These N & P-Channel MOSFETs are
produced using Fairchild Semiconductor’s
advanced PowerTrench process that has been
especially tailored to minimize on-state
resistance and yet maintain superior switching
performance.
These devices are well suited for low voltage
and battery powered applications where low
in-line power loss and fast switching are
required.
D2
D
D2
D
D1
D
D1
D
SO-8
Pin 1
SO-8
S1
S2
G1
S
S
S
Absolute Maximum RatingsT
G2
=25
A
Features
• Q1 4.1 A, 30V. RR
• Q2 –3.4 A, 30V. RR
• Low gate charge
• High performance trench technology for extremely
low R
• High power and handling capability in a widely used
surface mount package.
o
C unless otherwise noted
DS(ON)
= 80 mΩ @ VGS = 10 V
DS(ON)
= 130 mΩ @ VGS = 4.5 V
DS(ON)
= 130 mΩ @ VGS = –10 V
DS(ON)
= 200 mΩ @ VGS = –4.5 V
DS(ON)
.
Q2
5
6
Q1
7
8
4
3
2
1
Symbol Parameter Q1 Q2 Units
V
Drain-Source Voltage 30 –30 V
DSS
V
Gate-Source Voltage ±16±20
GSS
ID Drain Current – Continuous (Note 1a)4.1 –3.4 A
– Pulsed 20 –20
PD
TJ, T
STG
Power Dissipation for Dual Operation 2
Power Dissipation for Single Operation (Note 1a)
(Note 1b)1
(Note 1c)0.9
Operating and Storage Junction Temperature Range –55 to +150 °C
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
is guaranteed by design while R
θJC
a) 78°C/W when
θCA
mounted on a
0.5in2 pad of 2
oz copper
is determined by the user's board design.
VGS = 0 V, IS = 1.3 A (Note 2)
VGS = 0 V, IS = –1.3 A (Note 2)
Q2
IF = 4.1 A, diF/dt = 100 A/µs
IF = –3.4 A, diF/dt = 100 A/µs
Q2
IF = 4.1 A, diF/dt = 100 A/µs
IF = –3.4 A, diF/dt = 100 A/µs
Q2
b) 125°C/W when
mounted on a
0.02 in2 pad of
2 oz copper
0.8 1.2
0.8 –1.2
16.3
14.5
26.7
21.1
c) 135°C/W when
mounted on a
minimum pad.
V
nS
nC
FDS8333C Rev C (W)
Page 4
= 10V
= 10V
C
=5V
= 0V
FDS8333C
Typical Characteristics: N-Channel
10
V
GS
6.0V
8
6
4
, DRAIN CURRENT (A)
D
I
2
0
0123
4.5V
3.5V
VDS, DRAIN-SOURCE VOLTAGE (V)
3.0V
2
VGS = 3.0V
1.8
1.6
1.4
, NORMALIZED
1.2
DS(ON)
R
1
DRAIN-SOURCE ON-RESISTANCE
0.8
0246810
3.5V
4.0V
4.5V
ID, DRAIN CURRENT (A)
Figure 1. On-Region Characteristics. Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.6
ID = 4.1A
V
GS
1.4
1.2
, NORMALIZED
1
DS(ON)
R
0.8
DRAIN-SOURCE ON-RESISTANCE
0.6
-50-250255075100125150
TJ, JUNCTION TEMPERATURE (oC)
0.25
0.15
, ON-RESISTANCE (OHM)
DS(ON)
R
0.05
0.2
o
TA = 125
0.1
TA = 25oC
246810
VGS, GATE TO SOURCE VOLTAGE (V)
6.0V
10V
ID = 2 A
Figure 3. On-Resistance Variation
withTemperature.
10
V
DS
8
6
4
, DRAIN CURRENT (A)
D
I
2
0
1.522.533.54
VGS, GATE TO SOURCE VOLTAGE (V)
TA =-55oC
Figure 5. Transfer Characteristics. Figure 6. Body Diode Forward Voltage Variation
Figure 19. Maximum Safe Operating Area. Figure 20. Single Pulse Maximum
Power Dissipation.
1
RθJA(t) = r(t) * RθJA
0.2
0.1
0.01
THERMAL RESISTANCE
0.1
0.05
RθJA = 135oC/W
t1
t
2
TJ - TA = P * R
Duty Cycle, D = t1 / t
0.001
0.00010.0010.010.11101001000
t1, TIME (sec)
Figure 21. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
JA(t)
θ
2
FDS8333C Rev C (W)
Page 8
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I1
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