Very low noise density of 5 nV/√Hz at 1 kHz maximum
Excellent input offset voltage of 75 μV maximum
Low offset voltage drift of 1 μV/°C maximum
Very high gain of 1500 V/mV minimum
Outstanding CMR of 106 dB minimum
Slew rate of 2.4 V/μs typical
Gain bandwidth product of 5 MHz typical
Industry-standard 8-lead dual pinout
GENERAL DESCRIPTION
The OP270 is a high performance, monolithic, dual operational
amplifier with exceptionally low voltage noise density (5 nV/√Hz
maximum at 1 kHz). It offers comparable performance to the
industry-standard OP27 from Analog Devices, Inc.
The OP270 features an input offset voltage of less than 75 μV
and an offset drift of less than 1 μV/°C, guaranteed over the full
military temperature range. Open-loop gain of the OP270 is more
than 1,500,000 into a 10 kΩ load, ensuring excellent gain accuracy
and linearity, even in high gain applications. The input bias
current is less than 20 nA, which reduces errors due to signal
source resistance. With a common-mode rejection (CMR) of
greater than 106 dB and a power supply rejection ratio (PSRR)
of less than 3.2 μV/V, the OP270 significantly reduces errors
due to ground noise and power supply fluctuations. The power
consumption of the dual OP270 is one-third less than two OP27
Operational Amplifier
OP270
FUNCTIONAL BLOCK DIAGRAMS
1
–IN A
2
+IN A
NC
3
V–
4
OP270
5
NC
+IN B
6
–IN B
7
8
NC
NC = NO CONNECT
Figure 1. 16-Lead SOIC
(S-Suffix)
OUT A
1
AB
2
–IN A
3
+IN A
4
V–
OP270
Figure 2. 8-Lead PDIP (P-Suffix)
8-Lead CERDIP
(Z-Suffix)
devices, a significant advantage for power conscious applications.
The OP270 is unity-gain stable with a gain bandwidth product
of 5 MHz and a slew rate of 2.4 V/μs.
The OP270 offers excellent amplifier matching, which is
important for applications such as multiple gain blocks, low
noise instrumentation amplifiers, dual buffers, and low noise
active filters.
The OP270 conforms to the industry-standard 8-lead DIP
pinout. It is pin compatible with the MC1458, SE5532/A,
RM4558, and HA5102 dual op amps, and can be used to
upgrade systems using those devices.
For higher speed applications, the ADA4004-2 or the AD8676 are
recommended. For a quad op amp, see the OP470 data sheet.
16
15
14
13
12
11
10
9
8
7
6
5
OUT A
NC
NC
V+
NC
NC
OUT B
NC
V+
OUT B
–IN B
+IN B
00325-001
00325-002
Rev. E
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
VS = ±15 V, −40°C ≤ TA ≤ 85°C, unless otherwise noted.
Table 2.
OP270E OP270F OP270G
Parameter Symbol Test Conditions
Input Offset Voltage VOS 25 150 45 275 100 400 μV
TCV
Average Input Offset
0.2 1 0.4 2 0.7 3 μV/°C
OS
Voltage Drift
Input Offset Current IOS V
Input Bias Voltage IB V
Large-Signal Voltage Gain AVO
A
Input Voltage Range
1
VO
IVR ±12 ±12.5 ±12 ±12.5 ±12 ±12.5 V
Output Voltage Swing VO R
= 0 V 1.5 30 5 40 15 50 nA
CM
= 0 V 6 60 15 70 19 80 nA
CM
= ±10 V,
V
O
= 10 kΩ
R
L
= ±10 V,
V
O
R
= 2 kΩ
L
≥ 2 kΩ ±12 ±13.5 ±12 ±13.5 ±12 ±13.5 V
L
1000 1800 600 1400 400 1250 V/mV
500 900 300 700 225 670 V/mV
Common-Mode Rejection CMR VCM = ±11 V 100 120 94 115 90 100 dB
Power Supply Rejection
PSRR V
= ±4.5 V to ±18 V 0.7 5.6 1.8 10 2.0 1.5 μV/V
S
Ratio
No load 4.4 7.2 4.4 7.2 4.4 7.2 mA
Supply Current
I
SY
(All Amplifiers)
1
Guaranteed by CMR test.
Unit Min Typ Max Min Typ Max Min Typ Max
Rev. E | Page 4 of 20
OP270
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating
Supply Voltage 18 V
Differential Input Voltage1 1.0 V
Differential Input Current1 ±25 mA
Input Voltage Supply voltage
Output Short-Circuit Duration Continuous
Storage Temperature Range −65°C to +150°C
Lead Temperature Range (Soldering, 60 sec) 300°C
Junction Temperature (TJ) −65°C to +150°C
Operating Temperature Range −40°C to +85°C
1
The OP270 inputs are protected by back-to-back diodes. To achieve low noise
performance, current-limiting resistors are not used. If the differential voltage
exceeds +10 V, the input current should be limited to ±25 mA.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
For military processed devices, refer to the Standard Microcircuit Drawing (SMD) available at the Defense Logistics
Agency website.
Table 4. Analog Devices Equivalent to SMD
SMD Part Number Analog Devices Equivalent
5962-8872101PA OP270AZMDA
ESD CAUTION
Rev. E | Page 5 of 20
OP270
TYPICAL PERFORMANCE CHARACTERISTICS
VOLTAGE NOISE DENSITY (nV/√Hz)
10
9
8
7
6
5
4
3
2
TA = 25°C
V
= ±15V
S
1/f CORNER = 5Hz
CURRENT NOISE DE NSITY (pA/ √Hz)
10
1
TA = 25°C
V
= ±15V
S
1/f CORNER = 200Hz
1
1101001k
FREQUENCY (Hz)
Figure 3. Voltage Noise Density vs. Frequency
5
TA = 25°C
4
AT 10kHz
3
2
VOLTAGE NOISE DENSITY (nV/√Hz)
1
0 ±5 ±10 ±15 ±20
SUPPLY VOLTAGE (V)
AT 1kHz
Figure 4. Voltage Noise Density vs. Supply Voltage
0.1Hz TO 10Hz NOISE
00352-004
0.1
101001k10k
FREQUENCY (Hz)
00352-007
Figure 6. Current Noise Density vs. Frequency
40
VS = ±15V
30
20
10
0
VOLTAGE (µV)
–10
–20
00352-005
–30
–75–50–252550751001250
TEMPERATURE (° C)
00352-008
Figure 7. Input Offset Voltage vs. Temperature
5
TA = 25°C
V
= ±15V
S
4
NOISE VO LTAGE ( 100nV/DIV )
TA = 25°C
T
= ±15V
S
TIME (1 sec/DIV)
Figure 5. 0.1 Hz to 10 Hz Input Voltage Noise
00352-006
Rev. E | Page 6 of 20
3
2
1
CHANGE IN OFF SET VOL TAGE (µA)
0
02341
TIME (Minutes)
Figure 8. Warm-Up Offset Voltage Drift
00352-009
5
OP270
7
VS = ±15V
V
= 0V
CM
6
5
4
INPUT BIAS CURRENT (nA)
3
2
–75–50–252550751001250
TEMPERATURE (° C)
Figure 9. Input Bias Current vs. Temperature
00352-010
130
120
110
100
90
80
70
60
CMR (dB)
50
40
30
20
10
1101k10k100k1M100
FREQUENCY (Hz)
Figure 12. CMR vs. Frequency
TA = 25°C
V
= ±15V
S
00352-013
5
VS = ±15V
V
= 0V
CM
4
3
2
INPUT OFFSET CURRENT (nA)
1
0
–75–50–252550751001250
TEMPERATURE (° C)
Figure 10. Input Offset Current vs. Temperature
7
TA = +25°C
V
= ±15V
S
6
5
4
6
5
4
+125°C
+25°C
3
TOTAL SUPPLY CURRENT (mA)
00352-011
2
–55°C
00352-014
0 ±5 ±10 ±15 ±20
SUPPLY VOLTAGE (V)
Figure 13. Total Supply Current vs. Supply Voltage
8
VS = ±15V
7
6
5
4
3
INPUT BIAS CURRENT (nA)
3
2
–10.0–5. 005.0
–12.5–7. 5–2.52.5
COMMON-MODE VOLTAGE (V)
7.512.5
Figure 11. Input Bias Current vs. Common-Mode Voltage
10.0
00352-012
Rev. E | Page 7 of 20
2
TOTAL SUPPLY CURRENT (mA)
1
0
–75–50–252550751001250
TEMPERATURE (° C)
Figure 14. Total Supply Current vs. Temperature
00352-015
OP270
= ±15V
80
100
120
140
160
180
PHASE SHIF T (Degrees)
00352-019
140
120
100
80
60
PSR (dB)
40
20
0
1101k10k100k1M10M100M100
140
120
100
80
–PSR
+PSR
FREQUENCY (Hz)
Figure 15. PSR vs. Frequency
TA = 25°C
TA = 25°C
V
= ±15V
S
25
20
15
10
5
0
OPEN-LOOP GAIN (dB)
–5
00352-016
–10
12345678910
FREQUENCY (MHz )
PHASE
MARGIN = 62°
GAIN
PHASE
TA = 25°C
V
S
Figure 18. Open-Loop Gain and Phase Shift vs. Frequency
5000
4000
3000
60
40
OPEN-LOOP GAIN (dB)
20
0
1101k10k100k1M10M100M100
FREQUENCY (Hz)
Figure 16. Open-Loop Gain vs. Frequency
80
60
40
20
CLOSED-LOOP GAIN (dB)
0
–20
1k10k100k1M10M
FREQUENCY (Hz)
Figure 17. Closed-Loop Gain vs. Frequency
TA = 25°C
V
= ±15V
S
2000
OPEN-LOOP GAIN (V/mA)
1000
00352-017
0
0 ±5 ±10 ±15 ±20 ±25
SUPPLY VOLTAGE (V)
00352-020
Figure 19. Open-Loop Gain vs. Supply Voltage
80
8
70
60
50
PHASE MARGIN ( Degrees)
00352-018
40
–75–50–252550751001251500
Ф
GBP
TEMPERATURE (° C)
7
6
5
GAIN BANDWIDTH P RODUCT (MHz)
4
00352-021
Figure 20. Phase Margin and Gain Bandwidth Product vs. Temperature
Rev. E | Page 8 of 20
OP270
28
24
20
16
12
8
MAXIMUM OUTPUT SWING (V)
4
TA = 25°C
V
= ±15V
S
THD = 1%
100
TA = 25°C
V
= ±15V
S
A
= 1
75
50
A
= 100
V
OUTPUT IMPEDANCE (Ω)
25
A
= 10
V
V
0
1k10k100k1M10M
FREQUENCY (Hz)
Figure 21. Maximum Output Swing vs. Frequency
15
TA = 25°C
V
= ±15V
14
S
13
12
11
10
9
8
7
MAXIMUM OUTPUT VOLTAGE (V)
6
5
1001k10k
POSITIVE
SWING
NEGATIVE
SWING
LOAD RESIST ANCE (Ω)
Figure 22. Maximum Output Voltage vs. Load Resistance
50
TA = 25°C
V
= ±15V
S
V
= 100mV
IN
A
= +1
40
V
30
20
10
SMALL-SIGNAL OVERSHOOT (%)
0
02004006008001000
CAPACITIVE L OAD (pF)
Figure 23. Small-Signal Overshoot vs. Capacitive Load
00352-022
0
1k10k100k1M10M
FREQUENCY (Hz)
00352-025
Figure 24. Output Impedance vs. Frequency
2.8
VS = ±15V
2.7
2.6
2.5
2.4
SLEW RATE (V/µs)
2.3
00352-023
2.2
–75–50–252550751001250
TEMPERATURE (° C)
–SR
+SR
00352-026
Figure 25. Slew Rate vs. Temperature
190
180
170
160
150
140
130
120
110
100
CHANNEL SEPARATIO N (dB)
90
TA = 25°C
V
= ±15V
S
80
V
= 20V p-p TO 10kHz
00352-024
O
70
1101k10k100k1M100
00352-027
FREQUENCY (Hz)
Figure 26. Channel Separation vs. Frequency
Rev. E | Page 9 of 20
OP270
0.1
TA = 25°C
V
= ±15V
S
V
= 20V p-p
O
R
= 2kΩ
L
AV = 10
0.01
AV = 1
TOTAL HARMO NIC DISTO RTION (%)
0.001
101001k10k
FREQUENCY (Hz)
Figure 27. Total Harmonic Distortion vs. Frequency
TA = 25°C
V
= ±15V
S
A
= +1
V
R
= 2kΩ
L
00352-028
TA = 25°C
V
= ±15V
S
A
= +1
V
R
= 2kΩ
L
50mV200ns
Figure 29. Small-Signal Transient Response
00352-030
5V20µs
00352-029
Figure 28. Large-Signal Transient Response
Rev. E | Page 10 of 20
OP270
V
TEST CIRCUITS
5kΩ
500Ω
1/2
OP270
5kΩ
50Ω
1/2
OP270
CHANNEL SEPARATION = 20 LOG
Figure 30. Channel Separation Test Circuit
+18
20V
V
1
p-p
V
2
V
1
V2/1000
00325-031
1/2
OP270
1/2
OP270
–18V
8
1
7
4
00325-032
100kΩ
200kΩ
100kΩ
2
3
6
5
Figure 31. Burn-In Circuit
Rev. E | Page 11 of 20
OP270
√
√
APPLICATIONS INFORMATION
VOLTAGE AND CURRENT NOISE
The OP270 is a very low noise dual op amp, exhibiting a typical
voltage noise density of only 3.2 nV/√Hz at 1 kHz. Because the
voltage noise is inversely proportional to the square root of the
collector current, the exceptionally low noise characteristic of
the OP270 is achieved in part by operating the input transistors
at high collector currents. Current noise, however, is directly
proportional to the square root of the collector current. As a
result, the outstanding voltage noise density performance of the
OP270 is gained at the expense of current noise performance,
which is normal for low noise amplifiers.
To obtain the best noise performance in a circuit, it is vital to
understand the relationships among voltage noise (e
noise (i
), and resistor noise (et).
n
), current
n
TOTAL NOISE AND SOURCE RESISTANCE
The total noise of an op amp can be calculated by
222
)()()(
eRieE++=
tsnnn
where:
E
is the total input-referred noise.
n
e
is the op amp voltage noise.
n
i
is the op amp current noise.
n
e
is the source resistance thermal noise.
t
R
is the source resistance.
S
The total noise is referred to the input and at the output is
amplified by the circuit gain.
Figure 32 shows the relationship between total noise at 1 kHz
and source resistance. When R
is dominated by the voltage noise of the OP270. As R
above 1 kΩ, total noise increases and is dominated by resistor
noise rather than by the voltage or current noise of the OP270.
When R
exceeds 20 kΩ, the current noise of the OP270
S
becomes the major contributor to total noise.
100
is less than 1 kΩ, the total noise
S
rises
S
Figure 33 also shows the relationship between total noise and
source resistance, but at 10 Hz. Total noise increases more
quickly than shown in Figure 32 because current noise is
inversely proportional to the square root of frequency. In
Figure 33, the current noise of the OP270 dominates the total
noise when R
is greater than 5 kΩ.
S
Figure 32 and Figure 33 show that to reduce total noise, source
resistance must be kept to a minimum. In applications with a
high source resistance, the OP200, with lower current noise
than the OP270, can provide lower total noise.
100
Hz)
OP200
10
OP270
TOTAL NOISE (nV/
RESISTOR
NOISE ONLY
1
1001k10k100k
SOURCE RESIST ANCE (Ω)
00352-034
Figure 33. Total Noise vs. Source Resistance
(Including Resistor Noise) at 10 Hz
Figure 34 shows peak-to-peak noise vs. source resistance over
the 0.1 Hz to 10 Hz range. At low values of R
, the voltage noise
S
of the OP270 is the major contributor to peak-to-peak noise,
with current noise becoming the major contributor as R
S
increases. The crossover point between the OP270 and the
OP200 for peak-to-peak noise is at a source resistance of 17 kΩ.
1k
OP200
Hz)
OP200
10
OP270
TOTAL NOISE (nV/
RESISTOR
NOISE ONLY
1
1001k10k100k
SOURCE RESIST ANCE (Ω)
00352-033
100
OP270
PEAK-TO-PEAK NOISE (nV )
10
100
RESISTOR
NOISE ONLY
1k
SOURCE RESIST ANCE (Ω)
10k100k
Figure 34. Peak-to-Peak Noise (0.1 Hz to 10 Hz) vs. Source Resistance
(Including Resistor Noise)
00352-035
Figure 32. Total Noise vs. Source Resistance
(Including Resistor Noise) at 1 kHz
Rev. E | Page 12 of 20
OP270
For reference, typical source resistances of some signal sources are listed in Table 5.
Table 5. Typical Source Resistances
Device Source Impedance Comments
Strain Gage <500 Ω Typically used in low frequency applications.
Magnetic Tapehead, Microphone <1500 Ω
Magnetic Phonograph Cartridge <1500 Ω
Linear Variable Differential Transformer <1500 Ω
R3
1.24kΩ
R1
5Ω
OP270
R2
5Ω
DUT
R4
200Ω
OP27E
909Ω
C1
2µF
R5
600Ω
R6
Figure 35. Peak-to-Peak Voltage Noise Test Circuit (0.1 Hz to 10 Hz)
R8
10kΩ
D1, D2
1N4148
is very important to reduce self-magnetization problems when
Low I
B
direct coupling is used. OP270 I
is important to reduce self-magnetization problems in direct-coupled
Low I
B
can be disregarded.
B
applications. OP270 does not introduce any self-magnetization problems.
Used in rugged servo-feedback applications. The bandwidth of interest is
400 Hz to 5 kHz.
C4
0.22µF
OP27E
306Ω
C2
0.032µF
R10
65.4kΩ
R9
R11
65.4kΩ
0.22µF
R14
C3
10kΩ
R12
OP42E
R13
5.9kΩ
4.99kΩ
C5
1µF
GAIN = 50,000
V
= ±15V
S
e
OUT
00325-036
Rev. E | Page 13 of 20
OP270
(
(
(
)
(
)
(
NOISE MEASUREMENTS
Peak-to-Peak Voltage Noise
The circuit of Figure 35 is a test setup for measuring peak-topeak voltage noise. To measure the 200 nV peak-to-peak noise
specification of the OP270 in the 0.1 Hz to 10 Hz range, the
following precautions must be observed:
• The device has to be warmed up for at least five minutes.
As shown in the warm-up drift curve (see Figure 8), the
offset voltage typically changes 2 μV due to increasing chip
temperature after power-up. In the 10 sec measurement
interval, these temperature-induced effects can exceed tens
of nanovolts.
• For similar reasons, the device has to be well shielded from
air currents. Shielding also minimizes thermocouple effects.
• Sudden motion in the vicinity of the device can also feed
through to increase the observed noise.
• The test time to measure noise of 0.1 Hz to 10 Hz should
not exceed 10 sec. As shown in the noise-tester frequency
response curve of Figure 36, the 0.1 Hz corner is defined by
only one pole. The test time of 10 sec acts as an additional
pole to eliminate noise contribution from the frequency
band below 0.1 Hz.
• A noise voltage density test is recommended when measuring
noise on several units. A 10 Hz noise voltage density measurement correlates well with a 0.1 Hz to 10 Hz peak-to-peak
noise reading because both results are determined by the
white noise and the location of the 1/f corner frequency.
• Power should be supplied to the test circuit by well bypassed
low noise supplies, such as batteries. Such supplies will minimize output noise introduced via the amplifier supply pins.
100
80
60
GAIN (dB)
40
20
0
0.010.1110100
Figure 36. 0.1 Hz to 10 Hz Peak-to-Peak Voltage Noise
Test Circuit Frequency Response
FREQUENCY (Hz)
00352-037
Noise Measurement—Noise Voltage Density
The circuit of Figure 37 shows a quick and reliable method for
measuring the noise voltage density of dual op amps. The first
amplifier is in unity gain, with the final amplifier in a noninverting
gain of 101. Because the noise voltages of the amplifiers are
uncorrelated, they add in rms to yield
OUT
101
2
)
nA
2
)
eee+=
nB
The OP270 is a monolithic device with two identical amplifiers.
Therefore, the noise voltage densities of the amplifiers match,
giving
2
R1
100Ω
e
(nV/√Hz) ≈ 101 (√2en)
OUT
= ±15V
V
S
==
OP270
OUT
1/2
OP270
Figure 37. Noise Voltage Density Test Circuit
)
eee21012101
nn
R2
10kΩ
1/2
TO SPECTRUM ANALYZER
e
OUT
00325-038
Noise Measurement—Current Noise Density
The test circuit shown in Figure 38 can be used to measure current
noise density. The formula relating the voltage output to the current
noise density is
2
e
⎞
⎛
nOUT
⎜
G
⎝
i
=
n
()
⎟
⎠
R
S
2
HznV
/40−
where:
G is a gain of 10,000.
R
= 100 kΩ source resistance.
S
R3
1.24kΩ
R15ΩR2
100kΩ
OP270
DUT
200Ω
Figure 38. Current Noise Density Test Circuit
OP27E
R5
8.06kΩ
R4
e
nOUT
TO SPECTRUM ANALYZER
GAIN = 10,000
V
= ±15V
S
00325-039
Rev. E | Page 14 of 20
OP270
V
V
CAPACITIVE LOAD DRIVING AND POWER SUPPLY
CONSIDERATIONS
The OP270 is unity-gain stable and capable of driving large
capacitive loads without oscillating. Nonetheless, good supply
bypassing is highly recommended. Proper supply bypassing
reduces problems caused by supply line noise and improves the
capacitive load driving capability of the OP270.
In the standard feedback amplifier, the output resistance of the
op amp combines with the load capacitance to form a low-pass
filter that adds phase shift in the feedback network and reduces
stability. A simple circuit to eliminate this effect is shown in
Figure 39. The components C1 and R3 decouple the amplifier
from the load capacitance and provide additional stability. The
values of C1 and R3 shown in Figure 39 are for a load capacitance
of up to 1000 pF when used with the OP270.
+
+
C2
10µF
C3
0.1µF
R1
IN
OP270
C1
200pF
C5
0.1µF
V–
Figure 39. Driving Large Capacitive Loads
R2
R3
50Ω
C4
10µF
+
PLACE SUPPLY D ECOUPL ING
CAPACIT OR AT O P270
V
OUT
C1
1000pF
00325-040
UNITY-GAIN BUFFER APPLICATIONS
When Rf ≤ 100 Ω and the input is driven with a fast, large signal
pulse (>1 V), the output waveform looks like the one in Figure 40.
During the fast feedthrough-like portion of the output, the input
protection diodes effectively short the output to the input, and
a current, limited only by the output short-circuit protection, is
drawn by the signal generator. With R
capable of handling the current requirements (I
the amplifier stays in its active mode and a smooth transition occurs.
When R
> 3 kΩ, a pole created by Rf and the input capacitance
f
(3 pF) of the amplifier creates additional phase shift and reduces
phase margin. A small capacitor (20 pF to 50 pF) in parallel with
helps eliminate this problem.
R
f
R
f
OP270
Figure 40. Pulsed Operation
≥ 500 Ω, the output is
f
≤ 20 mA at 10 V);
L
2.4V/µs
00325-041
Rev. E | Page 15 of 20
OP270
LOW PHASE ERROR AMPLIFIER
The simple amplifier depicted in Figure 41 utilizes a monolithic
dual operational amplifier and a few resistors to substantially
reduce phase error compared with conventional amplifier
designs. At a given gain, the frequency range for a specified
phase accuracy is more than a decade greater than that of a
standard single op amp amplifier.
The low phase error amplifier performs second-order frequency compensation through the response of Op Amp A2 in
the feedback loop of A1. Both op amps must be extremely well
matched in frequency response. At low frequencies, the A1
feedback loop forces V
forces V
function of V
/(K1 + 1) = V2/(K1 + 1), yielding an overall transfer
O
O/VIN
resistor divider at the output, V
the resistor divider around A2. Note that, like a conventional
single op amp amplifier, the dc gain is set by resistor ratios only.
Minimum gain for the low phase error amplifier is 10.
R2
K2
V
IN
ASSUME A1 AND A2 ARE MATCHED.
Figure 42 compares the phase error performance of the low
phase error amplifier with a conventional single op amp
amplifier and a cascaded two-stage amplifier. The low phase
error amplifier shows a much lower phase error, particularly for
frequencies where ω/βω
−0.1° occurs at 0.002 ω/βω
at 0.11 ω/βω
for the low phase error amplifier.
T
/(K1 + 1) = VIN. The A2 feedback loop
2
= K1 + 1. The dc gain is determined by the
, and is not directly affected by
O
R2R2 = R1
1/2
OP270E
A2
1/2
OP270E
A1
ω
T
A
(s) =
O
s
Figure 41. Low Phase Error Amplifier
< 0.1. For example, a phase error of
T
for the single op amp amplifier, but
T
R1
V
2
R1
K1
VO = (K1 + 1)V
V
O
IN
00325-042
0
PHASE SHIF T (Degrees)
–1
–2
–3
–4
–5
–6
–7
0.001
SINGLE OP AMP.
CONVENTIO NAL DESIGN
CASCADED
(TWO STAGES)
LOW PHASE E RROR
0.010.11
0.005
FREQUENCY RATI O (1/βω)(ω/ωT)
AMPLIFI ER
00352-043
0.050.5
Figure 42. Phase Error Comparison
FIVE-BAND, LOW NOISE, STEREO GRAPHIC
EQUALIZER
The graphic equalizer circuit shown in Figure 43 provides 15 dB
of boost or cut over a five-band range. Signal-to-noise ratio over
a 20 kHz bandwidth is better than 100 dB and referred to a 3 V
rms input. Larger inductors can be replaced by active inductors,
but consequently reduces the signal-to-noise ratio.
C1
0.47µF
V
IN
R1
47kΩ
R3
680Ω
R5
680Ω
R7
680Ω
R9
680Ω
R11
680Ω
1/2
OP270E
C2
6.8µF
+
TANTALUM
C3
1µF
+
TANTALUM
C4
0.22µF
+
C5
0.047µF
+
C6
0.022µF
+
Figure 43. Five-Band, Low Noise Graphic Equalizer
3.3kΩ
L1
1H
L2
600mH
L3
180mH
L4
60mH
L5
10mH
R2
R14
100Ω
V
OUT
1kΩ
R6
1kΩ
R8
1kΩ
R10
1kΩ
R12
1kΩ
1/2
60Hz
200Hz
800Hz
3kHz
10kHz
OP270E
R13
3.3kΩ
R4
00325-044
Rev. E | Page 16 of 20
OP270
A
A
DIGITAL PANNING CONTROL
Figure 44 uses a DAC8221 (a dual 12-bit CMOS DAC) to pan a
signal between two channels. One channel is formed by the
current output of DAC A driving one-half of an OP270 in a
current-to-voltage converter configuration. The other channel
is formed by the complementary output current of DAC A,
which normally flows to ground through the AGND pin. This
complementary current is converted to a voltage by the other
half of the OP270, which also holds AGND at virtual ground.
Gain error due to mismatching between the internal DAC
ladder resistors and the current-to-voltage feedback resistors is
eliminated by using feedback resistors internal to the DAC8221.
Only DAC A passes a signal; DAC B provides the second
feedback resistor. With V
voltage converter, using R
B unconnected, the current-to-
REF
, is accurate and not influenced by
FBB
digital data reaching DAC B. Distortion of the digital panning
control is less than 0.002% over the 20 Hz to 20 kHz audio
range. Figure 45 shows the complementary outputs for a 1 kHz
input signal and a digital ramp applied to the DAC data input.
DUAL PROGRAMMABLE GAIN AMPLIFIER
The dual OP270 and the DAC8221 (a dual 12-bit CMOS DAC)
can be combined to form a space-saving, dual programmable
amplifier. The digital code present at the DAC, which is easily
set by a microprocessor, determines the ratio between the internal
feedback resistor and the resistance that the DAC ladder presents
to the op amp feedback loop. Gain of each amplifier is
V
where n is the decimal equivalent of the 12-bit digital code
present at the DAC.
If the digital code present at the DAC consists of all 0s, the
feedback loop opens, causing the op amp output to saturate. A
20 MΩ resistor placed in parallel with the DAC feedback loop
eliminates this problem with only a very small reduction in gain
accuracy.
4096
O
IN
−=
nV
V
IN
DAC DATA BUS
PINS 6 (MSB) TO 17 (LSB)
NC
18
19
WRITE
CONTROL
20
OUT
OUT
DAC8221P
V
A
REF
DAC A
B
V
REF
DAC B
DAC A/DAC B
CS
WR
+5V
V
DD
DGND
21
R
FBA
3
I
A
OUT
24
AGND
1
R
FBB
23
B
I
OUT
2422
5
2
OP270G P
3
6
OP270G P
5
+15V
–15V
Figure 44. Digital Panning Control
5V5V1 ms
Figure 45. Digital Panning Control Output
0.01µF
+
10µF
–
8
1/2
1
4
0.1µF
1/2
7
+
10µF
–
OUT
OUT
00352-046
0325-045
Rev. E | Page 17 of 20
OP270
V
–
V
+5V
21
V
DD
V
A
REF
4
R
FBA
I
A
2
DAC A
R
FBB
DAC B
DGND
OUT
1
AGND
B
I
24
OUT
20MΩ
V
B
REF
22
5
VINA
VINB
WRITE
CONTROL
DAC8221P
3
23
DAC DATA BUS
PINS 6 (MSB) TO 17 (L SB)
18
19
20
20MΩ
2
3
OP270EZ
6
OP270GP
5
+15
1/2
–15V
1/2
0.01µF
+
10µF
–
8
1
V
A
+
–
V
OUT
10µF
OUT
B
00325-047
4
0.1µF
7
Figure 46. Dual Programmable Gain Amplifier
+
BIAS
OUT
IN
+IN
V–
00325-003
Figure 47. Simplified Schematic
(One of Two Amplifiers Is Shown)
Rev. E | Page 18 of 20
OP270
OUTLINE DIMENSIONS
0.005 (0.13)
0.200 (5.08)
MAX
0.200 (5.08)
0.125 (3.18)
0.023 (0.58)
0.014 (0.36)
CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN.
CONTROLL ING DIMENS IONS ARE IN INCHES; MILLIMETER DI MENSIONS
(IN PARENTHESES) ARE ROUNDED-OF F INCH EQUI VALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRI ATE FOR USE IN DESIGN.
CORNER LEADS MAY BE CONFIGURED AS WHOL E OR HALF LEADS.
CONTROLL ING DIMENS IONS ARE IN MILLIM ETERS; INCH DI MENSIONS
(IN PARENTHESES) ARE ROUNDED-O FF MIL LIMETE R EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRI ATE FOR USE IN DESIGN.
COMPLIANT TO JEDEC STANDARDS MS-013- AA
(
0
.
0
2
9
0
0
9
(
0
.
1.27 (0.0500)
0.40 (0.0157)
5
)
45°
8
)
032707-B
Figure 50. 16-Lead Standard Small Outline Package [SOIC_W]