Alliance Semiconductor Corporation AS7C31026-20TI, AS7C31026-20TC, AS7C31026-20JC, AS7C31026-20BC, AS7C31026-15TI Datasheet

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Alliance Semiconductor Corporation AS7C31026-20TI, AS7C31026-20TC, AS7C31026-20JC, AS7C31026-20BC, AS7C31026-15TI Datasheet

March 2001

AS7C1026

 

AS7C31026

®

5V/3.3V 64K×16 CMOS SRAM

Features

AS7C1026 (5V version)

AS7C31026 (3.3V version)

Industrial and commercial versions

Organization: 65,536 words x 16 bits

Center power and ground pins for low noise

High speed

-12/15/20 ns address access time

-6,7,8 ns output enable access time

Low power consumption: ACTIVE

-880 mW (AS7C1026) / max @ 12 ns

-396 mW (AS7C31026) / max @ 12 ns

Low power consumption: STANDBY

-28 mW (AS7C1026) / max CMOS I/O

-18 mW (AS7C31026) / max CMOS I/O

2.0V data retention

Easy memory expansion with CE, OE inputs

TTL-compatible, three-state I/O

JEDEC standard packaging

-44-pin 400 mil SOJ

-44-pin 400 mil TSOP II

-48-ball 6 mm × 8 mm CSP mBGA

ESD protection 2000 volts

Latch-up current 200 mA

Logic block diagram

A0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VCC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A1

 

 

decoder

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A2

 

 

 

 

 

 

 

 

Array

 

 

 

 

 

 

 

 

 

 

 

 

 

64K × 16

 

 

 

GND

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A3

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A4

 

 

Row

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A5

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A6

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A7

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

I/O0–I/O7

 

 

I/O

 

 

 

 

Control circuit

 

 

 

 

I/O8–I/O15

 

 

buffer

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

WE

Column decoder

 

A8

A9

A10

A11

A12

A13

A14

A15

UB

 

 

 

 

 

 

 

OE

 

 

 

 

 

 

 

LB

 

 

 

 

 

 

 

CE

 

 

 

 

 

 

 

Pin arrangement

 

44-Pin SOJ, TSOP II (400 mil)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A4

 

1

 

 

44

 

 

A5

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A3

 

2

 

 

43

 

 

A6

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A2

 

3

 

 

42

 

 

A7

48-CSP mini Ball-Grid-Array Package

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A1

 

4

 

 

41

 

 

OE

 

1

 

2

 

3

4

5

 

 

6

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A0

 

 

5

 

 

40

 

 

UB

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CE

 

 

 

6

 

 

39

 

 

LB

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

I/O0

 

 

7

 

 

38

 

 

I/O15

A

 

LB

 

OE

A0

A1

 

 

A2

NC

 

 

 

 

 

 

I/O1

 

 

8

 

 

37

 

 

I/O14

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

B

I/O8

 

UB

A3

A4

 

CE

I/O0

I/O2

 

 

9

 

 

36

 

 

I/O13

 

 

 

 

 

 

 

 

I/O3

 

 

10

AS7C1026

AS7C31026

35

 

 

I/O12

C

I/O9

I/O10

A5

A6

I/O1

I/O2

VCC

 

 

11

34

 

 

GND

 

 

 

 

 

 

GND

 

 

12

 

 

33

 

 

VCC

D

VSS

I/O11

NC

A7

I/O3

VDD

 

 

 

 

 

 

I/O4

 

 

13

 

 

32

 

 

I/O11

 

 

 

 

 

 

I/O5

 

 

14

 

 

31

 

 

I/O10

E

VDD

I/O12

NC

NC

I/O4

VSS

 

 

 

 

 

 

I/O6

 

 

15

 

 

30

 

 

I/O9

 

 

 

 

 

 

I/O7

 

 

16

 

 

29

 

 

I/O8

F

I/O14

I/O13

A14

A15

I/O5

I/O6

 

 

 

 

 

WE

 

 

 

17

 

 

28

 

 

NC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A15

 

 

18

 

 

27

 

 

A8

G

I/O15

NC

A12

A13

 

 

 

 

 

I/O7

 

 

 

 

 

 

 

WE

 

A14

 

 

19

 

 

26

 

 

A9

A13

 

 

20

 

 

25

 

 

A10

H

NC

 

A8

A9

A10

A11

NC

 

 

 

 

 

 

A12

 

21

 

 

24

 

 

A11

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

NC

 

22

 

 

23

 

 

NC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Selection guide

 

 

AS7C1026-12

AS7C1026-15

AS7C1026-20

 

 

 

AS7C31026-12

AS7C31026-15

AS7C31026-20

Unit

 

 

 

 

 

Maximum address access time

 

12

15

20

ns

 

 

 

 

 

 

Maximum output enable access time

 

6

8

10

ns

 

 

 

 

 

 

Maximum operating current

AS7C1026

160

150

140

mA

 

 

 

 

 

AS7C31026

110

100

90

mA

 

 

 

 

 

 

 

Maximum CMOS standby current

AS7C1026

10

10

15

mA

 

 

 

 

 

AS7C31026

10

10

15

mA

 

 

 

 

 

 

 

Shaded areas indicate preliminary information.

3/23/01; v.1.0 Alliance Semiconductor P. 1 of 10

Copyright © Alliance Semiconductor. All rights reserved.

AS7C1026

AS7C31026

®

Functional description

The AS7C1026 and AS7C31026 are high-performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) devices organized as 65,536 words x 16 bits. They are designed for memory applications where fast data access, low power, and simple interfacing are desired.

Equal address access and cycle times (tAA, tRC, tWC) of 12/15/20 ns with output enable access times (tOE) of 6,7,8 ns are ideal for high-performance applications.

When CE is high the devices enter stanby mode. The AS7C1026 is guaranteed not to exceed 28 mW power consumption in CMOS standby mode. The devices also offer 2.0V data retention.

A write cycle is accomplished by asserting write enable (WE) and chip enable (CE). Data on the input pins I/O0–I/O15 is written on the rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive I/ O pins only after outputs have been disabled with output enable (OE) or write enable (WE).

A read cycle is accomplished by asserting output enable (OE) and chip enable (CE), with write enable (WE) high. the chips drive I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or write enable is active, output drivers stay in high-impedance mode.

The devices provide multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to be written and read. LB controls the lower bits, I/O0–I/O7, and UB controls the higher bits, I/O8–I/O15.

All chip inputs and outputs are TTL-compatible, and operation is from a single 5V supply (AS7C1026) or 3.3V supply (AS7C31026). the device is packaged in common industry standard packages. Chip scale BGA packaging, easy to use in manufacturing, provides the smallest possible footprint. This 48-ball JEDEC-registered package has a ball pitch of 0.75 mm and external dimensions of 8 mm × 6 mm.

Absolute maximum ratings

Parameter

Symbol

Min

Max

Unit

 

 

 

 

 

 

Voltage on VCC relative to GND

AS7C1026

Vt1

–0.50

+7.0

V

AS7C31026

Vt1

–0.50

+5.0

V

 

Voltage on any pin relative to GND

 

Vt2

–0.50

VCC +0.50

V

Power dissipation

 

PD

1.0

W

Storage temperature (plastic)

 

Tstg

–65

+150

° C

Ambient temperature with VCC applied

 

Tbias

–55

+125

° C

DC current into outputs (low)

 

IOUT

20

mA

Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.

Truth table

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CE

 

 

WE

 

 

OE

 

 

LB

 

 

UB

I/O0–I/O7

I/O8–I/O15

Mode

 

H

 

 

X

 

 

X

 

 

X

 

 

X

High Z

High Z

Standby (ISB), ISBI)

 

L

 

 

H

 

 

L

 

 

L

 

 

H

DOUT

High Z

Read I/O0–I/O7 (ICC)

 

L

 

 

H

 

 

L

 

 

H

 

 

L

High Z

DOUT

Read I/O8–I/O15 (ICC)

 

L

 

 

H

 

 

L

 

 

L

 

 

L

DOUT

DOUT

Read I/O0–I/O15 (ICC)

 

L

 

 

L

 

 

X

 

 

L

 

 

L

DIN

DIN

Write I/O0–I/O15 (ICC)

 

L

 

 

L

 

 

X

 

 

L

 

 

H

DIN

High Z

Write I/O0–I/O7 (ICC)

3/23/01; v.1.0

Alliance Semiconductor

P. 2 of 10

 

 

 

AS7C1026

AS7C31026

®

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CE

 

 

WE

 

 

OE

 

 

LB

 

 

UB

I/O0–I/O7

I/O8–I/O15

Mode

 

L

 

 

L

 

 

X

 

 

H

 

 

L

High Z

DIN

Write I/O8–I/O15 (ICC)

 

L

 

 

H

 

 

H

 

 

X

 

 

X

High Z

High Z

Output disable (ICC)

 

L

 

 

X

 

 

X

 

 

H

 

 

H

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Key: H = High, L = Low, X = don’t care.

Recommended operating conditions

Parameter

 

Device

Symbol

Min

Typ

Max

Unit

 

 

AS7C1026

VCC

4.5

5.0

5.5

V

Supply voltage

 

AS7C31026 (–10)

VCC

3.15

3.3

3.6

V

 

 

AS7C31026 (12/15/20)

VCC

3.0

3.3

3.6

V

 

 

AS7C1026

VIH

2.2

VCC + 0.5

V

Input voltage

 

AS7C31026

VIH

2.0

VCC + 0.5

V

 

 

 

VIL

–0.5

0.8

V

Ambient operating temperature

commercial

 

TA

0

70

°C

industrial

 

TA

–40

85

°C

 

 

VIL min = –3.0V for pulse width less than tRC/2.

DC operating characteristics (over the operating range)1

 

 

 

 

 

 

 

 

 

 

 

 

 

 

-12

 

-15

-20

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

Sym

Test conditions

Device

Min

 

Max

Min

 

Max

Min

Max

Unit

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Input leakage

| ILI |

 

VCC = Max

 

 

1

 

1

1

µA

current

VIN = GND to VCC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Output leakage

| ILO |

 

VCC

 

= Max

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CE = VIH,

 

 

1

 

1

1

µA

current

 

 

 

 

 

 

 

VOUT = GND to VCC

 

 

 

 

 

 

 

 

 

 

 

 

VCC = Max,

 

 

VIL

AS7C1026

 

160

 

150

140

mA

Operating power

ICC

CE

supply current

outputs open,

AS7C31026

 

110

 

100

90

mA

 

f = fMax = 1/tRC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VCC = Max,

 

 

VIL,

AS7C1026

 

50

 

50

50

 

 

 

CE

 

Standby

ISB

outputs open,

 

 

 

 

 

 

 

 

 

mA

AS7C31026

 

35

 

35

35

 

f = fMax = 1/tRC

 

 

 

power supply

 

 

 

 

 

 

 

 

 

 

 

 

VCC = Max,

 

VCC–0.2V,

AS7C1026

 

10

 

10

15

 

current

 

CE

 

 

 

 

ISB1

VIN

 

GND + 0.2V or

 

 

 

 

 

 

 

 

 

mA

 

 

AS7C31026

 

10

 

10

15

 

 

VIN

 

VCC–0.2V, f = 0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Output

VOL

IOL = 8 mA, VCC = Min

 

 

0.4

 

0.4

0.4

V

voltage

VOH

IOH = –4 mA, VCC = Min

 

2.4

 

2.4

 

2.4

V

Shaded areas indicate preliminary information.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Capacitance (f = 1MHz, T

= 25 ° C, V = NOMINAL)2

 

 

 

a

CC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

Symbol

 

 

 

Signals

Test conditions

Max

Unit

Input capacitance

 

CIN

A,

 

 

 

 

 

 

 

 

 

 

VIN = 0V

5

pF

CE,

WE,

OE,

LB,

UB

I/O capacitance

 

CI/O

 

 

 

I/O

VIN = VOUT = 0V

7

pF

3/23/01; v.1.0

Alliance Semiconductor

P. 3 of 10

 

 

 

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