SAMSUNG M470L1714BT0 Technical data

M470L1714BT0
200pin DDR SDRAM SODIMM
128MB DDR SDRAM MODULE
(16Mx64 based on 8Mx16 DDR SDRAM)
200pin SODIMM
64-bit Non-ECC/Parity
Revision 0.1
Rev. 0.1 June. 2001
M470L1714BT0
200pin DDR SDRAM SODIMM
Revision History
Revision 0.0 (Apr. 2001)
1. First release.
Revision 0.1 (June. 2001)
1. Changed module current speificaton
2. Changed typo size on module PCB in package dimesions. (from 2.6mm to 3mm).
3. Changed AC parameter table.
Rev. 0.1 June. 2001
M470L1714BT0
200pin DDR SDRAM SODIMM
M470L1714BT0 200pin DDR SDRAM SODIMM
16Mx64 200pin DDR SDRAM SODIMM based on 8Mx16
GENERAL DESCRIPTION
The Samsung M470L1714BT0 is 16M bit x 64 Double Data
FEATURE
• Performance range
Rate SDRAM high density memory modules based on first gen of 128Mb DDR SDRAM respectively. The Samsung M470L1714BT0 consists of eight CMOS 8M x 16 bit with 4banks Double Data Rate SDRAMs in 66pin TSOP­II(400mil) packages mounted on a 200pin glass-epoxy sub­strate. Four 0.1uF decoupling capacitors are mounted on the printed circuit board in parallel for each DDR SDRAM. The M470L1714BT0 is Dual In-line Memory Modules and intended for mounting into 200pin edge connector sockets. Synchronous design allows precise cycle control with the use of system clock. Data I/O transactions are possible on both edges of DQS. Range of operating frequencies, programmable latencies and burst lengths allow the same device to be useful for a variety of high bandwidth, high performance memory sys­tem applications.
M470L1714BT0-C(L)A2 133MHz(7.5ns@CL=2) M470L1714BT0-C(L)B0 133MHz(7.5ns@CL=2.5) M470L1714BT0-C(L)A0
• Power supply : Vdd: 2.5V ± 0.2V, Vddq: 2.5V ± 0.2V
Double-data-rate architecture; two data transfers per clock cycle
• Bidirectional data strobe(DQS)
• Differential clock inputs(CK and CK)
• DLL aligns DQ and DQS transition with CK transition
• Programmable Read latency 2, 2.5 (clock)
• Programmable Burst length (2, 4, 8)
• Programmable Burst type (sequential & interleave)
• Edge aligned data output, center aligned data input
• Auto & Self refresh, 15.6us refresh interval(4K/64ms refresh)
• Serial presence detect with EEPROM
• PCB : Height 1250 (mil), double sided component
PIN CONFIGURATIONS (Front side/back side)
Pin Front Pin Front Pin Front Pin Back Pin Back Pin Back
1
VREF
67
DQ27
135
3
VSS
69
5
DQ0
7
DQ1
9
VDD
11
DQS0
13
DQ2
15
VSS
17
DQ3
19
DQ8
21
VDD
23
DQ9
25
DQS1
27
VSS
29
DQ10
31
DQ11
33
VDD
35
CK0
37
/CK0
39
VSS
41
DQ16
43
DQ17
45
VDD
47
DQS2
49
DQ18
51
VSS
53
DQ19
55
DQ24
57
VDD
59
DQ25
61
DQS3
63
VSS
65
DQ26
71 73 75 77 79 81 83 85 87 89 91 93 95 97
99 101 103 105 107 109 111 113 115 117 119 121 123 125 127 129 131 133
VDD CB0 CB1 VSS
DQS8
CB2 VDD CB3
DU VSS CK2 /CK2 VDD
CKE1
DU(A13)
A12
A9
VSS
A7 A5 A3 A1
VDD
A10/AP
BA0 /WE
/S0
DU VSS
DQ32 DQ33
VDD
DQS4
137 139 141 143 145 147 149 151 153 155 157 159 161 163 165 167 169 171 173 175 177 179 181 183 185 187 189 191 193 195 197 199
DQ34 DQ35
DQ40 DQ41
DQS5 DQ42
DQ43
DQ48 DQ49
DQS6 DQ50
DQ51 DQ56
DQ57 DQS7
DQ58 DQ59
VDDSPD
VDDID
VSS
VDD
VSS
VDD VDD VSS VSS
VDD
VSS
VDD
VSS
VDD SDA SCL
2
VREF
68
4
VSS
6
DQ4
8
DQ5
10
VDD
12
DM0
14
DQ6
16
VSS
18
DQ7
20
DQ12
22
VDD
24
DQ13
26
DM1
28
VSS
30
DQ14
32
DQ15
34
VDD
36
VDD
38
VSS
40
VSS
KeyKey
42
DQ20
44
DQ21
46
VDD
48
DM2
50
DQ22
52
VSS
54
DQ23
56
DQ28
58
VDD
60
DQ29
62
DM3
64
VSS
66
DQ30
70 72 74 76 78 80 82 84 86 88 90 92 94 96
98 100 102 104 106 108 110 112 114 116 118 120 122 124 126 128 130 132 134
DQ31
VDD CB4 CB5 VSS DM8 CB6 VDD CB7
DU/(RESET)
VSS VSS VDD VDD
CKE0
DU(BA2)
VSS
VDD
BA1 /RAS /CAS
VSS
DQ36 DQ37
VDD
DM4
A11
A8 A6
A4 A2 A0
/S1 DU
136 138 140 142 144 146 148 150 152 154 156 158 160 162 164 166 168 170 172 174 176 178 180 182 184 186 188 190 192 194 196 198 200
Part No. Max Freq. Interface
SSTL_2
100MHz(10ns@CL=2)
PIN DESCRIPTION
Pin Name Function
DQ38
VSS DQ39 DQ44
VDD DQ45
DM5
VSS DQ46 DQ47
VDD
/CK1
CK1
VSS DQ52 DQ53
VDD DM6
DQ54
VSS DQ55 DQ60
VDD
DQ61
DM7
VSS DQ62 DQ63
VDD
SA0
SA1
SA2
DU
A0 ~ A11 Address input (Multiplexed) BA0 ~ BA1 Bank Select Address DQ0 ~ DQ63 Data input/output DQS0 ~ DQS7 Data Strobe input/output CK0~ CK2,
CK0~ CK2
Clock input
CKE0 Clock enable input CS0 Chip select input RAS Row address strobe CAS Column address strobe WE Write enable DM0 ~ DM7 Data - in mask VDD Power supply (2.5V) VDDQ Power Supply for DQS(2.5V) VSS Ground VREF Power supply for reference VDDSPD Serial EEPROM Power
Supply (2.3V to 3.6V)
SDA Serial data I/O SCL Serial clock SA0 ~ 2 Address in EEPROM VDDID VDD identification flag NC No connection
* These pins are not used in this module.
SAMSUNG ELECTRONICS CO., Ltd. reserves the right to change products and specifications without notice.
Rev. 0.1 June. 2001
M470L1714BT0
FUNCTIONAL BLOCK DIAGRAM
S1 S0
DQS0 DM0
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
DQS1 DM1
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
LDQS LDM I/0 0 I/0 1 I/0 2 I/0 3 I/0 4 I/0 5 I/0 6 I/0 7
UDQS UDM I/0 8 I/0 9 I/0 10 I/0 11 I/0 12 I/0 13 I/0 14 I/0 15
S S
LDQS LDM I/0 0 I/0 1
D0
I/0 2 I/0 3 I/0 4 I/0 5 I/0 6 I/0 7
UDQS UDM I/0 8 I/0 9 I/0 10 I/0 11 I/0 12 I/0 13 I/0 14 I/0 15
D4
DQS4 DM4
DQS5 DM5
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
200pin DDR SDRAM SODIMM
LDQS LDM I/0 0 I/0 1 I/0 2 I/0 3 I/0 4 I/0 5 I/0 6 I/0 7
UDQS UDM I/0 8 I/0 9 I/0 10 I/0 11 I/0 12 I/0 13 I/0 14 I/0 15
S S
D2
LDQS LDM I/0 0 I/0 1 I/0 2 I/0 3 I/0 4 I/0 5 I/0 6 I/0 7
UDQS UDM I/0 8 I/0 9 I/0 10 I/0 11 I/0 12 I/0 13 I/0 14 I/0 15
D6
DQS2 DM2
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
DQS3 DM3
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
BA0 - BA1 BA0-BA1: DDR SDRAMs D0 - D7 A0 - A13 RAS CAS CKE0 WE WE: SDRAMs D0 - D7
V
DDSPD
VDD/V
DDQ
VREF
V
SS
V
DDID Strap: see Note 4
LDQS LDM
S S
I/0 0 I/0 1 I/0 2 I/0 3
D1
I/0 4 I/0 5 I/0 6 I/0 7
UDQS UDM I/0 8 I/0 9 I/0 10 I/0 11 I/0 12 I/0 13 I/0 14 I/0 15
A0-A13: DDR SDRAMs D0 - D7 RAS: SDRAMs D0 - D7 CAS: SDRAMs D0 - D7 CKE: SDRAMs D0 - D7
SPD D0 - D7 D0 - D7 D0 - D7
D0 - D7
LDQS LDM I/0 0 I/0 1 I/0 2 I/0 3 I/0 4 I/0 5 I/0 6 I/0 7
UDQS UDM I/0 8 I/0 9 I/0 10 I/0 11 I/0 12 I/0 13 I/0 14 I/0 15
SCL
WP
D5
Clock
Input
CK0/CK0 CK1/CK1 CK2/CK2
A0
SA0 SA1
DQS6 DM6
DQS7 DM7
Clock Wiring
Serial PD
A1
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
SDRAMs
4 SDRAMs 4 SDRAMs
NC
A2
SA2
LDQS LDM
S S
I/0 0 I/0 1 I/0 2 I/0 3
D3
I/0 4 I/0 5 I/0 6 I/0 7
UDQS UDM I/0 8 I/0 9 I/0 10 I/0 11 I/0 12 I/0 13 I/0 14 I/0 15
R=120
± 5%
CK CK
Card Edge
*Clock Net Wiring
Notes:
1. DQ-to-I/O wiring is shown as recom­mended but may be changed.
2. DQ/DQS/DM/CKE/CS relationships must be maintained as shown.
SDA
3. DQ, DQS, DM/DQS resistors: 22 Ohms.
4. VDDID strap connections (for memory device VDD, VDDQ): STRAP OUT (OPEN): VDD = VDDQ STRAP IN (VSS): VDD VDDQ.
LDQS LDM I/0 0 I/0 1 I/0 2 I/0 3 I/0 4 I/0 5 I/0 6 I/0 7
UDQS UDM I/0 8 I/0 9 I/0 10 I/0 11 I/0 12 I/0 13 I/0 14 I/0 15
Dram1
Dram2
Dram3
Dram4
D7
Rev. 0.1 June. 2001
M470L1714BT0
200pin DDR SDRAM SODIMM
ABSOLUTE MAXIMUM RATINGS
Parameter Symbol Value Unit
Voltage on any pin relative to Vss VIN, VOUT -0.5 ~ 3.6 V Voltage on VDD supply relative to Vss VDD -1.0 ~ 3.6 V Voltage on VDDQ supply relative to Vss Storage temperature TSTG -55 ~ +150 °C Power dissipation PD 8 W Short circuit current IOS 50 mA
Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to recommended operating condition. Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
VDDQ
-0.5 ~ 3.6 V
POWER & DC OPERATING CONDITIONS (SSTL_2 In/Out)
Recommended operating conditions(Voltage referenced to VSS=0V, TA=0 to 70°C)
Parameter Symbol Min Max Unit Note
Supply voltage(for device with a nominal VDD of 2.5V) VDD 2.3 2.7 I/O Supply voltage VDDQ 2.3 2.7 V I/O Reference voltage VREF VDDQ/2-50mV VDDQ/2+50mV V 1 I/O Termination voltage(system) V Input logic high voltage VIH(DC) VREF+0.15 VDDQ+0.3 V 4 Input logic low voltage VIL(DC) -0.3 VREF-0.15 V 4 Input Voltage Level, CK and CK inputs VIN(DC) -0.3 VDDQ+0.3 V Input Differential Voltage, CK and CK inputs VID(DC) 0.3 VDDQ+0.6 V 3 Input crossing point voltage, CK and CK inputs VIX(DC) 1.15 1.35 V 5 Input leakage current II -2 2 uA Output leakage current IOZ -5 5 uA Output High Current(Normal strengh driver)
;V
= VTT + 0.84V
OUT
Output High Current(Normal strengh driver) ;V
= VTT - 0.84V
OUT
Output High Current(Half strengh driver) ;V
= VTT + 0.45V
OUT
Output High Current(Half strengh driver) ;V
= VTT - 0.45V
OUT
Notes 1. Includes ± 25mV margin for DC offset on VREF, and a combined total of ± 50mV margin for all AC noise and DC offset on VREF,
2.VTT is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be set equal to
4. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in simulation. The AC and DC input specifications are relative to a VREF envelop that has been bandwidth limited to 200MHZ.
5. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the dc level of the same.
6. These charactericteristics obey the SSTL-2 class II standards.
bandwidth limited to 20MHz. The DRAM must accommodate DRAM current spikes on VREF and internal DRAM noise coupled TO VREF, both of which may result in VREF noise. VREF should be de-coupled with an inductance of 3nH.
VREF, and must track variations in the DC level of VREF
3. VID is the magnitude of the difference between the input level on CK and the input level on CK.
TT
IOH -16.8 mA
IOL 16.8 mA
IOH -9 mA
OL
I
VREF-0.04 VREF+0.04 V 2
9 mA
Rev. 0.1 June. 2001
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