Alliance Semiconductor Corporation AS7C31026A-20TI, AS7C31026A-20TC, AS7C31026A-20JC, AS7C31026A-20BI, AS7C31026A-20BC Datasheet

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January 2001 Advance Information
Copyright © Alliance Semiconductor. All rights reserved.
®
AS7C1026A
AS7C31026A
5V/3.3V 64K X 16 CMOS SRAM
2/6/01; V.0.9 Alliance Semiconductor P. 1 of 9
• AS7C1026A (5V version)
• AS7C31026A (3.3V version)
• Industrial and commercial versions
• Organization: 65,536 words × 16 bits
• Center power and ground pins for low noise
• High speed
- 10/12/15/20 ns address access time
- 3/3/4/5 ns output enable access time
• Low power consumption: ACTIVE
- 660 mW (AS7C1026A) / max @ 10 ns
- 324 mW (AS7C31026A) / max @ 10 ns
• Low power consumption: STANDBY
- 55 mW (AS7C1026A) / max CMOS I/O
- 36 mW (AS7C31026A) / max CMOS I/O
• Latest 6T 0.25u CMOS technology
• 2.0V data retention
• Easy memory expansion with CE
, OE inputs
• TTL-compatible, three-state I/O
• JEDEC standard packaging
- 44-pin 400 mil SOJ
- 44-pin 400 mil TSOP II
- 48-ball 6 mm × 8 mm CSP mBGA
• ESD protection 2000 volts
• Latch-up current 200 mA
Logic block diagram
64K × 16
Array
OE
CE
WE
Column decoder
Row decoder
A0
A1
A2
A3
A4
A5
A7
V
CC
GND
A8
A9
A10
A11
A12
A13
A14
A15
Control circuit
I/O0–I/O7
I/O8–I/O15
UB
LB
I/O
buffer
A6
Pin arrangement
5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
I/O13 I/O12 GND V
CC
I/O11 I/O10 I/O9 I/O8 NC A8 A9 A10 A11 NC
A0
CE I/O0 I/O1 I/O2 I/O3
V
CC
GND I/O4 I/O5 I/O6 I/O7
WE A15 A14 A13
44-Pin SOJ, TSOP II (400 mil)
21 22
A12
NC
UB LB I/O15 I/O14
2
A3
3
A2
4
A1
1
A4
40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
43 42 41
44
A6 A7
OE
A5
AS7C1026A
AS7C31026A
Selection guide
AS7C1026A-10
AS7C31026A-10
AS7C1026A-12
AS7C31026A-12
AS7C1026A-15
AS7C31026A-15
AS7C1026A-20
AS7C31026A-20 Unit
Maximum address access time
10 12 15 20 ns
Maximum output enable access time
3345ns
Maximum operating current
AS7C1026A 120 110 100 100 mA
AS7C31026A 90 80 80 80 mA
Maximum CMOS standby current
AS7C1026A 10 10 10 15 mA
AS7C31026A 10 10 10 15 mA
48-CSP mini Ball-Grid-Array Package
123456
ALB
OE A
0
A1A2NC
BI/O8 UB
A3 A4 CE I/O0
CI/O9
I/O10
A5 A6 I/O1 I/O2
DV
SS
I/O11
NC A7 I/O3 V
DD
EVDDI/O12
NC NC I/O4 V
SS
FI/O14
I/O13
A14 A15 I/O5 I/O6
GI/O15 NC A12 A13 WE
I/O7
HNC A8 A9A10A11NC
®
AS7C1026A
AS7C31026A
2/6/01; V.0.9 Alliance Semiconductor P. 2 of 9
Functional description
The AS7C1026A and AS7C31026A are high-performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) devices organized as 65,536 words × 16 bits. They are designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (t
AA
, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 3/3/4/5 ns are ideal for
high-performance applications.
When CE
is high the devices enter standby mode. The AS7C1026A is guaranteed not to exceed 55 mW power consumption in CMOS
standby mode. The devices also offer 2.0V data retention.
A write cycle is accomplished by asserting write enable (WE
) and chip enable (CE). Data on the input pins I/O0–I/O15 is written on the
rising edge of WE
(write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive I/O pins only after outputs
have been disabled with output enable (OE
) or write enable (WE).
A read cycle is accomplished by asserting output enable (OE) and chip enable (CE), with write enable (WE) high. the chips drive I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or write enable is active, output drivers stay in high-impedance mode.
The devices provide multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to be written and read. LB
controls the lower bits, I/O0–I/O7, and UB controls the higher bits, I/O8–I/O15.
All chip inputs and outputs are TTL-compatible, and operation is from a single 5V supply (AS7C1026A) or 3.3V supply (AS7C31026A). the device is packaged in common industry standard packages. Chip scale BGA packaging, easy to use in manufacturing, provides the smallest possible footprint. This 48-ball JEDEC-registered package has a ball pitch of 0.75 mm and external dimensions of 8 mm × 6 mm.
Absolute maximum ratings
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Truth table
Key:
H = High, L = Low, X = don’t care.
Parameter Symbol Min Max Unit
Vol t ag e o n V
CC
relative to GND
AS7C1026A V
t1
–0.50 +7.0 V
AS7C31026A V
t1
–0.50 +5.0 V
Voltage on any pin relative to GND Both V
t2
–0.50 VCC +0.50 V
Power dissipation Both P
D
–1.0W
Storage temperature (plastic) Both T
stg
–65 +150 °C
Ambient temperature with VCC applied
Both T
bias
–55 +125 °C
DC current into outputs (low) Both I
OUT
–20mA
CE
WE OE LB UB I/O0–I/O7 I/O8–I/O15 Mode
H X X X X High Z High Z Standby (I
SB
), I
SBI
)
LHLLHD
OUT
High Z Read I/O0–I/O7 (ICC)
LHLHLHigh ZD
OUT
Read I/O8–I/O15 (I
CC)
LHLL LD
OUT
D
OUT
Read I/O0–I/O15 (ICC)
LLXLLD
IN
D
IN
Write I/O0–I/O15 (ICC)
LLXLHD
IN
High Z Write I/O0–I/O7 (ICC)
LLXHLHigh ZD
IN
Write I/O8–I/O15 (ICC)
L L
H X
H X
X
H
X H
High Z High Z Output disable (I
CC
)
®
AS7C1026A
AS7C31026A
2/6/01; V.0.9 Alliance Semiconductor P. 3 of 9
Recommended operating conditions
VIL min. = –3.0V for pulse width less than tRC/2.
DC operating characteristics (over the operating range)
1
Capacitance (f = 1MHz, T
a
= 25 °C, V
CC
= NOMINAL)
2
Parameter Device Symbol Min Nominal Max Unit
Supply voltage
AS7C1026A V
CC
4.5 5.0 5.5 V
AS7C31026A V
CC
3.0 3.3 3.6 V
Input voltage
AS7C1026A V
IH
2.2 VCC + 0.5 V
AS7C31026A V
IH
2.0 VCC + 0.5 V
Both V
IL
–0.5 0.8 V
Ambient operating temperature
commercial T
A
0– 70
o
C
industrial T
A
–40 85
o
C
Parameter Sym Test conditions Device
-10 -12 -15 -20
UnitMin Max Min Max Min Max Min Max
Input leakage current
| ILI |
VCC = Max
V
IN
= GND to V
CC
Both 1 1 1 1 µA
Output leakage current
| I
LO
|
V
CC
= Max
CE
= VIH,
V
OUT
= GND to V
CC
Both 1 1 1 1 µA
Operating power supply current
I
CC
V
CC
= Max, CE V
IL
outputs open,
f = f
Max
= 1/t
RC
AS7C1026A 120 110 100 100 mA
AS7C31026A 90 80 80 80 mA
Standby power supply current
I
SB
VCC = Max, CE
V
IL
,
outputs open,
f = f
Max
= 1/t
RC
AS7C1026A 30 25 20 20
mA
AS7C31026A 30 25 20 20
I
SB1
V
CC
= Max, CE V
CC
–0.2V,
V
IN
GND + 0.2V or
V
IN
V
CC
–0.2V, f = 0
AS7C1026A 10 10 10 15
mA
AS7C31026A 10 10 10 15
Output voltage
V
OL
IOL = 8 mA, VCC = Min AS7C1026A 0.4 0.4 0.4 0.4 V
V
OH
IOH = –4 mA, VCC = Min AS7C31026A 2.4 2.4 2.4 2.4 V
Data retention current
I
CCDR
VCC = 2.0V
CE
V
CC
–0.2V
V
IN
V
CC
–0.2V or
V
IN
0.2V
AS7C1026A
11 1 5mA
AS7C31026A
11 1 5mA
Parameter Symbol Signals Test conditions Max Unit
Input capacitance C
IN
A, CE, WE, OE, LB, UB VIN = 0V 5 pF
I/O capacitance C
I/O
I/O VIN = V
OUT
= 0V 7 pF
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