Leica CLEANLINESS EXPERT User Manual

Leica Cleanliness Expert
The new analysis software for measurement and
classification of particles on filters.
Living up to Life
The Expert for Quality Assurance
Critical Quality Factors
The lifetime and functionality of engineering components often depend on the cleanliness of their surface after the production process as tiny dirt particles affect their reliability and durability. Leica Cleanliness Expert is a quantitative Quality Assurance system that helps monitor the quality of components during the manufacturing process.
Reliability by experience
Leica Cleanliness Expert
Leica Cleanliness Expert is designed to measure the contamination of cleaning fluids for micro mechanic and engine components. It can be used in all applications where particle classification and characterisation on circular shaped substrates is undertaken. During the measurement process an overview image of the whole filter is built up and the length of the largest detected feature is displayed. The user can zoom in on the overview image whilst it is being built to get an early indication of the filter preparation, imaging quality and the presence of very large fibres and particles.
Featur e Highlights:
• Easy to use and quick to perform meas­urements on circular filters for rapid results
• Automatic differentiation between
reflective and non-reflective features to trace back the source or potential risk of contamination.
• Measurement parameters and system
settings are automatically stored and can be recalled for reproducible and consistent measurement conditions.
• Rapid measurement and classification
of different particles simultaneously to increase throughput.
• Editing function with documentation for
easy and reliable control of the results
• Live particle information to obtain early
feedback on the severest contamina­tion to decrease response time.
• Limitless feature length detection func­tion for the accurate measurement of large and small particles at the same magnification.
• Access to measured particle data
for artefact removal and further data processing
• Fully compliant with the latest stand­ards (ISO 16232 and VDA 19) imple-
mented in cleanliness detection.
• User management to avoid unauthor­ised alterations of settings.
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