Low Distortion: 0.0006%
High Slew Rate: 22 V/s
Wide Bandwidth: 9 MHz
Low Supply Current: 5 mA
Low Offset Voltage: 1 mV
Low Offset Current: 2 nA
Unity Gain Stable
SOIC-8 Package
APPLICATIONS
High Performance Audio
Active Filters
Fast Amplifiers
Integrators
GENERAL DESCRIPTION
The OP275 is the first amplifier to feature the Butler Amplifier
front-end. This new front-end design combines both bipolar
and JFET transistors to attain amplifiers with the accuracy and
low noise performance of bipolar transistors, and the speed and
sound quality of JFETs. Total Harmonic Distortion plus Noise
equals that of previous audio amplifiers, but at much lower supply currents.
A very low l/f corner of below 6 Hz maintains a flat noise density
response. Whether noise is measured at either 30 Hz or 1 kHz,
it is only 6 nV/√
the OP275 its high slew rates to keep distortion low, even when
large output swings are required, and the 22 V/µs slew rate of
the OP275 is the fastest of any standard audio amplifier. Best of
all, this low noise and high speed are accomplished using less
than 5 mA of supply current, lower than any standard audio
amplifier.
Hz. The JFET portion of the input stage gives
Operational Amplifier
OP275*
PIN CONNECTIONS
8-Lead Narrow-Body SO8-Lead Epoxy DIP
(S Suffix)(P Suffix)
Improved dc performance is also provided with bias and offset
currents greatly reduced over purely bipolar designs. Input offset voltage is guaranteed at 1 mV and is typically less than
200 µV. This allows the OP275 to be used in many dc coupled
or summing applications without the need for special selections
or the added noise of additional offset adjustment circuitry.
The output is capable of driving 600 Ω loads to 10 V rms while
maintaining low distortion. THD + Noise at 3 V rms is a low
0.0006%.
The OP275 is specified over the extended industrial (–40°C to
+85°C) temperature range. OP275s are available in both plastic
DIP and SOIC-8 packages. SOIC-8 packages are available in
2500 piece reels. Many audio amplifiers are not offered in
SOIC-8 surface mount packages for a variety of reasons; however, the OP275 was designed so that it would offer full performance in surface mount packaging.
*Protected by U.S. Patent No. 5,101,126.
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood. MA 02062-9106, U.S.A.
Tel: 617/329-4700Fax: 617/326-8703
(@ VS = ⫾15.0 V, TA = +25ⴗC unless otherwise noted)
Parameter␣ SymbolConditionsMinTypMaxUnits
AUDIO PERFORMANCE␣
THD + NoiseV
Voltage Noise Densitye
n
= 3 V rms,
IN
R
= 2 kΩ, f = 1 kHz0.006%
L
f = 30 Hz7nV/√Hz
f = 1 kHz6nV/√
Current Noise Densityi
n
f = 1 kHz1.5pA/√Hz
HeadroomTHD + Noise ≤ 0.01%,
R
= 2 kΩ, VS = ±18 V>12.9dBu
L
INPUT CHARACTERISTICS␣
Offset VoltageV
Input Bias CurrentI
Input Offset CurrentI
Input Voltage RangeV
OS
B
OS
CM
Common-Mode Rejection RatioCMRRV
Large Signal Voltage GainA
VO
–40°C ≤ T
≤ +85°C1.25mV
A
VCM = 0 V100350nA
V
= 0 V, –40°C ≤ TA ≤ +85°C100400nA
CM
VCM = 0 V250nA
= 0 V, –40°C ≤ TA ≤ +85°C2100nA
V
CM
–10.5+10.5V
= ±10.5 V,
CM
–40°C ≤ T
R
= 2 kΩ250V/mV
L
R
= 2 kΩ, –40°C ≤ TA ≤ +85°C175V/mV
L
= 600 Ω200V/mV
R
L
≤ +85°C80106dB
A
1mV
Offset Voltage Drift∆VOS/∆T2µV/°C
Hz
OUTPUT CHARACTERISTICS␣
R
Output Voltage SwingV
O
= 2 kΩ–13.5±13.9+13.5V
L
= 2 kΩ, –40°C ≤ TA ≤ +85°C–13±13.9+13V
R
L
R
= 600 Ω, VS = ±18 V+14, –16V
L
POWER SUPPLY␣
Power Supply Rejection RatioPSRRV
Supply CurrentI
Supply Voltage RangeV
SY
S
= ±4.5 V to ±18 V85111dB
S
V
= ±4.5 V to ±18 V,
S
–40°C ≤ T
V
= ±4.5 V to ±18 V, V
S
R
= ∞, –40°C ≤ TA ≤ +85°C45mA
L
= ±22 V, V
V
S
–40°C ≤ T
≤ +85°C80dB
A
= 0 V, R
O
≤ +85°C5.5mA
A
= 0 V,
O
= ∞,
L
±4.5±22V
DYNAMIC PERFORMANCE␣
Slew RateSRR
Full-Power BandwidthBW
P
= 2 kΩ1522V/µs
L
Gain Bandwidth ProductGBP9MHz
Phase Marginø
m
Overshoot FactorV
Specifications subject to change without notice.
= 100 mV, AV = +1,
IN
R
= 600 Ω, C
L
= 100 pF10%
L
62Degrees
kHz
–2–
REV. A
OP275
WARNING!
ESD SENSITIVE DEVICE
WAFER TEST LIMITS
(@ VS = ⴞ15.0 V, TA = +25ⴗC unless otherwise noted)
Parameter SymbolConditionsLimitUnits
Offset VoltageV
Input Bias CurrentI
Input Offset CurrentI
Input Voltage Range
1
OS
B
OS
V
CM
Common-Mode Rejection RatioCMRRV
VCM = 0 V350nA max
VCM = 0 V50nA max
= ±10.5 V80dB min
CM
1mV max
±10.5V min
Power Supply Rejection RatioPSRRV = ±4.5 V to ±18 V85dB min
R
Large Signal Voltage GainA
Output Voltage RangeV
Supply CurrentI
NOTES
Electrical tests and wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard
product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
Absolute maximum ratings apply to both DICE and packaged parts, unless
otherwise noted.
2
For supply voltages greater than ±22 V, the absolute maximum input voltage is
equal to the supply voltage.
3
Shorts to either supply may destroy the device. See data sheet for full details.
4
θJA is specified for the worst case conditions, i.e., θ
for cerdip, P-DIP, and LCC packages; θ
board for SOIC package.
JA
is specified for device in socket
JA
is specified for device soldered in circuit
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the OP275 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
REV. A
Die Size 0.070 × 0.108 in. (7,560 sq. mils)
Substrate is connected to V–
–3–
OP275–Typical Performance Curves
FREQUENCY – Hz
1M10M
10k100k
PHASE – Degrees
180
135
–180
90
45
0
–45
–90
–135
40
30
–40
20
10
0
–10
–20
–30
GAIN – dB
VS = ±15V
T
A
= +25°C
FREQUENCY – Hz
100
80
–60
1k10k100M
100k1M10M
60
40
20
0
–20
–40
0
PHASE – Degrees
45
90
135
180
225
270
VS = ±15V
R
L
= 2kΩ
T
A
= +25°C
OPEN-LOOP GAIN – dB
GAIN
PHASE
Øm= 58°
25
TA = +25°C
20
R
= 2kΩ
L
15
10
5
0
–5
–10
–15
OUTPUT VOLTAGE SWING – V
–20
–25
0±5±25
±10±15±20
SUPPLY VOLTAGE – V
+VOM
–VOM
Output Voltage Swing vs. Supply
Voltage
MARKER 15 309.059Hz
MAG (A/H) 60.115dB
60
50
40
30
20
MARKER 15 309.058Hz
PHASE (A/R 90.606Deg
10
GAIN – dB
0
–10
–20
10k100k
VS = ±15V
TA = +25°C
135
90
45
0
–45
–90
1M10M
FREQUENCY – Hz
OPEN-LOOP GAIN – V/mV
Open-Loop Gain vs. Temperature
PHASE – Degrees
1500
VS = ±15V
= ±10V
V
O
1250
1000
750
+GAIN
= 600Ω
R
L
500
250
0
–50 –25100
50
40
A
30
20
A
10
0
A
–10
CLOSED-LOOP GAIN – dB
–20
–30
1k10k100M
0255075
TEMPERATURE – °C
= +100
VCL
= +10
VCL
= +1
VCL
100k1M10M
FREQUENCY – Hz
–GAIN
= 600Ω
R
L
+GAIN
R
L
–GAIN
= 2kΩ
R
L
= 2kΩ
VS = ±15V
= +25°C
T
A
Closed-Loop Gain and Phase, AV = +1
60
VS = ±15V
50
= +25°C
T
A
40
30
20
IMPEDANCE – Ω
10
0
1001k10M
A
VCL
FREQUENCY – Hz
A
= +1
VCL
A
= +10
VCL
= +100
10k100k1M
Open-Loop Gain, Phase vs. Frequency
120
100
80
60
40
20
COMMON-MODE REJECTION – dB
0
1001k10M10k100k1M
FREQUENCY – Hz
VS = ±15V
T
Common-Mode Rejection vs.
Frequency
= +25°C
A
Closed-Loop Gain vs. Frequency
120
100
80
VS = ±15V
= +25°C
T
A
60
40
20
POWER SUPPLY REJECTION – dB
0
101001M
1k10k100k
FREQUENCY – Hz
+PSRR
–PSRR
Power Supply Rejection vs.
Frequency
–4–
Closed-Loop Output Impedance vs.
Frequency
Open-Loop Gain, Phase vs. Frequency
REV. A
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