FEATURES
Four DACs in a 28 Pin, 0.6 Inch Wide DIP or 28-Pin JEDEC
Plastic Chip Carrier
61/4 LSB Endpoint Linearity
Guaranteed Monotonic
DACs Matched to Within 1%
Microprocessor Compatible
Read/Write Capability (with Memory)
TTL/CMOS Compatible
Four-Quadrant Multiplication
Single-Supply Operation (+5 V)
Low Power Consumption
Latch-Up Resistant
Available In Die Form
APPLICATIONS
Voltage Set Points in Automatic Test Equipment
Systems Requiring Data Access for Self-Diagnostics
Industrial Automation
Multichannel Microprocessor-Controlled Systems
Digitally Controlled Op Amp Offset Adjustment
Process Control
Digital Attenuators
GENERAL DESCRIPTION
The DAC8408 is a monolithic quad 8-bit multiplying digital-toanalog CMOS converter. Each DAC has its own reference input,
feedback resistor, and onboard data latches that feature
read/write capability. The readback function serves as memory
for those systems requiring self-diagnostics.
D/A Converter with Memory
DAC8408
A common 8-bit TTL/CMOS compatible input port is used to
load data into any of the four DAC data-latches. Control lines
DS1, DS2, and A/B determine which DAC will accept data.
Data loading is similar to that of a RAMs write cycle. Data can
be read back onto the same data bus with control line R/
DAC8408 is bus compatible with most 8-bit microprocessors,
including the 6800, 8080, 8085, and Z80. The DAC8408 operates on a single +5 volt supply and dissipates less than 20 mW.
The DAC8408 is manufactured using PMI’s highly stable,
thin-film resistors on an advanced oxide-isolated, silicon-gate,
CMOS process. PMI’s improved latch-up resistant design eliminates the need for external protective Schottky diodes.
ORDERING INFORMATION
TemperaturePackage
ModelINLDNLRangeDescription
DAC8408GP±1/4 LSB ±1/2 LSB 0°C to +70°C28-Pin Plastic DIP
DAC8408ET±1/4 LSB ±1/2 LSB –40°C to +85°C28-Pin Cerdip
DAC8408AT2±1/4 LSB ±1/2 LSB –55°C to +125°C 28-Pin Cerdip
DAC8408FT±1/2 LSB ±1 LSB–40°C to +85°C28-Pin Cerdip
DAC8408BT2±1/2 LSB ±1 LSB–55°C to +125°C 28-Pin Cerdip
DAC8408FPC3±1/2 LSB ±1 LSB–40°C to +85°C28-Contact PLCC
DAC8408FS±1/2 LSB ±1 LSB–40°C to +85°C28-Pin SOL
DAC8408FP±1/2 LSB ± 1 LSB–40°C to +85°C28-Pin Plastic DIP
NOTES
1
Burn-in is available on commercial and industrial temperature range parts
in cerdip, plastic DIP, and TO-can packages. For outline information see Package Information section.
2
For devices processed in total compliance to MIL-STD-883, add /883 after
part number. Consult factory for 883 data sheet.
3
For availability and burn-in information on SO and PLCC packages, contact
your local sales office.
1
W. The
FUNCTIONAL BLOCK DIAGRAM
DAC8408
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700Fax: 617/326-8703
DAC8408
ELECTRICAL CHARACTERISTICS
(@ VDD = +5 V; V
= 610 V; V
REF
A, B, C, D = 0 V; TA = –558C to +1258C apply for
OUT
DAC8408AT/BT, TA = –408C to +858C apply for DAC8408ET/FT/FP/FPC/FS; TA = 08C to +708C apply for DAC8408GP, unless otherwise noted.
Specifications apply for DAC A, B, C, & D.)
DAC8408
ParameterSymbolConditionsMinTypMaxUnits
STATIC ACCURACY
ResolutionN8Bits
Nonlinearity
1, 2
INLDAC8408A/E/G±1/4LSB
DAC8408B/F/H±1/2LSB
DifferentialDNLDAC8408A/E/G±1/2LSB
NonlinearityDAC8408B/F/H±1LSB
Gain ErrorG
Gain Tempco
3, 6
TC
FSE
GFS
(Using Internal RFB)±1LSB
±2±40ppm/°C
Power Supply Rejection
(∆V
= ±10%)PSR0.001%FSR/%
DD
I
OUT 1A, B, C, D
Leakage Current
13
I
LKG
TA =+25°C±30nA
TA = Full Temperature Range±100nA
REFERENCE INPUT
Input Voltage Range±20V
Input Resistance Match
Input ResistanceR
4
IN
R
A, B, C, D
±1%
6 1014kΩ
DIGITAL INPUTS
Digital Input LowV
Digital Input HighV
Input Current
Input Capacitance
5
6
IL
IH
2.4V
TA = +25°C±0.01±1.0µA
I
IN
C
IN
TA = Full Temperature Range±10.0µA
0.8V
8pF
DATA BUS OUTPUTS
Digital Output LowV
Digital Output HighV
Output Leakage CurrentI
OL
OH
LKG
16 mA Sink0.4V
400 µA Source4V
TA = +25°C±0.005 ± 1.0µA
TA = Full Temperature Range±0.075 ± 10.0µA
DAC OUTPUTS
Propagation Delay
Settling Time
Output CapacitanceC
6
11,12
7
t
t
PD
S
OUT
150180ns
190250ns
DAC Latches All “0s”30pF
DAC Latches All “1s”50pF
AC FeedthroughFT(20 V
SWITCHING CHARACTERISTICS
Write to Data Strobe Timet
Data Valid to Strobe Set-Up Timet
Data Valid to Strobe Hold Timet
DAC Select to Strobe Set-Up Timet
DAC Select to Strobe Hold Timet
Write Select to Strobe Set-Up Timet
Write Select to Strobe Hold Timet
Read to Data Strobe Widtht
Data Strobe to Output Valid Timet
Output Data to Deselect Timet
Read Select to Strobe Set-Up Timet
Read Select to Strobe Hold Timet
Specifications subject to change without notice.
6, 10
orTA = +25°C90 ns
DS1
t
DS2
DSU
DH
AS
AH
WSU
WH
RDS
CO
OTD
RSU
RH
TA = Full Temperature Range145ns
TA = +25°C150ns
T
TA = +25°C220ns
T
TA = +25°C320ns
T
TA = +25°C200ns
T
@ F = 100 kHz)54dB
p-p
= Full Temperature Range175ns
A
10ns
0ns
0ns
0ns
0ns
= Full Temperature Range350ns
A
= Full Temperature Range430ns
A
= Full Temperature Range270ns
A
0ns
0ns
–2–
REV. A
DAC8408
ELECTRICAL CHARACTERISTICS
@ VDD = +5 V; V
= 610 V; V
REF
A, B, C, D = 0 V; TA = –558C to +1258C apply for
OUT
DAC8408AT/BT, TA = –408C to +858C apply for DAC8408ET/FT/FP/FPC/FS; TA = 08C to +708C apply for DAC8408GP, unless otherwise noted.
Specifications apply for DAC A, B, C, & D.
Continued
DAC8408
ParameterSymbolConditionsMinTypMaxUnits
POWER SUPPLY
Voltage RangeV
Supply Current
Supply Current
8
9
DD
I
DD
I
DD
TA = +25°C1.0mA
4.55.5V
50µA
TA = Full Temperature Range1.5mA
NOTES
1
This is an end-point linearity specification.
2
Guaranteed to be monotonic over the full operating temperature range.
3
ppm/°C of FSR (FSR = Full Scale Range = V
4
Input Resistance Temperature Coefficient = +300ppm/ °C.
5
Logic Inputs are MOS gates. Typical input current at +25 °C Is less than 10 nA.
6
Guaranteed by design.
-1 LSB.)
REF
7
From Digital Input to 90% of final analog output current.
8
All Digital Inputs “0” or VDD.
9
All Digital Inputs VIH or VIL.
10
See Timing Diagram.
11
Digital Inputs = 0 V to VDD or VDD to 0 V.
12
Extrapolated: tS (1/2 LSB) = tPD + 6.2τ where τ = the measured first time con-
*θJA is specified for worst case mounting conditions, i.e., θJA is specified for
device in socket for cerdip and P-DIP packages; θJA is specified for device
soldered to printed circuit board for SOL and PLCC packages.
CAUTION
1. Do not apply voltages higher than V
–0.3 V potential on any terminal except V
+0.3 V or less than
DD
and RFB.
REF
2. The digital control inputs are diode-protected; however,
permanent damage may occur on unconnected inputs from
high energy electrostatic fields. Keep in conductive foam at
all times until ready to use.
3. Use proper antistatic handling procedures.
4. Absolute Maximum Ratings apply to both packaged devices
and DICE. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device.
REV. A
–3–
DAC8408
Burn-in Circuit
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the DAC8408 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
DICE CHARACTERISTICS
DIE SIZE 0.130 × 0.124 inch, 16,120 sq. mils
(3.30
×
3.15 mm, 10.4 sq. mm)
1. V
2. V
DD
A16. DB7 (MSB)
REF
15. DB6
3. RFBA17. A/B
4. I
OUT 1A
5. I
OUT 2A/IOUT 2B
6. I
OUT 1B
B21. V
7. R
FB
8. V
B22. RFBD
REF
9. DB0 (LSB)23. I
10. DB124. I
11. DB225. I
18. R/W
19. DS1
20. DS2
REF
OUT 1D
OUT 2C/IOUT 2D
OUT 1C
D
12. DB326. RFBC
13. DB427. V
REF
C
14. DB528. DGND
–4–
REV. A
DAC8408
WAFER TEST LIMITS
at VDD = +5 V; V
= 610 V; V
REF
A, B, C, D = 0 V; TA = +258C, unless otherwise noted. Specifications apply for
OUT
DAC A, B, C, & D.
DAC8408G
ParameterSymbolConditionsLimitsUnits
STATIC ACCURACY
ResolutionN8Bits min
Nonlinearity
1
INL±1/2LSB max
Differential NonlinearityDNL±1LSB max
Gain ErrorG
Power Supply RejectionPSRUsing Internal R
(∆V
= ±10%)
DD
I
OUT 1A, B, C, D
2
Leakage CurrentI
V
FSE
LKG
REF
= +10 V
Using Internal R
FB
FB
±1LSB max
0.001%FSR/% max
All Digital Inputs = 0 V±30nA max
REFERENCE INPUT
Reference InputR
Resistance
3
Input Resistance MatchR
IN
IN
6/14kΩ min/max
±1% max
DIGITAL INPUTS
Digital Input LowV
Digital Input HighV
Input Current
4
IL
IH
I
IN
0.8V max
2.4V min
±1.0µA max
DATA BUS OUTPUTS
Digital Output LowV
Digital Output HighV
Output Leakage CurrentI
POWER SUPPLY
Supply Current
Supply Current
NOTES
1
This is an endpoint linearity specification.
2
FSR is Full Scale Range = V
3
Input Resistance Temperature Coefficient approximately equals +300 ppm/ °C.
4
Logic inputs are MOS gates.Typical input current at +25°C is less than 10 nA.
5
All Digital Inputs are either “0” or VDD.
6
All Digital Inputs are either VIH or VIL.
5
6
–1 LSB.
REF
I
I
OL
OH
LKG
DD
DD
1.6 mA Sink0.4V max
400 µA Source4V min
±1.0µA max
50µA max
1.0mA max
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
REV. A
–5–
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