These N-Channel MOSFETs are produced using
Fairchild Semiconductor’s advanced PowerTrench
process that has been especially tailored to minimize
on-state resistance and yet maintain superior switching
performance.
Application
• Inverter
• Power Supplies
D
SO-8
D
D
Pin 1
D
D
D
D
SO-8
D
G
G
S
S
S
S
S
S
Features
•7.6 A, 40V RR
• High power handling capability in a widely used
surface mount package
• RoHS compliant
5
6
7
8
= 29mΩ@ VGS = 10V
DS(on)
= 36mΩ@ VGS = 4.5V
DS(on)
4
3
2
1
V N-
h
nn
l P
w
rTr
n
h
®
M
FET
Absolute Maximum RatingsT
o
=25
C unless otherwise noted
A
Symbol Parameter Ratings Units
V
Drain-Source Voltage 40 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous (Note 1a) 7.6 A
– Pulsed 50
PD
TJ, T
STG
Power Dissipation for Single Operation (Note 1a) 2.5
Operating and Storage Junction Temperature Range –55 to +150
Symbol Parameter Test Conditions Min Typ Max Units
Drain-Source Avalanche Ratings (Note 3)
EAS Drain-Source Avalanche Energy
IAS Drain-Source Avalanche Current 7.3 A
V
= 40 V, ID = 7.3 A, L = 1 mH 27 mJ
DD
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
ΔBVDSS
ΔT
J
I
Zero Gate Voltage Drain Current VDS = 32 V, VGS = 0 V 1
DSS
I
Gate–Body Leakage
GSS
Breakdown Voltage Temperature
Coefficient
= 0 V, ID = 250 μA
V
GS
= 250 μA, Referenced to 25°C
I
D
= ±20 V, VDS = 0 V
V
GS
40 V
34
±100
mV/°C
μA
nA
On Characteristics (Note 2)
V
Gate Threshold Voltage
GS(th)
ΔVGS(th)
ΔTJ
R
DS(on)
gFS Forward Transconductance VDS = 10 V, ID = 7.6 A 21 S
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
= VGS, ID = 250 μA
V
DS
= 250 μA, Referenced to 25°C
I
D
VGS = 10 V, ID = 7.6 A
= 4.5 V, ID = 6.8 A
V
GS
V
= 10 V, ID = 7.6 A, TJ=125°C
GS
1 1.9 3 V
–5
21
26
29
29
36
43
mV/°C
mΩ
Dynamic Characteristics
C
Input Capacitance 760 pF
iss
C
Output Capacitance 100 pF
oss
C
Reverse Transfer Capacitance
rss
RG Gate Resistance f = 1.0 MHz 1.2
V
= 20 V, V
DS
f = 1.0 MHz
= 0 V,
GS
60 pF
Ω
Switching Characteristics (Note 2)
t
Turn–On Delay Time 9 18 ns
d(on)
tr Turn–On Rise Time 5 10 ns
t
Turn–Off Delay Time 23 17 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 7.7 11 nC
Qgs Gate–Source Charge 2.4 nC
Qgd Gate–Drain Charge
= 20 V, ID = 1 A,
V
DD
= 10 V, R
V
GS
V
= 20 V, ID = 7.6 A,
DS
V
= 5 V
GS
GEN
= 6 Ω
3 6 ns
2.8 nC
Drain–Source Diode Characteristics
VSD
trr Diode Reverse Recovery Time 17 nS
Qrr Diode Reverse Recovery Charge
Notes:
1. R
θJA
the drain pins. R
Drain–Source Diode Forward
Voltage
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
is guaranteed by design while R
θJC
θCA
VGS = 0 V, IS = 2.1 A (Note 2) 0.76 1.2 V
= 7.6 A, diF/dt = 100 A/µs
I
F
is determined by the user's board design.
7 nC
44
4
V N-
h
nn
l P
w
rTr
n
h
®
M
FET
a) 50°C/W when mounted
on a 1in2 pad of 2 oz
copper
2 Test: Pulse Width < 300μs, Duty Cycle < 2.0%
3. BV(avalanche) Single-Pulse rating is guaranteed if device is operated within the UIS SOA boundary of the device.
FDS8449 Rev A(W) www.fairchildsemi.com
b) 125°C/W when mounted on a
minimum pad.
Scale 1 : 1 on letter size paper
Page 3
S8
9
0
C
a
e
o
e
e
c
OS
Typical Characteristics
FD
44
20
VGS = 10V
16
12
8
, DRAIN CURRENT (A)
D
I
4
0
00.511.522.5
4.0V
3.5V
4.5V6.0V
V
, DRAIN TO SOURCE VOLTAGE (V)
DS
3.0V
3
2.6
2.2
1.8
, NORMALIZED
1.4
DS(ON)
R
1
DRAIN-SOURCE ON-RESISTANCE
0.6
048121620
3.5V
VGS = 3.0V
4.0V
, DRAIN CURRENT (A)
I
D
4.5V
6.0V
Figure 1. On-Region Characteristics. Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.6
ID = 7.6A
= 10V
V
GS
1.4
1.2
, NORMALIZED
1
DS(ON)
R
0.8
DRAIN-SOURCE ON-RESISTANCE
0.6
-50-250255075100125150
, JUNCTION TEMPERATURE (oC)
T
J
0.07
0.06
0.05
0.04
0.03
, ON-RESISTANCE (OHM)
TA = 25oC
DS(ON)
0.02
R
0.01
246810
TA = 125oC
V
, GATE TO SOURCE VOLTAGE (V)
GS
10V
ID = 3.5A
4
V N-
h
nn
l P
w
rTr
n
h
®
M
FET
Figure 3. On-Resistance Variation with
Temperature.
20
VDS = 10V
15
10
TA = 125oC
, DRAIN CURRENT (A)
D
I
5
0
11.522.533.5
, GATE TO SOURCE VOLTAGE (V)
V
GS
-55oC
25oC
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
VGS = 0V
10
1
0.1
0.01
0.001
, REVERSE DRAIN CURRENT (A)
S
I
0.0001
00.20.40.60.811.2
TA = 125oC
25oC
BODY DIODE FORWARD VOLTAGE (V)
V
SD,
-55oC
Figure 5. Transfer Characteristics. Figure 6. Body Diode Forward Voltage Variation
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
f = 1 MHz
V
= 0 V
GS
SINGLE PULSE
R
= 125°C/W
θ
JA
T
= 25°C
A
4
V N-
h
nn
l P
w
rTr
n
h
®
M
FET
50
40
30
20
10
I(pk), PEAK TRANSIENT CURRENT (A)
0
0.0010.010.11101001000
t1, TIME (sec)
SINGLE PULSE
= 125°C/W
R
θ
JA
= 25°C
T
A
Figure 11. Single Pulse Maximum Peak
Current.
100
TJ = 25oC
10
, AVALANCHE CURRENT (A)
(AS)
I
1
0.010.1110
, TIME IN AVANCHE(ms)
t
AV
Figure 12. Unclamped Inductive Switching
Capability.
FDS8449 Rev A(W) www.fairchildsemi.com
Page 5
)
S8
9
0
C
a
e
o
e
e
c
OS
Typical Characteristics
1
D = 0.5
0.2
0.1
0.1
0.05
0.02
0.01
r(t), NORMALIZED EFFECTIVE
0.001
TRANSIENT THERMAL RESISTANCE
0.00010.0010.010.11101001000
0.01
SINGLE PULSE
Figure 25. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
t
, TIME (sec)
1
R
(t) = r(t) * R
θ
JA
R
= 125oC/W
θ
JA
P(pk
t
1
t
2
- TA = P * R
T
J
Duty Cycle, D = t
FD
44
4
θ
JA
V N-
h
nn
(t)
θ
JA
/ t
1
2
l P
w
rTr
n
h
®
M
FET
FDS8449 Rev A(W) www.fairchildsemi.com
Page 6
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx™
ActiveArray™
Bottomless™
FPS™
Build it Now™
CoolFET™
CROSSVOLT™
DOME™
EcoSPARK™
2
E
CMOS™
EnSigna™
FACT™
FACT Quiet Series™
Across the board. Around the world.™
The Power Franchise
Programmable Active Droop™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE T O ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY , FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PA TENT RIGHTS, NOR THE RIGHTS OF OTHERS.
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORA TION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STA TUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I17
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