Datasheet STH8NB90FI Datasheet (SGS Thomson Microelectronics)

Page 1
STW8NB90
STH8NB90FI
N-CHANNEL 900V - 1.1 - 8 A TO-24 7/ISO WATT218
PowerMesh™ MOSFET
TYPE V
DSS
R
DS(on)
I
D
STW8NB90 900 V < 1.45 8 A STH8NB90FI 900 V < 1.45 5 A
TYPICAL R
100% AVALANCHE TESTED
VERY LOW INTRINSIC CAPAC ITANCES
GATE CHARGE MINIMIZED
(on) = 1.1
DS
DESCRIPTION
Using the latest high voltage MESH OVERLAY™ process, STMicroelectronics has designed an ad­vanced family of power MOSFETs with outstanding performances. The new patent pending strip layout coupled with the Company’s proprieraty edge termi­nation structure, gives the lowest R
DS(on)
per area, exceptional avalanche and dv/dt capabilities and unrivalled gate charge and switching characteris­tics.
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITH MODE POWER SUPPLI ES ( SMPS)
DC-AC CONVERTERS FOR WELDING
EQUIPMENT
3
2
1
TO-247 ISOWATT218
INTERNAL SCHEMATIC DIAGRAM
3
2
1
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
STW8NB90 STH8NB90FI
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
dv/dt (1) Peak Diode Recovery voltage slope 4 V/ns
V
ISO
T
stg
T
j
(•)Pu l se width limi te d by safe oper ating area
8 A, di/dt 200A/µs, VDD V
(1)I
SD
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 k)
900 V 900 V
Gate- source Voltage ±30 V
Drain Current (continuos) at TC = 25°C Drain Current (continuos) at TC = 100°C
()
Drain Current (pulsed) 32 20 A Total Dissipation at TC = 25°C
85A 53A
200 80 W
Derating Factor 1.6 0.64 W/°C
Insulation Withstand Voltage (DC) - 2500 V Storage Temperature –65 to 150 °C Max. Operating Junction Temperature 150 °C
, Tj T
(BR)DSS
JMAX.
1/9July 2001
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STW8NB90 - STH8NB90FI
THERMA L D ATA
TO-247 ISOWATT218
Rthj-case Thermal Resistance Junction-case Max 0.625 1.56 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 30 °C/W
T
l
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
AS
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
Maximum Lead Temperature For Soldering Purpose 300 °C
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
Drain-source
= 25 °C, ID = IAR, VDD = 50 V)
j
ID = 250 µA, VGS = 0 900 V
8A
700 mJ
Breakdown Voltage Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
V
= Max Rating
DS
V
= Max Rating, TC = 125 °C
DS
V
= ±30V ±100 nA
GS
A
50 µA
ON (1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
= VGS, ID = 250 µA
DS
VGS = 10 V, ID = 4 A
345V
1.1 1.45
Resistance
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS > I
g
fs
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 225 pF Reverse Transfer
Capacitance
ID=4 A
V
DS
D(on)
x R
DS(on)max,
= 25V, f = 1 MHz, VGS = 0
8S
2120 pF
23 pF
2/9
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STW8NB90 - STH8NB90FI
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
d(on)
Q Q Q
t
r
g gs gd
Turn-on Delay Time Rise Time 12 ns Total Gate Charge
Gate-Source Charge 12.5 nC Gate-Drain Charge 18 nC
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
r(Voff)
t
t
f
c
Off-voltage Rise Time Fall Time 15 ns Cross-over Time 31 ns
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD (1)
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pu l se duration = 300 µs, duty cycle 1.5 %.
2. Pulse width li mited by safe operating area.
Source-drain Current 8 A
(2)
Source-drain Current (pulsed) 32 A Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge 6.3 µC Reverse Recovery Current 18 A
= 450 V, ID = 3.5 A
DD
RG= 4.7 VGS = 10 V (see test circuit, Figure 3)
V
= 400V, ID = 9A,
DD
VGS = 10V
V
= 720V, ID = 7.4 A,
DD
RG=4.7Ω, V
GS
= 10V
(see test circuit, Figure 5)
ISD = 8 A, VGS = 0 I
= 7.4 A, di/dt = 100A/µs,
SD
VDD = 100V, Tj = 150°C (see test circuit, Figure 5)
25 ns
46 72 nC
22 ns
1.6 V
700 ns
Safe Operating Area for ISOWATT 218Safe Operating Area for TO-247
3/9
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STW8NB90 - STH8NB90FI
Thermal Impedence for TO-247 Thermal Impedence for ISOWATT218
Output Characteristics
Transfer Characteristics
Static Drain-source On ResistanceTransconductanc e
4/9
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STW8NB90 - STH8NB90FI
Capacitance VariationsGate Charge vs Gate-source Voltage
Normalized Gate Thereshold Voltage vs Temp. Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/9
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STW8NB90 - STH8NB90FI
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
Fig. 4: Gate Charge test Circuit
6/9
Page 7
TO-247 MECHANICAL DATA
STW8NB90 - STH8NB90FI
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.7 5.3 0.185 0.209 D 2.2 2.6 0.087 0.102 E 0.4 0.8 0.016 0.031
F 1 1.4 0.039 0.055 F3 2 2.4 0.079 0.094 F4 3 3.4 0.118 0.134
G 10.9 0.429
H 15.3 15.9 0.602 0.626
L 19.7 20.3 0.776 0.779 L3 14.2 14.8 0.559 0.582 L4 34.6 1.362 L5 5.5 0.217
M 2 3 0.079 0.118
mm inch
P025P
7/9
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STW8NB90 - STH8NB90FI
ISOWATT218 MECHANICAL DATA
DIM.
A 5.35 5.65 0.211 0.222
C 3.30 3.80 0.130 0.150
D 2.90 3.10 0.114 0.122 D1 1.88 2.08 0.074 0.082
E 0.75 0.95 0.030 0.037
F 1.05 1.25 0.041 0.049 F2 1.50 1.70 0.059 0.067 F3 1.90 2.10 0.075 0.083
G 10.80 11.20 0.425 0.441
H 15.80 16.20 0.622 0.638
L 9 0.354 L1 20.80 21.20 0.819 0.835 L2 19.10 19.90 0.752 0.783 L3 22.80 23.60 0.898 0.929 L4 40.50 42.50 1.594 1.673 L5 4.85 5.25 0.191 0.207 L6 20.25 20.75 0.797 0.817
N 2.1 2.3 0.083 0.091
R 4.6 0.181
DIA 3.5 3.7 0.138 0.146
MIN. TYP. MAX. MIN. TYP. MAX.
mm inch
8/9
- Weight : 4.9 g (typ.)
- Maximum Torque (applied to mounting flange) Recommended: 0.8 Nm; Maximum: 1 Nm
- The side of the dissipator must be flat within 80 µm
P025C/A
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STW8NB90 - STH8NB90FI
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such informa tion n or for an y infring ement of patent s or other rig hts of third part ies which may resu lt from its use . No l i cen se i s granted by implication or otherwise under any patent or patent rights of ST Microelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical compo nents in life support devices or systems without express written approval of STMicroelectronics.
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