Datasheet STGD3NB60KD Datasheet (ST)

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查询STGD3NB60KD 供应商
SHORT CIRCUIT PROOF PowerMESH™ IGBT
STGD3NB60KD
N-CHANNEL 3A - 600V - DPAK
TYPE V
CES
V
CE(sat)
I
C
STD3NB60KD 600 V < 2.8 V3A
HIGH INPUTIMPEDANCE(VOLTAGE DRIVEN)
LOW ON-VOLTAGE DROP (V
LOW GATE CHARGE
HIGH CURRENT CAPABILITY
OFF LOSSES INCLUDE TAIL CURRENT
VERY HIGH FREQUENCY OPERATION
SHORT CIRCUIT RATED
LATCH CURRENT FREE OPERA TION
CO-PACKAGED WITH TURBOSWITCH™
cesat
)
ANTIPARALLEL DIODE
DESCRIPTION
Using the latest h igh voltage technology based on a patented strip layout, STMicroelectronics has designed an advanced family of IGBTs, the PowerMESH
IGBTs, with outstanding performances. The suffix “K” identifies a fam ily optimized for high frequency motor cont rol applications with short circuit withstand capability.
APPLICATIONS
HIGH FREQUENCY MOTOR CONTROLS
SMPS and PFC
3
1
DPAK
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
CES
V
ECR
V
GE
I
C
I
C
I
CM
Tsc Short Circuit Withstand 10
P
TOT
T
stg
T
j
() Pulse width limited by safe operating area
Collector-Emitter Voltage (VGS=0)
600 V Emitter-Collector Voltage 20 V Gate-Emitter Voltage ±20 V Collector Current (continuous) at TC=25°C Collector Current (continuous) at TC=100°C
()
Collector Current (pulsed) 24 A
Total Dissipation at TC= 25°C
6A 3A
35 W Derating Factor 0.28 W/°C Storage Temperature –65 to 150 °C Max. Operating Junction Temperature 150 °C
µs
1/9April 2003
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STGD3NB60KD
THERMAL DATA
Rthj-case Thermal Resistance Junction-case Max 3.57 °C/W Rthj-amb Thermal Resistance Junction-ambient Max 100 °C/W
Rthc-h Thermal Resistance Case-heatsink Typ 0.5 °C/W
ELECTRICAL CHARACTERISTICS (T
= 25 °C UNLESS O THERWISE SPECIFIED)
CASE
OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
BR(CES)
Collectro-Emitter Breakdown
IC= 250 µA, VGE= 0 600 V
Voltage
I
CES
I
GES
Collector cut-off
=0)
(V
GE
Gate-Emitter Leakage Current (V
CE
=0)
V
= Max Rating, TC=25°C
CE
VCE= Max Rating, TC= 125 °C V
=±20V,VCE= 0 ±100 nA
GE
10 µA
100 µA
ON (1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GE(th)
V
CE(sat)
Gate Threshold Voltage Collector-Emitter Saturation
Voltage
V
CE=VGE,IC
VGE=15V,IC=3A VGE=15V,IC= 3 A, Tj =125°C
= 250µA
57V
2.4 2.8 V
1.9 V
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
g
fs
C
ies
C
oes
C
res
Q
g
Q
ge
Q
gc
Forward Transconductance Input Capacitance
Output Capacitance Reverse Transfer Capacitance
Total Gate Charge Gate-Emitter Charge Gate-Collector Charge
tscw Short Circuit Withstand Time V
=25V,IC=3 A
CE
=25V,f=1MHz,VGE= 0 235
V
CE
1.3 2.4 S
VCE= 480V,IC=3A, V
=15V
GE
= 0.5 BVces , VGE=15V,
ce
10 µs
Tj = 125°C , RG=10
33
6.6
21
6
7.6
27
pF pF pF
nC nC nC
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(on)
t
(di/dt)
r
Turn-on Delay Time Rise Time
Turn-on Current Slope VCC= 480 V, IC=7ARG=10
on
Eon Turn-on Switching Losses 37 µJ
2/9
VCC=480V,IC=3A RG=10Ω,VGE=15V
V
= 15 V,Tj = 125°C
GE
16 30
400 A/µs
ns ns
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STGD3NB60KD
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
c
tr(V
off
td(
off
t
f
E
(**)
off
E
ts
t
c
t
r(Voff
td(
off
t
f
E
(**)
off
E
ts
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by max. junction temperature.
(**)Losses include Also the Tail (Jedec Standardization)
Cross-over Time
)
Off Voltage Rise Time 36 ns
)
Delay Time 53 ns Fall Time 70 ns Turn-off Switching Loss 33 Total Switching Loss 65 Cross-over Time
)
Off Voltage Rise Time 82 ns
)
Delay Time 58 ns Fall Time 110 ns Turn-off Switching Loss 88 Total Switching Loss 125
= 480 V, IC=3 A,
cc
=10,VGE=15V
R
GE
V
= 480 V, IC=3A,
cc
RGE=10,VGE=15V
Tj = 125 °C
90 ns
180 ns
µJ µJ
µJ µJ
COLLECTOR-EMITTER DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
f
I
fm
V
f
t
rr
Q
rr
I
rrm
Forward Current Forward Current pulsed
Forward On-Voltage If= 1.5 A
If= 1.5 A, Tj = 125 °C
= 1.5 A ,VR= 200 V,
Reverse Recovery Time Reverse Recovery Charge
I
f
Tj = 125°C, di/dt = 100 A/µs
Reverse Recovery Current
1.6
1.3 90
100
2.7
1 8
2
Thermal Impedance
A A
V V
ns
nC
A
3/9
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STGD3NB60KD
Output Characteristics
Transfer Characteristics
Collector-Emitter On Voltage vs Temp eratureTransconductance
Collector-Emitter On Voltage vs Collettor Cu rrent
4/9
Gate Threshold vs Temperature
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STGD3NB60KD
Normalized Breakdown Voltage vs Temperature
Capacitance Variations
Total Switching Losses vs Gate ResistanceGate Charge vs Gate-Emitter Voltage
Total Switching Lo sses vs Temperature
Emitter-collector Diode Characteristics
5/9
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STGD3NB60KD
Total Switching Losses vs Collector Cu rrent
Switching Off Safe Operating Area
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STGD3NB60KD
Fig. 2: Test Circuit For Induct ive Load SwitchingFig. 1: Gate Charge test Circuit
7/9
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STGD3NB60KD
TO-252 (DPAK) MECHANICAL DATA
DIM.
A 2.20 2.40 0.087 0.094 A1 0.90 1.10 0.035 0.043 A2 0.03 0.23 0.001 0.009
B 0.64 0.90 0.025 0.035 B2 5.20 5.40 0.204 0.213
C 0.45 0.60 0.018 0.024 C2 0.48 0.60 0.019 0.024
D 6.00 6.20 0.236 0.244
E 6.40 6.60 0.252 0.260
G 4.40 4.60 0.173 0.181
H 9.35 10.10 0.368 0.398 L2 0.8 0.031 L4 0.60 1.00 0.024 0.039 V2 0
MIN. TYP. MAX. MIN. TYP. MAX.
o
mm inch
o
8
o
0
o
0
8/9
P032P_B
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STGD3NB60KD
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of u se of such inf ormat ion nor for any in fring ement of p aten ts or othe r ri ghts of th ird p arties whic h may resul t f rom its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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