73 dB Spurious Free Dynamic Range at
fin = 15.5 MHz
D
5 V Analog and Digital Supply
D
3 V and 5 V CMOS Compatible Digital
Output
D
9.5 Bit ENOB at fIN = 31 MHz
D
60 dB SNR at fIN = 31 MHz
D
82 MHz Bandwidth
D
Internal or External Reference
D
Buffered 900 Ω Differential Analog Input
applications
D
Wireless Local Loop
D
Wireless Internet Access
D
Cable Modem Receivers
D
Medical Ultrasound
D
Magnetic Resonant Imaging
description
The THS1060 is a high speed low noise 10-bit CMOS pipelined analog-to-digital converter. A dif ferential sample
and hold minimizes even order harmonics and allows for a high degree of common mode rejection at the analog
input. A buffered analog input allows for operation with a constant analog input impedance, and prevents
transient voltage spikes from feeding backward to the analog input source. Full temperature DNL performance
allows for industrial application with the assurance of no missing codes. The THS1060 can operate with either
internal or external references. Internal reference usage selection is accomplished simply by externally
connecting reference output terminals to reference input terminals. Packaged in a small 48-pin quad flat-pack,
the THS1060 makes use of Texas Instruments PowerPAD technology. The die of the THS1060 is bonded
directly to a copper alloy plate which is exposed on the bottom of the package. When soldered to a ground land,
the PowerPAD provides superior heat dissipation and thermal performance ideal for industrial applications
in high temperature environments.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 2000, Texas Instruments Incorporated
1
THS1060
10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS
ANALOG-TO-DIGITAL CONVERTER
10OBand gap reference. Bypass to ground with a 1 µF and a 0.01 µF chip capacitor.
48OCommon mode voltage output. Bypass to ground with a 0.1 µF and a 0.01 µF chip device capacitor.
3IAnalog signal input
4IComplementary analog signal input
7IExternal reference input low
8IExternal reference input high
9OInternal reference output. Compensate with a 1 µF and a 0.01 µF chip capacitor.
6OInternal reference output. Compensate with a 1 µF and a 0.01 µF chip capacitor.
IAnalog power supply
IAnalog ground return for internal analog circuitry
THS1060
SLAS212 – MARCH 2000
detailed description
The THS1060 uses a differential pipeline architecture and assures no missing codes over the full operating
temperature range. The device uses a 1 bit per stage architecture in order to achieve the highest possible
bandwidth. The differential analog inputs are terminated with a 900 Ω resistor . The inputs are then fed to a unity
gain buffer followed by the S/H (sample and hold) stage. This S/H stage is a switched capacitor op-amp based
circuit, see Figure 3. The pipeline is a typical 1 bit per stage pipeline as shown in the functional block diagram.
The digital output of the 10 stages and the last 1 bit flash are sent to a digital correction logic block which then
outputs the final 10 bits.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
THS1060
10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS
ANALOG-TO-DIGITAL CONVERTER
SLAS212 – MARCH 2000
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
PARAMETERMINNOMMAXUNIT
Sample rate160MSPS
Analog supply voltage, AV
Digital supply voltage, DV
Digital output driver supply voltage, DRV
CLK + high level input voltage, V
CLK + low-level input voltage, V
CLK – high-level input voltage, V
CLK – low-level input voltage, V
CLK pulse-width high, t
CLK pulse-width low, t
Operating free-air temperature range, T
Operating free-air temperature range, T
DD
DD
IH
IL
IH
IL
p(H)
p(L)
DD
THS1060C070°C
A
THS1060I–4085°C
A
4.7555.25V
4.7555.25V
33.35.25V
455.5V
01V
455.5V
01V
7.58.3ns
7.58.3ns
electrical characteristics, over recommended operating free-air temperature range,
AV
The analog input frequency at which the spectral power of the fundamental frequency of a large input signal
is reduced by 3 dB.
aperture delay
The delay between the 50% point of the rising edge of the clock and the instant at which the analog input is
sampled.
aperture uncertainity (jitter)
The sample-to-sample variation in aperture delay
differential nonlinearity
The average deviation of any output code from the ideal width of 1 LSB.
clock pulse width/duty cycle
Pulse width high is the minimum amount of time that the clock pulse should be left in logic 1 state to achieve
rated performance; pulse width low is the minimum time clock pulse should be left in low state. At a given clock
rate, these specs define acceptable clock duty cycles.
offset error
The difference between the analog input voltage at which the analog-to-digital converter output changes from
negative full scale, to one LSB above negative full scale, and the ideal voltage at which this transition should
occur.
THS1060
gain error
The maximum error in LSBs between a digitized ideal full scale low frequency offset corrected triangle wave
analog input, from the ideal digitized full scale triangle wave, divided by the full scale range, in this case 1024.
harmonic distortion
The ratio of the power of the fundamental to a given harmonic component reported in dBc.
integral nonlinearity
The deviation of the transfer function from an end-point adjusted reference line measured in fractions of 1 LSB.
Also the integral of the DNL curve.
output delay
The delay between the 50% point of the falling edge of the clock and signal and the time when all output data
bits are within valid logic levels (not including pipeline delay).
signal-to-noise-and distortion (SINAD)
When tested with a single tone, the ratio of the signal power to the sum of the power of all other spectral
components, excluding dc, referenced to full scale.
signal-to-noise ratio (SNR)
When tested with a single tone, the ratio of the signal power to the sum of the power of all other power spectral
components, excluding dc and the first 9 harmonics, referenced to full scale.
effective number of bits (ENOB)
For a sine wave, SINAD can be expressed in terms of the number of bits, using the following formula,
ENOB
(
SINAD*1.76
+
6.02
)
spurious-free dynamic range (SFDR)
The ratio of the signal power to the power of the worst spur, excluding dc. The worst spurious component may
or may not be a harmonic. The ratio is reported in dBc (that is, degrades as signal levels are lowered).
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
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