FEATURES
Excellent TCV
Low Input Offset Voltage: 150 V Max
Low Supply Current: 100 A
Single-Supply Operation: 5 V to 30 V
Low Input Offset Voltage Drift: 0.75 V/ⴗC Max
High Open-Loop Gain: 2,000 V/mV
High PSRR: 3 V/V
Low Input Bias Current: 12 nA
Wide Common-Mode Voltage Range: V– to Within
1.5 V of V+
Pin Compatible with 1458, LM158, and LM2904
Available in Die Form
GENERAL DESCRIPTION
The OP220 is a monolithic dual operational amplifier that can
be used either in single or dual supply operation. The low offset
voltage and input offset voltage tracking as low as 1.0 mV/∞C,
make this the first micropower precision dual operational amplifier.
The excellent specifications of the individual amplifiers combined with the tight matching and temperature tracking between
channels provides high performance in instrumentation amplifier designs. The individual amplifiers feature extremely low
input offset voltage, low offset voltage drift, low noise voltage,
and low bias current. They are fully compensated and protected.
Matching between channels is provided on all critical parameters
including input offset voltage, tracking of offset voltage versus
temperature, noninverting bias currents, and common-mode
rejection ratios.
Match: 2 V/ⴗC Max
OS
Operational Amplifier
PIN CONFIGURATIONS
8-Lead Hermatic Dip
(Z-Suffix)
8-Lead SOIC
(S-Suffix)
OP220
8-Lead Plastic Dip
(P-Suffix)
OUT A
1
OP220
–IN A
2
+IN A
3
V–
4
8-Lead TO-99
(J-Suffix)
8
7
6
5
V+
OUT B
–IN B
+IN B
V+
Q11
Q27
Q28
OUTPUT
Q29
V–
Q3Q4
–IN
+IN
Q1
Q5
NULL*
*ACESSIBLE IN CHIP FORM ONLY
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices.
–40ⴗC £ TA £ +85ⴗC for OP220G unless otherwise noted.)
OP220A/E OP220F OP220C/G
2003004005001,000 1,300 mV
*Sample tested.
–2–
REV. A
OP220
MATCHING CHARACTERISTICS
(@ VS = ⴞ15 V, TA = 25ⴗC, unless otherwise noted.)
OP220A/E OP220F OP220C/G
ParameterSymbolConditionsMinTypMaxMinTypMaxMinTypMax Unit
Input Offset VoltageDV
OS
150300250500300800mV
Match
Average NoninvertingI
+V
B
= 0102015252030nA
CM
Bias Current
Noninverting OffsetI
+VCM = 00.71.5121.42.5nA
OS
Current
Common-ModeDCMRRVCM = –15 V to +13.5 V9210087957285dB
Rejection Ratio Match
Power SupplyDPSRRVS = ± 2.5 V to ± 15 V,614184457140mV/V
Rejection Ratio Match
NOTES
1
DCMRR is 20 log10 VCM/DCME, where VCM is the voltage applied to both noninverting inputs and D CME is the difference in common-mode input-referred error.
2
DPSRR is
3
Sample tested.
Input Referred Differential Error
DV
1
2
S
.
(Vs = ⴞ15 V, –55ⴗC £ TA £ +125ⴗC for OP220A/C, –25ⴗC £ TA £ +85ⴗC for OP220E/F,
MATCHING CHARACTERISTICS
ParameterSymbolConditionsMinTypMaxMinTypMaxMinTypMax Unit
Input Offset VoltageDV
Match
Input Offset VoltageTCDV
1
Tracking
Average NoninvertingIB+V
Bias Current
Average Drift ofTCIB+VCM = 0152515303050pA/∞C
Noninverting
Bias Current
1
Noninverting OffsetIOS+VCM = 00.7212.52.55nA
Current
Average Drift ofTCIOS+VCM = 07151222.51530pA/∞C
Noninverting Offset
1
Current
Common-ModeDCMRRVCM = –15 V to +13 V879682967280dB
Rejection Ratio Match
Power SupplyDPSRRVS = ± 2.5 V to ± 15 V,1026307857250mV/V
Rejection Ratio Match
NOTES
1
Sample tested.
2
DCMRR is 20 log10 VCM/DCME, where VCM is the voltage applied to both noninverting inputs and D CME is the difference in common-mode input-referred error.
3
DPSRR is
Input Referred Differential Error
DV
OS
OS
= 0102515302240nA
CM
2
3
S
.
–40ⴗC £ TA £ +85ⴗC for OP220G unless otherwise noted. Grades E, F are sample tested.)
OP220A/E OP220F OP220C/G
2505004008008001,800 mV
121.531.55mV/∞C
TYPICAL ELECTRICAL CHARACTERISTICS
(@ Vs = ⴞ15 V,TA = 25ⴗC, unless otherwise noted.)
OP220N
ParameterSymbolConditionsTypicalUnit
Average Input Offset Voltage DriftTCV
Large-Signal Voltage GainA
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packing is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on die lot qualification through sample lot assembly and testing.
–4–
REV. A
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