78FBGA with Lead-Free & Halogen-Free
(RoHS compliant)
M393B1K70QB0
datasheet
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- 1 -
Rev. 1.1
Registered DIMM
datasheetDDR3 SDRAM
Revision History
Revision No.HistoryDraft DateRemarkEditor
1.0- First SPEC. ReleaseJun. 2013-S.H.Kim
1.1- Deleted by changing line-up (4GB : 1Rx4, 2Rx8)Aug. 2013-S.H.Kim
- 2 -
Rev. 1.1
Registered DIMM
datasheetDDR3 SDRAM
Table Of Contents
240pin Registered DIMM based on 2Gb Q-die
1. DDR3 Registered DIMM Ordering Information .............................................................................................................4
8. Pinout Comparison Based On Module Type.................................................................................................................8
10. Function Block Diagram:.............................................................................................................................................10
10.1 8GB, 1Gx72 Module (Populated as 2 ranks of x4 DDR3 SDRAMs)......................................................................10
11. Absolute Maximum Ratings ........................................................................................................................................12
11.1 Absolute Maximum DC Ratings............................................................................................................................. 12
11.2 DRAM Component Operating Temperature Range ..............................................................................................12
12. AC & DC Operating Conditions...................................................................................................................................12
12.1 Recommended DC Operating Conditions (SSTL-15)............................................................................................ 12
13. AC & DC Input Measurement Levels ..........................................................................................................................13
13.1 AC & DC Logic Input Levels for Single-ended Signals..........................................................................................13
13.2 V
13.3 AC and DC Logic Input Levels for Differential Signals ..........................................................................................16
13.3.2. Differential Swing Requirement for Clock (CK -
13.3.3. Single-ended Requirements for Differential Signals ......................................................................................18
13.3.4. Differential Input Cross Point Voltage ............................................................................................................ 19
13.4 Slew Rate Definition for Single Ended Input Signals.............................................................................................19
13.5 Slew rate definition for Differential Input Signals ................................................................................................... 19
14. AC & DC Output Measurement Levels .......................................................................................................................20
14.1 Single Ended AC and DC Output Levels...............................................................................................................20
14.2 Differential AC and DC Output Levels ................................................................................................................... 20
18. Electrical Characteristics and AC timing .....................................................................................................................26
18.1 Refresh Parameters by Device Density................................................................................................................. 26
18.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin ................................................................26
18.3 Speed Bins and CL, tRCD, tRP, tRC and tRAS for corresponding Bin ................................................................. 26
18.3.1. Speed Bin Table Notes .................................................................................................................................. 30
19. Timing Parameters by Speed Grade ..........................................................................................................................31
- DDR3-1866(13-13-13) is backward compatible to DDR3-1600(11-11-11)
3. Please contact Samsung for product availability.
2
DensityOrganization
Component Composition
1
Number of
Rank
2. Key Features
Speed
tCK(min)2.51.8751.51.251.071ns
CAS Latency6791113nCK
tRCD(min)1513.12513.513.7513.91ns
tRP(min)1513.12513.513.7513.91ns
tRAS(min)37.537.5363534ns
tRC(min)52.550.62549.548.7547.91ns
DDR3-800DDR3-1066DDR3-1333DDR3-1600DDR3-1866
6-6-67-7-79-9-911-11-1113-13-13
Height
Unit
• JEDEC standard 1.5V ± 0.075V Power Supply
•V
= 1.5V ± 0.075V
DDQ
• 400MHz fCK for 800Mb/sec/pin, 533MHz fCK for 1066Mb/sec/pin, 667MHz fCK for 1333Mb/sec/pin, 800MHz fCK for 1600Mb/sec/pin,
933MHz fCK for 1866Mb/sec/pin
BA[2:0]SDRAM Bank Addresses3RESETRegister and SDRAM control pin1
SCLSerial Presence Detect (SPD) Clock Input1
SDASPD Data Input/Output1
SA[2:0]SPD Address Inputs3
Par_InParity bit for the Address and Control bus1
Err_Out
NOTE :
* The V
DD
Address Inputs2\14RFUReserved for Future Use2
Parity error found on the Address and Control
bus
and V
pins are tied common to a single power-plane on these designs.
DDQ
1
DQS[17:9]
TDQS[17:9]
DQS[17:9]
TDQS[17:9]
V
DD
V
SS
V
REFDQ
V
REFCA
V
TT
V
DDSPD
Data Masks/ Data strobes,
Termination data strobes
Data strobes, negative line, Termination data
strobes
Reserved for optional hardware temperature
sensing
Memory bus test toll (Not Connected and Not
Usable on DIMMs)
Power Supply22
Ground59
Reference Voltage for DQ1
Reference Voltage for CA1
Termination Voltage4
SPD Power1
Total240
9
9
1
1
6. ON DIMM Thermal Sensor
EVENT
NOTE : 1. All Samsung RDIMM support Thermal sensor on DIMM
2. When the SPD and the thermal sensor are placed on the module, R1 is placed but R2 is not.
When only the SPD is placed on the module, R2 is placed but R1 is not.
[ Table 1 ] Temperature Sensor Characteristics
GradeRange
75 < Ta < 95-+/- 0.5+/- 1.0
B
40 < Ta < 125-+/- 1.0+/- 2.0-
-20 < Ta < 125-+/- 2.0+/- 3.0-
Resolution0.25C /LSB-
SCL
R1
0
EVENT
WP/
SA0SA1SA2
R2
0
SA0SA1SA2
Min.Typ. Max.
SDA
Temperature Sensor Accuracy
UnitsNOTE
-
C
- 6 -
Rev. 1.1
Registered DIMM
datasheetDDR3 SDRAM
7. Input/Output Functional Description
SymbolTypePolarityFunction
CK0Input
CK0Input
CKE[1:0]InputActive High
S[3:0]InputActive Low
ODT[1:0]InputActive High On-Die Termination control signals
RAS, CAS, WEInputActive Low
V
REFDQ
V
REFCA
BA[2:0]Input
A[15:13,
12/BC,11,
10/AP,9:0]
DQ[63:0],
CB[7:0]
DM[8:0]
DQS[17:0] I/O Positive Edge Positive line of the differential data strobe for input and output data.
DQS[17:0] I/ONegative Edge Negative line of the differential data strobe for input and output data.
TDQS[17:9],
TDQS[17:9] OUT
SA[2:0]IN
SDAI/O
SCLIN
EVENT
V
DDSPD
RESETIN
Par_InINParity bit for the Address and Control bus. ("1 " : Odd, "0 ": Even)
Err_Out
TESTUsed by memory bus analysis tools (unused (NC) on memory DIMMs)
SupplyReference voltage for DQ0-DQ63 and CB0-CB7
SupplyReference voltage for A0-A15, BA0-BA2, RAS, CAS, WE, S0, S1, CKE0, CKE1, Par_In, ODT0 and ODT1.
Input
I/O Data and Check Bit Input/Output pins
OUT
(open
drain)
Supply
OUT
(open
drain)
Positive
Edge
Negative
Edge
Active Low
Positive line of the differential pair of system clock inputs that drives input to the on-DIMM Clock Driver.
Negative line of the differential pair of system clock inputs that drives the input to the on-DIMM Clock Driver.
CKE HIGH activates, and CKE LOW deactivates internal clock signals, and device input buffers
and output drivers of the SDRAMs. Taking CKE LOW provides PRECHARGE POWER-DOWN
and SELF REFRESH operation (all banks idle), or ACTIVE POWER DOWN (row ACTIVE in any bank)
Enables the associated SDRAM command decoder when low and disables decoder when high.
When decoder is disabled, new commands are ignored and previous operations continue.
These input signals also disable all outputs (except CKE and ODT) of the register(s) on the DIMM when both
inputs are high. When both S[1:0] are high, all register outputs (except CKE, ODT and Chip select) remain in
the previous state. For modules supporting 4 ranks, S[3:2] operate similarly to S[1:0] for a second set of register outputs.
When sampled at the positive rising edge of the clock, CAS, RAS, and WE define the operation to be executed by the SDRAM.
Selects which SDRAM bank of eight is activated.
BA0 - BA2 define to which bank an Active, Read, Write or Precharge command is being applied. Bank
address also determines mode register is to be accessed during an MRS cycle.
Provided the row address for Active commands and the column address and Auto Precharge bit for Read/
Write commands to select one location out of the memory array in the respective bank. A10 is sampled during a Precharge command to determine whether the Precharge applies to one bank (A10 LOW) or all banks
(A10 HIGH). If only one bank is to be precharged, the bank is selected by BA. A12 is also utilized for BL 4/8
identification for "BL on the fly" during CAS command. The address inputs also provide the op-code during
Mode Register Set commands.
Active High Masks write data when high, issued concurrently with input data.
, VSS Supply Power and ground for the DDR SDRAM input buffers and core logic.
V
DD
Supply Termination Voltage for Address/Command/Control/Clock nets.
V
TT
TDQS/TDQS is applicable for X8 DRAMs only. When enabled via Mode Register A11=1 in MR1, DRAM will
enable the same termination resistance function on TDQS/TDQS that is applied to DQS/DQS. When disabled via mode register A11=0 in MR1, DM/TDQS will provide the data mask function and TDQS is not used.
X4/X16 DRAMs must disable the TDQS function via mode register A11=0 in MR1
These signals are tied at the system planar to either VSS or V
address range.
This bidirectional pin is used to transfer data into or out of the SPD EEPROM. A resistor must be
connected from the SDA bus line to V
This signal is used to clock data into and out of the SPD EEPROM. A resistor may be connected
from the SCL bus time to V
This signal indicates that a thermal event has been detected in the thermal sensing device.The system
should guarantee the electrical level requirement is met for the EVENT pin on TS/SPD part.
Serial EEPROM positive power supply wired to a separate power pin at the connector which supports from
3.0 Volt to 3.6 Volt (nominal 3.3V) operation.
The RESET pin is connected to the RESET pin on the register and to the RESET pin on the DRAM. When
low, all register outputs will be driven low and the Clock Driver clocks to the DRAMs and register(s) will be set
to low level (the Clock Driver will remain synchronized with the input clock)
Parity error detected on the Address and Control bus. A resistor may be connected from
bus line to VDD on the system planar to act as a pull up.
on the system planar to act as a pull-up.
DDSPD
on the system planar to act as a pull-up.
DDSPD
to configure the serial SPD EEPROM
DDSPD
Err_Out
- 7 -
Rev. 1.1
Registered DIMM
datasheetDDR3 SDRAM
8. Pinout Comparison Based On Module Type
Pin
48, 49
120, 240
53 Err_Out
63 NC
64 NCCK1
68 Par_In Connected to the register on all RDIMMs NCNot used on RDIMMs
76 S1Connected to the register on all RDIMMs S1
77 ODT1, NC
79S2, NC
167 NC TEST input used only on bus analysis probesNC
169 CKE1
171A15
172A14A14
196A13A13
198S3, NC
39, 40, 45, 46,
158, 159, 164,
165
125, 134, 143,
152, 161, 203,
212, 221, 230
126, 135, 144,
153, 162, 204,
213, 222, 231
187
NOTE : NC = No internal Connection
SignalNOTESignalNOTE
V
TT
VTT
CBn Used on all RDIMMs; (n = 0...7) NC, CBn
DQSn,
TDQSn
DQSn,
TDQSn
EVENT
NC
Additional connection for Termination Voltage for
Address/Command/Control/Clock nets.
Termination Voltage for Address/Command/Control/Clock nets.
Connected to the register on all RDIMMs NC Not
used on UDIMMs
Not used on RDIMMs
Connected to the register on dual- and quadrank
RDIMMs; NC on single-rank RDIMMs
Connected to the register on quad-rank
RDIMMs, not connected on single or dual rank
RDIMMs
Connected to the register on dual- and quadrank
RDIMMs; NC on single-rank RDIMMs
Connected to the register on all RDIMMs
Connected to the register on quad-rank
RDIMMs, not connected on single-or dual-rank
RDIMMs
Connected to DQS on x4 SDRAMs,
TDQS on x8 SDRAMs on RDIMMs; (n = 9...17)
Connected to DQS on x4 DRAMs, TDQS on x8
SDRAMs on RDIMMs; (n=9...17)
Connected to optional thermal sensing component.
NC on Modules without a thermal sensing
component.
RDIMMUDIMM
NC Not used on UDIMMs
V
TT
NCNC Not used on UDIMMs
CK1
ODT1,NC
NC Not used on UDIMMs
CKE1,
NC
A15, NCDepending on device density, may not be
NC Not used on UDIMMs
DMn
NC Not used on UDIMMs
NCNot used on UDIMMs
Termination Voltage for Address/Command/Control/Clock nets.
Used for 2 rank UDIMMs, not used on single-rank
UDIMMs, but terminated
Used for dual-rank UDIMMs, not connected
on single-rank UDIMMs
Used for dual-rank UDIMMs, not connected
on single-rank UDIMMs
TEST input used only on bus analysis
probes
Used for dual-rank UDIMMs, not connected
on single-rank UDIMMs
connected to SDRAMs on UDIMMs. However,
these signals are terminated on
UDIMMs. A15 not routed on some RCs
Used on x72 UDIMMs, (n = 0...7); not
used on x64 UDIMMs
Connected to DM on x8 DRAMs, UDM or
LDM on x16 DRAMs on UDIMMs;
(n = 0...8)
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions
for extended periods may affect reliability.
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to JESD51-2 standard.
3. VDD and V
equal to or less than 300mV.
Voltage on any pin relative to V
IN, VOUT
T
Storage Temperature -55 to +100C 1, 2
STG
DDQ
10.2 DRAM Component Operating Temperature Range
SymbolParameterratingUnitNOTE
T
OPER
NOTE :
1. Operating Temperature T
JESD51-2.
2. The Normal Temperature Range specifies the temperatures where all DRAM specifications will be supported. During operation, the DRAM case temperature must be maintained between 0-85C under all operating conditions
3. Some applications require operation of the Extended Temperature Range between 85C and 95C case temperature. Full specifications are guaranteed in this range, but the
following additional conditions apply:
a) Refresh commands must be doubled in frequency, therefore reducing the refresh interval tREFI to 3.9us.
b) If Self-Refresh operation is required in the Extended Temperature Range, then it is mandatory to either use the Manual Self-Refresh mode with Extended Temperature
Range capability (MR2 A6 = 0b and MR2 A7 = 1b), in this case IDD6 current can be increased around 10~20% than normal Temperature range.
Voltage on VDD pin relative to V
pin relative to V
DDQ
must be within 300mV of each other at all times; and V
SS
SS
SS
Operating Temperature Range 0 to 95C1, 2, 3
is the case surface temperature on the center/top side of the DRAM. For measurement conditions, please refer to the JEDEC document
OPER
-0.4 V ~ 1.975 VV 1,3
-0.4 V ~ 1.975 VV 1,3
-0.4 V ~ 1.975 VV 1
must be not greater than 0.6 x V
REF
, When VDD and V
DDQ
are less than 500mV; V
DDQ
REF
may be
11. AC & DC Operating Conditions
11.1 Recommended DC Operating Conditions (SSTL-15)
SymbolParameter
V
DD
V
DDQ
NOTE:
1. Under all conditions V
tracks with VDD. AC parameters are measured with VDD and V
2. V
DDQ
Supply Voltage1.4251.51.575V1,2
Supply Voltage for Output1.4251.51.575V1,2
must be less than or equal to VDD.
DDQ
tied together.
DDQ
Min.Typ. Max.
Rating
UnitsNOTE
- 13 -
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