SEMICONDUCTOR TECHNICAL DATA
The MC10197 provides a high speed hex AND function with strobe
capability.
PD= 200 mW typ/pkg (No Load)
tpd= 2.8 ns typ (B–Q)
tpd= 3.8 ns typ (A–Q)
tr, tf= 2.5 ns typ (20%–80%)
LOGIC DIAGRAM
A
10
11
12
9
B
5
6
7
Q
2
3
4
13
14
15
V
= PIN 1
CC1
V
= PIN 16
CC2
VEE= PIN 8
CERAMIC PACKAGE
CASE 620–10
PLASTIC PACKAGE
CASE 648–08
FN SUFFIX
CASE 775–02
DIP
PIN ASSIGNMENT
16
V
A
OUT
B
OUT
C
OUT
CC1
A
B
C
V
EE
1
15
2
14
3
13
4
12
5
IN
11
6
IN
10
7
IN
8
L SUFFIX
P SUFFIX
PLCC
9
V
CC2
F
OUT
E
OUT
D
OUT
F
IN
E
IN
D
IN
COMMON
3/93
Motorola, Inc. 1996
TRUTH TABLE
Inputs
A B Q
L L L
L H L
H L L
H H H
Output
3–168
Pin assignment is for Dual–in–Line Package.
For PLCC pin assignment, see the Pin Conversion
T ables on page 6–11 of the Motorola MECL Data
Book (DL122/D).
REV 5
MC10197
ELECTRICAL CHARACTERISTICS
Test Limits
Pin
Characteristic Symbol
Power Supply Drain Current I
Input Current I
Output Voltage Logic 1 V
Output Voltage Logic 0 V
Threshold Voltage Logic 1 V
Threshold Voltage Logic 0 V
Switching Times (50Ω Load) ns
Propagation Delay t
Rise Time (20 to 80%) t
Fall Time (20 to 80%) t
inH
I
inL
OH
OL
OHA
OLA
5+2+
t
9+2+
2+
2–
E
Under
Test
8 54 39 49 54 mAdc
5
9
5 0.5 0.5 0.3 µAdc
2 –1.060 –0.890 –0.960 –0.810 –0.890 –0.700 Vdc
2 –1.890 –1.675 –1.850 –1.650 –1.825 –1.615 Vdc
2 –1.080 –0.980 –0.910 Vdc
2 –1.655 –1.630 –1.595 Vdc
2
2
2 1.1 4.7 1.1 2.5 4.5 1.1 5.0
2 1.1 4.7 1.1 2.5 4.5 1.1 5.0
–30°C +25°C +85°C
Min Max Min Typ Max Min Max
1.1
1.1
425
460
4.2
5.3
1.1
1.1
2.8
3.5
265
290
4.0
5.0
1.1
1.1
265
290
4.4
5.5
Unit
µAdc
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
@ Test Temperature V
–30°C –0.890 –1.890 –1.205 –1.500 –5.2
+25°C –0.810 –1.850 –1.105 –1.475 –5.2
+85°C –0.700 –1.825 –1.035 –1.440 –5.2
Pin
Characteristic Symbol
Power Supply Drain Current I
Input Current I
Output Voltage Logic 1 V
Output Voltage Logic 0 V
Threshold Voltage Logic 1 V
Threshold Voltage Logic 0 V
Switching Times (50Ω Load) +1.11V Pulse In Pulse Out –3.2 V +2.0 V
Propagation Delay t
Rise Time (20 to 80%) t
Fall Time (20 to 80%) t
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
inH
I
inL
OH
OL
OHA
OLA
5+2+
t
9+2+
2+
2–
E
Test
8 8 1, 16
5
9
5 5 8 1, 16
2 5, 9 8 1, 16
2 8 1, 16
2 9 5 8 1, 16
2 9 5 8 1, 16
2
2
2 9 5 2 8 1, 16
2 9 5 2 8 1, 16
IHmax
er
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
V
IHmax
5
9
V
ILmin
V
ILmin
V
IHAminVILAmax
V
IHAminVILAmax
9
5
5
9
2
2
V
EE
V
EE
8
8
8
8
Gnd
1, 16
1, 16
1, 16
1, 16
DL122 — Rev 6
3–169 MOTOROLAMECL Data