Texas Instruments SN65LVDS104D, SN65LVDS104DR, SN65LVDS104PW, SN65LVDS104PWR, SN65LVDS105D Datasheet

...
D
Receiver and Drivers Meet or Exceed the Requirements of ANSI EIA/TIA-644 Standard – SN65LVDS105 Receives Low-Voltage TTL
(LVTTL) Levels
– SN65LVDS104 Receives Differential Input
Levels, ±100 mV
D
Designed for Signaling Rates up to 630 Mbps
D
Operates From a Single 3.3-V Supply
D
Low-Voltage Differential Signaling With Typical Output Voltage of 350 mV and a 100- Load
D
Propagation Delay Time – SN65LVDS105 . . . 2.2 ns (Typ) – SN65LVDS104 . . . 3.1 ns (Typ)
D
Electrically Compatible With LVDS, PECL, LVPECL, LVTTL, L VCMOS, GTL, BTL, CTT, SSTL, or HSTL Outputs With External Networks
D
Driver Outputs Are High Impedance When Disabled or With VCC <1.5 V
D
Bus-Pin ESD Protection Exceeds 16 kV
D
SOIC and TSSOP Packaging
description
The SN65LVDS104 and SN65LVDS105 are a differential line receiver and a LVTTL input (respectively) connected to four differential line drivers that implement the electrical characteris­tics of low-voltage differential signaling (LVDS). LVDS, as specified in EIA/TIA-644 is a data signaling technique that offers low-power, low­noise coupling, and switching speeds to transmit data at speeds up to 655 Mbps at relatively long distances. (Note: The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media, the noise coupling to the environment, and other system characteris­tics.)
SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
SN65LVDS104
D OR PW PACKAGE
(TOP VIEW)
EN1 EN2 EN3 V
CC
GND
EN4
1 2 3 4 5
A
6
B
7 8
16 15 14 13 12 11 10
1Y 1Z 2Y 2Z 3Y 3Z 4Y
9
4Z
logic diagram (positive logic)
’LVDS104
EN1 EN2
EN3
A B
EN4
’LVDS105
EN1 EN2
EN3
A
EN4
SN65LVDS105
D OR PW PACKAGE
(TOP VIEW)
EN1
1
16
EN2
2
15
EN3
3
14
V
4
CC
GND
A
NC
EN4
13
5
12
6
11
7
10
8
1Y 1Z 2Y 2Z 3Y 3Z 4Y
9
4Z
1Y 1Z
2Y 2Z
3Y 3Z
4Y 4Z
1Y 1Z
2Y 2Z
3Y 3Z
4Y 4Z
The intended application of this device and signaling technique is for point-to-point baseband data transmission over controlled impedance media of approximately 100 . The transmission media may be printed-circuit board traces, backplanes, or cables. Having the drivers integrated into the same substrate, along with the low pulse skew of balanced signaling, allows extremely precise timing alignment of the signals repeated from the input. This is particularly advantageous in distribution or expansion of signals such as clock or serial data stream.
The SN65LVDS104 and SN65LVDS105 are characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 1999, Texas Instruments Incorporated
1
SN65LVDS104, SN65LVDS105 4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
description (continued)
The SN65LVDS104 and SN65LVDS105 are members of a family of LVDS repeaters. A brief overview of the family is provided in the table below.
Selection Guide to L VDS Repeaters
DEVICE
SN65LVDS22 2 LVDS 2 LVDS 16-pin D Dual multiplexed LVDS repeater SN65LVDS104 1 LVDS 4 LVDS 16-pin D 4-Port LVDS repeater SN65LVDS105 1 LVTTL 4 LVDS 16-pin D 4-Port TTL-to-LVDS repeater SN65LVDS108 1 LVDS 8 LVDS 38-pin DBT 8-Port LVDS repeater SN65LVDS109 2 LVDS 8 LVDS 38-pin DBT Dual 4-port LVDS repeater SN65LVDS116 1 LVDS 16 LVDS 64-pin DGG 16-Port LVDS repeater SN65LVDS117 2 LVDS 16 LVDS 64-pin DGG Dual 8-port LVDS repeater
VID = VA - V
VID 100 mV H H L Open H L H
–100 mV < VID < 100 mV H ? ? X L Z Z
VID –100 mV H L H X X Z Z
H = high level, L = low level, Z = high impedance, ? = indeterminate, X = don’t care
NO. INPUTS NO. OUTPUTS PACKAGE COMMENT
Function Tables
SN65LVDS104 SN65LVDS105
INPUT
B
X X Z Z L H L H X L Z Z H H H L
#EN #Y #Z A #EN #Y #Z
OUTPUT INPUT OUTPUT
equivalent input and output schematic diagrams
V
CC
A
Input
7 V 7 V
300 k300 k
B Input
EN and
A (’LVDS105)
Input
7 V
50
300 k
V
10 k
CC
5
Y or Z Output
7 V
V
CC
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
g
IC
SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage range, VCC(see Note 1) –0.5 to 4 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range, Enable inputs –0.5 to 6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A, B, Y or Z –0.5 to 4 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Electrostatic discharge (see Note 2); Y, Z, and GND Class 3, A:16 kV, B: 600 V. . . . . . . . . . . . . . . . . . . . . . . .
All pins Class 3, A:7 kV, B: 500 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous power dissipation See Dissipation Rating Table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
2. T ested in accordance with MIL-STD-883C Method 3015.7
DISSIPATION RATING TABLE
PACKAGE
D 950 mW 7.6 mW/°C 494 mW
PW 774 mW 6.2 mW/°C 402 mW
This is the inverse of the junction-to-ambient thermal resistance when board-mounted (low-k) and with no air flow.
TA 25°C
POWER RATING
OPERATING FACTOR‡
ABOVE TA = 25°C
TA = 85°C
POWER RATING
recommended operating conditions
MIN NOM MAX UNIT
Supply voltage, V High-level input voltage, V Low-level input voltage, V Magnitude of differential input voltage, VID 0.1 3.6 V
Common-mode input voltage, V
Operating free-air temperature, T
CC
IH
IL
IC
A
3 3.3 3.6 V 2 V
0.8 V
Ť
Ť
Ť
V
ID
2
–40 85 °C
2.4 – VCC–0.8 V
Ť
V
ID
2
V
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3
SN65LVDS104, SN65LVDS105
See Figure 1 and Table 1
mV
L
,
ICCSupply current
IIInput current (A or B inputs)
A
IOSShort-circuit output current
C See
See Figure 4
See Figure 5
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
SN65LVDS104 electrical characteristics over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
V
ITH+
V
ITH–
VOD Differential output voltage magnitude VOD V
OC(SS)
V
OC(SS)
V
OC(PP)
I
I(OFF)
I
IH
I
IL
I
OZ
I
O(OFF)
C
IN
C
O
All typical values are at 25°C and with a 3.3 V supply.
Positive-going differential input voltage threshold Negative-going differential input voltage threshold
R
= 100Ω,
Change in differential output voltage magnitude between logic states
Steady-state common-mode output voltage 1.125 1.375 V Change in steady-state common-mode output voltage
between logic states Peak-to-peak common-mode output voltage 25 150 mV
pp
p
Power-off Input current VCC= 1.5 V, VI= 2.4 V 20 µA High-level input current (enables) VIH = 2 V 20 µA Low-level input current (enables) VIL = 0.8 V 10 µA
High-impedance output current VO = 0 V or 2.4 V ±1 µA Power-off output current VCC = 1.5 V, VO = 2.4 V ±1 µA Input capacitance (A or B inputs) VI = 0.4 sin (4E6πt) + 0.5 V 3 pF
Output capacitance (Y or Z outputs)
p
p
VID= ± 100 mV, See Figure 1 and Figure 2
See Figure 3
Enabled, RL = 100 23 35 mA Disabled 3 8 mA VI = 0 V –2 –11 –20 VI = 2.4 V –1.2 –3
VOY or VOZ = 0 V ±10 mA VOD = 0 V ±10 mA
VI = 0.4 sin (4E6πt) + 0.5 V, Disabled
–100
247 340 454 –50 50
–50 50 mV
100
9.4 pF
mV
µ
SN65LVDS104 switching characteristics over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
t
PLH
t
PHL
t
r
t
f
t
sk(p)
t
sk(o)
t
sk(pp)
t
PZH
t
PZL
t
PHZ
t
PLZ
All typical values are at 25°C and with a 3.3 V supply.
t
sk(o)
§
t
sk(pp)
with the same supply voltages, at the same temperature, and have identical packages and test circuits.
Propagation delay time, low-to-high-level output 2.4 3.2 4.2 ns Propagation delay time, high-to-low-level output 2.2 3.1 4.2 ns Differential output signal rise time Differential output signal fall time Pulse skew (|t Channel-to-channel output skew Part-to-part skew Propagation delay time, high-impedance-to-high-level output 7.2 15 ns Propagation delay time, high-impedance-to-low-level output Propagation delay time, high-level-to-high-impedance output Propagation delay time, low-level-to-high-impedance output 6 15 ns
is the magnitude of the time difference between the t
is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate
PHL
– t
|)
PLH
§
or t
PLH
of all drivers of a single device with all of their inputs connected together.
PHL
RL = 100Ω,
= 10 pF,
L
Figure 4
p
0.3 0.8 1.2 ns
0.3 0.8 1.2 ns 150 500 ps
20 100 ps
1.5 ns
8.4 15 ns
3.6 15 ns
4
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L
,
ICCSupply current
IOSShort-circuit output current
C See
9
See Figure 9
See Figure 10
SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
SN65LVDS105 electrical characteristics over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
VOD Differential output voltage magnitude
VOD V
OC(SS)
V
OC(SS)
V
OC(PP)
I
IH
I
IL
I
OZ
I
O(OFF)
C
IN
C
O
All typical values are at 25°C and with a 3.3 V supply.
Change in differential output voltage magnitude between logic states
Steady-state common-mode output voltage 1.125 1.375 V Change in steady-state common-mode output voltage be-
tween logic states Peak-to-peak common-mode output voltage 25 150 mV
pp
High-level input current VIH = 2 V 20 µA Low-level input current VIL = 0.8 V 10 µA
p
High-impedance output current VO = 0 V or 2.4 V ±1 µA Power-off output current VCC = 1.5 V, VO = 2.4 V 0.3 ±1 µA Input capacitance VI = 0.4 sin (4E6πt) + 0.5 V 5 pF
Output capacitance (Y or Z outputs)
R
= 100Ω, VID= ± 100 mV, See Figure 6 and Figure 7
See Figure 8
Enabled, RL = 100 23 35 mA Disabled 0.7 6.4 mA
VOY or VOZ = 0 V ±10 mA VOD = 0 V ±10 mA
VI = 0.4 sin (4E6πt) + 0.5 V, Disabled
247 340 454 –50 50
–50 50 mV
9.4 pF
mV
SN65LVDS105 switching characteristics over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
t
PLH
t
PHL
t
r
t
f
t
sk(p)
t
sk(o)
t
sk(pp)
t
PZH
t
PZL
t
PHZ
t
PLZ
All typical values are at 25°C and with a 3.3 V supply.
t
sk(o)
§
t
sk(pp)
with the same supply voltages, at the same temperature, and have identical packages and test circuits.
Propagation delay time, low-to-high-level output 1.7 2.2 3 ns Propagation delay time, high-to-low-level output 1.4 2.3 3.5 ns Differential output signal rise time Differential output signal fall time Pulse skew (|t Channel-to-channel output skew Part-to-part skew Propagation delay time, high-impedance-to-high-level output 7.2 15 ns Propagation delay time, high-impedance-to-low-level output Propagation delay time, high-level-to-high-impedance output Propagation delay time, low-level-to-high-impedance output 6 15 ns
is the magnitude of the time difference between the t
is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate
PHL
– t
|)
PLH
§
or t
PLH
of all drivers of a single device with all of their inputs connected together.
PHL
RL = 100Ω,
= 10 pF,
L
Figure
p
0.3 0.8 1.2 ns
0.3 0.8 1.2 ns 150 500 ps
20 100 ps
1.5 ns
8.4 15 ns
3.6 15 ns
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SN65LVDS104, SN65LVDS105 4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
PARAMETER MEASUREMENT INFORMATION
I
I
I
V
IA
IB
V
IB
A
V
ID
B
I
OY
Y
V
OD
I
OZ
Z
V
OY
V
V
OZ
OC
VOY)
2
Figure 1. ’LVDS104 Voltage and Current Definitions
Table 1. SN65LVDS104 Minimum and Maximum Input Threshold Test Voltages
APPLIED
VOLTAGES
V
IA
1.25 V 1.15 V 100 mV 1.2 V
1.15 V 1.25 V –100 mV 1.2 V
2.4 V 2.3 V 100 mV 2.35 V
2.3 V 2.4 V –100 mV 2.35 V
0.1 V 0 V 100 mV 0.05 V
1.5 V 0.9 V 600 mV 1.2 V
0.9 V 1.5 V –600 mV 1.2 V
2.4 V 1.8 V 600 mV 2.1 V
1.8 V 2.4 V –600 mV 2.1 V
0.6 V 0 V 600 mV 0.3 V
V
IB
0 V 0.1 V –100 mV 0.05 V
0 V 0.6 V –600 mV 0.3 V
RESULTING
DIFFERENTIAL
INPUT VOLTAGE
V
ID
RESULTING COMMON-MODE INPUT VOLTAGE
V
IC
V
OZ
Input
Y
V
OD
Z
100
3.75 k
3.75 k
±
0 V V
TEST
2.4 V
Figure 2. ’LVDS104 VOD Test Circuit
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
PARAMETER MEASUREMENT INFORMATION
49.9 ± 1% (2 Places)
Y
Input
Input
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf 1 ns, pulse repetition rate (PRR) = 0.5 Mpps,
pulsewidth = 500 ± 10 ns . CL includes instrumentation and fixture capacitance within 0,06 m of the D.U.T . The measurement of V is made on test equipment with a –3 dB bandwidth of at least 300 MHz.
Z
V
CL = 10 pF (2 Places)
OC
V
I
V
I
V
OC(PP)
V
O
1.4 V
1 V
V
OC(SS)
OC(PP)
Figure 3. ’LVDS104 Test Circuit and Definitions for the Driver Common-Mode Output Voltage
V
IB
Input
V
IA t
Output
PLH
0 V
V
OD(H)
t
f
A
Input
B
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf 1 ns, pulse repetition rate (PRR) = 50 Mpps,
pulsewidth = 10 ± 0.2 ns . CL includes instrumentation and fixture capacitance within 0,06 m of the D.U.T.
Y
V
Z
OD
100 ± 1 %
CL = 10 pF (2 Places)
t
PHL
V
OD(L)
1.4 V
1.2 V 1 V
t
r
100% 80%
20% 0%
Figure 4. ’LVDS104 Test Circuit, Timing, and Voltage Definitions for the Differential output Signal
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SN65LVDS104, SN65LVDS105 4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
PARAMETER MEASUREMENT INFORMATION
1 V or 1.4 V
1.2 V
EN
EN
t
PZH
V
OY
or
V
OZ
t
PZL
V
OZ
or
V
OY
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf 1 ns, pulse repetition rate (PRR) = 0.5 Mpps,
pulsewidth = 500 ± 10 ns . CL includes instrumentation and fixture capacitance within 0,06 m of the D.U.T.
Y
Z
CL = 10 pF
(2 Places)
(see Note B)
49.9 ± 1% (2 Places)
VOYV
t
PHZ
t
PLZ
OZ
3 V
1.5 V 0 V
1.4 V
1.25 V
1.2 V
1.2 V
1.15 V 1 V
1.2 V
Figure 5. ’LVDS104 Enable and Disable Time Circuit and Definitions
I
OY
I
I
A
V
IA
Y
V
OD
I
OZ
Z
V
OY
V
V
OZ
OC
VOY)
V
OZ
2
Figure 6. ’LVDS105 Voltage and Current Definitions
Input
Y
V
OD
Z
100
3.75 k
3.75 k
±
0 V V
TEST
2.4 V
Figure 7. ’LVDS105 VOD Test Circuit
8
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SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
PARAMETER MEASUREMENT INFORMATION
49.9 ± 1% (2 Places)
Y
Input
Input
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf 1 ns, pulse repetition rate (PRR) = 0.5 Mpps,
pulsewidth = 500 ± 10 ns . CL includes instrumentation and fixture capacitance within 0,06 m of the D.U.T . The measurement of V is made on test equipment with a –3 dB bandwidth of at least 300 MHz.
Z
V CL = 10 pF (2 Places)
OC
V
O
V
OC(PP)
3 V
0 VA
V
OC(SS)
OC(PP)
Figure 8. ’LVDS105 Test Circuit and Definitions for the Driver Common-Mode Output Voltage
Input
V
IA t
Output
PLH
0 V
V
OD(H)
t
f
Y
Input
Z
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf 1 ns, pulse repetition rate (PRR) = 50 Mpps,
pulsewidth = 10 ± 0.2 ns . CL includes instrumentation and fixture capacitance within 0,06 m of the D.U.T.
V
OD
CL = 10 pF (2 Places)
100 ± 1 %
t
PHL
V
OD(L)
3 V
1.5 V 0 V
t
r
100% 80%
20% 0%
Figure 9. ’LVDS105 Test Circuit, Timing, and Voltage Definitions for the Differential output Signal
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SN65LVDS104, SN65LVDS105 4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
PARAMETER MEASUREMENT INFORMATION
Y
0.8 V or 2 V
EN
EN
t
PZH
V
OY
or
V
OZ
t
PZL
V
OZ
or
V
OY
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf 1 ns, pulse repetition rate (PRR) = 0.5 Mpps,
pulsewidth = 500 ± 10 ns . CL includes instrumentation and fixture capacitance within 0,06 m of the D.U.T.
Z
CL = 10 pF
(2 Places)
(see Note B)
49.9 ± 1% (2 Places)
VOYV
t
PHZ
t
PLZ
OZ
3 V
1.5 V 0 V
1.4 V
1.25 V
1.2 V
1.2 V
1.15 V 1 V
1.2 V
Figure 10. ’LVDS105 Enable and Disable Time Circuit and Definitions
10
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SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
TYPICAL CHARACTERISTIC
SN65L VDS104
SUPPLY CURRENT
vs
SWITCHING FREQUENCY
60
55
50
VCC = 3.6 V
45
40
– Supply Current – mA
35
CC
I
30
25
50 100 150 200 250 300 350
VCC = 3.3 V
f – Frequency – MHz
VCC = 3 V
All Outputs Loaded
and Enabled
Figure 11
SN65L VDS105
SUPPLY CURRENT
vs
SWITCHING FREQUENCY
50
45
40
35
– Supply Current – mA
30
CC
I
25
20
50 100 150 200 250 300 350
VCC = 3.6 V
VCC = 3 V
VCC = 3.3 V
All Outputs Loaded
and Enabled
f – Frequency – MHz
Figure 12
4
3
2
– Low-Level Output Voltage – V
1
OL
V
0
0
DRIVER
LOW-LEVEL OUTPUT VOLTAGE
vs
LOW-LEVEL OUTPUT CURRENT
VCC = 3.3 V TA = 25°C
2
IOL – Low-Level Output Current – mA
46
Figure 13
3.5
3
2.5
2
1.5
1
– High-Level Output Voltage – V
OH
0.5
V
0
–4
DRIVER
HIGH-LEVEL OUTPUT VOLTAGE
vs
HIGH-LEVEL OUTPUT CURRENT
VCC = 3.3 V TA = 25°C
–3
IOH – High-Level Output Current – mA
–2 0
Figure 14
–1
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SN65LVDS104, SN65LVDS105 4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
TYPICAL CHARACTERISTIC
SN65L VDS104
LOW-TO-HIGH PROPAGATION DELAY TIME
vs
FREE-AIR TEMPERATURE
3.6
3.5
3.4 VCC = 3.3 V
3.3
3.2
3.1
3.0
2.9
PLH – Low-To-High Propagation Delay T ime – ns
t
2.8
–50 –25 0 25 50 75 100
VCC = 3.6 V
TA – Free–Air Temperature – °C
VCC = 3 V
Figure 15
SN65L VDS104
HIGH-TO-LOW PROPAGATION DELAY TIME
vs
FREE-AIR TEMPERATURE
3.6
3.5
3.4
3.3 VCC = 3 V
3.2
3.1
3.0
2.9
PHL – High-To-Low Propagation Delay T ime – ns
t
2.8
–50 –25 0 25 50 75 100
TA – Free–Air Temperature – °C
VCC = 3.6 V
VCC = 3.3 V
Figure 16
SN65L VDS105
LOW-TO-HIGH PROPAGATION DELAY TIME
vs
FREE-AIR TEMPERATURE
2.7
2.6
2.5
2.4 VCC = 3 V
2.3
2.2
VCC = 3.3 V
2.1
PLH – Low-To-High Propagation Delay T ime – ns
t
2
–50 –25 0 25 50 75 100
VCC = 3.6 V
TA – Free–Air Temperature – °C
Figure 17
SN65L VDS105
HIGH-TO-LOW PROPAGATION DELAY TIME
vs
FREE-AIR TEMPERATURE
2.7
2.6
2.5 VCC = 3 V
2.4
2.3
VCC = 3.3 V
2.2
VCC = 3.6 V
2.1
PHL – High-To-Low Propagation Delay T ime – ns
t
2
–50 –25 0 25 50 75 100
TA – Free–Air Temperature – °C
Figure 18
12
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SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
APPLICATION INFORMATION
A L VDS receiver can be used to receive various other types of logic signals. Figure 19 through Figure 28 show the termination circuits for SSTL, HSTL, GTL, BTL, LVPECL, PECL, CMOS, and TTL.
V
DD
25
50
A
1/2 V
50
DD
0.1 µF
B
LVDS Receiver
Figure 19. Stub-Series Terminated (SSTL) or High-Speed Transceiver Logic (HSTL)
V
DD
50
50
1.35 V < VTT < 1.65 V
0.1 µF
A
B
LVDS Receiver
Figure 20. Center-Tap Termination (CTT)
1.14 V < VTT < 1.26 V
V
DD
50
2 k
50 1 k
A
B
0.1 µF
LVDS Receiver
Figure 21. Gunning Transceiver Logic (GTL)
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13
SN65LVDS104, SN65LVDS105 4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
APPLICATION INFORMATION
3.3 V
ECL
Z
0
1.47 V < VTT < 1.62 V
Z
0
Figure 22. Backplane Transceiver Logic (BTL)
3.3 V
50
33
50
A
B
120 120
33
0.1 µF
A
LVDS Receiver
B
51
51
Figure 23. Low-Voltage Positive Emitter-Coupled Logic (LVPECL)
LVDS Receiver
14
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
APPLICATION INFORMATION
5 V
5 V
ECL
50
100
50
33
Figure 24. Postive Emitter-Coupled Logic (PECL)
3.3 V
3.3 V
7.5 k
A
82 82
100
A
B
33
LVDS Receiver
B
7.5 k
0.1 µF
Figure 25. 3.3-V CMOS
LVDS Receiver
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15
SN65LVDS104, SN65LVDS105 4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
APPLICATION INFORMATION
5 V
5 V
5 V
560
470
10 k
560
3.32 k
Figure 26. 5-V CMOS
10 k
5 V
A
B
0.1 µF
A
B
LVDS Receiver
3.3 V
560
3.3 V
4.02 k
Figure 27. 5-V TTL
4.02 k
3.01 k
Figure 28. LVTTL
3.3 V
0.1 µF
A
B
0.1 µF
LVDS Receiver
LVDS Receiver
16
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
APPLICATION INFORMATION
fail safe
One of the most common problems with differential signaling applications is how the system responds when no differential voltage is present on the signal pair . The LVDS receiver is like most differential line receivers, in that its output logic state can be indeterminate when the differential input voltage is between –100 mV and 100 mV and within its recommended input common-mode voltage range. TI’s LVDS receiver is different in how it handles the open-input circuit situation, however.
Open-circuit means that there is little or no input current to the receiver from the data line itself. This could be when the driver is in a high-impedance state or the cable is disconnected. When this occurs, the L VDS receiver will pull each line of the signal pair to near V feature uses an AND gate with input voltage thresholds at about 2.3 V to detect this condition and force the output to a high-level regardless of the differential input voltage.
300 k 300 k
through 300-k resistors as shown in Figure 10. The fail-safe
CC
V
CC
A
Rt = 100 (Typ)
B
VIT 2.3 V
Y
Figure 29. Open-Circuit Fail Safe of the LVDS Receiver
It is only under these conditions that the output of the receiver will be valid with less than a 100 mV differential input voltage magnitude. The presence of the termination resistor, Rt, does not af fect the fail-safe function as long as it is connected as shown in the figure. Other termination circuits may allow a dc current to ground that could defeat the pullup currents from the receiver and the fail-safe feature.
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17
SN65LVDS104, SN65LVDS105 4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
MECHANICAL INFORMATION
D (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
14 PINS SHOWN
0.050 (1,27)
14
1
0.069 (1,75) MAX
A
0.020 (0,51)
0.014 (0,35)
0.010 (0,25)
0.004 (0,10)
DIM
8
7
PINS **
0.010 (0,25)
0.157 (4,00)
0.150 (3,81)
M
0.244 (6,20)
0.228 (5,80)
Seating Plane
0.004 (0,10)
8
14
0.008 (0,20) NOM
0°–8°
16
Gage Plane
0.010 (0,25)
0.044 (1,12)
0.016 (0,40)
A MAX
A MIN
NOTES: A. All linear dimensions are in inches (millimeters).
18
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion, not to exceed 0.006 (0,15). D. Falls within JEDEC MS-012
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0.197
(5,00)
0.189
(4,80)
0.344
(8,75)
0.337
(8,55)
0.394
(10,00)
0.386
(9,80)
4040047/D 10/96
SN65LVDS104, SN65LVDS105
4-PORT LVDS AND 4-PORT TTL-TO-LVDS REPEATERS
SLLS396B– SEPTEMBER 1999 – REVISED DECEMBER 1999
MECHANICAL INFORMATION
PW (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
14 PINS SHOWN
0,65
1,20 MAX
14
0,30
0,19
8
4,50 4,30
PINS **
7
Seating Plane
0,15
0,05
8
1
A
DIM
6,60 6,20
14
0,10
0,10
M
0,15 NOM
Gage Plane
0,25
0°–8°
2016
24
28
0,75 0,50
A MAX
A MIN
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion not to exceed 0,15. D. Falls within JEDEC MO-153
3,10
2,90
5,10
4,90
5,10
4,90
6,60
6,40
7,90
7,70
9,80
9,60
4040064/F 01/97
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19
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