Uniden BCD396T undocumented testing modes

File Revision: 2007.04.02

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UNDOCUMENTED UNIDENP

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BCD396T APCO25 DIGITAL SCANNER FACTORY TEST MODES,
SOME OF THESE TESTS WILL REQUIRE VARIOUS BENCH TEST MEASURING EQUIPMENT, SUCH
AS SIGNAL STRENGTH METERS, SIGNAL GENERATORS, DIGITAL AND ANALOG MULTIMETERS,
DATA RECORDERS, SERVICING DIAGRAMS, EXPECTED TEST VALUE AND THRESHOLDS, ETC…

CAUTION: USE AT YOUR OWN RISKS!

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Note: Yellow highlighted key combinations also apply to the UnidenP

[Press] + “On” Test Remarks / Display

0 + 1 + Hold
0 + .No + Hold
2 + .No + Hold

0 + 1 + Func
0 + 1 + 2
0 + 2 + .No
1 + 2 + .No

0 + 3 + Hold
0 + E + Hold
2 + E + Hold

0 + 3 + Scan
0 + 6 + Hold
5 + E + Hold

0 + 1 + 9
0 + 3 + 7
2 + 9 + .No
3 + 8 + .No

1 + 2 + 9
1 + 3 + 8
1 + 8 + 9
2 + 3 + 7
2 + 7 + 9

1 + 5 + 9
1 + 6 + 8
2 + 4 + 9
2 + 6 + 7
3 + 4 + 8

RS232C Test

On-Air Test

Frequency Bands
Test

Key Touch Test

LCD Pixels Test

Systems Tests

Frequency Step
Tests

RS232C Serial Interface Test. Initial Test Screen displays: ----- ERROR
Requires a loopback serial cable or null modem to run properly on BCD-39 6T.
(Use the supplied serial cable connected from back to the bottom for Remote
Head).

ON-AIR CLONING FREQUENCIES TEST

151.8200 ----- Press [Hold] to change On-Air Frequency under test:

467.8500 -----

857.2000 -----

40.8400 -----

800MHz+ Band, Close-Call ON, [Scroll] to select band under test:
VHF Lo1 Band
VHF Lo2 Band
Air Band
VHF Hi1 Band
VHF Hi2 Band
UHF Band

KEYPAD VERIFICATION TEST
Verify the keys touched. (Note: F1, F2 and F3 keys on Remote Head do not
work “in remote mode” when using BCD396T Firmware Ver. 1.11.03 or below).

LCD PIXELS TEST (aka LCD Segment Test)
Initially, all LCD pixels in the LCD matrix are turned ON . This verifies the
proper operation of the LCD matrix. Press Illumination [ON] and check for
dead pixels. Any other keys pressed reverts back to the Key Touch Test, see
above.

Press the [Menu] button to access 1 to 4 systems options:
1: [Hold]: MOT TEST [VOICE], [Scan]: MOT TEST [CTRL]
2: [Hold]: EDACS WIDE [VC], [Scan]: EDACS WIDE [CT]
3: [Hold]: EDACS NARROW [VC], [Scan]: EDACS NARROW [CT]
4: LTR TEST
note: tests 1, 2 & 4 @ 851.0125MHz, test 3 @ 894.0125MHz.

SRC TST 5K, press [Hold] to Scan/Hold, [#] to select Step/Band:

1. SRC TST 5KHz 144.0000MHz to 144.1000MHz NFM

2. SRC TST 6.25KHz 145.0000MHz to 145.1000MHz NFM

3. SRC TST 7.5KHz 173.0000MHz to 173.1000MHz NFM

4. SRC TST 8.33KHz 127.0000MHz to 127.1000MHz NFM

5. SRC TST 10KHz 35.0000MHz to 35.1000MHz NFM

6. SRC TST 12.5KHz 511.9000MHz to 512.0000MHz NFM

7. SRC TST WFM 196.7500MHz to 198.7500MHz WFM

8. SRC TST AM 136.0000MHz to 136.1000MHz AM

9. SEARCH RATE TEST 144.0000MHz to 145.0000MHz FM

0. DATA SKIP TEST 144.0000MHz to 145.0000MHz FM

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BC-RH96 Remote Head.

1 + 3 + L/O

Dump Test

1 + 9 + L/O
1 + 9 + Hold
3 + 7 + L/O
3 + 7 + Hold
7 + 9 + Hold
2 + 6 + L/O
2 + 9 + Scan
3 + 8 + Scan
5 + 9 + Hold
6 + 8 + Hold
3 + 5 + L/O

2 + 5 + 9
2 + 6 + 8

Loads Test
Frequencies in
memory

Firmware Version
EEPROM Checksum

2 + 6 + 9
3 + 5 + 8
3 + 5 + 9
3 + 6 + 8

0 + 1 + 3
0 + 3 + .No

NWR-SAME Test
WX Alert Test

2 + 3 + .No

1 + 4 + 8

Batt. Save Test

1 + 5 + 8
2 + 4 + 7
2 + 4 + 8
2 + 5 + 7
2 + 3 + L/O
2 + 9 + L/O
2 + 9 + Hold ***
3 + 8 + L/O

All Memory Clear

3 + 8 + Hold
8 + 9 + Hold

1 + 6 + L/O

Scan Rate Test

1 + 9 + Scan
3 + 4 + L/O
4 + 9 + Hold
6 + 7 + Hold

6 + 9 + Scan

Backlight Test

6 + 9 + L/O
Hold + Scan + L/O

Tone-Out Test

DISCLAIMER: THIS INFORMATION IS NOT OFFICIALLY ENDORSED BY UNIDENP
‘AS IS’ FOR EDUCATIONAL PURPOSES ONLY. THE AUTHOR CAN NOT AND WILL NOT BE HELD RESPONSIBLE FOR
ANY DAMAGES IF YOU CHOOSE TO PERFORM THESE KEY COMBINATIONS. IF YOU CHOOSE TO DISREGARD THE
RED TEXT WARNINGS, YOU ARE DOING SO AT YOUR OWN RISKS. HAVE FUN BUT PLEASE REMEMBER TO SHARE
YOUR KNOWLEDGE WITH OTHERS SO THAT IT MAY FURTHER ENHA NC E THE SCANNING HOBBY!

EEPROM DUMP TEST. This is the EEPROM Memory Dump Test Routine.
Initial EEPROM Memory Locations set to 00000:FF Hex.
EEPROM Memory Locations to be dumped to a data recorder are selected by
pressing [.No] and [Scroll] keys for Most Significant Bit (MSB) and Least
Significant Bit (LSB) of the Hex memory location you wish to dump to recorder.

WARNING: THIS WILL ERASE YOUR PROGRAMS.

Previously programmed memories erased. Displays LOADING TEST DATA,
then loads 4 new conventional systems in GQK 1, 2, 3 and 4 of SQK 1.

LOAD TEST DATA then displays “Version X.XX.XX EXXXH
Displays the current Firmware Version & EEPROM Checksum in Hexadecimal.
This value will vary depending upon which Firmware Version is installed in
your unit.

WARNING: AUDIO ALERT LEVEL TEST TONES ARE SET AT MAXIMUM
ALERTING VOLUME, PLEASE ENSURE THE HEADPHONE JACK IS NOT
CONNECTED TO YOUR COMPUTER SPEAKERS OR HEADPHONES.

Press [Hold] to select 1 of 2 Alert Tests: NWR-SAME or WX ALERT
Press [Menu] to test S.A.M.E alerts @ 162.4000MHz
Press [Menu] to test WX ALERT @ 1050Hz
Press [Menu] to end tests.

Press [Hold] to change between low power and high power Battery Save Test.
OFF (RF_PWR = H)
ON (RF_PWR = L)

WARNING: THIS WILL ERASE YOUR PROGRAMS.

Initializes the scanner memory. You will then have the option to select the
factory setting “Pre-Load” of all systems. At the prompt, press [Yes] or [No] to
load all factory pre-loaded systems.
*** Documented in the User’s Manual.

WARNING: THIS WILL ERASE YOUR PROGRAMS.

Loads and scans a large conventional test system in memory. Programs every
frequency between 144.0000MHz and 163.9800MHz in steps of 20KHz.
Total memory usage: 13%

Remove power or one battery to terminate the Backlight Test.

WARNING: THIS WILL OVERWRITE YOUR PROGRAMMED FTOs.

Loads 10 Fire Tone-Out Test Frequencies, ranging from 137.0000M Hz to

146.0000MHz, at FTO memory locations 1 to 10.
All Tones A = 1000Hz, All Tones B = 2000Hz.
Press [Hold] to switch between Test and Hold.
Press [Scan] to resume normal scanning, minus your programmed FTOs.

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AMERICA CORP. AND IS PROVIDED

USE AT YOUR OWN RISKS!

© 2007 Anabella M.