ANALOG DEVICES OP270 Service Manual

Dual Very Low Noise Precision

FEATURES

Very low noise density of 5 nV/√Hz at 1 kHz maximum Excellent input offset voltage of 75 μV maximum Low offset voltage drift of 1 μV/°C maximum Very high gain of 1500 V/mV minimum Outstanding CMR of 106 dB minimum Slew rate of 2.4 V/μs typical Gain bandwidth product of 5 MHz typical Industry-standard 8-lead dual pinout

GENERAL DESCRIPTION

The OP270 is a high performance, monolithic, dual operational amplifier with exceptionally low voltage noise density (5 nV/√Hz maximum at 1 kHz). It offers comparable performance to the industry-standard OP27 from Analog Devices, Inc.
The OP270 features an input offset voltage of less than 75 μV and an offset drift of less than 1 μV/°C, guaranteed over the full military temperature range. Open-loop gain of the OP270 is more than 1,500,000 into a 10 kΩ load, ensuring excellent gain accuracy and linearity, even in high gain applications. The input bias current is less than 20 nA, which reduces errors due to signal source resistance. With a common-mode rejection (CMR) of greater than 106 dB and a power supply rejection ratio (PSRR) of less than 3.2 μV/V, the OP270 significantly reduces errors due to ground noise and power supply fluctuations. The power consumption of the dual OP270 is one-third less than two OP27
Operational Amplifier
OP270

FUNCTIONAL BLOCK DIAGRAMS

1
–IN A
2
+IN A
NC
3
V–
4
OP270
5
NC
+IN B
6
–IN B
7 8
NC
NC = NO CONNECT
Figure 1. 16-Lead SOIC
(S-Suffix)
OUT A
1
AB
2
–IN A
3
+IN A
4
V–
OP270
Figure 2. 8-Lead PDIP (P-Suffix)
8-Lead CERDIP
(Z-Suffix)
devices, a significant advantage for power conscious applications. The OP270 is unity-gain stable with a gain bandwidth product of 5 MHz and a slew rate of 2.4 V/μs.
The OP270 offers excellent amplifier matching, which is important for applications such as multiple gain blocks, low noise instrumentation amplifiers, dual buffers, and low noise active filters.
The OP270 conforms to the industry-standard 8-lead DIP pinout. It is pin compatible with the MC1458, SE5532/A, RM4558, and HA5102 dual op amps, and can be used to upgrade systems using those devices.
For higher speed applications, the ADA4004-2 or the AD8676 are recommended. For a quad op amp, see the OP470 data sheet.
16 15 14 13 12 11 10
9
8 7 6 5
OUT A NC NC V+ NC NC OUT B NC
V+ OUT B –IN B +IN B
00325-001
00325-002
Rev. E
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2001–2010 Analog Devices, Inc. All rights reserved.
OP270

TABLE OF CONTENTS

Features .............................................................................................. 1
Functional Block Diagrams ............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Electrical Specifications ............................................................... 4
Absolute Maximum Ratings ............................................................ 5
ESD Caution .................................................................................. 5
Typical Performance Characteristics ............................................. 6
Test Circuits ..................................................................................... 11
Applications Information .............................................................. 12

REVISION HISTORY

2/10—Rev. D to Rev. E
Change to General Description Section ........................................ 1
Change to Input Noise Current Density Parameter, Table 1 ...... 3
Change to Figure 18 ......................................................................... 8
Changes to Total Noise and Source Resistance Section ............ 13
Changes to Figure 41 ...................................................................... 16
2/09—Rev. C to Rev. D
Updated Format .................................................................. Universal
Reorganized Layout ............................................................ Universal
Changes to Figure 7 .......................................................................... 6
Changes to Figure 22 ........................................................................ 9
Deleted Applications Heading ...................................................... 11
Changes to Figure 44 ...................................................................... 17
Changes to Figure 46 ...................................................................... 18
Updated Outline Dimensions ....................................................... 19
Changes to Ordering Guide .......................................................... 20
Voltage and Current Noise ........................................................ 12
Total Noise and Source Resistance ........................................... 12
Noise Measurements .................................................................. 14
Capacitive Load Driving and Power Supply Considerations .. 15
Unity-Gain Buffer Applications ............................................... 15
Low Phase Error Amplifier ....................................................... 16
Five-Band, Low Noise, Stereo Graphic Equalizer .................. 16
Digital Panning Control ............................................................ 17
Dual Programmable Gain Amplifier ....................................... 17
Outline Dimensions ....................................................................... 19
Ordering Guide .......................................................................... 20
4/03—Rev. B to Rev. C
Deletion of OP270A model ............................................... Universal
Edits to Features ................................................................................. 1
Changes to Specifications ................................................................. 2
Deletion of Wafer Limits and Dice Characteristics ...................... 4
Changes to Absolute Maximum Ratings ........................................ 4
Changes to Ordering Guide ............................................................. 4
Changes to Equations in Noise Measurements section ............. 10
Change to Figure 10 ....................................................................... 11
Updated Outline Dimensions ....................................................... 14
11/02—Rev. A to Rev. B
Updated Ordering Guide .............................................................. 15
9/02—Rev. 0 to Rev. A
Edits to Absolute Maximum Ratings .............................................. 5
Edits to Ordering Guide ................................................................ 15
2/01—Revision 0: Initial Version
Rev. E | Page 2 of 20
OP270

SPECIFICATIONS

VS = ±15 V, TA = 25°C, unless otherwise noted.
Table 1.
OP270E OP270F OP270G
Parameter Symbol Test Conditions
Input Offset Voltage VOS 10 75 20 150 50 250 μV Input Offset Current IOS V Input Bias Current IB V Input Noise Voltage1 e
p-p 0.1 Hz to 10 Hz 80 200 80 200 80 nV p-p
n
Input Noise Voltage Density2 en f
e
e
f
n
f
n
Input Noise Current Density in f
i
i
f
n
f
n
Large-Signal Voltage Gain AVO
= 0 V 1 10 3 15 5 20 nA
CM
= 0 V 5 20 10 40 15 60 nA
CM
= 10 Hz 3.6 6.5 3.6 6.5 3.6 nV/√Hz
O
= 100 Hz 3.2 5.5 3.2 5.5 3.2 nV/√Hz
O
= 1 kHz 3.2 5.0 3.2 5.0 3.2 nV/√Hz
O
= 10 Hz 1.1 1.1 1.1 pA/√Hz
O
= 100 Hz 0.7 0.7 0.7 pA/√Hz
O
= 1 kHz 0.6 0.6 0.6 pA/√Hz
O
= ±10 V,
V
O
= 10 kΩ
R
L
= ±10 V,
V
O
R
= 2 kΩ
L
1500 2300 1000 1700 750 1500 V/mV
750 1200 500 900 350 700 V/mV
Input Voltage Range3 IVR ±12 ±12.5 ±12 ±12.5 ±12 ±12.5 V Output Voltage Swing VO R
≥ 2 kΩ ±12 ±13.5 ±12 ±13.5 ±12 ±13.5 V
L
Common-Mode Rejection CMR VCM = ±11 V 106 125 100 120 90 110 dB Power Supply Rejection
Ratio
PSRR
= ±4.5 V
V
S
to ±18 V
0.56 3.2 1.0 5.6 1.5 5.6 μV/V
Slew Rate SR 1.7 2.4 1.7 2.4 1.7 2.4 V/μs
No load 4 6.5 4 6.5 4 6.5 mA
Supply Current
I
SY
(All Amplifiers) Gain Bandwidth Product GBP 5 5 5 MHz Channel Separation1 CS
= ±20 V p-p,
V
O
f
= 10 Hz
O
125 175 125 175 175 dB
Input Capacitance CIN 3 3 3 pF Input Resistance
Differential Mode RIN 0.4 0.4 0.4 MΩ
Common Mode R Settling Time tS
20 20 20 GΩ
INCM
= +1, 10 V,
A
V
5 5 5 μs
step to 0.01%
1
Guaranteed but not 100% tested.
2
Sample tested.
3
Guaranteed by CMR test.
Unit Min Typ Max Min Typ Max Min Typ Max
Rev. E | Page 3 of 20
OP270

ELECTRICAL SPECIFICATIONS

VS = ±15 V, −40°C ≤ TA ≤ 85°C, unless otherwise noted.
Table 2.
OP270E OP270F OP270G
Parameter Symbol Test Conditions
Input Offset Voltage VOS 25 150 45 275 100 400 μV
TCV
Average Input Offset
0.2 1 0.4 2 0.7 3 μV/°C
OS
Voltage Drift Input Offset Current IOS V Input Bias Voltage IB V Large-Signal Voltage Gain AVO
A
Input Voltage Range
1
VO
IVR ±12 ±12.5 ±12 ±12.5 ±12 ±12.5 V
Output Voltage Swing VO R
= 0 V 1.5 30 5 40 15 50 nA
CM
= 0 V 6 60 15 70 19 80 nA
CM
= ±10 V,
V
O
= 10 kΩ
R
L
= ±10 V,
V
O
R
= 2 kΩ
L
≥ 2 kΩ ±12 ±13.5 ±12 ±13.5 ±12 ±13.5 V
L
1000 1800 600 1400 400 1250 V/mV
500 900 300 700 225 670 V/mV
Common-Mode Rejection CMR VCM = ±11 V 100 120 94 115 90 100 dB Power Supply Rejection
PSRR V
= ±4.5 V to ±18 V 0.7 5.6 1.8 10 2.0 1.5 μV/V
S
Ratio
No load 4.4 7.2 4.4 7.2 4.4 7.2 mA
Supply Current
I
SY
(All Amplifiers)
1
Guaranteed by CMR test.
Unit Min Typ Max Min Typ Max Min Typ Max
Rev. E | Page 4 of 20
OP270

ABSOLUTE MAXIMUM RATINGS

Table 3.
Parameter Rating
Supply Voltage 18 V Differential Input Voltage1 1.0 V Differential Input Current1 ±25 mA Input Voltage Supply voltage Output Short-Circuit Duration Continuous Storage Temperature Range −65°C to +150°C Lead Temperature Range (Soldering, 60 sec) 300°C Junction Temperature (TJ) −65°C to +150°C Operating Temperature Range −40°C to +85°C
1
The OP270 inputs are protected by back-to-back diodes. To achieve low noise
performance, current-limiting resistors are not used. If the differential voltage exceeds +10 V, the input current should be limited to ±25 mA.
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
For military processed devices, refer to the Standard Micro­circuit Drawing (SMD) available at the Defense Logistics Agency website.
Table 4. Analog Devices Equivalent to SMD
SMD Part Number Analog Devices Equivalent
5962-8872101PA OP270AZMDA

ESD CAUTION

Rev. E | Page 5 of 20
OP270

TYPICAL PERFORMANCE CHARACTERISTICS

VOLTAGE NOISE DENSITY (nV/√Hz)
10
9 8 7
6
5
4
3
2
TA = 25°C V
= ±15V
S
1/f CORNER = 5Hz
CURRENT NOISE DE NSITY (pA/ Hz)
10
1
TA = 25°C V
= ±15V
S
1/f CORNER = 200Hz
1
1 10 100 1k
FREQUENCY (Hz)
Figure 3. Voltage Noise Density vs. Frequency
5
TA = 25°C
4
AT 10kHz
3
2
VOLTAGE NOISE DENSITY (nV/√Hz)
1
0 ±5 ±10 ±15 ±20
SUPPLY VOLTAGE (V)
AT 1kHz
Figure 4. Voltage Noise Density vs. Supply Voltage
0.1Hz TO 10Hz NOISE
00352-004
0.1 10 100 1k 10k
FREQUENCY (Hz)
00352-007
Figure 6. Current Noise Density vs. Frequency
40
VS = ±15V
30
20
10
0
VOLTAGE (µV)
–10
–20
00352-005
–30
–75 –50 –25 25 50 75 100 1250
TEMPERATURE (° C)
00352-008
Figure 7. Input Offset Voltage vs. Temperature
5
TA = 25°C V
= ±15V
S
4
NOISE VO LTAGE ( 100nV/DIV )
TA = 25°C T
= ±15V
S
TIME (1 sec/DIV)
Figure 5. 0.1 Hz to 10 Hz Input Voltage Noise
00352-006
Rev. E | Page 6 of 20
3
2
1
CHANGE IN OFF SET VOL TAGE (µA)
0
02341
TIME (Minutes)
Figure 8. Warm-Up Offset Voltage Drift
00352-009
5
OP270
7
VS = ±15V V
= 0V
CM
6
5
4
INPUT BIAS CURRENT (nA)
3
2
–75 –50 –25 25 50 75 100 1250
TEMPERATURE (° C)
Figure 9. Input Bias Current vs. Temperature
00352-010
130
120
110
100
90
80
70
60
CMR (dB)
50
40
30
20
10
1 10 1k 10k 100k 1M100
FREQUENCY (Hz)
Figure 12. CMR vs. Frequency
TA = 25°C V
= ±15V
S
00352-013
5
VS = ±15V V
= 0V
CM
4
3
2
INPUT OFFSET CURRENT (nA)
1
0
–75 –50 –25 25 50 75 100 1250
TEMPERATURE (° C)
Figure 10. Input Offset Current vs. Temperature
7
TA = +25°C V
= ±15V
S
6
5
4
6
5
4
+125°C
+25°C
3
TOTAL SUPPLY CURRENT (mA)
00352-011
2
–55°C
00352-014
0 ±5 ±10 ±15 ±20
SUPPLY VOLTAGE (V)
Figure 13. Total Supply Current vs. Supply Voltage
8
VS = ±15V
7
6
5
4
3
INPUT BIAS CURRENT (nA)
3
2
–10.0 –5. 0 0 5.0
–12.5 –7. 5 –2.5 2.5
COMMON-MODE VOLTAGE (V)
7.5 12.5
Figure 11. Input Bias Current vs. Common-Mode Voltage
10.0
00352-012
Rev. E | Page 7 of 20
2
TOTAL SUPPLY CURRENT (mA)
1
0
–75 –50 –25 25 50 75 100 1250
TEMPERATURE (° C)
Figure 14. Total Supply Current vs. Temperature
00352-015
OP270
= ±15V
80
100
120
140
160
180
PHASE SHIF T (Degrees)
00352-019
140
120
100
80
60
PSR (dB)
40
20
0
1 10 1k 10k 100k 1M 10M 100M100
140
120
100
80
–PSR
+PSR
FREQUENCY (Hz)
Figure 15. PSR vs. Frequency
TA = 25°C
TA = 25°C V
= ±15V
S
25
20
15
10
5
0
OPEN-LOOP GAIN (dB)
–5
00352-016
–10
12345678910
FREQUENCY (MHz )
PHASE
MARGIN = 62°
GAIN
PHASE
TA = 25°C V
S
Figure 18. Open-Loop Gain and Phase Shift vs. Frequency
5000
4000
3000
60
40
OPEN-LOOP GAIN (dB)
20
0
1 10 1k 10k 100k 1M 10M 100M100
FREQUENCY (Hz)
Figure 16. Open-Loop Gain vs. Frequency
80
60
40
20
CLOSED-LOOP GAIN (dB)
0
–20
1k 10k 100k 1M 10M
FREQUENCY (Hz)
Figure 17. Closed-Loop Gain vs. Frequency
TA = 25°C V
= ±15V
S
2000
OPEN-LOOP GAIN (V/mA)
1000
00352-017
0
0 ±5 ±10 ±15 ±20 ±25
SUPPLY VOLTAGE (V)
00352-020
Figure 19. Open-Loop Gain vs. Supply Voltage
80
8
70
60
50
PHASE MARGIN ( Degrees)
00352-018
40
–75 –50 –25 25 50 75 100 125 1500
Ф
GBP
TEMPERATURE (° C)
7
6
5
GAIN BANDWIDTH P RODUCT (MHz)
4
00352-021
Figure 20. Phase Margin and Gain Bandwidth Product vs. Temperature
Rev. E | Page 8 of 20
OP270
28
24
20
16
12
8
MAXIMUM OUTPUT SWING (V)
4
TA = 25°C V
= ±15V
S
THD = 1%
100
TA = 25°C V
= ±15V
S
A
= 1
75
50
A
= 100
V
OUTPUT IMPEDANCE (Ω)
25
A
= 10
V
V
0
1k 10k 100k 1M 10M
FREQUENCY (Hz)
Figure 21. Maximum Output Swing vs. Frequency
15
TA = 25°C V
= ±15V
14
S
13
12
11
10
9
8
7
MAXIMUM OUTPUT VOLTAGE (V)
6
5
100 1k 10k
POSITIVE
SWING
NEGATIVE SWING
LOAD RESIST ANCE (Ω)
Figure 22. Maximum Output Voltage vs. Load Resistance
50
TA = 25°C V
= ±15V
S
V
= 100mV
IN
A
= +1
40
V
30
20
10
SMALL-SIGNAL OVERSHOOT (%)
0
0 200 400 600 800 1000
CAPACITIVE L OAD (pF)
Figure 23. Small-Signal Overshoot vs. Capacitive Load
00352-022
0
1k 10k 100k 1M 10M
FREQUENCY (Hz)
00352-025
Figure 24. Output Impedance vs. Frequency
2.8 VS = ±15V
2.7
2.6
2.5
2.4
SLEW RATE (V/µs)
2.3
00352-023
2.2
–75 –50 –25 25 50 75 100 1250
TEMPERATURE (° C)
–SR
+SR
00352-026
Figure 25. Slew Rate vs. Temperature
190
180
170
160
150
140
130
120
110
100
CHANNEL SEPARATIO N (dB)
90
TA = 25°C V
= ±15V
S
80
V
= 20V p-p TO 10kHz
00352-024
O
70
1 10 1k 10k 100k 1M100
00352-027
FREQUENCY (Hz)
Figure 26. Channel Separation vs. Frequency
Rev. E | Page 9 of 20
OP270
0.1 TA = 25°C
V
= ±15V
S
V
= 20V p-p
O
R
= 2k
L
AV = 10
0.01
AV = 1
TOTAL HARMO NIC DISTO RTION (%)
0.001 10 100 1k 10k
FREQUENCY (Hz)
Figure 27. Total Harmonic Distortion vs. Frequency
TA = 25°C V
= ±15V
S
A
= +1
V
R
= 2k
L
00352-028
TA = 25°C V
= ±15V
S
A
= +1
V
R
= 2k
L
50mV 200ns
Figure 29. Small-Signal Transient Response
00352-030
5V 20µs
00352-029
Figure 28. Large-Signal Transient Response
Rev. E | Page 10 of 20
OP270
V

TEST CIRCUITS

5k
500
1/2
OP270
5k
50
1/2
OP270
CHANNEL SEPARATION = 20 LOG
Figure 30. Channel Separation Test Circuit
+18
20V
V
1
p-p
V
2
V
1
V2/1000
00325-031
1/2
OP270
1/2
OP270
–18V
8
1
7
4
00325-032
100k
200k
100k
2
3
6
5
Figure 31. Burn-In Circuit
Rev. E | Page 11 of 20
OP270

APPLICATIONS INFORMATION

VOLTAGE AND CURRENT NOISE

The OP270 is a very low noise dual op amp, exhibiting a typical voltage noise density of only 3.2 nV/√Hz at 1 kHz. Because the voltage noise is inversely proportional to the square root of the collector current, the exceptionally low noise characteristic of the OP270 is achieved in part by operating the input transistors at high collector currents. Current noise, however, is directly proportional to the square root of the collector current. As a result, the outstanding voltage noise density performance of the OP270 is gained at the expense of current noise performance, which is normal for low noise amplifiers.
To obtain the best noise performance in a circuit, it is vital to understand the relationships among voltage noise (e noise (i
), and resistor noise (et).
n
), current
n

TOTAL NOISE AND SOURCE RESISTANCE

The total noise of an op amp can be calculated by
222
)()()(
eRieE ++=
tsnnn
where:
E
is the total input-referred noise.
n
e
is the op amp voltage noise.
n
i
is the op amp current noise.
n
e
is the source resistance thermal noise.
t
R
is the source resistance.
S
The total noise is referred to the input and at the output is amplified by the circuit gain.
Figure 32 shows the relationship between total noise at 1 kHz and source resistance. When R is dominated by the voltage noise of the OP270. As R above 1 kΩ, total noise increases and is dominated by resistor noise rather than by the voltage or current noise of the OP270. When R
exceeds 20 kΩ, the current noise of the OP270
S
becomes the major contributor to total noise.
100
is less than 1 kΩ, the total noise
S
rises
S
Figure 33 also shows the relationship between total noise and source resistance, but at 10 Hz. Total noise increases more quickly than shown in Figure 32 because current noise is inversely proportional to the square root of frequency. In Figure 33, the current noise of the OP270 dominates the total noise when R
is greater than 5 kΩ.
S
Figure 32 and Figure 33 show that to reduce total noise, source resistance must be kept to a minimum. In applications with a high source resistance, the OP200, with lower current noise than the OP270, can provide lower total noise.
100
Hz)
OP200
10
OP270
TOTAL NOISE (nV/
RESISTOR NOISE ONLY
1
100 1k 10k 100k
SOURCE RESIST ANCE (Ω)
00352-034
Figure 33. Total Noise vs. Source Resistance
(Including Resistor Noise) at 10 Hz
Figure 34 shows peak-to-peak noise vs. source resistance over the 0.1 Hz to 10 Hz range. At low values of R
, the voltage noise
S
of the OP270 is the major contributor to peak-to-peak noise, with current noise becoming the major contributor as R
S
increases. The crossover point between the OP270 and the OP200 for peak-to-peak noise is at a source resistance of 17 kΩ.
1k
OP200
Hz)
OP200
10
OP270
TOTAL NOISE (nV/
RESISTOR NOISE ONLY
1
100 1k 10k 100k
SOURCE RESIST ANCE (Ω)
00352-033
100
OP270
PEAK-TO-PEAK NOISE (nV )
10
100
RESISTOR NOISE ONLY
1k
SOURCE RESIST ANCE (Ω)
10k 100k
Figure 34. Peak-to-Peak Noise (0.1 Hz to 10 Hz) vs. Source Resistance
(Including Resistor Noise)
00352-035
Figure 32. Total Noise vs. Source Resistance
(Including Resistor Noise) at 1 kHz
Rev. E | Page 12 of 20
OP270
For reference, typical source resistances of some signal sources are listed in Table 5.
Table 5. Typical Source Resistances
Device Source Impedance Comments
Strain Gage <500 Ω Typically used in low frequency applications. Magnetic Tapehead, Microphone <1500 Ω
Magnetic Phonograph Cartridge <1500 Ω
Linear Variable Differential Transformer <1500 Ω
R3
1.24k
R1 5
OP270
R2 5
DUT
R4
200
OP27E
909
C1
2µF
R5
600
R6
Figure 35. Peak-to-Peak Voltage Noise Test Circuit (0.1 Hz to 10 Hz)
R8
10k
D1, D2 1N4148
is very important to reduce self-magnetization problems when
Low I
B
direct coupling is used. OP270 I
is important to reduce self-magnetization problems in direct-coupled
Low I
B
can be disregarded.
B
applications. OP270 does not introduce any self-magnetization problems. Used in rugged servo-feedback applications. The bandwidth of interest is
400 Hz to 5 kHz.
C4
0.22µF
OP27E
306
C2
0.032µF
R10
65.4k
R9
R11
65.4k
0.22µF
R14
C3
10k
R12
OP42E
R13
5.9k
4.99k
C5
1µF
GAIN = 50,000 V
= ±15V
S
e
OUT
00325-036
Rev. E | Page 13 of 20
OP270
(
(
(
)
(
)
(

NOISE MEASUREMENTS

Peak-to-Peak Voltage Noise

The circuit of Figure 35 is a test setup for measuring peak-to­peak voltage noise. To measure the 200 nV peak-to-peak noise specification of the OP270 in the 0.1 Hz to 10 Hz range, the following precautions must be observed:
The device has to be warmed up for at least five minutes.
As shown in the warm-up drift curve (see Figure 8), the offset voltage typically changes 2 μV due to increasing chip temperature after power-up. In the 10 sec measurement interval, these temperature-induced effects can exceed tens of nanovolts.
For similar reasons, the device has to be well shielded from
air currents. Shielding also minimizes thermocouple effects.
Sudden motion in the vicinity of the device can also feed
through to increase the observed noise.
The test time to measure noise of 0.1 Hz to 10 Hz should
not exceed 10 sec. As shown in the noise-tester frequency response curve of Figure 36, the 0.1 Hz corner is defined by only one pole. The test time of 10 sec acts as an additional pole to eliminate noise contribution from the frequency band below 0.1 Hz.
A noise voltage density test is recommended when measuring
noise on several units. A 10 Hz noise voltage density mea­surement correlates well with a 0.1 Hz to 10 Hz peak-to-peak noise reading because both results are determined by the white noise and the location of the 1/f corner frequency.
Power should be supplied to the test circuit by well bypassed
low noise supplies, such as batteries. Such supplies will min­imize output noise introduced via the amplifier supply pins.
100
80
60
GAIN (dB)
40
20
0
0.01 0.1 1 10 100
Figure 36. 0.1 Hz to 10 Hz Peak-to-Peak Voltage Noise
Test Circuit Frequency Response
FREQUENCY (Hz)
00352-037

Noise Measurement—Noise Voltage Density

The circuit of Figure 37 shows a quick and reliable method for measuring the noise voltage density of dual op amps. The first amplifier is in unity gain, with the final amplifier in a noninverting gain of 101. Because the noise voltages of the amplifiers are uncorrelated, they add in rms to yield
OUT
101
2
)
nA
2
)
eee +=
nB
The OP270 is a monolithic device with two identical amplifiers. Therefore, the noise voltage densities of the amplifiers match, giving
2
R1
100
e
(nV/√Hz) ≈ 101 (2en)
OUT
= ±15V
V
S
==
OP270
OUT
1/2
OP270
Figure 37. Noise Voltage Density Test Circuit
)
eee 21012101
nn
R2
10k
1/2
TO SPECTRUM ANALYZER
e
OUT
00325-038

Noise Measurement—Current Noise Density

The test circuit shown in Figure 38 can be used to measure current noise density. The formula relating the voltage output to the current noise density is
2
e
nOUT
G
i
=
n
()
⎟ ⎠
R
S
2
HznV
/40
where:
G is a gain of 10,000. R
= 100 kΩ source resistance.
S
R3
1.24k
R15R2
100k
OP270
DUT
200
Figure 38. Current Noise Density Test Circuit
OP27E
R5
8.06k
R4
e
nOUT
TO SPECTRUM ANALYZER
GAIN = 10,000 V
= ±15V
S
00325-039
Rev. E | Page 14 of 20
OP270
V
V

CAPACITIVE LOAD DRIVING AND POWER SUPPLY CONSIDERATIONS

The OP270 is unity-gain stable and capable of driving large capacitive loads without oscillating. Nonetheless, good supply bypassing is highly recommended. Proper supply bypassing reduces problems caused by supply line noise and improves the capacitive load driving capability of the OP270.
In the standard feedback amplifier, the output resistance of the op amp combines with the load capacitance to form a low-pass filter that adds phase shift in the feedback network and reduces stability. A simple circuit to eliminate this effect is shown in Figure 39. The components C1 and R3 decouple the amplifier from the load capacitance and provide additional stability. The values of C1 and R3 shown in Figure 39 are for a load capacitance of up to 1000 pF when used with the OP270.
+
+
C2 10µF
C3
0.1µF
R1
IN
OP270
C1
200pF
C5
0.1µF
V–
Figure 39. Driving Large Capacitive Loads
R2
R3
50
C4 10µF
+
PLACE SUPPLY D ECOUPL ING CAPACIT OR AT O P270
V
OUT
C1 1000pF
00325-040

UNITY-GAIN BUFFER APPLICATIONS

When Rf ≤ 100 Ω and the input is driven with a fast, large signal pulse (>1 V), the output waveform looks like the one in Figure 40.
During the fast feedthrough-like portion of the output, the input protection diodes effectively short the output to the input, and a current, limited only by the output short-circuit protection, is drawn by the signal generator. With R capable of handling the current requirements (I the amplifier stays in its active mode and a smooth transition occurs.
When R
> 3 kΩ, a pole created by Rf and the input capacitance
f
(3 pF) of the amplifier creates additional phase shift and reduces phase margin. A small capacitor (20 pF to 50 pF) in parallel with
helps eliminate this problem.
R
f
R
f
OP270
Figure 40. Pulsed Operation
≥ 500 Ω, the output is
f
≤ 20 mA at 10 V);
L
2.4V/µs
00325-041
Rev. E | Page 15 of 20
OP270

LOW PHASE ERROR AMPLIFIER

The simple amplifier depicted in Figure 41 utilizes a monolithic dual operational amplifier and a few resistors to substantially reduce phase error compared with conventional amplifier designs. At a given gain, the frequency range for a specified phase accuracy is more than a decade greater than that of a standard single op amp amplifier.
The low phase error amplifier performs second-order fre­quency compensation through the response of Op Amp A2 in the feedback loop of A1. Both op amps must be extremely well matched in frequency response. At low frequencies, the A1 feedback loop forces V forces V function of V
/(K1 + 1) = V2/(K1 + 1), yielding an overall transfer
O
O/VIN
resistor divider at the output, V the resistor divider around A2. Note that, like a conventional single op amp amplifier, the dc gain is set by resistor ratios only. Minimum gain for the low phase error amplifier is 10.
R2 K2
V
IN
ASSUME A1 AND A2 ARE MATCHED.
Figure 42 compares the phase error performance of the low phase error amplifier with a conventional single op amp amplifier and a cascaded two-stage amplifier. The low phase error amplifier shows a much lower phase error, particularly for frequencies where ω/βω
−0.1° occurs at 0.002 ω/βω at 0.11 ω/βω
for the low phase error amplifier.
T
/(K1 + 1) = VIN. The A2 feedback loop
2
= K1 + 1. The dc gain is determined by the
, and is not directly affected by
O
R2 R2 = R1
1/2
OP270E
A2
1/2
OP270E
A1
ω
T
A
(s) =
O
s
Figure 41. Low Phase Error Amplifier
< 0.1. For example, a phase error of
T
for the single op amp amplifier, but
T
R1
V
2
R1 K1
VO = (K1 + 1)V
V
O
IN
00325-042
0
PHASE SHIF T (Degrees)
–1
–2
–3
–4
–5
–6
–7
0.001
SINGLE OP AMP.
CONVENTIO NAL DESIGN
CASCADED
(TWO STAGES)
LOW PHASE E RROR
0.01 0.1 1
0.005
FREQUENCY RATI O (1/βω)(ω/ωT)
AMPLIFI ER
00352-043
0.05 0.5
Figure 42. Phase Error Comparison

FIVE-BAND, LOW NOISE, STEREO GRAPHIC EQUALIZER

The graphic equalizer circuit shown in Figure 43 provides 15 dB of boost or cut over a five-band range. Signal-to-noise ratio over a 20 kHz bandwidth is better than 100 dB and referred to a 3 V rms input. Larger inductors can be replaced by active inductors, but consequently reduces the signal-to-noise ratio.
C1
0.47µF
V
IN
R1
47k
R3
680
R5
680
R7
680
R9
680
R11
680
1/2
OP270E
C2
6.8µF +
TANTALUM
C3
1µF
+
TANTALUM
C4
0.22µF +
C5
0.047µF +
C6
0.022µF +
Figure 43. Five-Band, Low Noise Graphic Equalizer
3.3k
L1
1H
L2
600mH
L3
180mH
L4
60mH
L5
10mH
R2
R14
100
V
OUT
1k
R6
1k
R8
1k
R10 1k
R12 1k
1/2
60Hz
200Hz
800Hz
3kHz
10kHz
OP270E
R13
3.3k
R4
00325-044
Rev. E | Page 16 of 20
OP270
A
A

DIGITAL PANNING CONTROL

Figure 44 uses a DAC8221 (a dual 12-bit CMOS DAC) to pan a signal between two channels. One channel is formed by the current output of DAC A driving one-half of an OP270 in a current-to-voltage converter configuration. The other channel is formed by the complementary output current of DAC A, which normally flows to ground through the AGND pin. This complementary current is converted to a voltage by the other half of the OP270, which also holds AGND at virtual ground.
Gain error due to mismatching between the internal DAC ladder resistors and the current-to-voltage feedback resistors is eliminated by using feedback resistors internal to the DAC8221. Only DAC A passes a signal; DAC B provides the second feedback resistor. With V voltage converter, using R
B unconnected, the current-to-
REF
, is accurate and not influenced by
FBB
digital data reaching DAC B. Distortion of the digital panning control is less than 0.002% over the 20 Hz to 20 kHz audio range. Figure 45 shows the complementary outputs for a 1 kHz input signal and a digital ramp applied to the DAC data input.

DUAL PROGRAMMABLE GAIN AMPLIFIER

The dual OP270 and the DAC8221 (a dual 12-bit CMOS DAC) can be combined to form a space-saving, dual programmable amplifier. The digital code present at the DAC, which is easily set by a microprocessor, determines the ratio between the internal feedback resistor and the resistance that the DAC ladder presents to the op amp feedback loop. Gain of each amplifier is
V
where n is the decimal equivalent of the 12-bit digital code present at the DAC.
If the digital code present at the DAC consists of all 0s, the feedback loop opens, causing the op amp output to saturate. A 20 MΩ resistor placed in parallel with the DAC feedback loop eliminates this problem with only a very small reduction in gain accuracy.
4096
O
IN
=
nV
V
IN
DAC DATA BUS
PINS 6 (MSB) TO 17 (LSB)
NC
18
19
WRITE
CONTROL
20
OUT
OUT
DAC8221P
V
A
REF
DAC A
B
V
REF
DAC B
DAC A/DAC B
CS
WR
+5V
V
DD
DGND
21
R
FBA
3
I
A
OUT
24
AGND
1
R
FBB
23
B
I
OUT
2422
5
2
OP270G P
3
6
OP270G P
5
+15V
–15V
Figure 44. Digital Panning Control
5V5V 1 ms
Figure 45. Digital Panning Control Output
0.01µF
+
10µF
8
1/2
1
4
0.1µF
1/2
7
+
10µF
OUT
OUT
00352-046
0325-045
Rev. E | Page 17 of 20
OP270
V
V
+5V
21
V
DD
V
A
REF
4
R
FBA
I
A
2
DAC A
R
FBB
DAC B
DGND
OUT
1
AGND
B
I
24
OUT
20M
V
B
REF
22
5
VINA
VINB
WRITE
CONTROL
DAC8221P
3
23
DAC DATA BUS
PINS 6 (MSB) TO 17 (L SB)
18
19
20
20M
2
3
OP270EZ
6
OP270GP
5
+15
1/2
–15V
1/2
0.01µF
+
10µF
8
1
V
A
+
V
OUT
10µF
OUT
B
00325-047
4
0.1µF
7
Figure 46. Dual Programmable Gain Amplifier
+
BIAS
OUT
IN
+IN
V–
00325-003
Figure 47. Simplified Schematic
(One of Two Amplifiers Is Shown)
Rev. E | Page 18 of 20
OP270

OUTLINE DIMENSIONS

0.005 (0.13)
0.200 (5.08) MAX
0.200 (5.08)
0.125 (3.18)
0.023 (0.58)
0.014 (0.36)
CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN.
Figure 48. 8-Lead Ceramic Dual In-Line Package [CERDIP]
Dimensions shown in inches and (millimeters)
0.400 (10.16)
0.365 (9.27)
0.355 (9.02)
8
1
0.100 (2.54)
0.210 (5.33)
0.150 (3.81)
0.130 (3.30)
0.115 (2.92)
0.022 (0.56)
0.018 (0.46)
0.014 (0.36)
MAX
BSC
0.070 (1.78)
0.060 (1.52)
0.045 (1.14)
0.055 (1.40)
MIN
14
0.100 (2.54) BSC
0.405 (10.29) MAX
5
4
MAX
58
0.070 (1.78)
0.030 (0.76)
0.280 (7.11)
0.250 (6.35)
0.240 (6.10)
0.015 (0.38) MIN
SEATING PLANE
0.005 (0.13) MIN
0.310 (7.87)
0.220 (5.59)
0.060 (1.52)
0.015 (0.38)
0.150 (3.81) MIN
SEATING PLANE
Z-Suffix
(Q-8)
0.060 (1.52)
0.015 (0.38) GAUGE
MAX
PLANE
0.320 (8.13)
0.290 (7.37)
15° 0°
0.325 (8.26)
0.310 (7.87)
0.300 (7.62)
0.430 (10.92) MAX
0.015 (0.38)
0.008 (0.20)
0.195 (4.95)
0.130 (3.30)
0.115 (2.92)
0.014 (0.36)
0.010 (0.25)
0.008 (0.20)
CONTROLL ING DIMENS IONS ARE IN INCHES; MILLIMETER DI MENSIONS (IN PARENTHESES) ARE ROUNDED-OF F INCH EQUI VALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRI ATE FOR USE IN DESIGN. CORNER LEADS MAY BE CONFIGURED AS WHOL E OR HALF LEADS.
COMPLIANT TO JEDEC STANDARDS MS-001
070606-A
Figure 49. 8-Lead Plastic Dual In-Line Package [PDIP]
Narrow Body
P-Suffix
(N-8)
Dimensions shown in inches and (millimeters)
Rev. E | Page 19 of 20
OP270
C
0.30 (0.0 118)
0.10 (0.0039)
OPLANARITY
0.10
10.50 (0.4134)
10.10 (0.3976)
BSC
9
7.60 (0.2992)
7.40 (0.2913)
8
10.65 (0.4193)
10.00 (0.3937)
2.65 (0.1043)
2.35 (0.0925)
SEATING PLANE
8° 0°
0.33 (0.0130)
0.20 (0.0079)
5
0
.
7
0
.
2
5
16
1
1.27 (0.0500)
0.51 (0.0201)
0.31 (0.0122)
CONTROLL ING DIMENS IONS ARE IN MILLIM ETERS; INCH DI MENSIONS (IN PARENTHESES) ARE ROUNDED-O FF MIL LIMETE R EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRI ATE FOR USE IN DESIGN.
COMPLIANT TO JEDEC STANDARDS MS-013- AA
(
0
.
0
2
9
0
0
9
(
0
.
1.27 (0.0500)
0.40 (0.0157)
5
)
45°
8
)
032707-B
Figure 50. 16-Lead Standard Small Outline Package [SOIC_W]
Wide Body
S-Suffix
(RW-16)
Dimensions shown in millimeters and (inches)

ORDERING GUIDE

1
θ
JA
(°C/W) Temperature Range Package Description
is specified for device soldered to
JA
Package Option
Model
T
= +25°C
A
Max (μV)
V
OS
θ
JC
(°C/W)
OP270EZ 75 12 134 −40°C to +85°C 8-Lead CERDIP Q-8 (Z-Suffix) OP270FZ 150 12 134 −40°C to +85°C 8-Lead CERDIP Q-8 (Z-Suffix) OP270GP 250 37 96 −40°C to +85°C 8-Lead PDIP N-8 (P-Suffix) OP270GPZ
2
−40°C to +85°C 8-Lead PDIP N-8 (P-Suffix)
OP270GS 250 27 92 −40°C to +85°C 16-Lead SOIC_W RW-16 (S-Suffix) OP270GS-REEL −40°C to +85°C 16-Lead SOIC_W RW-16 (S-Suffix) OP270GSZ OP270GSZ-REEL
1
θ
JA
printed circuit board for SOIC package.
2
Z = RoHS Compliant Part.
2
−40°C to +85°C 16-Lead SOIC_W RW-16 (S-Suffix)
2
−40°C to +85°C 16-Lead SOIC_W RW-16 (S-Suffix)
is specified for worst-case mounting conditions, that is, θJA is specified for device in socket for CERDIP and PDIP packages; θ
©2001–2010 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D00325-0-2/10(E)
Rev. E | Page 20 of 20
Loading...