Samsung M378B5173EB0-CK0 User Manual

Rev. 1.1, Apr. 2014
M378B5173EB0 M378B1G73EB0
240pin Unbuffered DIMM
based on 4Gb E-die
78FBGA with Lead-Free & Halogen-Free (RoHS compliant)
datasheet
SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE.
1.35V
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- 1 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM
Revision History
Revision No. History Draft Date Remark Editor
1.0 - First SPEC Release Oct. 2014 - J.Y.Lee
1.1 - Added to 1866(13-13-13) speed from Product line-up Apr. 2015 - J.Y.Lee
- 2 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM
Table Of Contents
240pin Unbuffered DIMM based on 4Gb E-die
1. DDR3L Unbuffered DIMM Ordering Information...........................................................................................................4
2. Key Features.................................................................................................................................................................4
3. Address Configuration ..................................................................................................................................................4
4. x64 DIMM Pin Configurations (Front side/Back side) ...................................................................................................5
5. Pin Description .............................................................................................................................................................6
6. SPD and Thermal Sensor for ECC UDIMMs ................................................................................................................6
7. Input/Output Functional Description..............................................................................................................................7
7.1 Address Mirroring Feature.......................................................................................................................................8
7.1.1. DRAM Pin Wiring Mirroring .............................................................................................................................. 8
8. Function Block Diagram:...............................................................................................................................................9
8.1 4GB, 512Mx64 Non ECC Module (Populated as 1 rank of x8 DDR3 SDRAMs)..................................................... 9
8.2 8GB, 1Gx64 Non ECC Module (Populated as 2 ranks of x8 DDR3 SDRAMs) .......................................................10
9. Absolute Maximum Ratings ..........................................................................................................................................14
9.1 Absolute Maximum DC Ratings............................................................................................................................... 14
9.2 DRAM Component Operating Temperature Range ................................................................................................14
10. AC & DC Operating Conditions...................................................................................................................................14
10.1 Recommended DC Operating Conditions .............................................................................................................14
11. AC & DC Input Measurement Levels ..........................................................................................................................15
11.1 AC & DC Logic Input Levels for Single-ended Signals..........................................................................................15
11.2 VREF Tolerances .................................................................................................................................................. 17
11.3 AC and DC Logic Input Levels for Differential Signals ..........................................................................................18
11.3.1. Differential Signals Definition ......................................................................................................................... 18
11.3.2. Differential Swing Requirement for Clock (CK -
11.3.3. Single-ended Requirements for Differential Signals ......................................................................................20
11.3.4. Differential Input Cross Point Voltage ............................................................................................................ 21
11.4 Slew Rate Definition for Single Ended Input Signals.............................................................................................22
11.5 Slew rate definition for Differential Input Signals ................................................................................................... 22
12. AC & DC Output Measurement Levels .......................................................................................................................22
12.1 Single Ended AC and DC Output Levels...............................................................................................................22
12.2 Differential AC and DC Output Levels ................................................................................................................... 22
12.3 Single-ended Output Slew Rate ............................................................................................................................ 23
12.4 Differential Output Slew Rate ................................................................................................................................ 24
13. IDD specification definition..........................................................................................................................................25
14. IDD SPEC Table .........................................................................................................................................................27
15. Input/Output Capacitance ...........................................................................................................................................29
16. Electrical Characteristics and AC timing .....................................................................................................................30
16.1 Refresh Parameters by Device Density................................................................................................................. 30
16.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin ................................................................30
16.3 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin ................................................................30
16.3.1. Speed Bin Table Notes .................................................................................................................................. 34
17. Timing Parameters by Speed Grade ..........................................................................................................................35
17.1 Jitter Notes ............................................................................................................................................................39
17.2 Timing Parameter Notes........................................................................................................................................ 40
18. Physical Dimensions...................................................................................................................................................41
18.1 512Mbx8 based 512Mx64 Module (1 Rank) - M378B5173EB0 ............................................................................41
18.2 512Mbx8 based 1Gx64 Module (2 Ranks) - M378B1G73EB0..............................................................................42
CK) and Strobe (DQS - DQS) ............................................. 18
- 3 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

1. DDR3L Unbuffered DIMM Ordering Information

Part Number
M378B5173EB0-YK0/MA 4GB 512Mx64 512Mx8(K4B4G0846E-BY##)*8 1 30mm
M378B1G73EB0-YK0/MA 8GB 1Gx64 512Mx8(K4B4G0846E-BY##)*16 2 30mm
NOTE :
1. "##" - K0/MA
2. K0(1600Mbps 11-11-11) / CMA(1866Mbps 13-13-13)
- DDR3-1866(13-13-13) is backward compatible to DDR3-1600(11-11-11)
2
Density Organization
Component Composition
1
Number of
Rank

2. Key Features

Speed
tCK(min) 2.5 1.875 1.5 1.25 1.071 ns
CAS Latency 6 7 9 11 13 nCK
tRCD(min) 15 13.125 13.5 13.75 13.91 ns
tRP(min) 15 13.125 13.5 13.75 13.91 ns
tRAS(min) 37.5 37.5 36 35 34 ns
tRC(min) 52.5 50.625 49.5 48.75 47.91 ns
DDR3-800 DDR3-1066 DDR3-1333 DDR3-1600 DDR3-1866
6-6-6 7-7-7 9-9-9 11-11-11 13-13-13
Height
Unit
• JEDEC standard 1.35V(1.28V~1.14V) & 1.5V(1.425V~1.575V) Power Supply
•V
• 400MHz fCK for 800Mb/sec/pin, 533MHz fCK for 1066Mb/sec/pin, 667MHz fCK for 1333Mb/sec/pin, 800MHz fCK for 1600Mb/sec/pin, 933MHz fCK for
• 8 independent internal bank
• Programmable CAS Latency: 6,7,8,9,10,11,13
• Programmable Additive Latency(Posted CAS) : 0, CL - 2, or CL - 1 clock
• Programmable CAS Write Latency(CWL) = 5 (DDR3-800), 6 (DDR3-1066), 7 (DDR3-1333) ,8 (DDR3-1600) and 9(DDR3-1866)
• Burst Length: 8 (Interleave without any limit, sequential with starting address “000” only), 4 with tCCD = 4 which does not allow seamless read or
• Bi-directional Differential Data Strobe
• On Die Termination using ODT pin
• Average Refresh Period 7.8us at lower then T
• Asynchronous Reset
= 1.35V(1.28V~1.14V) & 1.5V(1.425V~1.575V)
DDQ
1866Mb/sec/pin
write [either On the fly using A12 or MRS]
85C, 3.9us at 85C < T
CASE
CASE
95C

3. Address Configuration

Organization Row Address Column Address Bank Address Auto Precharge
512Mx8(4Gb) based Module A0-A15 A0-A9 BA0-BA2 A10/AP
- 4 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

4. x64 DIMM Pin Configurations (Front side/Back side)

Pin Front Pin Back Pin Front Pin Back Pin Front Pin Back
1
2
V
REFDQ
121
V
SS
122 DQ4 43 NC 163
3 DQ0 123 DQ5 44
4 DQ1 124
5
6
V
SS
125 DM0 46 NC 166
DQS0 126 NC 47
7 DQS0 127
8
V
SS
128 DQ6 KEY 89
9 DQ2 129 DQ7 49 NC 169
10 DQ3 130
11
V
SS
131 DQ12 51
12 DQ8 132 DQ13 52 BA2 172 A14 93
13 DQ9 133
14
15
V
SS
134 DM1 54
DQS1 135 NC 55 A11 175 A9 96 DQ42 216 DQ47
16 DQS1 136
17
V
SS
137 DQ14 57
18 DQ10 138 DQ15 58 A5 178 A6 99 DQ48 219 DQ53
19 DQ11 139
20
V
SS
140 DQ20 60
21 DQ16 141 DQ21 61 A2 181 A1 102
22 DQ17 142
23
24
V
SS
143 DM2 63
DQS2 144 NC 64
25 DQS2 145
26
V
SS
146 DQ22 66
27 DQ18 147 DQ23 67
28 DQ19 148
29
V
SS
149 DQ28 69
30 DQ24 150 DQ29 70 A10/AP 190 BA1 111
31 DQ25 151
32
33
V
SS
152 DM3 72
DQS3 153 NC 73 WE 193 S0 114 DQ58 234 DQ63
34 DQS3 154
35
V
SS
155 DQ30 75
36 DQ26 156 DQ31 76
37 DQ27 157
38
V
SS
158 NC 78
39 NC 159 NC 79 NC 199
40 NC 160
41
V
SS
161 NC 81 DQ32 201 DQ37
NOTE : NC = No Connect; NU = Not Used; RFU = Reserved Future Use
S1, ODT1, CKE1: Used for dual-rank UDIMMs; NC on single-rank UDIMMs
1.
2. CK1,NC and
CK1,NC : Used for dual-rank UDIMMs; not used on single-rank UDIMMs, but terminated
3. TEST (pin 167) used by memory bus analysis tools (unused on memory DIMMs)
V
SS
V
SS
V
SS
V
SS
42 NC 162 NC 82 DQ33 202
V
SS
V
SS
164 NC 84 DQS4 204 NC
83
V
SS
203 DM4
45 NC 165 NC 85 DQS4 205
V
SS
V
SS
167
NC (TEST)
86
3
87 DQ34 207 DQ39
V
SS
206 DQ38
48 NC 168 Reset 88 DQ35 208
50 CKE0 170
V
DD
171 A15 92
CKE1,NC
V
DD
V
SS
1
90 DQ40 210 DQ45
91 DQ41 211
V
SS
209 DQ44
212 DM5
DQS5 213 NC
V
SS
V
SS
V
SS
53 NC 173
V
DD
174 A12/BC 95
56 A7 176
V
DD
177 A8 98
59 A4 179
V
DD
180 A3 101
V
DD
V
DD
V
DD
94 DQS5 214
V
SS
215 DQ46
97 DQ43 217
V
SS
218 DQ52
100 DQ49 220
V
SS
221 DM6
DQS6 222 NC
V
SS
V
SS
V
SS
62
65
68 NC 188 A0 109 DQ57 229
V
DD
CK1,NC
CK1,NC
V
DD
V
DD
CA
V
REF
V
DD
182
183
184 CK0 105 DQ50 225 DQ55
185 CK0 106 DQ51 226
186
187 NC 108 DQ56 228 DQ61
189
V
DD
V
DD
V
DD
V
DD
103 DQS6 223
104
107
110
V
SS
V
SS
V
SS
224 DQ54
227 DQ60
230 DM7
DQS7 231 NC
V
SS
V
SS
V
SS
V
SS
71 BA0 191
V
DD
192 RAS 113
74 CAS 194
V
DD
1
S1, NC
77
80
ODT1, NC
V
DD
V
SS
195 ODT0 116
196 A13 117 SA0 237 SA1
1
197
198 NC 119 SA2 239
200 DQ36
V
DD
V
DD
V
DD
V
SS
112 DQS7 232
V
SS
233 DQ62
115 DQ59 235
V
SS
236
118 SCL 238 SDA
120
V
TT
240
V
V
V
V
V
V
V
V
V
V
V
V
V
DDSPD
V
V
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
TT
SAMSUNG ELECTRONICS CO., Ltd. reserves the right to change products and specifications without notice.
- 5 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

5. Pin Description

Pin Name Description Pin Name Description
A0-A15 SDRAM address bus SCL
BA0-BA2 SDRAM bank select SDA
RAS SDRAM row address strobe SA0-SA2
CAS SDRAM column address strobe
WE SDRAM write enable
S0, S1 DIMM Rank Select Lines
CKE0,CKE1 SDRAM clock enable lines
ODT0, ODT1 On-die termination control lines
DQ0 - DQ63 DIMM memory data bus
CB0 - CB7 DIMM ECC check bits NC Spare Pins(no connect)
DQS0 - DQS8
DQS0-DQS8
DM0-DM8
CK0, CK1
CK0, CK1
SDRAM data strobes (positive line of differential pair)
SDRAM differential data strobes (negative line of differential pair)
SDRAM data masks/high data strobes (x8-based x72 DIMMs)
SDRAM clocks (positive line of differential pair)
SDRAM clocks (negative line of differential pair)
VDD*
*
V
DDQ
V
REFDQ
V
REFCA
V
SS
V
DDSPD
TEST
RESET Set DRAMs Known State
EVENT Reserved for optional temperature-sensing hardware
V
TT
RFU Reserved for future use
I2C serial bus clock for EEPROM
2
I
C serial bus data line for EEPROM
I2C serial address select for EEPROM
SDRAM core power supply
SDRAM I/O Driver power supply
SDRAM I/O reference supply
SDRAM command/address reference supply
Power supply return (ground)
Serial EEPROM positive power supply
Used by memory bus analysis tools (unused on memory DIMMs)
SDRAM I/O termination supply
NOTE : *The V
DD
** DQS8,
and V
DQS8, DM8 arefor ECC UDIMM only
pins are tied common to a single power-plane on these designs.
DDQ

6. SPD and Thermal Sensor for ECC UDIMMs

On DIMM thermal sensor will provide DRAM temperature readout through a integrated thermal sensor.
SCL
EVENT
NOTE :
1. Raw Cards D (1Rx8 ECC) and E (2Rx8 ECC) support a thermal sensor.
2. When the SPD and the thermal sensor are placed on the module, R1 is placed but R2 is not. When only the SPD is placed on the module, R2 is placed but R1 is not.
[ Table 1 ] Temperature Sensor Characteristics
Grade Range
75 < Ta < 95 - +/- 0.5 +/- 1.0
B
40 < Ta < 125 - +/- 1.0 +/- 2.0 -
-20 < Ta < 125 - +/- 2.0 +/- 3.0 -
Resolution 0.25 C /LSB -
R1 0
R2 0
EVENT
WP/
SA0 SA1 SA2
SA0 SA1 SA2
Temperature Sensor Accuracy
Min. Typ. Max.
SDA
Units NOTE
-
C
- 6 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

7. Input/Output Functional Description

Symbol Type Function
CK0-CK1 CK0-CK1
CKE0-CKE1 SSTL
S0-S1 SSTL
RAS, CAS, WE SSTL RAS, CAS, and WE (ALONG WITH S) define the command being entered.
ODT0-ODT1 SSTL
V
REFDQ
V
REFCA
V
DDQ
BA0-BA2 SSTL Selects which SDRAM bank of eight is activated.
A0-A15 SSTL
DQ0-DQ63 CB0-CB7
DM0-DM8
VDD,V
DQS0-DQS8
DQS0-DQS8
SA0-SA2 -
SDA -
SCL -
V
DDSPD
RESET - The RESET pin is connected to the RESET pin on each DRAM. When low, all DRAMs are set to a know state.
EVENT Output
NOTE :
1. DM8, DQS8 and
1
SS
1
1
SSTL
Supply Reference voltage for SSTL 15 I/O inputs.
Supply Reference voltage for SSTL 15 command/address inputs.
Supply
SSTL Data and Check Bit Input/Output pins.
SSTL
Supply
SSTL Data strobe for input and output data.
Supply
DQS8 are for ECC UDIMM only
CK and CK are differential clock inputs. All the DDR3 SDRAM addr/cntl inputs are sampled on the crossing of positive edge of CK and negative edge of CK. Output (read) data is reference to the crossing of CK and CK (Both directions of crossing)
Activates the SDRAM CK signal when high and deactivates the CK signal when low. By deactivating the clocks, CKE low initiates the Power Down mode, or the Self-Refresh mode
Enables the associated SDRAM command decoder when low and disables the command decoder when high. When the command decoder is disabled, new command are ignored but previous operations continue. This signal provides for external rank selection on systems with multiple ranks.
When high, termination resistance is enabled for all DQ, DQS, DQS and DM pins, assuming the function is enabled in the Extended Mode Register Set (EMRS).
Power supply for the DDR3 SDRAM output buffers to provide improved noise immunity. For all current DDR3 unbuffered DIMM designs, V
During a Bank Activate command cycle, Address input defines the row address (RA0-RA13) During a Read or Write command cycle, Address input defines the column address, In addition to the column address, AP is used to invoke autoprecharge operation at the end of the burst read or write cycle. If AP is high, autoprecharge is selected and BA0, BA1, BA2 defines the bank to be precharged. If AP is low, autoprecharge is disabled. During a pre­charge command cycle, AP is used in conjunction with BA0, BA1, BA2 to control which bank(s) to precharge. If AP is high, all banks will be precharged regardless of the state of BA0, BA1 or BA2. If AP is low, BA0, BA1 and BA2 are used to define which bank to precharge. A12(BC) is sampled during READ and WRITE commands to determine if burst chop (on-the-fly) will be performed (HIGH, no burst chop; Low, burst chopped).
DM is an input mask signal for write data. Input data is masked when DM is sampled High coincident with that input data during a write access. DM is sampled on both edges of DQS. Although DM pins are input only, the DM loading matches the DQ and DQS loading.
Power and ground for DDR3 SDRAM input buffers, and core logic. VDD and V
these modules.
These signals and tied at the system planar to either VSS or V
range.
This bidirectional pin is used to transfer data into or out of the SPD EEPROM. An external resistor may be connected from the SDA bus line to V
This signal is used to clock data into and out of the SPD EEPROM. An external resistor may be connected from the SCL bus time to V
Power supply for SPD EEPROM. This supply is separate from the V
from 3.0V to 3.6V.
This signal indicates that a thermal event has been detected in the thermal sensing device. The system should guarantee the electrical level requirement is met for the EVENT pin on TS/SPD part
shares the same power plane as VDD pins.
DDQ
to act as a pull-up on the system board.
DDSPD
to act as a pull-up on the system board.
DDSPD
pins are tied to VDD/V
DDQ
to configure the serial SPD EERPOM address
DDSPD
DD/VDDQ
power plane. EEPROM supply is operable
DDQ
planes on
- 7 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

7.1 Address Mirroring Feature

There is a via grid located under the DRAMs for wiring the CA signals (address, bank address, command, and control lines) to the DRAM pins. The length of the traces from the vias to the DRAMs places limitations on the bandwidth of the module. The shorter these traces, the higher the bandwidth. To extend the bandwidth of the CA bus for DDR3 modules, a scheme was defined to reduce the length of these traces. The pins on the DRAM are defined in a manner that allows for these short trace lengths. The CA bus pins in Columns 2 and 8, ignoring the mechanical support pins, do not have any special functions (secondary functions). This allows the most flexibility with these pins. These are address pins A3, A4, A5, A6, A7, A8 and bank address pins BA0 and BA1. Refer to Table . Rank 0 DRAM pins are wired straight, with no mismatch between the connector pin assignment and the DRAM pin assignment. Some of the Rank 1 DRAM pins are cross wired as defined in the table. Pins not listed in the table are wired straight.

7.1.1 DRAM Pin Wiring Mirroring

Connector Pin
A3 A3 A4
A4 A4 A3
A5 A5 A6
A6 A6 A5
A7 A7 A8
A8 A8 A7
BA0 BA0 BA1
BA1 BA1 BA0
Rank 0 Rank 1
DRAM Pin
Figure 1illustrates the wiring in both the mirrored and non-mirrored case. The lengths of the traces to the DRAM pins, is obviously shorter. The via grid is smaller as well.
Figure 1. Wiring Differences for Mirrored and Non-Mirrored Addresses
Since the cross-wired pins have no secondary functions, there is no problem in normal operation. Any data written is read the same way. There are limita­tions however. When writing to the internal registers with a "load mode" operation, the specific address is required. See the DDR3 UDIMM SPD specifica­tion for these details. The controller must read the SPD and have the capability of de-mirroring the address when accessing the second rank. SAMSUNG DDR3 dual rank UDIMM R/C B(2Rx8) and R/C E(2Rx8) Modules are using Mirrored Addresses mode.
- 8 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

8. Function Block Diagram:

8.1 4GB, 512Mx64 Non ECC Module (Populated as 1 rank of x8 DDR3 SDRAMs)

S0 DQS0 DQS0 DM0
DM CS DQS DQS
DQS1 DQS1 DM1
DQS2 DQS2 DM2
DQS3 DQS3 DM3
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15
DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23
DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31
I/O 0 I/O 1
D0
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM NU/ CS DQS DQS
I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
ZQ
D1
ZQ
D2
ZQ
D3
ZQ
BA0 - BA2 BA0-BA2 : SDRAMs D0 - D7
A0 - A13 A0-A13 : SDRAMs D0 - D7
RAS RAS : SDRAMs D0 - D7
CAS CAS : SDRAMs D0 - D7
CKE0 CKE : SDRAMs D0 - D7
WE WE : SDRAMs D0 - D7
ODT0 ODT : SDRAMs D0 - D7
CK0 CK : SDRAMs D0 - D7
Serial PD
SCL
WP
A0
A1
SA0 SA1
V
DDSPD SPD
VDD/V
DDQ
V
REFDQ
V
SS
V
REFCA
A2
SA2
DQS4 DQS4 DM4
DQS5 DQS5 DM5
DQS6 DQS6 DM6
DQS7 DQS7 DM7
SDA
D0 - D7
D0 - D7
D0 - D7
D0 - D7
DM CS DQS DQS
DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39
DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47
DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55
DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63
I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
NOTE :
1. For each DRAM, a unique ZQ resistor is connected to ground. The ZQ resistor is 240 Ohm +/- 1%
2. One SPD exists per module.
D4
ZQ
D5
ZQ
D6
ZQ
D7
ZQ
- 9 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

8.2 8GB, 1Gx64 Non ECC Module (Populated as 2 ranks of x8 DDR3 SDRAMs)

S1 S0 DQS0 DQS0 DM0
DQS1 DQS1 DM1
DQS2 DQS2 DM2
DQS3 DQS3 DM3
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15
DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23
DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31
DM CS DQS DQS
I/O 0 I/O 1
D0
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D1
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D2
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D3
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D8
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D9
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D10
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D11
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DQS4 DQS4 DM4
DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38
DQS5 DQS5 DM5
DQS6 DQS6 DM6
DQS7 DQS7 DM7
DQ39
DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47
DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55
DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63
ZQZQ ZQZQ
ZQZQ ZQZQ
ZQZQ ZQZQ
ZQZQ ZQZQ
DM CS DQS DQS
I/O 0 I/O 1
D4
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D5
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D6
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D7
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D12
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D13
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D14
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
DM CS DQS DQS
I/O 0 I/O 1
D15
I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7
BA0 - BA2 BA0-BA2 : SDRAMs D0 - D15
A0 - A15 A0-A15 : SDRAMs D0 - D15
CKE1 CKE : SDRAMs D8 - D15
CKE0 CKE : SDRAMs D0 - D7
RAS RAS : SDRAMs D0 - D15
CAS CAS : SDRAMs D0 - D15
WE WE : SDRAMs D0 - D15
ODT0 ODT : SDRAMs D0 - D7
ODT1 ODT : SDRAMs D8 - D15
CK0 CK : SDRAMs D0 - D7
CK1 CK : SDRAMs D8 - D15
Serial PD
SCL
WP
A0
A1
A2
SA0 SA1
V
DDSPD SPD
V
DD/VDDQ
V
REFDQ
V
SS
V
REFCA
SA2
- 10 -
SDA
D0 - D15
D0 - D15
D0 - D15
D0 - D15
NOTE :
1. For each DRAM, a unique ZQ resistor is connected to ground. The ZQ resistor is 240 Ohm +/- 1%
2. One SPD exists per module.
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

11. Absolute Maximum Ratings

11.1 Absolute Maximum DC Ratings

Symbol Parameter Rating Units NOTE
V
DD
Voltage on V
V
DDQ
V
NOTE :
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to JESD51-2 standard.
3. VDD and V
equal to or less than 300mV.
Voltage on any pin relative to V
IN, VOUT
T
Storage Temperature -55 to +100 C 1, 2
STG
DDQ

11.2 DRAM Component Operating Temperature Range

Symbol Parameter rating Unit NOTE
T
OPER
NOTE :
1. Operating Temperature T JESD51-2.
2. The Normal Temperature Range specifies the temperatures where all DRAM specifications will be supported. During operation, the DRAM case temperature must be main­tained between 0-85C under all operating conditions
3. Some applications require operation of the Extended Temperature Range between 85C and 95C case temperature. Full specifications are guaranteed in this range, but the following additional conditions apply:
a) Refresh commands must be doubled in frequency, therefore reducing the refresh interval tREFI to 3.9us. b) If Self-Refresh operation is required in the Extended Temperature Range, then it is mandatory to either use the Manual Self-Refresh mode with Extended Temperature
Range capability (MR2 A6 = 0b and MR2 A7 = 1b), in this case IDD6 current can be increased around 10~20% than normal Temperature range.
Voltage on VDD pin relative to V
pin relative to V
DDQ
must be within 300mV of each other at all times;and V
SS
SS
SS
Operating Temperature Range 0 to 95 C 1, 2, 3
is the case surface temperature on the center/top side of the DRAM. For measurement conditions, please refer to the JEDEC document
OPER
-0.4 V ~ 1.8 V V 1,3
-0.4 V ~ 1.8 V V 1,3
-0.4 V ~ 1.8 V V 1
must be not greater than 0.6 x V
REF
, When VDD and V
DDQ
are less than 500mV; V
DDQ
REF
may be

12. AC & DC Operating Conditions

12.1 Recommended DC Operating Conditions

Symbol Parameter Operation Voltage
V
DD
V
DDQ
NOTE:
1. Under all conditions V
2. V
tracks with VDD. AC parameters are measured with VDD and V
DDQ
& V
3. V
DD
DDQ
Supply Voltage
Supply Voltage for Output
must be less than or equal to VDD.
DDQ
rating are determinied by operation voltage.
1.35V 1.283 1.35 1.45 V 1, 2, 3
1.5V 1.425 1.5 1.575 V 1, 2, 3
1.35V 1.283 1.35 1.45 V 1, 2, 3
1.5V 1.425 1.5 1.575 V 1, 2, 3
DDQ
tied together.
Rating
Min. Typ. Max.
Units NOTE
- 14 -
Rev. 1.1
Unbuffered DIMM
datasheet DDR3L SDRAM

13. AC & DC Input Measurement Levels

13.1 AC & DC Logic Input Levels for Single-ended Signals

[ Table 2 ] Single Ended AC and DC input levels for Command and Address(1.35V)
Symbol Parameter
V
(DC90)
IH.CA
V
(DC90)
IL.CA
V
(AC160)
IH.CA
V
(AC160)
IL.CA
V
(AC135)
IH.CA
V
(AC135)
IL.CA
V
(AC125)
IH.CA
(AC125)
V
IL.CA
V
REFCA
NOTE :
1. For input only pins except
2. See "Overshoot and Undershoot specifications" section.
3. The ac peak noise on VRef may not allow VRef to deviate from VRefDQ(DC) by more than +/-1% VDD (for reference: approx. +/- 13.5 mV).
4. For reference: approx. VDD/2 +/- 13.5 mV
5. These levels apply for 1.35 Volt operation only. If the device is operated at 1.5 V , the respective levels in JESD79-3 (VIH/L.CA(DC100), VIH/L.CA(AC175), VIHL.CA(AC150),
VIH/L.CA(AC135), VIH/L.CA(AC125)etc.) apply. The 1.5 V levels (VIH/L.CA(DC100), VIH/L.CA(AC175), VIH/L.CA(AC150), VIH/L.CA(AC135), VIHL.CA(AC125)etc.) do not apply when the device is operated in the 1.35 voltage range.
DC input logic high
DC input logic low
AC input logic high
AC input logic low Note 2
AC input logic high
AC input logic lowM Note 2
AC input logic high - -
AC input logic low - - Note 2
Reference Voltage for ADD,
(DC)
CMD inputs
RESET, V
REF
= V
REFCA
(DC)
DDR3L-800/1066/1333/1600 DDR3L-1866
Min. Max. Min. Max.
1.35V
V
+ 90 V
REF
V
SS
V
+ 160
REF
V
+135
REF
0.49*V
DD
DD
V
- 90 V
REF
Note 2 - - mV 1,2,5
V
- 160
REF
Note 2
V
-135
REF
0.51*V
DD
V
+ 90 V
REF
SS
- - mV 1,2,5
V
+135
REF
Note 2
V
+ 125
REF
0.49*V
DD
Unit NOTE
DD
V
- 90
REF
mV 1
mV 1
Note 2 mV 1,2,5
V
REF
-135
mV 1,2,5
Note 2 mV 1,2,5
V
+ 125
REF
0.51*V
DD
mV 1,2,5
V 3,4
[ Table 3 ] Single-ended AC & DC input levels for Command and Address(1.5V)
Symbol Parameter
V
(DC100)
IH.CA
V
(DC100)
IL.CA
V
(AC175)
IH.CA
(AC175)
V
IL.CA
(AC150)
V
IH.CA
(AC150)
V
IL.CA
V
(AC135)
IH.CA
V
(AC135)
IL.CA
V
(AC125)
IH.CA
V
(AC125)
IL.CA
V
REFCA
NOTE :
1. For input only pins except
2. See "Overshoot and Undershoot specifications" section.
3. The ac peak noise on VRef may not allow VRef to deviate from VRefCA(DC) by more than +/-1% VDD (for reference: approx. +/- 15 mV).
4. For reference: approx. VDD/2 +/- 15 mV.
5. VIH(dc) is used as a simplified symbol for VIH.CA(DC100)
6. VIL(dc) is used as a simplified symbol for VIL.CA(DC100)
7. VIH(ac) is used as a simplified symbol for VIH.CA(AC175), VIH.CA(AC150), VIH.CA(AC135), and VIH.CA(AC125); VIH.CA(AC175) value is used when Vref + 0.175V is
referenced, VIH.CA(AC150) value is used when Vref + 0.150V is referenced, VIH.CA(AC135) value is used when Vref + 0.135V is referenced, and VIH.CA(AC125) value is used when Vref + 0.125V is referenced.
8. VIL(ac) is used as a simplified symbol for VIL.CA(AC175), VIL.CA(AC150), VIL.CA(AC135) and VIL.CA(AC125); VIL.CA(AC175) value is used when Vref - 0.175V is
referenced, VIL.CA(AC150) value is used when Vref - 0.150V is referenced, VIL.CA(AC135) value is used when Vref - 0.135V is referenced, and VIL.CA(AC125) value is used when Vref - 0.125V is referenced.
9. VrefCA(DC) is measured relative to VDD at the same point in time on the same device
DC input logic high
DC input logic low
AC input logic high
AC input logic low Note 2
AC input logic high
AC input logic low Note 2
AC input logic high - -
AC input logic low - - Note 2
AC input logic high - -
AC input logic low - - Note 2
Reference Voltage for ADD,
(DC)
CMD inputs
RESET, V
REF
= V
REFCA
(DC)
DDR3-800/1066/1333/1600 DDR3-1866
Min. Max. Min. Max.
V
+ 100 V
REF
V
SS
V
+ 175
REF
V
+150
REF
0.49*V
DD
DD
V
- 100 V
REF
Note 2 - - mV 1,2,7
V
- 175
REF
Note 2 - - mV 1,2,7
V
-150
REF
0.51*V
DD
V
+ 100 V
REF
SS
- - mV 1,2,8
- - mV 1,2,8
V
+ 135
REF
V
+125
REF
0.49*V
DD
Unit NOTE
DD
V
- 100
REF
mV 1,5
mV 1,6
Note 2 mV 1,2,7
V
REF
- 135
mV 1,2,8
Note 2 mV 1,2,7
V
REF
0.51*V
-125
DD
mV 1,2,8
V 3,4,9
- 15 -
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