Texas Instruments TLC542IDWR, TLC542CDWR, TLC542IFNR Datasheet

U
TLC542C, TLC542I
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH SERIAL CONTROL AND 11 INPUTS
SLAS075A – FEBRUARY 1989 – REVISED MARCH 1995
D
D
Microprocessor Peripheral or Stand-Alone Operation
D
On-Chip 12-Channel Analog Multiplexer
D
Built-in Self-Test Mode
D
Software-Controllable Sample and Hold
D
Total Unadjusted Error... ±0.5 LSB Max
D
Direct Replacement for Motorola MC145041
D
On-Board System Clock
D
End-of-Conversion (EOC) Output
D
Pinout and Control Signals Compatible
INPUT A0 INPUT A1 INPUT A2 INPUT A3 INPUT A4 INPUT A5 INPUT A6 INPUT A7 INPUT A8
With the TLC1542/3 10-Bit A/D Converters
D
CMOS Technology
PARAMETER VALUE
Channel Acquisition/Sample Time 16 µs Conversion TIme (Max) 20 µs Samples per Second (Max) 25 × 10 Power Dissipation (Max) 10 mW
description
The TLC542 is a CMOS converter built around an 8-bit switched-capacitor successive-approximation
3
INPUT A3 INPUT A4 INPUT A5 INPUT A6 INPUT A7
analog-to-digital converter. The device is designed for serial interface to a microprocessor or peripheral via a 3-state output with three inputs [including I/O CLOCK, CS
(chip select), and ADDRESS INPUT]. The TLC542 allows high-speed data transfers and sample rates of up to 40,000 samples per second. In addition to the high-speed converter and versatile control logic, an on-chip 12-channel analog multiplexer can sample any one of 1 1 inputs or an internal “self-test” voltage, and the sample and hold is started under microprocessor control. At the end of conversion, the end-of-conversion (EOC) output pin goes high to indicate that conversion is complete. Detailed information on interfacing to most popular microprocessors is readily available from the factory.
AVAILABLE OPTIONS
PACKAGE
T
A
0°C to 70°C TLC542CN TLC542CDW
–40°C to 85°C TLC542IFN TLC542IN TLC542IDW
CHIP CARRIER
(FN)
PLASTIC DIP
(N)
DW OR N PACKAGE
(TOP VIEW)
1 2 3 4 5 6 7 8 9
GND
SMALL OUTLINE
10
FN PACKAGE
(TOP VIEW)
INPUT A2
INPUT A1
3212019
4 5 6 7 8
910111213
GND
INPUT A8
(DW)
V
20
CC
EOC
19
I/O CLOCK
18
ADDRESS INPUT
17
DATA OUT
16
CS
15
REF+
14
REF–
13
INPUT A10
12
INPUT A9
11
CC
INPUT A0
V
EOC
18 17 16 15 14
REF–
INPUT A9
INPUT A10
I/O CLOCK ADDRESS INP DATA OUT CS REF+
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 1995, Texas Instruments Incorporated
1
TLC542C, TLC542I 8-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 INPUTS
SLAS075A – FEBRUARY 1989 – REVISED MARCH 1995
description (continued)
The converter incorporated in the TLC542 features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noises. A switched­capacitor design allows low-error (±0.5 LSB) conversion in 20 µs over the full operating temperature range.
The TLC542C is characterized for operation from 0°C to 70°C and the TLC542I is characterized for operation from –40°C to 85°C.
functional block diagram
REF+ REF–
Analog
Inputs
ADDRESS
INPUT
I/O CLOCK
CS
EOC
12-Channel
Analog
Multiplexer
Self-Test
Reference
typical equivalent inputs
Sample and
4
Input Address
Register
Multiplexer
Hold
4
Input
8-Bit
Analog-to-Digital
Converter
(Switched-Capacitors)
8
Output
Data
Register
Control Logic
and I/O
2
Counters
8
8-to-1 Data
Selector and
Driver
4
DATA OUT
INPUT CIRCUIT IMPEDANCE DURING SAMPLING MODE INPUT CIRCUIT IMPEDANCE DURING HOLD MODE
INPUT
A0–A10
2
1 kTYP
Ci = 60 pF TYP (equivalent input capacitance)
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
INPUT
A0–A10
5 MTYP
operating sequence
1 2345678 1 2345678
I/O
CLOCK
t
t
su(CS)
CS
su(A)
(see Note A)
Access Cycle B
t
acq
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH SERIAL CONTROL AND 11 INPUTS
Don’t Care
t
conv
12 Internal System Clocks 12 µs
TLC542C, TLC542I
SLAS075A – FEBRUARY 1989 – REVISED MARCH 1995
Access Cycle C
t
acq
MSB LSB
ADDRESS
INPUT
DATA
OUT
EOC
NOTES: A. To minimize errors caused by noise at the chip select input, the internal circuitry waits for two rising edges and one falling edge
B. The output is 3-stated on CS
B3 B2 B1 B0 C3 C2 C1 C0
Previous Conversion Data A Conversion Data B
MSB
(see Note B)
of the internal system clock after CS specifications. Therefore, no attempt should be made to clock-in an address until the minimum chip select setup time has elapsed.
Don’t Care Don’t Care
Hi-Z State
See Note B
LSB
t
t
d(I/O–EOC)
t
cycle
before responding to control input signals. The CS setup time is given by the t
going high or on the negative edge of the eighth I/O clock.
d(EOC–DATA)
MSB LSB
B7 B6 B5 B4 B3 B2 B1 B0A7 A6 A5 A4 A3 A2 A1 A0
MSB LSB
Hi-Z
State
su(CS)
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V Input voltage range (any input) –0.3 V to V Output voltage range –0.3 V to V
Peak input current range (any input) ±20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Peak total input current (all inputs) ±30 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range: TLC542C 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Case temperature for 10 seconds: FN package 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds: DW or N package 260°C. . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to digital ground with REF– and GND wired together (unless otherwise noted).
(see Note 1) 6.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
TLC542l –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
CC
+ 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
+ 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
3
TLC542C, TLC542I
I/O CLOCK transition time, t
(see Note 3)
ns
Operating free-air temperature, T
°C
(g )
A
Selected channel leakage current
CC
,
A
CiInput capacitance
pF
8-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 INPUTS
SLAS075A – FEBRUARY 1989 – REVISED MARCH 1995
recommended operating conditions, V
Supply voltage, V Positive reference voltage, V Negative reference voltage, V Differential reference voltage, V Analog input voltage (see Note 3) 0 V High-level control input voltage, V Low-level control input voltage, V Setup time, address bits at data input before I/O CLOCK, t Hold time, address bits after I/O CLOCK, t Hold time, CS low after 8th I/O CLOCK, t Setup time, CS low before clocking in first address bit, t Input/output clock frequency, f Input/output clock high, t Input/output clock low, t
p
NOTES: 2. Analog input voltages greater than that applied to REF+ convert as all ones (11111111), while input voltages less than that applied
CC
(see Note 2) V
ref+
(see Note 2) –0.1 0 V
ref–
– V
ref+
IH
IL
clock(I/O)
wH(I/O)
wL(I/O)
t
p
to REF – convert as all zeros (00000000). For proper operation, REF+ must be at least 1 V higher than REF–. Also, the total unadjusted error may increase as this differential reference voltage falls below 4.75 V.
3. This is the time required for the clock input signal to fall from VIH min to VIL max or to rise from VIL max to VIH min. In the vicinity of normal room temperature, the devices function with input clock transition time as slow as 2 µs for remote data acquisition applications where the sensor and the A/D converter are placed several feet away from the controlling microprocessor.
4. To minimize errors caused by noise at the chip select input, the internal circuitry waits for two rising edges and one falling edge of the internal system clock after CS specifications. Therefore, no attempt should be made to clock-in address data until the minimum chip select setup time has elapsed.
A
(see Note 2) 1 V
ref–
h(A)
h(CS)
f
clock(I/O)
f
clock(I/O)
TLC542C 0 70 TLC542I –40 85
before responding to control input signals. The CS setup time is given by the t
= 4.75 to 5.5 V
CC
MIN NOM MAX UNIT
4.75 5 5.5 V ref–VCC
2 V
su(A)
(see Note 4) 3.8 µs
su(CS)
525 kHz 100 > 525 kHz 40
400 ns
0 ns 0 ns
0 1.1 MHz 404 ns 404 ns
VCC + 0.1 V
CCVCC
ref+
+ 0.2 V CC
V
V
0.8 V
°
su(CS)
electrical characteristics over recommended operating temperature range, VCC = V
= 1.1 MHz (unless otherwise noted)
5.5 V, f
V V
I I I
I
clock(I/O)
High-level output voltage (DATA OUT) VCC = 4.75 V, IOH = –360 µA 2.4 V
OH
Low-level output voltage VCC = 4.75 V, IOL = 1.6 mA 0.4 V
OL
Off-state (high-impedance state) output current
High-level input current VI = V
IH
Low-level input current VI = 0 –0.005 –2.5 µA
IL
Operating supply current CS at 0 V 1.2 2 mA
CC
Maximum static analog reference current into
ref
REF+
p
All typical values are at TA = 25°C.
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
VO = VCC, CS at V VO = 0,
CC
Selected at V Unselected channel at 0 V
V
= VCC, V
ref+
p
Analog inputs 7 55 Control inputs 5 15
,
CC
CS at V
CC
0.005 2 µA
0°C to 70 °C 0.4 –40°C to 85°C –0.4
= GND 10 µA
ref–
= 4.75 V to
ref+
–10
10
µ
µ
p
4
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