78FBGA with Lead-Free & Halogen-Free
(RoHS compliant)
M391B5773DH0
M391B5273DH0
datasheet
SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND
SPECIFICATIONS WITHOUT NOTICE.
Products and specifications discussed herein are for reference purposes only. All information discussed
herein is provided on an "AS IS" basis, without warranties of any kind.
This document and all information discussed herein remain the sole and exclusive property of Samsung
Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property
right is granted by one party to the other party under this document, by implication, estoppel or otherwise.
Samsung products are not intended for use in life support, critical care, medical, safety equipment, or
similar applications where product failure could result in loss of life or personal or physical harm, or any
military or defense application, or any governmental procurement to which special terms or provisions
may apply.
For updates or additional information about Samsung products, contact your nearest Samsung office.
All brand names, trademarks and registered trademarks belong to their respective owners.
ⓒ 2010 Samsung Electronics Co., Ltd. All rights reserved.
6. SPD and Thermal Sensor for ECC UDIMMs ................................................................................................................ 6
7.1.1. DRAM Pin Wiring Mirroring.............................................................................................................................. 8
8. Function Block Diagram:...............................................................................................................................................9
8.1 2GB, 256Mx72 ECC Module (Populated as 1 rank of x8 DDR3 SDRAMs) ............................................................ 9
8.2 4GB, 512Mx72 ECC Module (Populated as 2 ranks of x8 DDR3 SDRAMs)........................................................... 10
9. Absolute Maximum Ratings ..........................................................................................................................................11
9.1 Absolute Maximum DC Ratings............................................................................................................................... 11
9.2 DRAM Component Operating Temperature Range ................................................................................................ 11
10. AC & DC Operating Conditions...................................................................................................................................11
10.1 Recommended DC Operating Conditions (SSTL-15)............................................................................................11
11. AC & DC Input Measurement Levels ..........................................................................................................................12
11.1 AC & DC Logic Input Levels for Single-ended Signals.......................................................................................... 12
11.2 V
11.3 AC and DC Logic Input Levels for Differential Signals .......................................................................................... 15
11.3.2. Differential Swing Requirement for Clock (CK - CK
11.3.3. Single-ended Requirements for Differential Signals ...................................................................................... 17
11.3.4. Differential Input Cross Point Voltage ............................................................................................................ 18
11.4 Slew Rate Definition for Single Ended Input Signals .............................................................................................19
11.5 Slew rate definition for Differential Input Signals ................................................................................................... 19
12. AC & DC Output Measurement Levels ....................................................................................................................... 19
12.1 Single Ended AC and DC Output Levels............................................................................................................... 19
12.2 Differential AC and DC Output Levels ................................................................................................................... 19
16. Electrical Characteristics and AC timing .....................................................................................................................26
16.1 Refresh Parameters by Device Density................................................................................................................. 26
16.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin ................................................................ 26
16.3 Speed Bins and CL, tRCD, tRP, tRC and tRAS for corresponding Bin ................................................................. 26
16.3.1. Speed Bin Table Notes .................................................................................................................................. 28
17. Timing Parameters by Speed Grade ..........................................................................................................................30
• Programmable CAS Write Latency(CWL) = 5 (DDR3-800), 6 (DDR3-1066), 7 (DDR3-1333) and 8 (DDR3-1600)
• Burst Length: 8 (Interleave without any limit, sequential with starting address “000” only), 4 with tCCD = 4 which does not allow seamless read or
write [either On the fly using A12 or MRS]
SDRAM data strobes
(positive line of differential pair)
SDRAM differential data strobes
(negative line of differential pair)
SDRAM data masks/high data strobes
(x8-based x72 DIMMs)
SDRAM clocks
(positive line of differential pair)
SDRAM clocks
(negative line of differential pair)
V
DD
*
V
DDQ
V
REFDQ
V
REFCA
V
SS
V
DDSPD
TEST
RESETSet DRAMs Known State
EVENT
V
TT
RFUReserved for future use
2
I
C serial bus clock for EEPROM
2
I
C serial bus data line for EEPROM
2
I
C serial address select for EEPROM
SDRAM core power supply
SDRAM I/O Driver power supply
SDRAM I/O reference supply
SDRAM command/address reference supply
Power supply return (ground)
Serial EEPROM positive power supply
Used by memory bus analysis tools
(unused on memory DIMMs)
Reserved for optional temperature-sensing hardware
SDRAM I/O termination supply
NOTE :
* The V
** DM8, DQS8 and DQS
DD
and V
pins are tied common to a single power-plane on these designs.
DDQ
8 are for ECC UDIMM only.
6. SPD and Thermal Sensor for ECC UDIMMs
On DIMM thermal sensor will provide DRAM temperature readout through a integrated thermal sensor.
SCL
EVENT
NOTE :
1. Raw Cards D (1Rx8 ECC) and E (2Rx8 ECC) support a thermal sensor.
2. When the SPD and the thermal sensor are placed on the module, R1 is placed but R2 is not.
When only the SPD is placed on the module, R2 is placed but R1 is not.
[ Table 1 ] Temperature Sensor Characteristics
GradeRange
75 < Ta < 95-+/- 0.5+/- 1.0
B
40 < Ta < 125-+/- 1.0+/- 2.0-
-20 < Ta < 125-+/- 2.0+/- 3.0-
Resolution0.25°C /LSB-
R1
0 Ω
WP/EVENT
SA0SA1SA2
R2
0 Ω
SA0SA1SA2
Min.Typ . Max.
Temperature Sensor Accuracy
SDA
UnitsNOTE
-
°C
- 6 -
Rev. 1.0
Unbuffered DIMM
datasheetDDR3L SDRAM
7. Input/Output Functional Description
SymbolTy peFunction
CK0-CK1
CK
0-CK1
CKE0-CKE1SSTL
S
0-S1SSTL
, CAS, WESSTLRAS, CAS, and WE (ALONG WITH S) define the command being entered.
RAS
ODT0-ODT1SSTL
V
REFDQ
V
REFCA
V
DDQ
BA0-BA2SSTLSelects which SDRAM bank of eight is activated.
A0-A14SSTL
DQ0-DQ63
CB0-CB7
DM0-DM8
V
DD,VSS
DQS0-DQS8
DQS0-DQS8
SA0-SA2-
SDA-
SCL-
V
DDSPD
RESET
EVENT
NOTE :
1. DM8, DQS8 and DQS
1
SSTL
SupplyReference voltage for SSTL 15 I/O inputs.
SupplyReference voltage for SSTL 15 command/address inputs.
Supply
SSTLData and Check Bit Input/Output pins.
SSTL
Supply
1
SSTLData strobe for input and output data.
1
Supply
Output
8 are for ECC UDIMM only.
CK and CK
edge of CK and negative edge of CK
crossing)
Activates the SDRAM CK signal when high and deactivates the CK signal when low. By deactivating the clocks, CKE low
initiates the Power Down mode, or the Self-Refresh mode
Enables the associated SDRAM command decoder when low and disables the command decoder when high. When the
command decoder is disabled, new command are ignored but previous operations continue. This signal provides for
external rank selection on systems with multiple ranks.
When high, termination resistance is enabled for all DQ, DQS, DQS
Extended Mode Register Set (EMRS).
Power supply for the DDR3 SDRAM output buffers to provide improved noise immunity. For all current DDR3 unbuffered
DIMM designs, V
During a Bank Activate command cycle, Address input defines the row address (RA0-RA13)
During a Read or Write command cycle, Address input defines the column address, In addition to the column address,
AP is used to invoke autoprecharge operation at the end of the burst read or write cycle. If AP is high, autoprecharge is
selected and BA0, BA1, BA2 defines the bank to be precharged. If AP is low, autoprecharge is disabled. During a precharge command cycle, AP is used in conjunction with BA0, BA1, BA2 to control which bank(s) to precharge. If AP is
high, all banks will be precharged regardless of the state of BA0, BA1 or BA2. If AP is low, BA0, BA1 and BA2 are used
to define which bank to precharge. A12(BC
(on-the-fly) will be performed (HIGH, no burst chop; Low, burst chopped).
DM is an input mask signal for write data. Input data is masked when DM is sampled High coincident with that input data
during a write access. DM is sampled on both edges of DQS. Although DM pins are input only, the DM loading matches
the DQ and DQS loading.
Power and ground for DDR3 SDRAM input buffers, and core logic. V
these modules.
These signals and tied at the system planar to either V
range.
This bidirectional pin is used to transfer data into or out of the SPD EEPROM. An external resistor may be connected
from the SDA bus line to V
This signal is used to clock data into and out of the SPD EEPROM. An external resistor may be connected from the SCL
bus time to V
Power supply for SPD EEPROM. This supply is separate from the V
from 3.0V to 3.6V.
-The RESET pin is connected to the RESET pin on each DRAM. When low, all DRAMs are set to a know state.
This signal indicates that a thermal event has been detected in the thermal sensing device. The system should guarantee
the electrical level requirement is met for the EVENT
are differential clock inputs. All the DDR3 SDRAM addr/cntl inputs are sampled on the crossing of positive
. Output (read) data is reference to the crossing of CK and CK (Both directions of
shares the same power plane as VDD pins.
DDQ
) is sampled during READ and WRITE commands to determine if burst chop
or V
SS
to act as a pull-up on the system board.
DDSPD
to act as a pull-up on the system board.
DDSPD
pin on TS/SPD part
and DM pins, assuming the function is enabled in the
and V
DD
to configure the serial SPD EERPOM address
DDSPD
DD/VDDQ
pins are tied to VDD/V
DDQ
power plane. EEPROM supply is operable
planes on
DDQ
- 7 -
Rev. 1.0
Unbuffered DIMM
datasheetDDR3L SDRAM
7.1 Address Mirroring Feature
There is a via grid located under the DRAMs for wiring the CA sign
of the traces from the vias to the DRAMs places limitations on the bandwidth of the module. The shorter these traces, the higher the bandwidth. To extend
the bandwidth of the CA bus for DDR3 modules, a scheme was defined to reduce the length of these traces.
The pins on the DRAM are defined in a manner that allows for these short trace lengths. The CA bus pins in Columns 2 and 8, ignoring the mechanical
support pins, do not have any special functions (secondary functions). This allows the most flexibility with these pins. These are address pins A3, A4, A5,
A6, A7, A8 and bank address pins BA0 and BA1. Refer to Table . Rank 0 DRAM pins are wired straight, with no mismatch between the connector pin
assignment and the DRAM pin assignment. Some of the Rank 1 DRAM pins are cross wired as defined in the table. Pins not listed in the table are wired
straight.
7.1.1 DRAM Pin Wiring Mirroring
Connector Pin
A3A3A4
A4A4A3
A5A5A6
A6A6A5
A7A7A8
A8A8A7
BA0BA0BA1
BA1BA1BA0
Rank 0 Rank 1
als (address, bank address, command, and control lines) to the DRAM pins. The length
DRAM Pin
Figure 1illustrates the wiring in both the mirrored and non-mirrored case. The lengths of the traces to the DRAM pins, is obviously shorter. The via grid is smaller as well.
Figure 1. Wiring Differences for Mirrored and Non-Mirrored Addresses
Since the cross-wired pins have no secondary functions, there is no problem in normal operation. Any data written is read the same way. There are limitations however. When writing to the internal registers with a "load mode" operation, the specific address is required. See the DDR3 UDIMM SPD specification for these details. The controller must read the SPD and have the capability of de-mirroring the address when accessing the second rank.
SAMSUNG DDR3 dual rank UDIMM R/C B(2Rx8) and R/C E(2Rx8) Modules are using Mirrored Addresses mode.
- 8 -
Rev. 1.0
Unbuffered DIMM
datasheetDDR3L SDRAM
8. Function Block Diagram:
8.1 2GB, 256Mx72 ECC Module (Populated as 1 rank of x8 DDR3 SDRAMs)
S0
DQS0
DQS0
DM0
DMCS DQS DQS
DQS1
DQS1
DM1
DQS2
DQS2
DM2
DQS3
DQS3
DM3
DQS8
DQS8
DM8
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
I/O 0
I/O 1
D0
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D2
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D3
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D8
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
BA0 - BA2BA0-BA2 : SDRAMs D0 - D8
A0 - A15A0-A15 : SDRAMs D0 - D8
RAS
CAS
RAS : SDRAMs D0 - D8
CAS : SDRAMs D0 - D8
CKE0CKE : SDRAMs D0 - D8
WE
WE : SDRAMs D0 - D8
ODT0ODT : SDRAMs D0 - D8
CK0CK : SDRAMs D0 - D8
ZQ
ZQ
ZQ
ZQ
ZQ
V
DDSPDSPD
VDD/V
DDQ
V
REFDQ
V
SS
V
REFCA
D0 - D8
D0 - D8
D0 - D8
D0 - D8
DQS4
DQS4
DM4
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQS5
DQS5
DM5
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQS6
DQS6
DM6
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQS7
DQS7
DM7
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
Serial PD
SCL
EVENTEVENT
A0
SA0 SA1
NOTE :
1. For each DRAM, a unique ZQ resistor is connected to
ground. The ZQ resistor is 240 Ohm +/- 1%
2. Refer to "SPD and Thermal sensor for ECC UDIMMs"
for SPD detail.
DMCS DQS DQS
I/O 0
I/O 1
D4
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D5
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D6
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D7
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
A1
A2
SA2
ZQ
ZQ
ZQ
ZQ
SDA
- 9 -
Rev. 1.0
Unbuffered DIMM
datasheetDDR3L SDRAM
8.2 4GB, 512Mx72 ECC Module (Populated as 2 ranks of x8 DDR3 SDRAMs)
S1
S0
DQS0
DQS0
DM0
DMCS DQS DQS
I/O 0
I/O 1
D0
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D2
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D3
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D8
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DQS1
DQS1
DM1
DQS2
DQS2
DM2
DQS3
DQS3
DM3
DQS8
DQS8
DM8
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
BA0 - BA2BA0-BA2 : SDRAMs D0 - D17
A0 - A15A0-A15 : SDRAMs D0 - D17
CKE1CKE : SDRAMs D9 - D17
CKE0CKE : SDRAMs D0 - D8
RAS
CAS
WE
RAS : SDRAMs D0 - D17
CAS : SDRAMs D0 - D17
WE : SDRAMs D0 - D17
ODT0ODT : SDRAMs D0 - D8
ODT1ODT : SDRAMs D9 - D17
CK0CK : SDRAMs D0 - D8
CK1CK : SDRAMs D9 - D17
DMCS DQS DQS
I/O 0
I/O 1
D9
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
ZQ
ZQ
ZQ
ZQ
ZQ
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D10
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D11
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D12
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
D17
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
V
DDSPDSPD
V
DD/VDDQ
V
REFDQ
V
SS
V
REFCA
ZQ
ZQ
ZQ
ZQ
ZQ
DQS4
DQS4
DM4
DQS5
DQS5
DM5
DQS6
DQS6
DM6
DQS7
DQS7
DM7
D0 - D17
D0 - D17
D0 - D17
D0 - D17
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
DMCS DQS DQS
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
SCL
NOTE :
1. For each DRAM, a unique ZQ resistor is connected to
ground. The ZQ resistor is 240 Ohm +/- 1%
2. Refer to "SPD and Thermal sensor for ECC UDIMMs"
for SPD detail.
D4
D5
D6
D7
ZQ
ZQ
ZQ
ZQ
Serial PD
EVENTEVENT
A0
A1
SA0 SA1
DMCS DQS DQS
I/O 0
I/O 1
D13
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DMCS DQS DQS
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
ZQ
D14
ZQ
D15
ZQ
D16
ZQ
SDA
A2
SA2
- 10 -
Rev. 1.0
Unbuffered DIMM
datasheetDDR3L SDRAM
9. Absolute Maximum Ratings
9.1 Absolute Maximum DC Ratings
SymbolParameter RatingUnitsNOTE
V
DD
V
Voltage on V
DDQ
V
NOTE :
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions
for extended periods may affect reliability.
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to JESD51-2 standard.
3. VDD and V
equal to or less than 300mV.
Voltage on any pin relative to V
IN, VOUT
T
Storage Temperature -55 to +100°C 1, 2
STG
DDQ
Voltage on VDD pin relative to V
pin relative to V
DDQ
must be within 300mV of each other at all times;and V
SS
SS
SS
must be not greater than 0.6 x V
REF
9.2 DRAM Component Operating Temperature Range
SymbolParameterratingUnitNOTE
T
OPER
NOTE :
1. Operating Temperature T
JESD51-2.
2. The Normal Temperature Range specifies the temperatures where all DRAM specifications will be supported. During operation, the DRAM case temperature must be maintained between 0-85°C under all operating conditions
3. Some applications require operation of the Extended Temperature Range between 85°C and 95°C case temperature. Full specifications are guaranteed in this range, but the
following additional conditions apply:
a) Refresh commands must be doubled in frequency, therefore reducing the refresh interval tREFI to 3.9us. It is also possible to specify a component with 1X refresh (tREFI
to 7.8us) in the Extended Temperature Range.
b) If Self-Refresh operation is required in the Extended Temperature Range, then it is mandatory to either use the Manual Self-Refresh mode with Extended Temperature
Range capability (MR2 A6 = 0b and MR2 A7 = 1b), in this case IDD6 current can be increased around 10~20% than normal Temperature range.
is the case surface temperature on the center/top side of the DRAM. For measurement conditions, please refer to the JEDEC document
OPER
Operating Temperature Range 0 to 95°C1, 2, 3
-0.4 V ~ 1.975 VV 1,3
-0.4 V ~ 1.975 VV 1,3
-0.4 V ~ 1.975 VV 1
, When VDD and V
DDQ
are less than 500mV; V
DDQ
REF
may be
10. AC & DC Operating Conditions
10.1 Recommended DC Operating Conditions (SSTL-15)
SymbolParameterOperation Voltage
V
DD
V
DDQ
NOTE:
1. Under all conditions V
2. V
tracks with VDD. AC parameters are measured with VDD and V
DDQ
3. V
& V
DD
DDQ
Supply Voltage
Supply Voltage for Output
must be less than or equal to VDD.
DDQ
rating are determinied by operation voltage.
1.35V1.2831.351.45V1, 2, 3
1.5V1.4251.51.575V1, 2, 3
1.35V1.2831.351.45V1, 2, 3
1.5V1.4251.51.575V1, 2, 3
tied together.
DDQ
Min.Typ . Max.
Rating
UnitsNOTE
- 11 -
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