Samsung M393B1K70QB0-CMA User Manual

Rev.1.1, Aug. 2013
240pin Registered DIMM
based on 2Gb Q-die
78FBGA with Lead-Free & Halogen-Free (RoHS compliant)
M393B1K70QB0
datasheet
SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE.
Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.
This document and all information discussed herein remain the sole and exclusive property of Samsung Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other­wise.
Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply.
For updates or additional information about Samsung products, contact your nearest Samsung office.
All brand names, trademarks and registered trademarks belong to their respective owners.
2013 Samsung Electronics Co., Ltd. All rights reserved.
- 1 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM
Revision History
Revision No. History Draft Date Remark Editor
1.0 - First SPEC. Release Jun. 2013 - S.H.Kim
1.1 - Deleted by changing line-up (4GB : 1Rx4, 2Rx8) Aug. 2013 - S.H.Kim
- 2 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM
Table Of Contents
240pin Registered DIMM based on 2Gb Q-die
1. DDR3 Registered DIMM Ordering Information .............................................................................................................4
2. Key Features.................................................................................................................................................................4
3. Address Configuration ..................................................................................................................................................4
4. Registered DIMM Pin Configurations (Front side/Back side)........................................................................................5
5. Pin Description .............................................................................................................................................................6
6. ON DIMM Thermal Sensor ...........................................................................................................................................6
7. Input/Output Functional Description..............................................................................................................................7
8. Pinout Comparison Based On Module Type.................................................................................................................8
9. Registering Clock Driver Specification..........................................................................................................................9
9.1 Timing & Capacitance values .................................................................................................................................. 9
9.2 Clock driver Characteristics.....................................................................................................................................9
10. Function Block Diagram:.............................................................................................................................................10
10.1 8GB, 1Gx72 Module (Populated as 2 ranks of x4 DDR3 SDRAMs)......................................................................10
11. Absolute Maximum Ratings ........................................................................................................................................12
11.1 Absolute Maximum DC Ratings............................................................................................................................. 12
11.2 DRAM Component Operating Temperature Range ..............................................................................................12
12. AC & DC Operating Conditions...................................................................................................................................12
12.1 Recommended DC Operating Conditions (SSTL-15)............................................................................................ 12
13. AC & DC Input Measurement Levels ..........................................................................................................................13
13.1 AC & DC Logic Input Levels for Single-ended Signals..........................................................................................13
13.2 V
13.3 AC and DC Logic Input Levels for Differential Signals ..........................................................................................16
13.3.1. Differential Signals Definition ......................................................................................................................... 16
13.3.2. Differential Swing Requirement for Clock (CK -
13.3.3. Single-ended Requirements for Differential Signals ......................................................................................18
13.3.4. Differential Input Cross Point Voltage ............................................................................................................ 19
13.4 Slew Rate Definition for Single Ended Input Signals.............................................................................................19
13.5 Slew rate definition for Differential Input Signals ................................................................................................... 19
14. AC & DC Output Measurement Levels .......................................................................................................................20
14.1 Single Ended AC and DC Output Levels...............................................................................................................20
14.2 Differential AC and DC Output Levels ................................................................................................................... 20
14.3 Single-ended Output Slew Rate ............................................................................................................................ 20
14.4 Differential Output Slew Rate ................................................................................................................................ 21
15. DIMM IDD specification definition ...............................................................................................................................22
16. IDD SPEC Table .........................................................................................................................................................24
17. Input/Output Capacitance ...........................................................................................................................................25
18. Electrical Characteristics and AC timing .....................................................................................................................26
18.1 Refresh Parameters by Device Density................................................................................................................. 26
18.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin ................................................................26
18.3 Speed Bins and CL, tRCD, tRP, tRC and tRAS for corresponding Bin ................................................................. 26
18.3.1. Speed Bin Table Notes .................................................................................................................................. 30
19. Timing Parameters by Speed Grade ..........................................................................................................................31
19.1 Jitter Notes ............................................................................................................................................................37
19.2 Timing Parameter Notes........................................................................................................................................ 38
20. Physical Dimensions...................................................................................................................................................39
20.1 512Mbx4 based 1Gx72 Module (2 Ranks) - M393B1K70QB0..............................................................................39
20.1.1. x72 DIMM, populated as two physical ranks of x4 DDR3 SDRAMs...............................................................39
Tolerances.................................................................................................................................................... 15
REF
CK) and Strobe (DQS - DQS) ............................................. 16
- 3 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM

1. DDR3 Registered DIMM Ordering Information

Part Number
M393B1K70QB0-CK0/MA 8GB 1Gx72 512Mx4(K4B2G0446Q-BC##)*36 2 30mm
NOTE :
1. "##" - K0/MA
2. K0(1600Mbps 11-11-11) / MA(1866Mbps 13-13-13)
- DDR3-1866(13-13-13) is backward compatible to DDR3-1600(11-11-11)
3. Please contact Samsung for product availability.
2
Density Organization
Component Composition
1
Number of
Rank

2. Key Features

Speed
tCK(min) 2.5 1.875 1.5 1.25 1.071 ns
CAS Latency 6 7 9 11 13 nCK
tRCD(min) 15 13.125 13.5 13.75 13.91 ns
tRP(min) 15 13.125 13.5 13.75 13.91 ns
tRAS(min) 37.5 37.5 36 35 34 ns
tRC(min) 52.5 50.625 49.5 48.75 47.91 ns
DDR3-800 DDR3-1066 DDR3-1333 DDR3-1600 DDR3-1866
6-6-6 7-7-7 9-9-9 11-11-11 13-13-13
Height
Unit
• JEDEC standard 1.5V ± 0.075V Power Supply
•V
= 1.5V ± 0.075V
DDQ
• 400MHz fCK for 800Mb/sec/pin, 533MHz fCK for 1066Mb/sec/pin, 667MHz fCK for 1333Mb/sec/pin, 800MHz fCK for 1600Mb/sec/pin, 933MHz fCK for 1866Mb/sec/pin
• 8 independent internal bank
• Programmable CAS Latency: 6,7,8,9,10,11,13
• Programmable Additive Latency(Posted CAS) : 0, CL - 2, or CL - 1 clock
• Programmable CAS Write Latency(CWL) = 5 (DDR3-800), 6 (DDR3-1066), 7 (DDR3-1333), 8 (DDR3-1600) and 9 (DDR3-1866)
• Burst Length: 8 (Interleave without any limit, sequential with starting address “000” only), 4 with tCCD = 4 which does not allow seamless read or
write [either On the fly using A12 or MRS]
• Bi-directional Differential Data Strobe
• On Die Termination using ODT pin
• Average Refresh Period 7.8us at lower then T
• Asynchronous Reset
85C, 3.9us at 85C < T
CASE
CASE
95C

3. Address Configuration

Organization Row Address Column Address Bank Address Auto Precharge
512Mx4(2Gb) based Module A0-A14 A0-A9, A11 BA0-BA2 A10/AP
- 4 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM

4. Registered DIMM Pin Configurations (Front side/Back side)

Pin Front Pin Back Pin Front Pin Back Pin Front Pin Back
1
2
V
REFDQ
V
121
SS
122 DQ4 43 DQS8 163
3 DQ0 123 DQ5 44
4 DQ1 124
5
6
V
SS
125
DQS0 126
7 DQS0 127
8
V
SS
128 DQ6 KEY 89
9 DQ2 129 DQ7 49
10 DQ3 130
11
V
SS
131 DQ12 51
12 DQ8 132 DQ13 52 BA2 172 A14 93
13 DQ9 133
14
15
V
SS
134
DQS1 135
16 DQS1 136
17
V
SS
137 DQ14 57
18 DQ10 138 DQ15 58 A5 178 A6 99 DQ48 219 DQ53
19 DQ11 139
20
V
SS
140 DQ20 60
21 DQ16 141 DQ21 61 A2 181 A1 102
22 DQ17 142
23
24
V
SS
143
DQS2 144
25 DQS2 145
26
V
SS
146 DQ22 66
27 DQ18 147 DQ23 67
28 DQ19 148
29
V
SS
149 DQ28 69
30 DQ24 150 DQ29 70 A10/AP 190 BA1 111
31 DQ25 151
32
33
V
SS
152
DQS3 153
34 DQS3 154
35
V
SS
155 DQ30 75
36 DQ26 156 DQ31 76 S1,NC 196 A13 117 SA0 237 SA1
37 DQ27 157
38
V
SS
158 CB4,NC 78
39 CB0,NC 159 CB5,NC 79 S2,NC 199
40 CB1,NC 160
41
V
SS
161
NOTE : NC = No internal Connection
V
SS
V
SS
DM0,DQS9
,TDQS9
DQS9
NC,
TDQS9
,
V
SS
V
SS
V
SS
DM1,DQS10
,TDQS10
DQS10
NC,
TDQS10
,
V
SS
V
SS
V
SS
DM2,DQS11
,TDQS11
DQS11
NC,
TDQS11
,
V
SS
V
SS
V
SS
DM3,DQS12
,TDQS12
DQS12
NC,
TDQS12
,
V
SS
V
SS
V
SS
DM8,DQS17 TDQS17,NC
42 DQS8 162
V
SS
164 CB6,NC 84 DQS4 204
45 CB2,NC 165 CB7,NC 85 DQS4 205
46 CB3,NC 166
47
48
V
SS
, NC
V
TT
V
, NC
TT
167 NC(TEST) 87 DQ34 207 DQ39
168
169 CKE1, NC 90 DQ40 210 DQ45
50 CKE0 170
V
DD
171 NC 92
53 Err_Out/NC 173
54
V
DD
174 A12/BC 95
55 A11 175 A9 96 DQ42 216 DQ47
56 A7 176
V
DD
177 A8 98
59 A4 179
V
DD
62
V
DD
180 A3 101
182
63 NC, CK1 183
64 NC,
65
CK1 184 CK0 105 DQ50 225 DQ55
V
V
V
REFCA
DD
DD
185 CK0 106 DQ51 226
186
187 EVENT,NC 108 DQ56 228 DQ61
68 NC/Par_In 188 A0 109 DQ57 229
V
DD
189
71 BA0 191
72
73
V
DD
WE 193 S0 114 DQ58 234 DQ63
192 RAS 113
74 CAS 194
V
DD
195 ODT0 116
77 ODT1,NC 197
V
DD
80
V
SS
198 S3,NC 119 SA2 239
200 DQ36
81 DQ32 201 DQ37
SAMSUNG ELECTRONICS CO., Ltd. reserves the right to change products and specifications without notice.
DQS17
NC,
TDQS17
,
V
V
SS
SS
82 DQ33 202
83
86
V
SS
V
SS
RESET 88 DQ35 208
V
SS
V
DD
91 DQ41 211
V
SS
DQS5 213
V
DD
V
DD
V
DD
94 DQS5 214
V
SS
97 DQ43 217
V
SS
100 DQ49 220
V
SS
DQS6 222
V
DD
V
DD
V
DD
V
DD
103 DQS6 223
104
107
110
V
SS
V
SS
V
SS
DQS7 231
V
DD
V
DD
V
DD
V
SS
112 DQS7 232
V
SS
115 DQ59 235
V
SS
118 SCL 238 SDA
120
V
TT
203
DM4,DQS13
206 DQ38
209 DQ44
212
DM5,DQS14
215 DQ46
218 DQ52
221
DM6,DQS15
224 DQ54
227 DQ60
230
DM7/DQS16
DM7,
233 DQ62
236
240
V
SS
,TDQS13
DQS13
NC,
,
TDQS13
V
SS
V
SS
V
SS
,TDQS14
DQS14
NC,
TDQS14
,
V
SS
V
SS
V
SS
,TDQS15
DQS15
NC,
TDQS15
,
V
SS
V
SS
V
SS
TDQS16
DQS16
,TDQS16
V
SS
V
SS
V
DDSPD
V
SS
V
TT
- 5 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM

5. Pin Description

Pin Name Description Number Pin Name Description Number
CK0 Clock Input, positive line 1 ODT[1:0] On Die Termination Inputs 2
CK0 Clock Input, negative line 1 DQ[63:0] Data Input/Output 64
CKE[1:0] Clock Enables 2 CB[7:0] Data check bits Input/Output 8
RAS Row Address Strobe 1 DQS[8:0] Data strobes 9
CAS Column Address Strobe 1 DQS[8:0] Data strobes, negative line 9
DM[8:0]/
WE Write Enable 1
S[3:0] Chip Selects 4
A[9:0],A11,
A[15:13]
A10/AP Address Input/Autoprecharge 1 EVENT
A12/BC Address Input/Burst chop 1 TEST
BA[2:0] SDRAM Bank Addresses 3 RESET Register and SDRAM control pin 1
SCL Serial Presence Detect (SPD) Clock Input 1
SDA SPD Data Input/Output 1
SA[2:0] SPD Address Inputs 3
Par_In Parity bit for the Address and Control bus 1
Err_Out
NOTE : * The V
DD
Address Inputs 2\14 RFU Reserved for Future Use 2
Parity error found on the Address and Control bus
and V
pins are tied common to a single power-plane on these designs.
DDQ
1
DQS[17:9]
TDQS[17:9]
DQS[17:9]
TDQS[17:9]
V
DD
V
SS
V
REFDQ
V
REFCA
V
TT
V
DDSPD
Data Masks/ Data strobes, Termination data strobes
Data strobes, negative line, Termination data strobes
Reserved for optional hardware temperature sensing
Memory bus test toll (Not Connected and Not Usable on DIMMs)
Power Supply 22
Ground 59
Reference Voltage for DQ 1
Reference Voltage for CA 1
Termination Voltage 4
SPD Power 1
Total 240
9
9
1
1

6. ON DIMM Thermal Sensor

EVENT
NOTE : 1. All Samsung RDIMM support Thermal sensor on DIMM
2. When the SPD and the thermal sensor are placed on the module, R1 is placed but R2 is not.
When only the SPD is placed on the module, R2 is placed but R1 is not.
[ Table 1 ] Temperature Sensor Characteristics
Grade Range
75 < Ta < 95 - +/- 0.5 +/- 1.0
B
40 < Ta < 125 - +/- 1.0 +/- 2.0 -
-20 < Ta < 125 - +/- 2.0 +/- 3.0 -
Resolution 0.25 C /LSB -
SCL
R1 0
EVENT
WP/
SA0 SA1 SA2 R2 0
SA0 SA1 SA2
Min. Typ. Max.
SDA
Temperature Sensor Accuracy
Units NOTE
-
C
- 6 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM

7. Input/Output Functional Description

Symbol Type Polarity Function
CK0 Input
CK0 Input
CKE[1:0] Input Active High
S[3:0] Input Active Low
ODT[1:0] Input Active High On-Die Termination control signals
RAS, CAS, WE Input Active Low
V
REFDQ
V
REFCA
BA[2:0] Input
A[15:13,
12/BC,11,
10/AP,9:0]
DQ[63:0],
CB[7:0]
DM[8:0]
DQS[17:0] I/O Positive Edge Positive line of the differential data strobe for input and output data.
DQS[17:0] I/O Negative Edge Negative line of the differential data strobe for input and output data.
TDQS[17:9],
TDQS[17:9] OUT
SA[2:0] IN
SDA I/O
SCL IN
EVENT
V
DDSPD
RESET IN
Par_In IN Parity bit for the Address and Control bus. ("1 " : Odd, "0 ": Even)
Err_Out
TEST Used by memory bus analysis tools (unused (NC) on memory DIMMs)
Supply Reference voltage for DQ0-DQ63 and CB0-CB7
Supply Reference voltage for A0-A15, BA0-BA2, RAS, CAS, WE, S0, S1, CKE0, CKE1, Par_In, ODT0 and ODT1.
Input
I/O Data and Check Bit Input/Output pins
OUT (open drain)
Supply
OUT (open drain)
Positive
Edge
Negative
Edge
Active Low
Positive line of the differential pair of system clock inputs that drives input to the on-DIMM Clock Driver.
Negative line of the differential pair of system clock inputs that drives the input to the on-DIMM Clock Driver.
CKE HIGH activates, and CKE LOW deactivates internal clock signals, and device input buffers and output drivers of the SDRAMs. Taking CKE LOW provides PRECHARGE POWER-DOWN and SELF REFRESH operation (all banks idle), or ACTIVE POWER DOWN (row ACTIVE in any bank)
Enables the associated SDRAM command decoder when low and disables decoder when high. When decoder is disabled, new commands are ignored and previous operations continue. These input signals also disable all outputs (except CKE and ODT) of the register(s) on the DIMM when both inputs are high. When both S[1:0] are high, all register outputs (except CKE, ODT and Chip select) remain in the previous state. For modules supporting 4 ranks, S[3:2] operate similarly to S[1:0] for a second set of reg­ister outputs.
When sampled at the positive rising edge of the clock, CAS, RAS, and WE define the operation to be exe­cuted by the SDRAM.
Selects which SDRAM bank of eight is activated. BA0 - BA2 define to which bank an Active, Read, Write or Precharge command is being applied. Bank address also determines mode register is to be accessed during an MRS cycle.
Provided the row address for Active commands and the column address and Auto Precharge bit for Read/ Write commands to select one location out of the memory array in the respective bank. A10 is sampled dur­ing a Precharge command to determine whether the Precharge applies to one bank (A10 LOW) or all banks (A10 HIGH). If only one bank is to be precharged, the bank is selected by BA. A12 is also utilized for BL 4/8 identification for "BL on the fly" during CAS command. The address inputs also provide the op-code during Mode Register Set commands.
Active High Masks write data when high, issued concurrently with input data.
, VSS Supply Power and ground for the DDR SDRAM input buffers and core logic.
V
DD
Supply Termination Voltage for Address/Command/Control/Clock nets.
V
TT
TDQS/TDQS is applicable for X8 DRAMs only. When enabled via Mode Register A11=1 in MR1, DRAM will enable the same termination resistance function on TDQS/TDQS that is applied to DQS/DQS. When dis­abled via mode register A11=0 in MR1, DM/TDQS will provide the data mask function and TDQS is not used. X4/X16 DRAMs must disable the TDQS function via mode register A11=0 in MR1
These signals are tied at the system planar to either VSS or V address range.
This bidirectional pin is used to transfer data into or out of the SPD EEPROM. A resistor must be connected from the SDA bus line to V
This signal is used to clock data into and out of the SPD EEPROM. A resistor may be connected from the SCL bus time to V
This signal indicates that a thermal event has been detected in the thermal sensing device.The system should guarantee the electrical level requirement is met for the EVENT pin on TS/SPD part.
Serial EEPROM positive power supply wired to a separate power pin at the connector which supports from
3.0 Volt to 3.6 Volt (nominal 3.3V) operation.
The RESET pin is connected to the RESET pin on the register and to the RESET pin on the DRAM. When low, all register outputs will be driven low and the Clock Driver clocks to the DRAMs and register(s) will be set to low level (the Clock Driver will remain synchronized with the input clock)
Parity error detected on the Address and Control bus. A resistor may be connected from bus line to VDD on the system planar to act as a pull up.
on the system planar to act as a pull-up.
DDSPD
on the system planar to act as a pull-up.
DDSPD
to configure the serial SPD EEPROM
DDSPD
Err_Out
- 7 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM

8. Pinout Comparison Based On Module Type

Pin
48, 49
120, 240
53 Err_Out
63 NC
64 NC CK1
68 Par_In Connected to the register on all RDIMMs NC Not used on RDIMMs
76 S1 Connected to the register on all RDIMMs S1
77 ODT1, NC
79 S2, NC
167 NC TEST input used only on bus analysis probes NC
169 CKE1
171 A15
172 A14 A14
196 A13 A13
198 S3, NC
39, 40, 45, 46, 158, 159, 164,
165
125, 134, 143, 152, 161, 203, 212, 221, 230
126, 135, 144, 153, 162, 204, 213, 222, 231
187
NOTE : NC = No internal Connection
Signal NOTE Signal NOTE
V
TT
VTT
CBn Used on all RDIMMs; (n = 0...7) NC, CBn
DQSn,
TDQSn
DQSn,
TDQSn
EVENT
NC
Additional connection for Termination Voltage for Address/Command/Control/Clock nets.
Termination Voltage for Address/Command/Con­trol/Clock nets.
Connected to the register on all RDIMMs NC Not used on UDIMMs
Not used on RDIMMs
Connected to the register on dual- and quadrank RDIMMs; NC on single-rank RDIMMs
Connected to the register on quad-rank RDIMMs, not connected on single or dual rank RDIMMs
Connected to the register on dual- and quadrank RDIMMs; NC on single-rank RDIMMs
Connected to the register on all RDIMMs
Connected to the register on quad-rank RDIMMs, not connected on single-or dual-rank RDIMMs
Connected to DQS on x4 SDRAMs, TDQS on x8 SDRAMs on RDIMMs; (n = 9...17)
Connected to DQS on x4 DRAMs, TDQS on x8 SDRAMs on RDIMMs; (n=9...17)
Connected to optional thermal sensing compo­nent. NC on Modules without a thermal sensing component.
RDIMM UDIMM
NC Not used on UDIMMs
V
TT
NC NC Not used on UDIMMs
CK1
ODT1,NC
NC Not used on UDIMMs
CKE1,
NC
A15, NC Depending on device density, may not be
NC Not used on UDIMMs
DMn
NC Not used on UDIMMs
NC Not used on UDIMMs
Termination Voltage for Address/Command/Con­trol/Clock nets.
Used for 2 rank UDIMMs, not used on single-rank UDIMMs, but terminated
Used for dual-rank UDIMMs, not connected on single-rank UDIMMs
Used for dual-rank UDIMMs, not connected on single-rank UDIMMs
TEST input used only on bus analysis probes
Used for dual-rank UDIMMs, not connected on single-rank UDIMMs
connected to SDRAMs on UDIMMs. However, these signals are terminated on UDIMMs. A15 not routed on some RCs
Used on x72 UDIMMs, (n = 0...7); not used on x64 UDIMMs
Connected to DM on x8 DRAMs, UDM or LDM on x16 DRAMs on UDIMMs; (n = 0...8)
- 8 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM

9. Registering Clock Driver Specification

9.1 Timing & Capacitance values

TC = TBD
= 1.5 0.075V
Symbol Parameter Conditions
fclock Input Clock Frequency application frequency 300 670 MHz
tCH/t
CL
t
ACT
t
SU
t
H
t
PDM
t
DIS
t
EN
CIN(DATA)
CIN(CLOCK)
C
(RST)
IN
Pulse duration, CK, CK HIGH or LOW 0.4 -
Inputs active time4 before RESET is taken HIGH
Setup time Input valid before CK/CK 100 - ps
Hold time
Propagation delay, single-bit switching CK/CK to output 0.65 1.0 ns
output disable time(1/2-Clock pre-launch)
output disable time(3/4-Clock pre-launch) 0.25 -
output enable time(1/2-Clock pre-launch)
output enable time(3/4-Clock pre-launch) - 0.25
Data Input Capacitance 1.5 2.5
Data Input Capacitance 2 3
Reset Input Capacitance - 3
DCKE0/1 = LOW and DCS0/1 = HIGH
Input to remain Valid after CK/ CK
CK/CK to output float
CK/CK to output driving
V
DD
Min Max
8-
175 -
0.5 -
- 0.5
Units Notes
t
CK
t
CK
t
CK
t
CK
pF

9.2 Clock driver Characteristics

Symbol Parameter Conditions
t
jit
t
t
t
jit
t
jit
t
t
t
(cc)
STAB
t
fdyn
CKsk
(per)
(hper)
Qsk1
Qsk1
dynoff
Cycle-to-cycle period jitter 0 40 ps
Stabilization time -6us
Dynamic phase offset -50 50 ps
Clock Output skew 50 ps
Yn Clock Period jitter -40 40 ps
Half period jitter -50 50 ps
Qn Output to clock tolerance (Standard 1/2 -Clock Pre-Launch)
Output clock tolerance (3/4 Clock Pre-Launch)
Maximum re-driven dynamic clock off-set -80 80 ps
Output Inversion enabled -100 200
OUtput Inversion disabled -100 300
Output Inversion enabled -100 200
OUtput Inversion disabled -100 300
TC = TBD
VDD = 1.5 0.075V
Min Max
Units Notes
ps
ps
- 9 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM

10. Function Block Diagram:

10.1 8GB, 1Gx72 Module (Populated as 2 ranks of x4 DDR3 SDRAMs)

RS0A
RRASA
RCASA
RWEA
PCK0A
RCKE0A
RODT0A
A[N:0]A
DQS17 DQS17
VSS
CB[7:4]
DQS12 DQS12
VSS
DQ[31:28]
DQS11 DQS11
VSS
DQ[23:20]
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
PCK0A
D17
RAS
CASWECKCKCKE
D12
RAS
CASWECKCKCKE
D11
RAS
CASWECKCKCKE
/BA[N:0]A
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
RS1A
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
PCK1A
D17B
RAS
CASWECKCKCKE
D12B
RAS
CASWECKCKCKE
D11B
RAS
CASWECKCKCKE
PCK1A
RCKE1A
RODT1A
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
DQS8 DQS8
VSS
CB[3:0]
DQS3 DQS3
VSS
DQ[27:24]
DQS2 DQS2
VSS
DQ[19:16]
RS0A
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
RRASA
RCASA
RWEA
PCK0A
D8
RAS
CASWECKCKCKE
D3
RAS
CASWECKCKCKE
D2
RAS
CASWECKCKCKE
PCK0A
RCKE0A
RODT0A
A[N:0]A
/BA[N:0]A
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
RS1A
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
PCK1A
D8B
RAS
CASWECKCKCKE
D3B
RAS
CASWECKCKCKE
D2B
RAS
CASWECKCKCKE
PCK1A
RCKE1A
RODT1A
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
DQS10 DQS10
VSS
DQ[15:12]
DQS0 DQS0
VSS
DQ[3:0]
DQS DQS DM
D10
DQ[3:0]
CS
RAS
CASWECKCKCKE
DQS DQS DM DQ[3:0]
CS
RAS
CASWECKCKCKE
Vtt
ODT
D0
ODT
DQS DQS DM DQ[3:0]
A[N:0]/BA[N:0]
DQS DQS DM DQ[3:0]
A[N:0]/BA[N:0]
CS
RAS
CASWECKCKCKE
CS
RAS
CASWECKCKCKE
D10B
D0B
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
DQS1 DQS1
VSS
DQ[11:8]
DQS9 DQS9
VSS
DQ[7:4]
DQS DQS DM
D1
DQ[3:0]
CS
RAS
CASWECKCKCKE
DQS DQS DM DQ[3:0]
CS
RAS
CASWECKCKCKE
Vtt
ODT
D9
ODT
DQS DQS DM DQ[3:0]
A[N:0]/BA[N:0]
DQS DQS DM DQ[3:0]
A[N:0]/BA[N:0]
D1B
CS
RAS
CASWECKCKCKE
D9B
CS
RAS
CASWECKCKCKE
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
- 10 -
Rev. 1.1
Registered DIMM
RS0B
DQS4 DQS4
VSS
CB[35:32]
DQS5 DQS5
VSS
DQ[43:40]
DQS6 DQS6
VSS
DQ[51:48]
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
RRASB
RCASB
RWEB
PCK0B
D4
RAS
CASWECKCKCKE
D5
RAS
CASWECKCKCKE
D6
RAS
CASWECKCKCKE
PCK0B
RCKE0B
RODT0B
/BA[N:0]B
A[N:0]B
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
RS1B
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
datasheet DDR3 SDRAM
PCK1B
PCK1B
RCKE1B
D4B
RAS
CASWECKCKCKE
D5B
RAS
CASWECKCKCKE
D6B
RAS
CASWECKCKCKE
RODT1B
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
DQS13 DQS13
VSS
CB[39:36]
DQS14 DQS14
VSS
DQ[47:44]
DQS15 DQS15
VSS
DQ[55:52]
RS0B
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
RRASB
RCASB
RWEB
PCK0B
D13
RAS
CASWECKCKCKE
D14
RAS
CASWECKCKCKE
D15
RAS
CASWECKCKCKE
PCK0B
RCKE0B
RODT0B
/BA[N:0]B
A[N:0]B
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
RS1B
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
DQS DQS DM DQ[3:0]
CS
PCK1B
D13B
RAS
CASWECKCKCKE
D14B
RAS
CASWECKCKCKE
D15B
RAS
CASWECKCKCKE
PCK1B
RCKE1B
RODT1B
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
ODT
A[N:0]/BA[N:0]
DQS7 DQS7
VSS
DQ[59:56]
DQS DQS DM DQ[3:0]
CS
D7
RAS
CASWECKCKCKE
ODT
A[N:0]/BA[N:0]
DQS DQS DM DQ[3:0]
CS
D7B
RAS
CASWECKCKCKE
ODT
A[N:0]/BA[N:0]
DQS16 DQS16
DQ[63:60]
Vtt
Integrated Thermal sensor in SPD
SCL
EVENT EVENT
A0
A1 A2
SDA
SA0 SA1 SA2
Serial PD w/ integrated Thermal sensor
V
DDSPD
V
DD
V
TT
V
REFCA
V
REFDQ
V
SS
Serial PD
D0 - D35
D0 - D35
D0 - D35
D0 - D35
NOTE:
1. See wiring diagrams for resistor values.
2. ZQ pins of each SDRAM are connected to individual RZQ resistors (240 +/-1%)ohms...
VSS
DQS DQS DM DQ[3:0]
CS
D16
RAS
CASWECKCKCKE
ODT
DQS DQS DM DQ[3:0]
A[N:0]/BA[N:0]
D16B
CS
RAS
CASWECKCKCKE
ODT
A[N:0]/BA[N:0]
Vtt
RS0A -> CS0 : SDRAMs D[3:0], D[12:8], D17 RS0B -> CS0 : SDRAMs D[7:4]B, D[16:13] B
RS1A -> CS1 : SDRAMs D[3:0]B, D[12:8]B, D17B RS1B -> CS1 : SDRAMs D[7:4], D[16:13]
RBA[N:0]A -> BA[N:0]: SDRAMs D[3:0], D[12:8], D17,D[3:0]B, D[12:8]B, D17B RBA[N:0]B -> BA[N:0]: SDRAMs D[7:4], D[16:13], D[7:4]B, D[16:13]B
RA[N:0]A -> A[N:0]: SDRAMs D[3:0], D[12:8], D17, D[3:0]B, D[12:8]B, D17B RA[N:0]B -> A[N:0]: SDRAMs D[7:4], D[16:13], D[7:4], D[16:13]B
RRASA -> RAS: SDRAMs D[3:0], D[12:8],D17, D[3:0]B, D[12:8]B, D17B RRASB -> RAS: SDRAMs D[7:4], D[16:13], D[7:4]B, D[16:13]B
RCASA -> CAS: SDRAMs D[3:0], D[12:8], D17, D[3:0]B, D[12:8]B, D17B RCASB -> CAS: SDRAMs D[7:4], D[16:13], D[7:4]B, D[16:13]B
1:2
RWEA -> WE: SDRAMs D[3:0], D[12:8], D17, D[3:0]B, D[12:8]B, D17B
R
RWEB -> WE: SDRAMs D[7:4], D[16:13], D[7:4]B, D[16:13]B
E
RCKE0A -> CKE0: SDRAMs D[3:0], D[12:8], D17
G
RCKE0B -> CKE0: SDRAMs D[7:4]B, D[16:13]B
I
RCKE1A -> CKE1: SDRAMs D[3:0], D[12:8]B, D17B
S
RCKE1B -> CKE1: SDRAMs D[7:4], D[16:13]
T
RODT0A -> ODT0: SDRAMs D[3:0], D[12:8], D17
E
RODT0B -> ODT0: SDRAMs D[7:4]B, D[16:13]B
R
RODT1A -> ODT1: SDRAMs D[3:0]B, D[12:8]B, D17B
RODT1B -> ODT1: SDRAMs D[7:4], D[16:13] PCK0A -> CK: SDRAMs D[3:0], D[12:8], D17 PCK0B -> CK: SDRAMs D[7:4]B, D[16:13]B
PCK1A -> CK: SDRAMs D[3:0]B, D[12:8]B, D17B PCK1B -> CK: SDRAMs D[7:4], D[16:13]
PCK0A -> CK: SDRAMs D[3:0], D[12:8], D17 PCK0B -> CK: SDRAMs D[7:4]B, D[16:13]B
PCK1A -> CK: SDRAMs D[3:0]B, D[12:8]B, D17B PCK1B -> CK: SDRAMs D[7:4], D[16:13]
ERR_OUT
RST
RST : SDRAMs D[17:0], D[17:0]B
BA[N:0]
A[N:0]
RAS
CAS
WE
CKE0
CKE1
ODT0
ODT1
S0
S1
CK0
CK0
CK1 CK1
PAR_IN
RESET
120
- 11 -
Rev. 1.1
Registered DIMM
datasheet DDR3 SDRAM

10. Absolute Maximum Ratings

10.1 Absolute Maximum DC Ratings

Symbol Parameter Rating Units NOTE
V
DD
Voltage on V
V
DDQ
V
NOTE :
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to JESD51-2 standard.
3. VDD and V
equal to or less than 300mV.
Voltage on any pin relative to V
IN, VOUT
T
Storage Temperature -55 to +100 C 1, 2
STG
DDQ

10.2 DRAM Component Operating Temperature Range

Symbol Parameter rating Unit NOTE
T
OPER
NOTE :
1. Operating Temperature T JESD51-2.
2. The Normal Temperature Range specifies the temperatures where all DRAM specifications will be supported. During operation, the DRAM case temperature must be main­tained between 0-85C under all operating conditions
3. Some applications require operation of the Extended Temperature Range between 85C and 95C case temperature. Full specifications are guaranteed in this range, but the following additional conditions apply:
a) Refresh commands must be doubled in frequency, therefore reducing the refresh interval tREFI to 3.9us. b) If Self-Refresh operation is required in the Extended Temperature Range, then it is mandatory to either use the Manual Self-Refresh mode with Extended Temperature
Range capability (MR2 A6 = 0b and MR2 A7 = 1b), in this case IDD6 current can be increased around 10~20% than normal Temperature range.
Voltage on VDD pin relative to V
pin relative to V
DDQ
must be within 300mV of each other at all times; and V
SS
SS
SS
Operating Temperature Range 0 to 95 C 1, 2, 3
is the case surface temperature on the center/top side of the DRAM. For measurement conditions, please refer to the JEDEC document
OPER
-0.4 V ~ 1.975 V V 1,3
-0.4 V ~ 1.975 V V 1,3
-0.4 V ~ 1.975 V V 1
must be not greater than 0.6 x V
REF
, When VDD and V
DDQ
are less than 500mV; V
DDQ
REF
may be

11. AC & DC Operating Conditions

11.1 Recommended DC Operating Conditions (SSTL-15)

Symbol Parameter
V
DD
V
DDQ
NOTE:
1. Under all conditions V
tracks with VDD. AC parameters are measured with VDD and V
2. V
DDQ
Supply Voltage 1.425 1.5 1.575 V 1,2
Supply Voltage for Output 1.425 1.5 1.575 V 1,2
must be less than or equal to VDD.
DDQ
tied together.
DDQ
Min. Typ. Max.
Rating
Units NOTE
- 13 -
Loading...
+ 27 hidden pages