Throughput rate: 3 MSPS
Specified for V
Power consumption
12.6 mW at 3 MSPS with 3 V supplies
Wide input bandwidth
70 dB SNR at 1 MHz input frequency
Flexible power/serial clock speed management
No pipeline delays
High speed serial interface
SPI®-/QSPI™-/MICROWIRE™-/DSP-compatible
Temperature range: −40°C to +125°C
Power-down mode: 0.1 μA typical
6-lead TSOT package
8-lead MSOP package
AD7476 and AD7476A pin-compatible
GENERAL DESCRIPTION
The AD7276/AD7277/AD7278 are 12-/10-/8-bit, high speed,
low power, successive approximation analog-to-digital converters
(ADCs), respectively. The parts operate from a single 2.35 V
to 3.6 V power supply and feature throughput rates of up to
3 MSPS. The parts contain a low noise, wide bandwidth trackand-hold amplifier that can handle input frequencies in excess
of 55 MHz.
The conversion process and data acquisition are controlled
using
with microprocessors or DSPs. The input signal is sampled on
the falling edge of
point. There are no pipeline delays associated with the part.
The AD7276/AD7277/AD7278 use advanced design techniques
to achieve ver y low power dissipation at high throughput rates.
The reference for the part is taken internally from VDD. This
allows the widest dynamic input range to the ADC; therefore,
the analog input range for the part is 0 to VDD. The conversion
rate is determined by the SCLK.
and the serial clock, allowing the devices to interface
4. Flexible power/serial clock speed management. This allows
maximum power efficiency at low throughput rates.
5. Reference derived from the power supply.
6. No pipeline delay. The parts feature a standard successive
approximation ADC with accurate control of the sampling
instant via a
input and once-off conversion control.
CS
SUCCESSIVE
APPROXIMATION
ADC
CONTROL
LOGIC
GND
Figure 1.
SCLK
SDATA
CS
04903-001
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to Ordering Guide.......................................................... 26
7/05—Revision 0: Initial Version
Rev. C | Page 2 of 28
AD7276/AD7277/AD7278
SPECIFICATIONS
AD7276 SPECIFICATIONS
VDD = 2.35 V to 3.6 V, B Grade and A Grade: f
T
, unless otherwise noted.
MAX
= 48 MHz, f
SCLK
= 3 MSPS, Y Grade:1 f
SAMPLE
= 16 MHz, f
SCLK
= 1 MSPS, TA = T
SAMPLE
MIN
to
Table 2.
Parameter A Grade
2, 3
B, Y Grade
2,3
Unit Test Conditions/Comments
DYNAMIC PERFORMANCE fIN = 1 MHz sine wave, B Grade
f
= 100 kHz sine wave, Y Grade
IN
Signal-to-Noise + Distortion (SINAD)4 68 68 dB min
Signal-to-Noise Ratio (SNR) 69 69 dB min
70 70 dB typ
Total Harmonic Distortion (THD)4 −73 −73 dB max
−78 −78 dB typ
Peak Harmonic or Spurious Noise (SFDR)4 −80 −80 dB typ
Intermodulation Distortion (IMD)4
Second-Order Terms −82 −82 dB typ fa = 1 MHz, fb = 0.97 MHz
Third-Order Terms −82 −82 dB typ fa = 1 MHz, fb = 0.97 MHz
Aperture Delay 5 5 ns typ
Aperture Jitter 18 18 ps typ
Full Power Bandwidth 55 55 MHz typ @ 3 dB
8 8 MHz typ @ 0.1 dB
DC ACCURACY
Resolution 12 12 Bits
Integral Nonlinearity4 ±1.5 ±1 LSB max
Differential Nonlinearity4 +1/−0.99 +1/−0.99 LSB max Guaranteed no missed codes to 12 bits
Offset Error4 ±4 ±3 LSB max
Gain Error4 ±3.5 ±3.5 LSB max
Total Unadjusted Error4 (TUE) ±5 ±3.5 LSB max
ANALOG INPUT
Input Voltage Ranges 0 to VDD 0 to VDD V
DC Leakage Current ±1 ±1 μA max −40°C to +85°C
±5.5 ±5.5 μA max 85°C to 125°C
Input Capacitance 42 42 pF typ When in track
10 10 pF typ When in hold
LOGIC INPUTS
Input High Voltage, V
1.7 1.7 V min 2.35 V ≤ VDD ≤ 2.7 V
INH
2 2 V min 2.7 V < VDD ≤ 3.6 V
Input Low Voltage, V
0.7 0.7 V max 2.35 V ≤ VDD ≤ 2.7 V
INL
0.8 0.8 V max 2.7 V < VDD ≤ 3.6 V
Input Current, IIN ±1 ±1 μA max Typically 10 nA, VIN = 0 V or VDD
Input Capacitance, C
5
2 2 pF typ
IN
LOGIC OUTPUTS
Output High Voltage, VOH V
Output Low Voltage, VOL 0.2 0.2 V max I
− 0.2 VDD − 0.2 V min I
DD
= 200 μA, VDD = 2.35 V to 3.6 V
SOURCE
= 200 μA
SINK
Floating-State Leakage Current ±2.5 ±2.5 μA max
Floating-State Output Capacitance5 4.5 4.5 pF typ
Output Coding Straight (natural) binary
Rev. C | Page 3 of 28
AD7276/AD7277/AD7278
Parameter A Grade
2, 3
B, Y Grade
2,3
Unit Test Conditions/Comments
CONVERSION RATE
Conversion Time 291 291 ns max 14 SCLK cycles with SCLK at 48 MHz, B Grade
875 875 ns max 14 SCLK cycles with SCLK at 16 MHz, Y Grade
Track-and-Hold Acquisition Time4 60 60 ns min
Throughput Rate 3 3 MSPS max See the Serial Interface section
POWER REQUIREMENTS
VDD 2.35/3.6 2.35/3.6 V min/max
IDD Digital I/Ps 0 V or VDD
Normal Mode (Static) 1 1 mA typ VDD = 3.6 V, SCLK on or off
Normal Mode (Operational) 5.5 5.5 mA max VDD = 2.35 V to 3.6 V, f
2.5 2.5 mA max VDD = 2.35 V to 3.6 V, f
4.2 4.2 mA typ VDD = 3 V, f
1.6 1.6 mA typ VDD = 3 V, f
= 3 MSPS, B Grade
SAMPLE
= 1 MSPS, Y Grade
SAMPLE
= 3 MSPS, B Grade
SAMPLE
= 1 MSPS, Y Grade
SAMPLE
Partial Power-Down Mode (Static) 34 34 μA typ
Full Power-Down Mode (Static) 2 2 μA max −40°C to +85°C, typically 0.1 μA
10 10 μA max 85°C to 125°C
Power Dissipation6
Normal Mode (Operational) 19.8 19.8 mW max VDD = 3.6 V, f
9 9 mW max VDD = 3.6 V, f
12.6 12.6 mW typ VDD = 3 V, f
4.8 4.8 mW typ VDD = 3 V, f
= 3 MSPS, B Grade
SAMPLE
= 1 MSPS, Y Grade
SAMPLE
= 3 MSPS, B Grade
SAMPLE
= 1 MSPS, Y Grade
SAMPLE
Partial Power-Down 102 102 μW typ VDD = 3 V
Full Power-Down 7.2 7.2 μW max VDD = 3.6 V, −40°C to +85°C
1
Y Grade specifications are guaranteed by characterization.
2
Temperature range from −40°C to +125°C.
3
Typical specifications are tested with VDD = 3 V and at 25°C.
4
See the Terminology section.
5
Guaranteed by characterization.
6
See the Power vs. Throughput Rate section.
Rev. C | Page 4 of 28
AD7276/AD7277/AD7278
AD7277 SPECIFICATIONS
VDD = 2.35 V to 3.6 V, f
= 48 MHz, f
SCLK
= 3 MSPS, TA = T
SAMPLE
MIN
to T
, unless otherwise noted.
MAX
Table 3.
Parameter A Grade
1, 2
B Grade
1, 2
Unit Test Conditions/Comments
DYNAMIC PERFORMANCE fIN = 1 MHz sine wave
Signal-to-Noise + Distortion (SINAD)3 60.5 60.5 dB min
Total Harmonic Distortion (THD)3 −70 −1 dB max
−76 −76 dB typ
Peak Harmonic or Spurious Noise (SFDR)3 −80 −80 dB typ
Intermodulation Distortion (IMD)3
Second-Order Terms −82 −82 dB typ fa = 1 MHz, fb = 0.97 MHz
Third-Order Terms −82 −82 dB typ fa = 1 MHz, fb = 0.97 MHz
Aperture Delay 5 5 ns typ
Aperture Jitter 18 18 ps typ
Full Power Bandwidth 74 74 MHz typ @ 3 dB
10 10 MHz typ @ 0.1 dB
DC ACCURACY
Resolution 10 10 Bits
Integral Nonlinearity3 ±0.5 ±0.5 LSB max
Differential Nonlinearity3 ±0.5 ±0.5 LSB max Guaranteed no missed codes to 10 bits
Offset Error3 ±1.5 ±1 LSB max
Gain Error3 ±2 ±1.5 LSB max
Total Unadjusted Error (TUE)3 ±2.5 ±2.5 LSB max
ANALOG INPUT
Input Voltage Ranges 0 to VDD 0 to VDD V
DC Leakage Current ±1 ±1 μA max −40°C to +85°C
±5.5 ±5.5 μA max 85°C to 125°C
Input Capacitance 42 42 pF typ When in track
10 10 pF typ When in hold
LOGIC INPUTS
Input High Voltage, V
1.7 1.7 V min 2.35 V ≤ VDD ≤ 2.7 V
INH
2 2 V min 2.7 V < VDD ≤ 3.6 V
Input Low Voltage, V
0.7 0.7 V max 2.35 V ≤ VDD ≤ 2.7 V
INL
0.8 0.8 V max 2.7 V < VDD ≤ 3.6 V
Input Current, IIN ±1 ±1 μA max Typically 10 nA, VIN = 0 V or VDD
Input Capacitance, C
4
2 2 pF typ
IN
LOGIC OUTPUTS
Output High Voltage, VOH V
Output Low Voltage, VOL 0.2 0.2 V max I
− 0.2 VDD − 0.2 V min I
DD
= 200 μA, VDD = 2.35 V to 3.6 V
SOURCE
= 200 μA
SINK
Floating-State Leakage Current ±2.5 ±2.5 μA max
Floating-State Output Capacitance4 4.5 4.5 pF typ
Output Coding Straight (natural) binary
CONVERSION RATE
Conversion Time 250 250 ns max 12 SCLK cycles with SCLK at 48 MHz
Track-and-Hold Acquisition Time3 60 60 ns min
Throughput Rate 3.45 3.45 MSPS max SCLK at 48 MHz
Rev. C | Page 5 of 28
AD7276/AD7277/AD7278
Parameter A Grade
1, 2
B Grade
1, 2
Unit Test Conditions/Comments
POWER REQUIREMENTS
VDD 2.35/3.6 2.35/3.6 V min/max
IDD Digital I/Ps 0 V or VDD
Normal Mode (Static) 0.6 0.6 mA typ VDD = 3.6 V, SCLK on or off
Normal Mode (Operational) 5.5 5.5 mA max VDD = 2.35 V to 3.6 V, f
SAMPLE
= 3 MSPS
3.5 3.5 mA typ VDD = 3 V
Partial Power-Down Mode (Static) 34 34 μA typ
Full Power-Down Mode (Static) 2 2 μA max −40°C to +85°C, typically 0.1 μA
10 10 μA max 85°C to 125°C
Power Dissipation5
Normal Mode (Operational) 19.8 19.8 mW max VDD = 3.6 V, f
SAMPLE
= 3 MSPS
10.5 10.5 mW typ VDD = 3 V
Partial Power-Down 102 102 μW typ VDD = 3 V
Full Power-Down 7.2 7.2 μW max VDD = 3.6 V, −40°C to +85°C
1
Temperature range from −40°C to +125°C.
2
Typical specifications are tested with VDD = 3 V and at 25°C.
3
See the Terminology section.
4
Guaranteed by characterization.
5
See the Power vs. Throughput Rate section.
Rev. C | Page 6 of 28
AD7276/AD7277/AD7278
AD7278 SPECIFICATIONS
VDD = 2.35 V to 3.6 V, f
= 48 MHz, f
SCLK
= 3 MSPS, TA = T
SAMPLE
MIN
to T
, unless otherwise noted.
MAX
Table 4.
Parameter A Grade
1, 2
B Grade
1, 2
Unit Test Conditions/Comments
DYNAMIC PERFORMANCE fIN = 1 MHz sine wave
Signal-to-Noise + Distortion (SINAD)3 49 49 dB min
Total Harmonic Distortion (THD)3 −66 −67 dB max
−73 −73 dB typ
Peak Harmonic or Spurious Noise (SFDR)3 −69 −69 dB typ
Intermodulation Distortion (IMD)3
Second-Order Terms −76 −76 dB typ fa = 1 MHz, fb = 0.97 MHz
Third-Order Terms −76 −76 dB typ fa = 1 MHz, fb = 0.97 MHz
Aperture Delay 5 5 ns typ
Aperture Jitter 18 18 ps typ
Full Power Bandwidth 74 74 MHz typ @ 3 dB
Full Power Bandwidth 10 10 MHz typ @ 0.1 dB
DC ACCURACY
Resolution 8 8 Bits
Integral Nonlinearity3 ±0.2 ±0.2 LSB max
Differential Nonlinearity3 ±0.3 ±0.3 LSB max Guaranteed no missed codes to 8 bits
Offset Error3 ±0.9 ±0.5 LSB max
Gain Error3 ±1.2 ±1 LSB max
Total Unadjusted Error (TUE)3 ±1.5 ±1.5 LSB max
ANALOG INPUT
Input Voltage Ranges 0 to VDD 0 to VDD V
DC Leakage Current ±1 ±1 μA max −40°C to +85°C
±5.5 ±5.5 μA max 85°C to 125°C
Input Capacitance 42 42 pF typ When in track
10 10 pF typ When in hold
LOGIC INPUTS
Input High Voltage, V
1.7 1.7 V min 2.35 V ≤ VDD ≤ 2.7 V
INH
2 2 V min 2.7 V < VDD ≤ 3.6 V
Input Low Voltage, V
0.7 0.7 V max 2.35 V ≤ VDD ≤ 2.7 V
INL
0.8 0.8 V max 2.7 V < VDD ≤ 3.6 V
Input Current, IIN ±1 ±1 μA max
Input Capacitance, C
4
2 2 pF typ
IN
LOGIC OUTPUTS
Output High Voltage, VOH V
Output Low Voltage, VOL 0.2 0.2 V max I
− 0.2 VDD − 0.2 V min I
DD
= 200 μA, VDD = 2.35 V to 3.6 V
SOURCE
= 200 μA
SINK
Floating-State Leakage Current ±2.5 ±2.5 μA max
Floating-State Output Capacitance4 4.5 4.5 pF typ
Output Coding Straight (natural) binary
CONVERSION RATE
Conversion Time 208 208 ns max 10 SCLK cycles with SCLK at 48 MHz
Track-and-Hold Acquisition Time3 60 60 ns min
Throughput Rate 4 4 MSPS max SCLK at 48 MHz
Rev. C | Page 7 of 28
AD7276/AD7277/AD7278
Parameter A Grade
1, 2
B Grade
1, 2
Unit Test Conditions/Comments
POWER REQUIREMENTS
VDD 2.35/3.6 2.35/3.6 V min/max
IDD Digital I/Ps = 0 V or VDD
Normal Mode (Static) 0.5 0.5 mA typ VDD = 3.6 V, SCLK on or off
Normal Mode (Operational) 5.5 5.5 mA max VDD = 2.35 V to 3.6 V, f
SAMPLE
= 3 MSPS
3.5 3.5 mA typ VDD = 3 V
Partial Power-Down Mode (Static) 34 34 μA typ
Full Power-Down Mode (Static) 2 2 μA max −40°C to +85°C, typically 0.1 μA
10 10 μA max +85°C to +125°C
Power Dissipation5
Normal Mode (Operational) 19.8 19.8 mW max VDD = 3.6 V, f
SAMPLE
= 3 MSPS
10.5 10.5 mW typ VDD = 3 V
Partial Power-Down 102 102 μW typ VDD = 3 V
Full Power-Down 7.2 7.2 μW max VDD = 3.6 V, −40°C to +85°C
1
Temperature range from −40°C to +125°C.
2
Typical specifications are tested with VDD = 3 V and at 25°C.
3
See the Terminology section.
4
Guaranteed by characterization.
5
See the Power vs. Throughput Rate section.
TIMING SPECIFICATIONS—AD7276/AD7277/AD7278
VDD = 2.35 V to 3.6 V, TA = T
MIN
to T
, unless otherwise noted.1
MAX
Table 5.
Parameter2 Limit at T
3
f
500 kHz min4
SCLK
MIN
, T
Unit Description
MAX
48 MHz max B grade
16 MHz max Y grade
t
14 × t
CONVER T
12 × t
10 × t
t
4 ns min
QUIET
AD7276
SCLK
AD7277
SCLK
AD7278
SCLK
Minimum quiet time required between the bus relinquish and the
start of the next conversion
t1 3 ns min
t2 6 ns min
5
t
4 ns max
3
5
t
15 ns max Data access time after SCLK falling edge
4
t5 0.4 t
t6 0.4 t
5
t
5 ns min SCLK to data valid hold time
7
ns min SCLK low pulse width
SCLK
ns min SCLK high pulse width
SCLK
Minimum CS
to SCLK setup time
CS
Delay from CS
pulse width
until SDATA three-state disabled
t8 14 ns max SCLK falling edge to SDATA three-state
5 ns min SCLK falling edge to SDATA three-state
t
9
T
POWER-UP
1
Sample tested during initial release to ensure compliance. All timing specifications given are with a 10 pF load capacitance. With a load capacitance greater than this
value, a digital buffer or latch must be used.
2
Guaranteed by characterization. All input signals are specified with tr = tf = 2 ns (10% to 90% of VDD) and timed from a voltage level of 1.6 V.
3
Mark/space ratio for the SCLK input is 40/60 to 60/40.
4
Minimum f
5
The time required for the output to cross the VIH or VIL voltage.
6
See the Power-Up Times section.
4.2 ns max
6
1 μs max Power-up time from full power-down
at which specifications are guaranteed.
SCLK
rising edge to SDATA three-state
CS
Rev. C | Page 8 of 28
AD7276/AD7277/AD7278
t
SCLK
SDATA
SCLK
SDATA
4
Figure 2. Access Time After SCLK Falling Edge
t
7
V
IH
V
IL
Figure 3. Hold Time After SCLK Falling Edge
SCLK
V
IH
V
IL
04903-002
SDATA
Figure 4. SCLK Falling Edge SDATA Three-State
04903-003
t
8
1.4V
04903-004
Rev. C | Page 9 of 28
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