ATMEL ATmega406 User Manual

BDTIC www.bdtic.com/ATMEL

Features

High Performance, Low Power AVR
Advanced RISC Architecture
– 124 Powerful Instructions - Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation – Up to 1 MIPS Throughput at 1 MHz
Nonvolatile Program and Data Memories
– 40K Bytes of In-System Self-Programmable Flash, Endurance: 10,000 Write/Erase
Cycles
– Optional Boot Code Section with Independent Lock Bits
In-System Programming by On-chip Boot Program
True Read-While-Write Operation – 512 bytes EEPROM, Endurance: 100,000 Write/Erase Cycles – 2K Bytes Internal SRAM – Programming Lock for Software Security
On-chip Debugging
– Extensive On-chip Debug Support – Available through JTAG interface
Battery Management Features
– Two, Three, or Four Cells in Series – Deep Under-voltage Protection – Over-current Protection (Charge and Discharge) – Short-circuit Protection (Discharge) – Integrated Cell Balancing FETs – High Voltage Outputs to Drive Charge/Precharge/Discharge FETs
Peripheral Features
– One 8-bit Timer/Counter with Separate Prescaler, Compare Mode, and PWM – One 16-bit Timer/Counter with Separate Prescaler and Compare Mode – 12-bit Voltage ADC, Eight External and Two Internal ADC Inputs – High Resolution Coulomb Counter ADC for Current Measurements – TWI Serial Interface for SM-Bus – Programmable Wake-up Timer – Programmable Watchdog Timer
Special Microcontroller Features
– Power-on Reset – On-chip Voltage Regulator – External and Internal Interrupt Sources – Four Sleep Modes: Idle, Power-save, Power-down, and Power-off
Packages
– 48-pin LQFP
Operating Voltage: 4.0 - 25V
Maximum Withstand Voltage (High-voltage pins): 28V
Temperature Range: -30°C to 85°C
– Speed Grade: 1 MHz
®
8-bit Microcontroller
8-bit
Microcontroller with 40K Bytes In-System Programmable Flash
ATmega406
Preliminary Summary
2548ES–AVR–07/06

1. Pin Configurations

Figure 1-1. Pinout ATmega406.
Top View
(ADC0 (ADC1 (ADC2 (ADC3
(ADC4/INT0
(INT1 (INT2
(INT3/PCINT7) PA7
SGND
/PCINT0) PA0 /PCINT1) PA1 /PCINT2) PA2 /PCINT3) PA3
VREG
VCC
GND
/PCINT4) PA4 /PCINT5) PA5 /PCINT6) PA6
1 2 3 4 5 6 7 8 9 10 11 12
NNINIPI
48
47
13
14
XTAL1
RESET
PPI
VREFGND
VREFNVPV1
46
45
44
43
15
16
17
18
GND
XTAL2
(TDI/PCINT9) PB1
(TDO/PCINT8) PB0
PV2
PV3
PV4
GND
42
41
40
39
38
37
36 35 34 33 32 31 30 29 28 27 26 25
19
20
21
22
23
24
SCL
SDA
(PCINT13) PB5
(PCINT12) PB4
(TCK/PCINT11) PB3
(TMS/PCINT10) PB2
PVT OD VFET OC OPC BATT PC0 GND PD1 PD0 (T0) PB7 (OC0B/PCINT15) PB6 (OC0A/PCINT14)

1.1 Disclaimer

2
ATmega406
Typical values contained in this datasheet are based on simulations and characterization of other AVR microcontrollers manufactured on the same process technology. Min and Max values will be available after the device is characterized.
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2. Overview

The ATmega406 is a low-power CMOS 8-bit microcontroller based on the AVR enhanced RISC architecture. By executing powerful instructions in a single clock cycle, the ATmega406 achieves throughputs approaching 1 MIPS at 1 MHz.

2.1 Block Diagram

Figure 2-1. Block Diagram
ATmega406
RESET
VFET VREG
XTAL1
XTAL2
BATT
VCC
GND
Oscillator
Circuits /
Clock
Generation
Watchdog Oscillator
Watchdog
Timer
Powe r
Supervision
POR &
RESET
Charger
Detect
Voltage
Regulator
PD1..0
PORTD (2)
Wake-Up
Timer
CPU
JTAG
SRAMFlash
DATA BU S
PORTC (1)
PB7..0
PORTB (8)
8 bit T/C0
16 bit T/C1
EEPROM
PORTA (8)TWI
FET
Control
Battery
Protection
Cell
Balancing
Voltage
ADC
Voltage
Reference
Coulumb
Counter ADC
PA3..0
OPC OC OD
PPI NNI PVT
PV4 PV3 PV2 PV1
NV
SGND
VREF
VREFGND
PI NI
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PC0SCASCL
PA7..0
The ATmega406 provides the following features: a Voltage Regulator, dedicated Battery Protec­tion Circuitry, integrated cell balancing FETs, high-voltage analog front-end, and an MCU with two ADCs with On-chip voltage reference for battery fuel gauging.
The voltage regulator operates at a wide range of voltages, 4.0 - 25 volts. This voltage is regu­lated to a constant supply voltage of nominally 3.3 volts for the integrated logic and analog functions.
The battery protection monitors the battery voltage and charge/discharge current to detect illegal conditions and protect the battery from these when required. The illegal conditions are deep under-voltage during discharging, short-circuit during discharging and over-current during charg­ing and discharging.
3
The integrated cell balancing FETs allow cell balancing algorithms to be implemented in software.
The MCU provides the following features: 40K bytes of In-System Programmable Flash with Read-While-Write capabilities, 512 bytes EEPROM, 2K byte SRAM, 32 general purpose working registers, 18 general purpose I/O lines, 11 high-voltage I/O lines, a JTAG Interface for On-chip Debugging support and programming, two flexible Timer/Counters with PWM and compare modes, one Wake-up Timer, an SM-Bus compliant TWI module, internal and external interrupts, a 12-bit Sigma Delta ADC for voltage and temperature measurements, a high resolution Sigma Delta ADC for Coulomb Counting and instantaneous current measurements, a programmable Watchdog Timer with internal Oscillator, and four software selectable power saving modes.
The AVR core combines a rich instruction set with 32 general purpose working registers. All the 32 registers are directly connected to the Arithmetic Logic Unit (ALU), allowing two independent registers to be accessed in one single instruction executed in one clock cycle. The resulting architecture is more code efficient while achieving throughputs up to ten times faster than con­ventional CISC microcontrollers.
The Idle mode stops the CPU while allowing the other chip function to continue functioning. The Power-down mode allows the voltage regulator, battery protection, regulator current detection, Watchdog Timer, and Wake-up Timer to operate, while disabling all other chip functions until the next Interrupt or Hardware Reset. In Power-save mode, the Wake-up Timer and Coulomb Counter ADC continues to run.
The device is manufactured using Atmel’s high voltage high density non-volatile memory tech­nology. The On-chip ISP Flash allows the program memory to be reprogrammed In-System, by a conventional non-volatile memory programmer or by an On-chip Boot program running on the AVR core. The Boot program can use any interface to download the application program in the Application Flash memory. Software in the Boot Flash section will continue to run while the Application Flash section is updated, providing true Read-While-Write operation. By combining an 8-bit RISC CPU with In-System Self-Programmable Flash, fuel gauging ADCs, dedicated bat­tery protection circuitry, Cell Balancing FETs, and a voltage regulator on a monolithic chip, the Atmel ATmega406 is a powerful microcontroller that provides a highly flexible and cost effective solution for Li-ion Smart Battery applications.
The ATmega406 AVR is supported with a full suite of program and system development tools including: C Compilers, Macro Assemblers, Program Debugger/Simulators, and On-chip Debugger.
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ATmega406
2548ES–AVR–07/06

2.2 Pin Descriptions

2.2.1 VFET

High voltage supply pin. This pin is used as supply for the internal voltage regulator, described in
”Voltage Regulator” on page 114. In addition the voltage level on this pin is monitored by the bat-
tery protection circuit, for deep-under-voltage protection. For details, see ”Battery Protection” on
page 125.

2.2.2 VCC

Digital supply voltage. Normally connected to VREG.

2.2.3 VREG

Output from the internal Voltage Regulator. Used for external decoupling to ensure stable regu­lator operation. For details, see ”Voltage Regulator” on page 114.

2.2.4 VREF

Internal Voltage Reference for external decoupling. For details, see ”Voltage Reference and
Temperature Sensor” on page 121.
ATmega406

2.2.5 VREFGND

Ground for decoupling of Internal Voltage Reference. For details, see ”Voltage Reference and
Temperature Sensor” on page 121.

2.2.6 GND

Ground

2.2.7 SGND

Signal ground pin, used as reference for Voltage-ADC conversions. For details, see ”Voltage
ADC – 10-channel General Purpose 12-bit Sigma-Delta ADC” on page 116.

2.2.8 Port A (PA7:PA0)

PA3:PA0 serves as the analog inputs to the Voltage A/D Converter.
Port A also serves as a low-voltage 8-bit bi-directional I/O port with internal pull-up resistors (selected for each bit). As inputs, Port A pins that are externally pulled low will source current if the pull-up resistors are activated. The Port A pins are tri-stated when a reset condition becomes active, even if the clock is not running.
Port A also serves the functions of various special features of the ATmega406 as listed in ”Alter-
nate Functions of Port A” on page 68.

2.2.9 Port B (PB7:PB0)

Port B is a low-voltage 8-bit bi-directional I/O port with internal pull-up resistors (selected for each bit). As inputs, Port B pins that are externally pulled low will source current if the pull-up resistors are activated. The Port B pins are tri-stated when a reset condition becomes active, even if the clock is not running.
2548ES–AVR–07/06
Port B also serves the functions of various special features of the ATmega406 as listed in ”Alter-
nate Functions of Port B” on page 70.
5

2.2.10 Port C (PC0)

Port C is a high voltage Open Drain output port.

2.2.11 Port D (PD1:PD0)

Port D is a low-voltage 2-bit bi-directional I/O port with internal pull-up resistors (selected for each bit). As inputs, Port D pins that are externally pulled low will source current if the pull-up resistors are activated. The Port D pins are tri-stated when a reset condition becomes active, even if the clock is not running.
Port D also serves the functions of various special features of the ATmega406 as listed in ”Alter-
nate Functions of Port D” on page 72.

2.2.12 SCL

SMBUS clock, Open Drain bidirectional pin.

2.2.13 SDA

SMBUS data, Open Drain bidirectional pin.

2.2.14 OC/OD/OPC

High voltage output to drive external Charge/Discharge/Pre-charge FETs. For details, see ”FET
Control” on page 133.

2.2.15 PI/NI

Unfiltered positive/negative input from external current sense resistor, used by the battery pro­tection circuit, for over-current and short-circuit detection. For details, see ”Battery Protection” on
page 125.

2.2.16 PPI/NNI

Filtered positive/negative input from external current sense resistor, used to by the Coulomb Counter ADC to measure charge/discharge currents flowing in the battery pack. For details, see
”Coulomb Counter - Dedicated Fuel Gauging Sigma-delta ADC” on page 106.

2.2.17 NV/PV1/PV2/PV3/PV4

NV, PV1, PV2, PV3, and PV4 are the inputs for battery cells 1, 2, 3 and 4, used by the Voltage ADC to measure each cell voltage. For details, see ”Voltage ADC – 10-channel General Pur-
pose 12-bit Sigma-Delta ADC” on page 116.

2.2.18 PVT

PVT defines the pull-up level for the OD output.

2.2.19 BATT

Input for detecting when a charger is connected. This pin also defines the pull-up level for OC and OPC outputs.

2.2.20 RESET

Reset input. A low level on this pin for longer than the minimum pulse length will generate a reset, even if the clock is not running. The minimum pulse length is given in Table 11 on page
38. Shorter pulses are not guaranteed to generate a reset.
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ATmega406
2548ES–AVR–07/06

2.2.21 XTAL1

2.2.22 XTAL2

3. Resources

ATmega406
Input to the inverting Oscillator amplifier.
Output from the inverting Oscillator amplifier.
A comprehensive set of development tools, application notes and datasheets are available for download on http://www.atmel.com/avr.
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7

4. Register Summary

Address Name Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Page
(0xFF) Reserved
(0xFE) Reserved
(0xFD) Reserved
(0xFC) Reserved
(0xFB) Reserved
(0xFA) Reserved
(0xF9) Reserved
(0xF8) BPPLR BPPLE BPPL 128
(0xF7) BPCR DUVD SCD DCD CCD 128
(0xF6) CBPTR SCPT[3:0] OCPT[3:0] 129
(0xF5) BPOCD DCDL[3:0] CCDL[3:0] 130
(0xF4) BPSCD SCDL[3:0] 130
(0xF3) BPDUV DUVT1 DUVT0 DUDL[3:0] 131
(0xF2) BPIR DUVIF COCIF DOCIF SCIF DUVIE COCIE DOCIE SCIE 132
(0xF1) CBCR CBE4 CBE3 CBE2 CBE1 137
(0xF0) FCSR PWMOC PWMOPC CPS DFE CFE PFD 134
(0xEF) Reserved
(0xEE) Reserved
(0xED) Reserved
(0xEC) Reserved
(0xEB) Reserved
(0xEA) Reserved
(0xE9) CADICH CADIC[15:8] 111
(0xE8) CADICL CADIC[7:0] 111
(0xE7) CADRDC CADRDC[7:0] 112
(0xE6) CADRCC CADRCC[7:0] 112
(0xE5) CADCSRB CADACIE CADRCIE CADICIE CADACIF CADRCIF CADICIF 110
(0xE4) CADCSRA CADEN CADUB CADAS1 CADAS0 CADSI1 CADSI0 CADSE 109
(0xE3) CADAC3 CADAC[31:24] 111
(0xE2) CADAC2 CADAC[23:16] 111
(0xE1) CADAC1 CADAC[15:8] 111
(0xE0) CADAC0 CADAC[7:0] 111
(0xDF) Reserved
(0xDE) Reserved
(0xDD) Reserved
(0xDC) Reserved
(0xDB) Reserved
(0xDA) Reserved
(0xD9) Reserved
(0xD8) Reserved
(0xD7) Reserved
(0xD6) Reserved
(0xD5) Reserved
(0xD4) Reserved
(0xD3) Reserved
(0xD2) Reserved
(0xD1) BGCRR BGCR7 BGCR6 BGCR5 BGCR4 BGCR3 BGCR2 BGCR1 BGCR0 123
(0xD0) BGCCR BGEN BGCC5 BGCC4 BGCC3 BGCC2 BGCC1 BGCC0 123
(0xCF) Reserved
(0xCE) Reserved
(0xCD) Reserved
(0xCC) Reserved
(0xCB) Reserved
(0xCA) Reserved
(0xC9) Reserved
(0xC8) Reserved
(0xC7) Reserved
(0xC6) Reserved
(0xC5) Reserved
(0xC4) Reserved
(0xC3) Reserved
(0xC2) Reserved
(0xC1) Reserved
(0xC0) CCSR –XOEACS 29
8
ATmega406
2548ES–AVR–07/06
ATmega406
Address Name Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Page
(0xBF) Reserved
(0xBE) TWBCSR TWBCIF TWBCIE TWBDT1 TWBDT0 TWBCIP 169
(0xBD) TWAMR TWAM[6:0] –150
(0xBC) TWCR TWINT TWEA TWSTA TWSTO TWWC TWEN –TWIE 147
(0xBB) TWDR 2–wire Serial Interface Data Register 149
(0xBA) TWAR TWA[6:0] TWGCE 149
(0xB9) TWSR TWS[7:3] TWPS1 TWPS0 148
(0xB8) TWBR 2–wire Serial Interface Bit Rate Register 147
(0xB7) Reserved
(0xB6) Reserved
(0xB5) Reserved
(0xB4) Reserved
(0xB3) Reserved
(0xB2) Reserved
(0xB1) Reserved
(0xB0) Reserved
(0xAF) Reserved
(0xAE) Reserved
(0xAD) Reserved
(0xAC) Reserved
(0xAB) Reserved
(0xAA) Reserved
(0xA9) Reserved
(0xA8) Reserved
(0xA7) Reserved
(0xA6) Reserved
(0xA5) Reserved
(0xA4) Reserved
(0xA3) Reserved
(0xA2) Reserved
(0xA1) Reserved
(0xA0) Reserved
(0x9F) Reserved
(0x9E) Reserved
(0x9D) Reserved
(0x9C) Reserved
(0x9B) Reserved
(0x9A) Reserved
(0x99) Reserved
(0x98) Reserved
(0x97) Reserved
(0x96) Reserved
(0x95) Reserved
(0x94) Reserved
(0x93) Reserved
(0x92) Reserved
(0x91) Reserved
(0x90) Reserved
(0x8F) Reserved
(0x8E) Reserved
(0x8D) Reserved
(0x8C) Reserved
(0x8B) Reserved
(0x8A) Reserved
(0x89) OCR1AH Timer/Counter1 – Output Compare Register A High Byte 101
(0x88) OCR1AL Timer/Counter1 – Output Compare Register A Low Byte 101
(0x87) Reserved
(0x86) Reserved
(0x85) TCNT1H Timer/Counter1 – Counter Register High Byte 101
(0x84) TCNT1L Timer/Counter1 – Counter Register Low Byte 101
(0x83) Reserved
(0x82) Reserved
(0x81) TCCR1B
(0x80) Reserved
(0x7F) Reserved
(0x7E) DIDR0
CTC1 CS12 CS11 CS10 100
VADC3D VADC2D VADC1D VADC0D 120
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9
Address Name Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Page
(0x7D) Reserved
(0x7C) VADMUX VADMUX3 VADMUX2 VADMUX1 VADMUX0 118
(0x7B) Reserved
(0x7A) VADCSR VADEN VADSC VADCCIF VADCCIE 118
(0x79) VADCH VADC Data Register High byte 119
(0x78) VADCL VADC Data Register Low byte 119
(0x77) Reserved
(0x76) Reserved
(0x75) Reserved
(0x74) Reserved
(0x73) Reserved
(0x72) Reserved
(0x71) Reserved
(0x70) Reserved
(0x6F) TIMSK1 –OCIE1ATOIE1 102
(0x6E) TIMSK0 OCIE0B OCIE0A TOIE0 93
(0x6D) Reserved
(0x6C) PCMSK1 PCINT[15:8] 59
(0x6B) PCMSK0 PCINT[7:0] 59
(0x6A) Reserved
(0x69) EICRA ISC31 ISC30 ISC21 ISC20 ISC11 ISC10 ISC01 ISC00 56
(0x68) PCICR –PCIE1PCIE0 58
(0x67) Reserved
(0x66) FOSCCAL Fast Oscillator Calibration Register 29
(0x65) Reserved
(0x64) PRR0 PRTWI PRTIM1 PRTIM0 PRVADC 36
(0x63) Reserved
(0x62) WUTCSR WUTIF WUTIE WUTCF WUTR WUTE WUTP2 WUTP1 WUTP0 49
(0x61) Reserved
(0x60) WDTCSR WDIF WDIE WDP3 WDCE WDE WDP2 WDP1 WDP0 47
0x3F (0x5F) SREG I T H S V N Z C 10
0x3E (0x5E) SPH SP15 SP14 SP13 SP12 SP11 SP10 SP9 SP8 12
0x3D (0x5D) SPL SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0 12
0x3C (0x5C) Reserved
0x3B (0x5B) Reserved
0x3A (0x5A) Reserved
0x39 (0x59) Reserved
0x38 (0x58) Reserved
0x37 (0x57) SPMCSR SPMIE RWWSB SIGRD RWWSRE BLBSET PGWRT PGERS SPMEN 183
0x36 (0x56) Reserved
0x35 (0x55) MCUCR JTD –PUD– IVSEL IVCE 55/73/176
0x34 (0x54) MCUSR JTRF WDRF BODRF EXTRF PORF 46
0x33 (0x53) SMCR SM2 SM1 SM0 SE 31
0x32 (0x52) Reserved
0x31 (0x51) OCDR On-Chip Debug Register 176
0x30 (0x50) Reserved
0x2F (0x4F) Reserved
0x2E (0x4E) Reserved
0x2D (0x4D) Reserved
0x2C (0x4C) Reserved
0x2B (0x4B) GPIOR2 General Purpose I/O Register 2 24
0x2A (0x4A) GPIOR1 General Purpose I/O Register 1 24
0x29 (0x49) Reserved
0x28 (0x48) OCR0B Timer/Counter0 Output Compare Register B 92
0x27 (0x47) OCR0A Timer/Counter0 Output Compare Register A 92
0x26 (0x46) TCNT0 Timer/Counter0 (8 Bit) 92
0x25 (0x45) TCCR0B FOC0A FOC0B WGM02 CS02 CS01 CS00 91
0x24 (0x44) TCCR0A COM0A1 COM0A0 COM0B1 COM0B0
0x23 (0x43) GTCCR TSM
0x22 (0x42) EEARH High Byte 19
0x21 (0x41) EEARL EEPROM Address Register Low Byte 19
0x20 (0x40) EEDR EEPROM Data Register 19
0x1F (0x3F) EECR EEPM1 EEPM0 EERIE EEMPE EEPE EERE 19
0x1E (0x3E) GPIOR0 General Purpose I/O Register 0 24
0x1D (0x3D) EIMSK
0x1C (0x3C) EIFR
–WGM01WGM00 88
PSRSYNC 105
INT3 INT2 INT1 INT0 57
INTF3 INTF2 INTF1 INTF0 57
10
ATmega406
2548ES–AVR–07/06
ATmega406
Address Name Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Page
0x1B (0x3B) PCIFR –PCIF1PCIF0
0x1A (0x3A) Reserved
0x19 (0x39) Reserved
0x18 (0x38) Reserved
0x17 (0x37) Reserved
0x16 (0x36) TIFR1
0x15 (0x35) TIFR0
0x14 (0x34) Reserved
0x13 (0x33) Reserved
0x12 (0x32) Reserved
0x11 (0x31) Reserved
0x10 (0x30) Reserved
0x0F (0x2F) Reserved
0x0E (0x2E) Reserved
0x0D (0x2D) Reserved
0x0C (0x2C) Reserved
0x0B (0x2B) PORTD PORTD1 PORTD0 74
0x0A (0x2A) DDRD
0x09 (0x29) PIND
0x08 (0x28) PORTC –PORTC0 76
0x07 (0x27) Reserved
0x06 (0x26) Reserved
0x05 (0x25) PORTB PORTB7 PORTB6 PORTB5 PORTB4 PORTB3 PORTB2 PORTB1 PORTB0 74
0x04 (0x24) DDRB DDB7 DDB6 DDB5 DDB4 DDB3 DDB2 DDB1 DDB0 74
0x03 (0x23) PINB PINB7 PINB6 PINB5 PINB4 PINB3 PINB2 PINB1 PINB0 74
0x02 (0x22) PORTA PORTA7 PORTA6 PORTA5 PORTA4 PORTB3 PORTA2 PORTA1 PORTA0 73
0x01 (0x21) DDRA DDA7 DDA6 DDA5 DDA4 DDA3 DDA2 DDA1 DDA0 73
0x00 (0x20) PINA PINA7 PINA6 PINA5 PINA4 PINA3 PINA2 PINA1 PINA0 73
Notes: 1. For compatibility with future devices, reserved bits should be written to zero if accessed. Reserved I/O memory addresses
should never be written.
2. I/O registers within the address range $00 - $1F are directly bit-accessible using the SBI and CBI instructions. In these reg­isters, the value of single bits can be checked by using the SBIS and SBIC instructions.
3. Some of the status flags are cleared by writing a logical one to them. Note that the CBI and SBI instructions will operate on all bits in the I/O register, writing a one back into any flag read as set, thus clearing the flag. The CBI and SBI instructions work with registers 0x00 to 0x1F only.
4. When using the I/O specific commands IN and OUT, the I/O addresses $00 - $3F must be used. When addressing I/O regis­ters as data space using LD and ST instructions, $20 must be added to these addresses. The ATmega406 is a complex microcontroller with more peripheral units than can be supported within the 64 location reserved in Opcode for the IN and OUT instructions. For the Extended I/O space from $60 - $FF in SRAM, only the ST/STS/STD and LD/LDS/LDD instructions can be used.
–OCF1ATOV1 102
–OCF0BOCF0ATOV0 94
DDD1 DDD0 74
PIND1 PIND0 74
2548ES–AVR–07/06
11

5. Instruction Set Summary

Mnemonics Operands Description Operation Flags #Clocks
ARITHMETIC AND LOGIC INSTRUCTIONS
ADD Rd, Rr Add two Registers Rd ← Rd + Rr Z,C,N,V,H 1
ADC Rd, Rr Add with Carry two Registers Rd Rd + Rr + C Z,C,N,V,H 1
ADIW Rdl,K Add Immediate to Word Rdh:Rdl Rdh:Rdl + K Z,C,N,V,S 2
SUB Rd, Rr Subtract two Registers Rd ← Rd - Rr Z,C,N,V,H 1
SUBI Rd, K Subtract Constant from Register Rd Rd - K Z,C,N,V,H 1
SBC Rd, Rr Subtract with Carry two Registers Rd Rd - Rr - C Z,C,N,V,H 1
SBCI Rd, K Subtract with Carry Constant from Reg. Rd Rd - K - C Z,C,N,V,H 1
SBIW Rdl,K Subtract Immediate from Word Rdh:Rdl Rdh:Rdl - K Z,C,N,V,S 2
AND Rd, Rr Logical AND Registers Rd Rd Rr Z,N,V 1
ANDI Rd, K Logical AND Register and Constant Rd Rd • K Z,N,V 1
OR Rd, Rr Logical OR Registers Rd Rd v Rr Z,N,V 1
ORI Rd, K Logical OR Register and Constant Rd Rd v K Z,N,V 1
EOR Rd, Rr Exclusive OR Registers Rd Rd Rr Z,N,V 1
COM Rd One’s Complement Rd 0xFF Rd Z,C,N,V 1
NEG Rd Two’s Complement Rd 0x00 Rd Z,C,N,V,H 1
SBR Rd,K Set Bit(s) in Register Rd Rd v K Z,N,V 1
CBR Rd,K Clear Bit(s) in Register Rd Rd • (0xFF - K) Z,N,V 1
INC Rd Increment Rd Rd + 1 Z,N,V 1
DEC Rd Decrement Rd Rd 1 Z,N,V 1
TST Rd Test for Zero or Minus Rd Rd Rd Z,N,V 1
CLR Rd Clear Register Rd Rd Rd Z,N,V 1
SER Rd Set Register Rd 0xFF None 1
MUL Rd, Rr Multiply Unsigned R1:R0 Rd x Rr Z,C 2
MULS Rd, Rr Multiply Signed R1:R0 Rd x Rr Z,C 2
MULSU Rd, Rr Multiply Signed with Unsigned R1:R0 Rd x Rr Z,C 2 FMUL Rd, Rr Fractional Multiply Unsigned R1:R0 (Rd x Rr) << 1 Z,C 2 FMULS Rd, Rr Fractional Multiply Signed R1:R0 (Rd x Rr) << 1 Z,C 2 FMULSU Rd, Rr Fractional Multiply Signed with Unsigned R1:R0 (Rd x Rr) << 1 Z,C 2
BRANCH INSTRUCTIONS
RJMP k Relative Jump PC PC + k + 1 None 2
IJMP Indirect Jump to (Z) PC Z None 2
JMP k Direct Jump PC kNone3
RCALL k Relative Subroutine Call PC PC + k + 1 None 3
ICALL Indirect Call to (Z) PC ZNone3
CALL k Direct Subroutine Call PC kNone4
RET Subroutine Return PC STACK None 4
RETI Interrupt Return PC STACK I 4
CPSE Rd,Rr Compare, Skip if Equal if (Rd = Rr) PC PC + 2 or 3 None 1/2/3
CP Rd,Rr Compare Rd Rr Z, N,V,C,H 1
CPC Rd,Rr Compare with Carry Rd Rr C Z, N,V,C,H 1
CPI Rd,K Compare Register with Immediate Rd K Z, N,V,C,H 1
SBRC Rr, b Skip if Bit in Register Cleared if (Rr(b)=0) PC PC + 2 or 3 None 1/2/3
SBRS Rr, b Skip if Bit in Register is Set if (Rr(b)=1) PC PC + 2 or 3 None 1/2/3
SBIC P, b Skip if Bit in I/O Register Cleared if (P(b)=0) PC PC + 2 or 3 None 1/2/3
SBIS P, b Skip if Bit in I/O Register is Set if (P(b)=1) PC PC + 2 or 3 None 1/2/3
BRBS s, k Branch if Status Flag Set if (SREG(s) = 1) then PCPC+k + 1 None 1/2
BRBC s, k Branch if Status Flag Cleared if (SREG(s) = 0) then PCPC+k + 1 None 1/2
BREQ k Branch if Equal if (Z = 1) then PC PC + k + 1 None 1/2
BRNE k Branch if Not Equal if (Z = 0) then PC PC + k + 1 None 1/2
BRCS k Branch if Carry Set if (C = 1) then PC PC + k + 1 None 1/2
BRCC k Branch if Carry Cleared if (C = 0) then PC ← PC + k + 1 None 1/2
BRSH k Branch if Same or Higher if (C = 0) then PC PC + k + 1 None 1/2
BRLO k Branch if Lower if (C = 1) then PC PC + k + 1 None 1/2
BRMI k Branch if Minus if (N = 1) then PC PC + k + 1 None 1/2
BRPL k Branch if Plus if (N = 0) then PC PC + k + 1 None 1/2
BRGE k Branch if Greater or Equal, Signed if (N V= 0) then PC PC + k + 1 None 1/2
BRLT k Branch if Less Than Zero, Signed if (N V= 1) then PC PC + k + 1 None 1/2
BRHS k Branch if Half Carry Flag Set if (H = 1) then PC PC + k + 1 None 1/2
BRHC k Branch if Half Carry Flag Cleared if (H = 0) then PC PC + k + 1 None 1/2
BRTS k Branch if T Flag Set if (T = 1) then PC PC + k + 1 None 1/2
BRTC k Branch if T Flag Cleared if (T = 0) then PC PC + k + 1 None 1/2
BRVS k Branch if Overflow Flag is Set if (V = 1) then PC PC + k + 1 None 1/2
BRVC k Branch if Overflow Flag is Cleared if (V = 0) then PC PC + k + 1 None 1/2
12
ATmega406
2548ES–AVR–07/06
ATmega406
5. Instruction Set Summary (Continued)
Mnemonics Operands Description Operation Flags #Clocks
BRIE k Branch if Interrupt Enabled if ( I = 1) then PC PC + k + 1 None 1/2
BRID k Branch if Interrupt Disabled if ( I = 0) then PC PC + k + 1 None 1/2
BIT AND BIT-TEST INSTRUCTIONS
SBI P,b Set Bit in I/O Register I/O(P,b) 1None2
CBI P,b Clear Bit in I/O Register I/O(P,b) 0None2
LSL Rd Logical Shift Left Rd(n+1) Rd(n), Rd(0) 0 Z,C,N,V 1
LSR Rd Logical Shift Right Rd(n) Rd(n+1), Rd(7) 0 Z,C,N,V 1
ROL Rd Rotate Left Through Carry Rd(0)←C,Rd(n+1)← Rd(n),C←Rd(7) Z,C,N,V 1
ROR Rd Rotate Right Through Carry Rd(7)←C,Rd(n)← Rd(n+1),C←Rd(0) Z,C,N,V 1
ASR Rd Arithmetic Shift Right Rd(n) Rd(n+1), n=0..6 Z,C,N,V 1
SWAP Rd Swap Nibbles Rd(3..0)←Rd(7..4),Rd(7..4)←Rd(3..0) None 1
BSET s Flag Set SREG(s) 1 SREG(s) 1
BCLR s Flag Clear SREG(s) 0 SREG(s) 1
BST Rr, b Bit Store from Register to T T Rr(b) T 1
BLD Rd, b Bit load from T to Register Rd(b) TNone1
SEC Set Carry C 1C1
CLC Clear Carry C 0 C 1
SEN Set Negative Flag N 1N1
CLN Clear Negative Flag N 0 N 1
SEZ Set Zero Flag Z 1Z1
CLZ Clear Zero Flag Z 0 Z 1
SEI Global Interrupt Enable I 1I1
CLI Global Interrupt Disable I 0 I 1
SES Set Signed Test Flag S 1S1
CLS Clear Signed Test Flag S 0 S 1
SEV Set Twos Complement Overflow. V 1V1
CLV Clear Twos Complement Overflow V 0 V 1
SET Set T in SREG T 1T1
CLT Clear T in SREG T 0 T 1
SEH Set Half Carry Flag in SREG H 1H1 CLH Clear Half Carry Flag in SREG H 0 H 1
DATA TRANSFER INSTRUCTIONS
MOV Rd, Rr Move Between Registers Rd Rr None 1
MOVW Rd, Rr Copy Register Word
LDI Rd, K Load Immediate Rd KNone1
LD Rd, X Load Indirect Rd (X) None 2
LD Rd, X+ Load Indirect and Post-Inc. Rd (X), X X + 1 None 2
LD Rd, - X Load Indirect and Pre-Dec. X X - 1, Rd (X) None 2
LD Rd, Y Load Indirect Rd (Y) None 2
LD Rd, Y+ Load Indirect and Post-Inc. Rd (Y), Y Y + 1 None 2
LD Rd, - Y Load Indirect and Pre-Dec. Y Y - 1, Rd (Y) None 2
LDD Rd,Y+q Load Indirect with Displacement Rd (Y + q) None 2
LD Rd, Z Load Indirect Rd (Z) None 2
LD Rd, Z+ Load Indirect and Post-Inc. Rd (Z), Z Z+1 None 2
LD Rd, -Z Load Indirect and Pre-Dec. Z ← Z - 1, Rd ← (Z) None 2
LDD Rd, Z+q Load Indirect with Displacement Rd (Z + q) None 2
LDS Rd, k Load Direct from SRAM Rd (k) None 2
ST X, Rr Store Indirect (X) Rr None 2
ST X+, Rr Store Indirect and Post-Inc. (X) Rr, X X + 1 None 2
ST - X, Rr Store Indirect and Pre-Dec. X X - 1, (X) Rr None 2
ST Y, Rr Store Indirect (Y) Rr None 2
ST Y+, Rr Store Indirect and Post-Inc. (Y) Rr, Y Y + 1 None 2
ST - Y, Rr Store Indirect and Pre-Dec. Y Y - 1, (Y) Rr None 2
STD Y+q,Rr Store Indirect with Displacement (Y + q) Rr None 2
ST Z, Rr Store Indirect (Z) Rr None 2
ST Z+, Rr Store Indirect and Post-Inc. (Z) Rr, Z
ST -Z, Rr Store Indirect and Pre-Dec. Z Z - 1, (Z) Rr None 2
STD Z+q,Rr Store Indirect with Displacement (Z + q) Rr None 2
STS k, Rr Store Direct to SRAM (k) Rr None 2
LPM Load Program Memory R0 (Z) None 3
LPM Rd, Z Load Program Memory Rd (Z) None 3
LPM Rd, Z+ Load Program Memory and Post-Inc Rd (Z), Z Z+1 None 3
SPM Store Program Memory (Z) R1:R0 None -
IN Rd, P In Port Rd PNone1
Rd+1:Rd Rr+1:Rr
Z + 1 None 2
None 1
2548ES–AVR–07/06
13
5. Instruction Set Summary (Continued)
Mnemonics Operands Description Operation Flags #Clocks
OUT P, Rr Out Port P Rr None 1
PUSH Rr Push Register on Stack STACK Rr None 2
POP Rd Pop Register from Stack Rd STACK None 2
MCU CONTROL INSTRUCTIONS
NOP No Operation None 1
SLEEP Sleep (see specific descr. for Sleep function) None 1
WDR Watchdog Reset (see specific descr. for WDR/timer) None 1 BREAK Break For On-chip Debug Only None N/A
14
ATmega406
2548ES–AVR–07/06
ATmega406

6. Ordering Information

Speed (MHz) Power Supply Ordering Code Package
1 4.0 - 25V ATmega406-1AAU
Notes: 1. This device can also be supplied in wafer form. Please contact your local Atmel sales office for detailed ordering information
and minimum quantities.
2. Pb-free packaging alternative, complies to the European Directive for Restriction of Hazardous Substances (RoHS direc­tive). Also Halide free and fully Green.
(2)
48AA
(1)
Operation Range
Industrial
(-30°C to 85°C)
Package Type
48AA 48-lead, 7 x 7 x 1.44 mm body, 0.5 mm lead pitch, Low Profile Plastic Quad Flat Package (LQFP)
2548ES–AVR–07/06
15

7. Packaging Information

7.1 48AA

PIN 1
PIN 1 IDENTIFIER
B
e
E1 E
D1
D
C
0˚~7˚
A1
L
Notes: 1. This package conforms to JEDEC reference MS-026, Variation BBC.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable protrusion is 0.25 mm per side. Dimensions D1 and E1 are maximum plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.08 mm maximum.
A2 A
SYMBOL
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A 1.60
A1 0.05 0.15
A2 1.35 1.40 1.45
D 8.75 9.00 9.25
D1 6.90 7.00 7.10 Note 2
E 8.75 9.00 9.25
E1 6.90 7.00 7.10 Note 2
B 0.17 0.27
C 0.09 0.20
L 0.45 0.75
e 0.50 TYP
NOM
MAX
NOTE
16
2325 Orchard Parkway
R
San Jose, CA 95131
ATmega406
TITLE
48AA, 48-lead, 7 x 7 mm Body Size, 1.4 mm Body Thickness,
0.5 mm Lead Pitch, Low Profile Plastic Quad Flat Package (LQFP)
10/5/2001
DRAWING NO.
48AA
2548ES–AVR–07/06
REV.
C

8. Errata

8.1 Rev. F

ATmega406
Voltage-ADC Common Mode Offset
Voltage Reference Spike
1. Voltage-ADC Common Mode Offset
The cell conversion will have an Offset-error depending on the Common Mode (CM) level. This means that the error of a cell is depending on the voltage of the lower cells. The CM Offset is calibrated away in Atmel production when the cells are balanced. When the cells get un-balanced the CM depending offset will reappear:
a. Cell 1 defines its own CM level, and will never be affected by the CM dependent
offset. b. The CM level for Cell 2 will change if Cell 1 voltage deviates from Cell 2 voltage. c. The CM level for Cell 3 will change if Cell 1 and/or Cell 2 voltage deviates from the
voltage at Cell 3. The worst-case error is when Cell 1 and 2 are balanced while Cell 3
voltage deviates from the voltage at Cell 1 and 2. d. The CM level for Cell 4 will change if Cell 1, Cell 2 and/or Cell 3 deviate from the volt-
age at Cell 4. The worst-case error is when Cell 1, Cell 2 and Cell 3 are balanced
while Cell 4 voltage deviates from the voltage at Cell 1, 2 and 3.
Figure 9-1 on page 18, shows the error of Cell2, Cell3 and Cell4 with 5% and 10% unbal-
anced cells.
2548ES–AVR–07/06
17
Figure 8-1. CM Offset with unbalanced cells.
18
Problem Fix/Workaround
Avoid getting unbalanced cells by using the internal cell balancing FETs.
2. Voltage Reference spike
The Voltage Reference, VREF, will spike each time the internal temperature sensor is enabled. The temperature sensor is enabled when the VTEMP is selected in the VADMUX register and the V-ADC is enabled by the VADEN bit.
The spike will be approximately 50mV and lasts for about 5ms, and it will affect any ongoing current accumulation in the CC-ADC, as well as V-ADC conversions in the period of the spike. Figure 9-2 on page 19 illustrates the Voltage Reference spike.
ATmega406
2548ES–AVR–07/06
Figure 8-2. Voltage Reference Spike
e
Voltage
ATmega406
1.1 V
VADEN
VADMUX3:0 XXX VTEMP
V~50mV
t ~< 5ms
VREF
tim
Problem workaround:
To get correct temperature measurement, the VADSC bit should not be written until the spike has settled (external decoupling capacitor of 1μF).
2548ES–AVR–07/06
19

8.2 Rev. E

Voltage ADC not functional below 0°C
Voltage-ADC Common Mode Offset
Voltage Reference Spike
1. Voltage-ADC Failing at Low Temperatures
Voltage ADC not functional below 0°C. The voltage ADC has a very large error below 0°C, and can not be used
Problem Fix/Workaround
Do not use this revision below 0 celsius.
2. Voltage-ADC Common Mode Offset
The cell conversion will have an Offset-error depending on the Common Mode (CM) level. This means that the error of a cell is depending on the voltage of the lower cells. The CM Offset is calibrated away in Atmel production when the cells are balanced. When the cells get un-balanced the CM depending offset will reappear:
a. Cell 1 defines its own CM level, and will never be affected by the CM dependent
offset. b. The CM level for Cell 2 will change if Cell 1 voltage deviates from Cell 2 voltage. c. The CM level for Cell 3 will change if Cell 1 and/or Cell 2 voltage deviates from the
voltage at Cell 3. The worst-case error is when Cell 1 and 2 are balanced while Cell 3
voltage deviates from the voltage at Cell 1 and 2. d. The CM level for Cell 4 will change if Cell 1, Cell 2 and/or Cell 3 deviate from the volt-
age at Cell 4. The worst-case error is when Cell 1, Cell 2 and Cell 3 are balanced
while Cell 4 voltage deviates from the voltage at Cell 1, 2 and 3.
Figure 9-1 on page 18, shows the error of Cell2, Cell3 and Cell4 with 5% and 10% unbal-
anced cells.
20
ATmega406
2548ES–AVR–07/06
Figure 8-3. CM Offset with unbalanced cells.
ATmega406
2548ES–AVR–07/06
Problem Fix/Workaround
Avoid getting unbalanced cells by using the internal cell balancing FETs.
3. Voltage Reference Spike
The Voltage Reference, VREF, will spike each time a temperature measurement is started with the Voltage-ADC.
Problem Fix/Workaround
An accurate temperature measurement could be obtained by doing 10 temperature conver­sions immediately after each other. The first 9 results would be inaccurate, but the 10th conversion will be correct.
Figure 9-4 on page 22 illustrates the spike on the Voltage Reference when doing 10 temper-
ature conversions in a row (external decoupling capacitor of 1μF).
21
Figure 8-4. Voltage Reference Spike
e
Voltage

8.3 Rev. D

1.1 V
VADSC (10 VTEMP conversion in a row)
VADMUX3:0
V~50mV
t ~< 5ms
XXX VTEMP
VREF
tim
If the CC-ADC is doing current accumulation while the V-ADC is doing temperature mea­surement, both the Instantaneous and the Accumulated conversion results will be affected. The spike on VREF will be visible on 1 Accumulated Current (CADAC3…0) and 2 Instanta­neous Current (CADIC1…0) conversion results.
Voltage ADC not functional below 0°C
Voltage-ADC Common Mode Offset
Voltage Reference Spike
Voltage Regulator Start-up sequence
V
influenced by MCU state
REF
EEPROM read from application code does not work in Lock Bit Mode 3
22
1. Voltage-ADC Failing at Low Temperatures
Voltage ADC not functional below 0°C. The voltage ADC has a very large error below 0°C, and can not be used
Problem Fix/Workaround
1. Voltage-ADC Common Mode Offset
The cell conversion will have an Offset-error depending on the Common Mode (CM) level. This means that the error of a cell is depending on the voltage of the lower cells. The CM Offset is calibrated away in Atmel production when the cells are balanced. When the cells get un-balanced the CM depending offset will reappear:
ATmega406
2548ES–AVR–07/06
ATmega406
a. Cell 1 defines its own CM level, and will never be affected by the CM dependent
offset. b. The CM level for Cell 2 will change if Cell 1 voltage deviates from Cell 2 voltage. c. The CM level for Cell 3 will change if Cell 1 and/or Cell 2 voltage deviates from the
voltage at Cell 3. The worst-case error is when Cell 1 and 2 are balanced while Cell 3
voltage deviates from the voltage at Cell 1 and 2. d. The CM level for Cell 4 will change if Cell 1, Cell 2 and/or Cell 3 deviate from the volt-
age at Cell 4. The worst-case error is when Cell 1, Cell 2 and Cell 3 are balanced
while Cell 4 voltage deviates from the voltage at Cell 1, 2 and 3.
Figure 9-1 on page 18, shows the error of Cell2, Cell3 and Cell4 with 5% and 10% unbal-
anced cells.
Figure 8-5. CM Offset with unbalanced cells.
2548ES–AVR–07/06
Problem Fix/Workaround
Avoid getting unbalanced cells by using the internal cell balancing FETs.
23
3. Voltage Reference Spike
e
The Voltage Reference, VREF, will spike each time a temperature measurement is started with the Voltage-ADC.
Problem Fix/Workaround
An accurate temperature measurement could be obtained by doing 10 temperature conver­sions immediately after each other. The first 9 results would be inaccurate, but the 10th conversion will be correct.
Figure 9-6 illustrates the spike on the Voltage Reference when doing 10 temperature con-
versions in a row (external decoupling capacitor of 1μF).
Figure 8-6. Voltage Reference Spike
Voltage
1.1 V
VADSC (10 VTEMP conversion in a row)
VADMUX3:0
V~50mV
t ~< 5ms
XXX VTEMP
VREF
tim
If the CC-ADC is doing current accumulation while the V-ADC is doing temperature mea­surement, both the Instantaneous and the Accumulated conversion results will be affected. The spike on VREF will be visible on 1 Accumulated Current (CADAC3…0) and 2 Instanta­neous Current (CADIC1…0) conversion results.
24
ATmega406
2548ES–AVR–07/06
ATmega406
4. Voltage Regulator Start-up sequence
When powering up ATmega406 some precautions are necessary to ensure proper start-up of the Voltage Regulator.
Problem Fix/Workaround
The three steps below are needed to ensure proper start-up of the voltage regulator.
a. Do NOT connect a capacitor larger than 100 nF on the VFET pin. This is to ensure
fast rise time on the VFET pin when a supply voltage is connected. b. During assembly, always connect Cell1 first, then Cell2 and so on until the top cell is
connected to PVT. If the cell voltages are about 2 volts or larger, the Voltage Regula-
tor will normally start up properly in Power-off mode (VREG appr. 2.8 volts). c. After all cells have been assembled as described in step 2, a charger source must be
connected at the BATT+ terminal to initialize the chip, see Section 8.3 ”Power-on
Reset and Charger Connect” on page 38 in the datasheet.
If the Voltage Regulator started up in Power-off during assembly of the cells, the chip will ini­tialize when the charger source makes the voltage at the BATT pin exceed 7 - 8 Volts.
If the Voltage Regulator did not start up properly, the charger source has one additional requirement to ensure proper start up and initialization. In this case the charger source must ensure that the voltage at the VFET pin increases quickly at least 3 Volts above the voltage at the PVT pin, and that the voltage at the BATT pin exceeds 7 - 8 Volts. This will start up and initialize the chip directly.
5. V
influenced by MCU state
REF
The reference voltage at the V
pin depends on the following conditions of the device:
REF
a. Charger Over-current and/or Discharge Over-current Protection active but Short-cir-
cuit inactive. This will increase V
voltage with typical 1 mV compared to a
REF
condition were all Current Protections are disabled. b. Short-circuit Protection active. Short-circuit measurements are activated when SCD
in BPCR is zero (default) and DFE in FET Control and Status Register (FCSR) is set.
This will increase V
voltage with typical 8 mV compared to a condition with short-
REF
circuit measurements inactive. c. V-ADC conversion of the internal VTEMP voltage. This will increase V
voltage
REF
with typical 15 mV compared to a condition with short-circuit measurements inactive.
Problem Fix/Work around
To ensure the highest accuracy, set the Bandgap Calibration Register (BGCC) to get 1.100 V at V
after the chip is configured with the actual Battery Protection settings and the Dis-
REF
charge FET is enabled.
6. EEPROM read from application code does not work in Lock Bit Mode 3
When the Memory Lock Bits LB2 and LB1 are programmed to mode 3, EEPROM read does not work from the application code.
Problem Fix/Work around
Do not set Lock Bit Protection Mode 3 when the application code needs to read from EEPROM.
2548ES–AVR–07/06
25

9. Datasheet Revision History

9.1 Rev 2548E - 07/06

1. Updated ”Pin Configurations” on page 2.
2. Updated ”ADC Noise Reduction Mode” on page 32.
3. Updated ”Power-save Mode” on page 32.
4. Updated ”Power-down Mode” on page 33. 5 Updated ”Power-off Mode” on page 33.
6. Updated ”Power Reduction Register” on page 36.
7. Added ”Voltage ADC” on page 37 and ”Coloumb Counter” on page 38.
8. Updated ”Reset Sources” on page 39.
9. Updated ”Power-on Reset and Charger Connect” on page 40.
10. Updated ”External Reset” on page 41.
11. V
12. Updated ”Alternate Port Functions” on page 66.
13. Updated ”Internal Clock Source” on page 103.
14. Updated ”External Clock Source” on page 103.
15. Updated Features in ”Coulomb Counter - Dedicated Fuel Gauging Sigma-delta ADC”
16. Updated Operation in Section 18. ”Coulomb Counter - Dedicated Fuel Gauging
17. Updated Features in ”Voltage Regulator” on page 114.
18. Updated Operation in ”Voltage Regulator” on page 114.
19. Updated Bit description in ”VADCL and VADCH – The V-ADC Data Register” on page
20. Updated ”Writing to Bandgap Calibration Registers” on page 122.
21. Updated Text in ”Register Description for FET Control” on page 134.
22. Added ”MCUCR – MCU Control Register” on page 176. 23 Updated ”Operating Circuit” on page 223
24. Updated ”Electrical Characteristics” on page 225.
25. Added ”Typical Characteristics – Preliminary” on page 232. 26 Updated ”Register Summary” on page 236.
27. Updated ”Errata” on page 17.
28. Updated Table 9-2 on page 48, Table 27-5 on page 189.
29. Updated Figure 8-1 on page 35, Figure 9-5 on page 42, Figure 17-2 on page 104,
30. Updated Register Adresses.
replaced by VREG in ”Brown-out Detection” on page 42.
CC
on page 106.
Sigma-delta ADC” on page 106.
119.
Figure 18-2 on page 107, Figure 18-3 on page 108, Figure 19-1 on page 114, Figure 29-1 on page 223.
26
ATmega406
2548ES–AVR–07/06

9.2 Rev 2548D - 06/05

1. Updated Section 9. ”Errata” on page 17.

9.3 Rev 2548C - 05/05

1. Updated Section 9. ”Errata” on page 17.

9.4 Rev 2548B - 04/05

1. Typos updated, bit “PSRASY” removed, CS12:0 renamed CS1[2:0].
2. Removed “BGEN” bit in BGCCR register. The bandgap voltage reference is always
3. Updated Figure 2-1 on page 3, Figure 6-1 on page 25, Figure 24-9 on page 137, Fig-
4. Updated Table 7-2 on page 33, Table 7-3 on page 34, Table 8-1 on page 38, Table
5. Updated Section 12.3.2 ”Alternate Functions of Port A” on page 66 and Section 21.
6. Updated registers ”External Interrupt Flag Register – EIFR” on page 55 and
7. Updated Section 17.1 ”Features” on page 103 and Section 17.2 ”Operation” on page
8. Updated Section 29. ”Electrical Characteristics” on page 211.
9. Updated Section 35. ”Errata” on page 225.
ATmega406
enabled in ATmega406 revision E.
ure 21-1 on page 120.
26-5 on page 181, Figure 27-1 on page 188.
”Battery Protection” on page 118 description.
”Timer/Counter Control Register B – TCCR0B” on page 89.
103.
Updated Section 19.1 ”Features” on page 111. Updated Section 20.2 ”Register Description for Voltage Reference and Temperature
Sensor” on page 116.
2548ES–AVR–07/06
27
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