78FBGA with Lead-Free & Halogen-Free
(RoHS compliant)
datasheet
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- 1 -
Rev. 1.6
Registered DIMM
datasheetDDR4 SDRAM
Revision History
Revision No.HistoryDraft DateRemarkEditor
1.0- First SPEC ReleaseNov. 2014-J.Y.Lee
1.1
1.2
1.3
1.4
1.5
1.6
- Change of Part Number (Speed bin "RC")
- Addition of VDDSPD tolerance on page 8
- Addition of IDD value (M393A2K40BB0-CPB, M393A2K40BB1-CRC,
M393A4K40BB1-CRC) on page 25
- Change of IDD
- Addition of Module line up (8GB)
- Addition of DDR4-2666
Jan. 2015-J.Y.Lee
Mar. 2015-J.Y.Lee
Apr. 2015-J.Y.Lee
16th Dec. 2015-J.Y.Lee
3rd Feb. 2016-J.Y.Lee
7th Apr. 2016-J.Y.Lee
- 2 -
Rev. 1.6
Registered DIMM
datasheetDDR4 SDRAM
Table Of Contents
288pin Registered DIMM based on 8Gb B-die
1. DDR4 Registered DIMM Ordering Information ............................................................................................................. 4
9. Function Block Diagram:............................................................................................................................................... 10
9.1 8GB, 1Gx72 Module (Populated as 1 rank of x8 DDR4 SDRAMs) ......................................................................... 10
9.2 16GB, 2Gx72 Module (Populated as 1 rank of x4 DDR4 SDRAMs) ....................................................................... 11
9.3 32GB, 4Gx72 Module (Populated as 2 ranks of x4 DDR4 SDRAMs) ..................................................................... 12
10. Absolute Maximum Ratings ........................................................................................................................................14
10.1 Absolute Maximum DC Ratings............................................................................................................................. 14
11. AC & DC Operating Conditions...................................................................................................................................14
11.1 Recommended DC Operating Conditions ............................................................................................................. 14
12. AC & DC Input Measurement Levels ..........................................................................................................................15
12.1 AC & DC Logic Input Levels for Single-Ended Signals ......................................................................................... 15
12.2 AC and DC Input Measurement Levels : VREF Tolerances.................................................................................. 15
12.3 AC and DC Logic Input Levels for Differential Signals .......................................................................................... 16
12.4.1. Slew Rate Definitions for Differential Input Signals ( CK ) ............................................................................. 18
12.5 Differential Input Cross Point Voltage.................................................................................................................... 19
12.6 Single-ended AC & DC Output Levels................................................................................................................... 20
12.7 Differential AC & DC Output Levels....................................................................................................................... 20
12.10 Single-ended AC & DC Output Levels of Connectivity Test Mode ...................................................................... 22
12.11 Test Load for Connectivity Test Mode Timing ..................................................................................................... 22
16. Electrical Characterisitics and AC Timing ...................................................................................................................30
16.1 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin ................................................................ 30
16.2 Speed Bin Table Note ........................................................................................................................................... 35
17. Timing Parameters by Speed Grade ..........................................................................................................................36
Data Buffer data strobes
(positive line of differential pair)
Data Buffer data strobes
(negative line of differential pair)
Register clock input (positive line of differential
pair)
Register clocks input (negative line of differential
pair)
VTT
RFUReserved for future use
SDRAM I/O termination supply
NOTE :
1. Address A17 is only valid for 16 Gb x4 based SDRAMs.
2. RAS_n is a multiplexed function with A16.
3. CAS_n is a multiplexed function with A15.
4. WE_n is a multiplexed function with A14.
6. ON DIMM Thermal Sensor
NOTE : 1. All Samsung RDIMM support Thermal sensor on DIMM
[ Table 1 ] Temperature Sensor Characteristics
GradeRange
75 < Ta < 95-+/- 0.5+/- 1.0
B
40 < Ta < 125-+/- 1.0+/- 2.0-
-20 < Ta < 125-+/- 2.0+/- 3.0-
Resolution0.25C /LSB-
Temperature Sensor Accuracy
Min.Typ. Max.
- 6 -
UnitsNOTE
-
C
Rev. 1.6
Registered DIMM
datasheetDDR4 SDRAM
7. Input/Output Functional Description
SymbolTypeFunction
CK0_t, CK0_c,
CK1_t, CK1_c
CKE0, CKE1Input
CS0_n, CS1_n,
CS2_n, CS3_n
C0, C1, C2Input
ODT0, ODT1Input
ACT_nInput
RAS_n/A16.
CAS_n/A15.
WE_n/A14
BG0 - BG1Input
BA0 - BA1Input
A0 - A17Input
A10 / APInput
A12 / BC_nInput
RESET_n
DQ
DQS0_t-DQS17_t,
DQS0_c-DQS17_c
PARInput
ALERT_n
RFUReserved for Future Use: No on DIMM electrical connection is present
NCNo Connect: No on DIMM electrical connection is present
Input
Input
Input
CMOS
Input
Input/
Output
Input/
Output
Output
(Input)
Clock: CK_t and CK_c are differential clock inputs. All address and control input signals are sampled on the crossing of
the positive edge of CK_t and negative edge of CK_c.
Clock Enable: CKE HIGH activates and CKE LOW deactivates internal clock signals and device input buffers and
output drivers. Taking CKE LOW provides Precharge Power-Down and Self-Refresh operation (all banks idle), or
Active Power-Down (row Active in any bank). CKE is synchronous for Self-Refresh exit. After VREFCA and Internal
DQ Vref have become stable during the power on and initialization sequence, they must be maintained during all
operations (including Self-Refresh). CKE must be maintained high throughout read and write accesses. Input buffers,
excluding CK_t, CK_c, ODT and CKE, are disabled during power-down. Input buffers, excluding CKE, are disabled
during Self-Refresh.
Chip Select: All commands are masked when CS_n is registered HIGH. CS_n provides for external Rank selection.
CS_n is considered part of the command code.
Chip ID : Chip ID is only used for 3DS for 2,4,8 high stack via TSV to select each slice of stacked component. Chip ID
is considered part of the command code.
On Die Termination: ODT (registered HIGH) enables RTT_NOM termination resistance internal to the DDR4 SDRAM.
When enabled, ODT is only applied to each DQ, DQS_t, DQS_c, TDQS_t and TDQS_c signal. The ODT pin will be
ignored if MR1 is programmed to disable RTT_NOM.
Activation Command Input : ACT_n defines the Activation command being entered along with CS_n. The input into
RAS_n/A16, CAS_n/A15 and WE_n/A14 will be considered as Row Address A16, A15 and A14
Command Inputs: RAS_n/A16, CAS_n/A15 and WE_n/A14 (along with CS_n) define the command being entered.
Those pins have multi function. For example, for activation with ACT_n Low, these are Addresses like A16, A15 and
A14 but for non-activation command with ACT_n High, these are Command pins for Read, Write and other command
defined in command truth table
Bank Group Inputs: BG0 - BG1 define which bank group an Active, Read, Write or Precharge command is being
applied. BG0 also determines which mode register is to be accessed during a MRS cycle.
Bank Address Inputs: BA0 - BA1 define to which bank an Active, Read, Write or Precharge command is being applied.
Bank address also determines which mode register is to be accessed during a MRS cycle.
Address Inputs: Provide the row address for ACTIVATE Commands and the column address for Read/Write
commands to select one location out of the memory array in the respective bank. A10/AP, A12/BC_n, RAS_n/A16,
CAS_n/A15 and WE_n/A14 have additional functions. See other rows. The address inputs also provide the op-code
during Mode Register Set commands. A17 is only defined for 16 Gb x4 SDRAM configurations.
Auto-precharge: A10 is sampled during Read/Write commands to determine whether Autoprecharge should be
performed to the accessed bank after the Read/Write operation. (HIGH: Autoprecharge; LOW: no Autoprecharge). A10
is sampled during a Precharge command to determine whether the Precharge applies to one bank (A10 LOW) or all
banks (A10 HIGH). If only one bank is to be precharged, the bank is selected by bank addresses.
Burst Chop: A12/BC_n is sampled during Read and Write commands to determine if burst chop (on-thefly) will be
performed. (HIGH, no burst chop; LOW: burst chopped). See command truth table for details.
Active Low Asynchronous Reset: Reset is active when RESET_n is LOW, and inactive when RESET_n is HIGH.
RESET_n must be HIGH during normal operation.
Data Input/ Output: Bi-directional data bus. If CRC is enabled via Mode register then CRC code is added at the end of
Data Burst. Any DQ from DQ0-DQ3 may indicate the internal Vref level during test via Mode Register Setting MR4
A4=High. Refer to vendor specific data sheets to determine which DQ is used.
Data Strobe: output with read data, input with write data. Edge-aligned with read data, centered in write data. The data
strobe DQS_t is paired with differential signals DQS_c, respectively, to provide differential pair signaling to the system
during reads and writes. DDR4 SDRAM supports differential data strobe only and does not support single-ended.
Command and Address Parity Input: DDR4 Supports Even Parity check in SDRAMs with MR setting. Once it’s enabled
via Register in MR5, then SDRAM calculates Parity with ACT_n, RAS_n/A16, CAS_n/A15, WE_n/A14, BG0-BG1,
BA0-BA1, A17-A0. Input parity should be maintained at the rising edge of the clock and at the same time with
command & address with CS_n LOW
Alert : It has multi functions such as CRC error flag, Command and Address Parity error flag as Output signal. If there
is error in CRC, then ALERT_n goes LOW for the period time interval and goes back HIGH. If there is error in
Command Address Parity Check, then ALERT_n goes LOW for relatively long period until on going SDRAM internal
recovery transaction is complete. During Connectivity Test mode this pin functions as an input.
Using this signal or not is dependent on the system. If the SDRAM ALERT_n pins are not connected to the ALERT_n
pin on the edge connector is must still be connected to VDD on DIMM.
- 7 -
Rev. 1.6
Registered DIMM
SymbolTypeFunction
1
VDD
VSSSupply
VTTSupply
VPPSupply
VDDSPDSupply
VREFCASupply
NOTE :
1. For PC4 VDD is 1.2V. For PC4L VDD is TBD.
Supply
Power Supply: 1.2 V ± 0.06 V
Ground
VDD/2
SDRAM Activating Power Supply: 2.5V ( 2.375V min, 2.75V max)
SPD and register supply voltage. Register requires the nominl volatge to be 2.5V ± 10%.
CK1_t, CK1_c terminated with 120 ± 5% resistor but not used.
3.
Unless otherwise noted resistors are 22 ± 5%.
Registered DIMM
datasheetDDR4 SDRAM
- 13 -
Rev. 1.6
Registered DIMM
datasheetDDR4 SDRAM
10. Absolute Maximum Ratings
10.1 Absolute Maximum DC Ratings
[ Table 2 ] Absolute Maximum DC Ratings
SymbolParameter RatingUnitsNOTE
VDDVoltage on VDD pin relative to Vss-0.3 ~ 1.5V 1,3
VDDQ Voltage on VDDQ pin relative to Vss-0.3 ~ 1.5V 1,3
VPPVoltage on VPP pin relative to Vss-0.3 ~ 3.0V4
V
NOTE :
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions
for extended periods may affect reliability
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to JESD51-2 standard.
3. VDD and VDDQ must be within 300 mV of each other at all times;and VREFCA must be not greater than 0.6 x VDDQ, When VDD and VDDQ are less than 500 mV; VREFCA
may be equal to or less than 300 mV
4. VPP must be equal or greater than VDD/VDDQ at all times.
Voltage on any pin except VREFCA to Vss-0.3 ~ 1.5V 1,3
IN, VOUT
T
Storage Temperature -55 to +100°C 1,2
STG
11. AC & DC Operating Conditions
11.1 Recommended DC Operating Conditions
[ Table 3 ] Recommended DC Operating Conditions
SymbolParameter
VDDSupply Voltage1.141.21.26V1,2,3
VDDQSupply Voltage for Output1.141.21.26V1,2,3
VPPPeak-to-Peak Voltage2.3752.52.75V3
NOTE:
1. Under all conditions V
2. V
tracks with VDD. AC parameters are measured with VDD and V
DDQ
3. DC bandwidth is limited to 20MHz.
must be less than or equal to VDD.
DDQ
Min.Typ.Max.
tied together.
DDQ
Rating
UnitNOTE
- 14 -
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