TLV5625
2.7-V TO 5.5-V LOW-POWER DUAL 8-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS233A – JULY 1999 – REVISED MARCH 2000
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
features
D
Dual 8-Bit Voltage Output DAC
D
Programmable Internal Reference
D
Programmable Settling Time
– 2.5 µs in Fast Mode
– 12 µs in Slow Mode
D
Compatible With TMS320 and SPI Serial
Ports
D
Differential Nonlinearity <0.2 LSB Max
D
Monotonic Over Temperature
applications
D
Digital Servo Control Loops
D
Digital Offset and Gain Adjustment
D
Industrial Process Control
D
Machine and Motion Control Devices
D
Mass Storage Devices
description
The TLV5625 is a dual 8-bit voltage output DAC
with a flexible 3-wire serial interface. The serial
interface is compatible with TMS320, SPI,
QSPI, and Microwire serial ports. It is
programmed with a 16-bit serial string containing
4 control and 8 data bits.
The resistor string output voltage is buffered by an x2 gain rail-to-rail output buffer. The buffer features a
Class-AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC
allows the designer to optimize speed versus power dissipation.
Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It
is available in an 8-pin SOIC package in standard commercial and industrial temperature ranges.
AVAILABLE OPTIONS
PACKAGE
T
A
SOIC
(D)
0°C to 70°C TLV5625CD
–40°C to 85°C TLV5625ID
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCT PREVIEW
Copyright 2000, Texas Instruments Incorporated
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
1
2
3
4
8
7
6
5
DIN
SCLK
CS
OUTA
V
DD
OUTB
REF
AGND
D PACKAGE
(TOP VIEW)
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
TLV5625
2.7-V TO 5.5-V LOW-POWER DUAL 8-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS233A – JULY 1999 – REVISED MARCH 2000
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
functional block diagram
Serial
Interface
and
Control
8-Bit
DAC B
Latch
SCLK
DIN
CS
OUTA
Power-On
Reset
x2
8
Power and
Speed Control
2
8-Bit
DAC A
Latch
8
REF AGND V
DD
8 8
OUTB
x2
Buffer
8
Terminal Functions
TERMINAL
AGND 5 P Ground
CS 3 I Chip select. Digital input active low, used to enable/disable inputs.
DIN 1 I Digital serial data input
OUTA 4 O DAC A analog voltage output
OUTB 7 O DAC B analog voltage output
REF 6 I Analog reference voltage input
SCLK 2 I Digital serial clock input
V
DD
8 P Positive power supply
PRODUCT PREVIEW
TLV5625
2.7-V TO 5.5-V LOW-POWER DUAL 8-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS233A – JULY 1999 – REVISED MARCH 2000
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
†
Supply voltage (VDD to AGND) 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference input voltage range – 0.3 V to VDD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range – 0.3 V to V
DD
+ 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: TLV5625C 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TLV5625I –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
MIN NOM MAX UNIT
DD
VDD = 3 V 2.7 3 3.3
Power on reset, POR 0.55 2 V
High-level digital input voltage, V
IH
VDD = 2.7 V to 5.5 V 2 V
Low-level digital input voltage, V
IL
VDD = 2.7 V to 5.5 V 0.8 V
Reference voltage, V
ref
to REF terminal VDD = 5 V (see Note 1) AGND 2.048 VDD–1.5 V
Reference voltage, V
ref
to REF terminal VDD = 3 V (see Note 1) AGND 1.024 VDD–1.5 V
Load resistance, R
L
2 kΩ
Load capacitance, C
L
100 pF
Clock frequency, f
CLK
20 MHz
Operating free-air temperature, T
NOTE 1: Due to the x2 output buffer, a reference input voltage ≥ (VDD–0.4 V)/2 causes clipping of the transfer function.
PRODUCT PREVIEW
TLV5625
2.7-V TO 5.5-V LOW-POWER DUAL 8-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS233A – JULY 1999 – REVISED MARCH 2000
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions (unless otherwise noted)
power supply
PARAMETER TEST CONDITIONS MIN TYP MAX
UNIT
No load, All inputs = AGND or VDD,
Fast 1.8 2.3
Power-down supply current 1 3 µA
Zero scale, See Note 2 –65
Power supply rejection ratio
Full scale, See Note 3 –65
NOTES: 2. Power supply rejection ratio at zero scale is measured by varying VDD and is given by:
PSRR = 20 log [(EZS(VDDmax) – EZS(VDDmin)/VDDmax]
3. Power supply rejection ratio at full scale is measured by varying VDD and is given by:
PSRR = 20 log [(EG(VDDmax) – EG(VDDmin)/VDDmax]
static DAC specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Resolution 8 bits
INL Integral nonlinearity See Note 4 ±0.3 ±0.5 LSB
DNL Differential nonlinearity See Note 5 ±0.07 ±0.2 LSB
E
ZS
Zero-scale error (offset error at zero scale) See Note 6 ±12 mV
EZS TC Zero-scale-error temperature coefficient See Note 7 10 ppm/°C
E
G
Gain error See Note 8 ±0.5
% full
scale V
EG TCGain-error temperature coefficient See Note 9 10 ppm/°C
NOTES: 4. The relative accuracy of integral nonlinearity (INL), sometimes referred to as linearity error , is the maximum deviation of the output
from the line between zero and full scale, excluding the effects of zero-code and full-scale errors.
5. The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal
1-LSB amplitude change of any two adjacent codes.
6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
7. Zero-scale error temperature coef ficient is given by: EZS TC = [EZS (T
max) – EZS
(T
min
)]/2V
ref
× 106/(T
max
– T
min
).
8. Gain error is the deviation from the ideal output (2V
ref
– 1 LSB) with an output load of 10 kΩ.
9. Gain temperature coefficient is given by: EG TC = [EG (T
max) – Eg
(T
min
)]/2V
ref
× 106/(T
max
– T
min
).
output specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
O
Output voltage range RL = 10 kΩ 0 VDD–0.4 V
Output load regulation accuracy VO = 4.096 V , 2.048 V RL = 2 kΩ ±0.29 % FS
reference input
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VIInput voltage range 0 V
DD–1.5
V
RIInput resistance 10 MΩ
CIInput capacitance 5 pF
Reference input bandwidth
Slow 525 kHz
Reference feedthrough REF = 1 Vpp at 1 kHz + 1.024 V dc (see Note 10) –80 dB
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.
PRODUCT PREVIEW
TLV5625
2.7-V TO 5.5-V LOW-POWER DUAL 8-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS233A – JULY 1999 – REVISED MARCH 2000
5
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions (unless otherwise noted)
(Continued)
digital inputs
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
I
IH
High-level digital input current VI = V
DD
1 µA
I
IL
Low-level digital input current VI = 0 V –1 µA
C
i
Input capacitance 8 pF
analog output dynamic performance
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Output settling time, full scale
Output settling time, code to code
Glitch energy
DIN = 0 to 1, FCLK = 100 kHz,
CS
= V
DD
5 nV–s
SNR Signal-to-noise ratio 52 54
SINAD Signal-to-noise + distortion
f
THD Total harmonic distortion
RL = 10 kΩ,CL = 100 pF
–50 –48
SFDR Spurious free dynamic range 48 50
NOTES: 11. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change
of 0x020 to 0xFDF and 0xFDF to 0x020 respectively. Not tested, assured by design.
12. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change
of one count. Not tested, assured by design.
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% of full-scale voltage.
PRODUCT PREVIEW