20 ns
NOTE 2: Charge and discharge time is determined by VOL, VOH, and external loading.
baud generator switching characteristics over recommended ranges of supply voltage and
operating free-air temperature, C
L
= 75 pF
PARAMETER ALT. SYMBOL FIGURE TEST CONDITIONS MIN MAX UNIT
t
w3
Pulse duration, BAUDOUT low t
LW
1 f = 9 MHz, CLK ÷ 2 80 ns
t
w4
Pulse duration, BAUDOUT high t
HW
1 f = 9 MHz, CLK ÷ 2 80 ns
t
d1
Delay time, XIN↑ to BAUDOUT↑ t
BLD
1 75 ns
t
d2
Delay time, XIN↑↓ to BAUDOUT↓ t
BHD
1 65 ns