Philips NE56632-31D, NE56632-43D, NE56632-45D, NE56632-46D, NE56632-30D Datasheet

INTEGRATED CIRCUITS

NE56632-XX

Active-LOW system reset
with adjustable delay time

Product data 2002 Mar 25

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Philips Semiconductors Product data

NE56632-XXActive-LOW system reset with adjustable delay time

DESCRIPTION

The NE56632-XX is a family of Active-LOW, power-on reset that
offers precision threshold voltage detection within ±1.5% and super
low operating supply current of typically 3.0 µA. It includes a reset
delay that is user adjustable with an external capacitor.

Several detection threshold voltages are available at 1.9V , 2.0 V ,

2.7 V, 2.8 V, 2.9 V, 3.0 V, 3.1 V, 4.2 V, 4.3 V, 4.4 V, 4.5 V, and 4.6 V.
Other thresholds are offered upon request at 100 mV steps from

1.9 V to 4.6 V.
With its ultra low supply current and high precision voltage threshold

detection capability, the NE56632-XX is well suited for various
battery powered applications such as reset circuits for logic and
microprocessors, voltage check, and level detecting. It is available in
the SOT23-5 package.

FEA TURES

•High precision threshold detection voltage: V

±1.5%

S

•Super low operating supply current: 3 µA typ.

•Built-in hysteresis voltage: 50 mV typ.

•Detection threshold voltage: 1.9 V, 2.0 V , 2.7 V, 2.8 V, 2.9 V,

3.0 V, 3.1 V, 4.2 V, 4.3 V, 4.4 V, 4.5 V, and 4.6 V.

•Reset Output: Active-LOW, open collector

•Other detection threshold voltages available upon request at

100 mV steps from 1.9 V to 4.6 V.

•Large low reset output current: 30 mA typ.

•Power-on reset delay time adjustable with external capacitor:

200 µs to 200 ms

•Reset assertion with V

SIMPLIFIED SYSTEM DIAGRAM

TO V

CC

down to 0.65 V

CC

R

PU

NE56632-XX

TO RESET
TERMINAL
OF CPU

45

APPLICATIONS

•Reset for microprocessor and logic circuits

•Voltage level detection circuit

•Battery voltage check circuit

•Detection circuit for battery back-up

123

C

D

SL01605

Figure 1. Simplified system diagram.

2002 Mar 25 853–2329 27919

2

Philips Semiconductors Product data

TYPE NUMBER

NE56632-XXActive-LOW system reset with adjustable delay time

ORDERING INFORMATION

PACKAGE
NAME DESCRIPTION

NE56632-XXD SOT23-5 / SOT25 (SO5) plastic small outline package; 5 leads (see dimensional drawing) –20 to +75 °C

NOTE:

The device has 12 voltage output options, indicated by the XX on
the ‘Type number’.

XX

VOLTAGE (Typical)

19 1.9 V
20 2.0 V
27 2.7 V
28 2.8 V
29 2.9 V
30 3.0 V
31 3.1 V
42 4.2 V
43 4.3 V
44 4.4 V
45 4.5 V
46 4.6 V

Part number marking

The package is marked with a four letter code. The first three letters
designate the product. The fourth letter, represented by ‘x’, is a date
tracking code.

Part Number

NE56632-19D AKZx
NE56632-20D ALAx
NE56632-27D ALBx
NE56632-28D ALCx
NE56632-29D ALDx
NE56632-30D ALEx
NE56632-31D ALFx
NE56632-42D ALGx
NE56632-43D ALHx
NE56632-44D ALJx
NE56632-45D ALKx
NE56632-46D ALLx

Marking

TEMPERATURE
RANGE

PIN CONFIGURATION

PIN DESCRIPTION

PIN SYMBOL DESCRIPTION

1 TC Delay time control; set with external

capacitor.

2 SUB Substrate. Connect to ground (GND).

SUB

1

TC

2

NE56632-XX

5V

CC

3 GND Ground. Negative supply.

34

GND

SL01604

V

OUT

4 V
5 V

OUT
CC

Reset output voltage. Active-LOW.
Positive supply voltage; detection threshold

voltage input.

Figure 2. Pin configuration.

MAXIMUM RATINGS

SYMBOL PARAMETER MIN. MAX. UNIT

V

CC

T

amb

T

stg

P Power dissipation – 150 mW

Supply voltage –0.3 +10 V
Ambient operating temperature –20 +75 °C
Storage temperature –40 +125 °C

2002 Mar 25

3

Philips Semiconductors Product data

V

(Fig

)

Test Circuit 1 (Figure 27)

NE56632-XXActive-LOW system reset with adjustable delay time

ELECTRICAL CHARACTERISTICS

T

= 25 °C, unless otherwise specified.

amb

SYMBOL

V

S

V

hys

VS/∆T Detection threshold voltage

V

OL

I

LO

I

CCL

I

CCH

t

PLH

t

PHL

V

OPL

I

OL1

I

OL2

NOTES:

1. t

:VCC = (V

PLH

:VCC = (V

2. t

PHL

3. See Table 1.

PARAMETER CONDITIONS -XX MIN. TYP. MAX. UNIT

Detection threshold VCC = HIGH-to-LOW; RL = 4.7 kΩ; S1=ON;

≤ 0.4 V;

OL

Test Circuit 1

ure 27

46
45
44
43
42
31
30
29
28
27
20
19

Hysteresis voltage RL = 4.7 kΩ; VCC = LOW-to-HIGH-to-LOW; S1 = ON; Test

4.531 4.600 4.669 V

4.432 4.500 4.568 V

4.334 4.400 4.466 V

4.235 4.300 4.365 V

4.137 4.200 4.263 V

3.053 3.100 3.147 V

2.955 3.000 3.045 V

2.856 2.900 2.944 V

2.758 2.800 2.842 V

2.659 2.700 2.741 V

1.970 2.000 2.030 V

1.871 1.900 1.929 V
25 50 100 mV

Circuit 1 (Figure 27)

temperature coefficient
LOW-level output voltage V

Output leakage current V
Supply current (ON time) V
Supply current (OFF time) V

CC1

CC1

CC1

RL = 4.7 kΩ; T

= V

CC1

= V

= 10 V; S2 = ON; Test Circuit 1 (Figure 27) – – ±0.1 µA

CC2

= V

S(min)

= V

S(typ)

= –20 °C to +75 °C; S1 = ON;

amb

Test Circuit 1 (Figure 27)

– 0.05 V; RL = 4.7 kΩ; S1 = ON;

S(min)

Test Circuit 1 (Figure 27)

– ±0.01 – %/°C

– 0.2 0.4 V

– 0.05 V; RL = ∞; Test Circuit 1 (Figure 27) – 5.0 9.0 µA

/0.85; RL = ∞; Test Circuit 1 (Figure 27) – 3.0 5.0 µA
LOW-to-HIGH delay time CL = 100 pF; RL = 4.7 kΩ; CD = 10 nF (Note 1) – (Note 3) – ms
HIGH-to-LOW delay time CL = 100 pF; RL = 4.7 kΩ; CD = 10 nF (Note 2) – (Note 3) – µs
Minimum operating

threshold voltage
Output current (ON Time 1) VO = 0.4 V; RL = 0; V

Output current (ON Time 2) VO = 0.4 V; RL = 0; V

– 0.4 V) to (V

S(typ)

+ 0.4 V) to (V

S(typ)

S(typ)
S(typ)

+ 0.4 V); t
– 0.4 V); t

RL = 4.7 kΩ; VOL ≤ 0.4 V; S1 = ON;

Test Circuit 1 (Figure 27)

= V

CC1

CC1

= V

S(min)

S(min)

V

= 0.4 V; S2 = ON; Test Circuit 1 (Figure 27)

CC2

T

= –20 °C to +75 °C; S2 = ON;

amb

Test Circuit 1 (Figure 27)

is release delay time (Test Circuit 2, Figure 28).

PLH

is assertion delay time (Test Circuit 2, Figure 28).

PHL

– 0.05 V;

– 0.05 V;

– 0.65 0.80 V

5 – – mA

3 – – mA

Table 1. NE56632-XX series typical delay time

–XX t

PLH

46 195 ms 140 µs
45 190 ms 140 µs
44 185 ms 140 µs
43 180 ms 140 µs
42 175 ms 140 µs
31 120 ms 120 µs
30 115 ms 120 µs
29 110 ms 120 µs
28 105 ms 100 µs
27 100 ms 100 µs
20 65 ms 100 µs
19 60 ms 100 µs

2002 Mar 25

t

PHL

4

Philips Semiconductors Product data

NE56632-XXActive-LOW system reset with adjustable delay time

TYPICAL PERFORMANCE CURVES, NE56632-20

2.0050

2.0025

2.0000

1.9975

1.9950

1.9925

, DETECTION THRESHOLD (V)

S

V

1.9900

1.9875

1.9850
–40 –20

0 20 40 60 80 100

AMBIENT TEMPERATURE, T

Test Circuit 1

VCC = HIGH-to-LOW

= 4.7 kΩ

R

L

VOL ≤ 0.4 V
S1 = ON

(°C)

amb

SL01620

Figure 3. Detection threshold versus temperature.

0.225

0.220

0.215

0.210

0.205

0.200

, LOW-LEVEL OUTPUT VOLTAGE (V)
V

OL

0.195

0.190

0.185
–40 –20

0 20 40 60 80 100

AMBIENT TEMPERATURE, T

Test Circuit 1
V

= V

CC1

S(min)

RL = 4.7 kΩ
S1 = ON

(°C)

amb

– 0.05 V

SL01622

Figure 5. LOW-level output voltage versus temperature.

100

90

80

70

60

50

, HYSTERESIS VOLTAGE (mV)

Test Circuit 1

hys

VCC = LOW-to-HIGH-to-LOW

V

40

RL = 4.7 kΩ
S1 = ON

30

–40 –20

0 20 40 60 80 100

AMBIENT TEMPERATURE, T

amb

(°C)

SL01621

Figure 4. Hysteresis voltage versus temperature.

9

8

7

6

5

, SUPPLY CURRENT (ON time), ( A)µ

4

Test Circuit 1

CCL

I

V

= V

CC1

= ∞

R

L

3

–40 –20

– 0.05 V

S(min)

0 20 40 60 80 100

AMBIENT TEMPERATURE, T

amb

(°C)

SL01623

Figure 6. Supply current (ON time) versus temperature.

4.5

4.0

3.5

3.0

2.5

, SUPPLY CURRENT (OFF time), ( A)µ
I

CCH

Test Circuit 1
RL = ∞
V

CC1

2.0
–40 –20

= V

/0.85

S(typ)

0 20 40 60 80 100

AMBIENT TEMPERATURE, T

amb

(°C)

Figure 7. Supply current (OFF time) versus temperature.

2002 Mar 25

SL01624

0.9

0.8

0.7

0.6

0.5

Test Circuit 1

0.4

RL = 4.7 kΩ
VOL ≤ 0.4 V
S1 = ON

, MIN. OPERATING THRESHOLD VOLTAGE (V)

0.3

OPL

–40 –20

V

0 20 40 60 80 100

AMBIENT TEMPERATURE, T

amb

(°C)

Figure 8. Min. operating threshold voltage versus temperature.

5

SL01625