Channel Acquisition/Sample Time16 µs
Conversion TIme (Max)20 µs
Samples per Second (Max)25 × 10
Power Dissipation (Max)10 mW
description
The TLC542 is a CMOS converter built around an
8-bit switched-capacitor successive-approximation
3
INPUT A3
INPUT A4
INPUT A5
INPUT A6
INPUT A7
analog-to-digital converter. The device is designed
for serial interface to a microprocessor or peripheral
via a 3-state output with three inputs [including I/O
CLOCK, CS
(chip select), and ADDRESS INPUT].
The TLC542 allows high-speed data transfers and
sample rates of up to 40,000 samples per second.
In addition to the high-speed converter and
versatile control logic, an on-chip 12-channel
analog multiplexer can sample any one of 1 1 inputs or an internal “self-test” voltage, and the sample and hold
is started under microprocessor control. At the end of conversion, the end-of-conversion (EOC) output pin goes
high to indicate that conversion is complete. Detailed information on interfacing to most popular
microprocessors is readily available from the factory.
AVAILABLE OPTIONS
PACKAGE
T
A
0°C to 70°C—TLC542CNTLC542CDW
–40°C to 85°CTLC542IFNTLC542INTLC542IDW
CHIP CARRIER
(FN)
PLASTIC DIP
(N)
DW OR N PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
9
GND
SMALL OUTLINE
10
FN PACKAGE
(TOP VIEW)
INPUT A2
INPUT A1
3212019
4
5
6
7
8
910111213
GND
INPUT A8
(DW)
V
20
CC
EOC
19
I/O CLOCK
18
ADDRESS INPUT
17
DATA OUT
16
CS
15
REF+
14
REF–
13
INPUT A10
12
INPUT A9
11
CC
INPUT A0
V
EOC
18
17
16
15
14
REF–
INPUT A9
INPUT A10
I/O CLOCK
ADDRESS INP
DATA OUT
CS
REF+
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1995, Texas Instruments Incorporated
1
TLC542C, TLC542I
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH SERIAL CONTROL AND 11 INPUTS
SLAS075A – FEBRUARY 1989 – REVISED MARCH 1995
description (continued)
The converter incorporated in the TLC542 features differential high-impedance reference inputs that facilitate
ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noises. A switchedcapacitor design allows low-error (±0.5 LSB) conversion in 20 µs over the full operating temperature range.
The TLC542C is characterized for operation from 0°C to 70°C and the TLC542I is characterized for operation
from –40°C to 85°C.
functional block diagram
REF+REF–
Analog
Inputs
ADDRESS
INPUT
I/O CLOCK
CS
EOC
12-Channel
Analog
Multiplexer
Self-Test
Reference
typical equivalent inputs
Sample and
4
Input Address
Register
Multiplexer
Hold
4
Input
8-Bit
Analog-to-Digital
Converter
(Switched-Capacitors)
8
Output
Data
Register
Control Logic
and I/O
2
Counters
8
8-to-1 Data
Selector and
Driver
4
DATA
OUT
INPUT CIRCUIT IMPEDANCE DURING SAMPLING MODEINPUT CIRCUIT IMPEDANCE DURING HOLD MODE
INPUT
A0–A10
2
1 kΩ TYP
Ci = 60 pF TYP
(equivalent input
capacitance)
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
INPUT
A0–A10
5 MΩ TYP
operating sequence
1 23456781 2345678
I/O
CLOCK
t
t
su(CS)
CS
su(A)
(see Note A)
Access
Cycle B
t
acq
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH SERIAL CONTROL AND 11 INPUTS
Don’t Care
t
conv
12 Internal System Clocks ≤ 12 µs
TLC542C, TLC542I
SLAS075A – FEBRUARY 1989 – REVISED MARCH 1995
Access
Cycle C
t
acq
MSBLSB
ADDRESS
INPUT
DATA
OUT
EOC
NOTES: A. To minimize errors caused by noise at the chip select input, the internal circuitry waits for two rising edges and one falling edge
B. The output is 3-stated on CS
B3 B2 B1 B0C3 C2 C1 C0
Previous Conversion Data AConversion Data B
MSB
(see Note B)
of the internal system clock after CS
specifications. Therefore, no attempt should be made to clock-in an address until the minimum chip select setup time has elapsed.
Don’t CareDon’t Care
Hi-Z State
See Note B
LSB
t
t
d(I/O–EOC)
t
cycle
↓ before responding to control input signals. The CS setup time is given by the t
going high or on the negative edge of the eighth I/O clock.
d(EOC–DATA)
MSBLSB
B7B6 B5 B4 B3 B2 B1 B0A7A6 A5 A4 A3 A2 A1 A0
MSBLSB
Hi-Z
State
su(CS)
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
Input voltage range (any input) –0.3 V to V
Output voltage range –0.3 V to V
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds: DW or N package 260°C. . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to digital ground with REF– and GND wired together (unless otherwise noted).
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH SERIAL CONTROL AND 11 INPUTS
SLAS075A – FEBRUARY 1989 – REVISED MARCH 1995
recommended operating conditions, V
Supply voltage, V
Positive reference voltage, V
Negative reference voltage, V
Differential reference voltage, V
Analog input voltage (see Note 3)0V
High-level control input voltage, V
Low-level control input voltage, V
Setup time, address bits at data input before I/O CLOCK↑, t
Hold time, address bits after I/O CLOCK↑, t
Hold time, CS low after 8th I/O CLOCK↑, t
Setup time, CS low before clocking in first address bit, t
Input/output clock frequency, f
Input/output clock high, t
Input/output clock low, t
p
NOTES: 2. Analog input voltages greater than that applied to REF+ convert as all ones (11111111), while input voltages less than that applied
CC
(see Note 2)V
ref+
(see Note 2)–0.10V
ref–
– V
ref+
IH
IL
clock(I/O)
wH(I/O)
wL(I/O)
t
p
to REF – convert as all zeros (00000000). For proper operation, REF+ must be at least 1 V higher than REF–. Also, the total
unadjusted error may increase as this differential reference voltage falls below 4.75 V.
3. This is the time required for the clock input signal to fall from VIH min to VIL max or to rise from VIL max to VIH min. In the vicinity
of normal room temperature, the devices function with input clock transition time as slow as 2 µs for remote data acquisition
applications where the sensor and the A/D converter are placed several feet away from the controlling microprocessor.
4. To minimize errors caused by noise at the chip select input, the internal circuitry waits for two rising edges and one falling edge of
the internal system clock after CS
specifications. Therefore, no attempt should be made to clock-in address data until the minimum chip select setup time has elapsed.
A
(see Note 2)1V
ref–
h(A)
h(CS)
f
clock(I/O)
f
clock(I/O)
TLC542C070
TLC542I–4085
↓ before responding to control input signals. The CS setup time is given by the t
= 4.75 to 5.5 V
CC
MINNOMMAXUNIT
4.7555.5V
ref–VCC
2V
su(A)
(see Note 4)3.8µs
su(CS)
≤ 525 kHz100
> 525 kHz40
400ns
0ns
0ns
01.1MHz
404ns
404ns
VCC + 0.1V
CCVCC
ref+
+ 0.2V
CC
V
V
0.8V
°
su(CS)
electrical characteristics over recommended operating temperature range, VCC = V