REV. A
–2–
OP285–SPECIFICATIONS
(@ Vs = 15.0 V, TA = 25C, unless otherwise noted.)
Parameter Symbol Conditions Min Typ Max Unit
INPUT CHARACTERISTICS
Offset Voltage V
OS
35 250 µV
V
OS
–40°C ≤ TA ≤ +85°C 600 µV
Input Bias Current I
B
VCM = 0 V 100 350 nA
I
B
VCM = 0 V, –40°C ≤ TA ≤ +85°C 400 nA
Input Offset Current I
OS
VCM = 0 V 2 ±50 nA
I
OS
VCM = 0 V, –40°C ≤ TA ≤ +85°C2±100 nA
Input Voltage Range V
CM
–10.5 10.5 V
Common-Mode Rejection CMRR V
CM
= ±10.5 V,
–40°C ≤ T
A
≤ +85°C 80 106 dB
Large-Signal Voltage Gain A
VO
RL = 2 kΩ 250 V/mV
A
VO
RL = 2 kΩ, –40°C ≤ TA ≤ +85°C 175 V/mV
A
VO
RL = 600 Ω 200 V/mV
Common-Mode Input Capacitance 7.5 pF
Differential Input Capacitance 3.7 pF
Long-Term Offset Voltage ∆V
OS
Note 1 300 µV
Offset Voltage Drift ∆V
OS
/∆T1µV/°C
OUTPUT CHARACTERISTICS
Output Voltage Swing V
O
RL = 2 kΩ –13.5 +13.9 +13.5 V
V
O
RL = 2 kΩ, –40°C ≤ TA ≤ +85°C –13 +13.9 +13 V
RL = 600 Ω, V
S
= ±18 V –16/+14 V
POWER SUPPLY
Power Supply Rejection Ratio PSRR V
S
= ±4.5 V to ±18 V 85 111 dB
PSRR V
S
= ±4.5 V to ±18 V,
–40°C ≤ T
A
≤ +85°C80 dB
Supply Current I
SY
VS = ±4.5 V to ±18 V, VO = 0 V,
R
L
= x, –40°C ≤ TA ≤ +85°C45mA
I
SY
VS = ±22 V, VO, = 0 V, RL = x
–40°C ≤ T
A
≤ +85°C 5.5 mA
Supply Voltage Range VS ±4.5 ± 22 V
DYNAMIC PERFORMANCE
Slew Rate SR R
L
= 2 kΩ 15 22 V/µs
Gain Bandwidth Product GBP 9 MHz
Phase Margin o 62 Degrees
Settling Time t
s
To 0.1%, 10 V Step 625 ns
t
s
To 0.01%, 10 V Step 750 ns
Distortion A
V
= 1, V
OUT
= 8.5 V p-p,
f = 1 kHz, R
L
= 2 kΩ –104 dB
Voltage Noise Density e
n
f = 30 Hz 7 nV/√Hz
e
n
f = 1 kHz 6 nV/√Hz
Current Noise Density i
n
f = 1 kHz 0.9 pA/√Hz
Headroom THD + Noise ≤ 0.01%,
RL = 2 kΩ, VS = ±18 V >12.9 dBu
NOTE
1
Long-term offset voltage is guaranteed by a 1,000 hour life test performed on three independent wafer lots at 125 °C, with an LTPD of 1.3.
Specifications subject to change without notice.