2. Changed typo size on module PCB in package dimesions. (from 2.6mm to 3mm).
3. Changed AC parameter table.
Rev. 0.1 June. 2001
M470L1714BT0
200pin DDR SDRAM SODIMM
M470L1714BT0 200pin DDR SDRAM SODIMM
16Mx64 200pin DDR SDRAM SODIMM based on 8Mx16
GENERAL DESCRIPTION
The Samsung M470L1714BT0 is 16M bit x 64 Double Data
FEATURE
• Performance range
Rate SDRAM high density memory modules based on first gen
of 128Mb DDR SDRAM respectively.
The Samsung M470L1714BT0 consists of eight CMOS 8M x
16 bit with 4banks Double Data Rate SDRAMs in 66pin TSOPII(400mil) packages mounted on a 200pin glass-epoxy substrate. Four 0.1uF decoupling capacitors are mounted on the
printed circuit board in parallel for each DDR SDRAM.
The M470L1714BT0 is Dual In-line Memory Modules and
intended for mounting into 200pin edge connector sockets.
Synchronous design allows precise cycle control with the use
of system clock. Data I/O transactions are possible on both
edges of DQS. Range of operating frequencies, programmable
latencies and burst lengths allow the same device to be useful
for a variety of high bandwidth, high performance memory system applications.
Voltage on any pin relative to VssVIN, VOUT-0.5 ~ 3.6V
Voltage on VDD supply relative to VssVDD-1.0 ~ 3.6V
Voltage on VDDQ supply relative to Vss
Storage temperatureTSTG-55 ~ +150°C
Power dissipationPD8W
Short circuit currentIOS50mA
Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
VDDQ
-0.5 ~ 3.6V
POWER & DC OPERATING CONDITIONS (SSTL_2 In/Out)
Recommended operating conditions(Voltage referenced to VSS=0V, TA=0 to 70°C)
ParameterSymbolMinMaxUnitNote
Supply voltage(for device with a nominal VDD of 2.5V)VDD2.32.7
I/O Supply voltageVDDQ2.32.7V
I/O Reference voltageVREFVDDQ/2-50mV VDDQ/2+50mVV1
I/O Termination voltage(system)V
Input logic high voltageVIH(DC)VREF+0.15VDDQ+0.3V4
Input logic low voltageVIL(DC)-0.3VREF-0.15V4
Input Voltage Level, CK and CK inputsVIN(DC)-0.3VDDQ+0.3V
Input Differential Voltage, CK and CK inputsVID(DC)0.3VDDQ+0.6V3
Input crossing point voltage, CK and CK inputsVIX(DC)1.151.35V5
Input leakage currentII-22uA
Output leakage currentIOZ-55uA
Output High Current(Normal strengh driver)
;V
= VTT + 0.84V
OUT
Output High Current(Normal strengh driver)
;V
= VTT - 0.84V
OUT
Output High Current(Half strengh driver)
;V
=VTT + 0.45V
OUT
Output High Current(Half strengh driver)
;V
= VTT - 0.45V
OUT
Notes 1. Includes ± 25mV margin for DC offset on VREF, and a combined total of ± 50mV margin for all AC noise and DC offset on VREF,
2.VTT is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be set equal to
4. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in
simulation. The AC and DC input specifications are relative to a VREF envelop that has been bandwidth limited to 200MHZ.
5. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the dc level of the same.
6. These charactericteristics obey the SSTL-2 class II standards.
bandwidth limited to 20MHz. The DRAM must accommodate DRAM current spikes on VREF and internal DRAM noise coupled
TO VREF, both of which may result in VREF noise. VREF should be de-coupled with an inductance of ≤ 3nH.
VREF, and must track variations in the DC level of VREF
3. VID is the magnitude of the difference between the input level on CK and the input level on CK.
TT
IOH-16.8mA
IOL16.8mA
IOH-9mA
OL
I
VREF-0.04VREF+0.04V2
9mA
Rev. 0.1 June. 2001
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